CN1118354C - 镶嵌式抛光垫及其制造方法 - Google Patents
镶嵌式抛光垫及其制造方法 Download PDFInfo
- Publication number
- CN1118354C CN1118354C CN98804962A CN98804962A CN1118354C CN 1118354 C CN1118354 C CN 1118354C CN 98804962 A CN98804962 A CN 98804962A CN 98804962 A CN98804962 A CN 98804962A CN 1118354 C CN1118354 C CN 1118354C
- Authority
- CN
- China
- Prior art keywords
- polishing
- pad
- adjacent
- inserts
- panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/04—Headstocks; Working-spindles; Features relating thereto
- B24B41/047—Grinding heads for working on plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D7/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
- B24D7/06—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor with inserted abrasive blocks, e.g. segmental
- B24D7/066—Grinding blocks; their mountings or supports
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US4610497P | 1997-05-09 | 1997-05-09 | |
| US60/046,104 | 1997-05-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1255080A CN1255080A (zh) | 2000-05-31 |
| CN1118354C true CN1118354C (zh) | 2003-08-20 |
Family
ID=21941643
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN98804962A Expired - Fee Related CN1118354C (zh) | 1997-05-09 | 1998-05-08 | 镶嵌式抛光垫及其制造方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6019666A (cg-RX-API-DMAC7.html) |
| EP (1) | EP1007283A4 (cg-RX-API-DMAC7.html) |
| JP (1) | JP4151799B2 (cg-RX-API-DMAC7.html) |
| KR (1) | KR100485846B1 (cg-RX-API-DMAC7.html) |
| CN (1) | CN1118354C (cg-RX-API-DMAC7.html) |
| WO (1) | WO1998050201A1 (cg-RX-API-DMAC7.html) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100436060C (zh) * | 2004-06-04 | 2008-11-26 | 智胜科技股份有限公司 | 研磨垫及其制造方法 |
| US8182318B2 (en) | 2006-11-06 | 2012-05-22 | Jtekt Corporation | Obliquely grooved grinding wheel and method for manufacturing the same |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6390890B1 (en) | 1999-02-06 | 2002-05-21 | Charles J Molnar | Finishing semiconductor wafers with a fixed abrasive finishing element |
| US6641463B1 (en) | 1999-02-06 | 2003-11-04 | Beaver Creek Concepts Inc | Finishing components and elements |
| US6319108B1 (en) | 1999-07-09 | 2001-11-20 | 3M Innovative Properties Company | Metal bond abrasive article comprising porous ceramic abrasive composites and method of using same to abrade a workpiece |
| DE19939258A1 (de) * | 1999-08-19 | 2001-03-08 | Wacker Siltronic Halbleitermat | Werkzeug und Verfahren zum abrasiven Bearbeiten einer im wesentlichen ebenen Fläche |
| KR100598090B1 (ko) * | 1999-08-25 | 2006-07-07 | 삼성전자주식회사 | 폴리싱 면의 균일성을 얻기 위한 화학적 기계적 폴리싱 시스템 |
| US7059948B2 (en) * | 2000-12-22 | 2006-06-13 | Applied Materials | Articles for polishing semiconductor substrates |
| US6848970B2 (en) * | 2002-09-16 | 2005-02-01 | Applied Materials, Inc. | Process control in electrochemically assisted planarization |
| US6390891B1 (en) * | 2000-04-26 | 2002-05-21 | Speedfam-Ipec Corporation | Method and apparatus for improved stability chemical mechanical polishing |
| US6561891B2 (en) | 2000-05-23 | 2003-05-13 | Rodel Holdings, Inc. | Eliminating air pockets under a polished pad |
| DE60110226T2 (de) | 2000-06-30 | 2006-03-09 | Rohm and Haas Electronic Materials CMP Holdings, Inc., Wilmington | Unterlage für polierscheibe |
| US6612917B2 (en) | 2001-02-07 | 2003-09-02 | 3M Innovative Properties Company | Abrasive article suitable for modifying a semiconductor wafer |
| US6632129B2 (en) | 2001-02-15 | 2003-10-14 | 3M Innovative Properties Company | Fixed abrasive article for use in modifying a semiconductor wafer |
| US6673220B2 (en) * | 2001-05-21 | 2004-01-06 | Sharp Laboratories Of America, Inc. | System and method for fabricating silicon targets |
| US7070480B2 (en) * | 2001-10-11 | 2006-07-04 | Applied Materials, Inc. | Method and apparatus for polishing substrates |
| US20030194959A1 (en) * | 2002-04-15 | 2003-10-16 | Cabot Microelectronics Corporation | Sintered polishing pad with regions of contrasting density |
| US7141155B2 (en) * | 2003-02-18 | 2006-11-28 | Parker-Hannifin Corporation | Polishing article for electro-chemical mechanical polishing |
| JP2005019669A (ja) * | 2003-06-26 | 2005-01-20 | Matsushita Electric Ind Co Ltd | 研磨パッド、研磨装置、及びウェハの研磨方法 |
| US7086932B2 (en) * | 2004-05-11 | 2006-08-08 | Freudenberg Nonwovens | Polishing pad |
| JP2005294412A (ja) * | 2004-03-31 | 2005-10-20 | Toyo Tire & Rubber Co Ltd | 研磨パッド |
| TWI254354B (en) * | 2004-06-29 | 2006-05-01 | Iv Technologies Co Ltd | An inlaid polishing pad and a method of producing the same |
| US6958002B1 (en) * | 2004-07-19 | 2005-10-25 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad with flow modifying groove network |
| US7252582B2 (en) * | 2004-08-25 | 2007-08-07 | Jh Rhodes Company, Inc. | Optimized grooving structure for a CMP polishing pad |
| CN100513082C (zh) * | 2004-10-06 | 2009-07-15 | 拉杰夫·巴贾 | 用于改善的化学机械抛光的方法和设备 |
| US20080318505A1 (en) * | 2004-11-29 | 2008-12-25 | Rajeev Bajaj | Chemical mechanical planarization pad and method of use thereof |
| US20090061744A1 (en) * | 2007-08-28 | 2009-03-05 | Rajeev Bajaj | Polishing pad and method of use |
| US20070224925A1 (en) * | 2006-03-21 | 2007-09-27 | Rajeev Bajaj | Chemical Mechanical Polishing Pad |
| US7815778B2 (en) * | 2005-11-23 | 2010-10-19 | Semiquest Inc. | Electro-chemical mechanical planarization pad with uniform polish performance |
| US7846008B2 (en) * | 2004-11-29 | 2010-12-07 | Semiquest Inc. | Method and apparatus for improved chemical mechanical planarization and CMP pad |
| WO2006057713A2 (en) * | 2004-11-29 | 2006-06-01 | Rajeev Bajaj | Electro-method and apparatus for improved chemical mechanical planarization pad with uniform polish performance |
| US7530880B2 (en) * | 2004-11-29 | 2009-05-12 | Semiquest Inc. | Method and apparatus for improved chemical mechanical planarization pad with pressure control and process monitor |
| US7762871B2 (en) * | 2005-03-07 | 2010-07-27 | Rajeev Bajaj | Pad conditioner design and method of use |
| US8398463B2 (en) | 2005-03-07 | 2013-03-19 | Rajeev Bajaj | Pad conditioner and method |
| US7179159B2 (en) * | 2005-05-02 | 2007-02-20 | Applied Materials, Inc. | Materials for chemical mechanical polishing |
| KR100711010B1 (ko) * | 2005-06-14 | 2007-04-25 | 한국화학연구원 | 지르코늄 산화물 박막 제조 방법 |
| JP4712539B2 (ja) * | 2005-11-24 | 2011-06-29 | ニッタ・ハース株式会社 | 研磨パッド |
| US20070128991A1 (en) * | 2005-12-07 | 2007-06-07 | Yoon Il-Young | Fixed abrasive polishing pad, method of preparing the same, and chemical mechanical polishing apparatus including the same |
| JP4999560B2 (ja) * | 2007-06-07 | 2012-08-15 | 豊田バンモップス株式会社 | 研削盤における砥石軸装置 |
| US9180570B2 (en) | 2008-03-14 | 2015-11-10 | Nexplanar Corporation | Grooved CMP pad |
| TWI449597B (zh) * | 2008-07-09 | 2014-08-21 | Iv Technologies Co Ltd | 研磨墊及其製造方法 |
| KR20100096459A (ko) * | 2009-02-24 | 2010-09-02 | 삼성전자주식회사 | 화학적 기계적 연마장치 |
| TWI535527B (zh) * | 2009-07-20 | 2016-06-01 | 智勝科技股份有限公司 | 研磨方法、研磨墊與研磨系統 |
| US20120302148A1 (en) | 2011-05-23 | 2012-11-29 | Rajeev Bajaj | Polishing pad with homogeneous body having discrete protrusions thereon |
| EP2732916A1 (en) * | 2011-07-15 | 2014-05-21 | Toray Industries, Inc. | Polishing pad |
| US9067297B2 (en) | 2011-11-29 | 2015-06-30 | Nexplanar Corporation | Polishing pad with foundation layer and polishing surface layer |
| US9067298B2 (en) | 2011-11-29 | 2015-06-30 | Nexplanar Corporation | Polishing pad with grooved foundation layer and polishing surface layer |
| JP5923353B2 (ja) * | 2012-03-21 | 2016-05-24 | 富士紡ホールディングス株式会社 | 研磨パッド用シート及びその製造方法、研磨パッド及びその製造方法、並びに研磨方法 |
| US9597769B2 (en) | 2012-06-04 | 2017-03-21 | Nexplanar Corporation | Polishing pad with polishing surface layer having an aperture or opening above a transparent foundation layer |
| US10226853B2 (en) | 2013-01-18 | 2019-03-12 | Applied Materials, Inc. | Methods and apparatus for conditioning of chemical mechanical polishing pads |
| TWI599447B (zh) | 2013-10-18 | 2017-09-21 | 卡博特微電子公司 | 具有偏移同心溝槽圖樣之邊緣排除區的cmp拋光墊 |
| CN103551961A (zh) * | 2013-11-04 | 2014-02-05 | 无锡雨田精密工具有限公司 | 一种机夹切削打磨刀具 |
| US11685013B2 (en) * | 2018-01-24 | 2023-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Polishing pad for chemical mechanical planarization |
| EP3616840B1 (en) * | 2018-09-03 | 2024-10-30 | 3M Innovative Properties Company | Abrasive article |
| TWI850338B (zh) * | 2019-02-28 | 2024-08-01 | 美商應用材料股份有限公司 | 拋光墊、化學機械拋光系統、及控制拋光墊的背襯層的剛度的方法 |
| CN110802508B (zh) * | 2019-11-12 | 2021-08-24 | 西安奕斯伟硅片技术有限公司 | 抛光垫及化学机械抛光设备 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4571893A (en) * | 1983-03-23 | 1986-02-25 | Gerd Braasch | Rotary grinding tool |
| US4751797A (en) * | 1986-09-26 | 1988-06-21 | Hi-Control Limited | Abrasive sheet and method of preparation |
| US5076024A (en) * | 1990-08-24 | 1991-12-31 | Intelmatec Corporation | Disk polisher assembly |
| US5212910A (en) * | 1991-07-09 | 1993-05-25 | Intel Corporation | Composite polishing pad for semiconductor process |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60242975A (ja) * | 1984-05-14 | 1985-12-02 | Kanebo Ltd | 平面研磨装置 |
| US4927432A (en) * | 1986-03-25 | 1990-05-22 | Rodel, Inc. | Pad material for grinding, lapping and polishing |
| FR2639278B1 (fr) * | 1988-11-22 | 1991-01-11 | Lam Plan Sa | Plateau de polissage |
| US5209760A (en) * | 1990-05-21 | 1993-05-11 | Wiand Ronald C | Injection molded abrasive pad |
| US5243790A (en) * | 1992-06-25 | 1993-09-14 | Abrasifs Vega, Inc. | Abrasive member |
| MY114512A (en) * | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
| DE4240476A1 (de) * | 1992-12-02 | 1994-06-16 | Winter & Sohn Ernst | Schleifscheibe zum spangebenden Bearbeiten von Werkstückflächen |
| US5489233A (en) * | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
| US5672095A (en) * | 1995-09-29 | 1997-09-30 | Intel Corporation | Elimination of pad conditioning in a chemical mechanical polishing process |
| JP3042593B2 (ja) * | 1995-10-25 | 2000-05-15 | 日本電気株式会社 | 研磨パッド |
-
1998
- 1998-05-08 WO PCT/US1998/009037 patent/WO1998050201A1/en not_active Ceased
- 1998-05-08 JP JP54832798A patent/JP4151799B2/ja not_active Expired - Fee Related
- 1998-05-08 US US09/074,667 patent/US6019666A/en not_active Expired - Lifetime
- 1998-05-08 KR KR10-1999-7010311A patent/KR100485846B1/ko not_active Expired - Fee Related
- 1998-05-08 CN CN98804962A patent/CN1118354C/zh not_active Expired - Fee Related
- 1998-05-08 EP EP98920962A patent/EP1007283A4/en not_active Withdrawn
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4571893A (en) * | 1983-03-23 | 1986-02-25 | Gerd Braasch | Rotary grinding tool |
| US4751797A (en) * | 1986-09-26 | 1988-06-21 | Hi-Control Limited | Abrasive sheet and method of preparation |
| US5076024A (en) * | 1990-08-24 | 1991-12-31 | Intelmatec Corporation | Disk polisher assembly |
| US5212910A (en) * | 1991-07-09 | 1993-05-25 | Intel Corporation | Composite polishing pad for semiconductor process |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100436060C (zh) * | 2004-06-04 | 2008-11-26 | 智胜科技股份有限公司 | 研磨垫及其制造方法 |
| US8182318B2 (en) | 2006-11-06 | 2012-05-22 | Jtekt Corporation | Obliquely grooved grinding wheel and method for manufacturing the same |
| CN101528419B (zh) * | 2006-11-06 | 2012-10-31 | 株式会社捷太格特 | 带倾斜槽的砂轮及其制造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1007283A1 (en) | 2000-06-14 |
| US6019666A (en) | 2000-02-01 |
| KR20010012359A (ko) | 2001-02-15 |
| EP1007283A4 (en) | 2002-05-08 |
| JP2002504864A (ja) | 2002-02-12 |
| JP4151799B2 (ja) | 2008-09-17 |
| WO1998050201A1 (en) | 1998-11-12 |
| CN1255080A (zh) | 2000-05-31 |
| KR100485846B1 (ko) | 2005-04-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20030820 Termination date: 20170508 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |