CN111983574B - Method for improving performance of RCS test dead zone - Google Patents
Method for improving performance of RCS test dead zone Download PDFInfo
- Publication number
- CN111983574B CN111983574B CN202010764625.0A CN202010764625A CN111983574B CN 111983574 B CN111983574 B CN 111983574B CN 202010764625 A CN202010764625 A CN 202010764625A CN 111983574 B CN111983574 B CN 111983574B
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- Prior art keywords
- copper bar
- performance
- dielectric substrate
- receiving
- test
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- 238000012360 testing method Methods 0.000 title claims abstract description 36
- 238000000034 method Methods 0.000 title claims abstract description 14
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 64
- 229910052802 copper Inorganic materials 0.000 claims abstract description 64
- 239000010949 copper Substances 0.000 claims abstract description 64
- 239000011358 absorbing material Substances 0.000 claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 20
- 230000008878 coupling Effects 0.000 claims abstract description 14
- 238000010168 coupling process Methods 0.000 claims abstract description 14
- 238000005859 coupling reaction Methods 0.000 claims abstract description 14
- 238000007789 sealing Methods 0.000 claims description 4
- 238000005516 engineering process Methods 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 238000010329 laser etching Methods 0.000 claims description 2
- 239000002313 adhesive film Substances 0.000 claims 3
- 230000003068 static effect Effects 0.000 abstract description 7
- 238000010521 absorption reaction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000003292 glue Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000006260 foam Substances 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q17/00—Devices for absorbing waves radiated from an antenna; Combinations of such devices with active antenna elements or systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q17/00—Devices for absorbing waves radiated from an antenna; Combinations of such devices with active antenna elements or systems
- H01Q17/002—Devices for absorbing waves radiated from an antenna; Combinations of such devices with active antenna elements or systems using short elongated elements as dissipative material, e.g. metallic threads or flake-like particles
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Variable-Direction Aerials And Aerial Arrays (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Abstract
The invention relates to the technical field of electromagnetic property testing, in particular to a method for improving the performance of a static area of an RCS test. The method is that wave absorbing materials are arranged between the receiving and transmitting antennas to eliminate test clutter caused by coupling of the receiving and transmitting antennas; the wave absorbing material consists of a dielectric substrate and copper bar micro units, wherein the copper bar micro units are arranged on the front side and the back side of the dielectric substrate at equal intervals, and the copper bar micro units form a certain angle with the axis of the dielectric substrate. The invention is characterized in that a wave-absorbing material is arranged between the receiving and transmitting antennas, and the resonance unit structure of the wave-absorbing material consists of copper bars and a switch PIN diode. The resonance unit structure can change the side width of the copper bar in the resonance unit structure by controlling the conduction state of the switch PIN diode in the middle of the copper bar, absorb clutters of full frequency bands of L-band and KU-band, eliminate coupling signals of the receiving and transmitting antenna in RCS test, and improve the performance of a static area of RCS test.
Description
Technical Field
The invention relates to the technical field of electromagnetic property testing, in particular to a method for improving the performance of a static area of an RCS test.
Background
The compact range generates a plane wave with good performance in the test dead zone to irradiate the tested object. Firstly, testing background scattering signals of an empty darkroom (comprising a bracket turntable); finally, placing the tested object on a support turntable, and testing scattering signals of the tested object in a range of a specified frequency domain and an angle domain; after the test data is completed, data processing is carried out; vector background cancellation and time domain gate processing are carried out on the collected calibration data, target data and background data, so that the influence of clutter such as bracket turntable, transceiver antenna coupling, compact field edge strong reflection, back wall strong reflection and the like is eliminated.
Due to the influence of clutter such as a support turntable, transceiver antenna coupling, compact range edge strong reflection, back wall strong reflection and the like. The static area performance of the RCS test can be influenced, and the test accuracy of the target RCS is reduced. In the prior art of RCS test, foam wave absorbing material is placed between the receiving and transmitting antennas to eliminate the test influence caused by the coupling of the receiving and transmitting antennas, but the foam wave absorbing material has obvious influence on the signals of the X-band and the high-frequency receiving and transmitting antennas, and the effect is not particularly obvious for the signals of the low-frequency receiving and transmitting antennas.
Disclosure of Invention
The invention aims to:
the invention aims at the problems, and the wave absorbing material with wave absorbing function for all coupling signals of the full-band receiving and transmitting antennas is arranged between the receiving and transmitting antennas to eliminate test clutter caused by coupling of the receiving and transmitting antennas. Improving the performance of the test dead zone.
The technical scheme is as follows:
a method for improving RCS test dead zone performance is to arrange wave absorbing material between receiving and transmitting antennas to eliminate test clutter caused by coupling of the receiving and transmitting antennas; the wave absorbing material consists of a dielectric substrate and copper bar micro units, wherein the copper bar micro units are arranged on the front side and the back side of the dielectric substrate at equal intervals, and the copper bar micro units form a certain angle with the axis of the dielectric substrate.
Preferably, the copper bar micro-units are formed by sealing and arranging a plurality of equilateral thin copper bars, each thin copper bar is connected with an electric control switch, and the width change of the copper bar micro-units is realized through the opening and closing of the electric control switches.
Preferably, the electronically controlled switch employs a PIN diode connected to an external circuit to control the switching thereof.
Preferably, the distance between the upper copper bar microcells and the lower copper bar microcells is twice the width of the microcells, the distance between the left microcells and the right microcells is half the length of the microcells, and the arrangement is more beneficial to wave absorption.
Preferably, the copper bar micro unit forms an included angle of 45 degrees with the axis of the medium substrate, the copper bar micro unit is adhered and fixed with the medium substrate through a glue film, and the glue film is made of a glue film material with very good dielectric constant and low loss. Such an arrangement is more conducive to wave absorption.
Preferably, the wave-absorbing material is manufactured by a laser etching technology, and the dimensional accuracy of the copper bar micro unit can be better controlled by adopting the technology.
The beneficial technical effects are as follows: the invention relates to a method for improving the performance of a static area tested by RCS, which is characterized in that a wave-absorbing material is placed between receiving and transmitting antennas, and a resonance unit structure of the wave-absorbing material consists of copper bars and a switch PIN diode. The resonance unit structure can change the side width of the copper bar in the resonance unit structure by controlling the conduction state of the switch PIN diode in the middle of the copper bar, absorb clutters of full frequency bands of L-band and KU-band, eliminate coupling signals of the receiving and transmitting antenna in RCS test, and improve the performance of a static area of RCS test.
The invention effectively absorbs clutter in full frequency range from L band to KU band, eliminates coupling signals between receiving and transmitting antennas in RCS test, and improves performance of RCS test dead zone.
Drawings
The copper bar microcell structure shown in fig. 1 is schematically shown;
schematic of an equilateral thin copper bar in the copper bar microcell structure shown in fig. 2;
a switch PIN diode schematic diagram is arranged between the thin copper bars shown in the figure 3;
fig. 4 shows a graph of the wave absorbing effect of the wave absorbing material.
Detailed Description
The method for improving the performance of the RCS test dead zone is described in detail below with reference to the accompanying drawings and specific embodiments, and the core idea of the invention is that a wave-absorbing material is placed between the receiving and transmitting antennas, and the resonant unit structure of the wave-absorbing material consists of copper bars and switch PIN diodes. The resonance unit structure can change the side width of the copper bar in the resonance unit structure by controlling the conduction state of the switch PIN diode in the middle of the copper bar, absorb clutters of full frequency bands of L-band and KU-band, eliminate coupling signals of the receiving and transmitting antenna in RCS test, and improve the performance of a static area of RCS test.
As shown in fig. 1, in the invention, the wave absorbing material at the most core consists of a dielectric substrate and copper bar micro units, wherein the copper bar micro units are arranged on the front and back surfaces of the dielectric substrate at equal intervals, and the copper bar micro units form a certain angle with the axis of the dielectric substrate; the specific structure of any copper bar micro unit is shown in fig. 2, the copper bar micro units are formed by sealing and arranging a plurality of equilateral thin copper bars, each thin copper bar is connected with an electric control switch, the width of the copper bar micro unit is changed by opening and closing the electric control switch, and in principle, the larger the edge width of the copper bar in the resonance unit structure is, the better the low-frequency wave absorbing performance is; the smaller the side width is, the better the high-frequency wave absorbing performance is. Therefore, the electric control switch is adopted to realize the change of the sizes of the copper bar micro units so as to adapt to different incident waves and improve the wave absorbing range of the material.
Example 1
The embodiment of the invention provides a wave-absorbing material, which consists of a dielectric substrate and copper bar micro units. The length, width and height of the dielectric substrate are respectively 50cm multiplied by 50cm. Copper bar micro units are periodically arranged on the front side and the back side of the dielectric substrate at equal intervals. Copper bar micro-units are arranged at an included angle of 45 degrees with the axis of the medium substrate, the length of each copper bar micro-unit is 10mm, the width of each copper bar micro-unit is 5mm, the distance between the two upper copper bar micro-units and the lower copper bar micro-units is 10mm, the distance between the left copper bar micro-units and the right copper bar micro-units is 5mm, each copper bar micro-unit is formed by sealing and arranging a plurality of equilateral thin copper bars, the length of each equilateral thin copper bar is 10mm, the width of each copper bar micro-unit is 1mm, an electric control switch is connected between each equilateral thin copper bar micro-unit and the equilateral thin copper bar micro-unit, a PIN diode is adopted by the electric control switch, and the PIN diode is connected with an external circuit to control the switch of the PIN diode.
Final test results for this structure: the wave absorbing material has good wave absorbing performance. Under the vertical polarization and the parallel polarization, the average value of the wave absorption rate reaches more than 70% at the frequency of 1GHz-18GHz, and the interference factor of the coupling signal of the receiving and transmitting antenna to the RCS test dead zone is effectively eliminated. The invention can effectively eliminate the coupling of the receiving and transmitting antennas and effectively improve the performance of the RCS test dead zone.
Claims (5)
1. A method for improving the performance of an RCS test dead zone, which is characterized by comprising the following steps: the method is that wave absorbing materials are arranged between the receiving and transmitting antennas to eliminate test clutter caused by coupling of the receiving and transmitting antennas; the wave absorbing material consists of a dielectric substrate and a plurality of copper bar micro units, wherein the copper bar micro units are arranged on the front side and the back side of the dielectric substrate at equal intervals, and the copper bar micro units form a certain angle with the axis of the dielectric substrate;
the copper bar micro units are formed by sealing and arranging a plurality of equilateral thin copper bars, each thin copper bar is connected with an electric control switch, and the width change of the copper bar micro units is realized through the opening and closing of the electric control switches; the space between the upper copper bar microcell and the lower copper bar microcell is twice the width of the microcell, and the space between the left microcell and the right microcell is half the length of the microcell; the copper bar micro unit forms an included angle of 45 degrees with the axis of the dielectric substrate.
2. The method for improving the performance of the dead space of the RCS test of claim 1, wherein: the electronic control switch adopts a PIN diode, and the PIN diode is connected with an external circuit to control the switch of the PIN diode.
3. The method for improving the performance of the dead space of the RCS test of claim 1, wherein: the copper bar micro unit is fixedly bonded with the dielectric substrate through the adhesive film.
4. A method of improving the performance of an RCS test dead band according to claim 3, wherein: the adhesive film is made of adhesive film materials with very high dielectric constant and low loss.
5. The method for improving the performance of the dead space of the RCS test of claim 1, wherein: the wave-absorbing material is manufactured by a laser etching technology.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010764625.0A CN111983574B (en) | 2020-07-31 | 2020-07-31 | Method for improving performance of RCS test dead zone |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010764625.0A CN111983574B (en) | 2020-07-31 | 2020-07-31 | Method for improving performance of RCS test dead zone |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111983574A CN111983574A (en) | 2020-11-24 |
| CN111983574B true CN111983574B (en) | 2024-04-09 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN202010764625.0A Active CN111983574B (en) | 2020-07-31 | 2020-07-31 | Method for improving performance of RCS test dead zone |
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| CN (1) | CN111983574B (en) |
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|---|---|---|---|---|
| JP2006340202A (en) * | 2005-06-03 | 2006-12-14 | Matsushita Electric Ind Co Ltd | Antenna system and wireless communication device comprising the same |
| CN102723541A (en) * | 2012-06-14 | 2012-10-10 | 北京航空航天大学 | Method for optimizing cross-shaped annular slot frequency selection surface unit structural body and conformal antenna housing with low radar cross-section (RCS) |
| CN107086377A (en) * | 2017-04-21 | 2017-08-22 | 北京航空航天大学 | The suction wave reflection battle array control device of feed mirror image beam in a kind of Compact Range darkroom |
| CN107819173A (en) * | 2017-10-16 | 2018-03-20 | 西安空间无线电技术研究所 | A kind of structure for eliminating waveguide R type microwave switch spurious resonances |
| CN108879079A (en) * | 2018-06-22 | 2018-11-23 | 西安交通大学 | A kind of high-isolation array antenna based on electromagnetic wave absorption body |
| CN109586038A (en) * | 2018-12-04 | 2019-04-05 | 中国人民解放军国防科技大学 | Ultra-wideband switch type wave absorber based on PIN diode |
| CN109669078A (en) * | 2018-12-11 | 2019-04-23 | 中国航空工业集团公司济南特种结构研究所 | A kind of microwave dark room with suction wave oncus |
| CN110690578A (en) * | 2018-07-06 | 2020-01-14 | 中国航空工业集团公司济南特种结构研究所 | Wave absorbing structure for solving problem that wave transmittance of antenna housing test for electronic warfare exceeds hundred |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9160066B2 (en) * | 2011-09-23 | 2015-10-13 | Kuang-Chi Innovative Technology Ltd. | Unipolar antenna, wireless access apparatus and wireless router |
-
2020
- 2020-07-31 CN CN202010764625.0A patent/CN111983574B/en active Active
Patent Citations (8)
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| JP2006340202A (en) * | 2005-06-03 | 2006-12-14 | Matsushita Electric Ind Co Ltd | Antenna system and wireless communication device comprising the same |
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| CN107086377A (en) * | 2017-04-21 | 2017-08-22 | 北京航空航天大学 | The suction wave reflection battle array control device of feed mirror image beam in a kind of Compact Range darkroom |
| CN107819173A (en) * | 2017-10-16 | 2018-03-20 | 西安空间无线电技术研究所 | A kind of structure for eliminating waveguide R type microwave switch spurious resonances |
| CN108879079A (en) * | 2018-06-22 | 2018-11-23 | 西安交通大学 | A kind of high-isolation array antenna based on electromagnetic wave absorption body |
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| CN111983574A (en) | 2020-11-24 |
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