CN111650789A - Display panel and electronic device - Google Patents
Display panel and electronic device Download PDFInfo
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- CN111650789A CN111650789A CN202010354578.2A CN202010354578A CN111650789A CN 111650789 A CN111650789 A CN 111650789A CN 202010354578 A CN202010354578 A CN 202010354578A CN 111650789 A CN111650789 A CN 111650789A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F1/133509—Filters, e.g. light shielding masks
- G02F1/133514—Colour filters
Abstract
The application proposes a display panel, the display panel including a display area and a non-display area surrounding the display area, the display panel including: a plurality of metal wires and a plurality of color block blocks, which are positioned in the display area; the test key is positioned in the non-display area and comprises a plurality of color resistance patterns and a plurality of metal patterns, each color resistance pattern corresponds to the corresponding color resistance block, each metal pattern corresponds to the corresponding metal wire, and each color resistance pattern is arranged between two corresponding adjacent metal patterns.
Description
Technical Field
The present disclosure relates to display panels, and particularly to a test key design for a display panel and an electronic device including the display panel.
Background
In the field of Display technology, Liquid Crystal Displays (LCDs) are widely used in daily life, such as mobile phones or televisions. A display panel of an LCD is mainly composed of a Thin Film Transistor (TFT) array substrate, a Color Filter (CF) substrate, and a Liquid Crystal Layer (Liquid Crystal Layer) disposed between the two substrates. With the improvement of display technology, a COA (color filter array) technology has been developed, in which color resist blocks are fabricated on a thin film transistor array substrate, and the color resist blocks include a red color resist block, a green color resist block, and a blue color resist block. As shown in fig. 1(a), a plurality of display panels 2 are fabricated on a motherboard 1, a main monitoring mark (Testkey )3 is disposed at four corners of the motherboard 1, as shown in fig. 1(b), a plurality of color blocks 601 are disposed in a display area of each display panel 2, each color block 601 includes a red color block, a green color block, and a blue color block, and adjacent metal traces 501 (e.g., column driving lines) are disposed between the red color block, the green color block, and the blue color block, as shown in fig. 1(c), widths of the red color block, the green color block, and the blue color block may change in an actual fabrication process, and the color block 601 and the metal traces 501 may deviate and overlap (Overlay), and when the overlap/deviation width is too large or too small, performance such as flatness, shielding performance may deteriorate.
Although the main monitoring mark is arranged for monitoring the width of the color resistance block and the offset and overlapping (Overlay) of the color resistance block and the column driving line, the situation that the monitoring fails due to poor manufacture of the main monitoring mark and the like often occurs in actual production, the main monitoring mark cannot monitor each display panel, and the monitoring precision needs to be improved. It is therefore necessary to provide a test key adapted to be disposed on each display panel and disposed on each display panel to monitor the condition of the shift and overlap (Overlay) of the color resist blocks in each display panel.
Disclosure of Invention
The embodiment of the application provides a display panel and an electronic device, wherein a test key is arranged in each display panel, so that the problems that the relative position of metal wiring, the width of a color resistance block, the offset of the color resistance block and the metal wiring and the width of overlapping (Overlay) in a display area of the display panel cannot be monitored due to failure of a main monitoring mark in the manufacturing process of the conventional display panel are solved, and the monitoring precision of each display panel is improved.
The embodiment of the application provides a display panel, including display area and the non-display area who surrounds the display area, display panel includes: the metal wires and the color blocking blocks are positioned in the display area; the test key is located in the non-display area and comprises a plurality of color resistance patterns and a plurality of metal patterns, each color resistance pattern corresponds to a corresponding color resistance block, each metal pattern corresponds to a corresponding metal wire, and each color resistance pattern is arranged between two corresponding adjacent metal patterns.
In the display panel of the present application, the plurality of color-resisting patterns includes a plurality of first color-resisting patterns, the plurality of metal patterns includes a plurality of first metal patterns arranged along a first direction, and each first color-resisting pattern is disposed between two corresponding adjacent first metal patterns.
In the display panel of the present application, the plurality of color-resisting patterns further include a plurality of second color-resisting patterns, the plurality of metal patterns further include a plurality of second metal patterns arranged along a second direction, the second color-resisting patterns and the second metal patterns are located on one sides of the first color-resisting patterns and the first metal patterns along the first direction, each second color-resisting pattern is disposed between two corresponding adjacent second metal patterns, and the second direction is perpendicular to the first direction.
In the display panel of the present application, the plurality of first color resist patterns and the plurality of second color resist patterns are arranged along the first direction.
In the display panel of the present application, each second color resist pattern and the corresponding two adjacent second metal patterns are located between the corresponding two adjacent first metal patterns.
In the display panel of the present application, the plurality of metal patterns further includes a plurality of third metal patterns arranged along the second direction, each first color resist pattern is further disposed between two corresponding adjacent third metal patterns, the second direction is perpendicular to the first direction, and each third metal pattern is located between two corresponding adjacent first metal patterns or intersects with two corresponding adjacent first metal patterns.
In the display panel of the present application, the plurality of color-resisting patterns further include a plurality of third color-resisting patterns, each of the third color-resisting patterns is disposed on one side of the first color-resisting pattern, and at least one through hole is disposed in the third color-resisting pattern.
In the display panel of the present application, the first metal pattern and the second metal pattern are formed of metals of the same layer, or the first metal pattern and the second metal pattern are formed of metals of different layers.
In the display panel of the application, the non-display area comprises a first frame area and a third frame area which are arranged oppositely, and a second frame area and a fourth frame area which are arranged oppositely, any two adjacent areas in the first frame area, the second frame area, the third frame area and the fourth frame area are intersected to form a corner, and at least one corner is provided with a test key.
In the display panel of the application, the metal pattern is formed by extending a part or all of the metal routing to the non-display area; or/and the color resistance pattern is formed by extending the color resistance blocks to the non-display area partially or completely.
The embodiment of the application also provides an electronic device which comprises the display panel.
The beneficial effect of this application does: the non-display area of each display panel is provided with a test key, the width of a color resistance block in the display area of the display panel, the offset and overlapping (Overlay) quantity of the color resistance block and adjacent metal wires are monitored through testing the relative positions of a plurality of metal patterns, the width of a plurality of color resistance patterns and the offset and overlapping (Overlay) quantity of the plurality of color resistance patterns relative to two corresponding adjacent metal patterns in the test key, the failure of monitoring of a main monitoring mark is avoided, and the monitoring precision of each display panel is improved.
Drawings
The technical solutions and other advantages of the present application will become apparent from the following detailed description of specific embodiments of the present application when taken in conjunction with the accompanying drawings.
Fig. 1(a) is a schematic diagram of a master monitoring mark provided in a motherboard in the prior art;
FIG. 1(b) is a schematic diagram of color resistance blocks of a display area of a display panel provided in the prior art;
FIG. 1(c) is a schematic diagram of color resistance blocks of a display area of a display panel according to the prior art;
fig. 2 is a schematic structural diagram of a display motherboard according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of a display panel according to an embodiment of the present disclosure;
fig. 4 is a schematic structural diagram of a test key of a display panel according to a first embodiment of the present application;
fig. 5 is a schematic structural diagram of a test key of a display panel according to a third embodiment of the present application;
fig. 6 is a schematic structural diagram of a test key of a display panel according to a third embodiment of the present application;
fig. 7 is a schematic structural diagram of a test key of a display panel according to a fourth embodiment of the present disclosure;
fig. 8 is a schematic structural diagram of a test key of a display panel according to a fifth embodiment of the present disclosure;
fig. 9 is a schematic structural diagram of a test key of a display panel according to a sixth embodiment of the present application;
fig. 10 is a schematic structural diagram of a test key of a display panel according to a sixth embodiment of the present application;
fig. 11 is a schematic structural diagram of a test key of a display panel according to a seventh embodiment of the present disclosure;
fig. 12(a) is a schematic structural diagram of a test key of a display panel according to an eighth embodiment of the present application;
fig. 12(b) is a schematic structural diagram of a test key of a display panel according to an eighth embodiment of the present application;
fig. 12(c) is a schematic structural diagram of a test key of a display panel according to an eighth embodiment of the present application;
fig. 12(d) is a schematic structural diagram of a test key of a display panel according to an eighth embodiment of the present application;
fig. 13 is a schematic structural diagram of a test key of a display panel according to a ninth embodiment of the present disclosure;
fig. 14 is a schematic structural diagram of a test key of a display panel according to a ninth embodiment of the present disclosure;
fig. 15 is a schematic structural diagram of a test key of a display panel according to a ninth embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be described below clearly and completely with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any inventive work, are within the scope of protection of the present application.
In the description of the present application, it is to be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the present application and for simplicity in description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed in a particular orientation, and be operated in a particular manner, and thus should not be considered limiting. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, features defined as "first", "second", may explicitly or implicitly include one or more of the described features. In the description of the present application, "plurality" means two or more unless specifically limited otherwise.
In the description of the present application, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically connected, electrically connected or communicated with each other; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact of the first and second features, or may comprise contact of the first and second features not directly but through another feature in between. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
The following disclosure provides many different embodiments, or examples, for implementing different features of the application. In order to simplify the disclosure of the present application, specific example components and arrangements are described below. Of course, they are merely examples and are not intended to limit the present application. Moreover, the present application may repeat reference numerals and/or letters in the various examples, such repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed. Additionally, examples of various specific processes and materials are provided herein, but one of ordinary skill in the art may recognize applications of other processes and/or uses of other materials.
The embodiment of the application provides a display panel, including display area and the non-display area who surrounds the display area, display panel includes: the metal wires and the color blocking blocks are positioned in the display area; the test key is located in the non-display area and comprises a plurality of color resistance patterns and a plurality of metal patterns, each color resistance pattern corresponds to a corresponding color resistance block, each metal pattern corresponds to a corresponding metal wire, and each color resistance pattern is arranged between two corresponding adjacent metal patterns.
The beneficial effect of this application does: the non-display area of each display panel is provided with a test key, the width of a color resistance block in the display area of the display panel, the offset and overlapping (Overlay) quantity of the color resistance block and adjacent metal wires are monitored through testing the relative positions of a plurality of metal patterns, the width of a plurality of color resistance patterns and the offset and overlapping (Overlay) quantity of the plurality of color resistance patterns relative to two corresponding adjacent metal patterns in the test key, the failure of monitoring of a main monitoring mark is avoided, and the monitoring precision of each display panel is improved.
The present application is further described below with reference to the accompanying drawings and examples.
Example one
Referring to fig. 2 and fig. 3, and taking an example of a test key in fig. 4 as an illustration, an embodiment of the present application provides a display panel, where the display panel 2 includes a display area 8 and a non-display area 9 surrounding the display area 8, the display area 8 is provided with a plurality of metal traces 501 and a plurality of color-resisting blocks 601, the test key 10 is located in the non-display area 9, the test key 10 includes a plurality of color-resisting patterns 11 and a plurality of metal patterns 111, each color-resisting pattern 11 corresponds to a corresponding color-resisting block 601, each metal pattern 111 corresponds to a corresponding metal trace 501, and each color-resisting pattern 11 is disposed between two corresponding adjacent metal patterns 111.
Specifically, the display area 8 of the display panel 2 is provided with a plurality of color blocking blocks 601, which include a red color blocking block R, a green color blocking block G, and a blue color blocking block B. The test key 10 comprises a plurality of color resistance patterns 11, each color resistance pattern comprises a red color resistance pattern R, a green color resistance pattern G and a blue color resistance pattern B, each color resistance pattern corresponds to a corresponding color resistance block, namely the red color resistance pattern R corresponds to the red color resistance block R, the green color resistance pattern G corresponds to the green color resistance block G, the blue color resistance pattern B corresponds to the blue color resistance block B, the red color resistance pattern R and the red color resistance block R are formed through the same material and the same process, the green color resistance pattern G and the green color resistance block G are formed through the same material and the same process, and the blue color resistance pattern B and the blue color resistance block B are formed through the same material and the same process; the display area 8 of the display panel 2 is provided with a plurality of metal traces 501, each metal pattern 111 of the test key 10 corresponds to a corresponding metal trace 501, that is, each metal pattern 111 and its corresponding metal trace 501 are formed by the same process using the same material, for example, by the same process using a column driving line, and especially when the metal traces are data signal lines (data lines), some or all of the metal patterns 111 and the data signal lines (data lines) are formed by the same material and the same process.
Referring to fig. 2, a plurality of display panels 2 are manufactured in a display mother board 1, the mother board 1 is provided with a plurality of main monitoring marks 3 in a Dummy area, although a main monitoring mark3 is provided to monitor the overlapping/offsetting (Overlay) of each color resist layer and the column driving lines/row driving lines, etc., in actual production, a monitoring failure condition caused by poor manufacturing of the main monitoring mark3 often occurs, and the main monitoring mark3 cannot monitor each display panel 2, and the monitoring accuracy needs to be improved. In addition, the problem of film forming uniformity exists in the manufacturing process of the color resistance blocks and the metal wires, namely, the closer color resistance blocks and the metal wires have better size uniformity, the test key 10 is arranged on each display panel, the shapes and the sizes of a plurality of color resistance patterns in the test key 10 can be better kept consistent with a plurality of color resistance blocks in a display area, the shapes and the sizes of a plurality of metal patterns in the test key 10 can be better kept consistent with a plurality of metal wires in the display area, and therefore the display area pattern layer is accurately monitored through the test key 10.
In a preferred embodiment and implementation of this embodiment, the test key 10 is disposed in the non-display area 9 adjacent to the display area 8 and the non-display area 9. The test key 10 is arranged in the non-display area 9 in close proximity to the display area 8, so that the occupation of the test key 10 on the space and the area of the non-display area can be reduced, the layout and the manufacture of the test key 10 in the display panel 2 are facilitated, meanwhile, the test key 10 is arranged in close proximity to the display area, the uniformity of the pattern layer is considered, the shapes and the sizes of a plurality of color resistance patterns and a plurality of metal patterns in the test key 10 can be better kept consistent with the display area, and therefore the display area layer can be accurately monitored through the test key 10.
As an improvement, one side of the color-resisting pattern in the first direction and/or the second direction is provided with a skirt portion, the distance from one side of the color-resisting pattern close to the bottom surface of each skirt portion to one side of the color-resisting pattern far away from the bottom surface of each skirt portion is the same, one side of the skirt portion far away from the color-resisting pattern is an inclined surface, the area of the bottom surface of the skirt portion is larger than the area of the top surface of the skirt portion, raised lines or grooves are arranged on the inclined surface, the raised lines or the grooves are wavy or zigzag, the raised lines or the grooves extend from the bottom surface of the skirt portion to the top surface of the skirt portion, and the distances between any two wave crests of the wavy or zigzag raised lines or grooves are the same, or the distances between any two tooth crests are. The wavy or zigzag ridges or the zigzag grooves are used for identifying the thickness of the color resistance pattern, that is, when an image pickup unit (CCD) photographs the color resistance pattern in a direction perpendicular to the display panel, the photographed image includes the wavy or zigzag ridges or grooves on the inclined surface of the skirt portion, and the density of the wavy or zigzag ridges or grooves identifies the thickness of the color resistance pattern, that is, when the thickness of the color resistance pattern is larger, the density of the wavy or zigzag ridges or grooves in the photographed image is larger, and when the thickness of the color resistance pattern is smaller, the density of the wavy or zigzag ridges or grooves in the photographed image is smaller.
The beneficial effect of this application does: the non-display area of each display panel is provided with a test key, the width of a color resistance block in the display area of the display panel, the offset and overlapping (Overlay) quantity of the color resistance block and adjacent metal wires are monitored through testing the relative positions of a plurality of metal patterns, the width of a plurality of color resistance patterns and the offset and overlapping (Overlay) quantity of the plurality of color resistance patterns relative to two corresponding adjacent metal patterns in the test key, the failure of monitoring of a main monitoring mark is avoided, and the monitoring precision of each display panel is improved.
Example two
Referring to fig. 4, based on the above embodiment, in an embodiment and implementation case, the plurality of color resist patterns include a plurality of first color resist patterns 11, the plurality of metal patterns include a plurality of first metal patterns 111, and the test key includes: the first test key 6, the first test key 6 includes a plurality of first color resist patterns 11 and a plurality of first metal patterns 111 arranged along a first direction, each first color resist pattern 11 is disposed between two corresponding adjacent first metal patterns 111.
Specifically, the plurality of first color resist patterns 11 include: red color resistance patterns, green color resistance patterns and blue color resistance patterns; the plurality of first metal patterns include: the first metal patterns 111 arranged along the first direction are adjacently arranged on two sides of the red color resist pattern, the first metal patterns 111 arranged along the first direction are adjacently arranged on two sides of the green color resist pattern, and the first metal patterns 111 arranged along the first direction are adjacently arranged on two sides of the blue color resist pattern 11. The adjacent first metal patterns 111 on two sides of each first color resist pattern 11 are used for measuring the relative positions of the first metal patterns 111 in the first direction, each first color resist pattern 11 is used for measuring the width of the first metal pattern in the first direction, and each first metal pattern 11 is matched with the adjacent first metal patterns 111 on two sides of the first metal pattern to measure the offset and overlap (Overlay) amount of each first metal pattern 11 and the adjacent first metal patterns 111 on two sides of the first metal pattern in the first direction. Specifically, the adjacent first metal patterns 111 on two sides of the red color resistance pattern are used for measuring the relative position of the red color resistance pattern in the first direction, the red color resistance pattern is used for measuring the width of the red color resistance pattern in the first direction, and the red color resistance pattern is matched with the adjacent first metal patterns 111 on two sides of the red color resistance pattern and is used for measuring the offset and overlap (Overlay) amount of the red color resistance pattern and the adjacent first metal patterns 111 on two sides of the red color resistance pattern in the first direction; the first metal patterns 111 adjacent to both sides of the green color resistance pattern are used for measuring the relative position of the first metal patterns in the first direction, the green color resistance pattern is used for measuring the width of the green color resistance pattern in the first direction, and the green color resistance pattern is matched with the first metal patterns 111 adjacent to both sides of the green color resistance pattern and is used for measuring the offset and overlapping (Overlay) quantity of the green color resistance pattern and the first metal patterns 111 adjacent to both sides of the green color resistance pattern in the first direction; the adjacent first metal patterns 111 on two sides of the blue color resistance pattern are used for measuring the relative position of the blue color resistance pattern in the first direction, the blue color resistance pattern is used for measuring the width of the blue color resistance pattern in the first direction, and the blue color resistance pattern is matched with the adjacent first metal patterns 111 on two sides of the blue color resistance pattern and is used for measuring the offset and overlapping (Overlay) quantity of the blue color resistance pattern and the adjacent first metal patterns 111 on two sides of the blue color resistance pattern in the first direction.
In fig. 4, in order to compress the space occupied by the plurality of first color resist patterns and the plurality of first metal patterns in the panel, the first metal patterns 111 may be selectively shared between adjacent first color resist patterns 11, which is not limited herein.
In fig. 4, taking the blue color resistance pattern with the notch 101 as an example, the notch 101 is used to facilitate the machine station to capture the position of the test key, and the device or system such as computer and software can identify the position of the blue color resistance pattern through the notch 101, and thus distinguish the positions of the red color resistance pattern and the green color resistance pattern. The position of the notch 101 is not limited herein, and may be set on any one or more of the metal patterns and/or the color resistance patterns in the test key.
It should be noted that, in the first test key 6 shown in fig. 4, although in this preferred embodiment, each first color resist pattern 11 is not in contact with each corresponding two adjacent first metal patterns 111 in the first direction, there is no limitation on whether each first color resist pattern 11 in the preset designed or manufactured graph is in contact with each corresponding two adjacent first metal patterns 111 in the first direction, and only the preferred embodiment or case is listed here. In a preferred embodiment or implementation, as shown in fig. 4, in the first test key 6, the red color resistance pattern has distances r1 and r2 with respect to the corresponding two adjacent first metal patterns 111, the green color resistance pattern has distances g1 and g2 with respect to the corresponding two adjacent first metal patterns 111, and the blue color resistance pattern has distances b1 and b2 with respect to the corresponding two adjacent first metal patterns 111. Wherein the widths of the red color resist pattern, the green color resist pattern and the blue color resist pattern in the first direction are respectively represented by r3, g3 and b 3.
By calculating the difference between the measured value and the preset value, the relative positions of the plurality of metal patterns in the test key, the widths of the plurality of color resistance patterns, and the shift and overlap (Overlay) amounts of the plurality of color resistance patterns with respect to the corresponding two adjacent metal patterns can be calculated, for example: in the first test key 6 shown in fig. 4, the overlapping amount of the red color resist pattern 11 and the first metal pattern 111 can be represented by measured r 1-preset r 1.
Specifically, the method S for measuring and using the first test key is illustrated by a red color resistance pattern and two adjacent first metal patterns corresponding to the red color resistance pattern, and the method S includes:
s1: taking a picture of the first test key 6;
s2: comparing the picture of the first test key 6 with a design graph or a preset graph through equipment or systems such as a computer, software and the like;
s3: determining whether the relative positions of two adjacent first metal patterns corresponding to the red color resistance pattern are within a preset design value and error value range, wherein the relative positions include respective widths of the two adjacent first metal patterns corresponding to the red color resistance pattern and a distance between the two adjacent first metal patterns, it is to be noted that the relative positions of the two adjacent first metal patterns 111 are used as reference/reference quantities for subsequent measurement and calculation, a large number of monitoring marks or test keys for monitoring parameters such as the width and distance of the metal in the same layer of the first metal patterns are generally arranged at other positions of the display panel or at other positions of the motherboard, usually, the relative positions of the plurality of first metal patterns 111 are within the preset design value and error value range, and subsequent production is continued, and the subsequent measurement has reference significance for actual production;
s4: the width of the red color resistance pattern in the first direction is obtained through the step S2 or the step S2 is repeated, and the difference value between the actual implementation of the red color resistance pattern and the preset width can be represented by the actually measured r 3-preset r3 and used as an actual production reference;
s5: the shift and the amount of overlap (Overlay) of the red color resist pattern and the corresponding two adjacent first metal patterns 111 in the first direction are obtained by the step of S2 or repeating the step of S2 again. With reference to fig. 1(b), a plurality of color blocks 601 are disposed in the display area of each display panel 2, each color block 601 includes a red color block, a green color block, and a blue color block, adjacent metal traces 501 (e.g., column driving lines) are disposed between the red color block, the green color block, and the blue color block, and the red color block, the green color block, and the blue color block are aligned with edges of the adjacent metal traces 501 and are designed in advance, at this time, the preset overlap between the red color block and the column driving lines 501 is 0, the measured r1 and the measured r2 are obtained by repeating step S2, at this time, the measured r 1-preset r1 can be used to represent the overlap amount of the red color block layer and the left adjacent column driving lines 501, the measured r 2-preset r2 can be used to represent the overlap amount of the red color block layer and the right adjacent column driving lines 502, and the offset amount of the red color block layer relative to the two adjacent column driving lines 501 is measured r 1-preset r1+ (measured r 3-preset) (e.g R3)/2 or measured r 2-preset r2+ (measured r 3-preset r 3)/2. When the color resistance layer and the metal wiring line in the display area have different preset designed overlapping amounts, the offset and overlapping (Overlay) amounts can also have different corresponding calculation methods.
The order of steps S4 and S5 in method S may be adjusted, and is not limited.
It should be noted that, in the embodiment of the present application, the relative position of the two adjacent first metal patterns corresponding to each first color resist pattern in the first test key, the width of each first color resist pattern, and the offset and overlap (Overlay) amount of each first color resist pattern and the two corresponding adjacent first metal patterns in the first direction may be obtained by measuring, calculating, and calculating by the method S, which is not listed herein.
In fig. 4, although the plurality of metal patterns and the plurality of color resist patterns in the test key are illustrated as rectangles, the plurality of metal patterns and the plurality of color resist patterns in the test key may be set to have other shapes, such as a curved shape, a circular shape, etc., in the actual panel production, which is not limited herein.
In the embodiment of the application, a test key suitable for being arranged in each display panel is provided, the test comprises a key first test key, and when a main monitoring mark fails, the relative position of each metal pattern, the width of each color resistor, and the offset and overlapping (Overlay) amount of each color resistor pattern and the corresponding metal pattern can be well monitored, so that the monitoring precision of each display panel is improved.
In the embodiment of the present application, a test key is disposed in each display panel, the test key includes a first test key, and the steps and principles of detecting, by using the first test key as an example, the relative position of two adjacent first metal patterns corresponding to each color resistance pattern in the first test key, the width of each color resistance pattern, and the offset and overlap (Overlay) amount of each color resistance pattern and the corresponding two adjacent first metal patterns by the method S are described. The width of the color resistance blocks in the display area of the display panel, the offset and overlapping (Overlay) width of the color resistance blocks and the metal wiring can be monitored by testing the relative position of the metal patterns in the test key, the width of the color resistance patterns and the offset and overlapping (Overlay) amount of the color resistance patterns relative to the corresponding metal patterns, the situation that the main monitoring mark cannot monitor when in failure is avoided, and the monitoring precision of each display panel is improved.
EXAMPLE III
Referring to fig. 5, the present embodiment is the same as or similar to the first and second embodiments, except that: the plurality of color-resisting patterns further include a plurality of second color-resisting patterns 12, the plurality of metal patterns further include a plurality of second metal patterns 122, the test key further includes a second test key 7, the second test key 7 is located on one side of the first test key 6 along the first direction, the second test key 7 includes a plurality of second color-resisting patterns 12 and a plurality of second metal patterns 122 arranged along the second direction, each second color-resisting pattern 12 is disposed between two corresponding adjacent second metal patterns 122, and the second direction is perpendicular to the first direction.
Specifically, the test key includes a first test key 6 and a second test key 7, and the plurality of second color resistance patterns 12 include: red color resistance patterns, green color resistance patterns and blue color resistance patterns; the plurality of second metal patterns 122 includes: the second metal patterns 122 are adjacently arranged on two sides of the green color resist pattern and arranged along the second direction, the second metal patterns 122 are adjacently arranged on two sides of the red color resist pattern and arranged along the second direction, and the second metal patterns 122 are adjacently arranged on two sides of the blue color resist pattern and arranged along the second direction. The second metal patterns 122 adjacent to both sides of each second color-resisting pattern 12 are used for measuring the relative position of the second metal pattern in the second direction, each second color-resisting pattern 12 is used for measuring the width of the second metal pattern in the second direction, and each second color-resisting pattern 12 is matched with the second metal patterns 122 adjacent to both sides of the second color-resisting pattern to measure the offset and overlap (Overlay) amount of each second color-resisting pattern 12 and the second metal patterns 122 adjacent to both sides of the second color-resisting pattern in the second direction. Specifically, the adjacent second metal patterns 122 on two sides of the red color resist pattern are used for measuring the relative position of the red color resist pattern in the second direction, the red color resist pattern is used for measuring the width of the red color resist pattern in the second direction, and the red color resist pattern is matched with the adjacent second metal patterns 122 on two sides of the red color resist pattern and is used for measuring the offset and overlap (Overlay) amount of the red color resist pattern and the adjacent second metal patterns 122 on two sides of the red color resist pattern in the second direction; the adjacent second metal patterns 122 on two sides of the green color resistance pattern are used for measuring the relative position of the green color resistance pattern in the second direction, the green color resistance pattern is used for measuring the width of the green color resistance pattern in the second direction, and the green color resistance pattern is matched with the adjacent second metal patterns 122 on two sides of the green color resistance pattern and is used for measuring the offset and overlapping (Overlay) quantity of the green color resistance pattern and the adjacent second metal patterns 122 on two sides of the green color resistance pattern in the second direction; the second metal patterns 122 adjacent to both sides of the blue color resist pattern are used for measuring the relative position of the blue color resist pattern in the second direction, the blue color resist pattern is used for measuring the width of the blue color resist pattern in the second direction, and the blue color resist pattern is matched with the second metal patterns 122 adjacent to both sides of the blue color resist pattern to measure the offset and overlap (Overlay) amount of the blue color resist pattern and the second metal patterns 122 adjacent to both sides of the blue color resist pattern in the second direction.
It should be noted that, in the second test key 7 shown in fig. 5, although each second photoresist pattern 12 is not in contact with each corresponding two adjacent second metal patterns 122 in the second direction in this preferred embodiment, there is no limitation on whether each second photoresist pattern 12 is in contact with each corresponding two adjacent second metal patterns 122 in the second direction in the preset design or manufactured pattern, and only the preferred embodiment or case is listed here. In a preferred embodiment or implementation of the second test key 7 shown in fig. 5, the red color resistance pattern has distances r4 and r5 with respect to the two corresponding adjacent second metal patterns 122, the green color resistance pattern has distances g4 and g5 with respect to the two corresponding adjacent second metal patterns 122, and the blue color resistance pattern has distances b4 and b5 with respect to the two corresponding adjacent second metal patterns 122. Wherein the widths of the red color resist pattern, the green color resist pattern and the blue color resist pattern in the second direction are respectively represented by r6, g6 and b 6.
It should be noted that, the first direction may be an x direction, and the second direction may be a y direction, or the first direction may be a y direction, and the second direction may be an x direction, and the directions of the first direction and the second direction are not limited herein, and the second direction is perpendicular to the first direction.
It should be noted that, in the embodiment of the present application, the test key includes both the first test key 6 and the second test key 7. The relative position of two adjacent first metal patterns corresponding to each first color resist pattern in the first test key 6, the width of each first color resist pattern in the first direction, and the offset and overlap (Overlay) amount of each first color resist pattern and two corresponding adjacent first metal patterns in the first direction can be obtained by measuring, calculating and calculating by the method S; meanwhile, the relative position of two adjacent second metal patterns corresponding to each second color resist pattern in the second test key, the width of each second color resist pattern in the second direction, and the offset and overlap (Overlay) amount of each second color resist pattern and two corresponding adjacent second metal patterns in the second direction can also be obtained by measuring, calculating and calculating through the method S.
Referring to fig. 6, in some preferred embodiments or implementations, the second test key 7 further includes first metal patterns 111, and each of the second photoresist patterns 12 and two corresponding adjacent second metal patterns 122 are located between two corresponding adjacent first metal patterns 111.
Please refer to fig. 5 and 6, which include but are not limited to: in a preferred embodiment, the plurality of first color resist patterns 11 and the plurality of second color resist patterns 12 are arranged along a first direction, the plurality of first color resist patterns 11 include a red color resist pattern, a green color resist pattern, and a blue color resist pattern, the red color resist pattern, the green color resist pattern, and the blue color resist pattern in the plurality of first color resist patterns 11 are arranged along the first direction, the plurality of second color resist patterns 12 include a red color resist pattern, a green color resist pattern, and a blue color resist pattern, and the red color resist pattern, the green color resist pattern, and the blue color resist pattern in the plurality of second color resist patterns 11 are arranged along the first direction.
In the embodiment of the application, the test keys are arranged in each display panel and comprise the first test key and the second test key, and the first test key and the second test key can be used for simultaneously monitoring the relevant parameters in the first direction and the second direction in the display panel, so that the situation that the main monitoring mark cannot monitor when in failure is avoided, and the monitoring precision of each display panel is improved.
Example four
Referring to fig. 7, the present embodiment is the same as or similar to the first, second and third embodiments, except that: the plurality of metal patterns further include a plurality of third metal patterns 133, the first test key 6 further includes a plurality of third metal patterns 133 arranged along the second direction, each first color resist pattern 11 is further disposed between two corresponding adjacent third metal patterns 133, the second direction is perpendicular to the first direction, and each third metal pattern 133 is disposed between two corresponding adjacent first metal patterns 111 or intersects with two corresponding adjacent first metal patterns 11. That is, in this embodiment, the first test key 6 includes the first color resist pattern 11, the first metal pattern 11, and the third metal pattern 133.
In this embodiment, by the method S, the first test key may measure parameters of a first direction and a second direction at the same time to monitor the display panel, and the relative position of two adjacent first metal patterns corresponding to each first color resist pattern in the first test key, the width of each first color resist pattern in the first direction, and the offset and overlap (Overlay) amount of each first color resist pattern and the two adjacent first metal patterns in the first direction may be obtained by measuring, calculating, and calculating by the method S; meanwhile, the relative position of the two adjacent third metal patterns corresponding to each first color resist pattern in the first test key, the width of each first color resist pattern in the second direction, and the offset and overlap (Overlay) amount of each first color resist pattern and the two adjacent third metal patterns in the second direction can also be obtained by measuring, calculating and calculating through the method S. The monitoring method is the same as the above embodiment, and the description is not repeated here.
In the embodiment of the application, the test key is arranged in each display panel, the first test key can be simultaneously provided with a plurality of first color resist patterns, a plurality of first metal patterns and a plurality of third metal patterns 133, and the first test key can be used for simultaneously monitoring the relevant parameters in the first direction and the second direction in the display panel, so that the problem that the main monitoring mark cannot be monitored when in failure is avoided, and the monitoring precision of each display panel is improved.
EXAMPLE five
Referring to fig. 8, the present embodiment is the same as or similar to the previous embodiments, except that: the plurality of color-resisting patterns further include a plurality of third color-resisting patterns 13, the first test key 6 further includes a plurality of third color-resisting patterns 13, each of the third color-resisting patterns 13 is disposed on one side of the first color-resisting pattern 11, and at least one through hole 201 is disposed in the third color-resisting pattern 13.
Specifically, the third color resist pattern 13 includes: red color resistance patterns, green color resistance patterns and blue color resistance patterns; at least one through hole 201 is formed in the red color-resisting pattern, at least one through hole 201 is formed in the green color-resisting pattern, and at least one through hole 201 is formed in the blue color-resisting pattern. In the display area pixels of the display panel, the color resistance blocks in the pixels comprise through holes, including but not limited to COA (color Filter on array) substrate pixels, pixel electrodes are electrically connected to source/drain electrodes of TFTs (thin film transistors) through the through holes, and the sizes of the through holes on the color resistance layers in the display area pixels can be well monitored by arranging color resistance patterns for measuring the sizes of the through holes in the test keys. The shape of the through hole in the test key can be the same as the shape of the through hole in the pixel of the display area, and the design size of the through hole in the test key can be the same as the design size of the through hole in the pixel of the display area, so that the shape and the size of the through hole in the test key can directly explain the shape and the size of the through hole in the color block in the pixel of the display area.
Based on the method S in the foregoing embodiment, in this embodiment, the red color-resisting pattern in the plurality of third color-resisting patterns 13 is exemplified, and the method S further includes:
s6: the size of the through-hole 201 is found by the step of S2 or repeating the step of S2 again, and the change in the size of the through-hole 201 can be represented by measured r 7-preset r 7.
The sequence of steps S4, S5, and S6 in method S may be adjusted without limitation.
In the embodiment of the present application, based on the foregoing embodiment, a plurality of third color resist patterns for monitoring the sizes of the via holes in the pixels of the display area are added, so that the relative positions of the metal patterns, the widths of the color resists, the offset and overlap (Overlay) amounts of the color resist patterns and the corresponding metal patterns, and the shapes and sizes of the via holes can be monitored well, and the monitoring accuracy of each display panel is improved.
EXAMPLE six
Referring to fig. 9, this embodiment is the same as or similar to the previous embodiment, which illustrates a preferred implementation. In a preferred implementation of this embodiment, the test key includes the first test key 6 of the third embodiment, the first test key 6 includes a plurality of first color resist patterns 11 and a plurality of first metal patterns 111 arranged along a first direction, each first color resist pattern 11 is disposed between two corresponding adjacent first metal patterns 111; the test key comprises the second test key 7 in the third embodiment, the second test key 7 is located on one side of the first test key 6 along the first direction, the second test key 7 comprises a plurality of second color-resisting patterns 12 and a plurality of second metal patterns 122 arranged along the second direction, each second color-resisting pattern 12 is arranged between two corresponding adjacent second metal patterns 122, and the second direction is perpendicular to the first direction; the test key further includes a plurality of third color-resisting patterns 13 disposed at one side of the plurality of first color-resisting patterns 11 or/and the plurality of second color-resisting patterns 12, and at least one through hole 201 is disposed in each of the third color-resisting patterns 13.
In a preferred embodiment, the plurality of first color resist patterns 11 and the plurality of second color resist patterns 12 are arranged along a first direction, the plurality of first color resist patterns 11 include a red color resist pattern, a green color resist pattern, and a blue color resist pattern, the red color resist pattern, the green color resist pattern, and the blue color resist pattern in the plurality of first color resist patterns 11 are arranged along the first direction, the plurality of second color resist patterns 12 include a red color resist pattern, a green color resist pattern, and a blue color resist pattern, and the red color resist pattern, the green color resist pattern, and the blue color resist pattern in the plurality of second color resist patterns 11 are arranged along the first direction.
Referring to fig. 10, in a preferred embodiment, the second test key 7 may further include first metal patterns 111, and each of the second photoresist patterns 12 and two corresponding adjacent second metal patterns 122 are located between two corresponding adjacent first metal patterns 111.
In the embodiment of the present application, based on the foregoing embodiment, a preferred implementation case is illustrated, so that the relative position of each metal pattern, the width of each color resist, the offset and overlap (Overlay) amount between each color resist pattern and the corresponding metal pattern, and the shape and size of the via hole can be well monitored, and the monitoring accuracy of each display panel is improved.
EXAMPLE seven
Referring to fig. 11, the present embodiment is the same as or similar to the previous embodiments, except that: the first metal pattern 111 and the second metal pattern 122 are formed by different layers of metals, for example, the first metal pattern 111 is on the same layer as the row driving lines in the display panel, and the second metal pattern 122 is on the same layer as the row driving lines in the display panel; for example, the first metal pattern 111 is on the same layer as the row driving lines in the display panel, and the second metal pattern 122 is on the same layer as the column driving lines in the display panel; alternatively, referring to fig. 5, the first metal pattern 111 and the second metal pattern 122 are formed of the same metal layer, for example, the first metal pattern 111, the second metal pattern 122 and the row driving line or the column driving line in the display panel are the same layer. And are not limited herein.
In the embodiment of the present application, it is described that the first metal pattern and the second metal pattern use the same or different layers of metal, and the first test key and the second test key may be set by selecting appropriate metal layers according to specific conditions of the display panel, so as to facilitate layout and manufacturing of the test keys in the display panel.
Example eight
Referring to fig. 12(a), based on the foregoing embodiment, the present embodiment describes the position of the test key in the display panel: the non-display area 9 includes a first frame area 91 and a third frame area 93 which are oppositely arranged, and a second frame area 92 and a fourth frame area 94 which are oppositely arranged, any adjacent two of the first, second, third and fourth frame areas intersect to form a corner, and at least one corner is provided with the test key in the previous embodiment.
Referring to fig. 12(a), fig. 12(b), fig. 12(c), and fig. 12(d), the first frame region 91 and the second frame region 92 intersect to form a first corner portion 911, the second frame region 92 and the third frame region 93 intersect to form a second corner portion 912, the third frame region 93 and the fourth frame region 94 intersect to form a third corner portion 913, and the fourth frame region 94 and the first frame region 91 intersect to form a fourth corner portion 914; at least one of the first, second, third and fourth corner parts is provided with the test key.
In FIG. 12(a), in a preferred embodiment and implementation, at least one of the first, second, third and fourth corner portions 911-914 is provided with a test key.
In FIG. 12(b), in a preferred embodiment and implementation, at least one of the first, second, third and fourth bezel areas 91-94 is provided with a test key.
In fig. 12(c), in a preferred embodiment and implementation, at least one of the first, second, third, and fourth frame regions 91-94 is provided with a test key, wherein the fourth frame region includes a fourth frame first sub-region 941 provided with the frame structure and a fourth frame second sub-region 942 provided with the pad structure, and the test key may also be provided in the fourth frame second sub-region 942. When the test keys are disposed in the fourth sub-area 942, the test keys can be easily tested after the display panel is cut into small pieces from the motherboard.
In fig. 12(d), in a preferred embodiment and implementation, the test key is selectively disposed only in the fourth sub-area 942 of the frame.
In fig. 12(a) and 12(b), the preferred test key is disposed adjacent to the display region, and from the viewpoint of uniformity of layer formation, the shapes and sizes of the plurality of color resist patterns and the plurality of metal patterns in the test key can be better kept consistent with the display region, so that the display region layer can be accurately monitored by the test key.
In the embodiment of the application, a display panel comprising a test key is provided, and the position of the test key in the display panel, which is preferably set by implementation, is refined, so that the area occupied by the test key in the display panel is reduced, the accuracy of monitoring the layer of the display area through the test key is improved, and the monitoring convenience is improved.
Example nine
Referring to fig. 13, fig. 14, and fig. 15, based on the foregoing embodiments, the present embodiment further illustrates the setting of the test key in the display panel: the metal pattern in the test key is formed by extending part or all of the metal routing of the display area to the non-display area; or/and the color resistance pattern is formed by extending the color resistance layer of the display area to the non-display area partially or completely. The metal pattern includes one or more of the first metal patterns, the second metal patterns, and the third metal patterns, and the color-resist patterns include one or more of the first color-resist patterns, the second color-resist patterns, and the third color-resist patterns, which are not limited herein.
In fig. 13, the display area of the display panel includes row driving lines (e.g., scanning driving lines) 301 and column driving lines (e.g., data lines/data lines) 302, the plurality of column driving lines 302 are arranged along a first direction and extend along a second direction, the plurality of row driving lines 301 are arranged along the second direction and extend along the first direction, and the display area of the display panel further includes a color resist layer, which is exemplified by a COA (color Filter on array) type display panel, in which a color resist block is fabricated on a tft array substrate by using a COA technology, and the color resist block includes a red color block, a green color block, and a blue color block. Alternatively, for example, the column driving lines 302 and/or the row driving lines 301 in the display area extend from the display area to the non-display area to form a first metal pattern in the first test key and/or a second metal pattern in the second test key, and the red color block, the green color block and the blue color block in the display area extend to the non-display area to form a first color block pattern in the first test key and/or a second color block pattern in the second test key.
In a preferred embodiment and implementation, with reference to fig. 13 and 14, the display panel includes a display area 8 and a non-display area 9, the test key is disposed at a position of the non-display area 9 where the non-display area 8 is adjacent to the display area 8, the first metal patterns 111 are arranged at two sides of the first color resist patterns 11 along the first direction and extend along the second direction, the column driving lines 302 in the display area 8 extend along the second direction, and the red color resist blocks, the green color resist blocks, and the blue color resist blocks in the display area 8 are arranged along the first direction and extend along the second direction. The plurality of first metal patterns 111 of the first test key 6 are formed by extending a plurality of column driving lines 302 of the display area to the non-display area 9, the plurality of first color resist patterns 11 are formed by extending a red color resist block, a green color resist block, and a blue color resist block in the display area to the non-display area 9, so as to reduce an area occupied by the test key in the display panel, the plurality of first metal patterns 111 and the plurality of first color resist patterns 11 in the first test key 6 are formed by extending a plurality of column driving lines 302 and a plurality of color resist blocks in the display area 8 to the non-display area 9, so that shapes and sizes of the plurality of color resist patterns and the plurality of metal patterns in the first test key 6 can be better kept consistent with the display area, thereby accurately monitoring the pattern layer in the display area 8 through the first test key 6.
In some embodiments, with reference to fig. 13 and 15, the display panel includes a display area 8 and a non-display area 9, the test key is disposed at a position of the non-display area 9 where the non-display area 8 is adjacent to the display area 8, the plurality of second metal patterns 122 are arranged at two sides of the plurality of second color resist patterns 12 along the second direction and extend along the first direction, and the plurality of row driving lines 301 of the display area 8 extend along the first direction. The plurality of second metal patterns 122 of the second test key 7 are formed by extending the plurality of row driving lines 301 of the display area to the non-display area, so that the area occupied by the test key in the display panel is reduced, and the plurality of second metal patterns 122 of the second test key 6 are formed by extending the plurality of row driving lines 301 in the display area 8 to the non-display area 9, so that the shapes and sizes of the plurality of metal patterns in the second test key 7 can be better kept consistent with the display area, and thus, the layer in the display area 8 can be accurately monitored through the second test key 7.
When the test key is provided in the non-display area 9 adjacent to the display area 8 in the non-display area 9, the first test key 7 and the second test key 8 may be provided in one place or may be provided separately in different places. The plurality of metal patterns and the plurality of color resist patterns in the first test key 7 and/or the second test key 8 may be partially or entirely formed by the plurality of column driving lines and the plurality of color resist layers extending to the non-display area in the display area 9.
In the embodiment of the present application, a display panel including a test key is provided, and a detailed example is performed on a setting form of a preferred embodiment of a first test key and a second test key in the display panel, where a plurality of metal patterns and a plurality of color resistance patterns in the test key may be formed by extending a metal trace and a color resistance layer in a display area to a non-display area, partially or completely, so as to further reduce an area occupied by the first test key and the second test key in the display panel, and improve accuracy of monitoring a layer of the display area through the test key.
Although the present disclosure is illustrated with a COA (color Filter on array) display panel in various embodiments, the present disclosure is not limited thereto, for example, the display panel may be a non-COA type, the color resistance layer is disposed on the CF substrate, and the display area may also be monitored by disposing a test key in the same or similar manner as in the embodiments of the present disclosure.
Although in the embodiments of the present application, how to monitor the display panel is described in the method S, the test key may be measured by other methods to monitor the display panel.
The application also provides an electronic device, which comprises the display panel.
The above embodiments are described in detail, and specific examples are applied herein to explain the principles and implementations of the present application, and the above description of the embodiments is only used to help understand the technical solutions and core ideas of the present application; those of ordinary skill in the art will understand that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications or substitutions do not depart from the spirit and scope of the present disclosure as defined by the appended claims.
Claims (11)
1. A display panel including a display area and a non-display area surrounding the display area, the display panel comprising:
the metal wires and the color blocking blocks are positioned in the display area;
the test key is positioned in the non-display area and comprises a plurality of color resistance patterns and a plurality of metal patterns, each color resistance pattern corresponds to a color resistance block with the same color, each metal pattern corresponds to the corresponding metal wiring, and each color resistance pattern is arranged between two corresponding adjacent metal patterns.
2. The display panel of claim 1, wherein the plurality of color resist patterns comprises a plurality of first color resist patterns, the plurality of metal patterns comprises a plurality of first metal patterns arranged along a first direction, and each first color resist pattern is disposed between two corresponding adjacent first metal patterns.
3. The display panel according to claim 2, wherein the plurality of color-resist patterns further includes a plurality of second color-resist patterns, the plurality of metal patterns further includes a plurality of second metal patterns arranged in a second direction, the second color-resist patterns and the second metal patterns are located at one side of the first color-resist patterns and the first metal patterns in the first direction, each of the second color-resist patterns is disposed between two corresponding adjacent second metal patterns, and the second direction is perpendicular to the first direction.
4. The display panel according to claim 3, wherein the plurality of first color resist patterns and the plurality of second color resist patterns are arranged in the first direction.
5. The display panel according to claim 3, wherein each of the second color resist patterns and the corresponding two adjacent second metal patterns are located between the corresponding two adjacent first metal patterns.
6. The display panel according to claim 2, wherein the plurality of metal patterns further includes a plurality of third metal patterns arranged along a second direction, each of the first color resist patterns is further disposed between two corresponding adjacent third metal patterns, the second direction is perpendicular to the first direction, and each of the third metal patterns is disposed between two corresponding adjacent first metal patterns or intersects with two corresponding adjacent first metal patterns.
7. The display panel of claim 2, wherein the color-resisting patterns further include a plurality of third color-resisting patterns, each of the third color-resisting patterns is disposed on one side of the first color-resisting pattern, and at least one through hole is disposed in the third color-resisting pattern.
8. The display panel according to claim 3, wherein the first metal pattern and the second metal pattern are formed of the same layer of metal, or the first metal pattern and the second metal pattern are formed of different layers of metal.
9. The display panel according to any one of claims 1 to 8, wherein the non-display area includes a first frame area and a third frame area which are oppositely arranged, and a second frame area and a fourth frame area which are oppositely arranged, any adjacent two of the first, second, third, and fourth frame areas intersect to form a corner, and the test key is provided in at least one of the corners.
10. The display panel of claim 1, wherein the metal pattern is formed by extending the metal traces to the non-display area partially or completely; or/and
the color resistance pattern is formed by extending the color resistance blocks to the non-display area partially or completely.
11. An electronic device comprising the display panel according to any one of claims 1 to 10.
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| US16/771,014 US11342359B2 (en) | 2020-04-29 | 2020-05-15 | Display panel and electronic device |
| PCT/CN2020/090599 WO2021217741A1 (en) | 2020-04-29 | 2020-05-15 | Display panel and electronic device |
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| CN114241914A (en) * | 2021-12-21 | 2022-03-25 | 上海中航光电子有限公司 | Display panel and display device |
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| WO2022199192A1 (en) * | 2021-03-23 | 2022-09-29 | 滁州惠科光电科技有限公司 | Coa type array substrate and measurement method therefor, and liquid crystal display panel |
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