CN111965860A - System and method for measuring response time of liquid crystal display - Google Patents
System and method for measuring response time of liquid crystal display Download PDFInfo
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- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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Abstract
The application discloses a system and a method for measuring response time of a liquid crystal display, wherein the method comprises the following steps: acquiring a reference response time of the liquid crystal display at a reference temperature and a reference numerical value of a liquid crystal parameter set; acquiring a first numerical value of the liquid crystal parameter group at a first temperature; substituting the reference response time, the reference value and the first value into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature; compared with the prior art, the method and the device can be used for quickly and accurately measuring the response time of the liquid crystal display at different temperatures, are not limited by the influence of the temperature on measuring equipment any more, and improve the applicability and convenience for measuring the response time of the liquid crystal display.
Description
Technical Field
The present disclosure relates to display driving technologies, and in particular, to a system and a method for measuring response time of a liquid crystal display.
Background
Liquid crystal is a special state in which a substance exists, and is different from a solid crystal having a fixed shape and anisotropy in optical properties (having optical properties such as birefringence) and a liquid having no fixed shape and isotropy in optical properties, and is a viscous liquid having anisotropy in optical properties (having optical properties such as birefringence). Because of its special physical, chemical and optical properties, liquid crystal is widely used in the fields of display technology, various optical devices, etc., such as liquid crystal displays made of liquid crystal.
At present, the main factor influencing the dynamic taste of the lcd is the liquid crystal response time, which is the speed of each pixel point of the lcd reacting to the input signal, i.e. the time required for the pixel to turn from dark to light or from light to dark (the principle is to apply a voltage in the liquid crystal molecules to twist and recover the liquid crystal molecules). The shorter the response time, the less the user feels the trailing image when viewing the dynamic image, and the response time of the liquid crystal display is adjusted to be faster.
The existing liquid crystal display will make a response time specification and monitor the response time data to reduce the dynamic tailing, but the response time specification is generally defined at a normal temperature of 25 ℃, in a low-temperature environment, the response time of the liquid crystal is slowed, the phenomenon of dynamic tailing is easily caused, the temperature of different areas at the same time can be obviously different, the temperature of the same area in winter is also colder than that of the same area in summer, the dynamic trailing phenomenon is easy to generate in the area with cold weather, and the dynamic trailing phenomenon is also the high-rise period of the dynamic trailing phenomenon in winter, therefore, it is necessary to monitor the response time at different temperatures and to set up appropriate specifications to reduce the generation of dynamic tailing phenomenon, but the measurement environment is difficult to support large-scale temperature adjustment, even in the environment with adjustable temperature, the lens of the measuring instrument is easy to atomize at low temperature, which affects the service life of the device, so that the measurement of the response time of the liquid crystal at different temperatures is difficult to support.
Disclosure of Invention
The embodiment of the application provides a system and a method for measuring the response time of a liquid crystal display, which can quickly and accurately measure the response time of the liquid crystal display at different temperatures.
The embodiment of the application provides a method for measuring the response time of a liquid crystal display, which comprises the following steps:
acquiring a reference response time of the liquid crystal display at a reference temperature and a reference numerical value of a liquid crystal parameter set;
acquiring a first numerical value of the liquid crystal parameter group at a first temperature; and
and substituting the reference response time, the reference numerical value and the first numerical value into a measurement formula to obtain the first response time of the liquid crystal display at the first temperature.
In one embodiment of the present application, the set of liquid crystal parameters includes a liquid crystal viscosity coefficient, a difference in dielectric constant between horizontal and vertical directions of the liquid crystal, and a restoring force to which a horizontal or vertical rotation of the liquid crystal is subjected.
In an embodiment of the present application, the measurement formula includes:
wherein, Tr first temperatureIs the rise response time, T, at said first temperaturef first temperatureIs the falling response time at said first temperature, γFirst temperatureIs the liquid crystal viscosity coefficient at said first temperature, ΔFirst temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature, KFirst temperatureThe restoring force, T, applied to the horizontal or vertical rotation of the liquid crystal at the first temperaturer reference temperatureIs the rise response time, T, at the reference temperaturef reference temperatureIs the falling response time at the reference temperature, gammaReference temperatureIs the liquid crystal viscosity coefficient at the reference temperature, ΔReference temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature, KReference temperatureIs a restoring force to which the liquid crystal is subjected by the horizontal plane rotation or the vertical plane rotation at the reference temperature, and d is a liquid crystal cell thickness,0The dielectric constant in vacuum, and E the electric field strength.
In one embodiment of the present application, the first response time includes a rise response time at the first temperature and a fall response time at the first temperature.
In one embodiment of the present application, the liquid crystal display includes a horizontal deflection type liquid crystal or a vertical deflection type liquid crystal.
According to the above object of the present application, a system for measuring response time of a liquid crystal display is provided, which comprises:
the measurement acquisition module is used for acquiring a first numerical value of the liquid crystal parameter set of the liquid crystal display at a first temperature, a reference numerical value of the liquid crystal parameter set at a reference temperature and a reference response time; and
and the operation module substitutes the first numerical value, the reference numerical value and the reference response time into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature.
In one embodiment of the present application, the set of liquid crystal parameters includes a liquid crystal viscosity coefficient, a difference in dielectric constant between horizontal and vertical directions of the liquid crystal, and a restoring force to which a horizontal or vertical rotation of the liquid crystal is subjected.
In an embodiment of the present application, the measurement formula includes:
wherein, Tr first temperatureIs the rise response time, T, at said first temperaturef first temperatureIs the falling response time at said first temperature, γFirst temperatureIs the liquid crystal viscosity coefficient at said first temperature, ΔFirst temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature, KFirst temperatureThe restoring force, T, applied to the horizontal or vertical rotation of the liquid crystal at the first temperaturer reference temperatureIs the rise response time, T, at the reference temperaturef reference temperatureIs the falling response time at the reference temperature, gammaReference temperatureIs the liquid crystal viscosity coefficient at the reference temperature, ΔReference temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature, KReference temperatureIs the reference temperatureThe restoring force to which the liquid crystal is subjected in the horizontal plane rotation or the vertical plane rotation at that degree, and d is the liquid crystal cell thickness,0The dielectric constant in vacuum, and E the electric field strength.
In one embodiment of the present application, the first response time includes a rise response time at the first temperature and a fall response time at the first temperature.
In one embodiment of the present application, the liquid crystal display includes a horizontal deflection type liquid crystal or a vertical deflection type liquid crystal.
The beneficial effect of this application: according to the method, the response time of the liquid crystal display at different temperatures can be measured quickly and accurately by establishing the measurement formula, acquiring the response time of the liquid crystal display at the reference temperature, the liquid crystal parameter group and the liquid crystal parameter group at the first temperature, and substituting the numerical values into the measurement formula, so that the response time of the liquid crystal display at the first temperature can be obtained quickly and accurately, the influence of the temperature on the measurement equipment is not limited, and the applicability and the convenience of the measurement of the response time of the liquid crystal display are improved.
Drawings
The technical solution and other advantages of the present application will become apparent from the detailed description of the embodiments of the present application with reference to the accompanying drawings.
Fig. 1 is a flowchart of a method for measuring response time of a liquid crystal display according to an embodiment of the present disclosure.
Fig. 2 is a bar graph of gray scale response time at 25 ℃ provided in the examples of the present application.
Fig. 3 is a bar graph of gray scale response time at 10 ℃ according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the description of the present application, it is to be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the present application and for simplicity in description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed in a particular orientation, and be operated in a particular manner, and are not to be construed as limiting the present application. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, features defined as "first", "second", may explicitly or implicitly include one or more of the described features. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
In the description of the present application, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; may be mechanically connected, may be electrically connected or may be in communication with each other; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact of the first and second features, or may comprise contact of the first and second features not directly but through another feature in between. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
The following disclosure provides many different embodiments or examples for implementing different features of the application. In order to simplify the disclosure of the present application, specific example components and arrangements are described below. Of course, they are merely examples and are not intended to limit the present application. Moreover, the present application may repeat reference numerals and/or letters in the various examples, such repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed. In addition, examples of various specific processes and materials are provided herein, but one of ordinary skill in the art may recognize applications of other processes and/or use of other materials.
The embodiment of the application provides a system and a method for measuring the response time of a liquid crystal display, which can quickly and accurately measure the response time of the liquid crystal display at different temperatures.
The embodiment of the application provides a method for measuring the response time of a liquid crystal display, which comprises the following steps:
acquiring a reference response time of the liquid crystal display at a reference temperature and a reference numerical value of a liquid crystal parameter set;
acquiring a first numerical value of the liquid crystal parameter group at a first temperature; and
and substituting the reference response time, the reference numerical value and the first numerical value into a measurement formula to obtain the first response time of the liquid crystal display at the first temperature.
In the implementation and application process, the display effect is seriously affected by the generation of the dynamic tailing phenomenon of the existing liquid crystal display, but in the prior art, the response time specification is set aiming at the liquid crystal display, and the response time data is monitored so as to achieve the purpose of reducing the dynamic tailing, but the setting of the response time specification is generally defined at the normal temperature of 25 ℃, under the low-temperature environment, the response time of the liquid crystal is slowed, the dynamic tailing phenomenon is easily generated, meanwhile, the temperature of different regions has obvious difference, the temperature in winter in the same region is also colder than that in summer, the dynamic tailing phenomenon is easily generated in the colder region, and the winter is also the high-rise period of the dynamic tailing phenomenon, so the response time under different temperatures needs to be monitored, the proper specification is set to reduce the generation of the dynamic tailing phenomenon, but the measurement environment hardly supports large-scale temperature adjustment, even in the environment with adjustable temperature, the measuring instrument is easy to atomize a lens at low temperature, the service life of the measuring instrument is influenced, and therefore measurement of liquid crystal response time at different temperatures is difficult to support.
It should be noted that, at different temperatures, the liquid crystal characteristics may change, that is, the liquid crystal parameter group may change, and further affect the response time, and the amount of change of the liquid crystal parameter group at different temperatures relative to the reference temperature may be calculated by measuring the liquid crystal parameter group that changes at different temperatures, and then the response time at different temperatures may be derived and calculated.
Referring to fig. 1, a method for measuring response time of a liquid crystal display according to an embodiment of the present application is shown, the method including:
and S10, acquiring the reference response time of the liquid crystal display at the reference temperature and the reference value of the liquid crystal parameter group.
In the embodiment of the application, the liquid crystal parameter group comprises liquid crystal viscosity coefficient, liquid crystal horizontal direction and liquid crystal vertical directionThe liquid crystal parameter set also comprises liquid crystal box thickness, vacuum dielectric constant and electric field intensity, and the liquid crystal box thickness and the electric field intensity are not easy to be influenced by temperature and change, and can be regarded as fixed values, the vacuum dielectric constant is an electric constant, and the numerical value is an electric constant08.854187817 × 10-12F/m (approximate), the parameters that change include the liquid crystal viscosity, the difference in dielectric constant between the horizontal and vertical directions of the liquid crystal, and the restoring force to which the liquid crystal is subjected by horizontal or vertical rotation.
In the step S10, the rise response time T at the reference temperature is acquiredr reference temperatureFalling response time T at the reference temperaturef reference temperatureLiquid crystal viscosity coefficient gamma at the reference temperatureReference temperatureDifference Δ in dielectric constant between horizontal and vertical directions of the liquid crystal at the reference temperatureReference temperatureA restoring force K to which the horizontal or vertical plane of the liquid crystal is subjected at the reference temperatureReference temperatureAnd the thickness d and the vacuum dielectric constant of the liquid crystal cell0And an electric field intensity E.
S20, acquiring a first value of the liquid crystal parameter group at a first temperature.
Obtaining the liquid crystal viscosity coefficient gamma at the first temperatureFirst temperatureThe difference Δ in dielectric constant between the horizontal and vertical directions of the liquid crystal at the first temperatureFirst temperatureA restoring force K to which the horizontal or vertical plane of the liquid crystal is rotated at the first temperatureFirst temperature。
And S30, substituting the reference response time, the reference value and the first value into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature.
Specifically, the following is a calculation formula of the response time of the liquid crystal display:
wherein, TrWhich is the rise response time (i.e., the response time from low gray level to high gray level), gamma is the liquid crystal viscosity coefficient,0is a vacuum dielectric constant, Δ is a difference between dielectric constants in horizontal and vertical directions of the liquid crystal, K is a restoring force applied to the liquid crystal by rotation in the horizontal or vertical plane, and T isfFor the falling response time (i.e., the response time from the high gray level to the low gray level), and d is the cell thickness, and E is the electric field strength.
In the embodiment of the present application, the reference temperature is used as a standard, and the response time at the first temperature is derived and calculated by using the variation of the liquid crystal parameter set at the first temperature relative to the liquid crystal parameter set at the reference temperature, and then according to the above formula, the measurement formula is derived as follows:
wherein, Tr first temperatureIs the rise response time, T, at said first temperaturef first temperatureIs the falling response time at said first temperature, γFirst temperatureIs the liquid crystal viscosity coefficient at said first temperature, ΔFirst temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature, KFirst temperatureThe restoring force, T, applied to the horizontal or vertical rotation of the liquid crystal at the first temperaturer reference temperatureIs the rise response time, T, at the reference temperaturef reference temperatureIs the falling response time at the reference temperature, gammaReference temperatureIs the liquid crystal viscosity coefficient at the reference temperature, ΔReference temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature, KReference temperatureIs a restoring force to which the liquid crystal is subjected by the horizontal plane rotation or the vertical plane rotation at the reference temperature, and d is a liquid crystal cell thickness,0The dielectric constant in vacuum, and E the electric field strength.
Therefore, the rising response time T at the first temperature can be obtained by substituting the reference value, the reference liquid crystal response time and the first value obtained in the steps S10 and S20 into the measurement formular first temperatureAnd a falling response time T at said first temperaturef first temperatureStill further, the first response time includes a rise response time T at the first temperaturer first temperatureAnd a falling response time T at said first temperaturef first temperatureThe response time may be an average response time of gray scale variation to eliminate errors or differences of individual data.
It should be noted that, in the embodiments of the present application, a test may be performed to obtain values corresponding to the liquid crystal parameter sets at different temperatures, and a database is established, so that when a response time measurement needs to be performed, the liquid crystal parameter sets at different temperatures may be obtained quickly, so as to improve efficiency.
To sum up, this application embodiment can calculate fast and obtain LCD's response time under the different temperatures through establishing the measurement formula, no longer is subject to the influence of temperature to measuring equipment, has improved the suitability and the convenience that LCD response time measured, can obtain the response time under the different temperatures fast through the measurement method of LCD response time that this application embodiment provided to formulate the product of suitable specification in order to improve the display effect.
In one embodiment of the present application, the liquid crystal display includes a horizontal plane deflection type liquid crystal, such as an IPS/FFS liquid crystal display.
In this embodiment, the liquid crystal parameter set susceptible to temperature includes liquid crystal viscosity coefficient γ, liquid crystal horizontal and vertical dielectric constant difference Δ, and liquid crystal horizontal plane rotationTo the restoring force K1Therefore, the rise response time T is calculated on the measurementr(response time from low gray scale to high gray scale), the liquid crystal viscosity coefficient gamma, the difference delta of dielectric constant of liquid crystal in horizontal and vertical directions and the restoring force K applied to the rotation of liquid crystal horizontal plane are obtained by measurement at different temperatures1The value and the variation of the temperature can be measured and calculated to obtain the rise response time T at different temperaturesrThe values and variables of (a) are, similarly, measured to calculate the decay response time Tf(response time from high gray scale to low gray scale), the liquid crystal viscosity coefficient gamma and the restoring force K applied by the rotation of the liquid crystal horizontal plane at different temperatures are obtained by measurement1The value and the variation of the temperature can be measured and calculated to obtain the falling response time T at different temperaturesfAnd the amount of change thereof.
Specifically, the rise response time T at the reference temperature is first acquiredr reference temperatureFalling response time T at the reference temperaturef reference temperatureLiquid crystal viscosity coefficient gamma at the reference temperatureReference temperatureDifference Δ in dielectric constant between horizontal and vertical directions of the liquid crystal at the reference temperatureReference temperatureThe restoring force K to which the liquid crystal is rotated in the horizontal plane at the reference temperature1 reference temperatureAnd the thickness d and the vacuum dielectric constant of the liquid crystal cell0And an electric field intensity E.
Then obtaining the liquid crystal viscosity coefficient gamma at the first temperatureFirst temperatureThe difference Δ in dielectric constant between the horizontal and vertical directions of the liquid crystal at the first temperatureFirst temperatureA restoring force K to which the liquid crystal is rotated in a horizontal plane at the first temperature1 first temperature。
And substituting the parameters into the measurement formula to obtain the rise response time T at the first temperaturer first temperatureA falling response time T at said first temperaturef first temperatureAnd obtaining the first response time of the liquid crystal display.
In another embodiment of the present application, the liquid crystal display includes a vertical-plane deflection type liquid crystal, such as a VA liquid crystal display.
In this embodiment, the liquid crystal parameter set susceptible to temperature includes liquid crystal viscosity coefficient γ, difference Δ in dielectric constant between horizontal and vertical directions of liquid crystal, and restoring force K applied to vertical plane rotation of liquid crystal2Therefore, the rise response time T is calculated on the measurementr(response time from low gray scale to high gray scale), the liquid crystal viscosity coefficient gamma, the difference delta of dielectric constant of liquid crystal in horizontal and vertical directions and the restoring force K applied to the rotation of liquid crystal vertical plane are obtained by measurement at different temperatures2The value and the variation of the temperature can be measured and calculated to obtain the rise response time T at different temperaturesrThe values and variables of (a) are, similarly, measured to calculate the decay response time Tf(response time from high gray scale to low gray scale), the liquid crystal viscosity coefficient gamma and the restoring force K received by the rotation of the liquid crystal vertical plane under different temperatures are obtained by measurement2The value and the variation of the temperature can be measured and calculated to obtain the falling response time T at different temperaturesfAnd its variables.
Specifically, the rise response time T at the reference temperature is first acquiredr reference temperatureFalling response time T at the reference temperaturef reference temperatureLiquid crystal viscosity coefficient gamma at the reference temperatureReference temperatureDifference Δ in dielectric constant between horizontal and vertical directions of the liquid crystal at the reference temperatureReference temperatureThe restoring force K to which the vertical plane of the liquid crystal is subjected at the reference temperature2 reference temperatureAnd the thickness d and the vacuum dielectric constant of the liquid crystal cell0And an electric field intensity E.
Then obtaining the liquid crystal viscosity coefficient gamma at the first temperatureFirst temperatureThe difference Δ in dielectric constant between the horizontal and vertical directions of the liquid crystal at the first temperatureFirst temperatureA restoring force K to which the vertical plane of liquid crystal at the first temperature is subjected2 first temperature。
And substituting the parameters into the measurement formula to obtain the rise response time T at the first temperaturer first temperatureA falling response time T at said first temperaturef first temperatureAnd obtaining the first response time of the liquid crystal display.
Taking the vertical-plane-deflection liquid crystal as an example, the method for measuring the response time of the liquid crystal display provided in the embodiment of the present application is verified, and a process for calculating the falling response time is taken as an example for description.
Wherein, the reference temperature is selected to be normal temperature (25 ℃), the first temperature is 10 ℃, and the response time of the falling at 25 ℃ and 10 ℃ is measured, please refer to fig. 2 and fig. 3, fig. 2 is a bar graph of the response time of the gray scale change at 25 ℃, fig. 3 is a bar graph of the response time of the gray scale change at 10 ℃, wherein, the vertical axis represents the response time, the horizontal axis represents the gray scale change, and the average response time of the numerical values is obtained, and the obtained result is as shown in the following table one:
watch 1
25 |
10 |
10℃/25℃ | |
Tf | 15.2ms | 30.6ms | 2.0 |
In addition, the method for measuring response time of a liquid crystal display according to the embodiment of the present application calculates a falling response time, obtains a value of the liquid crystal parameter set at 25 ℃ and a value of the liquid crystal parameter set at 10 ℃, and obtains the following results through the measurement formula:
watch two
The falling response time at 10 ℃ obtained by the measurement formula provided by the embodiment of the application is twice the falling response time at 25 ℃, and the result is the same as the result measured in the table I, so that the method for measuring the response time of the liquid crystal display provided by the embodiment of the application is quick, effective and accurate.
In addition, an embodiment of the present application further provides a system for measuring response time of a liquid crystal display, which includes: the measurement acquisition module is used for acquiring a first numerical value of the liquid crystal display corresponding to the liquid crystal parameter group at a first temperature, a reference numerical value corresponding to the liquid crystal parameter group at a reference temperature and a reference response time; and the operation module substitutes the first numerical value, the reference numerical value and the reference response time into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature.
Specifically, the liquid crystal parameter set comprises a liquid crystal viscosity coefficient, a liquid crystal horizontal and vertical dielectric constant difference and a restoring force applied by liquid crystal horizontal plane rotation or vertical plane rotation, and the above parameters are easily influenced by temperature and changed to further influence response time08.854187817 × 10-12F/m (approximate value), therefore, the parameters that change include the liquid crystal viscosity coefficient, the difference between the dielectric constants of the liquid crystal in the horizontal and vertical directions, and the restoring force to which the liquid crystal is subjected by the horizontal or vertical rotation, and it should be noted that the liquid crystal display includes a horizontal or vertical deflection type liquid crystal, wherein the parameters corresponding to the horizontal deflection type liquid crystal include the liquid crystal viscosity coefficient, the difference between the dielectric constants of the liquid crystal in the horizontal and vertical directions, and the liquid crystal is subjected to the horizontal rotationThe parameters corresponding to the vertical deflection type liquid crystal comprise liquid crystal viscosity coefficient, dielectric constant difference of the liquid crystal in horizontal and vertical directions and restoring force applied to the rotation of the liquid crystal vertical surface.
The embodiment of the application can also carry out experimental tests to obtain the corresponding numerical values of the liquid crystal parameter groups at different temperatures, establish a database, and quickly obtain the liquid crystal parameter groups at different temperatures when response time measurement needs to be carried out so as to improve the efficiency.
Further, the measurement formula includes:
wherein, Tr first temperatureIs the rise response time, T, at said first temperaturef first temperatureIs the falling response time at said first temperature, γFirst temperatureIs the liquid crystal viscosity coefficient at said first temperature, ΔFirst temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature, KFirst temperatureThe restoring force, T, applied to the horizontal or vertical rotation of the liquid crystal at the first temperaturer reference temperatureIs the rise response time, T, at the reference temperaturef reference temperatureIs the falling response time at the reference temperature, gammaReference temperatureIs the liquid crystal viscosity coefficient at the reference temperature, ΔReference temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature, KReference temperatureIs a restoring force to which the liquid crystal is subjected by the horizontal plane rotation or the vertical plane rotation at the reference temperature, and d is a liquid crystal cell thickness,0A vacuum dielectric constant, E is an electric field strength, wherein the first response time comprises a rise response time T at the first temperaturer first temperatureAnd a falling response at the first temperatureInter Tf first temperature。
To sum up, this application embodiment can calculate fast and obtain LCD's response time under the different temperatures through establishing the measurement formula, no longer is subject to the influence of temperature to measuring equipment, has improved the suitability and the convenience that LCD response time measured, can obtain the response time under the different temperatures fast through the measurement method of LCD response time that this application embodiment provided to formulate the product of suitable specification in order to improve the display effect.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
The foregoing describes in detail a system and a method for measuring response time of a liquid crystal display provided in an embodiment of the present application, and a specific example is applied to explain the principle and the implementation of the present application, and the description of the foregoing embodiment is only used to help understand the technical solution and the core idea of the present application; those of ordinary skill in the art will understand that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications or substitutions do not depart from the spirit and scope of the present disclosure as defined by the appended claims.
Claims (10)
1. A method for measuring response time of a Liquid Crystal Display (LCD) is characterized by comprising the following steps:
acquiring a reference response time of the liquid crystal display at a reference temperature and a reference numerical value of a liquid crystal parameter set;
acquiring a first numerical value of the liquid crystal parameter group at a first temperature; and
and substituting the reference response time, the reference numerical value and the first numerical value into a measurement formula to obtain the first response time of the liquid crystal display at the first temperature.
2. The method of claim 1, wherein the liquid crystal parameter set comprises liquid crystal viscosity, difference between dielectric constants of horizontal and vertical directions of liquid crystal, and restoring force applied to horizontal or vertical rotation of liquid crystal.
3. The method of claim 1, wherein the measurement formula comprises:
wherein, Tr first temperatureIs the rise response time, T, at said first temperaturef first temperatureIs the falling response time at said first temperature, γFirst temperatureIs the liquid crystal viscosity coefficient at said first temperature, ΔFirst temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature, KFirst temperatureThe restoring force, T, applied to the horizontal or vertical rotation of the liquid crystal at the first temperaturer reference temperatureIs the rise response time, T, at the reference temperaturef reference temperatureIs the falling response time at the reference temperature, gammaReference temperatureIs the liquid crystal viscosity coefficient at the reference temperature, ΔReference temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature, KReference temperatureIs a restoring force to which the liquid crystal is subjected by the horizontal plane rotation or the vertical plane rotation at the reference temperature, and d is a liquid crystal cell thickness,0The dielectric constant in vacuum, and E the electric field strength.
4. The method of claim 3, wherein the first response time comprises a rise response time at the first temperature and a fall response time at the first temperature.
5. The method of claim 1, wherein the LCD comprises a horizontal deflection type LCD or a vertical deflection type LCD.
6. A system for measuring response time of a Liquid Crystal Display (LCD) comprises:
the measurement acquisition module is used for acquiring a first numerical value of the liquid crystal parameter set of the liquid crystal display at a first temperature, a reference numerical value of the liquid crystal parameter set at a reference temperature and a reference response time; and
and the operation module substitutes the first numerical value, the reference numerical value and the reference response time into a measurement formula to obtain a first response time of the liquid crystal display at the first temperature.
7. The system of claim 6, wherein the set of LC parameters includes LC viscosity, difference between LC horizontal and vertical dielectric constants, and restoring force applied to horizontal or vertical rotation of the LC.
8. The system of claim 6, wherein the measurement formula comprises:
wherein, Tr first temperatureIs the rise response time, T, at said first temperaturef toA temperatureIs the falling response time at said first temperature, γFirst temperatureIs the liquid crystal viscosity coefficient at said first temperature, ΔFirst temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the first temperature, KFirst temperatureThe restoring force, T, applied to the horizontal or vertical rotation of the liquid crystal at the first temperaturer reference temperatureIs the rise response time, T, at the reference temperaturef reference temperatureIs the falling response time at the reference temperature, gammaReference temperatureIs the liquid crystal viscosity coefficient at the reference temperature, ΔReference temperatureIs the difference between the dielectric constants in the horizontal and vertical directions of the liquid crystal at the reference temperature, KReference temperatureIs a restoring force to which the liquid crystal is subjected by the horizontal plane rotation or the vertical plane rotation at the reference temperature, and d is a liquid crystal cell thickness,0The dielectric constant in vacuum, and E the electric field strength.
9. The system of claim 8, wherein the first response time comprises a rise response time at the first temperature and a fall response time at the first temperature.
10. The system of claim 6, wherein the LCD comprises a horizontal deflection type LCD or a vertical deflection type LCD.
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