CN111795802A - Device and method for measuring angle characteristic of light beam sampler - Google Patents
Device and method for measuring angle characteristic of light beam sampler Download PDFInfo
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- CN111795802A CN111795802A CN202010557771.6A CN202010557771A CN111795802A CN 111795802 A CN111795802 A CN 111795802A CN 202010557771 A CN202010557771 A CN 202010557771A CN 111795802 A CN111795802 A CN 111795802A
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- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
Abstract
The device comprises a laser, a laser processing component, a sampler and a laser measuring component which are sequentially arranged according to a light path, wherein the sampler and the laser measuring component are arranged on a turntable through a two-dimensional moving platform, and the light path is positioned right above the circle center of the turntable. The invention changes the laser receiving angle of the sampler through the turntable, and ensures that the light path always passes through the center of the sampler in the changing process, thereby ensuring that the value obtained by the laser measuring component is more accurate, and further obtaining more accurate angle obtaining characteristic.
Description
Technical Field
The invention relates to the field of laser beam sampling, in particular to a device and a method for measuring the angle characteristic of a beam sampler.
Background
The laser is transmitted in the medium such as the atmosphere, and due to the interaction with the transmission medium, the characteristic parameters of the output laser need to be measured in practical application, and the parameters such as the laser spot size, the beam quality, the centroid drift and the like are obtained, so that the laser is used for analyzing the atmosphere transmission effect of the laser and evaluating the control capability, the tracking and aiming capability and the like of a laser system. In the laser beam measurement process, the laser beam to be measured needs to be spatially sampled firstly, but the existing sampling technology has the main disadvantage that the measurement has angle sensitivity.
Disclosure of Invention
The invention provides a device and a method for measuring the angle characteristic of a light beam sampler, aiming at solving the problem that the intensity value of a sampling light spot is changed after the incident angle of laser is changed, and further the uncertainty of measurement is introduced.
Light beam sampler angle characteristic measuring device includes laser instrument, laser processing subassembly, sampler, the laser survey subassembly that sets gradually according to the light path, sampler and laser survey subassembly module pass through two-dimensional moving platform and set up on the carousel, and the light path is located the carousel centre of a circle directly over.
The method for using the device for measuring the angular characteristics of the beam sampler comprises the following steps:
s1, adjusting the intersection point of the first scattering surface of the sampler and the optical axis of the incident laser to be right above the center of the turntable, and adjusting the optical path;
s2, rotating the angle of the turntable, and changing the receiving angle of the sampler;
s3, measuring values of the laser measuring assembly at different angles;
and S4, summarizing different angles and corresponding measured values to obtain curves, and obtaining angle characteristics.
The invention has the advantages that:
(1) according to the invention, the laser receiving angle of the sampler is changed through the turntable, and the incident laser is ensured to always pass through the same position of the sampler in the changing process, so that the value obtained by the laser measuring component is more accurate, and more accurate angle characteristics are obtained.
(2) The invention adopts two measuring devices and corresponding methods for the angle characteristic of the light beam sampler, one is to adopt a power meter to directly measure the intensity of laser penetrating through the sampler; the other method is based on camera imaging, image information acquired by a camera is converted into a response value of a detection unit through a data processing system, and finally the relation between the laser intensity measured by a sampler and the laser incidence angle, namely the angle characteristic of the laser intensity is obtained.
(3) The direct measurement method of the power meter is direct and simple, the measured value is the actual power value, and data processing and conversion are not needed.
(4) The beam expander is used for expanding incident laser into a light beam with a relatively large uniform area, and a relatively large measurement error can be caused by a small offset angle when a light path is aligned if the Gaussian distribution of an experimental laser spot is relatively sharp. In order to reduce experimental errors, a beam expander is used for expanding an incident laser beam into light spots with relatively large distribution in a uniform area in an experiment, and meanwhile, the operation precision requirements of manual alignment and manual component adding can be reduced.
Drawings
FIG. 1 is a system configuration diagram of a first embodiment of an apparatus for measuring angular characteristics of a beam sampler;
FIG. 2 is a system configuration diagram of a second embodiment of the apparatus for measuring angular characteristics of a beam sampler;
FIG. 3 is a speckle pattern taken by a camera;
FIG. 4 is a processed image of a spot;
FIG. 5 is a flowchart of a method corresponding to the first embodiment of the apparatus for measuring angular characteristics of a beam sampler;
fig. 6 is a flow chart of a method corresponding to the second embodiment of the apparatus for measuring angular characteristics of a beam sampler.
The notations in the figures have the following meanings:
1-laser 2-beam expander 3-aperture diaphragm 4-sampler
5-target surface hole of quasi-detection unit 6-power meter
7-imaging screen 8-camera 9-turntable 10-data processing system
Detailed Description
Example 1
As shown in fig. 1, the device for measuring the angular characteristics of the light beam sampler comprises a laser 1, a laser processing component, a sampler 4 and a laser measuring component which are sequentially arranged according to a light path, wherein the sampler 4 and the laser measuring component are arranged on a turntable 9 through a two-dimensional moving platform, and the light path is positioned right above the center of the circle of the turntable 9.
The laser measurement assembly comprises a target surface hole 5 of the detection unit and a power meter 6 which are arranged in sequence. The power meter 6 is required to be installed at the same distance from the sampler as the actual detection unit.
The laser processing assembly comprises a beam expander 2 and an aperture diaphragm 3 which are sequentially arranged along a light path. The aperture diaphragm 3 is an iris diaphragm.
In the embodiment, the laser receiving angle of the sampler 4 is changed by rotating the turntable 9, the readings of the power meter 6 at different receiving angles are read, and the characteristic curve of the power measurement value and the angle of the sampler 4 is obtained. The direct measurement method of the power meter 6 is direct and simple, the measured value is the actual power value, and data processing and conversion are not needed.
Example 2
As shown in fig. 2, the device for measuring the angular characteristics of the light beam sampler comprises a laser 1, a laser processing component, a sampler 4 and a laser measuring component which are sequentially arranged according to a light path, wherein the sampler 4 and the laser measuring component are arranged on a turntable 9 through a two-dimensional moving platform, and the light path is positioned right above the center of the circle of the turntable 9.
The laser measuring component comprises an imaging screen 7 and a camera 8 which are arranged in sequence, and further comprises a data processing system 10 connected with the camera 8.
The laser processing assembly comprises a beam expander 2 and an aperture diaphragm 3 which are sequentially arranged along a light path.
The position of the imaging screen 7 is the measured position of the actual detection unit and the data acquired by the camera 8 are analyzed by the data processing system 10.
Example 3
As shown in fig. 5, the method of using the apparatus for measuring angular characteristics of a beam sampler according to embodiment 1 includes the steps of:
s1, adjusting the intersection point of the first scattering surface of the sampler 4 and the optical axis of the incident laser to be right above the center of the circle of the turntable, and adjusting all components in the optical path;
the specific steps of adjusting the intersection point of the first scattering surface of the sampler 4 and the optical axis of the incident laser to be right above the center of the circle of the turntable are as follows:
s111, when the laser 1 and the turntable 9 are installed, ensuring that an incident laser optical axis passes through the position right above the circle center of the turntable 9;
s112, mounting the sampler 4 and the laser measuring component on a two-dimensional moving platform, turning on a laser light source, and adjusting the small-hole diaphragm 3 in the laser processing component to enable the size of a light spot emitted from the small-hole diaphragm 3 to be an area with a uniform center, wherein the area is enough to cover one sampling hole of the sampler 4 but not enough to cover two sampling holes;
s113, moving a second slide rail perpendicular to the optical axis direction in the two-dimensional moving platform to enable the light spot to be aligned to one sampling hole of the first scattering surface of the sampler 4;
s114, rotating the turntable 9 to observe whether the light spot covers the same sampling hole, and if the light spot is emitted out of the sampling hole, adjusting a first sliding rail parallel to the optical axis direction in the two-dimensional moving platform to enable the light spot to cover the sampling hole again; the angle of rotation of the turntable 9 is in the range of 0-180.
And S115, repeating the step S113 and the step S114, and adjusting until the position of the light spot moves within the error range within the first set range of the rotating disc 9, wherein the position of the circle center is adjusted, namely the intersection point of the first scattering surface of the sampler 4 and the optical axis of the incident laser is right above the circle center of the rotating disc 9.
S2, rotating the angle of the turntable 9 to change the receiving angle of the sampler 4;
s3, measuring values of the laser measuring assembly at different angles; the measured value is the power value.
And S4, summarizing different angles and corresponding measured values to obtain curves, and obtaining angle characteristics.
Example 4
As shown in fig. 6, the method of using the apparatus for measuring angular characteristics of a beam sampler according to embodiment 2 includes the steps of:
s1, adjusting the intersection point of the first scattering surface of the sampler 4 and the optical axis of the incident laser to be right above the center of the circle of the turntable, and adjusting all components in the optical path; the specific step of adjusting the intersection point of the first scattering surface of the sampler 4 and the optical axis of the incident laser right above the center of the circle of the turntable is shown in embodiment 3, and the step of adjusting the laser measurement component is further included in the optical path, and specifically as follows:
s121, focusing, namely focusing the camera 8 on the position of the imaging screen 7 and reading scale data at the moment; and converting the spot image acquired by the camera 8 according to pixel/mm of a pixel scale.
S122, setting acquisition parameters of the camera 8; and selecting a pixel frame subjected to gridding processing by the camera 8 to simulate the target surface of the actual detection unit, wherein the size of the pixel frame is the same as that of the target surface hole 5 of the detection unit to be detected. Each pixel frame is targeted by a possible detection unit.
And S123, generating an environmental background in real time under the exposure time required by measurement.
S2, rotating the angle of the turntable 9 to change the receiving angle of the sampler 4;
s3, measuring values of the laser measuring assembly at different angles; the measured value is the spot image information.
And S4, summarizing different angles and corresponding measured values to obtain curves, and obtaining angle characteristics. And summarizing the light spot image information corresponding to different angles aiming at the data processing system 10 to obtain an angle characteristic curve of the sampler 4. The method specifically comprises the following steps: and counting the response average value of the camera 8 in each pixel frame, and converting the image information acquired by the camera 8 into a single detection unit response value. Selecting the pixel frame of the central position of the target surface acquired by the camera 8, and taking the response value as the intensity value P of the detection unitoutThe calculation formula is as follows:
in the formula, SDFor detecting the effective photosensitive area of the unit, mean is the mean function, and ADU is the response value of each pixel point of the camera 8. The speckle pattern obtained after the above-mentioned processing is shown in figure 4,
because the detection unit can respond to the maximum value of the power density in the detection target surface area, the numerical value of the central pixel frame is selected as the response value of the detection unit, after the laser receiving angle is changed, the response value of the same position is still selected as the intensity value under the angle, and the characteristic curve of the measured laser intensity value and the receiving angle is obtained, namely the angle characteristic curve of the sampler. The measurement of the camera 8 imaging method is recorded in an image mode, the method is visual, a pixel frame can be selected according to the target surface sizes of different detection units during later-stage data processing, the target surface angle characteristics of the detection units with different specifications can be obtained by setting parameters of data processing software, and the method is more flexible and adaptive.
The position of the imaging screen 7 in the experimental light path is the position of the detection unit, and the light spot on the imaging screen 7 shot by the camera 8 is the light spot of the sampling response of the detection unit. The light spot on the imaging screen 7 shot by the camera 8 is as shown in fig. 4, the size of the image is determined by the acquisition software, and the size of the target surface of the detection unit is the photosensitive surface of the detection unit, so that the acquired data needs to be converted.
The invention is not to be considered as limited to the specific embodiments shown and described, but is to be understood to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the appended claims.
Claims (10)
1. Light beam sampler angle characteristic measuring device, its characterized in that includes laser instrument (1), laser processing subassembly, sampler (4), the laser survey subassembly that sets gradually according to the light path, sampler (4) and laser survey subassembly module pass through two-dimensional moving platform and set up on carousel (9), and the light path is located carousel (9) centre of a circle directly over.
2. The beam sampler angle characteristic measuring device according to claim 1, wherein the laser measuring assembly comprises a target surface hole (5) of the unit to be detected and a power meter (6) which are arranged in sequence.
3. The beam sampler angle characteristic measuring device according to claim 1, characterized in that the laser measuring assembly comprises an imaging screen (7), a camera (8) arranged in sequence, and a data processing system (10) connected with the camera (8).
4. The beam sampler angle characteristic measuring device according to claim 1, wherein the laser processing assembly comprises a beam expanding lens (2) and an aperture stop (3) which are arranged in sequence along the optical path.
5. A method of using the beam sampler angular characteristic measurement device of claim 1, comprising the steps of:
s1, adjusting the intersection point of the first scattering surface of the sampler (4) and the optical axis of the incident laser to be right above the center of the circle of the turntable, and adjusting all components in the optical path;
s2, rotating the angle of the turntable (9) to change the receiving angle of the sampler (4);
s3, measuring values of the laser measuring assembly at different angles;
and S4, summarizing different angles and corresponding measured values to obtain curves, and obtaining angle characteristics.
6. The method according to claim 5, wherein when the laser measuring assembly comprises a target surface hole (5) of the unit to be detected and a power meter (6) which are arranged in sequence, the measured value of step S3 is a power value.
7. The method according to claim 5, wherein when the laser measuring assembly comprises an imaging screen (7) and a camera (8) which are arranged in sequence, in step S1, the step of adjusting the optical path comprises the following steps:
s121, focusing, namely focusing the camera (8) to the position of the imaging screen (7), and reading scale data at the moment;
s122, setting acquisition parameters of a camera (8);
and S123, generating an environmental background in real time under the exposure time required by measurement.
8. The method according to claim 7, wherein the measurement value in step S3 is spot image information.
9. The method according to claim 8, wherein step S4 is specifically: and summarizing light spot image information corresponding to different angles aiming at the data processing system (10) to obtain an angle characteristic curve of the sampler (4).
10. The method of claim 5, wherein in step S1, the step of adjusting the intersection point of the optical axis of the incident laser beam and the center of the turntable to be directly above the center of the turntable is as follows:
s111, when the laser (1) and the turntable (9) are installed, ensuring that an incident laser optical axis passes through the position right above the circle center of the turntable (9);
s112, mounting the sampler (4) and the laser measuring component on a two-dimensional moving platform, turning on a laser light source, and adjusting a small-hole diaphragm (3) in the laser processing component to enable the size of a light spot emitted from the small-hole diaphragm (3) to be an area with a uniform center, wherein the area is enough to cover one sampling hole of the sampler (4) but not enough to cover two sampling holes;
s113, moving a second slide rail perpendicular to the optical axis direction in the two-dimensional moving platform to enable the light spot to be aligned to one sampling hole of the first scattering surface of the sampler (4);
s114, rotating the turntable (9), observing whether the light spot covers the same sampling hole, and if the light spot is emitted out of the sampling hole, adjusting a first sliding rail parallel to the optical axis direction in the two-dimensional moving platform to enable the light spot to cover the sampling hole again;
s115, repeating the step S113 and the step S114, and adjusting until the position of the light spot moves in the error range when the turntable (9) is rotated within the first set range, wherein the position of the circle center is adjusted, namely the intersection point of the first scattering surface of the sampler (4) and the optical axis of the incident laser is right above the circle center of the turntable.
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