CN111641537A - SIM card testing device - Google Patents
SIM card testing device Download PDFInfo
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- CN111641537A CN111641537A CN202010488779.1A CN202010488779A CN111641537A CN 111641537 A CN111641537 A CN 111641537A CN 202010488779 A CN202010488779 A CN 202010488779A CN 111641537 A CN111641537 A CN 111641537A
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- 238000012360 testing method Methods 0.000 title claims abstract description 73
- 230000005540 biological transmission Effects 0.000 claims abstract description 34
- 238000004891 communication Methods 0.000 claims abstract description 34
- 238000005192 partition Methods 0.000 claims abstract description 12
- 238000013500 data storage Methods 0.000 claims description 12
- 230000004888 barrier function Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 9
- 239000003990 capacitor Substances 0.000 description 8
- 230000002159 abnormal effect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
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- 230000003993 interaction Effects 0.000 description 2
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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Abstract
The invention discloses a SIM card testing device. The device comprises a communication unit, an SIM card identification unit, a mechanical unit, a control unit and a power supply; the mechanical unit comprises a wedge-shaped base; the storage box is provided with a partition plate, and the partition plate divides the storage box into two storage areas; a first baffle and a second baffle are arranged on one surface of the storage box, and the first baffle slides relative to the second baffle along a groove on the storage box under the driving of the traction structure; the storage box is provided with a card seat for containing the SIM card to be tested; a gap is formed in one side, close to the second baffle, of the storage box, and a transmission structure is arranged in the gap; the SIM card identification unit is electrically connected with the SIM card to be tested; the communication unit is used for uploading the information of the SIM card to be tested to the master station and receiving the test result generated by the master station; and the control unit is used for controlling the transmission structure according to the test result so that the transmission structure puts the SIM card to be tested into the corresponding containing area. The invention can realize uninterrupted automatic test on the SIM card and improve the test efficiency of the SIM card.
Description
Technical Field
The embodiment of the invention relates to the technical field of mobile terminal application, in particular to a SIM card testing device.
Background
At present, communication between terminal equipment such as load control, distribution transformer and concentrator of a power grid enterprise and a main station needs to realize remote data interaction through an SIM card and a wireless public network. The quality of the SIM card determines whether the information can be effectively transmitted, and the importance of the SIM card is self-evident for power supply enterprises needing to master the power utilization information of millions of users in real time. Every year, a power supply company purchases nearly ten thousand SIM cards from three operators, and for operator reasons, there are generally three types of problems: firstly, the SIM cards which are not opened are sent by mistake in batch, the SIM cards cannot log in a main station, and a worker fails to receive the cards and mount the cards on site, and needs to return to replace the cards again, so that a great deal of manpower and material resources are wasted; secondly, although the SIM card is opened, data reading and writing errors exist or data uploading is incomplete, so that electric power measurement and later-stage copying, checking and receiving services are influenced; and thirdly, the SIM card body has defects and cannot be used. The problems increase a lot of unnecessary work for operation and maintenance personnel, so that the services of electric energy metering, reading, checking and accepting, customer complaints and the like from the beginning of metering are affected, and the credibility of an enterprise is seriously affected. Therefore, the SIM card needs to be tested before it is put into use.
However, the existing SIM card testing method can only test a single SIM card, and one SIM card takes several minutes. The annual inspection measurement of the SIM cards of the current general power supply bureau in the city reaches tens of thousands, only a small number of samples can be extracted for testing due to time limitation, the manual detection efficiency is low, the waste of labor cost is caused, the meter reading rate is reduced in case that the abnormal SIM cards cannot be detected and installed to the field, and a great deal of unnecessary workload is increased due to the fact that the SIM cards need to be reapplied, received and installed.
Disclosure of Invention
The invention provides an SIM card testing device which can realize uninterrupted automatic testing on an SIM card, improve the testing efficiency of the SIM card and realize the full-scale testing of the SIM card.
In a first aspect, an embodiment of the present invention provides an SIM card testing apparatus, including: the SIM card identification device comprises a communication unit, an SIM card identification unit, a mechanical unit, a control unit and a power supply; the mechanical unit includes: a wedge-shaped base; the storage box is arranged on the wedge-shaped base, a partition plate is arranged in the middle of the storage box, and the storage box is divided into a first storage area and a second storage area by the partition plate; a first baffle and a second baffle are oppositely arranged on one side, away from the wedge-shaped base, of the storage box, a traction structure is arranged between the first baffle and the second baffle, and the first baffle slides relative to the second baffle along a groove in the storage box under the driving of the traction structure; the storage box is provided with a card seat for containing SIM cards to be tested, and a plurality of SIM cards to be tested are arranged between the first baffle and the second baffle and are stacked and distributed along the extending direction parallel to the card seat; a gap is formed in one side, close to the second baffle, of the storage box, and a transmission structure is arranged in the gap;
the SIM card identification unit is arranged on one surface of the second baffle plate, which is close to the first baffle plate, is electrically connected with the SIM card to be detected and is used for collecting the information of the SIM card to be detected;
the communication unit is used for uploading the information of the SIM card to be tested to the master station and receiving a test result generated by the master station based on the information of the SIM card to be tested;
the control unit is used for controlling the transmission structure according to the test result so that the transmission structure puts the SIM card to be tested into the storage area corresponding to the storage box;
and the power supply is used for supplying power to the communication unit, the SIM card identification unit, the mechanical unit and the control unit.
Optionally, if the test result indicates that the SIM card to be tested has no fault, the control unit controls the transmission structure to put the SIM card to be tested into the first storage area;
and if the test result indicates that the SIM card to be tested has a fault, the control unit controls the transmission structure to put the SIM card to be tested into the second containing area.
Optionally, each traction structure comprises a pair of spring posts and a spring; the pair of spring columns are respectively arranged on the first baffle and the second baffle, and two ends of the spring are respectively connected with the pair of spring columns.
Optionally, the transmission structure comprises a rotating frame, a gear connecting rod and a stepping motor; the stepping motor is connected with a gear connecting rod arranged on the rotating frame, the rotating frame is arranged in the gap, and the rotating frame is driven by the stepping motor to rotate anticlockwise or clockwise in the gap.
Optionally, the rotating frame comprises 3 main frameworks and 6 auxiliary frameworks; one ends of the 3 main frameworks are connected, and the included angle between every two of the 3 main frameworks is 120 degrees; the other end of each main framework is connected with one end of each 2 auxiliary frameworks, and the included angle between each two main frameworks and the included angle between each two auxiliary frameworks are 120 degrees.
Optionally, the transmission structure is a mechanical arm.
Optionally, the device further comprises a data storage unit, configured to store information of the SIM card to be tested.
Optionally, the data storage unit, the communication unit, the control unit and the power supply are arranged in the storage box.
Optionally, the data storage unit and the communication unit are arranged on one surface of the second baffle plate close to the first baffle plate and are integrated with the SIM card identification unit; the control unit and the power supply are arranged in the storage box.
Optionally, the information of the SIM card to be tested includes the card number of the SIM card to be tested and the manufacturer of the SIM card to be tested.
The invention provides a SIM card testing device, comprising: the SIM card identification device comprises a communication unit, an SIM card identification unit, a mechanical unit, a control unit and a power supply; the mechanical unit includes: a wedge-shaped base; the storage box is arranged on the wedge-shaped base, a partition plate is arranged in the middle of the storage box, and the storage box is divided into a first storage area and a second storage area by the partition plate; a first baffle and a second baffle are oppositely arranged on one side, away from the wedge-shaped base, of the storage box, a traction structure is arranged between the first baffle and the second baffle, and the first baffle slides relative to the second baffle along a groove in the storage box under the driving of the traction structure; the storage box is provided with a card seat for containing SIM cards to be tested, and a plurality of SIM cards to be tested are arranged between the first baffle and the second baffle and are stacked and distributed along the extending direction parallel to the card seat; a gap is formed in one side, close to the second baffle, of the storage box, and a transmission structure is arranged in the gap; the SIM card identification unit is arranged on one surface of the second baffle plate, which is close to the first baffle plate, is electrically connected with the SIM card to be detected and is used for collecting the information of the SIM card to be detected; the communication unit is used for uploading the information of the SIM card to be tested to the master station and receiving a test result generated by the master station based on the information of the SIM card to be tested; the control unit is used for controlling the transmission structure according to the test result so that the transmission structure puts the SIM card to be tested into the storage area corresponding to the storage box; and the power supply is used for supplying power to the communication unit, the SIM card identification unit, the mechanical unit and the control unit. The mechanical unit of the SIM card testing device can contain a plurality of SIM cards to be tested, and after one SIM card to be tested is tested through the SIM card identification unit and the communication unit, the mechanical unit puts the SIM card into the containing area corresponding to the containing box and drives the next SIM card to be tested to test.
Drawings
Fig. 1 is a schematic structural diagram of a SIM card testing apparatus according to a first embodiment;
FIG. 2 is a schematic structural diagram of a rotating turret according to an embodiment;
fig. 3 is a schematic view of a work flow of a SIM card testing apparatus according to a second embodiment;
fig. 4 is a schematic structural diagram of a SIM card according to the second embodiment;
fig. 5 is a circuit diagram of a SIM card identification unit according to the second embodiment.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
At present, communication between terminal equipment such as load control, distribution transformer and concentrator of a power grid enterprise and a main station needs to realize remote data interaction through an SIM card and a wireless public network. The quality of the SIM card determines whether the information can be effectively transmitted, and the importance of the SIM card is self-evident for power supply enterprises needing to master the power utilization information of millions of users in real time. Every year, a power supply company purchases nearly ten thousand SIM cards from three operators, and for operator reasons, there are generally three types of problems: firstly, the SIM cards which are not opened are sent by mistake in batch, the SIM cards cannot log in a main station, and a worker fails to receive the cards and mount the cards on site, and needs to return to replace the cards again, so that a great deal of manpower and material resources are wasted; secondly, although the SIM card is opened, data reading and writing errors exist or data uploading is incomplete, so that electric power measurement and later-stage copying, checking and receiving services are influenced; and thirdly, the SIM card body has defects and cannot be used. The problems increase a lot of unnecessary work for operation and maintenance personnel, so that the services of electric energy metering, reading, checking and accepting, customer complaints and the like from the beginning of metering are affected, and the credibility of an enterprise is seriously affected. Therefore, the SIM card needs to be tested before it is put into use.
However, the existing SIM card testing method can only test a single SIM card, and one SIM card takes several minutes. If the number of the SIM cards is huge, only a small number of samples can be extracted for testing due to time limitation, the efficiency is low, and the detection rate is not high. Therefore, the embodiment of the invention provides an SIM card testing device, wherein a mechanical unit of the SIM card testing device can contain a plurality of SIM cards to be tested, and after one SIM card to be tested is tested through an SIM card identification unit and a communication unit, the mechanical unit puts the SIM card into a storage area corresponding to a storage box and drives the next SIM card to be tested to test.
It should be noted that the following embodiments of the present invention may be implemented individually, or may be implemented in combination with each other, and the embodiments of the present invention are not limited in this respect.
Next, the SIM card testing apparatus and its technical effects will be described.
Example one
Fig. 1 is a schematic structural diagram of a SIM card testing apparatus according to a first embodiment, as shown in fig. 1, the SIM card testing apparatus according to the first embodiment includes: a communication unit (not shown in fig. 1), a SIM card identification unit (not shown in fig. 1), a mechanical unit, a control unit (not shown in fig. 1) and a power supply (not shown in fig. 1). And the power supply is used for supplying power to the communication unit, the SIM card identification unit, the mechanical unit and the control unit.
The mechanical unit includes: a wedge-shaped base 1; the storage box is arranged on the wedge-shaped base 1, a partition plate 2 is arranged in the middle of the storage box, and the storage box is divided into a first storage area 3 and a second storage area 4 by the partition plate 2. The first containing area 3 is used for containing normal (namely, failure-free) SIM cards, the second containing area 4 is used for containing abnormal (namely, failure-free) SIM cards, and the wedge-shaped base 1 can enable the containing box to be placed at an inclined angle, so that the SIM cards can automatically fall into the containing area of the containing box.
A first baffle 5 and a second baffle 6 are oppositely arranged on one side, far away from the wedge-shaped base 1, of the storage box, a traction structure is arranged between the first baffle 5 and the second baffle 6, and the first baffle 5 slides relative to the second baffle 6 along a groove 7 on the storage box under the driving of the traction structure; the grooves 7 are symmetrically arranged on the storage box to ensure the sliding of the first baffle 5.
Be provided with the cassette 8 that is used for the holding SIM card that awaits measuring on the receiver, many SIM cards that await measuring are set up between first baffle 5 and second baffle 6 to pile up arranging along being on a parallel with cassette 8 extending direction. The card seat 8 is used for limiting a plurality of SIM cards to be tested, and specifically, the card seat 8 can be a groove. Because many SIM cards that await measuring are set up between first baffle 5 and second baffle 6, and be provided with between first baffle 5 and the second baffle 6 and pull the structure, consequently can know, first baffle 5 and second baffle 6 are in the state of pressing from both sides tight many SIM cards that await measuring constantly.
One side of the storage box close to the second baffle 6 is provided with a gap, and a transmission structure is arranged in the gap. The transmission structure is used for transferring the SIM card to be tested from the gap to the first containing area 3 or the second containing area 4.
Specifically, the SIM card identification unit is disposed on a surface of the second barrier 6 close to the first barrier 5, and is electrically connected to the SIM card to be tested. The working principle of the SIM card testing device is as follows: when a plurality of SIM cards to be tested are additionally arranged between the first baffle 5 and the second baffle 6, the SIM card identification unit is electrically connected with the SIM card to be tested closest to the second baffle 6, and the SIM card identification unit acquires the information of the SIM card to be tested. The communication unit uploads the information of the SIM card to be tested to the main station after acquiring the information of the SIM card to be tested, so that the main station judges whether the SIM card to be tested has a fault according to the information of the SIM card to be tested and returns a test result to the communication unit, and the communication unit receives a test result generated by the main station based on the information of the SIM card to be tested and sends the test result to the control unit. The control unit controls the transmission structure according to the test result, so that the transmission structure puts the SIM card to be tested into the storage area corresponding to the storage box. At this time, the first baffle 5 and the second baffle 6 electrically connect the next SIM card to be tested with the SIM card identification unit under the traction of the traction structure, and perform the test of the next SIM card to be tested.
Optionally, the first storage area 3 is configured to store normal (i.e., no fault) SIM cards, the second storage area 4 is configured to store abnormal (i.e., fault) SIM cards, and if the test result indicates that the SIM card to be tested has no fault, the control unit controls the transmission structure to put the SIM card to be tested into the first storage area 3; if the test result indicates that the SIM card to be tested has a fault, the control unit controls the transmission structure to put the SIM card to be tested into the second containing area 4.
With continued reference to fig. 1, each traction structure includes a pair of spring posts 9 and a spring 10; a pair of spring posts 9 are respectively arranged on the first baffle 5 and the second baffle 6, and two ends of the spring 10 are respectively connected with the pair of spring posts 9. Illustratively, two traction structures (i.e., two pairs of spring posts 9 and two springs 10) are included in fig. 1. The number of the traction structures is not particularly limited in the embodiments of the present invention.
The transmission structure comprises a rotating frame 11, a gear connecting rod 12 and a stepping motor 13; the stepping motor 13 is connected with the gear connecting rod 12 arranged on the rotating frame 11, the rotating frame 11 is arranged in the gap, and the rotating frame 11 is driven by the stepping motor 13 to rotate anticlockwise or clockwise in the gap.
It should be noted that the width of the gap is slightly larger than the thickness of the SIM card, so that the SIM card to be tested can be distributed to the first receiving area 3 or the second receiving area 4 from the gap along the way.
Fig. 2 is a schematic structural diagram of a revolving rack provided in the first embodiment, and as shown in fig. 2, the revolving rack includes 3 main frameworks (labeled as a1, a2, and A3 in fig. 2), and 6 sub frameworks (labeled as B1, B2, B3, B4, B5, and B6 in fig. 2). The main framework A1, the main framework A2 and one end of the main framework A3 are connected, and the included angle between every two 3 main frameworks is 120 degrees (namely, the included angle between the main framework A1 and the main framework A2 is 120 degrees, the included angle between the main framework A1 and the main framework A3 is 120 degrees, and the included angle between the main framework A2 and the main framework A3 is 120 degrees); the other end of each main framework is connected with one end of 2 auxiliary frameworks, the included angle between every two main frameworks and the 2 auxiliary frameworks is 120 degrees (namely the other end of the main framework A1 is connected with one end of the auxiliary framework B1 and the auxiliary framework B2, the included angle between the main framework A1 and the auxiliary framework B1 is 120 degrees, the included angle between the main framework A1 and the auxiliary framework B2 is 120 degrees, the included angle between the auxiliary framework B1 and the auxiliary framework B2 is 120 degrees, the other end of the main framework A2 is connected with one end of the auxiliary framework B3 and the auxiliary framework B4, the included angle between the main framework A2 and the auxiliary framework B3 is 120 degrees, the included angle between the main framework A2 and the auxiliary framework B4 is 120 degrees, the included angle between the auxiliary framework B3 and the auxiliary framework B4 is 120 degrees, the included angle between the other end of the main framework A3 and the auxiliary framework B53 are connected with one end of the auxiliary framework B8427, the main framework B867 and the auxiliary framework B8658 and 36867 degrees, the included angle between the sub-skeleton B5 and the sub-skeleton B6 is 120 degrees).
The main framework and the auxiliary framework can be made of the same material and have different thicknesses, the horizontal distance between the auxiliary framework B2 and the auxiliary framework B3, the horizontal distance between the auxiliary framework B4 and the auxiliary framework B5 and the horizontal distance between the auxiliary framework B1 and the auxiliary framework B6 are larger than the width of the SIM card to be tested, so that the SIM card to be tested can be positioned between the two auxiliary frameworks, and the SIM card to be tested is stirred to be thrown into a corresponding storage area of the storage box when the auxiliary framework rotates in the clockwise or anticlockwise direction in the picture 2.
In another possible implementation manner, the transmission structure may also be a mechanical arm, and the mechanical arm directly grips the SIM card to be tested and puts the SIM card into the storage area corresponding to the storage box under the control of the control unit.
Optionally, the SIM card testing apparatus further includes a data storage unit, configured to store information of the SIM card to be tested.
In a specific application, the data storage unit, the communication unit, the control unit and the power supply are arranged in the storage box. Therefore, the size of the SIM card testing device can be reasonably arranged, and the problem that the SIM card testing device occupies too large space is avoided.
Or the data storage unit and the communication unit are arranged on one surface of the second baffle 6 close to the first baffle 5 and are integrated with the SIM card identification unit; the control unit and the power supply are arranged in the storage box. The data storage unit, the communication unit and the SIM card identification unit are arranged in an integrated mode, so that the occupied space of the SIM card testing device can be further saved.
The information of the SIM card to be tested comprises the card number of the SIM card to be tested and the manufacturer of the SIM card to be tested. The manufacturer of the SIM card to be tested can comprise at least one of Unicom, Mobile and Telecommunications.
The invention provides a SIM card testing device, comprising: the SIM card identification device comprises a communication unit, an SIM card identification unit, a mechanical unit, a control unit and a power supply; the mechanical unit includes: a wedge-shaped base; the storage box is arranged on the wedge-shaped base, a partition plate is arranged in the middle of the storage box, and the storage box is divided into a first storage area and a second storage area by the partition plate; a first baffle and a second baffle are oppositely arranged on one side, away from the wedge-shaped base, of the storage box, a traction structure is arranged between the first baffle and the second baffle, and the first baffle slides relative to the second baffle along a groove in the storage box under the driving of the traction structure; the storage box is provided with a card seat for containing SIM cards to be tested, and a plurality of SIM cards to be tested are arranged between the first baffle and the second baffle and are stacked and distributed along the extending direction parallel to the card seat; a gap is formed in one side, close to the second baffle, of the storage box, and a transmission structure is arranged in the gap; the SIM card identification unit is arranged on one surface of the second baffle plate, which is close to the first baffle plate, is electrically connected with the SIM card to be detected and is used for collecting the information of the SIM card to be detected; the communication unit is used for uploading the information of the SIM card to be tested to the master station and receiving a test result generated by the master station based on the information of the SIM card to be tested; the control unit is used for controlling the transmission structure according to the test result so that the transmission structure puts the SIM card to be tested into the storage area corresponding to the storage box; and the power supply is used for supplying power to the communication unit, the SIM card identification unit, the mechanical unit and the control unit. The mechanical unit of the SIM card testing device can contain a plurality of SIM cards to be tested, and after one SIM card to be tested is tested through the SIM card identification unit and the communication unit, the mechanical unit puts the SIM card into the containing area corresponding to the containing box and drives the next SIM card to be tested to test.
Example two
Fig. 3 is a schematic diagram of a working process of a SIM card testing apparatus according to a second embodiment, as shown in fig. 3, the working process includes the following steps.
S101, when the SIM card identification unit is electrically connected with the SIM card to be detected, acquiring information of the SIM card to be detected, and sending the information of the SIM card to be detected to the data storage unit, so that the data storage unit stores the information of the SIM card to be detected.
S102, the communication unit acquires the information of the SIM card to be tested, uploads the information of the SIM card to be tested to the main station, so that the main station judges whether the SIM card to be tested has faults or not according to the information of the SIM card to be tested, and returns the test result to the communication unit.
S103, the communication unit sends the test result to the control unit, so that the control unit controls the transmission structure according to the test result, and the transmission structure puts the SIM card to be tested into the storage area corresponding to the storage box.
S104, the mechanical unit controls the next SIM card to be tested to be electrically connected with the SIM card identification unit through the spring tension, and the steps are executed in a circulating mode.
Realize the motion of transmission structure through the control unit control, can successfully log in main website control revolving rack forward rotation when the SIM card that awaits measuring, the backward rotation of revolving rack is then controlled in the login failure, can drive the SIM card through the rotation and rotate first storage area 3 or second storage area 4. Because the receiver below is provided with wedge base 1, consequently the revolving rack rotates 120 degrees back SIM cards and can fall into the receiver in because gravity component is automatic to realize the automatic batch test to the SIM card through spring tension control.
Fig. 4 is a schematic structural diagram of a SIM card according to the second embodiment, and fig. 5 is a circuit diagram of a SIM card identification unit according to the second embodiment. As shown in fig. 4, the SIM card includes six interfaces, which are a card power interface, a reset interface, a card clock interface, a ground interface, a programming interface, and a card data interface, respectively, and thus, the connection relationship between the SIM card and the SIM card identification unit is as shown in fig. 5. The card power interface 1 is connected with a processor SIM VDD; the reset interface 2 is connected with one end of a first resistor R1, and the other end of the first resistor R1 is connected with a processor SIM RST; the card clock interface 3 is connected with one end of a second resistor R2, and the other end of the second resistor R2 is connected with a processor SIM CLK; the grounding interface 4 is grounded; the card DATA interface 6 is connected with one end of a third resistor R3, and the other end of the third resistor R3 is connected with the processor SIM DATA; one end of the first capacitor C1 is grounded, and the other end of the first capacitor C1 is connected with the processor SIM RST; one end of the second capacitor C2 is grounded, and the other end of the second capacitor C2 is connected with the processor SIM CLK; one end of the third capacitor C3 is grounded, and the other end of the third capacitor C3 is connected to the processor SIM DATA; one end of the fourth capacitor C4 is connected to the processor SIM VDD, and the other end of the fourth capacitor C4 is grounded.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (10)
1. A SIM card testing apparatus, comprising: the SIM card identification device comprises a communication unit, an SIM card identification unit, a mechanical unit, a control unit and a power supply; the mechanical unit includes: a wedge-shaped base; the storage box is arranged on the wedge-shaped base, a partition plate is arranged in the middle of the storage box, and the storage box is divided into a first storage area and a second storage area by the partition plate; a first baffle and a second baffle are oppositely arranged on one side, away from the wedge-shaped base, of the storage box, a traction structure is arranged between the first baffle and the second baffle, and the first baffle slides relative to the second baffle along a groove in the storage box under the driving of the traction structure; the storage box is provided with a card seat for containing SIM cards to be tested, and a plurality of SIM cards to be tested are arranged between the first baffle and the second baffle and are stacked and distributed along the extending direction parallel to the card seat; a gap is formed in one side, close to the second baffle, of the storage box, and a transmission structure is arranged in the gap;
the SIM card identification unit is arranged on one surface of the second baffle plate, which is close to the first baffle plate, is electrically connected with the SIM card to be detected and is used for collecting the information of the SIM card to be detected;
the communication unit is used for uploading the information of the SIM card to be tested to a main station and receiving a test result generated by the main station based on the information of the SIM card to be tested;
the control unit is used for controlling the transmission structure according to the test result so that the transmission structure puts the SIM card to be tested into the storage area corresponding to the storage box;
the power supply is used for supplying power to the communication unit, the SIM card identification unit, the mechanical unit and the control unit.
2. The SIM card testing apparatus of claim 1, wherein if the test result indicates that the SIM card to be tested has no fault, the control unit controls the transmission structure to drop the SIM card to be tested into the first receiving area;
and if the test result indicates that the SIM card to be tested has a fault, the control unit controls the transmission structure to put the SIM card to be tested into the second containing area.
3. The SIM card testing device of claim 1, wherein each of the pulling structures comprises a pair of spring posts and a spring; the pair of spring columns are respectively arranged on the first baffle and the second baffle, and two ends of the spring are respectively connected with the pair of spring columns.
4. The SIM card testing device of claim 1, wherein the transmission structure comprises a rotating frame, a gear link and a stepping motor; the stepping motor is connected with the gear connecting rod arranged on the rotating frame, the rotating frame is arranged in the gap, and the rotating frame is driven by the stepping motor to rotate anticlockwise or clockwise in the gap.
5. The SIM card testing device of claim 4, wherein the turret comprises 3 main frames and 6 sub-frames; one ends of the 3 main frameworks are connected, and the included angle between every two of the 3 main frameworks is 120 degrees; the other end of each main framework is connected with one end of each 2 auxiliary frameworks, and the included angle between each two main frameworks and the included angle between each two auxiliary frameworks are 120 degrees.
6. The SIM card testing device of claim 1, wherein the transmission structure is a robotic arm.
7. The SIM card testing apparatus of claim 1, further comprising a data storage unit for storing information of the SIM card under test.
8. The SIM card testing device according to claim 7, wherein the data storage unit, the communication unit, the control unit, and the power supply are provided in the storage case.
9. The SIM card testing device according to claim 7, wherein the data storage unit and the communication unit are disposed on a side of the second barrier close to the first barrier and are integrated with the SIM card identification unit; the control unit and the power supply are arranged in the storage box.
10. The SIM card testing apparatus of claim 1, wherein the information of the SIM card to be tested comprises a card number of the SIM card to be tested and a manufacturer of the SIM card to be tested.
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| CN202010488779.1A CN111641537B (en) | 2020-06-02 | 2020-06-02 | SIM card testing device |
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| CN202010488779.1A CN111641537B (en) | 2020-06-02 | 2020-06-02 | SIM card testing device |
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| CN111641537B (en) | 2021-09-07 |
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