CN111856198A - Batch test method for equipment to be tested - Google Patents
Batch test method for equipment to be tested Download PDFInfo
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Abstract
The invention provides a batch test method and a system for equipment to be tested, which comprises the following steps: s11, sending an instruction to a mainboard to make the mainboard become a master, and sending an instruction to other mainboards to make the mainboard become a slave, wherein each mainboard is used for collecting test data of at least one device to be tested, and the mainboards are connected through bus communication; s12, obtaining the test data collected by each mainboard from the host, wherein the test data collected by each slave is sent to the host through the bus; and S13, processing and analyzing the test data. The method provided by the invention can test the finished products of the equipment in large batch, ensure the delivery quality and safety of the finished products, and simultaneously improve the testing efficiency and reduce the testing cost.
Description
Technical Field
The invention relates to the technical field of equipment testing, in particular to a batch testing method and system for equipment to be tested.
Background
Electronic product testing, which is an activity performed to maintain functional reliability in an expected use environment, and finds product defects through equipment testing; confirming defects of product processing and manufacturing processes; improvement suggestions and suggestions are provided, so that enterprises are helped to improve the process level, and the service life and the quality of products are improved; technical support is provided for research and development and production of enterprises, so that high-quality products are created, and the market competitiveness of the enterprises is improved.
Many aging tests of electronic products adopted at present are manual tests, such tests need to manually check test results in real time, and even if problems are found, test data of one hand cannot be obtained, so that the test efficiency is low, the management is inconvenient, and a series of problems such as test errors are easily caused. The charging voltage and current need to be monitored during the test, so that the phenomenon of overvoltage or overcurrent is prevented from occurring, and the finished product to be tested is prevented from being damaged. And the product that will appear testing unqualified in addition, the tester will be reminded in time, the power of test equipment is cut off simultaneously to the detailed test data of record is in preparation for the tester to inquire the failure reason, help improving the yield of product.
When manufacturing electronic products, traditional manufacturers need to be matched with relevant aging test systems for ensuring the safety and reliability of the electronic products. Testing an electronic product, including testing its operating voltage and current, and maintaining operation.
In summary, one technical problem to be solved by those skilled in the art is: the invention discloses a system for testing products in batches, which helps a factory to improve the testing efficiency, ensure the quality and safety of the products and simultaneously can store necessary testing data.
Disclosure of Invention
Technical problem to be solved
Aiming at the problems, the invention provides a batch test method and a system for equipment to be tested, which are used for at least partially solving the technical problems of low efficiency, inconvenient management, easy test error and the like of the traditional test method.
(II) technical scheme
The invention provides a batch test method for equipment to be tested on one hand, which comprises the following steps: s11, sending an instruction to a mainboard to make the mainboard become a master, and sending an instruction to other mainboards to make the mainboard become a slave, wherein each mainboard is used for collecting test data of at least one device to be tested, and the mainboards are connected through bus communication; s12, obtaining the test data collected by each mainboard from the host, wherein the test data collected by each slave is sent to the host through the bus; and S13, processing and analyzing the test data.
Further, the method for each motherboard in S11 to collect test data of at least one device under test includes: s111, the controller of the mainboard opens the analog change-over switch through the GPIO control unit, and selects a first group of working modules; s112, the controller of the main board collects the working data of the first group of working modules through an ADC (analog to digital converter) collecting unit; s113, comparing the processed working data with preset data, and storing test data and test information; and S114, switching the second group of working modules, and repeating S111-S113 until all the working modules are tested.
Further, the method for collecting the working data of the first group of working modules in S112 includes: s1121, adjusting an external power supply to a required voltage through a voltage stabilizing unit; s1122, collecting a voltage value, dividing the voltage by using two resistors to obtain a smaller voltage, and calculating the actual working voltage of the wireless charging equipment according to the smaller voltage; s1123, collecting the current value, obtaining a sampling voltage through the sampling resistor, amplifying the sampling voltage through the differential amplification chip to obtain a final voltage, and calculating according to the final voltage to obtain the actual working current of the wireless charging device.
In another aspect, the present invention provides a batch test method for devices to be tested, including: s21, acquiring an instruction which is sent by an upper computer and enables a local main board to be a host, and sending an instruction which enables the local main board to be a slave to other main boards, wherein each main board is used for collecting test data of at least one device to be tested, and the main boards are connected through bus communication; s22, collecting the test data of the equipment to be tested on the host computer, and obtaining the test data collected from the slave computer through the bus; and S23, sending the test data in the S22 to an upper computer together so that the upper computer processes and analyzes the test data.
Further, the method for each motherboard in S21 to collect test data of at least one device under test includes: s211, the controller of the mainboard opens the analog change-over switch through the GPIO control unit, and selects a first group of working modules; s212, the controller of the main board acquires the working data of the first group of working modules through the ADC acquisition unit; s213, comparing the processed working data with preset data, and storing test data and test information; and S214, switching the second group of working modules, and repeating S211-S213 until all the working modules are tested.
Further, the method for collecting the working data of the first group of working modules in S212 includes: s2121, adjusting an external power supply to a required voltage through a voltage stabilizing unit; s2122, collecting a voltage value, dividing the voltage value by using two resistors to obtain a smaller voltage, and calculating the actual working voltage of the wireless charging equipment according to the smaller voltage; and S2123, collecting a current value, obtaining a sampling voltage through a sampling resistor, amplifying the sampling voltage through a differential amplification chip to obtain a final voltage, and calculating according to the final voltage to obtain the actual working current of the wireless charging equipment.
In another aspect, the present invention provides a batch test method for devices to be tested, including: s31, acquiring an instruction which is sent by a mainboard and enables the local mainboard to serve as a slave, sending the instruction to the mainboard by an upper computer to enable the mainboard to serve as a host, wherein each mainboard is used for collecting test data of at least one device to be tested, and the mainboards are in communication connection through a bus; and S32, collecting the test data of the device to be tested on the slave and sending the test data to the host through the bus so that the host sends the test data together with the test data collected by the host to the host.
Further, the method for each motherboard in S31 to collect test data of at least one device under test includes: s311, the controller of the mainboard opens the analog change-over switch through the GPIO control unit and selects a first group of working modules; s312, the controller of the main board collects working data of the first group of working modules through the ADC collecting unit; s313, comparing the processed working data with preset data, and storing test data and test information; and S314, switching the second group of working modules, and repeating S311-S313 until all the working modules are tested.
Further, the method for collecting the working data of the first group of working modules in S312 includes: s3121, adjusting an external power supply to a required voltage through a voltage stabilizing unit; s3122, collecting a voltage value, dividing the voltage by using two resistors to obtain a smaller voltage, and calculating the actual working voltage of the wireless charging equipment according to the smaller voltage; and S3123, collecting a current value, obtaining a sampling voltage through the sampling resistor, amplifying the sampling voltage through the differential amplification chip to obtain a final voltage, and calculating according to the final voltage to obtain the actual working current of the wireless charging device.
In another aspect, the present invention provides a system for batch testing of devices under test, including: the host computer is used for sending a test command of the equipment to be tested to the host computer, receiving test data of the host computer and the slave computer and processing and analyzing the data; the host computer is connected with the upper computer through the serial port communication unit and used for testing a plurality of devices to be tested simultaneously; the system comprises a plurality of slave machines which are in communication connection with a host machine through a bus, wherein each slave machine is used for testing a plurality of devices to be tested simultaneously and sending test data to the host machine through the bus so that the host machine sends the test data and the test data acquired by the host machine to the host machine.
(III) advantageous effects
According to the batch test method and system for the equipment to be tested, the host and the multiple slave machines are used for simultaneously testing the multiple equipment to be tested, and the test data are sent to the host through the bus, so that the host sends the test data and the test data acquired by the host to the host, the equipment to be tested can be tested in batch, the test efficiency is improved, and the test cost is reduced.
Drawings
FIG. 1 is a flow chart of a method for batch testing devices to be tested by an upper computer according to an embodiment of the present invention;
fig. 2 is a flowchart schematically illustrating a method for collecting test data of at least one device under test by each motherboard in S11 according to an embodiment of the present invention;
FIG. 3 is a flow chart of a method for collecting working data of a first set of working modules in S112 according to an embodiment of the present invention;
FIG. 4 is a flow chart of a method for batch testing devices under test by a host according to an embodiment of the present invention;
fig. 5 is a flowchart schematically illustrating a method for collecting test data of at least one device under test by each motherboard in S21 according to an embodiment of the present invention;
FIG. 6 is a flow chart of a method for collecting working data of a first set of working modules in S212 according to an embodiment of the present invention;
FIG. 7 is a flow chart that schematically illustrates a method for batch testing by a slave device under test, in accordance with an embodiment of the present invention;
fig. 8 is a flowchart schematically illustrating a method for collecting test data of at least one device under test by each motherboard in S31 according to an embodiment of the present invention;
FIG. 9 is a flow chart of a method for collecting work data of a first set of work modules in S312 according to an embodiment of the present invention;
FIG. 10 is a flow chart schematically illustrating the identification of a master and a slave in a batch test of a device under test according to an embodiment of the present invention;
fig. 11 is a schematic structural diagram illustrating a master and a slave in a batch test of a device under test according to an embodiment of the present invention;
FIG. 12 is a schematic structural diagram illustrating a working module in a batch test of a device under test according to an embodiment of the present invention;
FIG. 13 is a flowchart illustrating the operation of a host during batch testing of a device under test according to an embodiment of the present invention;
FIG. 14 is a flowchart illustrating the operation of a slave device in a batch test of a device under test according to an embodiment of the present invention;
FIG. 15 is a flowchart illustrating the overall operation of a device under test in batch testing according to an embodiment of the present invention;
fig. 16 is a schematic diagram illustrating an overall structure of a device under test in batch testing according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to specific embodiments and the accompanying drawings.
A first embodiment of the present invention provides a method for testing devices under test in batch, please refer to fig. 1, which includes: s11, sending an instruction to a mainboard to make the mainboard become a master, and sending an instruction to other mainboards to make the mainboard become a slave, wherein each mainboard is used for collecting test data of at least one device to be tested, and the mainboards are connected through bus communication; s12, obtaining the test data collected by each mainboard from the host, wherein the test data collected by each slave is sent to the host through the bus; and S13, processing and analyzing the test data.
In this embodiment, a batch test method of devices under test is described from the perspective of an upper computer, wherein please refer to fig. 10 for the flow of identifying the host and the slave. In order to facilitate generation, installation and later maintenance of a test system, a master-slave machine integrated mode is adopted, namely the master-slave machine shares the same hardware, and software automatically judges whether the master machine or the slave machine is the master machine or the slave machine. After the system is powered on, the software waits for the command of the upper computer or the host. 1) If the command of the upper computer is received, the host computer is identified and the command of the upper computer is received. At the same time, a command is sent to the slave. 2) If the command of the master is received, the slave is identified and the command of the master is received. For example: and A, returning a corresponding response command when receiving the connection instruction from the upper computer. And sets itself as the master. And then sends the inquiry command to the slave. And B, receiving an inquiry command from the host, setting the host as a slave, and responding the acquired voltage and current values to the host.
In addition, each mainboard comprises a plurality of working modules, each working module collects the test data of one device to be tested, the test data comprises the working current, voltage and other data of the device to be tested, the mainboards are in communication connection through a BUS, the BUS CAN be a CAN BUS BUS, and in order to prevent electromagnetic interference, the whole CAN BUS BUS is in communication through a twisted pair with a shielding function. The invention adopts CAN serial communication, but is not limited to a specific serial communication interface, and other serial communication interfaces, such as UART, I2C, SPI and the like, are the same principle. Through the CAN bus, a plurality of devices CAN be cascaded, and the purpose of testing a plurality of products simultaneously is achieved. The host machine and the slave machine are the same, only the software logic is different, the host machine and the slave machine are used for collecting the test data of at least one device to be tested, the slave machine sends the collected test data to the host machine through a bus, the host machine sends the collected test data and the collected test data to the upper computer, and the upper computer further processes and analyzes the test data.
On the basis of the foregoing embodiment, the method for collecting test data of at least one device under test by each motherboard in S11, please refer to fig. 2, includes: s111, the controller of the mainboard opens the analog change-over switch through the GPIO control unit, and selects a first group of working modules; s112, the controller of the main board collects the working data of the first group of working modules through an ADC (analog to digital converter) collecting unit; s113, comparing the processed working data with preset data, and storing test data and test information; and S114, switching the second group of working modules, and repeating S111-S113 until all the working modules are tested.
Referring to fig. 11, each of the master and the slave is composed of an MCU controller, an analog switch, and 64 working modules. Here, the 64 work modules are only for convenience of illustration, and certainly, the number of the work modules is not limited to only 64. The 64 working modules mainly provide power for finished products needing to be aged through USB interfaces, and meanwhile, the modules are internally provided with current and voltage detection circuits for monitoring the voltage and the current of the finished products in the aging test in real time. The USB interface can also provide power for the finished product to be tested through other power supply connecting connectors and the like. The function of the analog change-over switch is used for switching different working modules, and due to the fact that 64 on-board working modules are arranged, the MCU controller is not enough to provide enough voltage and current detection ports. Therefore, a change-over switch is required to be adopted to sequentially select different working modules, and the voltage and the current of each working module are collected to the MCU control system unit in a polling mode.
The controller of the mainboard can be an MCU control system unit which takes a 32-bit singlechip as a main controller. The single chip microcomputer comprises a 12-bit high-precision ADC unit, a CAN transceiving control unit, a serial port communication unit and a common GPIO control unit.
1) And the GPIO control unit is used for coding through three GPIOs and controlling the analog switch to sequentially select different working modules. There are eight total groups of 8, each for a total of 64 work modules.
2) And the ADC acquisition unit is used for simultaneously acquiring the voltage and the current of 8 working modules at a time.
3) And the CAN communication unit is used for connecting the host machine and the slave machine. The host sends the command, and the slave sends the acquired data to the host through the CAN bus after receiving the command.
4) And the host machine feeds back the test data to the upper computer of the computer end through a serial port for data display.
On the basis of the above embodiment, the method for collecting the working data of the first group of working modules in S112, please refer to fig. 3, includes: s1121, adjusting an external power supply to a required voltage through a voltage stabilizing unit; s1122, collecting a voltage value, dividing the voltage by using two resistors to obtain a smaller voltage, and calculating the actual working voltage of the wireless charging equipment according to the smaller voltage; s1123, collecting the current value, obtaining a sampling voltage through the sampling resistor, amplifying the sampling voltage through the differential amplification chip to obtain a final voltage, and calculating according to the final voltage to obtain the actual working current of the wireless charging device.
Please refer to fig. 12 for a structure diagram of each working module, which includes an external power input, a GPIO control power pin, an LDO linear regulator unit, a current detection circuit, a voltage detection circuit, and a power output connection socket. And the external power supply is used for supplying power to the whole module. The GPIO control power supply pin is used for controlling the LDO linear voltage stabilization chip; when the LDO linear voltage stabilizing chip is enabled to work, the external power supply can be switched on to provide power for the module, otherwise, the module is in a non-working state. The LDO linear voltage stabilizing unit adjusts an external power supply into a voltage value required by the module, and prevents overhigh voltage or large fluctuation, so that the module works in an abnormal state. The voltage detection circuit is much higher than the reference voltage of the MCU due to the voltage to be tested, and in order to accurately measure the voltage of the working module, a smaller voltage is obtained by using a mode of voltage division of two resistors and is provided for the ADC unit of the MCU to collect and calculate. The specific formula is U1 ═ U0 × R2/(R1+ R2), where U1 is the voltage collected by the ADC, and U0 is the actual operating voltage of the module (i.e., the voltage to be detected during the test). The current detection circuit obtains a sampling voltage through a sampling resistor of 0.01R ohm (R3), the voltage is amplified through an operational amplifier (a differential amplification chip) with the amplification factor of A, the voltage is input into an ADC unit of the MCU for collection and calculation to obtain a final voltage, and then the working current is obtained through a formula I of U/A of R. And the power output is connected with the socket and is connected with a finished product to be aged. And the working power supply is provided or cut off through the LDO linear voltage stabilizing unit.
A second embodiment of the present invention provides a method for testing devices under test in batch, please refer to fig. 4, which includes: s21, acquiring an instruction which is sent by an upper computer and enables a local main board to be a host, and sending an instruction which enables the local main board to be a slave to other main boards, wherein each main board is used for collecting test data of at least one device to be tested, and the main boards are connected through bus communication; s22, collecting the test data of the equipment to be tested on the host computer, and obtaining the test data collected from the slave computer through the bus; and S23, sending the test data in the S22 to an upper computer together so that the upper computer processes and analyzes the test data.
In this embodiment, a batch test method of a device to be tested is described from the perspective of a host, and the invention adopts serial communication such as CAN, but is not limited to a specific serial communication interface, and other serial communication interfaces, such as UART, I2C, SPI, and the like, all have the same principle. Through the CAN bus, a plurality of devices CAN be cascaded, and the purpose of testing a plurality of products simultaneously is achieved. The host machine and the slave machine are the same, only the software logic is different, the host machine and the slave machine are used for collecting the test data of at least one device to be tested, the slave machine sends the collected test data to the host machine through a bus, the host machine sends the collected test data and the collected test data to the upper computer, and the upper computer further processes and analyzes the test data.
Referring to fig. 13, an embodiment of inquiring the operating voltage and current of the slave a for the upper computer is shown below. The specific process comprises the following steps:
1) after the host computer is powered on, the upper computer sends a command for inquiring the data of the slave computer A;
2) the host computer circularly inquires the command of the upper computer until receiving the command.
3) After receiving the command, the slave a sends a command for inquiring data to the slave a and waits for the response of the slave a. If the master does not receive the response from slave a and does not time out, it waits. And if the data is not received after the timeout, returning a response of error data to the upper computer. And if the response of the slave A is received within the specified time, the received data is sent to the upper computer according to the specified format.
4) And (3) circularly waiting for the upper computer to send a new command like the step 1), and repeating the steps 2 and 3.
On the basis of the foregoing embodiment, the method for collecting test data of at least one device under test by each motherboard in S21, please refer to fig. 5, which includes: s211, the controller of the mainboard opens the analog change-over switch through the GPIO control unit, and selects a first group of working modules; s212, the controller of the main board acquires the working data of the first group of working modules through the ADC acquisition unit; s213, comparing the processed working data with preset data, and storing test data and test information; and S214, switching the second group of working modules, and repeating S211-S213 until all the working modules are tested.
Referring to fig. 11, similarly to the embodiment, each of the master and the slave includes an MCU controller, an analog switch, and 64 working modules. The controller of the mainboard can be an MCU control system unit which takes a 32-bit singlechip as a main controller. The single chip microcomputer comprises a 12-bit high-precision ADC unit, a CAN transceiving control unit, a serial port communication unit and a common GPIO control unit.
1) And the GPIO control unit is used for coding through three GPIOs and controlling the analog switch to sequentially select different working modules. There are eight total groups of 8, each for a total of 64 work modules.
2) And the ADC acquisition unit is used for simultaneously acquiring the voltage and the current of 8 working modules at a time.
3) And the CAN communication unit is used for connecting the host machine and the slave machine. The host sends the command, and the slave sends the acquired data to the host through the CAN bus after receiving the command.
4) And the host machine feeds back the test data to the upper computer of the computer end through a serial port for data display.
On the basis of the above embodiment, the method for collecting the working data of the first group of working modules in S212, please refer to fig. 6, includes: s2121, adjusting an external power supply to a required voltage through a voltage stabilizing unit; s2122, collecting a voltage value, dividing the voltage value by using two resistors to obtain a smaller voltage, and calculating the actual working voltage of the wireless charging equipment according to the smaller voltage; and S2123, collecting a current value, obtaining a sampling voltage through a sampling resistor, amplifying the sampling voltage through a differential amplification chip to obtain a final voltage, and calculating according to the final voltage to obtain the actual working current of the wireless charging equipment.
Referring to fig. 12, a structure diagram of each working module, similar to the embodiment, includes an external power input, a GPIO control power pin, an LDO linear regulator unit, a current detection circuit, a voltage detection circuit, and a power output connection socket. The voltage detection circuit is much higher than the reference voltage of the MCU due to the voltage to be tested, and in order to accurately measure the voltage of the working module, a smaller voltage is obtained by using a mode of voltage division of two resistors and is provided for the ADC unit of the MCU to collect and calculate. The specific formula is U1 ═ U0 × R2/(R1+ R2), where U1 is the voltage collected by the ADC, and U0 is the actual operating voltage of the module (i.e., the voltage to be detected during the test). The current detection circuit obtains a sampling voltage through a sampling resistor of 0.01R ohm (R3), the voltage is amplified through an operational amplifier (a differential amplification chip) with the amplification factor of A, the voltage is input into an ADC unit of the MCU for collection and calculation to obtain a final voltage, and then the working current is obtained through a formula I of U/A of R. And the power output is connected with the socket and is connected with a finished product to be aged. And the working power supply is provided or cut off through the LDO linear voltage stabilizing unit.
A third embodiment of the present invention provides a method for testing devices under test in batch, please refer to fig. 7, which includes: s31, acquiring an instruction which is sent by a mainboard and enables the local mainboard to serve as a slave, sending the instruction to the mainboard by an upper computer to enable the mainboard to serve as a host, wherein each mainboard is used for collecting test data of at least one device to be tested, and the mainboards are in communication connection through a bus; and S32, collecting the test data of the device to be tested on the slave and sending the test data to the host through the bus so that the host sends the test data together with the test data collected by the host to the host.
In this embodiment, a batch test method of a device to be tested is described from a slave perspective, and the invention adopts serial communication such as CAN, but is not limited to a specific serial communication interface, and other serial communication interfaces, such as UART, I2C, SPI, and the like, all have the same principle. Through the CAN bus, a plurality of devices CAN be cascaded, and the purpose of testing a plurality of products simultaneously is achieved. The host machine and the slave machine are the same, only the software logic is different, the host machine and the slave machine are used for collecting the test data of at least one device to be tested, the slave machine sends the collected test data to the host machine through a bus, the host machine sends the collected test data and the collected test data to the upper computer, and the upper computer further processes and analyzes the test data.
The work flow diagram of the slave is shown in fig. 14, which includes:
1) after the slave computer is powered on, the slave computer always waits for the command of the host computer;
2) after receiving the command of the host, executing the command; and the data required by the host computer is responded to the host computer according to the specified format;
3) and (5) repeating the steps 1 and 2.
On the basis of the foregoing embodiment, the method for collecting test data of at least one device under test by each motherboard in S31, please refer to fig. 8, includes: s311, the controller of the mainboard opens the analog change-over switch through the GPIO control unit and selects a first group of working modules; s312, the controller of the main board collects working data of the first group of working modules through the ADC collecting unit; s313, comparing the processed working data with preset data, and storing test data and test information; and S314, switching the second group of working modules, and repeating S311-S313 until all the working modules are tested.
Referring to fig. 11, similarly to the embodiment, each of the master and the slave includes an MCU controller, an analog switch, and 64 working modules. The controller of the mainboard can be an MCU control system unit which takes a 32-bit singlechip as a main controller. The single chip microcomputer comprises a 12-bit high-precision ADC unit, a CAN transceiving control unit, a serial port communication unit and a common GPIO control unit.
1) And the GPIO control unit is used for coding through three GPIOs and controlling the analog switch to sequentially select different working modules. There are eight total groups of 8, each for a total of 64 work modules.
2) And the ADC acquisition unit is used for simultaneously acquiring the voltage and the current of 8 working modules at a time.
3) And the CAN communication unit is used for connecting the host machine and the slave machine. The host sends the command, and the slave sends the acquired data to the host through the CAN bus after receiving the command.
4) And the host machine feeds back the test data to the upper computer of the computer end through a serial port for data display.
On the basis of the above embodiment, the method for collecting the working data of the first group of working modules in S312, please refer to fig. 9, which includes: s3121, adjusting an external power supply to a required voltage through a voltage stabilizing unit; s3122, collecting a voltage value, dividing the voltage by using two resistors to obtain a smaller voltage, and calculating the actual working voltage of the wireless charging equipment according to the smaller voltage; and S3123, collecting a current value, obtaining a sampling voltage through the sampling resistor, amplifying the sampling voltage through the differential amplification chip to obtain a final voltage, and calculating according to the final voltage to obtain the actual working current of the wireless charging device.
Referring to fig. 12, a structure diagram of each working module, similar to the embodiment, includes an external power input, a GPIO control power pin, an LDO linear regulator unit, a current detection circuit, a voltage detection circuit, and a power output connection socket. The voltage detection circuit is much higher than the reference voltage of the MCU due to the voltage to be tested, and in order to accurately measure the voltage of the working module, a smaller voltage is obtained by using a mode of voltage division of two resistors and is provided for the ADC unit of the MCU to collect and calculate. The specific formula is U1 ═ U0 × R2/(R1+ R2), where U1 is the voltage collected by the ADC, and U0 is the actual operating voltage of the module (i.e., the voltage to be detected during the test). The current detection circuit obtains a sampling voltage through a sampling resistor of 0.01R ohm (R3), the voltage is amplified through an operational amplifier (a differential amplification chip) with the amplification factor of A, the voltage is input into an ADC unit of the MCU for collection and calculation to obtain a final voltage, and then the working current is obtained through a formula I of U/A of R. And the power output is connected with the socket and is connected with a finished product to be aged. And the working power supply is provided or cut off through the LDO linear voltage stabilizing unit.
The following describes the general work flow among the host computer, and the slave computer by specific examples, please refer to fig. 15, which includes:
1) powering on the system, and turning on the power supply of all 64 working modules;
2) the MCU controls the GPIO pin, turns on the analog switch, and sequentially selects the first group of working modules and the second group of working modules …;
3) an ADC unit of the MCU starts to acquire the voltage and current of 8 working modules in each group;
4) after conversion, filtering and other processing, comparing the acquired voltage value and current value with a set value;
5) if the tested data pass, storing the data in a data buffer; if the test fails, the data is also stored in the data buffer, and the power supply of the working module is turned off (turned off by the LDO linear voltage stabilizing unit) at the same time;
6) and inquiring whether a command of the host or the upper computer is received, and if so, sending the tested data and structure to the host (the upper computer). If not, go to the next step.
7) Switching a next group of working modules needing test data, and repeating the steps 2) to 6).
A fourth embodiment of the present invention provides a system for batch testing of devices under test, please refer to fig. 16, which includes: the host computer is used for sending a test command of the equipment to be tested to the host computer, receiving test data of the host computer and the slave computer and processing and analyzing the data; the host computer is connected with the upper computer through the serial port communication unit and used for testing a plurality of devices to be tested simultaneously; the system comprises a plurality of slave machines which are in communication connection with a host machine through a bus, wherein each slave machine is used for testing a plurality of devices to be tested simultaneously and sending test data to the host machine through the bus so that the host machine sends the test data and the test data acquired by the host machine to the host machine.
The upper computer is mainly used for processing and analyzing data, such as a computer; the host and the slave are mainly used for testing the equipment to be tested and collecting data such as current, voltage and the like when the equipment to be tested works, and a mainboard can be adopted. In fig. 16, the main board of the computer-side upper computer communicating via the serial port is called a host, wherein the wire used for the communication between the computer and the host is a wire dedicated for USB to serial port. Each node unit networked with the host is called a slave through the CAN BUS. In order to prevent electromagnetic interference, the whole CAN BUS communication uses a twisted pair with a shielding function. The master machine and the slave machine are the same, only the software logic is different, the serial communication of CAN is adopted in the invention, but the invention is not limited to a specific serial communication interface, other serial communication interfaces, UART, I2C, SPI and the like, and the principle is the same. Through the CAN bus, a plurality of devices CAN be cascaded to achieve the purpose of simultaneously testing a plurality of products in an aging way, and matching resistors R are connected at two ends of a CAN bus network.
In conclusion, the CAN bus networking mode is adopted for connection, the number of finished product tests is expanded, the working voltage and current of the product are detected during the test, and the working voltage and current are uploaded to an upper computer in real time for data sorting and analysis, so that simultaneous testing of multiple paths of electronic products is realized, and the automation and industrialization of product testing are promoted.
The above embodiments are provided to further explain the objects, technical solutions and advantages of the present invention in detail, it should be understood that the above embodiments are only examples of the present invention and are not intended to limit the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A batch test method for devices to be tested is characterized by comprising the following steps:
s11, sending an instruction to a mainboard to make the mainboard become a master, and sending an instruction to other mainboards to make the mainboard become a slave, wherein each mainboard is used for collecting test data of at least one device to be tested, and the mainboards are connected through bus communication;
s12, obtaining test data collected by each mainboard from a host, wherein the test data collected by each slave is sent to the host through the bus;
and S13, processing and analyzing the test data.
2. The method according to claim 1, wherein the step of collecting test data of at least one device under test for each motherboard in S11 comprises:
s111, the controller of the mainboard opens the analog change-over switch through the GPIO control unit, and selects a first group of working modules;
s112, the controller of the main board collects the working data of the first group of working modules through an ADC (analog to digital converter) collecting unit;
s113, comparing the processed working data with preset data, and storing test data and test information;
and S114, switching the second group of working modules, and repeating S111-S113 until all the working modules are tested.
3. The method for batch testing of devices under test according to claim 2, wherein the step of collecting the working data of the first group of working modules in S112 comprises:
s1121, adjusting an external power supply to a required voltage through a voltage stabilizing unit;
s1122, collecting a voltage value, dividing the voltage by using two resistors to obtain a smaller voltage, and calculating the actual working voltage of the wireless charging equipment according to the smaller voltage;
s1123, collecting the current value, obtaining a sampling voltage through a sampling resistor, amplifying the sampling voltage through a differential amplification chip to obtain a final voltage, and calculating according to the final voltage to obtain the actual working current of the wireless charging equipment.
4. A batch test method for devices to be tested is characterized by comprising the following steps:
s21, acquiring an instruction which is sent by an upper computer and enables a local main board to be a host, and sending an instruction which enables the local main board to be a slave to other main boards, wherein each main board is used for collecting test data of at least one device to be tested, and the main boards are connected through bus communication;
s22, collecting the test data of the equipment to be tested on the host computer, and obtaining the test data collected from the slave computer through the bus;
and S23, sending the test data in the S22 to the upper computer together so that the upper computer can process and analyze the test data.
5. The method according to claim 4, wherein the step of collecting test data of at least one device under test for each motherboard in S21 comprises:
s211, the controller of the mainboard opens the analog change-over switch through the GPIO control unit, and selects a first group of working modules;
s212, the controller of the main board acquires the working data of the first group of working modules through an ADC acquisition unit;
s213, comparing the processed working data with preset data, and storing test data and test information;
and S214, switching the second group of working modules, and repeating S211-S213 until all the working modules are tested.
6. The method for batch testing of devices under test as claimed in claim 5, wherein the step of collecting the working data of the first set of working modules in S212 comprises:
s2121, adjusting an external power supply to a required voltage through a voltage stabilizing unit;
s2122, collecting a voltage value, dividing the voltage value by using two resistors to obtain a smaller voltage, and calculating the actual working voltage of the wireless charging equipment according to the smaller voltage;
and S2123, collecting a current value, obtaining a sampling voltage through a sampling resistor, amplifying the sampling voltage through a differential amplification chip to obtain a final voltage, and calculating according to the final voltage to obtain the actual working current of the wireless charging equipment.
7. A batch test method for devices to be tested is characterized by comprising the following steps:
s31, acquiring an instruction which is sent by a mainboard and enables the local mainboard to serve as a slave, sending the instruction to the mainboard by an upper computer to enable the mainboard to serve as a host, wherein each mainboard is used for collecting test data of at least one device to be tested, and the mainboards are in communication connection through a bus;
and S32, collecting the test data of the equipment to be tested on the slave computer, and sending the test data to the host computer through the bus, so that the host computer sends the test data together with the test data collected by the host computer to the upper computer.
8. The method according to claim 7, wherein the step of collecting test data of at least one device under test for each motherboard in S31 includes:
s311, the controller of the mainboard turns on the analog change-over switch through the GPIO control unit, and selects a first group of working modules;
s312, the controller of the main board collects the working data of the first group of working modules through an ADC (analog to digital converter) collecting unit;
s313, comparing the processed working data with preset data, and storing test data and test information;
and S314, switching the second group of working modules, and repeating S311-S313 until all the working modules are tested.
9. The method for batch testing of devices under test as claimed in claim 8, wherein the step of collecting the working data of the first set of working modules in S312 comprises:
s3121, adjusting an external power supply to a required voltage through a voltage stabilizing unit;
s3122, collecting a voltage value, dividing the voltage by using two resistors to obtain a smaller voltage, and calculating the actual working voltage of the wireless charging equipment according to the smaller voltage;
s3123, collecting a current value, obtaining a sampling voltage through a sampling resistor, amplifying the sampling voltage through a differential amplification chip to obtain a final voltage, and calculating according to the final voltage to obtain the actual working current of the wireless charging device.
10. A system for batch testing of devices under test, comprising:
the host computer is used for sending a test command of the equipment to be tested to the host computer, receiving test data of the host computer and the slave computer and processing and analyzing the data;
the host is connected with the upper computer through a serial port communication unit and used for testing a plurality of devices to be tested simultaneously;
the system comprises a host computer, a plurality of slave computers and a plurality of slave computers, wherein the host computer is used for acquiring test data, the slave computers are in communication connection with the host computer through buses, and each slave computer is used for simultaneously testing a plurality of devices to be tested and sending the test data to the host computer through the buses so that the host computer sends the test data and the test data acquired by the host computer to the host computer.
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115357067A (en) * | 2022-08-26 | 2022-11-18 | 上海磐启微电子有限公司 | Full-automatic batch test system for high and low temperature performance of wireless image transmission product |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101710883A (en) * | 2009-12-03 | 2010-05-19 | 上海建坤信息技术有限责任公司 | Multi-protocol data acquisition gateway for intelligent building and data acquisition method thereof |
CN103884968A (en) * | 2014-02-17 | 2014-06-25 | 上海交通大学 | XLPE cable partial discharge positioning method based on GPS synchronization time service |
CN205003242U (en) * | 2015-10-10 | 2016-01-27 | 中国电子科技集团公司第三十八研究所 | Multicore cable check out test set |
CN107390130A (en) * | 2017-07-14 | 2017-11-24 | 王亚鲁 | Ring main unit battery on-Line Monitor Device and monitoring method |
US20170356961A1 (en) * | 2016-06-13 | 2017-12-14 | Intel Corporation | Apparatuses and methods for a multiple master capable debug interface |
CN108490279A (en) * | 2018-01-26 | 2018-09-04 | 深圳市沃特玛电池有限公司 | The test system and method for battery management system |
CN109358256A (en) * | 2018-12-20 | 2019-02-19 | 上海欧秒电力监测设备有限公司 | The arrester on-line monitoring system of synchronized sampling is realized in RS485 communication |
-
2020
- 2020-07-28 CN CN202010728865.5A patent/CN111856198A/en active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101710883A (en) * | 2009-12-03 | 2010-05-19 | 上海建坤信息技术有限责任公司 | Multi-protocol data acquisition gateway for intelligent building and data acquisition method thereof |
CN103884968A (en) * | 2014-02-17 | 2014-06-25 | 上海交通大学 | XLPE cable partial discharge positioning method based on GPS synchronization time service |
CN205003242U (en) * | 2015-10-10 | 2016-01-27 | 中国电子科技集团公司第三十八研究所 | Multicore cable check out test set |
US20170356961A1 (en) * | 2016-06-13 | 2017-12-14 | Intel Corporation | Apparatuses and methods for a multiple master capable debug interface |
CN107390130A (en) * | 2017-07-14 | 2017-11-24 | 王亚鲁 | Ring main unit battery on-Line Monitor Device and monitoring method |
CN108490279A (en) * | 2018-01-26 | 2018-09-04 | 深圳市沃特玛电池有限公司 | The test system and method for battery management system |
CN109358256A (en) * | 2018-12-20 | 2019-02-19 | 上海欧秒电力监测设备有限公司 | The arrester on-line monitoring system of synchronized sampling is realized in RS485 communication |
Non-Patent Citations (2)
Title |
---|
张善权: "调音台性能的自动化测试系统", 《电声技术》, vol. 37, no. 7, 31 December 2013 (2013-12-31), pages 22 - 25 * |
李世平 等: "《CAN总线应用层协议实例解析 第2版》", 西安电子科技大学出版社, pages: 67 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115357067A (en) * | 2022-08-26 | 2022-11-18 | 上海磐启微电子有限公司 | Full-automatic batch test system for high and low temperature performance of wireless image transmission product |
CN115357067B (en) * | 2022-08-26 | 2024-05-03 | 上海磐启微电子有限公司 | Full-automatic batch test system for high-low temperature performance of wireless image transmission product |
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