CN111627994A - 一种采用电压驱动的bjt - Google Patents

一种采用电压驱动的bjt Download PDF

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CN111627994A
CN111627994A CN202010512331.9A CN202010512331A CN111627994A CN 111627994 A CN111627994 A CN 111627994A CN 202010512331 A CN202010512331 A CN 202010512331A CN 111627994 A CN111627994 A CN 111627994A
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CN111627994B (zh
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唐红祥
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Wuxi Guanglei Electronic Technology Co ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/72Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/73Bipolar junction transistors
    • H01L29/7302Bipolar junction transistors structurally associated with other devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0684Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/72Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/73Bipolar junction transistors
    • H01L29/732Vertical transistors
    • H01L29/7325Vertical transistors having an emitter-base junction leaving at a main surface and a base-collector junction leaving at a peripheral surface of the body, e.g. mesa planar transistor

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Abstract

本发明涉及功率半导体器件领域,公开了一种采用电压驱动的BJT,包括N型硅片,N型硅片底部设有集电极,N型硅片顶部设有第一P阱,第一P阱内设有第一N扩散区,N型硅片顶部设有第二P阱,第二P阱内设有第二N扩散区,N型硅片顶部连接绝缘层,绝缘层上设有输出电极,输出电极穿过绝缘层分别与第一P阱和第一N扩散区电连接,绝缘层内设有控制电极,控制电极接收驱动集电极和输出电极导通的控制信号A,绝缘层在第二P阱对应处设有发射极和基极,发射极穿过绝缘层与第二N扩散区连接,输出电极与基极电连接,基极穿过绝缘层与第二P阱电连接,本发明将BJT的导通控制从电流驱动变为电压驱动,不用再额外设计大电流驱动电路,减少了BJT的应用成本。

Description

一种采用电压驱动的BJT
技术领域
本发明涉及功率半导体器件领域,具体涉及一种采用电压驱动的BJT。
背景技术
目前BJT即双极结型晶体管的导通靠电流驱动,在使用时通过驱动电路向BJT的基极输入大电流,然后BJT的集电极和发射极导通。然而对于一些BJT的应用电路,输出大电流的驱动电路增加了整体电路的应用成本。
发明内容
鉴于背景技术的不足,本发明是提供了一种采用电压驱动的BJT,所要解决的技术问题是现有BJE采用大电流驱动,在实际应用时需要相应的驱动电路,增加了应用成本。
为解决以上技术问题,本发明提供了如下技术方案:一种采用电压驱动的BJT,包括N型硅片,N型硅片底部设有集电极,N型硅片顶部设有至少一个第一P阱,第一P阱内设有至少一个第一N扩散区,N型硅片顶部还设有第二P阱,第二P阱内设有第二N扩散区;
N型硅片顶部连接绝缘层,绝缘层上设有输出电极,输出电极穿过绝缘层分别与第一P阱和第一N扩散区电连接,绝缘层内还设有控制电极,控制电极用来接收驱动集电极和输出电极导通的控制信号A,绝缘层在第二P阱对应处分别设有发射极和基极,发射极和基极被绝缘层隔开,发射极穿过绝缘层与第二N扩散区电连接,所述输出电极与基极电连接,基极穿过绝缘层与第二P阱电连接,用来接收驱动集电极和发射极导通的控制信号B。
进一步,第一P阱内间隔设有两第一N扩散区。
进一步,N型硅片分为N+层和N-层,其中N-的电阻率大于等于0.1Ω·cm,N+的电阻率小于0.1Ω·cm。
本发明与现有技术相比所具有的有益效果是:在驱动BJT导通时,向控制电极输入驱动电压,此时阳集电极和输出电极导通,与集电极连接的激励通过输出电极流入基极,然后集电极和发射极导通,激励便可通过集电极和发射极流出,进而实现了BJT的导通控制,综上,本发明将BJT的导通控制从电流驱动变为电压驱动,不用再额外设计大电流驱动电路,减少了BJT的应用成本。
附图说明
本发明有如下附图:
图1为实施例1的BJT的结构示意图;
图2为实施例2的BJT的结构示意图;
图3为本发明的电路原理图。
具体实施方式
现在结合附图对本发明作进一步详细的说明。这些附图均为简化的示意图,仅以示意方式说明本发明的基本结构,因此其仅显示与本发明有关的构成。
如图1所示,一种采用电压驱动的BJT,包括N型硅片1,N型硅片1底部设有集电极7,N型硅片1顶部设有一个第一P阱2,第一P阱2内设有两个第一N扩散区3,N型硅片1顶部还设有第二P阱4,第二P阱4内设有第二N扩散区5;
N型硅片1顶部连接绝缘层7,绝缘层6上设有输出电极8,输出电极8穿过绝缘层7分别与第一P阱2和第一N扩散区3电连接,绝缘层7内还设有控制电极9,控制电极9用来接收驱动集电极7和输出电极8导通的控制信号A,绝缘层7在第二P阱4对应处分别设有发射极10和基极11,发射极10和基极11被绝缘层7隔开,发射极10穿过绝缘层7与第二N扩散区5电连接,输出电极8与基极11电连接,基极11穿过绝缘层7与第二P阱4电连接,
用来接收驱动集电极7和发射极10导通的控制信号B。
进一步,第一P阱2内分开设有两第一N扩散区3。
进一步,N型硅片1分为N+层和N-层,其中N-的电阻率大于等于0.1Ω·cm,N+的电阻率小于0.1Ω·cm。
实施例2
如图2所示,一种采用电压驱动的BJT,包括N型硅片1,N型硅片1底部设有集电极7,N型硅片1顶部设有两个第一P阱2,第一P阱2内设有两个第一N扩散区3,N型硅片1顶部还设有第二P阱4,第二P阱4内设有第二N扩散区5;
N型硅片1顶部连接绝缘层7,绝缘层6上设有输出电极8,输出电极8穿过绝缘层7分别与第一P阱2和第一N扩散区3电连接,绝缘层7内还设有控制电极9,控制电极9用来接收驱动集电极7和输出电极8导通的控制信号A,绝缘层7在第二P阱4对应处分别设有发射极10和基极11,发射极10和基极11被绝缘层7隔开,发射极10穿过绝缘层7与第二N扩散区5电连接,输出电极8与基极11电连接,基极11穿过绝缘层7与第二P阱4电连接,用来接收驱动集电极7和发射极10导通的控制信号B。
进一步,第一P阱2内分开设有两第一N扩散区3。
进一步,N型硅片1分为N+层和N-层,其中N-的电阻率大于等于0.1Ω·cm,N+的电阻率小于0.1Ω·cm。
结合实施例一和实施例二,在生产设计时可在N型硅片顶部设置多个第一P阱2来满足实际需求,另外本发明相当于在一块N型硅片1上集成了BJT和BJT的驱动单元,其中驱动单元采用MOSFET结构。如图3所示,采用MOSFET结构时,驱动单元的漏极和BJT的集电极电连接,驱动单元的源极与可控硅的基极电连接,驱动单元的栅级用来接收驱动电压。
本发明的工作原理如下:在驱动BJT导通时,向控制电极9输入驱动电压,此时集电极7和输出电极8导通,与集电极7连接的激励通过输出电极8流入基极11,然后集电极7和发射极10导通,激励便可通过集电极7和发射极10流出,进而实现了BJT的导通控制,综上,本发明将BJT的导通控制从电流驱动变为电压驱动,不用再额外设计大电流驱动电路,减少了BJT的应用成本。
上述依据本发明为启示,通过上述的说明内容,相关工作人员完全可以在不偏离本项发明技术思想的范围内,进行多样的变更以及修改。本项发明的技术性范围并不局限于说明书上的内容,必须要根据权利要求范围来确定其技术性范围。

Claims (4)

1.一种采用电压驱动的BJT,其特征在于:包括N型硅片,
所述N型硅片底部设有集电极,所述N型硅片顶部设有至少一个第一P阱,所述第一P阱内设有至少一个第一N扩散区,所述N型硅片顶部还设有第二P阱,所述第二P阱内设有第二N扩散区;
所述N型硅片顶部连接绝缘层,所述绝缘层上设有输出电极,所述输出电极穿过所述绝缘层分别与所述第一P阱和第一N扩散区电连接,所述绝缘层内还设有控制电极,所述控制电极用来接收驱动所述集电极和输出电极导通的控制信号A,所述绝缘层在所述第二P阱对应处分别设有发射极和基极,所述发射极和基极被所述绝缘层隔开,所述发射极穿过所述绝缘层与所述第二N扩散区电连接,所述输出电极与基极电连接,所述基极穿过所述绝缘层与所述第二P阱电连接,用来接收驱动所述集电极和发射极导通的控制信号B。
2.根据权利要求1所述的采用电压驱动的可控硅,其特征在于:所述第一P阱内设有两所述第一N扩散区。
3.根据权利要求1所述的采用电压驱动的可控硅,其特征在于:所述N型硅片分为N+层和N-层。
4.根据权利要求2所述的采用电压驱动的可控硅,其特征在于:所述N型硅片N+层的电阻率小于0.1Ω·cm,所述N型硅片N-层的电阻率大于等于0.1Ω·cm。
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080237657A1 (en) * 2007-03-26 2008-10-02 Dsm Solution, Inc. Signaling circuit and method for integrated circuit devices and systems
CN101494239A (zh) * 2009-02-27 2009-07-29 电子科技大学 一种高速igbt
CN104392995A (zh) * 2014-10-30 2015-03-04 京东方科技集团股份有限公司 一种晶体管、驱动电路及其驱动方法、显示装置
CN110690278A (zh) * 2019-10-22 2020-01-14 上海睿驱微电子科技有限公司 一种绝缘栅双极型晶体管及其制备方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080237657A1 (en) * 2007-03-26 2008-10-02 Dsm Solution, Inc. Signaling circuit and method for integrated circuit devices and systems
CN101494239A (zh) * 2009-02-27 2009-07-29 电子科技大学 一种高速igbt
CN104392995A (zh) * 2014-10-30 2015-03-04 京东方科技集团股份有限公司 一种晶体管、驱动电路及其驱动方法、显示装置
CN110690278A (zh) * 2019-10-22 2020-01-14 上海睿驱微电子科技有限公司 一种绝缘栅双极型晶体管及其制备方法

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