CN111971585B - 具有用于均匀成像的聚焦闪烁体结构的x射线探测器 - Google Patents

具有用于均匀成像的聚焦闪烁体结构的x射线探测器 Download PDF

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Publication number
CN111971585B
CN111971585B CN201980025284.0A CN201980025284A CN111971585B CN 111971585 B CN111971585 B CN 111971585B CN 201980025284 A CN201980025284 A CN 201980025284A CN 111971585 B CN111971585 B CN 111971585B
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China
Prior art keywords
scintillator
detector
layer
elements
lss
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Chinese (zh)
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CN111971585A (zh
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H·施泰因豪泽
O·J·维默斯
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20186—Position of the photodiode with respect to the incoming radiation, e.g. in the front of, below or sideways the scintillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal

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  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201980025284.0A 2018-04-12 2019-04-04 具有用于均匀成像的聚焦闪烁体结构的x射线探测器 Active CN111971585B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP18167073.8A EP3553568A1 (en) 2018-04-12 2018-04-12 X-ray detector with focused scintillator structure for uniform imaging
EP18167073.8 2018-04-12
PCT/EP2019/058471 WO2019197263A1 (en) 2018-04-12 2019-04-04 X-ray detector with focused scintillator structure for uniform imaging

Publications (2)

Publication Number Publication Date
CN111971585A CN111971585A (zh) 2020-11-20
CN111971585B true CN111971585B (zh) 2024-11-12

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CN201980025284.0A Active CN111971585B (zh) 2018-04-12 2019-04-04 具有用于均匀成像的聚焦闪烁体结构的x射线探测器

Country Status (5)

Country Link
US (1) US11614550B2 (https=)
EP (2) EP3553568A1 (https=)
JP (2) JP7442458B2 (https=)
CN (1) CN111971585B (https=)
WO (1) WO2019197263A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11841470B2 (en) 2019-01-08 2023-12-12 The Research Foundation For The State University Of New York Prismatoid light guide

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4709382A (en) * 1984-11-21 1987-11-24 Picker International, Inc. Imaging with focused curved radiation detectors

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5410156A (en) * 1992-10-21 1995-04-25 Miller; Thomas G. High energy x-y neutron detector and radiographic/tomographic device
US5943388A (en) * 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
US5949850A (en) 1997-06-19 1999-09-07 Creatv Microtech, Inc. Method and apparatus for making large area two-dimensional grids
DE69927241T2 (de) * 1998-10-28 2006-06-29 Philips Intellectual Property & Standards Gmbh Verfahren zur herstellung eines geschichteten szintillationsdetektorelements
US6175615B1 (en) 1999-04-12 2001-01-16 General Electric Company Radiation imager collimator
US6473486B2 (en) 2000-12-05 2002-10-29 Ge Medical Systems Global Technology Co., Llc System and method of computed tomography imaging using a focused scintillator and method of manufacturing
JP2007514143A (ja) * 2003-11-25 2007-05-31 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Ｐｅｔ検出器用のシンチレーション層
DE102005010077B4 (de) * 2005-03-04 2007-09-20 Siemens Ag Detektor mit einem Szintillator und bildgebendes Gerät, aufweisend einen derartigen Detektor
WO2006097882A2 (en) * 2005-03-16 2006-09-21 Philips Intellectual Property & Standards Gmbh X-ray detector with in-pixel processing circuits
JP2007125086A (ja) 2005-11-01 2007-05-24 Ge Medical Systems Global Technology Co Llc Ｘ線検出器およびｘ線ｃｔ装置
US7636419B1 (en) 2006-02-21 2009-12-22 Brett Kilgore Nelson Method and apparatus for automated three dimensional dosimetry
EP1860679A1 (en) 2006-05-23 2007-11-28 ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik Mbh Charged particle beam device with a gas field ion source and a gas supply system
US7692156B1 (en) * 2006-08-23 2010-04-06 Radiation Monitoring Devices, Inc. Beam-oriented pixellated scintillators for radiation imaging
JP5715052B2 (ja) * 2008-06-30 2015-05-07 コーニンクレッカ フィリップス エヌ ヴェ 画像化システム及び画像化方法
WO2010018496A2 (en) 2008-08-11 2010-02-18 Koninklijke Philips Electronics N.V. Radiation detector and method for preparing same
CN102256548B (zh) * 2008-12-17 2014-03-05 皇家飞利浦电子股份有限公司 X射线检查装置及方法
US8373132B2 (en) * 2009-02-06 2013-02-12 Koninklijke Philips Electronics N. V. Radiation detector with a stack of scintillator elements and photodiode arrays
DE102011004918B4 (de) * 2011-03-01 2013-05-02 Siemens Aktiengesellschaft Strahlungsdetektor, insbesondere Röntgenstrahlungsdetektor
US9012857B2 (en) * 2012-05-07 2015-04-21 Koninklijke Philips N.V. Multi-layer horizontal computed tomography (CT) detector array with at least one thin photosensor array layer disposed between at least two scintillator array layers
JP2015532140A (ja) * 2012-10-09 2015-11-09 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． スペクトル画像診断のための方法及びシステム
JP6052595B2 (ja) * 2012-10-24 2016-12-27 日立金属株式会社 シンチレータアレイの製造方法
US9606244B2 (en) * 2013-03-14 2017-03-28 Varex Imaging Corporation X-ray imager with lens array and transparent non-structured scintillator
RU2532645C1 (ru) * 2013-04-29 2014-11-10 Общество с ограниченной ответственностью "Научно-технический центр "МТ" (ООО "НТЦ-МТ") Способ формирования структурированного сцинтиллятора на поверхности пикселированного фотоприемника (варианты) и сцинтилляционный детектор, полученнный данным способом (варианты)
CN104898157B (zh) * 2014-03-04 2019-02-22 环境保护部核与辐射安全中心 中子剂量当量测量装置及测量方法
WO2016074945A1 (en) * 2014-11-13 2016-05-19 Koninklijke Philips N.V. Pixelated scintillator with optimized efficiency
JP6384588B2 (ja) * 2015-03-10 2018-09-05 株式会社島津製作所 Ｘ線検出器
US20170090042A1 (en) * 2015-09-30 2017-03-30 Varian Medical Systems, Inc. Method for fabricating pixelated scintillators
US10509135B2 (en) * 2016-09-09 2019-12-17 Minnesota Imaging And Engineering Llc Structured detectors and detector systems for radiation imaging
US10365383B2 (en) * 2016-09-09 2019-07-30 Minnesota Imaging And Engineering Llc Structured detectors and detector systems for radiation imaging
US10274610B2 (en) * 2016-09-09 2019-04-30 Minnesota Imaging And Engineering Llc Structured detectors and detector systems for radiation imaging
US20190353802A1 (en) 2017-01-02 2019-11-21 Koninklijke Philips N.V. X-ray detector and x-ray imaging apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4709382A (en) * 1984-11-21 1987-11-24 Picker International, Inc. Imaging with focused curved radiation detectors

Also Published As

Publication number Publication date
JP7442458B2 (ja) 2024-03-04
JP2021521444A (ja) 2021-08-26
US20210239860A1 (en) 2021-08-05
US11614550B2 (en) 2023-03-28
JP2024026391A (ja) 2024-02-28
CN111971585A (zh) 2020-11-20
WO2019197263A1 (en) 2019-10-17
EP3553568A1 (en) 2019-10-16
EP3776005B1 (en) 2024-09-04
EP3776005A1 (en) 2021-02-17

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