CN111540400A - Write amplification factor testing method and device, electronic equipment and storage medium - Google Patents
Write amplification factor testing method and device, electronic equipment and storage medium Download PDFInfo
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Abstract
The application discloses a write amplification factor test method, a device, equipment and a medium, wherein the method comprises the following steps: initializing all solid state disks in a full configuration state of the solid state disks, and dividing all the solid state disks into a preset number of hard disk groups; respectively preprocessing each hard disk group to enable each hard disk group to be in different data read-write states, and determining a first write-in data volume of each hard disk after preprocessing; reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy, and acquiring a second written data volume of each hard disk after the reading and writing are completed; and determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume to obtain a test result. The method and the device can test the write amplification coefficients of the solid state disk in different data read-write states under the condition that the solid state disk of the server is fully matched, so that the accuracy and the validity of the write amplification test result are ensured, and a good data basis is provided for the performance analysis of the solid state disk.
Description
Technical Field
The present disclosure relates to the field of computer technologies, and in particular, to a method and an apparatus for testing write amplification factor, an electronic device, and a computer-readable storage medium.
Background
With the rapid development of information technology, data is explosively increased, SSD (Solid State Drive) based on NVMe (Non-volatile memory host controller interface specification) has become a mainstream enterprise-level data storage carrier, and read-write performance and reliability are important bases for determining whether SSD is stable and usable, and are both based on the superiority and inferiority of Firmware algorithm. One of the important indicators for evaluating the superiority and inferiority of the Firmware algorithm is the write amplification factor. In principle, the smaller the write amplification factor, the better the Firmware algorithm, and the size of the write amplification factor is affected by OP (Over-Provisioning) and GC (Garbage Collection) algorithms. Therefore, how to accurately test the write amplification factor of the SSD is a problem that needs to be solved by those skilled in the art.
Disclosure of Invention
The application aims to provide a write amplification factor testing method and device, an electronic device and a computer readable storage medium, and accuracy and effectiveness of a write amplification testing result are ensured.
In order to achieve the above object, the present application provides a write amplification factor testing method, including:
initializing all solid state disks in a full configuration state of the solid state disks, and dividing all the solid state disks into a preset number of hard disk groups;
respectively preprocessing each hard disk group to enable each hard disk group to be in different data read-write states, and determining a first write-in data volume of each hard disk after preprocessing;
reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy, and acquiring a second written data volume of each hard disk after the reading and writing are completed;
and determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume to obtain a test result.
Optionally, in the fully-configured state of the solid state disk, initializing all the solid state disks, and dividing all the solid state disks into a preset number of hard disk groups, including:
performing cold start in a full configuration state of the solid state disks, and performing low-level formatting treatment on all the solid state disks after the solid state disks are started, so that each solid state disk is in a preset format;
after the low-level formatting process, unloading the original NVMe drivers and reloading the NVMe drivers;
and grouping all the solid state disks to obtain a first hard disk group, a second hard disk group and a third hard disk group.
Optionally, the preprocessing is performed on each hard disk group respectively to enable each hard disk group to be in different data read-write states, and the preprocessing includes:
respectively determining a write strategy corresponding to each hard disk group, wherein the write strategy comprises any one or a combination of any several of block size, queue depth, write times, write mode, write range and write time;
and respectively writing the hard disks in each hard disk group based on the write strategy so as to enable each hard disk group to be in different data read-write states.
Optionally, the determining the first write data size of each hard disk after the preprocessing includes:
after preprocessing of each hard disk is completed, determining the first host write data volume and the first memory write data volume of each hard disk.
Optionally, the reading and writing for a preset time period on each preprocessed hard disk based on a preset reading and writing strategy, and obtaining a second write data volume of each hard disk after the reading and writing are completed includes:
reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy, wherein the preset reading and writing strategy comprises any one or a combination of any several of a preset reading and writing proportion, a preset block size, a preset queue depth, a preset parallel mode and a writing mode;
and acquiring the write data volume of the second host and the write data volume of the second memory of each hard disk after the reading and writing are finished.
Optionally, the determining, by combining the first write data amount and the second write data amount, a write amplification factor of each hard disk includes:
determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume based on a coefficient calculation formula, wherein the coefficient calculation formula is as follows:
wherein, HW1Writing data volume, NW, for the first host1Writing data quantity, HW, to a first memory2Writing data volume, NW, for the second host2And WA is a write amplification factor for the second memory write data volume.
Optionally, the determining, by combining the first write data volume and the second write data volume, a write amplification coefficient of each hard disk to obtain a test result includes:
determining the write amplification factor of each hard disk, and calculating the average write amplification factor of each hard disk group;
judging whether each write amplification factor is smaller than a first preset threshold value or not, and judging whether the difference value between the average write amplification factors of any two hard disk groups is smaller than a second preset threshold value or not;
and if so, judging that the performance test result of each hard disk is passed.
In order to achieve the above object, the present application provides a write amplification factor testing apparatus, comprising:
the hard disk initialization module is used for initializing all the solid state disks in a full configuration state of the solid state disks and dividing all the solid state disks into a preset number of hard disk groups;
the hard disk preprocessing module is used for respectively preprocessing each hard disk group to enable each hard disk group to be in different data read-write states and determine a first write-in data volume of each preprocessed hard disk;
the data reading and writing module is used for reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy and acquiring a second written data volume of each hard disk after the reading and writing are finished;
and the coefficient determining module is used for determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume to obtain a test result.
To achieve the above object, the present application provides an electronic device including:
a memory for storing a computer program;
a processor for implementing the steps of any of the write amplification factor test methods disclosed above when executing the computer program.
To achieve the above object, the present application provides a computer-readable storage medium having a computer program stored thereon, which when executed by a processor, implements the steps of any of the write amplification factor test methods disclosed in the foregoing.
According to the scheme, the write amplification factor testing method provided by the application comprises the following steps: initializing all solid state disks in a full configuration state of the solid state disks, and dividing all the solid state disks into a preset number of hard disk groups; respectively preprocessing each hard disk group to enable each hard disk group to be in different data read-write states, and determining a first write-in data volume of each hard disk after preprocessing; reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy, and acquiring a second written data volume of each hard disk after the reading and writing are completed; and determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume to obtain a test result. According to the method, all the solid state disks are grouped and each group of solid state disks is initialized under the full configuration state of the solid state disks of the server, so that the solid state disks of each group are in different data reading and writing states, and further, the solid state disks in different states are subjected to data reading and writing operations, so that the write amplification coefficients of the solid state disks are calculated after the reading and writing are completed.
The application also discloses a write amplification factor testing device, electronic equipment and a computer readable storage medium, and the technical effects can be realized.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a flow chart of a write amplification factor testing method disclosed in an embodiment of the present application;
FIG. 2 is a block diagram of a write amplification factor test apparatus according to an embodiment of the present disclosure;
fig. 3 is a block diagram of an electronic device disclosed in an embodiment of the present application;
fig. 4 is a block diagram of another electronic device disclosed in the embodiments of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the prior art, one of important indexes for evaluating the superiority and inferiority of the Firmware algorithm is write amplification factor. In principle, the smaller the write amplification factor is, the better the Firmware algorithm is, and how to accurately test the write amplification factor of the SSD is a problem to be solved by those skilled in the art.
Therefore, the embodiment of the application discloses a write amplification factor testing method, which ensures the accuracy and the validity of a write amplification testing result and provides a good data basis for the performance analysis of a solid state disk.
Referring to fig. 1, a write amplification factor testing method disclosed in an embodiment of the present application includes:
s101: initializing all solid state disks in a full configuration state of the solid state disks, and dividing all the solid state disks into a preset number of hard disk groups;
in the embodiment of the application, the test of the write amplification factor is carried out in the fully-matched state of the solid state disk of the server, namely, all the notches of the server are fully inserted with the solid state disk, and the cold start is carried out to clear the memory. And then all the inserted solid state disks are initialized. Specifically, all the solid state disks may be subjected to low-level formatting processing, so that each solid state disk is in a preset format, which is convenient for development of subsequent data reading and writing, and the preset format may be 512B specifically. The low-level formatting is the most thorough formatting method for the hard disk, and the originally stored data can be completely removed after passing through the low-level formatting hard disk.
Further, after the low-level formatting process, the original NVMe driver is unloaded, and the NVMe driver is reloaded, so that the solid state disk after the low-level is updated in the driver, and it is ensured that all the solid state disks can be seen in the NVMe list to be powered on in place.
In a specific implementation, all the solid state disks may be divided into three groups, and a first hard disk group, a second hard disk group, and a third hard disk group are obtained, so as to perform different data processing on the hard disks of each group. In hard disk partitioning, the allocation may be averaged based on the number of full allocations and the number of groups, for example, if there are twelve server slots that need to be divided into three groups, each group including four hard disks.
S102: respectively preprocessing each hard disk group to enable each hard disk group to be in different data read-write states, and determining a first write-in data volume of each hard disk after preprocessing;
in this step, the solid state disks in each hard disk group are respectively preprocessed, so that the solid state disks of each group are in different data reading and writing states. Specifically, the write strategies corresponding to the hard disk groups may be respectively determined, and the hard disks in the hard disk groups may be written based on the respective corresponding write strategies, so that the hard disks in the hard disk groups are in different data read-write states. Specifically, the write strategy may include, but is not limited to, a block size, a queue depth, a write time, a write mode, a write range, and a write time, where the write mode may include random writing, sequential writing, and the write range may include full disc writing, partial disc writing, and the like. By writing data of different strategies into the solid state disk, the data distribution range and the data erasing frequency of each group of hard disks are different, namely, each group of hard disks are in different states.
After the preprocessing of each group of solid state disks is completed, the first host write data volume and the first memory write data volume of each hard disk, that is, the first write data volume, may be determined respectively.
S103: reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy, and acquiring a second written data volume of each hard disk after the reading and writing are completed;
after the pretreatment of the solid state disks of each group is completed, reading and writing of each pretreated hard disk for a preset time period, namely a test process of the write amplification factor, can be performed based on a preset reading and writing strategy. The preset read-write strategy may include, but is not limited to, a preset read-write ratio, a preset block size, a preset queue depth, a preset parallel mode, and a write mode. And after the reading and writing are finished, acquiring a second write data volume of each hard disk, wherein the second write data volume comprises a second host write data volume and a second memory write data volume.
S104: and determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume to obtain a test result.
It is to be understood that the calculation of the write amplification factor may be performed after the first amount of write data and the second amount of write data are determined separately. Specifically, the write amplification factor of each hard disk may be determined based on a factor calculation formula, where the factor calculation formula is:
wherein, HW1Writing data volume, NW, for the first host1Writing data quantity, HW, to a first memory2Is as followsTwo host write data volume, NW2And WA is a write amplification factor for the second memory write data volume.
In a specific implementation, after the write amplification factor of each solid state disk is determined, the average write amplification factor of each disk group can be calculated. And further judging whether the write amplification coefficients of the hard disks are all smaller than a first preset threshold value, judging whether the difference value between the average write amplification coefficients of any two hard disk groups is smaller than a second preset threshold value, and if yes, judging that the performance test result of each hard disk passes. The first preset threshold and the second preset threshold may be set according to actual conditions in a specific implementation process, for example, may be set according to standards of a read-write performance test, and are not specifically limited herein.
According to the scheme, the write amplification factor testing method provided by the application comprises the following steps: initializing all solid state disks in a full configuration state of the solid state disks, and dividing all the solid state disks into a preset number of hard disk groups; respectively preprocessing each hard disk group to enable each hard disk group to be in different data read-write states, and determining a first write-in data volume of each hard disk after preprocessing; reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy, and acquiring a second written data volume of each hard disk after the reading and writing are completed; and determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume to obtain a test result. According to the method, all the solid state disks are grouped and each group of solid state disks is initialized under the full configuration state of the solid state disks of the server, so that the solid state disks of each group are in different data reading and writing states, and further, the solid state disks in different states are subjected to data reading and writing operations, so that the write amplification coefficients of the solid state disks are calculated after the reading and writing are completed.
The following describes a write amplification factor test method provided in an embodiment of the present application with a specific example. Specifically, the method comprises the following steps:
the method comprises the following steps: fully allocating and inserting 12 NVMe SSD into each slot of the server, and performing cold start, wherein the cold start is a start mode of a computer, namely, cutting off a power supply of the computer for restart, once the cold start is performed, all east and west of an internal memory are lost, and hardware is detected again;
step two: low-level formatting all NVMe SSDs into 512B format;
step three: unloading the NVMe driver, and reloading the NVMe driver to ensure that the NVMe list can check that all the NVMe SSDs are electrified in place;
step four: dividing 12 SSDs into three groups, and respectively testing the following scenes for each group of SSDs:
a first group: the method comprises the steps that 4 blocks of NVMe SSDs from Slot1 to Slot4 are written once in a full-disk sequence on the basis of the block size of 128K and the queue depth of 128, and further, full-disk random writing is performed once on the basis of the block size of 4K and the queue depth of 1;
second group: the 4 blocks of NVMe SSD from Slot5 to Slot8 are written once in a full disk sequence based on the block size of 128K and the queue depth of 128, and then are written once in a full disk random manner based on the block size of 4K and the queue depth of 128, and then are written for 2 hours in a 50% size disk random manner based on the block size of 4K and the queue depth of 1;
third group: the method comprises the steps that 4 blocks of NVMe SSDs from Slot9 to Slot12 are written once in a full-disk sequence on the basis of the block size of 128K and the queue depth of 128, further full-disk random writing is performed once on the basis of the block size of 4K and the queue depth of 128, and 10% size disks with the block size of 4K and the queue depth of 1 are written randomly for 1 hour;
through the preprocessing process, the data distribution range of each group of SSD is different, and the erasing times of different positions of the hard disk are different.
Step five: after the three sets of SSDs complete the data preprocessing, the Host write data volume HW1 and the Nand write data volume NW1 of each of the 12 blocks of NVMe SSDs are obtained by the NVMe Cli tool;
step six: based on random mixed reading and writing with a reading and writing proportion of 4:6, a queue depth of 256, a parallel mode of 4 and a norandomamp mode for two weeks, specifically, the block size can be in the following proportion: 512B accounts for 4%, 1024B accounts for 1%, 1536B accounts for 1%, 2048B accounts for 1%, 2560B accounts for 1%, 3072B accounts for 1%, 3584B accounts for 1%, 4k accounts for 67%, 8k accounts for 10%, 16k accounts for 7%, 32k accounts for 3%, and 64k accounts for 3%;
step seven: after the data reading and writing are finished, acquiring Host write data volume HW2 and Nand write data volume NW2 of 12 NVMe SSDs by an NVMe Cli tool two weeks later;
step eight: calculating a write amplification value WA of each block NVMe SSD by a formula WA ═ (NW2-NW1)/(HW2-HW 1);
step nine: and when the write amplification coefficients WA of the three groups of 12 NVMe SSD blocks are less than or equal to 6.09 and the average write amplification coefficient value difference among the groups is not more than 1, namely the average write amplification coefficient values of the first group and the second group, the first group and the third group and the second group and the third group are not more than 1, judging that the NVMe SSD write amplification test is passed.
By the write amplification factor testing method, the write amplification factor of the NVMe SSD can be accurately and clearly calculated, the merit and the disadvantage of a Firmware algorithm of the NVMe SSD are detected, and effective data support is provided for the improvement of the performance and the stability of the NVMe SSD.
In the following, a write amplification factor testing apparatus provided by an embodiment of the present application is introduced, and a write amplification factor testing apparatus described below and a write amplification factor testing method described above may be referred to each other.
Referring to fig. 2, a write amplification factor testing apparatus provided in an embodiment of the present application includes:
the hard disk initialization module 201 is configured to initialize all the solid state disks in a full configuration state of the solid state disks, and divide all the solid state disks into a preset number of hard disk groups;
the hard disk preprocessing module 202 is configured to preprocess each hard disk group to enable each hard disk group to be in different data read-write states, and determine a first write data amount of each preprocessed hard disk;
the data reading and writing module 203 is used for reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy, and acquiring a second written data volume of each hard disk after the reading and writing are finished;
and a coefficient determining module 204, configured to determine, by combining the first write data amount and the second write data amount, a write amplification coefficient of each hard disk, so as to obtain a test result.
For the specific implementation process of the modules 201 to 204, reference may be made to the corresponding content disclosed in the foregoing embodiments, and details are not repeated here.
The present application further provides an electronic device, and as shown in fig. 3, an electronic device provided in an embodiment of the present application includes:
a memory 100 for storing a computer program;
the processor 200, when executing the computer program, may implement the steps provided by the above embodiments.
Specifically, the memory 100 includes a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and computer-readable instructions, and the internal memory provides an environment for the operating system and the computer-readable instructions in the non-volatile storage medium to run. The processor 200 may be a Central Processing Unit (CPU), a controller, a microcontroller, a microprocessor or other data processing chip in some embodiments, and provides computing and controlling capability for the electronic device, and when executing the computer program stored in the memory 100, the steps of the write amplification factor testing method disclosed in any of the foregoing embodiments may be implemented.
On the basis of the above embodiment, as a preferred implementation, referring to fig. 4, the electronic device further includes:
and an input interface 300 connected to the processor 200, for acquiring computer programs, parameters and instructions imported from the outside, and storing the computer programs, parameters and instructions into the memory 100 under the control of the processor 200. The input interface 300 may be connected to an input device for receiving parameters or instructions manually input by a user. The input device may be a touch layer covered on a display screen, or a button, a track ball or a touch pad arranged on a terminal shell, or a keyboard, a touch pad or a mouse, etc.
And a display unit 400 connected to the processor 200 for displaying data processed by the processor 200 and for displaying a visualized user interface. The display unit 400 may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, an OLED (Organic Light-Emitting Diode) touch panel, or the like.
And a network port 500 connected to the processor 200 for performing communication connection with each external terminal device. The communication technology adopted by the communication connection can be a wired communication technology or a wireless communication technology, such as a mobile high definition link (MHL) technology, a Universal Serial Bus (USB), a High Definition Multimedia Interface (HDMI), a wireless fidelity (WiFi), a bluetooth communication technology, a low power consumption bluetooth communication technology, an ieee802.11 s-based communication technology, and the like.
While FIG. 4 shows only an electronic device having the assembly 100 and 500, those skilled in the art will appreciate that the configuration shown in FIG. 4 does not constitute a limitation of the electronic device, and may include fewer or more components than shown, or some components may be combined, or a different arrangement of components.
The present application also provides a computer-readable storage medium, which may include: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk. The storage medium has a computer program stored thereon, and the computer program, when executed by a processor, implements the steps of the write amplification factor testing method disclosed in any of the foregoing embodiments.
According to the method and the device, all the solid state disks are grouped under the full configuration state of the solid state disks of the server, each group of solid state disks is initialized, so that the solid state disks of each group are in different data reading and writing states, and then the solid state disks in different states are subjected to data reading and writing operations, so that the writing amplification coefficients of the solid state disks are calculated after the reading and writing are completed.
The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. For the system disclosed by the embodiment, the description is relatively simple because the system corresponds to the method disclosed by the embodiment, and the relevant points can be referred to the method part for description. It should be noted that, for those skilled in the art, it is possible to make several improvements and modifications to the present application without departing from the principle of the present application, and such improvements and modifications also fall within the scope of the claims of the present application.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Claims (10)
1. A write amplification factor test method is characterized by comprising the following steps:
initializing all solid state disks in a full configuration state of the solid state disks, and dividing all the solid state disks into a preset number of hard disk groups;
respectively preprocessing each hard disk group to enable each hard disk group to be in different data read-write states, and determining a first write-in data volume of each hard disk after preprocessing;
reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy, and acquiring a second written data volume of each hard disk after the reading and writing are completed;
and determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume to obtain a test result.
2. The write amplification factor testing method of claim 1, wherein initializing all solid state disks and dividing all solid state disks into a preset number of hard disk groups in a full configuration state of the solid state disks comprises:
performing cold start in a full configuration state of the solid state disks, and performing low-level formatting treatment on all the solid state disks after the solid state disks are started, so that each solid state disk is in a preset format;
after the low-level formatting process, unloading the original NVMe drivers and reloading the NVMe drivers;
and grouping all the solid state disks to obtain a first hard disk group, a second hard disk group and a third hard disk group.
3. The write amplification factor test method of claim 2, wherein the preprocessing is performed on each hard disk group respectively to make each hard disk group in different data read-write states, including:
respectively determining a write strategy corresponding to each hard disk group, wherein the write strategy comprises any one or a combination of any several of block size, queue depth, write times, write mode, write range and write time;
and respectively writing the hard disks in each hard disk group based on the write strategy so as to enable each hard disk group to be in different data read-write states.
4. The write amplification factor test method of claim 1, wherein the determining the first write data amount of each hard disk after preprocessing comprises:
after preprocessing of each hard disk is completed, determining the first host write data volume and the first memory write data volume of each hard disk.
5. The write amplification factor test method according to any one of claims 1 to 4, wherein the performing, based on a preset read-write strategy, read-write for a preset time period on each preprocessed hard disk, and acquiring a second write data volume of each hard disk after the read-write is completed, includes:
reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy, wherein the preset reading and writing strategy comprises any one or a combination of any several of a preset reading and writing proportion, a preset block size, a preset queue depth, a preset parallel mode and a writing mode;
and acquiring the write data volume of the second host and the write data volume of the second memory of each hard disk after the reading and writing are finished.
6. The write amplification factor test method of claim 5, wherein the determining the write amplification factor of each hard disk by combining the first write data amount and the second write data amount comprises:
determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume based on a coefficient calculation formula, wherein the coefficient calculation formula is as follows:
wherein, HW1Writing data volume, NW, for the first host1Writing data quantity, HW, to a first memory2Writing data volume, NW, for the second host2And WA is a write amplification factor for the second memory write data volume.
7. The write amplification factor test method of claim 6, wherein determining the write amplification factor of each hard disk by combining the first write data volume and the second write data volume to obtain a test result comprises:
determining the write amplification factor of each hard disk, and calculating the average write amplification factor of each hard disk group;
judging whether each write amplification factor is smaller than a first preset threshold value or not, and judging whether the difference value between the average write amplification factors of any two hard disk groups is smaller than a second preset threshold value or not;
and if so, judging that the performance test result of each hard disk is passed.
8. A write amplification factor test apparatus, comprising:
the hard disk initialization module is used for initializing all the solid state disks in a full configuration state of the solid state disks and dividing all the solid state disks into a preset number of hard disk groups;
the hard disk preprocessing module is used for respectively preprocessing each hard disk group to enable each hard disk group to be in different data read-write states and determine a first write-in data volume of each preprocessed hard disk;
the data reading and writing module is used for reading and writing each preprocessed hard disk for a preset time period based on a preset reading and writing strategy and acquiring a second written data volume of each hard disk after the reading and writing are finished;
and the coefficient determining module is used for determining the write amplification coefficient of each hard disk by combining the first write data volume and the second write data volume to obtain a test result.
9. An electronic device, comprising:
a memory for storing a computer program;
a processor for implementing the steps of the write amplification factor test method according to any one of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the steps of the write amplification factor test method according to any one of claims 1 to 7.
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