CN111879418A - Infrared detector nonlinear measurement method and measurement device based on luminous flux multiplication method - Google Patents

Infrared detector nonlinear measurement method and measurement device based on luminous flux multiplication method Download PDF

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CN111879418A
CN111879418A CN202010771667.7A CN202010771667A CN111879418A CN 111879418 A CN111879418 A CN 111879418A CN 202010771667 A CN202010771667 A CN 202010771667A CN 111879418 A CN111879418 A CN 111879418A
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diaphragm
infrared detector
infrared
luminous flux
radiation source
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CN111879418B (en
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董伟
宋旭尧
原遵东
赵云龙
安保林
卢小丰
王景辉
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National Institute of Metrology
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National Institute of Metrology
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/53Reference sources, e.g. standard lamps; Black bodies
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/06Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0803Arrangements for time-dependent attenuation of radiation signals

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  • Spectroscopy & Molecular Physics (AREA)
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Abstract

The invention relates to an infrared detector nonlinear measurement device and a measurement method based on a luminous flux multiplication method. According to the measuring method, the multiplication of the luminous flux of an infrared radiation source is realized through half-open and full-open diaphragms, the measured infrared detector measures the luminous flux of the infrared radiation source under the measuring conditions, the baffle plate measures and eliminates the stray radiation outside the infrared radiation source, and the output signal measured by the infrared detector is used for obtaining the response nonlinearity of the infrared detector based on a luminous flux multiplication method.

Description

Infrared detector nonlinear measurement method and measurement device based on luminous flux multiplication method
Technical Field
The invention relates to the field of nonlinear measurement, in particular to a nonlinear measurement method and a nonlinear measurement device of an infrared detector based on a luminous flux multiplication method.
Background
Radiometry is defined by planck's formula based on international temperature scale regulations. For radiation measurement research on the current infrared band, the method is expanded to wide-temperature-zone measurement. Namely, based on the planck formula, the corresponding radiance of its temperature region has spanned many orders of magnitude. The infrared detector is used as an infrared radiation receiving device, the responsivity of the infrared detector is nonlinear, and the infrared detector generally has more obvious nonlinear characteristics compared with a detector in a visible light wave band.
The effect on the measurement in the wide dynamic range infrared radiation measurement can reach 1% magnitude. The non-linearity is generally due to the non-ideal nature of the detector and associated amplification circuitry, and as measurement accuracy increases, the measurement of non-linearity on infrared detectors is an essential step in the evaluation of infrared detector performance.
Therefore, for high precision measurement, accurate characterization and calibration are needed to reduce the uncertainty of the infrared radiation measurement.
Disclosure of Invention
The invention provides a nonlinear measurement method and a measurement device for an infrared detector based on a light flux multiplication method. In the invention, the nonlinear definition of the detector is strictly met in the measurement principle; the operation method has the characteristics of rapidness, simplicity and convenience, and can effectively inhibit reflection influence. This is also a necessary requirement currently imposed on infrared detector non-linear measurements.
In order to achieve the purpose, the invention adopts the following technical scheme.
The invention provides an infrared detector nonlinear measuring device based on a luminous flux multiplication method, which comprises the following components:
the device comprises a cooling stray radiation shielding bin, a cage-type optical element fixing structure and a control system, wherein a first light transmission opening and a second light transmission opening are formed in two sides of a bin body of the cooling stray radiation shielding bin; a light flux multiplying diaphragm group disposed in the cage-type optical element fixing structure, the light flux multiplying diaphragm group including at least one diaphragm; the standard blackbody radiation source is positioned outside the first light transmission opening; the infrared detector is positioned on the outer side of the second light transmission opening; the infrared optical system, the infrared optical system and the luminous flux multiplication diaphragm group are positioned in the cage type optical element fixing structure.
Wherein the infrared system comprises dual off-axis mirrors, the dual off-axis mirrors comprising a first off-axis mirror and a second off-axis mirror.
Wherein, the standard blackbody radiation source is a deep cavity structure, the cavity material is sintered silicon carbide, and the working temperature range is 200-1000 ℃.
The light flux multiplication diaphragm group comprises a full-open diaphragm, a left side half-open diaphragm and a right side half-open diaphragm, and the surface of the diaphragm is coated with low-reflection characteristic black paint.
The diaphragm is characterized by further comprising a baffle, wherein the baffle is made of opaque metal with the surface completely blackened, and is embedded and fixed through a diaphragm groove.
The light flux multiplication diaphragm is fixedly installed by a diaphragm groove, and the diaphragm groove is 3/4 circular.
The invention provides a nonlinear measurement method of an infrared detector by adopting the nonlinear measurement device, which is characterized by comprising the following steps:
measuring the luminous flux of a standard black body radiation source passing through a fully-opened diaphragm by using a detected infrared detector;
respectively measuring the luminous fluxes of the standard black body radiation source passing through the two half-open diaphragms by using a detected infrared detector;
shielding a standard black body radiation source by using a baffle plate, and measuring ambient stray radiation luminous flux;
and the nonlinearity of the detector is obtained by measuring the obtained output signal of the infrared detector.
The device comprises a black body radiation source, a cage type optical element fixing structure, a detector, a luminous flux multiplication diaphragm group, a cage type optical element fixing structure and a black body radiation source, wherein the luminous flux multiplication diaphragm group is used for realizing the multiplication of the luminous flux of the black body radiation source reaching the detector under a certain known incident radiation brightness;
placing a fully-opened diaphragm in the luminous flux multiplication diaphragm group at a parallel light path of the infrared optical system, and measuring the radiation brightness of the black body radiation source;
placing a left half-open diaphragm in the luminous flux multiplication diaphragm group at a parallel light path of the infrared optical system, and measuring the radiation brightness of the black body radiation source;
placing a right half-open diaphragm in the luminous flux multiplication diaphragm group at a parallel light path of the infrared optical system, and measuring the radiation brightness of the black body radiation source;
placing a baffle plate at a parallel light path of an infrared system, and measuring the ambient background stray radiation brightness;
and through the measured radiance system, the nonlinearity of the detected detector is obtained through a display computing instrument.
Wherein the infrared detector nonlinearity further comprises establishing a nonlinear calculation function and a cumulative nonlinear calculation function based on the luminous flux multiplication method.
Wherein the nonlinear calculation function of the infrared detector is as follows:
Figure BDA0002616854630000031
wherein NL is the nonlinearity of the IR detector, R is the responsivity of the IR detector, φ is the luminous flux received by the IR detector, and λ is the measurement wavelength, and A, B, C respectively correspond to different diaphragms of claim 6.
Wherein the cumulative nonlinear computation function of the infrared detector is:
Figure BDA0002616854630000032
wherein INL is the accumulated nonlinearity of the infrared detector, and i is the accumulated step number.
The nonlinear calculation function of the infrared detector further comprises the step of establishing an output signal calculation model of the infrared detector;
the output signal calculation model of the infrared detector is as follows:
S(λ,T)=R(λ,T)φ(λ,T)+S0(λ,T)
wherein S is the output signal of the infrared detector, S0T is the output signal of the infrared detector for stray radiation and T is the temperature of a standard blackbody radiation source.
The nonlinear calculation function of the infrared detector through calculation and display is as follows:
Figure BDA0002616854630000041
wherein S isA、SB、SCAnd S0And the output signals of the infrared detectors are respectively used for measuring the full-open diaphragm, the left half-open diaphragm, the right half-open diaphragm and the baffle. The NL and the INL are nonlinear measurement results of the infrared detector finally obtained by the invention.
Infrared optical system, luminous flux multiplication, baffle etc. are located cooling stray radiation shielding storehouse in, and cooling stray radiation shielding storehouse is the cuboid storehouse, and the storehouse top is for carrying the cang gai, and the bulkhead is bilayer structure, has the cooling cistern in the bilayer, and the wall all scribbles the black lacquer of low reflection characteristic in the storehouse. The walls of the chamber facing the standard blackbody radiation source and the infrared detector each had an opening of 30mm in diameter. There are inlets and outlets for cooling fluid on the sides of the chamber, and the temperature of the chamber walls is controlled by circulating cooling fluid to be the same as the test environment temperature, typically 20 ℃.
The invention provides an infrared detector nonlinear measurement method and a measurement device based on a luminous flux multiplication method, which can carry out high-precision quantitative measurement on the nonlinear characteristics of an infrared detector in a wide temperature range by multiplying the incident radiation luminous flux of a radiation source, effectively eliminate stray radiation and inhibit the influence of mutual reflection of optical elements, and meet the requirements of rapidness and convenience in actual operation.
By adopting the infrared detector nonlinear measurement method and device based on the luminous flux multiplication method, the nonlinear characteristics of the infrared detector can be quantitatively depicted with high precision, and the nonlinear definition of the detector is strictly satisfied theoretically. The standard blackbody radiation source with the wide temperature zone is adopted as the incident infrared radiation source, so that the characteristics of good temperature accuracy and high stability are achieved, and the problem of self reflection of a light source is avoided; the infrared reflection type double off-axis optical system with high reflectivity can reduce more obvious aberration which often exists in a transmission type infrared optical system; the technical scheme that the diaphragm which is obliquely blackened is arranged in the water-cooling stray radiation shielding bin can effectively inhibit the influence of reflection in a measuring light path and the thermal effect of an optical element; the optical elements in the whole infrared optical system adopt a cage structure to carry out installation and positioning, so that the operation is convenient, and the coaxiality of all the optical elements is also guaranteed very high.
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In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some examples of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic view of a nonlinear measuring device of an infrared detector based on a luminous flux multiplication method according to the present invention;
FIG. 2 is a main flow chart of the method for measuring the nonlinearity of the infrared detector based on the luminous flux multiplication method;
FIG. 3 is a schematic view of an infrared optical system having a luminous flux multiplying diaphragm in a measuring device according to the present invention;
fig. 4 is a schematic view of a light flux multiplying diaphragm positioning device of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail with reference to the accompanying drawings in conjunction with the following detailed description. It should be understood that the description is intended to be exemplary only, and is not intended to limit the scope of the present invention. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present invention.
Fig. 1 is a nonlinear measuring device of an infrared detector based on a luminous flux multiplication method, as shown in fig. 1, the measuring device comprises: the cooling stray radiation shielding bin 1 comprises a cavity and cooling liquid positioned in the cavity, the top of the cooling stray radiation shielding bin 1 is provided with an inlet and an outlet of the cooling liquid, a cooling circulation component 6 is connected with the inlet and the outlet to realize circulation of the cooling liquid, the temperature of the bin wall is controlled to be kept at 20 ℃ by circulating the cooling liquid, and the cooling liquid is preferably water; a first light transmission opening and a second light transmission opening are formed in two sides of the cavity, the first light transmission opening is located on one side of the cooling stray radiation shielding bin 1, the second light transmission opening is located on the other side of the cooling stray radiation shielding bin 1, the cooling stray radiation shielding bin 1 is preferably a cuboid bin, the cavity comprises a bin top and a bin wall, the bin top is a bin lifting cover, the bin wall is of a double-layer structure, a water channel is formed in the double layer, the inner wall and the outer wall of the bin are coated with low-reflection characteristic black paint, and the preferred diameters of the first light transmission opening and the second light transmission opening, which face the standard black body radiation source 4 and face the infrared detector 5, on the bin wall are 30 mm; the cage-type optical element fixing structure 2 is positioned in the cooling stray radiation shielding bin 1, and the luminous flux multiplication diaphragm group 3 is arranged in the cage-type optical element fixing structure 2, wherein the luminous flux multiplication diaphragm group 3 comprises a full-open diaphragm, two half-open diaphragms and a baffle; the standard blackbody radiation source 4 is positioned at the outer side of the first light transmission opening; the infrared detector 5 is positioned outside the second light transmission opening; a display computing instrument connected with the infrared detector 5; an infrared optical system 7, said infrared system 7 comprising dual off-axis mirrors, said dual off-axis mirrors comprising a first off-axis mirror 8 and a second off-axis mirror 9; said infrared optical system 7 and said light flux multiplying diaphragm group 3 are located in said cage-shaped optical element fixing structure 2.
The cage-type optical element fixing structure 2 comprises a mirror cage and a mirror cage connecting rod, wherein the mirror cage is a cube, the preferred side length is 76.2mm (3 inches), each surface of the mirror cage is provided with a hollow part, the hollow part is circular, the diameter of the hollow part is preferably 63.5mm (2.5 inches), and the mirror cage is completely blackened; all there is 6 mm's through-hole 4 angles departments at the mirror cage, and a plurality of mirror cages accessible 4 mirror cage connecting rods link to each other, and mirror cage connecting rod diameter is preferred 6mm, and length is preferred 152.4 mm.
The first off-axis mirror 8 and the second off-axis mirror 9 are the same in size and configuration, and the off-axis mirrors are preferably 50.8mm (2 inches) in diameter, 152.4mm (6 inches) in focal length, and mirror-plated with gold.
Fig. 3 is a schematic view of the configuration of an infrared optical system having a luminous flux multiplying diaphragm in the measuring apparatus of the present invention, and as shown in the left side of fig. 3, there may be three luminous flux multiplying diaphragms and baffles. The outer diameters of the three diaphragms of the luminous flux multiplication diaphragm group 3 are preferably 50mm, the inner diameters of the three diaphragms are preferably 40mm, the diaphragm A is a full-open diaphragm, the opening is circular, the diaphragm B is a left-side half-open diaphragm, the diaphragm C is a right-side half-open diaphragm, and the openings of the diaphragm B and the diaphragm C are semicircular. Aperture a has an aperture area equal to the sum of the aperture areas of apertures B and C. And positioning screws made of polytetrafluoroethylene materials are arranged at the upper parts of the three diaphragms, and the surfaces of the diaphragms are coated with low-reflection characteristic black paint.
The standard blackbody radiation source 4 is preferably of a deep cavity structure, the cavity depth is preferably 270mm, the cavity opening diameter is preferably 50mm, the cavity bottom is preferably of a cone angle of 120 degrees, the cavity body is made of sintered silicon carbide, the working temperature range is 200-1000 ℃, a three-section heating mode is adopted, the effective emissivity of the blackbody estimated by a Monte-Carlo ray tracing method is superior to 0.998, and the temperature stability within 30 minutes is superior to 0.01%.
The diaphragms in the light flux multiplying diaphragm group 3 are fixedly installed by diaphragm grooves 10, the diaphragm grooves 10 are preferably 3/4 circles, the outer diameter is preferably 3 inches (76.2mm), the inner diameter is preferably 50mm, the outer diameter size of each diaphragm groove is matched with the side length of the cage-shaped optical element fixing structure, the inner diameter of each diaphragm groove is matched with the outer diameter size of the light flux multiplying diaphragm, through holes of 6mm are formed in four corners of each diaphragm groove, and the diaphragm grooves can be positioned through the cage-shaped optical element fixing structure 3 and positioned in parallel light paths in the infrared optical system 7, namely between the two off-axis reflectors. The way of installing the diaphragm to the diaphragm groove is embedded. The surface of the diaphragm groove is coated with black paint with low reflection characteristics. The diaphragm groove is obliquely arranged in the infrared optical system, and forms an included angle of 20 degrees with the vertical direction of the main optical axis. The surface of the baffle is completely blackened and opaque metal baffle, the outer diameter of the baffle is the same as that of the light flux multiplication diaphragm, preferably 50mm, and the baffle can also be embedded and fixed through the diaphragm groove 10.
Fig. 2 is a main flow of the infrared detector nonlinear measurement method based on the luminous flux multiplication method of the invention.
Measuring the luminous flux of a standard infrared radiation source passing through a fully-opened diaphragm by using a detected infrared detector;
respectively measuring the luminous fluxes of the standard infrared radiation source passing through the two half-open diaphragms by using a detected infrared detector;
shielding a standard infrared radiation source by using a baffle plate, and measuring ambient stray radiation luminous flux;
and obtaining the nonlinearity of the detector according to the obtained output signal of the infrared detector.
Specifically, the nonlinear measurement of the infrared detector in this embodiment includes the following steps:
step 1: FIG. 3 is a schematic diagram of an infrared optical system having a light flux multiplying diaphragm; as shown in fig. 3, a light flux multiplying diaphragm disposed between the first off-axis mirror 8 and the second off-axis mirror 9 of the infrared optical system 7 is disposed in the infrared optical system 7 in the caged optical element fixing structure 2 through the diaphragm groove 10.
Step 2: an infrared optical system 7 with a diaphragm groove 10 is arranged in the cold stray radiation shielding bin 1, the shielding bin is cooled by cooling liquid, preferably water, the temperature of the cooling water is 20 ℃, the temperature of the cooling water is kept at 20 ℃ in the whole measurement process, and the stability of the measurement environment is ensured.
And step 3: and respectively placing the standard blackbody radiation source 4 and the infrared detector 5 at the focus of the infrared optical system 7 at two sides of the light inlet of the water-cooling stray radiation shielding bin to form a nonlinear measuring device for the infrared detector.
And 4, step 4: and electrifying the standard blackbody radiation source to raise the temperature, and setting the temperature as a temperature point corresponding to the multiplication of the radiation brightness on the detection wavelength. Taking the embodiment as an example, the working temperature range of the standard blackbody radiation source 4 is 200-2Sr μm) according to the luminous flux multiplication method, i.e. the radiance of the set temperature points is multiplied under the same measurement conditions, and the radiance points selected in this range are 190, 380, 760, 1520, 3040, 6080, 12160, 24320W/(m) respectively2Sr · μm), namely, the radiation brightness of the standard blackbody radiation source is multiplied by 7 times, and the corresponding set temperature values are 207, 254, 312, 383, 476, 597, 762, and 1000 ℃. And after the standard black body radiation source reaches each set temperature point, stabilizing for 30 minutes and entering a working state.
And 5: will open diaphragm (diaphragm A) entirely and place in diaphragm groove 10, after standard blackbody radiation source 4 heaies up to first settlement temperature point and stably gets into operating condition, use and be surveyed infrared detector and carry out radiometric measurement, convert light signal into the signal of telecommunication through showing the calculating instrument and export, output signal is:
SA1(λ,T1)=RA1(λ,T1A1(λ,T1)+S0(λ)
wherein S isA1Measuring a first temperature point T of a standard black body radiation source under the limitation of a diaphragm A for an infrared detector1Output signal of RA1For responsivity, S, corresponding to the infrared detector0Is an environmental stray radiation signal, and lambda is the working wavelength of the infrared detector.
Step 6: replacing the diaphragm after the step 5 is finished, and as shown in the diagram of fig. 4, arranging a right half-open diaphragm (diaphragm B) in a diaphragm groove and positioning the diaphragm through a positioning screw, wherein the diaphragm is a schematic diagram of a luminous flux multiplication diaphragm positioning device, and as shown in fig. 4; or obtaining an aperture B by combining the aperture A and the baffle, keeping the working state of the standard blackbody radiation source in the step 5 unchanged, using the detected infrared detector to carry out radiation measurement, and displaying output signals of a computing instrument as follows:
SB1(λ,T1)=RB1(λ,T1B1(λ,T1)+S0(λ)
wherein S isB1Measuring a first temperature point T of a standard black body radiation source under the limitation of a diaphragm B for an infrared detector1Output signal of RB1Is the responsivity corresponding to the infrared detector.
And 7: and 6, replacing the diaphragm after the step 6 is finished, as shown in fig. 4, placing the right half-open diaphragm (diaphragm C) in the diaphragm groove and positioning the diaphragm through a positioning screw, keeping the working state of the standard blackbody radiation source in the steps 5 and 6 unchanged, using the infrared detector to be measured to perform radiation measurement, and displaying an output signal of a calculating instrument as follows:
SC1(λ,T1)=RC1(λ,T1C1(λ,T1)+S0(λ)
wherein S isC1Measuring a first temperature point T of a standard black body radiation source under the limit of a diaphragm C for an infrared detector1Output signal of RC1Is the responsivity corresponding to the infrared detector.
And 8: and 7, replacing the diaphragm after the step 7 is finished, placing a full-black baffle in the diaphragm groove, keeping the working state of the standard blackbody radiation source in the step 5-7 unchanged, measuring the environmental stray radiation by using the measured infrared detector, and obtaining an environmental stray radiation output signal S by a display calculating instrument0
And step 9: according to the output signal of the infrared detector obtained in the step 5-8, based on a luminous flux multiplication method, the single nonlinearity of the detected infrared detector under the radiation brightness of the current standard black body radiation source is obtained through calculation of a display calculating instrument, namely under the radiation brightness of the current standard black body radiation sourceInfrared detector nonlinearity NL at first set temperature point of standard blackbody radiation source1The calculation function is:
Figure BDA0002616854630000091
step 10: and (3) heating and stabilizing the standard blackbody radiation source to a second temperature point, and finishing the operation in the step (5-9) at the temperature point to obtain the nonlinearity NL of the infrared detector when the temperature of the standard blackbody radiation source is increased to the second temperature point2. Respectively calculating to obtain the infrared detector nonlinearity NL on each temperature point according to the set temperature points of the standard blackbody radiation source in the step 4 and the like3-NL8
Step 11: infrared detector nonlinearity NL measured according to the above-described steps 5-101-NL8The measured infrared detector is calculated by a display calculating instrument within the temperature range of 200-2Sr · μm), the cumulative nonlinear computation function of the infrared detector is:
Figure BDA0002616854630000101
and 12, repeating the measuring process of the steps 5-11 for 3 times, and taking the average value of the nonlinear measuring results of the infrared detector for 3 times, wherein the average value is the nonlinear measuring result of the infrared detector based on the luminous flux multiplication method.
In summary, the infrared detector nonlinear measurement method based on the luminous flux multiplication method can realize high-precision measurement in a wide luminance range, and strictly conforms to the detector nonlinear measurement principle. The infrared detector nonlinear measuring device based on the luminous flux multiplication method adopts a standard black body radiation source as an incident light source, and has no obvious limitation on the type of the detected infrared detector; a cage type optical element fixing structure is adopted, so that the high coaxiality of the whole measuring light path can be ensured; in the measuring process, only the luminous flux multiplication diaphragm is replaced, the operation process is simple and convenient, the diaphragm has high repeated positioning precision in the installation process, and the mechanical error in the measuring process is effectively reduced.
It will be appreciated by those skilled in the art that the foregoing types of applications are exemplary only, and that other types of applications, whether presently existing or later to be developed, that may be suitable for use with embodiments of the present invention, are also encompassed within the scope of the present invention and are hereby incorporated by reference. It is to be understood that the above-described embodiments of the present invention are merely illustrative of or explaining the principles of the invention and are not to be construed as limiting the invention. Therefore, any modification, equivalent replacement, improvement and the like made without departing from the spirit and scope of the present invention should be included in the protection scope of the present invention. Further, it is intended that the appended claims cover all such variations and modifications as fall within the scope and boundaries of the appended claims or the equivalents of such scope and boundaries.

Claims (10)

1. An infrared detector nonlinear measurement device based on a luminous flux multiplication method, comprising:
the cooling stray radiation shielding bin is characterized in that a first light-transmitting opening and a second light-transmitting opening are formed in two sides of a bin body of the cooling stray radiation shielding bin; a cage optical element mounting structure located in the cooling stray radiation shielded compartment; a light flux multiplying diaphragm group disposed in the cage-type optical element fixing structure, the light flux multiplying diaphragm group including at least one diaphragm; the standard blackbody radiation source is positioned outside the first light transmission opening; the infrared detector is positioned on the outer side of the second light transmission opening; the infrared optical system, the infrared optical system and the luminous flux multiplication diaphragm group are positioned in the cage type optical element fixing structure.
2. The non-linear measurement device of claim 1, wherein: the infrared system includes dual off-axis mirrors including a first off-axis mirror and a second off-axis mirror.
3. The nonlinear measurement apparatus according to claim 1, wherein: the standard blackbody radiation source is of a deep cavity structure, the cavity is made of sintered silicon carbide, and the working temperature range is 200-1000 ℃.
4. The nonlinear measurement apparatus according to claim 1, wherein: the luminous flux multiplication diaphragm group comprises a full-open diaphragm, a left side half-open diaphragm and a right side half-open diaphragm, and the surface of the diaphragm is coated with low-reflection characteristic black paint.
5. The nonlinear measurement apparatus according to claim 1, wherein: the diaphragm is characterized by further comprising a baffle, wherein the baffle is made of opaque metal with a black and completely-coated surface, and is embedded and fixed through a diaphragm groove.
6. A nonlinear measurement method of an infrared detector using the nonlinear measurement apparatus as set forth in any one of claims 1 to 5, characterized in that:
measuring the luminous flux of a standard black body radiation source passing through a fully-opened diaphragm by using a detected infrared detector;
respectively measuring the luminous fluxes of the standard black body radiation source passing through the two half-open diaphragms by using a detected infrared detector;
shielding a standard black body radiation source by using a baffle plate, and measuring ambient stray radiation luminous flux;
and the nonlinearity of the detector is obtained by measuring the obtained output signal of the infrared detector.
7. The nonlinear measurement method according to claim 6, characterized in that:
the luminous flux multiplication of a black body radiation source reaching a detector under a certain known incident radiation brightness is realized through a luminous flux multiplication diaphragm group, and the black body radiation source is arranged on a parallel light path of an infrared optical system through a cage type optical element fixing structure;
placing a fully-opened diaphragm in the luminous flux multiplication diaphragm group at a parallel light path of the infrared optical system, and measuring the radiation brightness of the black body radiation source;
placing a left half-open diaphragm in the luminous flux multiplication diaphragm group at a parallel light path of the infrared optical system, and measuring the radiation brightness of the black body radiation source;
placing a right half-open diaphragm in the luminous flux multiplication diaphragm group at a parallel light path of the infrared optical system, and measuring the radiation brightness of the black body radiation source;
placing a baffle plate at a parallel light path of an infrared system, and measuring the ambient background stray radiation brightness;
and through the measured radiance system, the nonlinearity of the detected detector is obtained through a display computing instrument.
8. The nonlinear measurement method according to any one of claims 6 to 7, characterized in that: the infrared detector nonlinearity further comprises establishing a non-linear calculation function and a cumulative non-linear calculation function based on the luminous flux multiplication method.
Wherein the nonlinear calculation function of the infrared detector is as follows:
Figure FDA0002616854620000021
wherein NL is the nonlinearity of the IR detector, R is the responsivity of the IR detector, φ is the luminous flux received by the IR detector, and λ is the measurement wavelength, and A, B, C respectively correspond to different diaphragms of claim 6.
Wherein the cumulative nonlinear computation function of the infrared detector is:
Figure FDA0002616854620000022
wherein INL is the accumulated nonlinearity of the infrared detector, and i is the accumulated step number.
9. The nonlinear measurement method according to any one of claims 6 to 7, characterized in that: the nonlinear calculation function of the infrared detector also comprises the establishment of an infrared detector output signal calculation model.
The output signal calculation model of the infrared detector is as follows:
S(λ,T)=R(λ,T)φ(λ,T)+S0(λ,T)
wherein S is the output signal of the infrared detector, S0T is the output signal of the infrared detector for stray radiation and T is the temperature of a standard blackbody radiation source.
10. The nonlinear measurement method according to any one of claims 6 to 7, characterized in that: the nonlinear calculation function of the infrared detector calculated and displayed is as follows:
Figure FDA0002616854620000031
wherein S isA、SB、SCAnd S0And the output signals of the infrared detectors are respectively used for measuring the full-open diaphragm, the left half-open diaphragm, the right half-open diaphragm and the baffle.
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