CN112033538B - Ultrafast image device based on spectrum-time mapping - Google Patents
Ultrafast image device based on spectrum-time mapping Download PDFInfo
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- 238000013507 mapping Methods 0.000 title claims abstract description 10
- 238000001514 detection method Methods 0.000 claims abstract description 27
- 238000000701 chemical imaging Methods 0.000 claims abstract description 20
- 238000003384 imaging method Methods 0.000 claims abstract description 19
- JNDMLEXHDPKVFC-UHFFFAOYSA-N aluminum;oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Al+3].[Y+3] JNDMLEXHDPKVFC-UHFFFAOYSA-N 0.000 claims abstract description 16
- 239000013078 crystal Substances 0.000 claims abstract description 16
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 claims abstract description 16
- 238000001228 spectrum Methods 0.000 claims abstract description 11
- 239000000523 sample Substances 0.000 claims description 37
- 239000006185 dispersion Substances 0.000 claims description 17
- 230000003287 optical effect Effects 0.000 claims description 13
- 239000011521 glass Substances 0.000 claims description 3
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- 238000000034 method Methods 0.000 abstract description 15
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- 230000031018 biological processes and functions Effects 0.000 abstract description 3
- 239000000126 substance Substances 0.000 abstract description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 17
- 229910052710 silicon Inorganic materials 0.000 description 17
- 239000010703 silicon Substances 0.000 description 17
- 238000002679 ablation Methods 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 238000000608 laser ablation Methods 0.000 description 3
- 238000012634 optical imaging Methods 0.000 description 3
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- 238000004020 luminiscence type Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J2003/1213—Filters in general, e.g. dichroic, band
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Abstract
The invention discloses an ultrafast imaging device based on spectrum-time mapping, which is formed by connecting a detection light generation system and a spectrum imaging system through a light path. The detection light generation system is formed by connecting a first femtosecond laser, a first electric shutter, a first convex lens, an yttrium aluminum garnet crystal, a second convex lens, a pulse stretcher, a filter and a first plane mirror in turn through light paths; the spectral imaging system is formed by connecting a sample, an objective lens, a beam splitter, a third convex lens and a hyperspectral camera in sequence through light paths. The invention can directly observe the two-dimensional space and time three-dimensional information of the ultrafast dynamic scene, and further is used for detecting the spatial and temporal evolution of physical, chemical and biological processes, thereby realizing the high-quality observation of the ultrafast dynamic process of nanosecond, picosecond and even femtosecond magnitude. Compared with the STAMP device, the invention is simple and easy to build, and does not need a complex pulse shaping system and a space separation system.
Description
Technical Field
The invention relates to the technical field of optical ultrafast imaging, in particular to an ultrafast imaging device based on spectrum-time mapping.
Background
Optical imaging is an important tool for human beings to explore the natural mysteries and realize technological development. It is crucial to obtain spatial and temporal information of ultrafast dynamic scenes simultaneously, which helps to study many important basic mechanisms in physics, chemistry and biology. In the conventional optical imaging, the imaging speed mainly depends on the detection speed of a CCD or a CMOS detector, and is usually in the order of milliseconds to microseconds, so that transient evolution events in the femtosecond to nanosecond scale cannot be captured. The pump-probe approach, while providing extremely high frame rates, requires that the dynamic scene being measured be repeatable. The pump-probe approach is therefore not applicable for many very fast events that are not repeatable or are difficult to repeat.
In recent years, ultrafast optical imaging by a single exposure has made a rapid progress in imaging speed (i.e., temporal resolution) and the number of imaging frames. In 2014, Nakagawa et al, k. tokyo university, japan, developed sequential time All-optical Mapping (STAMP), which split a bundle of ultra-short laser pulses into several sub-pulses after chirped stretching, and after shooting a dynamic scene, spatially separate and image them, and the imaging technology has a time resolution of up to 200 femtoseconds and a single frame pixel count of 450 × 450. Since the number of imaging frames depends on the number of sub-pulses, only 6 images can be taken. The research team subsequently improved the STAMP experimental system by using an optical diffraction element instead of a spatio-temporal distribution system to successfully increase the number of imaging frames to 25 in 2017. Nevertheless, single shot measurement devices aimed at high quality observation of ultrafast dynamic evolution processes in picosecond or even femtosecond-scale laser processing and some ultrafast processes without self-luminescence are still in the development stage.
Disclosure of Invention
The invention aims to provide an ultrafast imaging device based on spectrum-time mapping aiming at the defects of the prior art, which is formed by connecting a detection light generating system and a spectrum imaging system by optical paths, wherein the detection light generating system is formed by sequentially connecting a first femtosecond laser, a first electric shutter, a first convex lens, an yttrium aluminum garnet crystal, a second convex lens, a pulse stretcher, a filter plate and a first plane mirror by optical paths; the spectral imaging system is formed by connecting a sample, an objective lens, a beam splitter, a third convex lens and a hyperspectral camera in turn through light paths; the invention can realize the ultrafast dynamic process of high-quality observation nanosecond, picosecond and even femtosecond magnitude, can directly observe the two-dimensional space and time three-dimensional information of the ultrafast dynamic scene through single photographing, and is further used for detecting the space-time evolution of physical, chemical and biological processes. Compared with the STAMP device, the invention is simple and easy to build, and does not need a complex pulse shaping system and a space separation system.
The specific technical scheme for realizing the purpose of the invention is as follows:
an ultrafast imaging device based on spectrum-time mapping is characterized by comprising a detection light generation system and a spectrum imaging system;
the detection light generation system is formed by connecting a first femtosecond laser, a first electric shutter, a first convex lens, an yttrium aluminum garnet crystal, a second convex lens, a pulse stretcher, a filter plate and a first plane mirror in turn through light paths;
the spectral imaging system is formed by connecting a sample, an objective lens, a beam splitter, a third convex lens and a hyperspectral camera in turn through light paths;
and the first plane mirror of the detection light generation system is connected with the beam splitter optical path of the spectral imaging system.
The yttrium aluminum garnet crystal of the detection light generation system is arranged on the image focal plane of the first convex lens, and the yttrium aluminum garnet crystal is arranged on the object focal plane of the second convex lens.
The sample of the spectral imaging system is arranged at the working distance of the objective lens; and the hyperspectral camera of the spectral imaging system is arranged on the image plane of the third convex lens.
The invention can realize the ultrafast dynamic process of high-quality observation nanosecond, picosecond and even femtosecond magnitude, can directly observe the two-dimensional space and time three-dimensional information of the ultrafast dynamic scene through single photographing, and is further used for detecting the spatial and temporal evolution of physical, chemical and biological processes. Compared with the STAMP device, the invention is simple and easy to build, and does not need a complex pulse shaping system and a space separation system.
The invention has the advantages that:
the invention can realize the direct observation of the space-time three-dimensional information (two-dimensional space and one-dimensional time) of the ultrafast dynamic scene.
The invention belongs to a single-shot measuring device, and is suitable for measuring irreproducible and difficult-to-repeat ultrafast events.
Compared with the STAMP device, the invention has the advantages of simplicity and easiness in construction, and no need of a complex pulse shaping system and a space separation system.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic structural diagram of the present invention combined with a pump light generation system to measure femtosecond laser ablation of silicon;
FIG. 3 is a graph of wavelength versus time for probe light;
FIG. 4 is a graph showing the time-space evolution of silicon surface ablation under the action of a 400nm femtosecond laser.
Detailed Description
Referring to fig. 1, the present invention includes a probe light generation system 100 and a spectral imaging system 200;
the detection light generation system 100 is formed by sequentially connecting a first femtosecond laser 1, a first electric shutter 2, a first convex lens 3, an yttrium aluminum garnet crystal 4, a second convex lens 5, a pulse stretcher 6, a filter 7 and a first plane mirror 8 through light paths;
the spectral imaging system 200 is formed by connecting a sample 9, an objective lens 10, a beam splitter 11, a third convex lens 12 and a hyperspectral camera 13 in sequence through an optical path;
the first plane mirror 8 of the detection light generation system 100 is optically connected to the beam splitter 11 of the spectral imaging system 200.
Referring to fig. 1, the yttrium aluminum garnet crystal 4 of the detection light generation system 100 is disposed in the image-side focal plane of the first convex lens 3, and the yttrium aluminum garnet crystal 4 is disposed in the object-side focal plane of the second convex lens 5.
Referring to fig. 1, a sample 9 of the spectral imaging system 200 is positioned at a working distance of an objective lens 10; the hyperspectral camera 13 of the spectral imaging system 200 is arranged at the image plane of the third convex lens 12.
The invention is explained in further detail below with reference to the figures and examples.
The use of the components of the invention:
referring to fig. 1, the probe light generating system 100 of the present invention generates femtosecond laser pulses generated by a first femtosecond laser 1 as time-frequency domain dispersion pulses.
Referring to fig. 1, a first femtosecond laser 1 in a detection light generation system 100 of the present invention generates femtosecond laser pulses with a center wavelength of 800nm, a repetition frequency of 100Hz, and a single pulse energy of 2.5 mJ; the first electrically operated shutter 2 is used to obtain a single femtosecond laser pulse; the first convex lens 3 has a focal length f =50mm for focusing the femtosecond laser pulses; femtosecond laser focused by the first convex lens 3 is irradiated into the yttrium aluminum garnet crystal 4 to generate a supercontinuum light source with the wave band covering 400-850 nm; the focal length of the second convex lens 5 is f =50mm, and the second convex lens is used for collimating the supercontinuum light emitted from the yttrium aluminum garnet crystal 4 to change the supercontinuum light into supercontinuum parallel light; the pulse stretcher 6 is used for stretching the time domain pulse and carrying out time-frequency domain dispersion on the supercontinuum parallel light emitted by the second convex lens 5 to generate a time-frequency domain dispersion pulse; selecting the wave band of the time-frequency domain dispersion pulse through a filter plate 7; the time-frequency domain dispersed pulses of the probe light generation system 100 are transferred onto the beam splitter 11 of the spectral imaging system 200 by changing the optical path direction by the first plane mirror 8.
Referring to fig. 1, the spectral imaging system 200 of the present invention uses the filtered time-frequency domain dispersion pulse as the detection light to irradiate the target dynamic scene, so as to obtain a two-dimensional image of the target dynamic scene under a specific light frequency.
Referring to fig. 1, a beam splitter 11 in a spectral imaging system 200 of the present invention is used to change the direction of the light path and introduce the reflected light from the surface of a sample 9 into a hyperspectral camera 13; the objective lens 10 magnifies the dynamic scene of the target occurring in the sample 9 for observation; the third convex lens 12 is arranged behind the beam splitter 11 and used for imaging; the hyperspectral camera 13 is arranged behind the third convex lens 12 and is used for acquiring a two-dimensional image of the target dynamic scene at a specific light frequency.
The invention works as follows:
referring to fig. 1, in the present invention, laser generated by a first femtosecond laser 1 in a probe light generation system 100 passes through a first electric shutter 2 to obtain a single laser pulse, and then is focused in an yttrium aluminum garnet crystal 4 by a first convex lens 3 to generate a supercontinuum light source; the light emitted by the super-continuum spectrum light source is changed into super-continuum spectrum parallel light after passing through the second convex lens 5, the super-continuum spectrum parallel light enters the pulse stretcher 6, and the pulse stretcher 6 conducts time domain pulse stretching and time frequency domain dispersion on the incident super-continuum spectrum parallel light to generate time frequency domain dispersion pulses; the time-frequency domain dispersion pulse is selected out of a required wave band by a filter plate 7 to be used as detection light, and the detection light is sequentially reflected by a first plane mirror 8 and a beam splitter 11 and then irradiates a sample 9 through an objective lens 10; at this time, the reflected light from the sample 9 is collected by the objective lens 10 and the third convex lens 12 and then transmitted to the detection chip of the hyperspectral camera 13, and finally the hyperspectral camera 13 acquires two-dimensional images of the target dynamic scene generated in the sample 9 under different detection light frequencies.
After the invention is used for obtaining the two-dimensional images of the target dynamic scene under different detection light frequencies, the spectrum-time mapping step is executed by measuring the time information corresponding to the spectrum of the detection light, the two-dimensional images corresponding to the light frequencies collected by the invention are converted into the two-dimensional images corresponding to the time, and the time-space evolution information of the dynamic process is obtained.
The pulse stretcher 6 can be selected according to different requirements, for example, if the pulse width of the time-frequency domain dispersion pulse is required to be in picosecond magnitude, a glass rod can be used as the pulse stretcher; if the pulse width of the time-frequency domain dispersion pulse is required to be in the nanosecond order, an optical fiber can be used as a pulse stretcher.
Examples
The embodiment observes the ultrafast dynamic process of femtosecond laser ablation of silicon. The femtosecond laser draws the wide attention of scientists in the field of interaction with materials from both foundation and application. The ultrafast laser can change the state and properties of the material, and can be used for processing high-quality, high-precision and complex three-dimensional structures of almost any material. The process of interaction between femtosecond laser and material, including electron excitation, electron-lattice heat conduction, and material eruption and removal, is an ultrafast process with time from femtosecond to nanosecond. To understand and control these ultra-fast dynamic processes, ultra-fast observation techniques need to be relied upon. The ultra-fast dynamic process of the femtosecond laser ablation silicon is observed as an example.
Referring to fig. 1 and fig. 2, the present embodiment is implemented by combining the pump light generation system 300 according to the present invention; the pump light generation system 300 is formed by connecting a second femtosecond laser 14, a second electric shutter 15, a fourth convex lens 16 and a second plane mirror 17 in sequence through an optical path.
Referring to fig. 1 and 2, the sample 9 selected in this embodiment is a silicon sample 91; the pump light generation system 300 is used to induce an ablation dynamic scene on the silicon sample 91.
Referring to fig. 2, the second plane mirror 17 of the pump light generation system 300 is optically connected to the silicon sample 91 of the spectral imaging system 200. Wherein: the second femtosecond laser 14 is used for generating femtosecond laser with the central wavelength of 400nm, the pulse width of 50fs and the repetition frequency of 100 hz; the second electrically operated shutter 15 is used to obtain a single pumping pulse; the focal length f =100mm of the fourth convex lens 16, which is used for focusing the pump light; the second flat mirror 17 is used to change the direction of the pump light.
Referring to fig. 1 and 2, a first femtosecond laser 1 of the probe light generation system 100 generates a femtosecond laser having a center wavelength of 800nm, a pulse width of 50fs, a repetition frequency of 100hz, and a single pulse energy of 2.5 mJ; the focal length f =50mm of the first convex lens 3 for focusing the femtosecond laser; the yttrium aluminum garnet crystal 4 is used for generating a super-continuum spectrum light source, and the wave band of the super-continuum spectrum light source covers 400-850 nm; the focal length f =50mm of the second convex lens 5 is used for collimating the light of the supercontinuum light source into parallel light, the pulse stretcher 6 is composed of four glass rods with the cross section diameter phi =30mm and the length L =13.5cm and is used for carrying out time domain pulse stretching and time-frequency domain dispersion on the supercontinuum parallel light, the generated time-frequency domain dispersion pulse wave band covers the wave band 400 and 850nm, the pulse duration is 100ps, the filter 7 is a 600nm long-wave pass filter, the time-frequency domain dispersion pulse in the wave band 600nm-850nm is selected as detection light, and the light path direction is changed by the first plane mirror 8.
Referring to fig. 1 and 2, the spectral imaging system 200 is composed of a silicon sample 91, an objective lens 10, a beam splitter 11, a third convex lens 12, and a hyperspectral camera 13. The beam splitter 11 has a 50% ratio of transmittance to reflectance: 50% for changing the optical path direction and directing the reflected light from the surface of the silicon sample 91 into the hyperspectral camera 13. The objective lens 10 has a magnification of 20 times, and magnifies a dynamic scene of an object occurring in the silicon sample 91 for observation. The focal length of the third convex lens 12 is 100mm, and the third convex lens is arranged behind the beam splitter 11 for imaging. The hyperspectral camera 13 is of model MQ022HG-IM-SM5X5-NIR and is arranged behind the third convex lens 11 and used for collecting a two-dimensional image of a target dynamic scene at a specific light frequency.
The present embodiment works as follows:
referring to fig. 1 and 2, a second femtosecond laser 14 generates 400nm pump light, obtains a single pump pulse through a second electric shutter 15, and focuses the pump pulse on the surface of a silicon sample 91 by using a fourth convex lens 16 to induce an ablation dynamic process. Meanwhile, the first femtosecond laser 1 outputs laser with the central wavelength of 800nm to generate time-frequency domain dispersion pulse with the wave band covering 400nm-850nm and the duration of 100ps after sequentially passing through the first electric shutter 2, the first convex lens 3, the yttrium aluminum garnet crystal 4, the second convex lens 5 and the pulse stretcher 6, and then 600nm-850nm components of the frequency domain dispersion pulse at the time are selected by the filter 7 to serve as detection light. The detection light is reflected by the first plane mirror 8 and the beam splitter 11, then acts on the silicon sample 91 through the objective lens 10, and the detection light reflected from the surface of the silicon sample 91 enters the hyperspectral camera 13 after being collected by the objective lens 10 and the third convex lens 12; because the probe light carries the information of the surface of the sample, the hyperspectral camera 13 can record two-dimensional images of the shape change of the silicon sample 91 under different light frequencies in the ablation process; the whole experimental process was carried out in an air environment and at normal incidence. And the pumping light and the detecting light reach the surface of the silicon sample 91 at the same time, that is, the total optical paths from the first femtosecond laser 1 and the second femtosecond laser 14 to the surface of the silicon sample 91 through the optical devices are equal.
Referring to fig. 3, fig. 3 is a graph showing a wavelength-time distribution of probe light according to an embodiment of the present invention.
Referring to FIG. 4, FIG. 4 is a time-space evolution diagram of silicon surface ablation under the action of 400nm femtosecond laser in this embodiment.
Generally, the invention provides an ultrafast imaging device based on spectrum-time mapping, which has a simple principle and an easily-built light path, belongs to a single-shot measurement device, and can realize direct observation of space-time three-dimensional information (two-dimensional space and one-dimensional time) of an ultrafast dynamic scene.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (1)
1. An ultrafast imaging device based on spectrum-time mapping, characterized in that it comprises a probe light generation system (100) and a spectrum imaging system (200);
the detection light generation system (100) is formed by sequentially connecting a first femtosecond laser (1), a first electric shutter (2), a first convex lens (3), an yttrium aluminum garnet crystal (4), a second convex lens (5), a pulse stretcher (6), a filter (7) and a first plane mirror (8) through light paths;
the spectral imaging system (200) is formed by connecting a sample (9), an objective lens (10), a beam splitter (11), a third convex lens (12) and a hyperspectral camera (13) in turn through optical paths;
the first plane mirror (8) of the detection light generation system (100) is connected with the beam splitter (11) of the spectral imaging system (200) through an optical path; wherein:
the yttrium aluminum garnet crystal (4) of the detection light generation system (100) is arranged on the image focal plane of the first convex lens (3), and the yttrium aluminum garnet crystal (4) is arranged on the object focal plane of the second convex lens (5);
the sample (9) of the spectral imaging system (200) is arranged at the working focal length of the objective lens (10); the hyperspectral camera (13) of the spectral imaging system (200) is arranged on the image plane of the third convex lens (12);
the pulse stretcher (6) is selected according to different requirements, and if the pulse width of the time-frequency domain dispersion pulse is in picosecond magnitude, the glass rod is used as the pulse stretcher; if the pulse width of the time-frequency domain dispersion pulse is required to be in the nanosecond order, the optical fiber is used as a pulse stretcher.
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