CN111966593B - Method for realizing prenatal automatic compensation of chip test quantity - Google Patents

Abstract

The invention discloses a method for realizing prenatal automatic compensation of chip test quantity, which belongs to the field of integrated circuit semiconductor test. The original complex data acquisition, analysis, calculation and processing flow is eliminated, so that complex work which needs an engineer to do originally can be simply and quickly completed by a production line operator, much time is saved, the production capacity of a production line is improved, and the risk of volume production misdetection caused by manually modifying a fixed compensation value is avoided.

Description

Method for realizing prenatal automatic compensation of chip test quantity

Technical Field

The invention belongs to the field of integrated circuit semiconductor testing, and particularly relates to a method for realizing prenatal automatic compensation of chip testing quantity.

Background

The traditional chip test mass production does not have automatic compensation, and if the test data has deviation, the test data is compensated in a fixed compensation mode. However, the fixed compensation method requires manual data collection and analysis and calculation, and manual modification of the fixed compensation value. The method has complicated flow, delays the production line time, is not beneficial to improving the productivity, and is easy to make mistakes in manual modification, thus causing the error detection of mass production.

The original fixed compensation method needs an engineer to manually test a certain number of chips each time, and whether unsatisfactory data appears due to problems such as contact and the like is observed in the test process,

and after the test is finished, processing such as acquisition and calculation is carried out on the data, the obtained fixed compensation is manually filled into a program, and then the test mass production is carried out. Therefore, the time of normal mass production of a production line is delayed, the productivity is influenced, and even the risk of mis-filling exists, so that the misdetection of chips is caused. Therefore, an automatic compensation method for reducing complicated processes, saving process time, improving productivity and reducing errors is very important. The automatic compensation method does not need manual calculation, does not need to observe data in operation, does not need to manually fill in a fixed compensation value, and does not need worry about filling errors, so that chip test software automatically processes data and automatically compensates.

Disclosure of Invention

The technical problem to be solved by the invention is to provide a method for realizing the prenatal automatic compensation of the chip test quantity aiming at the defects of the background technology, which removes the original complicated flow of data acquisition, analysis, calculation and processing, so that the original complicated work required to be done by an engineer can be simply and quickly finished by a production line operator, thereby saving a lot of time, improving the productivity of the production line and avoiding the risk of volume production misdetection caused by manually modifying a fixed compensation value.

The invention adopts the following technical scheme for solving the technical problems:

a method for realizing the prenatal automatic compensation of chip test quantity includes setting three data files and utilizing software

The part function compares, judges and processes the test data automatically, and generates a compensation value automatically, thereby achieving the effect of automatic compensation, and specifically comprises the following steps:

step 1, inputting standard data of standard sample needing automatic compensation project

In the golden sample. ini file, simultaneously inputting the range of the automatic compensation value of the card control into the limit. ini file, and placing the two files under the specified road stress;

step 2, corresponding functions and instructions are set in the test program, and corresponding test data and instructions can be processed

Golden sample data is subjected to automatic subtraction processing, whether the golden sample data is in a set Limit range or not is judged, the obtained effective data can be automatically averaged to generate an offset.

Step 3, setting a total number of calibration in the test program, and selecting whether to carry out automatic compensation or not according to the prompt

Calibration, and this number needs to be less than the number of samples in golden sample;

step 4, calling the test program, running the test program, and if the test program has a pop-up frame prompt, performing self-test

And (5) performing dynamic compensation calibration.

As a further preferred scheme of the method for realizing the prenatal automatic compensation of the chip test quantity, the invention

The three data files include a golden sample. ini file, a limit. ini file, and an offset. ini file.

As a further preferable scheme of the method for implementing the prenatal automatic compensation of the chip test quantity, the step 4 specifically comprises the following steps;

step 4.1, calling the program, clicking once, popping up, and recalibrating, if not, not executing the program

Performing line calibration; if yes, the program enters an automatic compensation process, and the program is automatically opened to ensure that all items are tested;

step 4.2, sequentially popping up SITE1 for automatic compensation and SITE2 for automatic compensation; if yes, performing automatic compensation of the current SITE, otherwise, not performing;

step 4.3, if SITE1 and SITE2 both select to perform automatic compensation, selecting the number of the sample placed on the SITE1 clamp for testing at the moment, clicking OK, and if no error is reported, successfully compensating the sample, wherein the sample number disappears from a drop-down box;

step 4.4, then popping up a pop-up frame of SITE2, similarly, selecting the number of the sample tested on the SITE2 clamp, clicking OK, if no error report exists, the sample is successfully compensated, and the sample number disappears from the drop-down frame;

step 4.5, if the SITE is successfully calibrated for 6 times, a prompt that the SITE elastic frame automatic compensation is successful appears;

step 4.6, after the automatic compensation is completed, the automatic closing is stopped after the failure, and the normal mass production can be carried out

Compared with the prior art, the invention adopting the technical scheme has the following technical effects:

1. the invention removes the original complicated flow of data acquisition, analysis, calculation and processing, so that the original complicated work which needs an engineer to do can be simply and quickly completed by a production line operator, thereby saving much time, improving the productivity of the production line and avoiding the risk of volume production misdetection caused by manually modifying a fixed compensation value;

2. according to the invention, an engineer is not required to analyze and process data, so that the workload is reduced;

3. the invention can directly test the tested operator without waiting for the data of an engineer, thereby improving the efficiency and the productivity;

4. the interface of the invention has failure prompt, which item has a problem can be observed directly, and compensation can not be carried out;

5. the invention has simple operation, and an operator can operate according to the prompt, thereby removing the link of engineer operation.

Drawings

FIG. 1 is a flow chart of the present invention as an operation of the present invention for automatic compensation of SITE 2;

FIG. 2 is a diagram of a prompt for automatic compensation calibration;

FIG. 3 is a data display diagram of a test piece;

FIG. 4 is a diagram of selecting whether to calibrate one of multiple SITEs;

FIG. 5 is a numbered graph corresponding to the sample selection for calibration of SITE 1;

FIG. 6 is a numbered graph corresponding to the sample selection for calibration of SITE 2;

FIG. 7 is a diagram of an automatic compensation calibration success prompt;

fig. 8 is a diagram showing successful calibration followed by mass production.

Detailed Description

The technical scheme of the invention is further explained in detail by combining the attached drawings:

the scheme sets three data files, automatically compares and judges test data by using software functions

And (5) cutting off, processing and automatically generating a compensation value so as to achieve the effect of automatic compensation.

The three data files include a golden sample. ini file, a limit. ini file, and

ini file.

As shown in fig. 1, the method mainly comprises the following steps:

1. inputting standard data of a standard sample needing an automatic compensation project into a golden sample. ini file, inputting a range of a card control automatic compensation value into a limit. ini file, and placing the two files under a specified road force.

2. Corresponding functions and instructions are set in a test program, automatic subtraction processing can be carried out on corresponding test data and golden sample data, whether the test data and the golden sample data are within the set Limit range is judged, the obtained effective data can be automatically averaged to generate an offset.

3. A calibrated total is set in the program, which number needs to be less than the number of samples in the golden sample. The three parts are set for the engineer at one time when writing programs.

4. And in the actual operation 1, an operator calls a test program, runs the test program, and performs automatic compensation calibration if the test program is provided with a bullet frame prompt.

5. In practical operation 2, an operator only needs to sequentially test 10 numbered (taking 10 as an example) standard samples and select the current number during each test, if a certain item test value does not meet the requirement, a frame popping prompt is given, the next data is not calculated, the standard chip can be adjusted or replaced to continue automatic calibration, and after 10 calibration succeeds, automatic compensation is given.

In operation 3, when the completion of the automatic compensation is prompted, which means that the compensation value has been generated, the program can automatically read. The operator only needs to continue to test the mass production

The specific implementation mode is as follows:

step one, a program is called, clicking once, popping up (needing recalibration), and clicking no program to calibrate. And clicking (yes), and entering an automatic compensation process by the program. As shown in fig. 2. The program automatically opens to ensure that all items are tested. As shown in fig. 3. Fig. 3 is a data display diagram of one of the tests.

Step two, popping up [ SITE1 ] for automatic compensation in sequence [ SITE2 ] for automatic compensation

And if so, automatically compensating the current SITE, and otherwise, not performing. FIG. 4 is a diagram illustrating the selection of whether to calibrate one of multiple SITEs, as shown in FIG. 4.

And step three, taking the case that two SITEs are selected to perform automatic compensation, firstly, selecting the number of the sample placed on the SITE1 clamp for testing, clicking [ OK ], if no error is reported, successfully compensating the sample, and enabling the sample number to disappear from the drop-down frame. As shown in FIG. 5, FIG. 5 is a numbered graph corresponding to the selection of samples for calibration of SITE 1.

The frame of SITE2 was then popped, and likewise, the number of the sample tested on the SITE2 fixture was selected,

click [ OK ], if there is no error, the sample is compensated successfully, and the sample number disappears from the drop-down box. As shown in FIG. 6, FIG. 6 is a numbered graph corresponding to the selection of samples for calibration of SITE 2.

After 6 successful calibrations of the SITE (6 for example),

this sit bullet box auto-compensation success prompt will appear. As shown in fig. 7, fig. 7 is a diagram of automatic compensation calibration success.

And step four, after the automatic compensation is completed, the automatic closing is stopped after the failure, and normal mass production can be carried out. Fig. 8 is a diagram showing effects during and after the automatic compensation, and fig. 8 is a diagram showing successful calibration and subsequent mass production.

After 6 automatic compensations are successfully carried out, the numerical value in the program is changed, and the mass production work of chip testing can be directly carried out without any operation after the automatic compensation.

Wherein, the error-reporting prompt information of the pop-up frame, [ signal of the station ] [ test item ] [ value ] [ upper and lower limits ] is provided with a prompt if a certain calibration of the station fails in the calibration process, at this time, the error-reporting prompt information of the pop-up frame needs to be analyzed and adjusted or the chip needs to be replaced according to the prompt, and the error-reporting prompt information of the pop-up frame needs to be analyzed and adjusted or the chip needs to be replaced if a certain calibration of the station fails in the calibration process [ signal of the station ] [ test item ] value [ upper and lower limits ], the following prompt needs to be provided, at this time, the analysis, adjustment or the chip replacement needs to be performed according to the prompt.

The invention removes the original complicated flow of data acquisition, analysis, calculation and processing, so that the original complicated work which needs an engineer to do can be simply and quickly completed by a production line operator, thereby saving a lot of time, improving the productivity of the production line and avoiding the risk of volume production misdetection caused by manually modifying a fixed compensation value.

It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

The above embodiments are only for illustrating the technical idea of the present invention, and the protection scope of the present invention is not limited thereby, and any modifications made on the basis of the technical scheme according to the technical idea of the present invention fall within the protection scope of the present invention. While the embodiments of the present invention have been described in detail, the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art.

Claims (3)

1. A method for realizing prenatal automatic compensation of chip test quantity is characterized by comprising the following steps: by setting three data files, test data are automatically compared, judged and processed by using a software function, and a compensation value is automatically generated, so that the effect of automatic compensation is achieved, and the method specifically comprises the following steps:

step 1, inputting standard data of a standard sample needing an automatic compensation project into a golden sample. ini file, simultaneously inputting a range of a card control automatic compensation value into a limit. ini file, and placing the two files under a specified path;

step 2, setting corresponding functions and instructions in a test program, automatically subtracting corresponding test data and golden sample data, judging whether the corresponding test data and golden sample data are within a set Limit range, automatically averaging the obtained effective data to generate an offset.

Step 3, setting a total number of calibration in the test program, and selecting whether to carry out automatic compensation calibration according to a prompt, wherein the number is required to be smaller than the number of samples in the golden sample;

and 4, calling a test program, running the test program, and performing automatic compensation calibration if the test program has a popup frame prompt.

2. The method for realizing the prenatal automatic compensation of the chip test quantity as claimed in claim 1, wherein the method comprises the following steps: the three data files include a golden sample. ini file, a limit. ini file, and an offset. ini file.

3. The method for realizing the prenatal automatic compensation of the chip test quantity as claimed in claim 1, wherein the method comprises the following steps: the step 4 specifically comprises the following steps;

step 4.1, calling a program, clicking once, popping up the program which needs to be recalibrated, and if not, not calibrating the program; if yes, the program enters an automatic compensation process, and the program is automatically opened to ensure that all items are tested;

step 4.2, sequentially popping SITE1 for automatic compensation and SITE2 for automatic compensation; if yes, performing automatic compensation of the current SITE, otherwise, not performing;

step 4.3, if SITE1 and SITE2 both select to perform automatic compensation, selecting the number of the sample placed on the SITE1 clamp for testing at the moment, clicking OK, and if no error is reported, successfully compensating the sample, wherein the sample number disappears from a drop-down box;

step 4.4, then popping up a pop-up frame of SITE2, similarly, selecting the number of the sample tested on the SITE2 clamp, clicking OK, if no error report exists, the sample is successfully compensated, and the sample number disappears from the drop-down frame;

step 4.5, if the SITE is successfully calibrated for 6 times, a prompt that the SITE elastic frame automatic compensation is successful appears;

and 4.6, after the automatic compensation is completed, the automatic closing is stopped after the failure, and normal mass production can be carried out.

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