CN111693808B - Electrical characteristic testing method of thermal printing head - Google Patents
Electrical characteristic testing method of thermal printing head Download PDFInfo
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- CN111693808B CN111693808B CN202010526770.5A CN202010526770A CN111693808B CN 111693808 B CN111693808 B CN 111693808B CN 202010526770 A CN202010526770 A CN 202010526770A CN 111693808 B CN111693808 B CN 111693808B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Abstract
The invention provides a method for testing the electrical characteristics of a thermal printing head, which comprises a power-on step, an energy selecting signal testing step, a latching signal testing step and a heating element resistance value testing step. After connecting thermal printhead head, wait after mains voltage stabilizes, test the resistance of selecting the ability signal function, latching signal function and each solitary heat-generating body in proper order, three tests all pass, then represent current test thermal printhead head accords with the standard and belongs to the yields, can supply follow-up use, and the present case test scheme is stabilized and comprehensive test, and convenient high efficiency to each item function.
Description
Technical Field
The invention relates to the field of electrical characteristic detection, in particular to an electrical characteristic testing method of a thermal printing head.
Background
With the popularization and application of thermal printers in various industries, the thermal printer structure is used in automatic teller machines, cash terminals, take-out terminals, catering terminals and e-commerce delivery terminals of banks, the printing of the thermal printer structure is rapidly increased particularly in catering, e-commerce and express delivery industries, and higher requirements are provided for the stability and durability of the thermal printer.
The core printing component in the thermal printer is a thermal printing head which is a main execution unit for printing images on the thermal printer such as bills or bar codes, and the thermal printing head is composed of a row of heating elements which are arranged relatively densely, the arrangement of the heating elements is from 200dpi to 600dpi, and the heating elements can generate high temperature quickly when passing through certain current.
As printers require more demanding stability and durability, the quality of thermal printheads needs to be tightly controlled.
Disclosure of Invention
The invention aims to provide a stable, comprehensive and convenient method for testing the electrical characteristics of a thermal printing head.
In order to achieve the object of the present invention, the present invention provides an electrical characteristic testing method of a thermal print head, comprising:
electrifying, namely electrifying the thermal printing head and keeping the voltage stable;
an energy selecting signal testing step, namely detecting the conduction energy selecting voltage of the thermal printing head in a conduction energy selecting state and detecting the blocking energy selecting voltage of the thermal printing head in a blocking energy selecting state;
a latch signal testing step, namely controlling the thermal printing head to be in a conduction energy selection state, detecting conduction latch voltage of the thermal printing head in the conduction latch state, and detecting blocking latch voltage of the thermal printing head in the blocking latch state;
a heating element resistance value testing step, which is used for detecting the resistance value of each heating element in the thermal printing head;
and when the conduction energy selection voltage, the blocking energy selection voltage, the conduction latch voltage, the blocking latch voltage and the resistance value of the heating element all accord with preset values, the thermal printing head is a good product.
According to the scheme, after the thermal printing head is connected and the power supply voltage is stable, the energy selecting signal function, the signal latching function and the resistance value of each single heating body are tested in sequence, if the three tests are passed, the fact that the thermal printing head meets the standard and belongs to a good product can be provided for subsequent use, and the test scheme can be used for stably and comprehensively testing all functions, and is convenient and efficient.
Further, the power-up step comprises:
powering up the thermal printing head;
outputting all logic '0' printing data to the thermal printing head;
sequentially sending a conduction latch signal and a blocking latch signal to the thermal printing head;
reading a power supply detection voltage;
and judging whether the power supply detection voltage is stable, and if so, executing an energy selection signal test step.
Further, the step of reading the power supply detection voltage is as follows: reading power supply detection voltage every other preset time;
the step of judging whether the power supply detection voltage is stable is as follows: and when the variation range of the power supply detection voltage which is read continuously for three times is judged to be less than +/-2%, the power supply detection voltage is considered to be stable.
As can be seen, in order to improve the accuracy of the test, it is necessary to ensure the stability of the power supply voltage.
Further, the energy selecting signal testing step comprises;
outputting all logic '1' printing data to the thermal printing head;
sequentially outputting a conduction latch signal and a blocking latch signal to the thermal printing head;
outputting a blocking energy selection signal to the thermal printing head to obtain blocking energy selection voltage;
outputting a conduction energy selection signal to the thermal printing head to obtain a conduction energy selection voltage;
and when the conduction energy selection voltage and the blocking energy selection voltage accord with preset values, executing a latching signal test step.
Further, the latch signal testing step includes:
controlling the thermal printing head to be in a conduction energy selection state;
outputting all logic '0' printing data to a thermal printing head, and reading a first blocking latch voltage in a blocking latch state;
if the first blocking latch voltage is not equal to the blocking reference voltage of the heating element in the full blocking state, reading the first conduction latch voltage in the conduction latch state;
if the first conduction latch voltage is not equal to the blocking reference voltage, reading a second blocking latch voltage in a blocking latch state;
and if the second blocking latch voltage is equal to the blocking reference voltage, executing a heating element resistance value testing step.
Therefore, the enabling function and the latching function can be comprehensively tested by the method.
The electrical testing device for the electrical characteristic testing method comprises a processing unit and a driving circuit, wherein the driving circuit comprises a switch circuit and a detection circuit, the processing unit is connected with the switch circuit, and the processing unit controls the on-off of the detection circuit through the switch circuit;
the detection circuit comprises a first resistor, a second resistor and a third resistor which are sequentially connected in series, wherein the first end of the first resistor is connected with a power supply end, the power supply end of the thermal printing head is connected with the second end of the first resistor and the first end of the second resistor, the detection end of the processing unit is connected with the second end of the second resistor and the first end of the third resistor, and the second end of the third resistor is grounded;
the conduction energy selection voltage, the blocking energy selection voltage, the conduction latch voltage and the blocking latch voltage are obtained from the detection end of the processing unit.
Further, the reference voltage of the heating element can be obtained from the detection end of the processing unit, and the resistance value of the heating element meets the following formula:
DOTn＝Vin＊[(R2+R3)＊R1]/[(R2+R3)+R1]/(Vb－Vin)；
wherein, DOTn is the resistance value of the heating element, vin is the reference voltage of the heating element, vb is the blocking reference voltage of the heating element in the full blocking state, R1 is a first resistor, R2 is a second resistor, and R3 is a third resistor.
It is thus clear that, through processing unit and drive circuit, pass through the winding displacement with electric testing arrangement and be connected with thermal print head during the test, then can conveniently acquire each voltage value through the sense terminal, then can compare the test directly perceivedly to can accurately test high-efficiently.
Drawings
Fig. 1 is a structural view of a thermal print head of the present invention.
Fig. 2 is an internal schematic diagram of a thermal print head of the present invention.
FIG. 3 is a schematic circuit diagram of an embodiment of the electrical test apparatus of the present invention.
FIG. 4 is a flow chart of an embodiment of the electrical characteristic testing method of the present invention.
Fig. 5 is a flowchart of a power-up step in an embodiment of the electrical characteristic testing method of the present invention.
FIG. 6 is a flowchart of an enable signal test procedure in an embodiment of the electrical characteristic testing method of the present invention.
FIG. 7 is a flowchart of the latch signal testing procedure in the embodiment of the electrical characteristic testing method of the present invention.
FIG. 8 is a flowchart of a heating element resistance value testing step in the embodiment of the electrical characteristic testing method of the invention.
The invention is further explained with reference to the drawings and the embodiments.
Detailed Description
Referring to fig. 1, a thermal print head 1 is provided with a circuit board 11, a heating element arrangement region 14 is provided on the circuit board 11, the heating element arrangement region 14 is arranged in a band shape and provided with a plurality of heating elements thereon, the plurality of heating elements are arranged in a matrix, a connection serial port 12 is further provided on the circuit board 11, and the connection serial port 12 can be connected to a thermal printer or an electrical test device through a flat cable.
Referring to fig. 2, fig. 2 is an internal schematic diagram of the thermal print head, and the following describes the connection of each signal port in the serial port:
VH: a power supply end of the heating element;
GND: a ground terminal;
STB1, STB2: a gating signal of the heating element;
LAT: a data latch signal;
CLK: a clock signal;
DI2, DI1: inputting data;
DO2, DO1: outputting data;
VDD: a logic chip power supply;
TM: a thermistor;
DOT #1-DOT #640: a heating element.
Referring to fig. 3, the electrical testing apparatus for the electrical characteristic testing method is a schematic circuit diagram, the electrical testing apparatus includes a processing unit MCU and a driving circuit, the driving circuit includes a switching circuit and a detection circuit, the detection circuit includes a resistor R1, a resistor R2 and a resistor R3 connected in series in sequence, the switching circuit includes a field effect transistor Q1, a transistor Q2, a resistor R4, a resistor R5, a resistor R6 and a resistor R7, a control end of the processing unit MCU is connected to a first end of the resistor R6, a second end of the resistor R6 is connected to a base of the transistor Q2 and a first end of the resistor R7, a second end of the resistor R7 and an emitter of the transistor Q2 are grounded, a collector of the transistor Q2 is connected to a first end of the resistor R5, a second end of the resistor R5 is connected to a first end of the resistor R4 and a gate of the field effect transistor Q1, a second end of the resistor R4 and a source of the field effect transistor Q1 are connected to PWR, a source end of the field effect transistor Q1 and a power supply end of the resistor R3 are connected to a power supply end of the processing unit, and a second end of the detection circuit is connected to a power supply terminal of the resistor R3. The processing unit MCU is also connected with each signal port of the thermal printing head through other I/O interfaces, and the processing unit MCU can be connected with a connecting serial port through a flat cable during connection.
The on-off of the field effect transistor Q1 and the triode Q2 can be controlled through the signal control of the control end of the processing unit MCU, and the on-off of the switching circuit and the power supply of the power end VH of the heating element are controlled through the conduction or blocking of the field effect transistor Q1. And outputting different control signals or data signals to the heat-sensitive printing head by using the control processing unit MCU, and then acquiring a voltage reference value through the detection end Vin, wherein the voltage reference value comprises a conduction energy selection voltage, a blocking energy selection voltage, a conduction latch voltage and a heating body reference voltage.
Referring to fig. 4, fig. 4 is a flowchart of an electrical characteristic testing method, when a test is started, a thermal print head is connected with an electrical testing device, the electrical characteristic testing method includes a power-on step S1, an energy selection signal testing step S2, a latch signal testing step S3 and a heating element resistance value testing step S4, if the power-on step S1, the energy selection signal testing step S2, the latch signal testing step S3 and the heating element resistance value testing step S4 are passed, the thermal print head is considered to be a good product, and if any one of the power-on step S1, the energy selection signal testing step S2, the latch signal testing step S3 and the heating element resistance value testing step S4 is not passed, the thermal print head is considered to be a bad product.
Referring to fig. 5, the power-up step S1 includes the steps of:
the thermal printing head is powered on under the control of the processing unit, and the power supply comprises power supply for a power supply end VH of the heating element and a power supply VDD of the logic chip;
executing step S11, outputting all the printing data of logic '0' to the thermal printing head;
step S12 is executed, and the conduction latch signal, namely the signal of logic '1', is sent to the thermal printing head, and then the blocking latch signal, namely the signal of logic '0', is sent to the thermal printing head in sequence;
step S13 is executed, the power supply detection voltage is read, and the power supply detection voltage is read at the detection end Vin every 0.1 second during reading;
step S14 is executed to determine whether the power supply detection voltage is stable, and whether the variation range of the power supply detection voltage read for three consecutive times is smaller than ± 2% may be determined, if yes, step S15 is executed to determine that the power supply detection voltage is stable, otherwise, step S13 is executed to continue reading and wait for the voltage to be stable.
Referring to fig. 6, after the voltage is stabilized, an enable signal test step S2 is performed, where the enable signal test step S2 includes the steps of:
executing step S21, outputting all the printing data of logic '1' to the thermal printing head;
step S22 is executed, the latch signal is controlled, the conduction latch signal, namely the signal of sending logic '1', is sequentially output to the thermal printing head, and then the blocking latch signal, namely the signal of sending logic '0', is output;
step S23 is executed, the gating signal is controlled, the blocking energy selecting signal, namely the signal of logic '0', is output to the thermal printing head, the blocking energy selecting voltage of the detection end Vin is obtained and recorded, then the conducting energy selecting signal, namely the signal of logic '1', is output to the thermal printing head, and the conducting energy selecting voltage of the detection end Vin is obtained and recorded;
because the printing data which is output to be logic '1' represents that all the heating elements of the printing head are conducted simultaneously to work, the conduction reference voltage Va under the full conduction state of the heating elements can be obtained by reading the detection end Vin, when the printing data which is output to be logic '0' represents that all the heating elements of the printing head are blocked simultaneously, the blocking reference voltage Vb under the full blocking state of the heating elements can be obtained by reading the detection end Vin, when the step S24 is executed, the blocking selection energy signal is compared with the blocking reference voltage Vb, and the conduction selection energy voltage is compared with the conduction reference voltage Va, if the two voltages are equal, the gating function is normal, the latching signal testing step S3 can be executed, if one of the voltage data is different, the gating function is judged to be abnormal or the data transmission is abnormal, and then the defective product S52 can be judged.
Referring to fig. 7, a latch signal test step S3 is performed, which includes:
controlling the thermal printing head to be in a conduction energy selection state, executing a step S31, outputting all printing data of logic '0' to the thermal printing head, and reading a first blocking latch voltage from Vin in a blocking latch state;
step S32 is executed, whether the first blocking latch voltage is the blocking reference voltage Vb or not is judged, if yes, the effective logic of the latch signal is '0', then the latch information is invalid, and a defective product can be judged, and if the first blocking latch voltage is not equal to the blocking reference voltage Vb in the state that the heating element is completely blocked, step S33 is executed;
executing step S33, controlling the latch signal, sending a signal of logic "1" to the print head, and reading the first turn-on latch voltage from Vin in the turn-on latch state;
step S34 is executed to determine whether the first pass latch voltage is the blocking reference voltage Vb, if so, the effective logic of the latch signal is "1", and then the latch information is invalid, and it may be determined as a defective product, and if the first pass latch voltage is not equal to the blocking reference voltage Vb, step S35 is executed;
executing step S35, controlling the latch signal, sending a signal of logic "0" to the print head, and reading a second blocking latch voltage from Vin in a blocking latch state;
and step S36 is executed to determine whether the second blocking latch voltage is the blocking reference voltage Vb, if not, the latch information is invalid, and the latch information can be determined to be a defective product, if so, that is, the second blocking latch voltage is equal to the blocking reference voltage, the valid logic of the latch signal is "0", and then the next test can be performed, and step S4 of testing the resistance value of the heating element is executed.
Referring to fig. 8, an enable signal test step S4 is performed, which includes:
controlling the thermal printing head to be in a conduction energy selection state, executing a step S41, inputting printing data and controlling a clock signal to enable one heating element to be electrified and heated, and blocking other heating elements;
executing step S42, reading the reference voltage of the heating element from the detection end Vin of the processing unit;
step S43 is executed, the resistance value of the heating element is calculated, and according to the calculation formula:
DOTn＝Vin＊[(R2+R3)＊R1]/[(R2+R3)+R1]/(Vb－Vin)；
wherein, DOTn is the resistance value of the heating element, vin is the reference voltage of the heating element, vb is the blocking reference voltage of the heating element in the full blocking state, R1 is the resistance value of the resistor R1, R2 is the resistance value of the resistor R2, and R3 is the resistance value of the resistor R3.
After the reference voltage of the current heating element is read, the step S41 is returned to be executed to heat another heating element, and then each heating element can be heated independently and the corresponding reference voltage of the heating element is read.
And when the resistance values of the heating elements corresponding to all the heating elements are calculated and recorded, comparing the resistance values with factory preset parameters of the thermal sensitive sheet, if the resistance values are the same, judging that the thermal printing head is a good product S51, and if the resistance values are not the same, judging that the thermal printing head is a defective product S52.
Claims (4)
1. A method for testing electrical characteristics of a thermal print head, comprising:
a power-on step, namely, powering on the thermal printing head and keeping the voltage stable;
an energy selecting signal testing step, namely detecting the conduction energy selecting voltage of the thermal printing head in a conduction energy selecting state and detecting the blocking energy selecting voltage of the thermal printing head in a blocking energy selecting state;
a latch signal testing step, namely controlling the thermal printing head to be in a conduction energy selection state, detecting conduction latch voltage of the thermal printing head in the conduction latch state, and detecting blocking latch voltage of the thermal printing head in the blocking latch state;
a heating element resistance value testing step, which is used for detecting the resistance value of each heating element in the thermal printing head;
when the conducting energy selecting voltage, the blocking energy selecting voltage, the conducting latching voltage, the blocking latching voltage and the resistance value of the heating element all accord with preset values, the thermal printing head is a good product;
the step of powering up comprises:
powering up the thermal print head;
outputting all logic '0' printing data to the thermal printing head;
sequentially sending a conduction latch signal and a blocking latch signal to the thermal printing head;
reading a power supply detection voltage;
judging whether the power supply detection voltage is stable, and if so, executing the energy selection signal test step;
the energy selecting signal testing step comprises the following steps:
outputting all logic '1' printing data to the thermal printing head;
sequentially outputting a conduction latch signal and a blocking latch signal to the thermal printing head;
outputting a blocking energy selection signal to the thermal printing head to obtain blocking energy selection voltage;
outputting a conduction energy selection signal to the thermal printing head to obtain the conduction energy selection voltage;
when the conduction energy selecting voltage and the blocking energy selecting voltage accord with preset values, executing the latching signal testing step;
the latch signal testing step includes:
controlling the thermal printing head to be in a conduction energy selection state;
outputting all logic '0' printing data to the thermal printing head, and reading a first blocking latch voltage in the blocking latch state;
if the first blocking latch voltage is not equal to the blocking reference voltage of the heating element in the full blocking state, reading a first conduction latch voltage in the conduction latch state;
reading a second blocking latch voltage in the blocking latch state if the first conducting latch voltage is not equal to the blocking reference voltage;
and if the second blocking latch voltage is equal to the blocking reference voltage, executing the heating element resistance value testing step.
2. The electrical characteristic test method according to claim 1, characterized in that:
the step of reading the power supply detection voltage comprises: reading the power supply detection voltage once every preset time;
the step of judging whether the power supply detection voltage is stable is as follows: and when the variation range of the power supply detection voltage which is read continuously for three times is judged to be less than +/-2%, the power supply detection voltage is considered to be stable.
3. The electrical characteristic test method according to claim 1 or 2, characterized in that:
the electrical testing device for the electrical characteristic testing method comprises a processing unit and a driving circuit, wherein the driving circuit comprises a switch circuit and a detection circuit, the processing unit is connected with the switch circuit, and the processing unit controls the on-off of the detection circuit through the switch circuit;
the detection circuit comprises a first resistor, a second resistor and a third resistor which are sequentially connected in series, wherein a first end of the first resistor is connected with a power supply end, the power supply end of the heating element is connected with a second end of the first resistor and a first end of the second resistor, a detection end of the processing unit is connected with a second end of the second resistor and a first end of the third resistor, and a second end of the third resistor is grounded;
the conduction energy selection voltage, the blocking energy selection voltage, the conduction latch voltage and the blocking latch voltage are obtained from the detection end of the processing unit.
4. The electrical characteristic test method according to claim 3, characterized in that:
the reference voltage of the heating element can be obtained from the detection end of the processing unit, and the resistance value of the heating element meets the following formula:
DOTn＝Vin*[(R2+R3)*R1]/[(R2+R3)+R1]/(Vb-Vin)；
wherein, DOTn is the resistance value of the heating element, vin is the reference voltage of the heating element, vb is the blocking reference voltage of the heating element in the full blocking state, R1 is the first resistor, R2 is the second resistor, and R3 is the third resistor.
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| JPS63227356A (en) * | 1987-03-17 | 1988-09-21 | Mitsubishi Electric Corp | Thermal head driving circuit |
| JPH01115652A (en) * | 1987-10-30 | 1989-05-08 | Mitsubishi Electric Corp | Thermal printer device |
| JPH08174889A (en) * | 1994-12-26 | 1996-07-09 | Shinko Seisakusho Co Ltd | Thermal printing mechanism |
| JP2000326535A (en) * | 1999-05-21 | 2000-11-28 | Nec Yonezawa Ltd | Diagnosis circuit and diagnosis method for thermal head break and thermal printer |
| JP2008230123A (en) * | 2007-03-22 | 2008-10-02 | Sato Corp | Printer |
| JP2008279684A (en) * | 2007-05-11 | 2008-11-20 | Shinko Electric Co Ltd | Printer, control method of printer, and control program of printer |
| CN103192609A (en) * | 2012-01-10 | 2013-07-10 | 山东新北洋信息技术股份有限公司 | Thermal printer and control method of thermal printer |
| CN109278420A (en) * | 2017-07-20 | 2019-01-29 | 精工爱普生株式会社 | Printing equipment and thermal head |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103722907B (en) * | 2012-10-15 | 2016-08-03 | 山东新北洋信息技术股份有限公司 | Printer and control method thereof and device |
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2020
- 2020-06-10 CN CN202010526770.5A patent/CN111693808B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63227356A (en) * | 1987-03-17 | 1988-09-21 | Mitsubishi Electric Corp | Thermal head driving circuit |
| JPH01115652A (en) * | 1987-10-30 | 1989-05-08 | Mitsubishi Electric Corp | Thermal printer device |
| JPH08174889A (en) * | 1994-12-26 | 1996-07-09 | Shinko Seisakusho Co Ltd | Thermal printing mechanism |
| JP2000326535A (en) * | 1999-05-21 | 2000-11-28 | Nec Yonezawa Ltd | Diagnosis circuit and diagnosis method for thermal head break and thermal printer |
| JP2008230123A (en) * | 2007-03-22 | 2008-10-02 | Sato Corp | Printer |
| JP2008279684A (en) * | 2007-05-11 | 2008-11-20 | Shinko Electric Co Ltd | Printer, control method of printer, and control program of printer |
| CN103192609A (en) * | 2012-01-10 | 2013-07-10 | 山东新北洋信息技术股份有限公司 | Thermal printer and control method of thermal printer |
| CN109278420A (en) * | 2017-07-20 | 2019-01-29 | 精工爱普生株式会社 | Printing equipment and thermal head |
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