CN111965860B - System and method for measuring response time of liquid crystal display - Google Patents
System and method for measuring response time of liquid crystal display Download PDFInfo
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- CN111965860B CN111965860B CN202010804314.2A CN202010804314A CN111965860B CN 111965860 B CN111965860 B CN 111965860B CN 202010804314 A CN202010804314 A CN 202010804314A CN 111965860 B CN111965860 B CN 111965860B
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- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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Abstract
The application discloses a measuring system and a measuring method for response time of a liquid crystal display, wherein the method comprises the following steps: acquiring a reference response time of the liquid crystal display at a reference temperature and a reference value of a liquid crystal parameter set; acquiring a first value of the liquid crystal parameter set at a first temperature; substituting the reference response time, the reference value and the first value into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature; compared with the prior art, the application can rapidly and accurately measure the response time of the liquid crystal display at different temperatures, is not limited by the influence of the temperature on the measuring equipment, and improves the applicability and convenience of measuring the response time of the liquid crystal display.
Description
Technical Field
The present application relates to the field of display driving technologies, and in particular, to a system and a method for measuring response time of a liquid crystal display.
Background
Liquid crystal is a special state in which a substance exists, and it is different from a solid crystal having a fixed shape and having anisotropy in optical properties (having optical properties such as birefringence) and from a liquid having isotropy in optical properties without a fixed shape, and liquid crystal is a viscous liquid having anisotropy in optical properties (having optical properties such as birefringence). Because of their special physical, chemical and optical properties, liquid crystals are widely used in the fields of display technology, various optical devices, etc., such as liquid crystal displays made of liquid crystals.
Currently, the main factor affecting the dynamic taste of a liquid crystal display is the response time of the liquid crystal, which is the speed of the response of each pixel point of the liquid crystal display to an input signal, i.e. the time required for the pixel to turn from dark to bright or from bright to dark (the principle is that a voltage is applied in the liquid crystal molecules to twist and recover the liquid crystal molecules). The shorter the response time, the less the user will feel the trailing effect when looking at the dynamic picture, and the liquid crystal display needs to adjust the response time of the liquid crystal, so that the response time becomes faster.
The existing liquid crystal display can formulate a response time specification and monitor response time data to reduce dynamic tailing, but the response time specification is generally defined at the temperature of 25 ℃ at a low temperature, the response time of the liquid crystal is slow, the dynamic tailing phenomenon is easy to occur, the temperature in different areas at the same time is obviously different, the temperature in winter in the same area is colder than that in summer, the dynamic tailing phenomenon is easy to occur in colder areas, and the high-rise period of the dynamic tailing phenomenon is also caused in winter, so that the response time in different temperatures needs to be monitored, proper specification is formulated to reduce the occurrence of the dynamic tailing phenomenon, but the measuring environment is difficult to support large-scale temperature adjustment, even in the environment with adjustable temperature, the measuring instrument is easy to atomize at a low temperature, the service life of the equipment is influenced, and the measurement of the response time of the liquid crystal at different temperatures is difficult to support.
Disclosure of Invention
The embodiment of the application provides a system and a method for measuring response time of a liquid crystal display, which can rapidly and accurately measure the response time of the liquid crystal display at different temperatures.
The embodiment of the application provides a method for measuring response time of a liquid crystal display, which comprises the following steps:
acquiring a reference response time of the liquid crystal display at a reference temperature and a reference value of a liquid crystal parameter set;
acquiring a first value of the liquid crystal parameter set at a first temperature; and
substituting the reference response time, the reference value and the first value into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature.
In one embodiment of the present application, the liquid crystal parameter set includes a liquid crystal viscosity coefficient, a liquid crystal difference in dielectric constant in horizontal and vertical directions, and a restoring force to which a liquid crystal is subjected to a horizontal rotation or a vertical rotation.
In one embodiment of the present application, the measurement formula includes:
wherein T is r first temperature For the rising response time at the first temperature, T f first temperature For the falling response time at the first temperature, gamma First temperature For the liquid crystal viscosity coefficient at the first temperature, delta epsilon First oneTemperature (temperature) K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature First temperature A restoring force T applied to the liquid crystal at the first temperature for horizontal or vertical rotation r reference temperature For the rising response time at the reference temperature, T f reference temperature Gamma is the response time to the decrease at the reference temperature Reference temperature For the viscosity coefficient of the liquid crystal at the reference temperature, delta epsilon Reference temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature Reference temperature Restoring force applied to the liquid crystal at the reference temperature by horizontal rotation or vertical rotation, and d is thickness of the liquid crystal box and epsilon 0 Vacuum dielectric constant, E is electric field strength.
In one embodiment of the application, the first response time includes a rising response time at the first temperature and a falling response time at the first temperature.
In one embodiment of the present application, the liquid crystal display includes a horizontal-deflection type liquid crystal or a vertical-deflection type liquid crystal.
According to the above object of the present application, there is provided a system for measuring response time of a liquid crystal display, comprising:
the measuring and acquiring module is used for acquiring a first value of the liquid crystal parameter set at the corresponding first temperature of the liquid crystal display, and a reference value and reference response time of the liquid crystal parameter set at the corresponding reference temperature; and
and the operation module substitutes the first numerical value, the reference numerical value and the reference response time into a measurement formula to obtain the first response time of the liquid crystal display at the first temperature.
In one embodiment of the present application, the liquid crystal parameter set includes a liquid crystal viscosity coefficient, a liquid crystal difference in dielectric constant in horizontal and vertical directions, and a restoring force to which a liquid crystal is subjected to a horizontal rotation or a vertical rotation.
In one embodiment of the present application, the measurement formula includes:
wherein T is r first temperature For the rising response time at the first temperature, T f first temperature For the falling response time at the first temperature, gamma First temperature For the liquid crystal viscosity coefficient at the first temperature, delta epsilon First temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature First temperature A restoring force T applied to the liquid crystal at the first temperature for horizontal or vertical rotation r reference temperature For the rising response time at the reference temperature, T f reference temperature Gamma is the response time to the decrease at the reference temperature Reference temperature For the viscosity coefficient of the liquid crystal at the reference temperature, delta epsilon Reference temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature Reference temperature Restoring force applied to the liquid crystal at the reference temperature by horizontal rotation or vertical rotation, and d is thickness of the liquid crystal box and epsilon 0 Vacuum dielectric constant, E is electric field strength.
In one embodiment of the application, the first response time includes a rising response time at the first temperature and a falling response time at the first temperature.
In one embodiment of the present application, the liquid crystal display includes a horizontal-deflection type liquid crystal or a vertical-deflection type liquid crystal.
The application has the beneficial effects that: according to the application, the liquid crystal display response time at the reference temperature, the liquid crystal parameter set and the liquid crystal parameter set at the first temperature are obtained by establishing the measurement formula, and the values are substituted into the measurement formula, so that the liquid crystal display response time at the first temperature can be rapidly and accurately obtained.
Drawings
The technical solution and other advantageous effects of the present application will be made apparent by the following detailed description of the specific embodiments of the present application with reference to the accompanying drawings.
FIG. 1 is a flow chart of a method for measuring response time of a liquid crystal display according to an embodiment of the application.
FIG. 2 is a bar chart of gray scale response time at 25deg.C according to an embodiment of the present application.
FIG. 3 is a bar chart of gray scale response time at 10deg.C according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. It will be apparent that the described embodiments are only some, but not all, embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to fall within the scope of the application.
In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more of the described features. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In the description of the present application, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically connected, electrically connected or can be communicated with each other; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art according to the specific circumstances.
In the present application, unless expressly stated or limited otherwise, a first feature "above" or "below" a second feature may include both the first and second features being in direct contact, as well as the first and second features not being in direct contact but being in contact with each other through additional features therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly under and obliquely below the second feature, or simply means that the first feature is less level than the second feature.
The following disclosure provides many different embodiments, or examples, for implementing different features of the application. In order to simplify the present disclosure, components and arrangements of specific examples are described below. They are, of course, merely examples and are not intended to limit the application. Furthermore, the present application may repeat reference numerals and/or letters in the various examples, which are for the purpose of brevity and clarity, and which do not themselves indicate the relationship between the various embodiments and/or arrangements discussed. In addition, the present application provides examples of various specific processes and materials, but one of ordinary skill in the art will recognize the application of other processes and/or the use of other materials.
The embodiment of the application provides a system and a method for measuring response time of a liquid crystal display, which can rapidly and accurately measure the response time of the liquid crystal display at different temperatures.
The embodiment of the application provides a method for measuring response time of a liquid crystal display, which comprises the following steps:
acquiring a reference response time of the liquid crystal display at a reference temperature and a reference value of a liquid crystal parameter set;
acquiring a first value of the liquid crystal parameter set at a first temperature; and
substituting the reference response time, the reference value and the first value into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature.
In the implementation and application process, the existing liquid crystal display is subjected to serious influence on the display effect due to the generation of dynamic tailing phenomenon, in the prior art, response time specification is formulated for the liquid crystal display, response time data is monitored so as to achieve the purpose of reducing dynamic tailing, but the response time specification is generally defined at the temperature of 25 ℃ in a low-temperature environment, the response time of liquid crystal is slow, dynamic tailing phenomenon is easy to occur, the temperatures in different areas at the same time are obviously different, the temperature in winter in the same area is also cooler than that in summer, the dynamic tailing phenomenon is easy to occur in the colder area, and the winter is also the high-incidence period of the dynamic tailing phenomenon, so that the response time in different temperatures needs to be monitored, the response time is formulated to reduce the generation of the dynamic tailing phenomenon, but the measuring environment is difficult to support large-amplitude temperature adjustment, and even in the temperature-adjustable environment, a lens is easy to atomize at the low temperature to influence the service life of equipment.
It should be noted that, at different temperatures, the liquid crystal characteristics change, that is, the liquid crystal parameter set changes, so as to affect the response time, and by measuring the liquid crystal parameter set that changes at different temperatures, the change amount of the liquid crystal parameter set at different temperatures relative to the reference temperature can be calculated, so that the response time at different temperatures can be obtained by deduction and calculation.
Referring to fig. 1, a method for measuring response time of a liquid crystal display according to an embodiment of the application includes:
s10, acquiring reference response time of the liquid crystal display at a reference temperature and reference values of a liquid crystal parameter set.
In the embodiment of the application, the liquid crystal parameter set includes a liquid crystal viscosity coefficient, a liquid crystal dielectric constant difference in horizontal and vertical directions, and a restoring force applied to a liquid crystal by a horizontal rotation or a vertical rotation, and the above parameters are easily affected by temperature, and change to affect a response time, and in addition, the liquid crystal parameter set includes a liquid crystal cell thickness, a vacuum dielectric constant, and an electric field strength, and the liquid crystal cell thickness and the electric field strength are not easily affected by temperature, and can be regarded as a constant value, the vacuum dielectric constant is an electric constant, and the value is epsilon 0 = 8.854187817 ×10-12F/m (approximation), and thus the parameters that change include the liquid crystal viscosity coefficient, the difference in dielectric constant between the horizontal and vertical directions of the liquid crystal, and the restoring force to which the liquid crystal is subjected to horizontal or vertical rotation.
In the step S10, a rising response time T at the reference temperature is obtained r reference temperature A falling response time T at the reference temperature f reference temperature The liquid crystal viscosity coefficient gamma at the reference temperature Reference temperature At the reference temperatureDielectric constant difference delta epsilon between horizontal and vertical directions of liquid crystal Reference temperature A restoring force K applied to the liquid crystal at the reference temperature by the horizontal or vertical rotation Reference temperature And cell thickness d, vacuum dielectric constant ε 0 And electric field strength E.
S20, acquiring a first value of the liquid crystal parameter set at a first temperature.
Acquiring the liquid crystal viscosity coefficient gamma at the first temperature First temperature The dielectric constant difference delta epsilon between the horizontal and vertical directions of the liquid crystal at the first temperature First temperature A restoring force K applied to the liquid crystal at the first temperature by the horizontal or vertical rotation First temperature 。
S30, substituting the reference response time, the reference value and the first value into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature.
Specifically, the following is a calculation formula of the response time of the liquid crystal display:
wherein T is r For rising response time (i.e. response time from low gray level to high gray level), gamma is the liquid crystal viscosity coefficient, ε 0 The dielectric constant of vacuum is delta epsilon, the dielectric constant of liquid crystal in the horizontal and vertical directions is different, K is the restoring force applied to the rotation of the liquid crystal in the horizontal plane or the vertical plane, T f To decrease the response time (i.e., the response time from high gray scale to low gray scale), and d is the cell thickness and E is the electric field strength.
In the embodiment of the present application, the reference temperature is used as a standard, and the response time of the first temperature is calculated by deducting the variation of the liquid crystal parameter set at the first temperature relative to the liquid crystal parameter set at the reference temperature, so that the measurement formula can be deduced according to the above formula:
wherein T is r first temperature For the rising response time at the first temperature, T f first temperature For the falling response time at the first temperature, gamma First temperature For the liquid crystal viscosity coefficient at the first temperature, delta epsilon First temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature First temperature A restoring force T applied to the liquid crystal at the first temperature for horizontal or vertical rotation r reference temperature For the rising response time at the reference temperature, T f reference temperature Gamma is the response time to the decrease at the reference temperature Reference temperature For the viscosity coefficient of the liquid crystal at the reference temperature, delta epsilon Reference temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature Reference temperature Restoring force applied to the liquid crystal at the reference temperature by horizontal rotation or vertical rotation, and d is thickness of the liquid crystal box and epsilon 0 Vacuum dielectric constant, E is electric field strength.
Therefore, substituting the reference values, the reference liquid crystal response time, and the first values obtained in the step S10 and the step S20 into the measurement formula to obtain the rising response time T at the first temperature r first temperature And a falling response time T at the first temperature f first temperature Further, the first response time includes a rising response time T at the first temperature r first temperature And a falling response time T at the first temperature f first temperature The response time can be the average response time of gray level variation to exclude individual numberErrors or differences in the data.
It should be noted that, in the embodiment of the present application, a test may be performed to obtain values corresponding to the liquid crystal parameter sets at different temperatures, and a database is established.
In summary, the embodiment of the application can quickly calculate the response time of the liquid crystal display at different temperatures by establishing the measurement formula, is not limited by the influence of the temperature on the measurement equipment, improves the applicability and convenience of the measurement of the response time of the liquid crystal display, can quickly obtain the response time of the liquid crystal display at different temperatures by the measurement method of the response time of the liquid crystal display provided by the embodiment of the application, and formulates products with proper specifications to improve the display effect.
In one embodiment of the application, the liquid crystal display comprises a horizontal plane-switching liquid crystal, such as an IPS/FFS liquid crystal display.
In the present embodiment, the liquid crystal parameter set susceptible to temperature includes a liquid crystal viscosity coefficient γ, a liquid crystal horizontal and vertical dielectric constant difference Δε, and a restoring force K that the liquid crystal is subjected to in-plane rotation 1 Thus, the rise response time T is calculated at the measurement r When (response time from low gray level to high gray level), the liquid crystal viscosity coefficient gamma, the dielectric constant difference delta epsilon between the horizontal and vertical directions of the liquid crystal and the restoring force K applied to the rotation of the horizontal plane of the liquid crystal at different temperatures are obtained through measurement 1 The value and the variation of the temperature sensor can measure and calculate the rising response time T at different temperatures r Similarly, the falling response time T is calculated by measurement f (response time from high gray level to low gray level) and the liquid crystal viscosity coefficient gamma at different temperatures and the restoring force K applied to the rotation of the liquid crystal level are obtained by measurement 1 The values and the variation of the temperature coefficient can be measured and calculated to obtain the falling response time T at different temperatures f Is a numerical value of (c) and its variation.
Specifically, the rising response time T at the reference temperature is first obtained r reference temperature The reference temperatureFalling response time T in degrees f reference temperature The liquid crystal viscosity coefficient gamma at the reference temperature Reference temperature The dielectric constant difference Deltaε between the horizontal and vertical directions of the liquid crystal at the reference temperature Reference temperature A restoring force K applied to the rotation of the liquid crystal level at the reference temperature 1 reference temperature And cell thickness d, vacuum dielectric constant ε 0 And electric field strength E.
Then obtaining the liquid crystal viscosity coefficient gamma at the first temperature First temperature The dielectric constant difference delta epsilon between the horizontal and vertical directions of the liquid crystal at the first temperature First temperature A restoring force K applied to the liquid crystal level rotation at the first temperature 1 first temperature 。
And the parameters are brought into the measurement formula to obtain the rising response time T at the first temperature r first temperature The falling response time T at the first temperature f first temperature The first response time of the liquid crystal display can be obtained.
In another embodiment of the application, the liquid crystal display comprises a vertical plane-switching liquid crystal, such as a VA liquid crystal display.
In the present embodiment, the liquid crystal parameter sets susceptible to temperature include the liquid crystal viscosity coefficient γ, the liquid crystal horizontal and vertical dielectric constant difference Δε, and the restoring force K that the liquid crystal is subjected to in-plane rotation 2 Thus, the rise response time T is calculated at the measurement r When (response time from low gray level to high gray level), the liquid crystal viscosity coefficient gamma, the dielectric constant difference delta epsilon between the horizontal and vertical directions of the liquid crystal and the restoring force K received by the vertical plane rotation of the liquid crystal at different temperatures are obtained through measurement 2 The value and the variation of the temperature sensor can measure and calculate the rising response time T at different temperatures r Similarly, the falling response time T is calculated by measurement f (response time from high gray level to low gray level) and the liquid crystal viscosity coefficient gamma at different temperatures and the restoring force K applied to the rotation of the vertical plane of the liquid crystal are obtained by measurement 2 The values and the variation of the temperature coefficient can be measured and calculated to obtain the falling response time T at different temperatures f Is a numerical value of (1) and its variables.
Specifically, the rising response time T at the reference temperature is first obtained r reference temperature A falling response time T at the reference temperature f reference temperature The liquid crystal viscosity coefficient gamma at the reference temperature Reference temperature The dielectric constant difference Deltaε between the horizontal and vertical directions of the liquid crystal at the reference temperature Reference temperature A restoring force K applied to the vertical plane rotation of the liquid crystal at the reference temperature 2 reference temperature And cell thickness d, vacuum dielectric constant ε 0 And electric field strength E.
Then obtaining the liquid crystal viscosity coefficient gamma at the first temperature First temperature The dielectric constant difference delta epsilon between the horizontal and vertical directions of the liquid crystal at the first temperature First temperature A restoring force K applied to the vertical plane rotation of the liquid crystal at the first temperature 2 first temperature 。
And the parameters are brought into the measurement formula to obtain the rising response time T at the first temperature r first temperature The falling response time T at the first temperature f first temperature The first response time of the liquid crystal display can be obtained.
In the following, the vertical plane deflection type liquid crystal is taken as an example, the method for measuring the response time of the liquid crystal display provided by the embodiment of the application is used for verification, and the calculation process of the falling response time is taken as an example for explanation.
Wherein the reference temperature is selected to be normal temperature (25 ℃), the first temperature is 10 ℃, the falling response time at 25 ℃ and 10 ℃ is measured, please refer to fig. 2 and 3, fig. 2 is a response time bar chart of gray scale change at 25 ℃, fig. 3 is a response time bar chart of gray scale change at 10 ℃, wherein the vertical axis represents response time, the horizontal axis represents gray scale change, and the average response time is taken for the values, and the obtained results are shown in the following table one:
list one
| 25℃ | 10℃ | 10℃/25℃ | |
| T f | 15.2ms | 30.6ms | 2.0 |
In addition, according to the method for measuring response time of the liquid crystal display provided by the embodiment of the application, the descending response time is calculated, the values of the liquid crystal parameter set at 25 ℃ and the values of the liquid crystal parameter set at 10 ℃ are obtained, and the results are shown in the following table two through the measurement formula:
watch II
The response time of the liquid crystal display at 10 ℃ obtained by the measurement formula provided by the embodiment of the application is twice the response time of the liquid crystal display at 25 ℃, and the result is the same as the result measured in the table one, namely the measurement method of the response time of the liquid crystal display provided by the embodiment of the application is fast, effective and accurate.
In addition, the embodiment of the application also provides a system for measuring the response time of the liquid crystal display, which comprises: the measuring and acquiring module is used for acquiring a first value of the liquid crystal display corresponding to the liquid crystal parameter set at the first temperature, and a reference value and reference response time of the liquid crystal parameter set at the reference temperature; and the operation module substitutes the first numerical value, the reference numerical value and the reference response time into a measurement formula to obtain the first response time of the liquid crystal display at the first temperature.
Specifically, the liquid crystal parameter set includes a liquid crystal viscosity coefficient, a liquid crystal dielectric constant difference in horizontal and vertical directions, and a restoring force applied to a liquid crystal by a liquid crystal horizontal plane rotation or a liquid crystal vertical plane rotation, and the above parameters are easily affected by temperature, change to affect a response time, and further includes a liquid crystal cell thickness, a vacuum dielectric constant, and an electric field strength, and the liquid crystal cell thickness and the electric field strength are not easily affected by temperature, and can be regarded as a constant value, the vacuum dielectric constant is an electric constant, and the value is ε 0 The parameters that change include the liquid crystal viscosity coefficient, the difference between the dielectric constants of the liquid crystal in the horizontal and vertical directions, and the restoring force to which the liquid crystal is rotated in the horizontal or vertical direction, and it is noted that the liquid crystal display includes a horizontal-deflection-type liquid crystal or a vertical-deflection-type liquid crystal, wherein the parameters corresponding to the horizontal-deflection-type liquid crystal include the liquid crystal viscosity coefficient, the difference between the dielectric constants of the liquid crystal in the horizontal and vertical directions, and the restoring force to which the liquid crystal is rotated in the horizontal plane, and the parameters corresponding to the vertical-deflection-type liquid crystal include the liquid crystal viscosity coefficient, the difference between the dielectric constants of the liquid crystal in the horizontal and vertical directions, and the restoring force to which the liquid crystal is rotated in the vertical direction.
The embodiment of the application can also carry out test to obtain the values corresponding to the liquid crystal parameter sets at different temperatures, establish a database, and rapidly acquire the liquid crystal parameter sets at different temperatures when the response time is required to be measured so as to improve the efficiency.
Further, the measurement formula includes:
wherein T is r first temperature For the rising response time at the first temperature, T f first temperature For the falling response time at the first temperature, gamma First temperature For the liquid crystal viscosity coefficient at the first temperature, delta epsilon First temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature First temperature A restoring force T applied to the liquid crystal at the first temperature for horizontal or vertical rotation r reference temperature For the rising response time at the reference temperature, T f reference temperature Gamma is the response time to the decrease at the reference temperature Reference temperature For the viscosity coefficient of the liquid crystal at the reference temperature, delta epsilon Reference temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature Reference temperature Restoring force applied to the liquid crystal at the reference temperature by horizontal rotation or vertical rotation, and d is thickness of the liquid crystal box and epsilon 0 The vacuum dielectric constant and E are the electric field intensity, wherein the first response time comprises the rising response time T at the first temperature r first temperature And a falling response time T at the first temperature f first temperature 。
In summary, the embodiment of the application can quickly calculate the response time of the liquid crystal display at different temperatures by establishing the measurement formula, is not limited by the influence of the temperature on the measurement equipment, improves the applicability and convenience of the measurement of the response time of the liquid crystal display, can quickly obtain the response time of the liquid crystal display at different temperatures by the measurement method of the response time of the liquid crystal display provided by the embodiment of the application, and formulates products with proper specifications to improve the display effect.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and for parts of one embodiment that are not described in detail, reference may be made to related descriptions of other embodiments.
The system and the method for measuring the response time of the liquid crystal display provided by the embodiment of the application are described in detail, and specific examples are applied to the explanation of the principle and the implementation mode of the application, and the explanation of the above examples is only used for helping to understand the technical scheme and the core idea of the application; those of ordinary skill in the art will appreciate that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the application.
Claims (8)
1. A method for measuring response time of a liquid crystal display, the method comprising:
establishing a database, wherein the database comprises a plurality of numerical values corresponding to liquid crystal parameter sets at different temperatures;
acquiring a reference response time of the liquid crystal display at a reference temperature and a reference value of the liquid crystal parameter set;
acquiring a first value of the liquid crystal parameter set at a first temperature; and
substituting the reference response time, the reference value and the first value into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature;
the measurement formula comprises:
wherein T is r first temperature For the rising response time at the first temperature, T f first temperature For the falling response time at the first temperature, gamma First temperature For the liquid crystal viscosity coefficient at the first temperature, delta epsilon First temperature For the liquid crystal horizontal and vertical directions at the first temperatureDifference in dielectric constant, K First temperature A restoring force T applied to the liquid crystal at the first temperature for horizontal or vertical rotation r reference temperature For the rising response time at the reference temperature, T f reference temperature Gamma is the response time to the decrease at the reference temperature Reference temperature For the viscosity coefficient of the liquid crystal at the reference temperature, delta epsilon Reference temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature Reference temperature Restoring force applied to the liquid crystal at the reference temperature by horizontal rotation or vertical rotation, and d is thickness of the liquid crystal box and epsilon 0 Vacuum dielectric constant, E is electric field strength.
2. The method of claim 1, wherein the set of liquid crystal parameters includes a liquid crystal viscosity coefficient, a liquid crystal horizontal and vertical dielectric constant difference, and a restoring force applied to a liquid crystal horizontal or vertical rotation.
3. The method of claim 1, wherein the first response time includes a rising response time at the first temperature and a falling response time at the first temperature.
4. The method of claim 1, wherein the liquid crystal display comprises a horizontally-polarized liquid crystal or a vertically-polarized liquid crystal.
5. A system for measuring response time of a liquid crystal display, comprising:
the database comprises a plurality of numerical values corresponding to liquid crystal parameter sets at different temperatures;
the measurement acquisition module is used for acquiring a first value of the liquid crystal parameter set at a first temperature corresponding to the liquid crystal display, and a reference value and a reference response time of the liquid crystal parameter set at a reference temperature corresponding to the liquid crystal display; and
the operation module substitutes the first numerical value, the reference numerical value and the reference response time into a measurement formula to obtain first response time of the liquid crystal display at the first temperature;
the measurement formula comprises:
wherein T is r first temperature For the rising response time at the first temperature, T f first temperature For the falling response time at the first temperature, gamma First temperature For the liquid crystal viscosity coefficient at the first temperature, delta epsilon First temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature First temperature A restoring force T applied to the liquid crystal at the first temperature for horizontal or vertical rotation r reference temperature For the rising response time at the reference temperature, T f reference temperature Gamma is the response time to the decrease at the reference temperature Reference temperature For the viscosity coefficient of the liquid crystal at the reference temperature, delta epsilon Reference temperature K is the difference of dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature Reference temperature Restoring force applied to the liquid crystal at the reference temperature by horizontal rotation or vertical rotation, and d is thickness of the liquid crystal box and epsilon 0 Vacuum dielectric constant, E is electric field strength.
6. The system of claim 5, wherein the set of liquid crystal parameters includes a liquid crystal viscosity coefficient, a liquid crystal horizontal and vertical dielectric constant difference, and a restoring force applied by a liquid crystal horizontal or vertical rotation.
7. The system of claim 5, wherein the first response time comprises a rising response time at the first temperature and a falling response time at the first temperature.
8. The system of claim 5, wherein the LCD comprises a horizontally-polarized liquid crystal or a vertically-polarized liquid crystal.
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