CN111490017A - Moisture-proof structure for optoelectronic device and preparation method thereof - Google Patents

Moisture-proof structure for optoelectronic device and preparation method thereof Download PDF

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CN111490017A
CN111490017A CN202010301019.5A CN202010301019A CN111490017A CN 111490017 A CN111490017 A CN 111490017A CN 202010301019 A CN202010301019 A CN 202010301019A CN 111490017 A CN111490017 A CN 111490017A
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moisture
proof
film
substrate
agent
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周殿力
张大勇
李嘉文
于军胜
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University of Electronic Science and Technology of China
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University of Electronic Science and Technology of China
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/564Details not otherwise provided for, e.g. protection against moisture
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings

Abstract

The invention discloses a moisture-proof structure for an optoelectronic device and a preparation method thereof, relating to the technical field of moisture-proof materials, the moisture-proof structure comprises a substrate and a moisture-proof film which are arranged from bottom to top, the total thickness of the moisture-proof film is not more than 10 mu m, and the raw materials of the moisture-proof film comprise the following components in percentage by weight: the moisture-proof and corrosion-resistant composite material is used for moisture protection and corrosion prevention of optoelectronic devices, and has the advantages that the porous structure of the protective agent can prevent the moisture-proof agent from being directly exposed to external extreme environments such as ultraviolet radiation and the like to cause the moisture-proof agent to lose activity, meanwhile, the characteristic that the moisture-proof agent can be simultaneously attached to the inner surface and the outer surface of the porous structure of the protective agent after being dried is utilized, the effective moisture-proof specific surface area is increased, and the moisture-proof effect is greatly improved.

Description

Moisture-proof structure for optoelectronic device and preparation method thereof
Technical Field
The invention relates to the technical field of moisture-proof materials, in particular to a moisture-proof structure for an optoelectronic device and a preparation method thereof.
Background
With the increasing requirements of the human society on production efficiency, the requirements on the aspects of light weight, convenience in carrying, flexibility, transparency and integration degree integration of electronic equipment are higher and higher. With the increasing development degree of light weight, portability, multifunction and the like of electronic products, materials, parts and components used by electronic equipment can generate environmental effects under various environmental conditions, so that the reliability of the equipment is reduced, and the service life of the equipment is prolonged. Particularly, with the high integration, high-density assembly and micro-electronics degree of electronic equipment and the amplification characteristic of electronic circuits, metal is slightly corroded, the influence on the electrical performance, the mechanical performance and the like of the whole equipment is more obvious and fatal, the development process of the whole industry of the electronic equipment is seriously influenced, and one of the most obvious factors influencing the corrosion degree of the metal is the humidity of the ambient environment. Therefore, the issue of moisture protection is urgently needed to be solved in the process of designing large-scale integrated circuits and packaging electronic devices.
Most common traditional moisture-proof products in the market at present are based on common organic molecules, but the organic moisture-proof molecules of the type have poor adhesive force, low thermal decomposition temperature and low solid content, and are difficult to form a stable and durable moisture-proof film, so that the requirements of the existing products on moisture-proof performance are difficult to meet, and in addition, the organic molecules are sensitive to ultraviolet radiation, and are unstable in structure under exposure to ultraviolet radiation, so that the moisture-proof service life is short. Meanwhile, as the great advantages of the porous silicon dioxide (SiO2) in terms of structure and waterproofness are beginning to be widely applied to the moisture-proof industry, the moisture-proof film made of various types of SiO2 materials which are used at present also improves the moisture resistance of electronic products to a certain extent. However, most solvents used by the existing SiO2 moisture-proof material are benzene-containing, so that the solvent has great harm to the environment and human health after volatilization, the requirements of the future industry on green, environment-friendly and sustainable preparation of electronic products are not met, the thickness of the SiO2 moisture-proof film is within several centimeters due to the limitation of the size of the material and the limitation of the preparation process of the SiO2 moisture-proof material film, and the thickness is unacceptable for the current integrated, portable and multifunctional electronic equipment or flexible equipment. Meanwhile, the SiO2 film is easily dispersed unevenly during the preparation process, which easily causes the occurrence of defect spots in the moisture-proof film, and it is necessary to spend a large amount of cost to solve the problem, which not only increases the cost of the electronic product, but also reduces the yield and efficiency of the product. The problems seriously restrict the application and popularization of the SiO2 moisture-proof material film in the industrialization of optoelectronic products.
Disclosure of Invention
The invention aims to: in order to solve the technical problems that most solvents used by the conventional SiO2 moisture-proof material contain benzene and SiO2 film is easy to disperse unevenly in the preparation process, so that the situation that dead spots exist in the moisture-proof film is easy to occur, the invention provides a moisture-proof structure for an optoelectronic device and a preparation method thereof.
The invention specifically adopts the following technical scheme for realizing the purpose:
a moisture-proof structure usable in an optoelectronic device, comprising a substrate and a moisture-proof film provided on the substrate, the moisture-proof film having a total thickness of not more than 10 μm, the moisture-proof film being made of a material comprising the following components in parts by weight: 60-40% of mixed solvent, 20-30% of moisture-proof agent and 20-30% of protective agent.
The mixed solvent comprises glycol, a polymeric polyelectrolyte type 731 dispersant, silane coupling agents YGO-1204 and an aqueous emulsion.
The moisture-proof agent is a lotus extract liquid and glycerin mixed liquid with a stable film structure.
The protective agent is nano-scale porous SiO2 particles using ethylene glycol as a solvent.
The substrate is a rigid substrate or a flexible substrate, the rigid substrate is glass or sapphire, and the flexible substrate is one of polymer films such as metal foil, polyethylene terephthalate, polymethyl methacrylate, polycarbonate, polyurethane, polyimide, vinyl chloride-vinyl acetate resin or polyacrylic acid.
A method for preparing a moisture-proof structure for an optoelectronic device is characterized by comprising the following steps: the method comprises the following steps:
step 1, cleaning an optoelectronic device or a surface substrate to be sprayed, drying the cleaned optoelectronic device by dry nitrogen, and then performing oxygen plasma bombardment treatment to ensure good adhesion with a film;
step 2, preparing a raw material mixed solution of the moisture-proof film on the surface of the substrate treated in the step 1 by adopting any one of a roller coating method, an L B film method, a drop coating method, a spraying method, a pulling method, an ink-jet printing method or a screen printing method;
and 3, drying the film obtained in the step 2 to obtain the moisture-proof structure film for the optoelectronic device.
The invention has the following beneficial effects:
1. the invention utilizes the porous structure of the protective agent to avoid the loss of activity of the moisture-proof agent caused by the fact that the moisture-proof agent is directly exposed to external extreme environments such as ultraviolet irradiation and the like, and simultaneously utilizes the characteristic that the moisture-proof agent can be simultaneously attached to the inner surface and the outer surface of the porous structure of the protective agent after being dried, thereby increasing the effective moisture-proof specific surface area and greatly improving the moisture-proof effect; the preparation process is simple, and the micron-level film can be prepared, so that the magnitude of the thickness of the moisture-proof film is greatly reduced, and the market demand of industrialization can be met.
2. The nano-scale porous SiO2 added with glycol as the solvent has a porous structure, the solvent is green and environment-friendly, the film is flexible, and the porous structure can be used for increasing the effective specific surface area after the nano-scale porous SiO2 is mixed with the heat dissipating agent, sprayed and dried, so that the distribution range and the number of moisture-proof molecules can be effectively increased, and the moisture-proof efficiency is improved;
3. the selected protective agent nano-scale porous SiO2 has a three-dimensional porous structure and high heat resistance, can effectively prevent the damage of ultraviolet radiation and external high-temperature environment to the internal moisture-proof agent, and prolongs the service life of the moisture-proof agent;
4. the heat dissipating agent distributed among the protective agents is natural lotus extract dissolved in glycerin, has the characteristics of environmental protection and no toxicity, does not need to use benzene-containing or toxic solvents, and avoids the pollution to the environment and the damage to the health of users.
Drawings
FIG. 1 is a schematic view of a moisture barrier construction that may be used in an optoelectronic device;
reference numerals: 1-substrate, 2-moisture-proof film, a-mixed solvent, b-protective agent and c-moisture-proof agent.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention.
A moisture-proof structure usable in an optoelectronic device, comprising a substrate and a moisture-proof film provided on the substrate, the moisture-proof film having a total thickness of not more than 10 μm, the moisture-proof film being made of a material comprising the following components in parts by weight: 60-40% of mixed solvent, 20-30% of moisture-proof agent and 20-30% of protective agent.
The mixed solvent comprises glycol, a polymeric polyelectrolyte type 731 dispersant, silane coupling agents YGO-1204 and an aqueous emulsion.
The moisture-proof agent is a lotus extract liquid and glycerin mixed liquid with a stable film structure.
The protective agent is nano-scale porous SiO2 particles using ethylene glycol as a solvent.
The substrate is a rigid substrate or a flexible substrate, the rigid substrate is glass or sapphire, and the flexible substrate is one of polymer films such as metal foil, polyethylene terephthalate, polymethyl methacrylate, polycarbonate, polyurethane, polyimide, vinyl chloride-vinyl acetate resin or polyacrylic acid.
Example 1
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 1 and a moisture-proof film 2 arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 60% of mixed solvent, 20% of moisture-proof agent and 20% of protective agent;
the mixed solvent is glycol, polyelectrolyte type 731 dispersant, silane coupling agent YGO-1204 and water-based emulsion, and the moisture-proof agent is L B adopting roller coatingThe lotus extract and glycerin mixed solution has a stable film structure after being treated by any one of a film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a screen printing method, and has large contact area and green environmental protection characteristics, and the protective agent is nano-scale porous SiO liquid using ethylene glycol as a solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Example 2
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 4 and a moisture-proof film arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 50% of mixed solvent, 20% of moisture-proof agent and 30% of protective agent;
the mixed solvent is glycol, a macromolecular polyelectrolyte type 731 dispersant, a silane coupling agent YGO-1204 and a water-based emulsion, the moisture-proof agent is a lotus extract and glycerin mixed solution which has a stable film structure and large contact area and green and environment-friendly characteristics and is processed by any one of a roller coating method, a L B film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a screen printing method, and the protective agent is nano-scale porous SiO using the glycol as the solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Example 3
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 4 and a moisture-proof film arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 50% of mixed solvent, 30% of moisture-proof agent and 20% of protective agent;
the mixed solvent is glycol, a macromolecular polyelectrolyte type 731 dispersant, a silane coupling agent YGO-1204 and a water-based emulsion, the moisture-proof agent is a lotus extract and glycerin mixed solution which has a stable film structure and large contact area and green and environment-friendly characteristics and is processed by any one of a roller coating method, a L B film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a screen printing method, and the protective agent is nano-scale porous SiO using the glycol as the solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Example 4
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 4 and a moisture-proof film arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 50% of mixed solvent, 26% of moisture-proof agent and 24% of protective agent;
the mixed solvent is glycol, a macromolecular polyelectrolyte type 731 dispersant, a silane coupling agent YGO-1204 and a water-based emulsion, the moisture-proof agent is a lotus extract and glycerin mixed solution which has a stable film structure and large contact area and green and environment-friendly characteristics and is processed by any one of a roller coating method, a L B film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a screen printing method, and the protective agent is nano-scale porous SiO using the glycol as the solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Example 5
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 4 and a moisture-proof film arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 50% of mixed solvent, 22% of moisture-proof agent and 28% of protective agent;
the mixed solvent is glycol, a macromolecular polyelectrolyte type 731 dispersant, a silane coupling agent YGO-1204 and a water-based emulsion, the moisture-proof agent is a lotus extract and glycerin mixed solution which has a stable film structure and large contact area and green and environment-friendly characteristics and is processed by any one of a roller coating method, a L B film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a screen printing method, and the protective agent is nano-scale porous SiO using the glycol as the solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Example 6
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 4 and a moisture-proof film arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 50% of mixed solvent, 36% of moisture-proof agent and 24% of protective agent;
the mixed solvent is glycol, a polymeric polyelectrolyte type 731 dispersant, a silane coupling agent YGO-1204 and a water-based emulsion, and the moisture-proof agent is prepared by adopting a roll coating method, a L B film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a silk-screen printing methodThe lotus extract and glycerin mixed solution which is treated by any one method and has stable film structure, larger contact area and green environmental protection characteristic is brushed, and the protective agent is nano-scale porous SiO with glycol as solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Example 7
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 4 and a moisture-proof film arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 50% of mixed solvent, 22% of moisture-proof agent and 38% of protective agent;
the mixed solvent is glycol, a macromolecular polyelectrolyte type 731 dispersant, a silane coupling agent YGO-1204 and a water-based emulsion, the moisture-proof agent is a lotus extract and glycerin mixed solution which has a stable film structure and large contact area and green and environment-friendly characteristics and is processed by any one of a roller coating method, a L B film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a screen printing method, and the protective agent is nano-scale porous SiO using the glycol as the solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Example 8
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 4 and a moisture-proof film arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 50% of mixed solvent, 32% of moisture-proof agent and 28% of protective agent;
the mixed solvent is glycol, a macromolecular polyelectrolyte type 731 dispersant, a silane coupling agent YGO-1204 and a water-based emulsion, the moisture-proof agent is a lotus extract and glycerin mixed solution which has a stable film structure and large contact area and green and environment-friendly characteristics and is processed by any one of a roller coating method, a L B film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a screen printing method, and the protective agent is nano-scale porous SiO using the glycol as the solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Example 9
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 4 and a moisture-proof film arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 50% of mixed solvent, 25% of moisture-proof agent and 25% of protective agent;
the mixed solvent is glycol, a macromolecular polyelectrolyte type 731 dispersant, a silane coupling agent YGO-1204 and a water-based emulsion, the moisture-proof agent is a lotus extract and glycerin mixed solution which has a stable film structure and large contact area and green and environment-friendly characteristics and is processed by any one of a roller coating method, a L B film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a screen printing method, and the protective agent is nano-scale porous SiO using the glycol as the solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Example 10
As shown in fig. 1, a moisture-proof structure for optoelectronic devices comprises a substrate 4 and a moisture-proof film arranged from bottom to top, wherein the total thickness of the moisture-proof film is 10 μm, and the moisture-proof film comprises the following raw materials in percentage by weight: 40% of mixed solvent, 30% of moisture-proof agent and 30% of protective agent;
the mixed solvent is glycol, a macromolecular polyelectrolyte type 731 dispersant, a silane coupling agent YGO-1204 and a water-based emulsion, the moisture-proof agent is a lotus extract and glycerin mixed solution which has a stable film structure and large contact area and green and environment-friendly characteristics and is processed by any one of a roller coating method, a L B film method, a blade coating method, a spin coating method, a drop coating method, a spray coating method, a pulling method, a tape casting method, a dip coating method, an ink-jet printing method, a self-assembly method or a screen printing method, and the protective agent is nano-scale porous SiO using the glycol as the solvent2And (3) granules.
The preparation method comprises the following steps:
step 1, cleaning a photoelectronic device or a surface substrate to be sprayed, respectively carrying out ultrasonic cleaning by using a detergent, acetone, deionized water and isopropanol, drying by using dry nitrogen after cleaning, and then carrying out oxygen plasma bombardment treatment to ensure that the photoelectronic device or the surface substrate has good adhesiveness with a film;
step 2, spraying the moisture-proof film raw material mixed solution with the concentration of 2mg/ml on the surface of the substrate treated in the step 1 by adopting a spraying method, wherein the spraying speed is 500 mu L/min;
step 3, drying the film obtained in the step 2 at 80 ℃ for 5min to obtain the moisture-proof film for the optoelectronic device;
and 4, carrying out moisture resistance test on the film obtained in the step 3.
Table 1 shows the comparison of the corrosion degree (%) of the pure optoelectronic device and the optoelectronic device coated with the moisture-proof film of examples 1-10 under the same initial humidity and temperature conditions at different time intervals.
TABLE 1
Figure BDA0002453987470000091
Figure BDA0002453987470000101

Claims (6)

1. A moisture barrier structure useful in optoelectronic devices, comprising: the moisture-proof film comprises a substrate and a moisture-proof film, wherein the substrate and the moisture-proof film are arranged from bottom to top, the total thickness of the moisture-proof film is not more than 10 mu m, and raw materials of the moisture-proof film comprise the following components in percentage by weight: 60-40% of mixed solvent, 20-30% of moisture-proof agent and 20-30% of protective agent.
2. The moisture barrier structure useful in optoelectronic devices of claim 1, wherein: the mixed solvent comprises glycol, a polymeric polyelectrolyte type 731 dispersant, silane coupling agents YGO-1204 and an aqueous emulsion.
3. The moisture barrier structure useful in optoelectronic devices of claim 1, wherein: the moisture-proof agent is a lotus extract liquid and glycerin mixed liquid with a stable film structure.
4. The moisture barrier structure useful in optoelectronic devices of claim 1, wherein: the protective agent is nano-scale porous SiO2 particles using ethylene glycol as a solvent.
5. The moisture barrier structure useful in optoelectronic devices of claim 1, wherein: the substrate is a rigid substrate or a flexible substrate, the rigid substrate is glass or sapphire, and the flexible substrate is one of metal foil, polyethylene terephthalate, polymethyl methacrylate, polycarbonate, polyurethane, polyimide, vinyl chloride-vinyl acetate resin or polyacrylic acid polymer film.
6. A method for preparing a moisture-proof structure for an optoelectronic device is characterized by comprising the following steps: the method comprises the following steps:
step 1, cleaning an optoelectronic device or a surface substrate to be sprayed, drying the cleaned optoelectronic device by dry nitrogen, and then performing oxygen plasma bombardment treatment to ensure good adhesion with a film;
step 2, preparing a raw material mixed solution of the moisture-proof film on the surface of the substrate treated in the step 1 by adopting any one of a roller coating method, an L B film method, a drop coating method, a spraying method, a pulling method, an ink-jet printing method or a screen printing method;
and 3, drying the film obtained in the step 2 to obtain the moisture-proof structure film for the optoelectronic device.
CN202010301019.5A 2020-04-16 2020-04-16 Moisture-proof structure for optoelectronic device and preparation method thereof Pending CN111490017A (en)

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CN112509985A (en) * 2020-12-14 2021-03-16 电子科技大学 Moisture-proof structure for optoelectronic device and preparation method thereof
CN112599422A (en) * 2020-12-14 2021-04-02 电子科技大学 High heat-resistant structure for heat dissipation of photoelectronic device and preparation method thereof

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CN112599422A (en) * 2020-12-14 2021-04-02 电子科技大学 High heat-resistant structure for heat dissipation of photoelectronic device and preparation method thereof

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