CN111966572B - Description method and device based on test description model facing signal - Google Patents
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
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Abstract
The disclosure provides a description method and a device based on a test description model facing signals, comprising the following steps: obtaining test information of a tested object, establishing or/and editing a test description model, and setting model information of the test description model; judging whether the model information of the test description model meets the set conditions or not; if the set condition is not met, firstly judging whether the elements in the test element library meet the requirements of the test description, if the elements do not meet the requirements, creating or modifying element model information by calling the test element library, and after modifying the element model information, judging whether the requirements of the test description are met again; continuing editing the test description model until the element model meets the requirement of the test description; if the set condition is met, saving a test description model of the set completion model information; automatically generating a test description model into a UUT model and a test description model; the automatic generation of the test description file is realized quickly, and the working efficiency of test experts is improved.
Description
Technical Field
The disclosure relates to a description method and a device based on a test description model facing signals.
Background
The automatic test software for the signals has the advantages of loose coupling of the test program and instrument resources, transplanting of the test program across the hardware platform, reusability of the test program in each stage of the life cycle of the product, synchronization of the development of the test system software and the development of the tested equipment and the like, and becomes a main technical approach of the international aviation and complex equipment test. The signal-oriented test description modeling is a work key point and a difficulty of test requirements analysis by a test expert, and is also a core step of test program development in automatic test software oriented to signals. The common signal-oriented test description modeling is completed by a test expert by adopting a commercial test description modeling tool. Commercial test description modeling tools often use controls such as text, forms, drop-down boxes, etc. to complete editing of test description information, but for some commonly used test elements such as connectors, level characteristics, etc. the test elements need to be created from scratch, and the created test elements cannot be reused in different models. The method for editing the test description model by using the commercial modeling tool increases the work difficulty and workload of test experts, and can not realize accumulation and multiplexing of the related knowledge of the test elements.
At present, a plurality of commercialized signal-oriented test description modeling tools exist, and most typically, a TRD design tool in a Guangzhou avionics corporation SGTS platform is provided, wherein the tool is internally provided with a label page such as tested unit information, test requirements, a test connection table and the like, inputs test description information in a text and table mode, and can generate a test description model file in a specific format.
The commercialized tool adopts common controls such as texts, tables, drop-down boxes and the like to realize the input and configuration of test description information, does not provide a graphical drag-and-drop and wire connection mode for editing, and some common and reusable connectors, level characteristics and other test elements do not provide a special library for management, so that the test description information needs to be created from scratch. The commercialized test description modeling method increases the difficulty and workload of test experts in performing test demand analysis, and cannot realize precipitation and multiplexing of test knowledge.
Disclosure of Invention
In order to solve the technical problems, the present disclosure provides a description method and a device for a test description model based on signals, which implement centralized management and continuous expansion of various element libraries for test description modeling, rapidly draw the test description model by directly selecting, connecting wires and the like from the element libraries, and automatically generate a test description model file conforming to the ATML standard.
In a first aspect, the present disclosure further provides a description method based on a signal-oriented test description model, including:
obtaining test information of a tested object, establishing or/and editing a test description model, and setting model information of the test description model;
Firstly judging whether elements in a test element library meet the requirements of test description, if not, carrying out new construction or modifying element model information by calling the test element library information, and after modifying the element model information, judging whether the requirements of the test description are met again; continuing editing the test description model until the element model meets the requirement of the test description; presetting a set condition, and if the set condition is met, storing a test description model of the set completion model information; the test description model is automatically generated as a test object (UUT) model and a test description model.
In a second aspect, the present disclosure further provides a description device based on a signal-oriented test description model, including:
The test description imaging editing module is configured to: obtaining test information of a tested object, establishing or/and editing a test description model, and setting model information of the test description model;
A test element library management module configured to: test elements that manage test description commonalities, including creating, querying, deleting, modifying test element information, are categorized into types including connectors, signal and signal level characteristics, and the like.
A standard model file generation module configured to: and inputting the information of the tested object into the setting completion model information to generate a UUT model, and generating test item information such as signals, signal operation, signal level, UUT pin matching relation and the like to generate a test description model.
In a third aspect, the present disclosure provides a computer-readable storage medium storing computer instructions that, when executed by a processor, perform the method of describing a signal-oriented test description model according to the first aspect.
In a fourth aspect, the present disclosure provides an electronic device comprising a memory and a processor, and computer instructions stored on the memory and running on the processor, which when executed by the processor, perform the method of describing a signal-oriented test description model according to the first aspect.
Compared with the prior art, the present disclosure has the following beneficial effects:
1. The method and the device for testing the test element library of the tested object provide the test process of the tested object to be described based on the test description model file, solve the problems that the current modeling tool is used for editing the test description model, the working difficulty and the workload of test experts are high, the accumulation and the multiplexing of the related knowledge of the test element cannot be realized, realize the graphical signal-oriented test description modeling environment, break through a data channel in a test element library, directly select test elements in the test element library for modeling of test description, and reduce the modeling difficulty and the workload.
2. The graphical signal-oriented test description modeling environment of the present disclosure establishes signal and tested object port connection, adds signal operation and set operation information, and establishes a pin matching relationship between a signal level and a tested object connector for each test item in sequence; the connection relation between the graphical drawing signals and the tested object interface is realized, the signal operation information of each signal is set in a graphical way, and the intuitiveness and convenience of user modeling are improved; the method realizes the centralized management of the test elements such as the connector, the level characteristic, the signal and the signal operation, supports the expansion, the upgrading and the updating of the test elements, and continuously accumulates the knowledge in the test description modeling process.
4. According to the method, the device and the system, the centralized management and continuous expansion of the test element library are realized through the test element library management module, the test description model is rapidly drawn in modes of direct selection, connection and the like from the element library, signal operation of each signal can be graphically set, signal-oriented test description modeling and automatic generation of test description files conforming to the ATML standard are rapidly realized, the problem that accumulation and multiplexing of related knowledge of the test elements cannot be realized at present is solved, the learning time, workload and working difficulty of test experts are reduced, the working efficiency of the test experts is improved, and continuous accumulation and multiplexing of the test knowledge are facilitated.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the application.
FIG. 1 is a schematic structural diagram of a description device of the signal-oriented test description model of the present disclosure;
FIG. 2 is a collaborative relationship structure diagram of a description device of the present disclosure based on a signal-oriented test description model;
FIG. 3 is a schematic structural diagram of a description method of the present disclosure based on a signal-oriented test description model;
FIG. 4 is a workflow diagram of a test element library management module of the present disclosure;
Fig. 5 is a workflow diagram of a standard model file generation module of the present disclosure.
The specific embodiment is as follows:
The disclosure is further described below with reference to the drawings and examples.
It should be noted that the following detailed description is exemplary and is intended to provide further explanation of the application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of exemplary embodiments according to the present application. As used herein, the singular is also intended to include the plural unless the context clearly indicates otherwise, and furthermore, it is to be understood that the terms "comprises" and/or "comprising" when used in this specification are taken to specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof.
Example 1
As shown in fig. 1, the present disclosure provides a description method based on a signal-oriented test description model, including:
obtaining test information of a tested object, establishing or/and editing a test description model, and setting model information of the test description model;
judging whether the model information of the test description model meets the set conditions or not; if the set condition is not met, creating or modifying an element model by calling the test element library, and judging whether the test description meets the set condition again after continuing modifying the test description model information; if the set condition is met, saving a test description model of the set completion model information;
And inputting the test information of the tested object into a test description model with the completion model information to generate a test description model file, and describing the test process of the tested object based on the test description model file.
Further, firstly judging whether the elements in the test element library meet the requirements of the test description, if not, carrying out new construction or modifying element model information by calling the test element library information, and after modifying the element model information, judging whether the elements meet the requirements of the test description again; continuing editing the test description model until the element model meets the requirement of the test description; presetting a set condition, and if the set condition is met, storing a test description model of the set completion model information; and automatically generating a UUT model and a test description model by the test description model.
Further, the specific steps of obtaining the test information of the tested object, establishing or/and editing a test description model and setting the model information of the test description model are as follows:
Establishing a test description model by using a test description imaging editing module;
Selecting a tested object from the test element library and editing tested object information;
Sequentially establishing test item information according to test information of a tested object;
and storing the test description model with the model information until the information of all the test items is built.
Further, the establishing test item information specifically includes:
Selecting test signals from the test element library, and sequentially inserting the test signals and setting the test signals for each test item;
establishing signal connection with the port of the tested object for each test item in sequence;
Selecting signal operation from the test element library, and adding signal operation and setting operation information for each test item in sequence;
and establishing a pin matching relation between the signal level and the tested object connector for each test item in sequence.
The measured object information is UUT information, including information such as the name, type, connector, signal port and the like of the UUT.
Further, the specific steps of creating or modifying the element model by calling the test element library are as follows:
The test element library management module is used for managing test description commonalities, and the test element is edited by newly building or opening the existing test element until the test element is completely defined; the test elements include information such as names, types, models, and the like.
The kinds of test elements are classified into connector, signal level, signal and signal operation, the connector includes information such as connector name, type, pin name list and pin position layout, the signal level includes information such as level name, type, level characteristic name list and level characteristic layout, the signal includes information such as signal name, type, signal attribute and signal port, and the signal operation includes operations such as signal setting, signal connection, signal port and signal resetting.
Further, the step of judging whether the model information of the test description model meets the set condition includes: judging whether the model information of the test description model meets the requirements or not, wherein the model information comprises whether the information of the tested object is set completely, whether the test item is set completely, whether the test signal is established completely, whether the connection line between the signal and the port of the tested object is set completely, and whether the signal operation addition and the operation information are set completely. Such as signal levels including level names, types, level characteristic name lists, level characteristic layouts, and the like, and if not all-round, the set conditions are not satisfied, and the model information is set by the test element library to satisfy the set conditions.
Further, the test description model of the tested object test information input setting completion model information generates a test description model file, and the test description model automatically generates a UUT model and a test description model.
Assigning the information of the connector and the signal port of the tested object in the test description model with the set completion model information to the tested object model object;
storing the tested object model object as a tested object model file conforming to the standard;
Creating a test description model object, and assigning test item information such as signals, signal operation, signal level and test object pin matching relation information in the test description model to the test description model object;
The test description model object is saved as a standard-compliant test description model file. Further, the tested object is tested based on the test description model file, for example, the functional performance index is tested, the data information of the functional performance index is obtained through the test description model file, and the data information is tested by using the test control equipment according to the data information, so that the test result of the functional performance index is obtained, the test efficiency and the test cost are improved, the study time, the workload and the work difficulty of the test expert are reduced, the work efficiency of the test expert is improved, and the continuous accumulation and multiplexing of the test knowledge are facilitated.
The method and the device realize specialization and standardization of test description modeling, reduce learning time, workload and work difficulty of test experts, improve work efficiency of the test experts, and facilitate continuous accumulation and multiplexing of test knowledge. The connection relation between the graphical drawing signals and the tested object interface is constructed, the modeling environment of signal operation of each signal is graphically set, the centralized management and continuous expansion of the test element library are realized, the test model is built in an accelerating way by selecting the required elements from the test element library, and the test description model automatically generates a test description model file conforming to the ATML standard. The method and the device are beneficial to continuously accumulating and multiplexing the test knowledge, reduce the learning time, workload and work difficulty of the test expert, and improve the work efficiency of the test expert.
Example 2
A description device based on a signal-oriented test description model, comprising:
The test description imaging editing module is configured to: obtaining test information of a tested object, establishing or/and editing a test description model, and setting model information of the test description model;
a test element library management module configured to: judging whether the model information of the test description model meets the set conditions or not; if the set condition is not met, judging whether the test description meets the set condition or not after the test description model information is modified by calling the new or modified element model information of the test element library; if the set condition is met, saving a test description model of the set completion model information;
A standard model file generation module configured to: and inputting the test information of the tested object into a test description model with the completion model information to generate a test description model file, and describing the test process of the tested object based on the test description model file.
Further, the test element library management module is further configured to: test elements that manage test description commonalities, including creating, querying, deleting, modifying test element information, are categorized into types including connectors, signal and signal level characteristics, and the like. The standard model file generation module is further configured to: and inputting the information of the tested object into the setting completion model information to generate a UUT model, and generating test item information such as signals, signal operation, signal level, UUT pin matching relation and the like to generate a test description model.
Further, the specific modes configured by the test description imaging editing module, the test description document generating module and the test element library management module correspond to the specific steps of the description method based on the signal-oriented test description model in the above embodiment respectively.
Specifically, the description device based on the test description model facing the signal is divided into a test description graphical editing module, a test element library management module and an ATML standard model file generation module, as shown in fig. 1. The test description graphical editing module is used for creating or opening an existing graphical test description model file and also supporting graphical editing of the test description model. The test element library management module is used for managing test elements of test description commonality, wherein the test elements comprise connectors, signals, signal level characteristics and the like. The ATML standard model file generation module converts the information in the model into a UUT model and a test description model file conforming to the ATML standard.
The three parts of the cooperative relationship is shown in fig. 2: firstly, a test description graphical editing module is operated to edit test description model information; secondly, judging whether the test description model editing meets the requirement, and ending the test description model editing if the test description model editing meets the requirement; if the requirements are not met, judging whether the existing test element library meets the requirements. Thirdly, if the existing test element library meets the requirement, continuing editing the graphical test description; if the requirements are not met, a test element library management module is operated, and test elements are created or modified; and finally judging whether the ATML standard model file needs to be operated, and if not, ending the flow. Otherwise, an ATML standard model generating module is operated to generate a UUT model and a test description model file.
The test description graphical editing module builds or opens an existing test description model, edits the information of a tested object (UUT) and sequentially inserts signals in the test process, sequentially establishes the signal connection relation between the signals and the UUT port, adds signal operation and sets operation information, establishes the signal level and the pin matching relation in the UUT connector until all the information is established, saves the model information as a test description model file, and the working flow is shown in figure 3. The UUT information includes information such as the name, type, connector, and signal port of the UUT.
And the test element library management module is used for creating or opening the existing test elements and editing the test elements until the definition of the test elements is complete, and the working flow is shown in figure 4. The types of the test elements are classified into connector, signal level, signal and signal operation, wherein the connector comprises information such as connector name, type, pin name list, pin position layout and the like, the signal level comprises information such as level name, type, level characteristic name list, level characteristic layout and the like, the signal comprises information such as signal name, type, signal attribute, signal port and the like, and the signal operation comprises information such as signal setting, signal connection, signal port, signal resetting and the like.
The ATML standard model file generating module firstly creates a UUT model object, assigns UUT connector and signal port information in the model to the UUT model object, and stores the UUT model object as a UUT model file conforming to the ATML standard; and secondly, creating a test description model object, assigning test item information such as signals, signal operation, signal level and UUT pin matching relation and the like in the model to the test description object, and storing the test description object as a test description model file conforming to the ATML standard. The specific workflow is shown in fig. 5.
In other embodiments, the present disclosure also provides:
a computer readable storage medium storing computer instructions that, when executed by a processor, perform the method of describing a signal-oriented test description model according to the above embodiment.
An electronic device comprising a memory and a processor and computer instructions stored on the memory and running on the processor, which when executed by the processor, perform the method of describing a signal-oriented test description model as described in the above embodiments.
While the specific embodiments of the present disclosure have been described above with reference to the drawings, it should be understood that the present disclosure is not limited to the embodiments, and that various modifications and changes can be made by one skilled in the art without inventive effort on the basis of the technical solutions of the present disclosure while remaining within the scope of the present disclosure.
Claims (8)
1. A description method based on a signal-oriented test description model, comprising:
obtaining test information of a tested object, establishing or/and editing a test description model, and setting model information of the test description model;
Judging whether the model information of the test description model meets the set conditions or not; if the set condition is not met, creating or modifying an element model by calling a test element library, modifying model information of the test description model, and judging whether the test description model meets the set condition again; if the set condition is met, saving a test description model of the set completion model information;
Inputting the test information of the tested object into a test description model with completion model information to generate a test description model file, and describing the test process of the tested object based on the test description model file;
The specific steps of acquiring the test information of the tested object, establishing or/and editing a test description model and setting the model information of the test description model are as follows:
Establishing a test description model by using a test description imaging editing module;
Selecting a tested object from the test element library and editing tested object information;
Sequentially establishing test item information according to test information of a tested object;
Storing a test description model with model information until the information of all test items is built;
the specific steps of creating or modifying the element model by calling the test element library are as follows:
The test element library management module is used for managing test description commonalities, and the test element is edited by newly building or opening the existing test element until the test element is completely defined; the test elements include name, type and model information.
2. The description method based on the signal-oriented test description model according to claim 1, wherein the establishing test item information specifically includes:
Selecting test signals from the test element library, and sequentially inserting the test signals and setting the test signals for each test item;
establishing signal connection with the port of the tested object for each test item in sequence;
Selecting signal operation from the test element library, and adding signal operation and setting operation information for each test item in sequence;
and establishing a pin matching relation between the signal level and the tested object connector for each test item in sequence.
3. The description method based on the test description model of claim 1, wherein the tested object information is UUT information, including a name, a type, a connector, and a signal port of UUT.
4. The description method of a signal-oriented test description model according to claim 1, the step of judging whether model information of the test description model satisfies a set condition includes: judging whether the model information of the test description model meets the requirements or not, wherein the model information comprises whether the information of the tested object is set completely, whether the test item is set completely, whether the test signal is established completely, whether the connection line between the signal and the port of the tested object is set completely, and whether the signal operation addition and the operation information are set completely.
5. The description method based on the signal-oriented test description model according to claim 1, wherein the test description model of the test information input setting completion model information of the tested object generates a test description model file, and the test process of the tested object is described based on the test description model file, specifically:
creating a model object of the object to be tested through a standard model file generating module;
assigning the information of the connector and the signal port of the tested object in the test description model with the set completion model information to the tested object model object;
storing the tested object model object as a tested object model file conforming to the standard;
Creating a test description model object through a standard model file generating module, and assigning test item information in the test description model to the test description model object, wherein the test item information comprises signals, signal operation and signal level and test object pin matching relation information;
The test description model object is saved as a standard-compliant test description model file.
6. A description device based on a signal-oriented test description model, comprising:
The test description imaging editing module is configured to: obtaining test information of a tested object, establishing or/and editing a test description model, and setting model information of the test description model;
A test element library management module configured to: test elements for managing test description commonalities, including creating, querying, deleting and modifying test element information, the test element classifications including connector, signal and signal level characteristic types;
A standard model file generation module configured to: inputting the information of the tested object into the setting completion model information to generate a UUT model, and generating the test item information into a test description model, wherein the test item information comprises signals, signal operation, signal level and UUT pin matching relation;
The specific steps of acquiring the test information of the tested object, establishing or/and editing a test description model and setting the model information of the test description model are as follows:
Establishing a test description model by using a test description imaging editing module;
Selecting a tested object from the test element library and editing tested object information;
Sequentially establishing test item information according to test information of a tested object;
and storing the test description model with the model information until the information of all the test items is built.
7. A computer readable storage medium storing computer instructions which, when executed by a processor, perform the method of describing a signal-oriented test description model according to any one of claims 1-5.
8. An electronic device comprising a memory and a processor and computer instructions stored on the memory and running on the processor, which when executed by the processor, perform the method of describing a signal-oriented test description model according to any one of claims 1-5.
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