CN111652491B - Sampling inspection method for display panel, pipeline control device and storage medium - Google Patents
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Abstract
The invention provides a sampling inspection method of a display panel, which marks the display panels of different display panel mother boards, so that during sampling inspection, single display panels at different positions can be subjected to sampling inspection within a specified period, the interception range is wide, film products at different positions of the display panel mother boards can be accurately intercepted for sampling inspection, the interception time is shortened, and the interception timeliness is strong. The size of the display panel mother board can adapt to different scenes, the number of times of spot check can be changed correspondingly. According to the invention, from the process, under the condition of not affecting productivity, the interception timeliness is improved, and surface scratches, greasy dirt, foreign matters and other quality anomalies are quickly intercepted.
Description
Technical Field
The present invention relates to the field of display panel detection, and in particular, to a sampling inspection method, a pipeline control device, and a storage medium for a display panel.
Background
After a complete large-plate Glass (Glass) in the thin film transistor liquid crystal display (TFT-LCD) industry is cut into panels (panels) with standard sizes, personnel are required to carry out appearance inspection on the small panels, so that defects such as scratch, greasy dirt, foreign matters and the like on the surface of the Glass which cannot be detected in an automatic picture detection manner of a production line control system are timely intercepted, and abnormal quality diffusion is avoided. Due to productivity and yield requirements, spot inspection is performed at the inspection station during normal production.
The original sampling inspection technology is to set a sampling inspection period, and 1 glass sheet enters a human inspection station for sampling inspection after each sampling inspection period. However, under the spot inspection technology, the glass film product detected by each spot inspection is uncertain, and the risk of abnormal leakage detection and release exists; in addition, the set fixed membrane products are subjected to selective inspection, but the capacity flexibility is poor and the full membrane products have poor detection capability; in addition, people detection is carried out on each panel, but the productivity is indeed serious, and normal running is not applicable; in addition, the method also comprises the steps of setting the number of the slice inspection and automatically jumping the sampling inspection period after the set number is pumped.
Therefore, it is necessary to provide a new sampling inspection method, pipeline control device and storage medium for display panel, which can increase the interception range, reduce the sampling inspection time and further improve the efficiency.
Disclosure of Invention
The invention aims to provide a novel sampling inspection method, a pipeline control device and a storage medium of a display panel, which can increase the interception range, reduce the sampling inspection time and further improve the efficiency.
The invention provides a sampling inspection method of a display panel, which comprises the following steps: a database establishing step, namely inputting data of a plurality of display panels on a pipeline into a database, wherein the data of the display panels comprise serial numbers and product information, the serial numbers are (XIj), X is a display panel, i represents that the display panel is formed by cutting an ith display panel motherboard, j represents that the display panel is a jth display panel formed by cutting a corresponding display panel motherboard, 1< j < n, n is the number of the display panels formed by cutting a display panel motherboard; a first sampling inspection step, namely collecting data of a first display panel in the database and sending the data to a pipeline control system to intercept the first display panel for sampling inspection; a second sampling inspection step, continuously collecting data of a second display panel in the database, and sending the data to the pipeline control system to intercept the second display panel for sampling inspection, wherein the second display panel and the first display panel are at different positions from different display panel mother boards; and a cyclic sampling inspection step, namely, cycling the second sampling inspection step, wherein the display panel subjected to sampling inspection is not subjected to sampling inspection any more, and the number of times of cycling is n-2 times.
Further, the database creation step includes, before: a preparation step, marking the serial number (Xij) of the display panel on the production line.
Further, the method further comprises the following steps: the method comprises the steps of obtaining sampling inspection data of a display panel which is subjected to sampling inspection; and a sending step of sending the spot check data to a server.
Further, in the first sampling inspection step, the second sampling inspection step and the cyclic sampling inspection step, if the sampling inspection data of the display panel is abnormal, sampling inspection is performed on other display panels of the mother board of the corresponding display panel of the abnormal display panel.
Further, after the step of performing the spot check on the other display panels of the corresponding display panel motherboard of the abnormal display panel, if the obtained spot check data is still abnormal, when the non-single display panel is abnormal, checking the pipeline control system and relieving the abnormality, and performing all the spot check on the single display panel of the display panel motherboard; when the single display panel is abnormal, the partial single display panel of the display panel motherboard is subjected to spot check.
Further, when the size of the display panel is 21.5 inches, n is 16; and/or, when the size of the display panel is 27 inches, n is 24; and/or when the size of the display panel is 32 inches, n is 16; and/or when the size of the display panel is 43 inches, n is 12; and/or when the size of the display panel is 43 inches, n is 6; and/or.
The invention also provides a pipeline control device, which comprises a sampling inspection system, wherein the sampling inspection system comprises: the database establishing unit is used for inputting data of a plurality of display panels on a pipeline into a database, wherein the data of the display panels comprise serial numbers and product information, the serial numbers are Xij, X is a display panel, i represents that the display panel is formed by cutting an ith display panel motherboard, j represents that the display panel is a jth display panel formed by cutting a corresponding display panel motherboard, 1< j < n, n is the number of the display panels formed by cutting a display panel motherboard; the first sampling inspection unit is used for collecting data of a first display panel in the database and sending the data to the pipeline control system to intercept the first display panel for sampling inspection; the second sampling inspection unit is used for continuously collecting data of a second display panel in the database and sending the data to the pipeline control system so as to intercept the second display panel for sampling inspection, and the second display panel and the first display panel are at different positions from different display panel mother boards; and the circulation sampling inspection unit circulates the second sampling inspection step, wherein the display panel after sampling inspection is not subjected to sampling inspection any more, and the circulation times are n-2 times.
Further, the method further comprises the following steps: the assembly line control system is used for acquiring the spot check information and further intercepting a display panel of the spot check; the communication module is used for transmitting the sampling inspection information of the sampling inspection system to the pipeline control system and transmitting the sampling inspection data to the sampling inspection system.
Further, the spot check system further includes: the acquisition unit acquires sampling inspection data of the display panel which is subjected to sampling inspection; and the sending unit is used for sending the sampling inspection data to the server.
The invention also provides a storage medium having stored thereon a computer program which, when executed by a processor, performs the method as described above.
The beneficial effects of the invention are as follows: according to the spot inspection method, the assembly line control device and the storage medium of the display panel, the display panels of the different display panel motherboards are marked, so that during spot inspection, spot inspection can be performed on single display panels of different positions of different motherboards in a specified period, the interception range is wide, spot inspection can be performed on film products of different positions of the display panel motherboards accurately intercepted, the interception time is shortened, and the interception timeliness is strong. The size of the display panel mother board can adapt to different scenes, the number of times of spot check can be changed correspondingly.
Drawings
The invention is further described below with reference to the drawings and examples.
Fig. 1 is a flowchart of a sampling inspection method of a display panel provided by the invention.
Fig. 2 is a schematic structural diagram of a motherboard of a display panel according to an embodiment of the invention.
Fig. 3 is a functional block diagram of the pipeline control device provided by the invention.
Fig. 4 is a functional block diagram of the sampling inspection system provided by the present invention.
Detailed Description
The following description of the embodiments refers to the accompanying drawings, which illustrate specific embodiments in which the invention may be practiced. The directional terms, such as up, down, front, back, left, right, inner, outer, side, etc., are merely referring to the directions of the drawings. The names of the elements, such as first, second, etc., mentioned in the present invention are merely distinguishing different elements, and may be better expressed. In the drawings, like structural elements are denoted by like reference numerals.
Embodiments of the present invention will be described in detail herein with reference to the accompanying drawings. This invention may take many different forms and should not be construed as limited to the particular embodiments set forth herein. These embodiments are provided so that this disclosure will be thorough and complete, and will fully enable others skilled in the art to understand the various embodiments of the invention and with various modifications as are suited to the particular use contemplated.
In the description of the present invention, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
As shown in fig. 1, the present invention provides a sampling inspection method for a display panel executed by a computer, which includes the following steps.
Step S1) preparing step, marking serial number (XIj) of display panel on the assembly line, X is display panel, i is that i display panel has i display panel mother board cut, j is that j display panel that the corresponding display panel mother board cut forms, 1< j < n, n is the number of display panel mother board cut forms display panel.
As shown in fig. 2, the display panel motherboard 11 has 6 display panels 12 as an example, and is marked from left to right and then moved to the next row for continuing marking.
Step S2), a database is established, and a plurality of display panel data on a production line are input into the database, wherein the display panel data comprise serial numbers and product information, and the serial numbers of the display panels are Xij.
Step S3) a first sampling inspection step, namely collecting data of a first display panel in the database, and sending the data to the pipeline control system to intercept the display panel and perform sampling inspection.
Step S4) a second sampling inspection step, wherein data of a second display panel in the database are continuously collected and sent to the pipeline control system, the display panel is intercepted and sampling inspection is carried out, the second display panel and the first display panel are at different positions from different display panel mother boards, specifically, the serial numbers i and j are different, wherein j is the cutting serial number of the mother boards in FIG. 2.
Step S5), a cyclic sampling inspection step, and a second sampling inspection step, wherein j in the serial numbers of the display panels subjected to sampling inspection are the same, sampling inspection is not performed any more, and the number of times of the cyclic sampling inspection is n-2 times.
Step S6), acquiring the sampling inspection data of the display panel which is sampled and inspected.
Step S7), a step of sending the sampling inspection data to a server for storing the data.
And in the first sampling inspection step, the second sampling inspection step and the cyclic sampling inspection step, if the sampling inspection data of the display panel is abnormal, sampling inspection is carried out on other display panels of the mother board of the corresponding display panel of the abnormal display panel.
After the step of performing the spot check on the other display panels of the corresponding display panel mother board of the abnormal display panel, if the obtained spot check data is abnormal, that is, when the non-single display panel is abnormal, checking the pipeline control system and relieving the abnormality, and performing all the spot check on the single display panel of the display panel mother board; when the single display panel is abnormal, the partial single display panel of the display panel motherboard is subjected to spot check.
When the size of the display panel is 21.5 inches, n is 16, the sampling inspection sequence is 05-06-07-08-13-14-15-16-05, the sampling inspection can be sequential or non-cyclic sampling inspection, the priority is sequential sampling inspection, quality omission is avoided, the process capability of a person standing is improved, and the omission risk is reduced.
When the size of the display panel is 27 inches, n is 24; sampling sequence 01-02-03-04-06- … … 20-21-22-23-24-01.
When the size of the display panel is 32 inches, n is 16; sampling test sequence 01-02-03-04-06- … … 14-15-16-01.
When the size of the display panel is 43 inches, n is 12; sampling sequence 01-02-03-04-09-10-11-12-01.
When the size of the display panel is 43 inches, n is 6. Sampling test sequence 01-02-03-04-06-01.
The invention provides a sampling inspection method of display panels, which marks the display panels of different display panel mother boards, and further can perform sampling inspection on single display panels at different positions of different mother boards in a specified period during sampling inspection, and further can perform sampling inspection on all panels of the mother boards of the display panels with problems, has wide interception range, can accurately intercept film products at different positions of the display panel mother boards for sampling inspection, shortens interception time, and has strong interception timeliness. The size of the display panel mother board can adapt to different scenes, the number of times of spot check can be changed correspondingly.
According to the invention, from the process surface, under the condition of not affecting the productivity, the interception timeliness is improved, and the surface scratch, greasy dirt, foreign matters and other quality anomalies are quickly intercepted.
And in terms of the product surface, the abnormal interception capability of the whole film product is improved, and the leakage condition caused by the abnormality of the single film product can be effectively avoided in time.
As shown in fig. 3, the present invention further provides a pipeline control device 100, which includes a sampling inspection system 101, a pipeline control system 103, and a communication module 102.
As shown in fig. 4, the spot check system includes: a database creation unit 1011, a first sampling unit 1012, a second sampling unit 1013, a loop sampling unit 1014, an acquisition unit 1015, and a transmission unit 1016.
The database creation unit 1011 is configured to enter a plurality of display panel data on a pipeline into a database, where the display panel data includes serial numbers and product information; the display panel serial number is Xij, X is a display panel, i indicates that the display panel is formed by cutting an ith display panel motherboard, j indicates that the display panel is a jth display panel formed by cutting a corresponding display panel motherboard, and 1< j < n, n is the number of display panels formed by cutting a display panel motherboard.
The first sampling unit 1012 is used for collecting data of a first display panel in the database and sending the data to the pipeline control system to intercept the display panel and perform sampling inspection.
The second sampling inspection unit 1013 is configured to continuously collect a second display panel data in the database and send the second display panel data to the pipeline control system, intercept the display panel and perform sampling inspection, where the second display panel and the first display panel are different positions from different display panel mother boards.
The cyclic sampling unit 1014 is configured to cycle the second sampling step, where j with the same serial number in the display panel after sampling is no longer sampling, and the number of cycles is n-2 times.
The acquiring unit 1015 is configured to acquire sampling inspection data of the display panel that has been sampled.
The transmitting unit 1016 transmits the spot check data to a server.
The communication module 102 is configured to transmit the sampling information of the sampling system 101 to the pipeline control system 103. The pipeline control system 103 is configured to receive the spot check information and send spot check data to the spot check system 101.
The invention also provides a storage medium, wherein the storage medium is stored with a computer program, and the sampling inspection method of the display panel can be realized when the processor executes the computer program.
It should be noted that numerous variations and modifications are possible in light of the fully described invention, and are not limited to the specific examples of implementation described above. The above-described embodiments are merely illustrative of the present invention and are not intended to be limiting. In general, the scope of the present invention should include those variations or alternatives and modifications apparent to those skilled in the art.
Claims (10)
1. A spot check method for a display panel, comprising:
a database establishing step, namely inputting data of a plurality of display panels on a pipeline into a database, wherein the data of the display panels comprise serial numbers and product information, the serial numbers are (XIj), X is a display panel, i represents that the display panel is formed by cutting an ith display panel motherboard, j represents that the display panel is a jth display panel formed by cutting a corresponding display panel motherboard, 1< j < n, n is the number of the display panels formed by cutting a display panel motherboard;
a first sampling inspection step, namely collecting data of a first display panel in the database, wherein the data of the first display panel comprises the serial number and product information, and sending the serial number and the product information to a pipeline control system to intercept the first display panel for sampling inspection;
a second sampling inspection step, continuously collecting data of a second display panel in the database, wherein the data of the second display panel comprises the serial number and product information, and the serial number and the product information are sent to the pipeline control system to intercept the second display panel for sampling inspection, and the second display panel and the first display panel are at different positions from different display panel mother boards;
and a cyclic sampling inspection step, namely, cycling the second sampling inspection step, wherein the display panel subjected to sampling inspection is not subjected to sampling inspection any more, and the number of times of cycling is n-2 times.
2. The spot check method of a display panel according to claim 1, wherein,
the database establishment step is preceded by:
a preparation step, marking the serial number (Xij) of the display panel on the production line.
3. The spot check method of a display panel according to claim 1, further comprising: the method comprises the steps of obtaining sampling inspection data of a display panel which is subjected to sampling inspection;
and a sending step of sending the spot check data to a server.
4. The spot check method of a display panel according to claim 3, wherein,
and in the first sampling inspection step, the second sampling inspection step and the cyclic sampling inspection step, if the sampling inspection data of the display panel is abnormal, sampling inspection is carried out on other display panels of the mother board of the corresponding display panel of the abnormal display panel.
5. The spot check method of a display panel according to claim 4, wherein,
after the step of performing the spot check on the other display panels of the corresponding display panel mother board of the abnormal display panel, if the obtained spot check data is abnormal, checking the assembly line control system, removing the abnormality, and performing spot check on all the display panels of the display panel mother board again; in the spot check again, when a single display panel is abnormal, other display panels of the display panel motherboard are spot checked.
6. The spot check method of a display panel according to claim 1, wherein,
when the size of the display panel is 21.5 inches, n is 16; and/or the number of the groups of groups,
when the size of the display panel is 27 inches, n is 24; and/or the number of the groups of groups,
when the size of the display panel is 32 inches, n is 16; and/or the number of the groups of groups,
when the size of the display panel is 43 inches, n is 12; or alternatively, the first and second heat exchangers may be,
when the size of the display panel is 43 inches, n is 6.
7. A pipeline control apparatus comprising a spot check system, said spot check system comprising:
the database building unit is used for inputting a plurality of display panel data on a production line into the database, wherein the display panel data comprises serial numbers Xij and product information, X is a display panel, i represents that the display panel is formed by cutting an ith display panel motherboard, j represents that the display panel is a jth display panel formed by cutting a corresponding display panel motherboard, 1< j < n, n is the number of display panels formed by cutting a display panel motherboard;
the first sampling inspection unit is used for collecting data of a first display panel in the database, wherein the data of the first display panel comprises the serial numbers and product information and is sent to the pipeline control system to intercept the first display panel for sampling inspection;
the second sampling inspection unit is used for continuously collecting data of a second display panel in the database, wherein the data of the second display panel comprises the serial numbers and product information and is sent to the pipeline control system to intercept the second display panel for sampling inspection, and the second display panel and the first display panel are at different positions from different display panel mother boards;
and the circulation sampling inspection unit circulates the steps executed by the second sampling inspection unit, wherein the display panel after sampling inspection is not subjected to sampling inspection any more, and the circulation time is n-2 times.
8. The pipeline control apparatus according to claim 7, characterized by further comprising:
the assembly line control system is used for acquiring the spot check information and further intercepting a display panel of the spot check; the communication module is used for transmitting the sampling inspection information of the sampling inspection system to the pipeline control system and transmitting the sampling inspection data to the sampling inspection system.
9. The pipeline control apparatus of claim 7, wherein the spot check system further comprises:
the acquisition unit acquires sampling inspection data of the display panel which is subjected to sampling inspection;
and the sending unit is used for sending the sampling inspection data to the server.
10. A storage medium having stored thereon a computer program which, when executed by a processor, performs the method of any of claims 1 to 6.
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| JP2011138930A (en) * | 2009-12-28 | 2011-07-14 | Wit Co Ltd | Method and apparatus for inspecting and managing electronic substrate, and visual inspection apparatus |
| CN105225028A (en) * | 2015-08-27 | 2016-01-06 | 南京熊猫电子股份有限公司 | A kind of liquid crystal glass base production information method for tracing based on virtual ID |
| CN105445977A (en) * | 2016-01-21 | 2016-03-30 | 武汉华星光电技术有限公司 | Method for detecting yield of liquid crystal display panels |
| CN107015532B (en) * | 2017-02-23 | 2018-03-09 | 惠科股份有限公司 | Display panel online quality detection method and device |
| CN111045900A (en) * | 2019-11-22 | 2020-04-21 | 深圳市华星光电半导体显示技术有限公司 | Exception handling method for panel production and storage medium |
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