CN111971585B - 具有用于均匀成像的聚焦闪烁体结构的x射线探测器 - Google Patents
具有用于均匀成像的聚焦闪烁体结构的x射线探测器 Download PDFInfo
- Publication number
- CN111971585B CN111971585B CN201980025284.0A CN201980025284A CN111971585B CN 111971585 B CN111971585 B CN 111971585B CN 201980025284 A CN201980025284 A CN 201980025284A CN 111971585 B CN111971585 B CN 111971585B
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- China
- Prior art keywords
- scintillator
- detector
- layer
- elements
- lss
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20186—Position of the photodiode with respect to the incoming radiation, e.g. in the front of, below or sideways the scintillator
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
Landscapes
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP18167073.8A EP3553568A1 (en) | 2018-04-12 | 2018-04-12 | X-ray detector with focused scintillator structure for uniform imaging |
| EP18167073.8 | 2018-04-12 | ||
| PCT/EP2019/058471 WO2019197263A1 (en) | 2018-04-12 | 2019-04-04 | X-ray detector with focused scintillator structure for uniform imaging |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111971585A CN111971585A (zh) | 2020-11-20 |
| CN111971585B true CN111971585B (zh) | 2024-11-12 |
Family
ID=61972381
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201980025284.0A Active CN111971585B (zh) | 2018-04-12 | 2019-04-04 | 具有用于均匀成像的聚焦闪烁体结构的x射线探测器 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11614550B2 (https=) |
| EP (2) | EP3553568A1 (https=) |
| JP (2) | JP7442458B2 (https=) |
| CN (1) | CN111971585B (https=) |
| WO (1) | WO2019197263A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| PL3908856T3 (pl) | 2019-01-08 | 2025-09-08 | The Research Foundation For The State University Of New York | Światłowód pryzmatoidowy |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4709382A (en) * | 1984-11-21 | 1987-11-24 | Picker International, Inc. | Imaging with focused curved radiation detectors |
Family Cites Families (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5410156A (en) * | 1992-10-21 | 1995-04-25 | Miller; Thomas G. | High energy x-y neutron detector and radiographic/tomographic device |
| US5943388A (en) * | 1996-07-30 | 1999-08-24 | Nova R & D, Inc. | Radiation detector and non-destructive inspection |
| US5949850A (en) | 1997-06-19 | 1999-09-07 | Creatv Microtech, Inc. | Method and apparatus for making large area two-dimensional grids |
| WO2000025151A1 (en) * | 1998-10-28 | 2000-05-04 | Koninklijke Philips Electronics N.V. | Method of manufacturing a layered scintillation detector |
| US6175615B1 (en) | 1999-04-12 | 2001-01-16 | General Electric Company | Radiation imager collimator |
| US6473486B2 (en) | 2000-12-05 | 2002-10-29 | Ge Medical Systems Global Technology Co., Llc | System and method of computed tomography imaging using a focused scintillator and method of manufacturing |
| WO2005052637A1 (en) * | 2003-11-25 | 2005-06-09 | Philips Intellectual Property & Standards Gmbh | Scintillation layer for a pet-detector |
| DE102005010077B4 (de) * | 2005-03-04 | 2007-09-20 | Siemens Ag | Detektor mit einem Szintillator und bildgebendes Gerät, aufweisend einen derartigen Detektor |
| JP5600392B2 (ja) * | 2005-03-16 | 2014-10-01 | コーニンクレッカ フィリップス エヌ ヴェ | 検出器画素の感度層を有するx線検出器 |
| JP2007125086A (ja) * | 2005-11-01 | 2007-05-24 | Ge Medical Systems Global Technology Co Llc | X線検出器およびx線ct装置 |
| US7636419B1 (en) | 2006-02-21 | 2009-12-22 | Brett Kilgore Nelson | Method and apparatus for automated three dimensional dosimetry |
| EP1860679A1 (en) | 2006-05-23 | 2007-11-28 | ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik Mbh | Charged particle beam device with a gas field ion source and a gas supply system |
| US7692156B1 (en) * | 2006-08-23 | 2010-04-06 | Radiation Monitoring Devices, Inc. | Beam-oriented pixellated scintillators for radiation imaging |
| US8442184B2 (en) * | 2008-06-30 | 2013-05-14 | Koninklijke Philips Electronics N.V. | Spectral CT |
| WO2010018496A2 (en) | 2008-08-11 | 2010-02-18 | Koninklijke Philips Electronics N.V. | Radiation detector and method for preparing same |
| JP5604443B2 (ja) * | 2008-12-17 | 2014-10-08 | コーニンクレッカ フィリップス エヌ ヴェ | X線検査装置及び方法 |
| US8373132B2 (en) * | 2009-02-06 | 2013-02-12 | Koninklijke Philips Electronics N. V. | Radiation detector with a stack of scintillator elements and photodiode arrays |
| DE102011004918B4 (de) * | 2011-03-01 | 2013-05-02 | Siemens Aktiengesellschaft | Strahlungsdetektor, insbesondere Röntgenstrahlungsdetektor |
| US9012857B2 (en) * | 2012-05-07 | 2015-04-21 | Koninklijke Philips N.V. | Multi-layer horizontal computed tomography (CT) detector array with at least one thin photosensor array layer disposed between at least two scintillator array layers |
| US20150248782A1 (en) * | 2012-10-09 | 2015-09-03 | Koninklijke Philips N.V. | Quantitative spectral imaging |
| JP6052595B2 (ja) * | 2012-10-24 | 2016-12-27 | 日立金属株式会社 | シンチレータアレイの製造方法 |
| US9606244B2 (en) * | 2013-03-14 | 2017-03-28 | Varex Imaging Corporation | X-ray imager with lens array and transparent non-structured scintillator |
| RU2532645C1 (ru) * | 2013-04-29 | 2014-11-10 | Общество с ограниченной ответственностью "Научно-технический центр "МТ" (ООО "НТЦ-МТ") | Способ формирования структурированного сцинтиллятора на поверхности пикселированного фотоприемника (варианты) и сцинтилляционный детектор, полученнный данным способом (варианты) |
| CN104898157B (zh) * | 2014-03-04 | 2019-02-22 | 环境保护部核与辐射安全中心 | 中子剂量当量测量装置及测量方法 |
| WO2016074945A1 (en) * | 2014-11-13 | 2016-05-19 | Koninklijke Philips N.V. | Pixelated scintillator with optimized efficiency |
| US10295678B2 (en) * | 2015-03-10 | 2019-05-21 | Shimadzu Corporation | X-ray detector |
| US20170090042A1 (en) * | 2015-09-30 | 2017-03-30 | Varian Medical Systems, Inc. | Method for fabricating pixelated scintillators |
| US10509135B2 (en) * | 2016-09-09 | 2019-12-17 | Minnesota Imaging And Engineering Llc | Structured detectors and detector systems for radiation imaging |
| US10365383B2 (en) * | 2016-09-09 | 2019-07-30 | Minnesota Imaging And Engineering Llc | Structured detectors and detector systems for radiation imaging |
| US10274610B2 (en) * | 2016-09-09 | 2019-04-30 | Minnesota Imaging And Engineering Llc | Structured detectors and detector systems for radiation imaging |
| US20190353802A1 (en) | 2017-01-02 | 2019-11-21 | Koninklijke Philips N.V. | X-ray detector and x-ray imaging apparatus |
-
2018
- 2018-04-12 EP EP18167073.8A patent/EP3553568A1/en not_active Withdrawn
-
2019
- 2019-04-04 JP JP2020555896A patent/JP7442458B2/ja active Active
- 2019-04-04 CN CN201980025284.0A patent/CN111971585B/zh active Active
- 2019-04-04 WO PCT/EP2019/058471 patent/WO2019197263A1/en not_active Ceased
- 2019-04-04 US US17/046,105 patent/US11614550B2/en active Active
- 2019-04-04 EP EP19715097.2A patent/EP3776005B1/en active Active
-
2023
- 2023-12-18 JP JP2023212678A patent/JP2024026391A/ja not_active Withdrawn
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4709382A (en) * | 1984-11-21 | 1987-11-24 | Picker International, Inc. | Imaging with focused curved radiation detectors |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111971585A (zh) | 2020-11-20 |
| EP3776005B1 (en) | 2024-09-04 |
| JP2024026391A (ja) | 2024-02-28 |
| EP3553568A1 (en) | 2019-10-16 |
| WO2019197263A1 (en) | 2019-10-17 |
| US11614550B2 (en) | 2023-03-28 |
| JP2021521444A (ja) | 2021-08-26 |
| EP3776005A1 (en) | 2021-02-17 |
| JP7442458B2 (ja) | 2024-03-04 |
| US20210239860A1 (en) | 2021-08-05 |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |