CN111625409B - Bandwidth-adjustable signal testing jig - Google Patents
Bandwidth-adjustable signal testing jig Download PDFInfo
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- CN111625409B CN111625409B CN202010412675.2A CN202010412675A CN111625409B CN 111625409 B CN111625409 B CN 111625409B CN 202010412675 A CN202010412675 A CN 202010412675A CN 111625409 B CN111625409 B CN 111625409B
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- 238000012360 testing method Methods 0.000 title claims abstract description 218
- 230000008054 signal transmission Effects 0.000 abstract description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 9
- 229910052799 carbon Inorganic materials 0.000 description 9
- 239000008358 core component Substances 0.000 description 3
- 239000000306 component Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/382—Information transfer, e.g. on bus using universal interface adapter
- G06F13/385—Information transfer, e.g. on bus using universal interface adapter for adaptation of a particular data processing system to different peripheral devices
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
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- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a bandwidth-adjustable signal testing jig which comprises a testing shell, a testing interface, a testing cable and a bandwidth adjusting module, wherein the testing interface is arranged on the testing shell and is used for being connected with a testing board card signal, the testing cable is arranged on the testing shell and is used for being connected with a testing terminal signal, and the bandwidth adjusting module is arranged in the testing shell and is used for adjusting the allowable bandwidth of the testing cable. Therefore, the test interface is used for collecting signals of the test board card, the collected signals are sent to the test terminal through the test cable for signal test, the bandwidth adjusting module is used for adjusting the allowable bandwidth of the test cable in the middle according to the collected signal rate of the test board card, so that the signal transmission rate of the test cable is matched with the signal rate of the test board card, and when different test board cards are subjected to signal test, the allowable bandwidth of the test cable can be adjusted according to different signal rates, the adaptability of the signal test fixture to signals with different rates is improved, and the accuracy of test results is improved.
Description
Technical Field
The invention relates to the technical field of servers, in particular to a bandwidth-adjustable signal testing jig.
Background
With the development of the chinese electronic technology, more and more electronic devices have been widely used.
Servers are an important component in electronic devices, which are devices that provide computing services. Since the server needs to respond to the service request and process it, the server should generally have the ability to afford the service and secure the service. According to the different types of services provided by the server, the server is divided into a file server, a database server, an application server, a WEB server and the like. The main components of the server include a processor, hard disk, memory, system bus, etc., similar to a general purpose computer architecture.
In the big data age, a large amount of IT equipment is centrally placed in data centers. These data centers include servers, storage, switches, and a large number of racks and other infrastructure of each type. Each IT device is composed of various hardware boards, such as a computing module, a storage module, a chassis, a fan module, and the like. Currently, with the rapid development of internet economy, the unprecedented growth trend of mass data impacts the whole data center industry, and higher requirements are put on an IT infrastructure. The server is one of the core components of the data center, and in order to meet the requirement of future large-scale service growth, the architecture of the server needs to be optimized and reconstructed.
Many boards all need to be tested by signal testing tools before leaving the factory in the prior art. The signal testing jig uses the carbon rod to collect the signals of the board card, and different signals have the optimal carbon rod collection rate, and the rate is mainly determined by the bandwidth. If the bandwidth of the carbon rod is too high or too low, the acquired signals are distorted, and the test result is adversely affected. However, in the current signal testing jig, different types of carbon rods with different bandwidths and different signal speeds of different boards are different, so that the problem that the bandwidth of the carbon rod of the signal testing jig is not matched with the signal speed of the board frequently occurs. The probe with partially replaceable parts can quantitatively adjust the bandwidth according to the signal rate of the test board card, but the disassembly and replacement are troublesome, and the test efficiency is lower.
Therefore, how to improve the adaptability of the signal testing jig to signals with different rates, so that the bandwidth of the carbon rod can be adjusted, and meanwhile, the convenience of bandwidth adjustment is improved, which is a technical problem faced by the person skilled in the art.
Disclosure of Invention
The invention aims to provide a bandwidth-adjustable signal testing jig, which can improve the adaptability of the signal testing jig to signals with different rates, enable the bandwidth of a carbon rod to be adjustable and improve the convenience of bandwidth adjustment.
In order to solve the technical problems, the invention provides a bandwidth-adjustable signal testing jig, which comprises a testing shell, a testing interface, a testing cable and a bandwidth adjusting module, wherein the testing interface is arranged on the testing shell and is used for being connected with a testing board card signal, the testing cable is arranged on the testing shell and is used for being connected with a testing terminal signal, the bandwidth adjusting module is arranged in the testing shell and is used for adjusting the allowable bandwidth of the testing cable, and a plurality of operation keys are arranged on the surface of the testing shell and are used for controlling the bandwidth adjusting value of the bandwidth adjusting module.
Preferably, the test interface and the test cable are respectively connected to two end parts of the test housing.
Preferably, the test interface is specifically an I2C, RGMI, SPI signal interface.
Preferably, the test cable is specifically an SMP connector cable, an RF connector cable.
Preferably, the inner end of the test cable is in signal connection with the test interface, and the outer end of the test cable extends out of the test housing.
Preferably, the bandwidth adjusting module is connected in series in the test cable, one end of the test cable is connected with the input end of the bandwidth adjusting module, and the other end of the test cable is connected with the output end of the bandwidth adjusting module.
Preferably, the bandwidth adjusting module is specifically an adjustable bandwidth chip.
Preferably, the surface of the test shell is also provided with a display screen which is used for being in signal connection with the bandwidth adjusting module and displaying the bandwidth adjusting value of the test shell in real time.
The invention provides a bandwidth-adjustable signal testing jig which mainly comprises a testing shell, a testing interface, a testing cable and a bandwidth adjusting module. The test shell is of a main structure of the test fixture, and the test interface is arranged on the test shell and is mainly used for being connected with the test board card through signals, so that signals are collected from the test board card. The test cable is also arranged on the test shell and is mainly used for being connected with the test terminal through signals, and the collected signals are sent to the test terminal to carry out corresponding signal test. The bandwidth adjusting module is a core component and is arranged in the test shell and is mainly used for adjusting the allowable bandwidth of the test cable, so that the current bandwidth of the test cable is controlled, the current bandwidth is matched with the signal rate of the test board card collected currently, signal distortion is avoided, and the accuracy of a signal test result is improved. Therefore, the bandwidth-adjustable signal testing jig provided by the invention collects the signals of the test board card through the testing interface, then sends the collected signals to the testing terminal for signal testing through the testing cable, and the bandwidth adjusting module is used for adjusting the allowable bandwidth of the testing cable in the middle according to the collected signal rate of the test board card, so that the signal transmission rate of the testing cable is matched with the signal rate of the test board card, and when different test board cards are subjected to signal testing, the allowable bandwidth of the testing cable can be adjusted according to different signal rates, therefore, the adaptability of the signal testing jig to signals with different rates can be improved, the bandwidth of the carbon rod can be adjusted, the accuracy of the testing result of the board card signal is improved, and the convenience of bandwidth adjustment is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required to be used in the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only embodiments of the present invention, and that other drawings can be obtained according to the provided drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic overall structure of an embodiment of the present invention.
Fig. 2 is a schematic surface structure of the test housing shown in fig. 1.
Wherein, in fig. 1-2:
test shell-1, test interface-2, test cable-3, bandwidth adjustment module-4, operating button-5, display screen-6.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1, fig. 1 is a schematic overall structure of an embodiment of the present invention.
In one embodiment of the present invention, the bandwidth-adjustable signal testing fixture mainly includes a testing housing 1, a testing interface 2, a testing cable 3 and a bandwidth adjusting module 4.
The test shell 1 is a main structure of the test fixture, and the test interface 2 is arranged on the test shell 1 and is mainly used for being connected with the test board card through signals, so that signals are collected from the test board card.
The test cable 3 is also arranged on the test shell 1 and is mainly used for being in signal connection with a test terminal, and the collected signals are sent to the test terminal for corresponding signal test.
The bandwidth adjusting module 4 is a core component and is arranged in the test shell 1 and is mainly used for adjusting the allowable bandwidth of the test cable 3, so that the current bandwidth of the test cable 3 is controlled to be matched with the signal rate of the test board card collected currently, signal distortion is avoided, and the accuracy of a signal test result is improved.
In this way, the bandwidth-adjustable signal testing jig provided by the embodiment collects signals of the test board through the test interface 2, the collected signals are sent to the test terminal through the test cable 3 to perform signal testing, the bandwidth adjusting module 4 is used for adjusting the allowable bandwidth of the test cable 3 in the middle according to the collected signal rate of the test board, so that the signal transmission rate of the test cable 3 is matched with the signal rate of the test board, and when different test boards are subjected to signal testing, the allowable bandwidth of the test cable 3 can be adjusted according to different signal rates, therefore, the adaptability of the signal testing jig to signals with different rates can be improved, the bandwidth of a carbon rod can be adjusted, the accuracy of the test result of the board signal is improved, and the convenience of bandwidth adjustment is improved.
In a preferred embodiment with respect to the test housing 1, the test housing 1 is in particular rectangular in shape, and the test interface 2 may in particular be arranged at one end position of the test housing 1, while the test cable 3 is connected at the other end position of the test housing 1. In general, the test interface 2 and the test cable 3 may be located at both ends of the test housing 1 in the length direction, respectively. Of course, the specific shape of the test housing 1 is not fixed, and the specific setting positions of the test interface 2 and the test cable 3 on the test housing 1 can be flexibly adjusted.
In general, the test interface 2 may be specifically I 2 C. The low-speed signal interfaces such as RGMI and SPI can be high-speed signal interfaces such as PCIE and USB. The test cable 3 may be an SMP connector cable or an RF connector cable, which has low signal loss, and is beneficial for preventing signal distortion.
Considering that the test cable 3 needs to transmit the signal of the test board card collected at the test interface 2 to the test terminal, in this embodiment, the test cable 3 is laid along the length direction in the test housing 1, the inner end of the test cable 3 extends to the test interface 2 and is in signal connection with the test interface 2, and meanwhile, the outer end of the test cable 3 extends to the outside of the test housing 1, so as to be conveniently connected with the test terminal.
Further, in order to facilitate the bandwidth adjusting module 4 to adjust the allowable bandwidth of the test cable 3 according to the signal rate of the test board, in this embodiment, the bandwidth adjusting module 4 may be connected in series in the test cable 3, so as to divide the test cable 3 into two parts, where two ends of one part of the test cable 3 are respectively connected with the input ends of the test interface 2 and the bandwidth adjusting module 4, and one end of the other part of the test cable 3 is connected with the output end of the bandwidth adjusting module 4, and the other end of the other part of the test cable 3 extends out of the test housing 1.
In a preferred embodiment of the bandwidth adjustment module 4, the bandwidth adjustment module 4 may be specifically an adjustable bandwidth chip, and is in signal connection with the test interface 2 through the test cable 3, so that the adjustable bandwidth chip may obtain the signal rate of the test board from the test cable 3 and adjust the allowable bandwidth of the test cable 3 according to the rate. In general, the allowable bandwidth of the test cable 3 may be adjusted to be comparable to the signal rate of the test board, such as 500M, 1G up to 20G, etc.
As shown in fig. 2, fig. 2 is a schematic surface structure of the test case 1 shown in fig. 1.
In another specific embodiment, in order to facilitate the intervention control of an operator, in this embodiment, a plurality of operation keys 5 are disposed on the surface of the test housing 1, each operation key 5 is in signal connection with the bandwidth adjusting module 4, and after each operation key 5 is triggered, the bandwidth adjusting module 4 can be controlled to adjust the bandwidth. In this way, the operator can manually adjust the allowable bandwidth of the test cable 3 by operating each of the operation keys 5.
Furthermore, this embodiment has still offered display screen 6 on the surface of test housing 1, and this display screen 6 and bandwidth adjustment module 4 signal connection can be used to the current bandwidth regulation of real-time display bandwidth adjustment module 4 to, makes things convenient for operating personnel to observe.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (5)
1. The bandwidth-adjustable signal testing jig is characterized by comprising a testing shell (1), a testing interface (2) which is arranged on the testing shell (1) and is used for being connected with a testing board card signal, a testing cable (3) which is arranged on the testing shell (1) and is used for being connected with a testing terminal signal, a bandwidth adjusting module (4) which is arranged in the testing shell (1) and is used for adjusting the allowable bandwidth of the testing cable (3), and a plurality of operation keys (5) which are arranged on the surface of the testing shell (1) and are used for controlling the bandwidth adjusting value of the bandwidth adjusting module (4);
the bandwidth adjusting module (4) is specifically an adjustable bandwidth chip and is used for acquiring the signal rate of the test board card from the test cable (3) and adjusting the allowable bandwidth of the test cable (3) according to the signal rate;
the inner end of the test cable (3) is in signal connection with the test interface (2), and the outer end of the test cable (3) extends out of the test shell (1);
the bandwidth adjusting module (4) is connected in series in the test cable (3), one end of the test cable (3) is connected with the input end of the bandwidth adjusting module (4), and the other end of the test cable (3) is connected with the output end of the bandwidth adjusting module (4).
2. The bandwidth-adjustable signal testing jig according to claim 1, wherein the testing interface (2) and the testing cable (3) are respectively connected to two end portions of the testing housing (1).
3. The bandwidth-adjustable signal testing jig according to claim 2, wherein the testing interface (2) is specifically I 2 C. RGMI, SPI signal interface.
4. The bandwidth-adjustable signal testing jig according to claim 3, characterized in that the testing cable (3) is in particular an SMP connector cable, an RF connector cable.
5. The bandwidth-adjustable signal testing jig according to claim 1, wherein a display screen (6) for displaying the bandwidth adjustment value thereof in real time is further provided on the surface of the testing housing (1) and is in signal connection with the bandwidth adjustment module (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010412675.2A CN111625409B (en) | 2020-05-15 | 2020-05-15 | Bandwidth-adjustable signal testing jig |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010412675.2A CN111625409B (en) | 2020-05-15 | 2020-05-15 | Bandwidth-adjustable signal testing jig |
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| Publication Number | Publication Date |
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| CN111625409A CN111625409A (en) | 2020-09-04 |
| CN111625409B true CN111625409B (en) | 2023-08-25 |
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| JP2007110277A (en) * | 2005-10-12 | 2007-04-26 | Funai Electric Co Ltd | Television tuner automatic preset measurement testing device |
| CN101645030A (en) * | 2009-09-04 | 2010-02-10 | 浪潮电子信息产业股份有限公司 | Method for measuring signal integrality based on SAS storage system |
| CN102355620A (en) * | 2011-06-09 | 2012-02-15 | 周意春 | Method for realizing automatic debugging of wireless microphone and automatic debugging system |
| CN205880147U (en) * | 2016-08-01 | 2017-01-11 | 浪潮电子信息产业股份有限公司 | Test fixture of accuse board and cable before server |
| CN110277610A (en) * | 2019-06-25 | 2019-09-24 | 太原师范学院 | A kind of adjustable wide-band photon radio-frequency phase shifter based on highly nonlinear optical fiber ring |
| CN110581720A (en) * | 2019-09-04 | 2019-12-17 | 武汉长光科技有限公司 | testing device, system and testing method for converting G.hn PLC power line into coaxial line |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI354107B (en) * | 2008-01-18 | 2011-12-11 | Chroma Ate Inc | A load device according to impedance of electronic |
-
2020
- 2020-05-15 CN CN202010412675.2A patent/CN111625409B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007110277A (en) * | 2005-10-12 | 2007-04-26 | Funai Electric Co Ltd | Television tuner automatic preset measurement testing device |
| CN101645030A (en) * | 2009-09-04 | 2010-02-10 | 浪潮电子信息产业股份有限公司 | Method for measuring signal integrality based on SAS storage system |
| CN102355620A (en) * | 2011-06-09 | 2012-02-15 | 周意春 | Method for realizing automatic debugging of wireless microphone and automatic debugging system |
| CN205880147U (en) * | 2016-08-01 | 2017-01-11 | 浪潮电子信息产业股份有限公司 | Test fixture of accuse board and cable before server |
| CN110277610A (en) * | 2019-06-25 | 2019-09-24 | 太原师范学院 | A kind of adjustable wide-band photon radio-frequency phase shifter based on highly nonlinear optical fiber ring |
| CN110581720A (en) * | 2019-09-04 | 2019-12-17 | 武汉长光科技有限公司 | testing device, system and testing method for converting G.hn PLC power line into coaxial line |
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