CN111822443A - Control method for laser cleaning energy density threshold - Google Patents
Control method for laser cleaning energy density threshold Download PDFInfo
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- CN111822443A CN111822443A CN201910310787.4A CN201910310787A CN111822443A CN 111822443 A CN111822443 A CN 111822443A CN 201910310787 A CN201910310787 A CN 201910310787A CN 111822443 A CN111822443 A CN 111822443A
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- China
- Prior art keywords
- laser
- cleaning
- energy density
- density threshold
- control method
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/0035—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
- B08B7/0042—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like by laser
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B13/00—Accessories or details of general applicability for machines or apparatus for cleaning
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- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
The invention discloses a control method of laser cleaning energy density threshold in the technical field of laser cleaning, which comprises the steps of controlling all electrical appliances by an external power supply, starting a laser, enabling laser emitted by the laser to act on the surface of a cleaning material substrate through a condenser lens, detecting laser plasma by a detector, and performing processing calculation by a microprocessor; then, repeating the operation to obtain a plurality of groups of laser energy values and peak voltage values, and performing processing calculation through a microprocessor to obtain a laser cleaning energy density threshold value so as to control; can be at any time quick survey laser energy through the detector, then through the cooperation with microprocessor, the relation of survey laser energy value that can be quick and survey laser plasma's peak voltage value calculates laser and washs threshold value and laser damage threshold value, has avoided the repetition test many times, has reduced experimental time and cost.
Description
Technical Field
The invention relates to the technical field of laser cleaning, in particular to a control method of a laser cleaning energy density threshold.
Background
When laser cleaning is carried out, when the laser energy is too high, the material to be cleaned is easy to be damaged to a certain degree, and when the laser energy is too low, the material cannot be cleaned effectively; therefore, a control method for the laser cleaning energy density threshold is provided.
Disclosure of Invention
The present invention is directed to a method for controlling a laser cleaning energy density threshold, so as to solve the problems mentioned in the background art.
In order to achieve the purpose, the invention provides the following technical scheme: a control method of laser cleaning energy density threshold comprises the following steps: the device comprises a laser, a condenser, a detector, a cleaning material matrix, a displacement sensor, a microprocessor, a spectrometer and a filter mirror.
A control method of laser cleaning energy density threshold comprises the following steps,
s1: controlling all electrical appliances to be switched on and off through an external power supply, starting a laser, and enabling laser emitted by the laser to act on the surface of the cleaning material substrate through a condenser;
s2: and the laser generates laser plasma after going through step S1, and the laser plasma can be detected by the detector,
s3: the laser plasma enters the micro processor after passing through the spectrometer and the filter mirror, and is processed and calculated through the micro processor;
s4: and repeating the steps from S1 to S3 for multiple times to obtain multiple groups of laser energy values and peak voltage values, and performing processing calculation through a microprocessor to obtain a laser cleaning energy density threshold value for control.
Further, the steps S1 to S3 are repeated five times or more.
Further, the preset cleaning time in the step S1 is 1 second to 1.25 seconds.
Further, the laser energy value in step S4 changes from small to large in an equal range.
Compared with the prior art, the invention has the beneficial effects that:
the control method for the laser cleaning energy density threshold is simple to operate and convenient to use, can be used for rapidly detecting the laser energy at any time through the detector, and then can be used for rapidly calculating the laser cleaning threshold and the laser damage threshold through the cooperation with the micro-processor and detecting the relation between the laser energy value and the peak voltage value of the laser plasma, so that repeated tests are avoided, and the test time and cost are reduced.
Drawings
FIG. 1 is a schematic view of the structure of the present invention.
In the figure: 1. a laser; 2. a condenser lens; 3. a detector; 4. cleaning a material substrate; 5, a displacement sensor; 6. a microprocessor; 7. a spectrometer; 8. and a filter mirror.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, the present invention provides a technical solution: a control method of laser cleaning energy density threshold comprises the following steps: the device comprises a laser 1, a condenser 2, a detector 3, a cleaning material substrate 4, a displacement sensor 5, a microprocessor 6, a spectrometer 7 and a filter lens 8.
A control method of laser cleaning energy density threshold comprises the following steps,
s1: all electrical appliances are controlled to be switched on and off through an external power supply, the laser 1 is started, and laser emitted by the laser 1 acts on the surface of the cleaning material matrix 4 through the condenser lens 2;
s2: and the laser generates laser plasma after going through step S1, and the laser plasma can be detected by the detector 3,
s3: the laser plasma enters the microprocessor 6 after passing through the spectrometer 7 and the filter 8, and is processed and calculated by the microprocessor 6;
s4: and repeating the steps from S1 to S3 for multiple times to obtain multiple groups of laser energy values and peak voltage values, and performing processing calculation through the microprocessor 6 to obtain a laser cleaning energy density threshold value for control.
The steps S1 to S3 are repeated five times or more.
The preset cleaning time in the step S1 is 1 second to 1.25 seconds.
The laser energy value in the step S4 changes from small to large in a constant range.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (5)
1. A control method of laser cleaning energy density threshold is characterized in that: the device comprises a laser (1), a condenser (2), a detector (3), a cleaning material substrate (4), a displacement sensor (5), a micro-processor (6), a spectrometer (7) and a filter mirror (8).
2. A control method of laser cleaning energy density threshold is characterized in that: comprises the following steps of (a) carrying out,
s1: all electrical appliances are controlled to be switched on and off through an external power supply, the laser (1) is started, and laser emitted by the laser (1) acts on the surface of the cleaning material substrate (4) through the condenser lens (2);
s2: and the laser generates laser plasma after going through step S1, and the laser plasma can be detected by the detector (3),
s3: the laser plasma enters the micro processor (6) after passing through the spectrometer (7) and the filter mirror (8), and is processed and calculated through the micro processor (6);
s4: and repeating the steps from S1 to S3 for multiple times to obtain multiple groups of laser energy values and peak voltage values, and performing processing calculation through a microprocessor (6) to obtain a laser cleaning energy density threshold value so as to perform control.
3. The method of claim 2, wherein the threshold is selected from the group consisting of: the steps S1 to S3 are repeated five times or more.
4. The method of claim 2, wherein the threshold is selected from the group consisting of: the preset cleaning time in the step S1 is 1 second to 1.25 seconds.
5. The method of claim 2, wherein the threshold is selected from the group consisting of: the laser energy value in the step S4 changes from small to large in a constant range.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910310787.4A CN111822443A (en) | 2019-04-18 | 2019-04-18 | Control method for laser cleaning energy density threshold |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910310787.4A CN111822443A (en) | 2019-04-18 | 2019-04-18 | Control method for laser cleaning energy density threshold |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111822443A true CN111822443A (en) | 2020-10-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910310787.4A Pending CN111822443A (en) | 2019-04-18 | 2019-04-18 | Control method for laser cleaning energy density threshold |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111822443A (en) |
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2019
- 2019-04-18 CN CN201910310787.4A patent/CN111822443A/en active Pending
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Legal Events
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| PB01 | Publication | ||
| PB01 | Publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20201027 |
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| WD01 | Invention patent application deemed withdrawn after publication |