CN111652491A - Sampling inspection method for display panel, pipeline control device and storage medium - Google Patents
Sampling inspection method for display panel, pipeline control device and storage medium Download PDFInfo
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- CN111652491A CN111652491A CN202010467105.3A CN202010467105A CN111652491A CN 111652491 A CN111652491 A CN 111652491A CN 202010467105 A CN202010467105 A CN 202010467105A CN 111652491 A CN111652491 A CN 111652491A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
- G06Q10/063—Operations research, analysis or management
- G06Q10/0639—Performance analysis of employees; Performance analysis of enterprise or organisation operations
- G06Q10/06395—Quality analysis or management
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/133351—Manufacturing of individual cells out of a plurality of cells, e.g. by dicing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
- G06F16/90—Details of database functions independent of the retrieved data types
- G06F16/901—Indexing; Data structures therefor; Storage structures
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q50/00—Systems or methods specially adapted for specific business sectors, e.g. utilities or tourism
- G06Q50/04—Manufacturing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Abstract
The invention provides a selective inspection method of a display panel, which can perform selective inspection on single display panels at different positions in a specified period by marking the display panels of different display panel motherboards, has wide interception range, can accurately intercept film products at different positions of the display panel motherboards for selective inspection, shortens interception time and has strong interception timeliness. The size of the display panel mother board can adapt to different scenes, and the number of times of selective examination and the label number can be correspondingly changed. According to the invention, in terms of the manufacturing process, the interception timeliness is improved under the condition of not influencing the productivity, and the quality abnormity such as surface scratch, oil stain, foreign matters and the like is intercepted quickly.
Description
Technical Field
The present invention relates to the field of display panel detection, and in particular, to a method for performing a spot check on a display panel, a pipeline control device, and a storage medium.
Background
After complete large-plate Glass (Glass) in the thin film transistor liquid crystal display (TFT-LCD) industry is cut into panels (Panel) with various standard sizes, personnel are required to perform appearance inspection on the small Panel, and the purpose is to timely intercept the defects of scratches, oil stains, foreign matters and the like on the surface of the Glass which cannot be detected in automatic picture detection of a control system of an assembly line, and avoid abnormal diffusion of quality. Due to the requirements of capacity and yield, the manual inspection station performs spot inspection during normal production.
The original spot check technology is that 1 piece of glass enters a spot check station for spot check every time a spot check period is set. However, under the sampling inspection technology, the glass film products sampled and inspected each time are uncertain, and the risk of abnormal leakage detection and leakage inspection exists; in addition, the set fixed film products are subjected to spot inspection, but the productivity flexibility is poor, and the detection capability of the whole film products is poor; in addition, people check each panel, but the productivity is really serious, and normal goods running is not applicable; in addition, there is also a method for setting the number of pieces to be inspected and automatically skipping the period of the inspection after the set number is inspected.
Therefore, there is a need for a new sampling method, a new pipeline control device and a new storage medium for a display panel, which can increase the interception range, reduce the sampling time and further improve the efficiency.
Disclosure of Invention
The invention aims to provide a novel display panel spot check method, a production line control device and a storage medium, which can increase the interception range, reduce the spot check time and further improve the efficiency.
The invention provides a spot inspection method of a display panel, which comprises the following steps: a database establishing step, namely inputting data of a plurality of display panels on a pipeline into a database, wherein the data of the display panels comprise serial numbers and product information, the serial numbers are (Xij), X is a display panel, i represents that the display panel is formed by cutting an ith display panel mother board, j represents that the display panel is a jth display panel formed by cutting a corresponding display panel mother board, 1< j < n, and n is the number of the display panels formed by cutting one display panel mother board; a first sampling inspection step, wherein data of a first display panel in the database is collected and sent to a production line control system to intercept the first display panel for sampling inspection; a second sampling step, continuously collecting data of a second display panel in the database, and sending the data to the pipeline control system to intercept the second display panel for sampling inspection, wherein the second display panel and the first display panel are from different positions of different display panel motherboards; and a step of circulating the second sampling step, wherein the sampled display panel is not sampled any more, and the circulating times are n-2 times.
Further, the database establishing step comprises, before: a preparation step of marking the serial number (Xij) of the display panel on the pipeline.
Further, still include: an acquisition step of acquiring the selective inspection data of the display panel which has been subjected to the selective inspection; and a sending step, sending the sampling inspection data to a server.
Further, in the first sampling step, the second sampling step, and the cyclic sampling step, if the sampling data of the display panel is abnormal, the sampling is performed on the other display panels of the display panel mother board corresponding to the abnormal display panel.
Further, after the step of performing a spot check on other display panels of the display panel motherboard corresponding to the abnormal display panel, if the obtained spot check data is abnormal, when a non-single display panel is abnormal, the pipeline control system is checked and the abnormality is removed, and all the single display panels of the display panel motherboard are spot checked; and when the single display panel is abnormal, performing spot inspection on partial single display panel of the display panel motherboard.
Further, when the size of the display panel is 21.5 inches, n is 16; and/or, when the size of the display panel is 27 inches, n is 24; and/or, when the size of the display panel is 32 inches, n is 16; and/or, when the size of the display panel is 43 inches, n is 12; and/or, when the size of the display panel is 43 inches, n is 6; and/or.
The invention also provides a pipeline control device, comprising a sampling system, wherein the sampling system comprises: the system comprises a database establishing unit, a data processing unit and a data processing unit, wherein the database establishing unit is used for inputting data of a plurality of display panels on a pipeline into a database, the data of the display panels comprise serial numbers and product information, the serial numbers are Xij, X is a display panel, i represents that the display panel is formed by cutting an ith display panel mother board, j represents that the display panel is a jth display panel formed by cutting a corresponding display panel mother board, 1< j < n, and n is the number of the display panels formed by cutting one display panel mother board; the first sampling inspection unit is used for acquiring data of a first display panel in the database and sending the data to the production line control system to intercept the first display panel for sampling inspection; the second sampling unit is used for continuously acquiring data of a second display panel in the database and sending the data to the pipeline control system to intercept the second display panel for sampling inspection, and the second display panel and the first display panel are from different positions of different display panel mother boards; and the circulation sampling inspection unit circulates the second sampling inspection step, wherein the sampled display panel is not sampled any more, and the circulation frequency is n-2 times.
Further, still include: the assembly line control system is used for acquiring the selective inspection information and further intercepting the display panel required for selective inspection; and the communication module is used for transmitting the sampling inspection information of the sampling inspection system to the assembly line control system and transmitting the sampling inspection data to the sampling inspection system.
Further, the spot check system further comprises: an acquisition unit that acquires sampling data of a sampled display panel; and the sending unit is used for sending the sampling inspection data to the server.
The present invention also provides a storage medium having a computer program stored thereon, which when executed by a processor is operable to implement the method as described above.
The invention has the beneficial effects that: according to the spot inspection method, the production line control device and the storage medium for the display panel, the display panels of the motherboards of the different display panels are marked, so that during spot inspection, single display panels at different positions of the different motherboards can be spot inspected in a specified period, the interception range is wide, membrane products at different positions of the motherboards of the display panels can be accurately intercepted for spot inspection, the interception time is shortened, and the interception timeliness is high. The size of the display panel mother board can adapt to different scenes, and the number of times of selective examination and the label number can be correspondingly changed.
Drawings
The invention is further described below with reference to the figures and examples.
Fig. 1 is a flowchart of a sampling inspection method for a display panel according to the present invention.
Fig. 2 is a schematic structural diagram of a display panel motherboard according to an embodiment of the present invention.
Fig. 3 is a functional block diagram of a pipeline control apparatus according to the present invention.
Fig. 4 is a functional block diagram of a spot check system according to the present invention.
Detailed Description
The following description of the embodiments refers to the accompanying drawings for illustrating the specific embodiments in which the invention may be practiced. Directional phrases used herein, such as, for example, upper, lower, front, rear, left, right, inner, outer, lateral, etc., refer only to the orientation of the accompanying drawings. The names of the elements, such as the first, the second, etc., mentioned in the present invention are only used for distinguishing different elements and can be better expressed. In the drawings, elements having similar structures are denoted by the same reference numerals.
Embodiments of the present invention will be described in detail herein with reference to the accompanying drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. These embodiments are provided to explain the practical application of the invention and to enable others skilled in the art to understand the invention for various embodiments and with various modifications as are suited to the particular use contemplated.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
As shown in fig. 1, the present invention provides a computer-implemented method for sampling display panels, comprising the following steps.
Step S1), a preparation step, marking the serial number (Xij) of the display panel on the production line, wherein X is the display panel, i indicates that the display panel is formed by cutting the ith display panel mother board, j indicates that the display panel is the jth display panel formed by cutting the corresponding display panel mother board, 1< j < n, and n is the number of the display panels formed by cutting one display panel mother board.
As shown in fig. 2, the display panel mother board 11 has 6 display panels 12 as an example, and the display panels are numbered from left to right and then moved to the next row to continue the numbering.
Step S2), a database establishing step, wherein a plurality of display panel data on a production line are recorded into the database, the display panel data comprise serial numbers and product information, and the serial number of the display panel is Xij.
Step S3), a first sampling inspection step, which is to collect data of a first display panel in the database and send the data to the pipeline control system to intercept the display panel and carry out sampling inspection.
Step S4), a second sampling step, to continue to collect data of a second display panel in the database and send the data to the pipeline control system, intercept the display panel, and perform sampling inspection, where the second display panel and the first display panel are from different positions of different display panel motherboards, specifically, serial numbers i and j are different, where j is the cutting serial number of the motherboard in fig. 2.
Step S5), a circulation sampling inspection step, circulating the second sampling inspection step, wherein j in the sampled display panel serial numbers are the same and will not be sampled again, and the circulation times are n-2 times.
Step S6), obtaining the sampling data of the sampled display panel.
Step S7), sending the spot check data to a server for storing data.
In the first sampling step, the second sampling step and the cyclic sampling step, if the sampling data of the display panel is abnormal, sampling inspection is performed on other display panels of the abnormal display panel corresponding to the display panel mother board.
After the step of performing the spot check on other display panels of the display panel mother board corresponding to the abnormal display panel, if the obtained spot check data is abnormal, that is, when a non-single display panel is abnormal, the assembly line control system is checked and the abnormality is removed, and all the single display panels of the display panel mother board are spot checked; and when the single display panel is abnormal, performing spot inspection on partial single display panel of the display panel motherboard.
When the size of the display panel is 21.5 inches, and n is 16, the spot check is sequential 05 → 06 → 07 → 08 → 13 → 14 → 15 → 16 → 05, the spot check can be performed sequentially or non-cyclically, and the sequential spot check is preferred, so that quality leakage is avoided, the processing capacity of a workshop is improved, and the leakage risk is reduced.
When the size of the display panel is 27 inches, n is 24; the spot check sequence 01 → 02 → 03 → 04 → 06 → … … 20 → 21 → 22 → 23 → 24 → 01.
When the size of the display panel is 32 inches, n is 16; the spot check sequence 01 → 02 → 03 → 04 → 06 → … … 14 → 15 → 16 → 01.
When the size of the display panel is 43 inches, n is 12; the spot check is sequential 01 → 02 → 03 → 04 → 09 → 10 → 11 → 12 → 01.
When the size of the display panel is 43 inches, n is 6. The spot check is sequential 01 → 02 → 03 → 04 → 06 → 06 → 01.
The invention provides a selective inspection method of a display panel, which can perform selective inspection on single display panels at different positions of different mother boards in a specified period by marking the display panels of different mother boards of the display panel, further perform selective inspection on all the panels of the mother board of the display panel with problems, has wide interception range, can accurately intercept film products at different positions of the mother board of the display panel for selective inspection, shortens the interception time and has strong interception timeliness. The size of the display panel mother board can adapt to different scenes, and the times and the labels of the spot check can be changed correspondingly.
In terms of the manufacturing process, the invention improves the interception timeliness and quickly intercepts the quality abnormity of surface scratch, oil stain, foreign matters and the like under the condition of not influencing the productivity.
From the product face, promote whole membrane article unusual interception ability, can effectively avoid in time that single membrane article unusually leads to leak puts the condition.
As shown in fig. 3, the present invention further provides a pipeline control apparatus 100, which includes a sampling system 101, a pipeline control system 103, and a communication module 102.
As shown in fig. 4, the spot check system includes: a database creation unit 1011, a first sampling unit 1012, a second sampling unit 1013, a cycle sampling unit 1014, an acquisition unit 1015, and a transmission unit 1016.
The database establishing unit 1011 is configured to enter data of a plurality of display panels on a production line into a database, where the data of the display panels includes serial numbers and product information; the serial number of the display panel is Xij, X is the display panel, i indicates that the display panel is formed by cutting an ith display panel mother board, j indicates that the display panel is a jth display panel formed by cutting a corresponding display panel mother board, and 1< j < n, wherein n is the number of the display panels formed by cutting one display panel mother board.
The first sampling unit 1012 is used to collect data of a first display panel in the database, and send the data to the pipeline control system to intercept the display panel and perform sampling inspection.
The second sampling unit 1013 is configured to continuously acquire data of a second display panel in the database, send the data to the pipeline control system, intercept the display panel, and perform sampling inspection, where the second display panel and the first display panel are from different positions of different display panel motherboards.
The cycle random inspection unit 1014 is configured to cycle the second random inspection step, wherein the same j in the sequence numbers of the randomly inspected display panels will not be sampled again, and the cycle time is n-2 times.
The obtaining unit 1015 is used to obtain the sampling data of the display panel that has been sampled.
The sending unit 1016 sends the spot check data to the server.
The communication module 102 is used for transmitting the sampling information of the sampling system 101 to the pipeline control system 103. The pipeline control system 103 is configured to receive the spot check information and send spot check data to the spot check system 101.
The invention also provides a storage medium, wherein the storage medium is stored with a computer program, and the computer program can realize the sampling inspection method of the display panel when a processor executes the computer program.
It should be noted that many variations and modifications of the embodiments of the present invention fully described are possible and are not to be considered as limited to the specific examples of the above embodiments. The above examples are intended to be illustrative of the invention and are not intended to be limiting. In conclusion, the scope of the present invention should include those changes or substitutions and modifications which are obvious to those of ordinary skill in the art.
Claims (10)
1. A spot check method of a display panel is characterized by comprising the following steps:
a database establishing step, namely inputting data of a plurality of display panels on a pipeline into a database, wherein the data of the display panels comprise serial numbers and product information, the serial numbers are (Xij), X is a display panel, i represents that the display panel is formed by cutting an ith display panel mother board, j represents that the display panel is a jth display panel formed by cutting a corresponding display panel mother board, 1< j < n, and n is the number of the display panels formed by cutting one display panel mother board;
a first sampling inspection step, wherein data of a first display panel in the database is collected and sent to a production line control system to intercept the first display panel for sampling inspection;
a second sampling step, continuously collecting data of a second display panel in the database, and sending the data to the pipeline control system to intercept the second display panel for sampling inspection, wherein the second display panel and the first display panel are from different positions of different display panel motherboards;
and a step of circulating the second sampling step, wherein the sampled display panel is not sampled any more, and the circulating times are n-2 times.
2. The spot inspection method of a display panel according to claim 1,
the database establishing step comprises the following steps:
a preparation step of marking the serial number (Xij) of the display panel on the pipeline.
3. The method for spot inspection of a display panel according to claim 1, further comprising: an acquisition step of acquiring the selective inspection data of the display panel which has been subjected to the selective inspection;
and a sending step, sending the sampling inspection data to a server.
4. The spot inspection method of a display panel according to claim 3,
in the first sampling step, the second sampling step and the cyclic sampling step, if the sampling data of the display panel is abnormal, sampling inspection is performed on other display panels of the abnormal display panel corresponding to the display panel mother board.
5. The spot inspection method of a display panel according to claim 4,
after the step of performing selective inspection on other display panels of the display panel mother board corresponding to the abnormal display panel, if the obtained selective inspection data is abnormal, the assembly line control system is checked and the abnormality is removed, and all the display panels of the display panel mother board are subjected to selective inspection again; in the second sampling inspection, when a single display panel is abnormal, other display panels of the display panel mother board are sampled and inspected.
6. The spot inspection method of a display panel according to claim 1,
when the size of the display panel is 21.5 inches, n is 16; and/or the presence of a gas in the gas,
when the size of the display panel is 27 inches, n is 24; and/or the presence of a gas in the gas,
when the size of the display panel is 32 inches, n is 16; and/or the presence of a gas in the gas,
when the size of the display panel is 43 inches, n is 12; and/or the presence of a gas in the gas,
when the size of the display panel is 43 inches, n is 6; and/or.
7. A pipeline control apparatus comprising a spot check system, the spot check system comprising:
the system comprises a database establishing unit, a display panel data processing unit and a display panel data processing unit, wherein the database establishing unit is used for inputting a plurality of display panel data on a production line into a database, the display panel data comprises serial numbers and product information, the serial numbers are Xij, X are display panels, i represents that the display panels are formed by cutting an ith display panel mother board, j represents that the display panels are jth display panels formed by cutting the corresponding display panel mother board, 1< j < n, and n represents the number of the display panels formed by cutting one display panel mother board;
the first sampling inspection unit is used for acquiring data of a first display panel in the database and sending the data to the production line control system to intercept the first display panel for sampling inspection;
the second sampling unit is used for continuously acquiring data of a second display panel in the database and sending the data to the pipeline control system to intercept the second display panel for sampling inspection, and the second display panel and the first display panel are from different positions of different display panel mother boards;
and the circulation sampling inspection unit circulates the second sampling inspection step, wherein the sampled display panel is not sampled any more, and the circulation frequency is n-2 times.
8. The flow line control apparatus of claim 7, further comprising:
the assembly line control system is used for acquiring the selective inspection information and further intercepting the display panel required for selective inspection;
and the communication module is used for transmitting the sampling inspection information of the sampling inspection system to the assembly line control system and transmitting the sampling inspection data to the sampling inspection system.
9. The flowline control apparatus of claim 7, wherein said spot check system further comprises:
an acquisition unit that acquires sampling data of a sampled display panel;
and the sending unit is used for sending the sampling inspection data to the server.
10. A storage medium having a computer program stored thereon, the computer program when executed by a processor being operable to implement the method of any of claims 1 to 6.
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