CN111487447A - Digital oscilloscope for realizing rapid measurement - Google Patents
Digital oscilloscope for realizing rapid measurement Download PDFInfo
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- CN111487447A CN111487447A CN202010387269.5A CN202010387269A CN111487447A CN 111487447 A CN111487447 A CN 111487447A CN 202010387269 A CN202010387269 A CN 202010387269A CN 111487447 A CN111487447 A CN 111487447A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R19/2503—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques for measuring voltage only, e.g. digital volt meters (DVM's)
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Abstract
The application discloses realize digital oscilloscope of quick measurement, including memory, treater, measurement preprocessing circuit and display. The measurement preprocessing circuit compares a measured signal with three preset voltages to obtain three pulse signals according to a comparison result, monitors high-low level information of the three pulse signals, obtains edge type information according to the monitoring result, sequences the edge type information according to an obtaining sequence of the edge type information, and finally obtains sequence number information of a rising edge and sequence number information of a falling edge of the measured signal from the sequenced edge type information to serve as preprocessing data of the measured signal. Because the preprocessed data only comprise the edge type information and the serial number information corresponding to the edge type information, when the parameters of the detected signal are calculated, the calculated amount is greatly reduced, and the digital oscilloscope can measure more preprocessed data under the condition of occupying the same memory and calculate the parameters of the period and the like of the detected signal more quickly and accurately.
Description
Technical Field
The invention belongs to the technical field of digital oscilloscopes, and particularly relates to a digital oscilloscope for realizing rapid measurement.
Background
With the development of the modern test and measurement field, in order to cope with the increasingly complex design of electronic products, monitoring equipment is required to develop towards high bandwidth, high sampling rate and high storage depth, and a digital oscilloscope serving as a widely-used general electronic measurement instrument measures the amplitude, period, pulse width, duty ratio and the like of various electric signals, has the advantages of being accurate in measurement, simple and convenient to maintain, flexible to use, high in reliability, good in stability and the like, and is widely applied to multiple industries. In the present stage, the digital oscilloscope is basically measured by software, and original data acquired by the digital oscilloscope need to be read from a storage into an internal memory, and then the original data is processed according to the measurement requirement so as to acquire and display relevant parameters of a measured signal. In practical application, the digital oscilloscope collects more and more original data, so that the digital oscilloscope has higher and higher requirements on the memory capacity of the processor, the more the memory capacity is, the more the processed original data is, and the more accurate the measurement parameters of the measured signal are obtained. Under the condition that the memory capacity of the digital oscilloscope is not changed, the technical problem to be solved urgently is to improve the measurement speed of the digital oscilloscope.
Disclosure of Invention
The invention discloses a digital oscilloscope for realizing rapid measurement, which is used for improving the measurement speed of the digital oscilloscope for measuring the measured signal parameters.
According to a first aspect, there is provided in one embodiment a digital oscilloscope for enabling fast measurements, comprising:
the memory is used for storing original data acquired by acquiring a detected signal through an acquisition circuit of the digital oscilloscope;
the processor is used for reading the original data from the memory so as to obtain the tested signal according to the original data;
the measurement preprocessing circuit is used for preprocessing the measured signal to acquire preprocessed data; the measurement preprocessing circuit comprises a level comparison circuit, an edge detection circuit, an edge position calculation circuit and an edge position acquisition circuit; the level comparison circuit is used for comparing the detected signal with three preset voltage signals respectively and outputting three pulse signals respectively according to the comparison result; the edge detection circuit is used for respectively monitoring high and low level information of the three pulse signals and acquiring edge type information according to the high and low level information of the three pulse signals; the edge type information comprises rising edge information, falling edge information and no edge information of the detected signal; the edge position calculating circuit is used for sequencing the sequentially acquired edge type information; the edge position acquisition circuit is used for acquiring rising edge information of the detected signal, serial number information corresponding to the rising edge information, falling edge information and serial number information corresponding to the falling edge information from the sequenced edge type information to serve as the preprocessed data to be output; the processor is also used for acquiring the parameter information of the detected signal according to the preprocessing data;
and the display is used for displaying the parameter information of the detected signal.
Furthermore, the measurement preprocessing circuit also comprises a signal preprocessing device and a preset voltage acquisition device; the signal preprocessing device is used for acquiring voltage histogram information of the detected signal so as to acquire the maximum voltage amplitude, the minimum voltage amplitude and/or probability information of each voltage amplitude of the detected signal according to the histogram information;
the preset voltage acquisition device is used for acquiring three preset voltages according to the maximum voltage amplitude, the minimum voltage amplitude and/or probability information of each voltage amplitude of the detected signal.
Further, the preset voltage acquisition device is used for comparing the voltage amplitude of the detected signal with a first preset value and a second preset value respectively, and averaging the voltage amplitude smaller than the first preset value and averaging the voltage amplitude larger than the second preset value to acquire a Vbase value and a Vtop value; wherein Vbase is the average value of the voltage amplitude of the detected signal smaller than the first preset value, and Vtop is the average value of the voltage amplitude of the detected signal larger than the second preset value;
the preset voltage obtaining device obtains the preset voltage according to the following formula:
VL=Vbase+(Vtop-Vbase)/10
VM=(Vbase+ Vtop)/2
VH=Vbase+9*( Vtop-Vbase)/10,
wherein V L is a first preset voltage, VM is a second preset voltage, VH is a third preset voltage, Vbase is an average value of the voltage amplitude of the detected signal smaller than the first preset value, and Vtop is an average value of the voltage amplitude of the detected signal larger than the second preset value.
Further, the first preset value is 40% of a peak-to-peak voltage value of the detected signal; and/or the second preset value is 60% of the peak-to-peak voltage value of the detected signal.
Further, the edge detection circuit acquires edge type information according to high and low level information of the three pulse signals, and includes:
the edge detection circuit acquires the rising and falling edge information of the three pulse signals according to the high and low level information of the three pulse signals respectively, and combines the rising and falling edge information of the three pulse signals to acquire the edge type information.
Further, the rising and falling edge information of the pulse signal comprises binary numbers of two bits.
Further, the information of the rising and falling edges of the pulse signal comprises:
when the high-low level information of the pulse signal keeps low level, the rising and falling edge information of the pulse signal is 00;
when the high-low level information of the pulse signal keeps high level, the rising and falling edge information of the pulse signal is 11;
when the high-low level information of the pulse signal is changed from low level to high level, the rising and falling edge information of the pulse signal is 01;
when the high-low level information of the pulse signal changes from high level to low level, the rising and falling edge information of the pulse signal is 10.
Further, the edge type information includes a four-bit binary number.
Further, the lifting edge information of the three pulse signals comprises first lifting edge information, second lifting edge information and third lifting edge information;
the first lifting edge information is obtained according to a pulse signal obtained by comparing the detected signal with the first preset voltage; the second lifting edge information is obtained according to a pulse signal obtained by comparing the detected signal with the second preset voltage; the third lifting edge information is obtained according to a pulse signal obtained by comparing the measured signal with the third preset voltage;
combining rising and falling edge information of three pulse signals to acquire the edge type information comprises:
when the first lifting edge information is 10, and the second lifting edge information and the third lifting edge information are both 00 or 11, the edge type information is 0001;
when the first lifting edge information is 01, and the second lifting edge information and the third lifting edge information are both 00 or 11, the edge type information is 0010;
when the second lifting edge information is 10 and the first lifting edge information and the third lifting edge information are both 00 or 11, the edge type information is 0011;
when the second lifting edge information is 01, and the first lifting edge information and the third lifting edge information are both 00 or 11, the edge type information is 0100;
when the third lifting edge information is 10 and the first lifting edge information and the second lifting edge information are both 00 or 11, the edge type information is 0101;
when the third lifting edge information is 01 and the first lifting edge information and the second lifting edge information are both 00 or 11, the edge type information is 0110;
when the first lifting edge information and the second lifting edge information are both 10 and the third lifting edge information is 00 or 11, the edge type information is 1001;
when the first lifting edge information and the second lifting edge information are both 01 and the third lifting edge information is 00 or 11, the edge type information is 1010;
when the second lifting edge information and the third lifting edge information are both 10 and the first lifting edge information is 00 or 11, the edge type information is 1011;
when the second lifting edge information and the third lifting edge information are both 01 and the first lifting edge information is 00 or 11, the edge type information is 1100;
when the first lifting edge information, the second lifting edge information and the third lifting edge information are all 10, the edge type information is 1101;
when the first lifting edge information, the second lifting edge information and the third lifting edge information are all 01, the edge type information is 1110;
when the first lifting edge information, the second lifting edge information and the third lifting edge information are all 00 or 11, the edge type information is 0000.
Further, the processor is further configured to obtain a period of the signal to be measured according to the preprocessing data and a sampling frequency at which a signal to be measured is acquired by an acquisition circuit of the digital oscilloscope.
The digital oscilloscope for realizing the rapid measurement according to the embodiment comprises a memory, a processor, a measurement preprocessing circuit and a display. The memory is used for storing raw data, the processor is used for reading the raw data and obtaining a measured signal, and the measurement preprocessing circuit is used for preprocessing the measured signal to obtain preprocessed data. The measuring preprocessing circuit comprises a level comparison circuit, an edge detection circuit, an edge position calculation circuit and an edge position acquisition circuit, wherein the level comparison circuit compares a measured signal with three preset voltages, the edge detection circuit acquires three pulse signals according to comparison results respectively, then monitors high and low level information of the three pulse signals, acquires edge type information according to the monitoring results, meanwhile, the edge position calculation circuit sorts the edge type information according to the acquisition sequence of the edge type information, and finally, the edge position acquisition circuit acquires rising edge information of the measured signal, sequence number information corresponding to the rising edge information, sequence number information corresponding to the falling edge information and sequence number information corresponding to the falling edge information from the sorted edge type information to serve as preprocessing data and output the preprocessing data. The processor acquires the parameter information of the detected signal according to the pre-processing data and displays the parameter information through the display. When the digital oscilloscope is used for calculating the parameters of the measured signal, the processor only needs to process the edge type information and the serial number information corresponding to the edge type information in the preprocessed data, so that the calculated amount is greatly reduced, and the processor can process more preprocessed data under the condition of occupying the same memory so as to calculate more, faster and more accurate parameters such as the period of the measured signal.
Drawings
FIG. 1 is a flow chart of a method for measuring a period of a signal under test by a digital oscilloscope;
FIG. 2 is a schematic diagram of a threshold for periodic measurement of a signal under test;
FIG. 3 is a block diagram of a digital oscilloscope in one embodiment;
FIG. 4 is a statistical representation of the measured signal amplitude in one embodiment;
FIG. 5 is a schematic diagram illustrating an embodiment of obtaining information of a rising and falling edge of a pulse signal;
FIG. 6 is a diagram illustrating edge type information acquisition in one embodiment;
FIG. 7 is a schematic diagram of a cycle measurement process of the digital oscilloscope in one embodiment.
Detailed Description
The present invention will be described in further detail with reference to the following detailed description and accompanying drawings. Wherein like elements in different embodiments are numbered with like associated elements. In the following description, numerous details are set forth in order to provide a better understanding of the present application. However, those skilled in the art will readily recognize that some of the features may be omitted or replaced with other elements, materials, methods in different instances. In some instances, certain operations related to the present application have not been shown or described in detail in order to avoid obscuring the core of the present application from excessive description, and it is not necessary for those skilled in the art to describe these operations in detail, so that they may be fully understood from the description in the specification and the general knowledge in the art.
Furthermore, the features, operations, or characteristics described in the specification may be combined in any suitable manner to form various embodiments. Also, the various steps or actions in the method descriptions may be transposed or transposed in order, as will be apparent to one of ordinary skill in the art. Thus, the various sequences in the specification and drawings are for the purpose of describing certain embodiments only and are not intended to imply a required sequence unless otherwise indicated where such sequence must be followed.
The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings).
The processor of the digital oscilloscope reads original data acquired by the acquisition circuit from the memory, temporarily stores the original data in the memory, adjusts the original data in the horizontal direction in order to ensure that the data for measurement is aligned with the waveform displayed on the display screen, calculates the adjusted original data to acquire parameter information of a measured signal, and finally displays the calculation result through the display. The original data is measured by a software method, please refer to fig. 1, which is a flow chart of a method for measuring the period of a measured signal by a digital oscilloscope, and the method is described below by taking the period measurement of the measured signal as an example:
step 101, a processor of a digital oscilloscope reads original data from a memory and temporarily stores the original data in a memory;
step 102, calculating reference values Vbase and Vtop of the original data through a processor, wherein the Vbase is an average value of the voltage amplitude of the detected signal smaller than a first preset value, and the Vtop is an average value of the voltage amplitude of the detected signal larger than a second preset value. The method specifically comprises the steps of counting amplitude information of original data of a detected signal to obtain a maximum amplitude, a minimum amplitude and an amplitude peak-to-peak value, then carrying out statistical analysis on amplitude data which are more than 60% of the peak-to-peak value to obtain an average value which is Vtop, and then carrying out statistical analysis on amplitude data which are less than 40% of the peak-to-peak value to obtain an average value which is a Vbase value;
and 103, acquiring a preset threshold voltage according to the Vbase value and the Vtop value. The threshold voltage is typically set at 10%, 50% and 90% of the amplitude of the signal being measured. Please refer to fig. 2, which is a schematic diagram of a threshold of a periodic measurement of a signal under test, wherein:
VL=Vbase+(Vtop-Vbase)/10
VM=(Vbase+ Vtop)/2
VH=Vbase+9*( Vtop-Vbase)/10；
104, according to the amplitude and V of the original dataL/ VM/ VHAnd finding the abscissa of the rising edge or the falling edge which meets the condition. For example, when 3 threshold voltages are crossed simultaneously, recording abscissa information of a rising edge or a falling edge of original data;
105, acquiring the period of the detected signal according to the abscissa information of the adjacent rising edges or falling edges, namely multiplying the difference of the abscissas of the two adjacent rising edges or falling edges by the sampling period to obtain the period value of the detected signal;
the parameter information of the measured signal measured by adopting the method has the defects that a large amount of memory is occupied, the storage depth of the digital oscilloscope at the present stage is hundreds of megabytes, some special measurement items also need to read the data of a plurality of channels of the digital oscilloscope, the data volume is multiplied, and the memory resource is inevitably tense. In order to reduce the data volume of the preprocessed data to optimize and save the memory, the preprocessed data is firstly compressed in the measurement method, which can cause the loss of the measurement precision; secondly, the measurement needs to count and compare a large amount of data, and search for effective rising edge or falling edge information, and if the measurement is completely processed by software, the time consumption is very serious, so that most oscilloscope manufacturers currently adopt a processing method of only measuring the searched first period or pulse width or selectively measuring the period or pulse width near the trigger point, which brings about a problem that the measured value cannot reflect the real situation of the acquired data, such as a plurality of different period values in the acquired waveform, and if only one period value is measured, the measurement result is obviously unreasonable.
In an embodiment of the present application, a digital oscilloscope includes a measurement preprocessing circuit, a memory, a processor, and a display. The measuring preprocessing circuit comprises a level comparison circuit, an edge detection circuit, an edge position calculation circuit and an edge position acquisition circuit, wherein the level comparison circuit compares a measured signal with three preset voltages, the edge detection circuit acquires three pulse signals according to comparison results respectively, then monitors high and low level information of the three pulse signals, acquires edge type information according to the monitoring results, meanwhile, the edge position calculation circuit sorts the edge type information according to the acquisition sequence of the edge type information, and finally, the edge position acquisition circuit acquires sequence number information of a rising edge and sequence number information of a falling edge of the measured signal from the sorted edge type information to serve as preprocessing data and output the preprocessing data. The memory stores the pre-processing data, and the processor reads the pre-processing data from the memory, acquires the parameter information of the detected signal according to the pre-processing data and displays the parameter information through the display. Because the digital oscilloscope only stores the sequence number information of the rising edge and the sequence number information of the falling edge of the measured signal, the data capacity of the measured signal is greatly reduced, the processor can measure more original data by occupying the same memory, the processing speed of the processor on the preprocessed data is higher, and the parameters of the period and the like of the measured signal can be calculated more quickly and accurately.
Example one
Referring to fig. 3, a block diagram of a digital oscilloscope according to an embodiment of the present invention includes a measurement preprocessing circuit 10, a memory 20, a processor 30, and a display 40. The memory 20 is used for storing original data acquired by acquiring a signal to be tested through an acquisition circuit of the digital oscilloscope, the processor 30 is used for reading the original data from the memory 20 and acquiring the signal to be tested according to the original data, the measurement preprocessing circuit 10 is used for preprocessing the signal to be tested to acquire preprocessed data, and the display 40 is used for displaying parameter information of the signal to be tested. The measurement preprocessing circuit 10 includes a level comparison circuit 11, an edge detection circuit 12, an edge position calculation circuit 13, and an edge position acquisition circuit 14. The level comparison circuit 11 is configured to compare the signal to be detected with three preset voltage signals, and output three pulse signals according to the comparison result. The edge detection circuit 12 is configured to monitor high and low level information of the three pulse signals, respectively, and obtain edge type information according to the high and low level information of the three pulse signals, where the edge type information includes rising edge information, falling edge information, and no edge information of a signal to be detected. The edge position calculation circuit 14 is used to order the sequentially acquired edge type information. The edge position obtaining circuit 14 is configured to obtain, from the sorted edge type information, rising edge information of the signal under test, sequence number information corresponding to the rising edge information, sequence number information corresponding to the falling edge information, and sequence number information corresponding to the falling edge information, so as to output the signal under test as preprocessed data. The processor 30 is further configured to obtain parameter information of the measured signal according to the pre-processed data.
In an embodiment, the measurement preprocessing circuit 10 further includes a signal preprocessing device 15 and a preset voltage obtaining device 16, where the signal preprocessing device 15 is configured to obtain voltage histogram information of the measured signal, so as to obtain a maximum voltage amplitude, a minimum voltage amplitude, and/or probability information of occurrence of each voltage amplitude of the measured signal according to the histogram information of the measured signal. The preset voltage obtaining device 16 is configured to obtain three preset voltages according to the maximum voltage amplitude, the minimum voltage amplitude and/or probability information of occurrence of each voltage amplitude of the detected signal. The preset voltage obtaining device 16 is configured to compare the voltage amplitude of the detected signal with a first preset value and a second preset value, and average the voltage amplitude smaller than the first preset value and average the voltage amplitude larger than the second preset value to obtain a Vbase value and a Vtop value, where Vbase is an average value of the voltage amplitude of the detected signal smaller than the first preset value, and Vtop is an average value of the voltage amplitude of the detected signal larger than the second preset value. The preset voltage obtaining device obtains three preset voltages according to the following formula:
VL=Vbase+(Vtop-Vbase)/10
VM=(Vbase+ Vtop)/2
VH=Vbase+9*( Vtop-Vbase)/10,
wherein, VLIs a first predetermined voltage, VMIs a second predetermined voltage, VHAnd for a third preset voltage, Vbase is the average value of the voltage amplitude of the detected signal smaller than the first preset value, and Vtop is the average value of the voltage amplitude of the detected signal larger than the second preset value. Referring to fig. 4, a statistical diagram of the measured signal amplitude is shown in an embodiment, where the first preset value and the second preset value are set according to a peak-to-peak value of the measured signal, and the peak-to-peak value is a difference between a maximum value and a minimum value of the measured signal amplitude. In one embodiment, the first predetermined value is 40% of the peak-to-peak voltage value of the signal under test, and the second predetermined value is 60% of the peak-to-peak voltage value of the signal under test. Wherein Vtop is the average value of the voltage amplitude of the measured signal being greater than 60% of the voltage peak-to-peak value of the measured signal, and Vbase is the average value of the voltage amplitude of the measured signal being less than 40% of the voltage peak-to-peak value of the measured signal.
In one embodiment, the edge detection circuit obtains the edge type information according to the high and low level information of the three pulse signals, and the edge detection circuit obtains the rising and falling edge information of the three pulse signals according to the high and low level information of the three pulse signals, and then combines the rising and falling edge information of the three pulse signals to obtain the edge type information. Referring to fig. 5, a schematic diagram of obtaining information of a rising and falling edge of a pulse signal in an embodiment is shown, where an amplitude of a signal to be measured is compared with a preset voltage to output a pulse signal, and when the amplitude of the signal to be measured is greater than the preset voltage, a high level of the pulse signal is marked as 1, otherwise, a low level of the pulse signal is marked as 0. The lifting edge information of the set pulse signal comprises binary digits of two bits, and the lifting edge information specifically comprises:
when the high-low level information of the pulse signal keeps low level, the rising and falling edge information of the pulse signal is 00;
when the high-low level information of the pulse signal keeps high level, the rising and falling edge information of the pulse signal is 11;
when the high-low level information of the pulse signal is changed from low level to high level, the rising and falling edge information of the pulse signal is 01, namely rising edge;
when the high-low level information of the pulse signal changes from high level to low level, the rising and falling edge information of the pulse signal is 10, i.e. the falling edge.
Please refer to fig. 6, which is a schematic diagram illustrating edge type information acquisition in an embodiment, wherein VLIs a first predetermined voltage, VMIs a second predetermined voltage, VHThe third preset voltage is 90%, 50% and 10% of the peak-to-peak value of the measured signal. The method comprises the steps of comparing a measured signal with three preset voltages respectively, outputting a pulse signal and a corresponding data enable signal en, and then obtaining edge type information according to high-low level information of the three pulse signals, wherein the lifting edge information of the three pulse signals comprises first lifting edge information, second lifting edge information and third lifting edge information, the first lifting edge information is obtained according to the pulse signal obtained by comparing the measured signal with the first preset voltage, the second lifting edge information is obtained according to the pulse signal obtained by comparing the measured signal with the second preset voltage, and the third lifting edge information is obtained according to the pulse signal obtained by comparing the measured signal with the third preset voltage.
Setting the edge type information to include a four-bit binary number, and combining the rising and falling edge information of the three pulse signals to acquire the edge type information includes:
when the first rising and falling edge information is 10 and the second rising and falling edge information and the third rising and falling edge information are both 00 or 11, the edge type information is 0001. When the first rising and falling edge information is 01, and the second rising and falling edge information and the third rising and falling edge information are both 00 or 11, the edge type information is 0010. When the second rising and falling edge information is 10 and the first and third rising and falling edge information are both 00 or 11, the edge type information is 0011. When the second rising and falling edge information is 01, and the first and third rising and falling edge information are both 00 or 11, the edge type information is 0100. When the third lifting edge information is 10 and the first lifting edge information and the second lifting edge information are both 00 or 11, the edge type information is 0101. When the third rising and falling edge information is 01 and both the first rising and falling edge information and the second rising and falling edge information are 00 or 11, the edge type information is 0110.
When the first rising and falling edge information and the second rising and falling edge information are both 10 and the third rising and falling edge information is 00 or 11, the edge type information is 1001. When the first lifting edge information and the second lifting edge information are both 01 and the third lifting edge information is 00 or 11, the edge type information is 1010. When the second rising and falling edge information and the third rising and falling edge information are both 10 and the first rising and falling edge information is 00 or 11, the edge type information is 1011. When the second rising and falling edge information and the third rising and falling edge information are both 01 and the first rising and falling edge information is 00 or 11, the edge type information is 1100. When the first rising and falling edge information, the second rising and falling edge information, and the third rising and falling edge information are all 10, the edge type information is 1101. When the first rising and falling edge information, the second rising and falling edge information, and the third rising and falling edge information are all 01, the edge type information is 1110.
When the first rising and falling edge information, the second rising and falling edge information, and the third rising and falling edge information are all 00 or 01, the edge type information is 0000.
In an embodiment of the application, the measurement preprocessing circuit includes a programmable logic device, and the edge type information is sequentially acquired and is sorted according to the acquisition order. In an embodiment, the preprocessing circuit processes 10 pulses per clock, and the high-low level information of the pulse signal obtained after comparing with the preset voltage is also 10 pulses obtained per clock cycle, that is, 10 sequence numbers are added to the sequence ordered per clock cycle. In this embodiment, the processor of the digital oscilloscope may further obtain the period of the signal to be measured according to the pre-processing data and the sampling frequency of the signal to be measured acquired by the acquisition circuit of the digital oscilloscope. Because the preprocessed data comprises the rising edge information of the tested signal, the serial number information corresponding to the rising edge information, the falling edge information and the serial number information corresponding to the falling edge information, when the acquisition rate of the edge type information is known, the period of the tested signal can be converted quickly.
Referring to fig. 7, a schematic diagram of a cycle measurement process of the digital oscilloscope in the embodiment is shown, including:
step 201, obtaining voltage histogram information of the detected signal, so as to obtain voltage amplitude information of the detected signal according to the histogram information, that is, maximum voltage amplitude, minimum voltage amplitude and/or probability information of occurrence of each voltage amplitude of the detected signal;
step 202, acquiring three preset voltages according to the voltage amplitude information of the detected signal;
step 203, comparing the detected signal with three preset voltage signals respectively, and acquiring three pulse signals respectively according to the comparison result;
step 204, respectively monitoring high and low level information of the three pulse signals, and acquiring edge type information according to the high and low level information of the three pulse signals; the edge type information comprises rising edge information, falling edge information and no edge information of the detected signal;
step 205, sequencing the sequentially acquired edge type information;
step 206, acquiring the rising edge information of the detected signal, the serial number information corresponding to the rising edge information, the falling edge information and the serial number information corresponding to the falling edge information from the sorted edge type information, and outputting the signals as the preprocessing data of the detected signal;
step 207, obtaining the period of the detected signal according to the preprocessed data.
In the embodiment of the application, a digital oscilloscope for realizing rapid measurement is disclosed, which comprises a measurement preprocessing circuit, a memory, a processor and a display. The measuring preprocessing circuit adopts a programmable logic device and comprises a level comparison circuit, an edge detection circuit, an edge position calculation circuit and an edge position acquisition circuit, wherein the level comparison circuit compares a measured signal with three preset voltages, the edge detection circuit acquires three pulse signals according to a comparison result respectively, monitors high-low level information of the three pulse signals and acquires edge type information according to the monitoring result, meanwhile, the edge position calculation circuit sorts the edge type information according to an acquisition sequence of the edge type information, and finally, the edge position acquisition circuit acquires rising edge information of the measured signal and corresponding sequence number information thereof as well as falling edge information and corresponding sequence number information thereof from the sorted edge type information to serve as preprocessing data and output the preprocessing data. The memory stores the pre-processing data, and the processor reads the pre-processing data from the memory, acquires the parameter information of the detected signal according to the pre-processing data and displays the parameter information through the display. Because the digital oscilloscope only stores the sequence number information of the rising edge and the sequence number information of the falling edge of the measured signal, the data capacity of the measured signal is greatly reduced, the processor can measure more original data by occupying the same memory, the processing speed of the processor on the preprocessed data is higher, and the parameters of the period and the like of the measured signal can be calculated more quickly and accurately.
Those skilled in the art will appreciate that all or part of the functions of the various methods in the above embodiments may be implemented by hardware, or may be implemented by computer programs. When all or part of the functions of the above embodiments are implemented by a computer program, the program may be stored in a computer-readable storage medium, and the storage medium may include: a read only memory, a random access memory, a magnetic disk, an optical disk, a hard disk, etc., and the program is executed by a computer to realize the above functions. For example, the program may be stored in a memory of the device, and when the program in the memory is executed by the processor, all or part of the functions described above may be implemented. In addition, when all or part of the functions in the above embodiments are implemented by a computer program, the program may be stored in a storage medium such as a server, another computer, a magnetic disk, an optical disk, a flash disk, or a removable hard disk, and may be downloaded or copied to a memory of a local device, or may be version-updated in a system of the local device, and when the program in the memory is executed by a processor, all or part of the functions in the above embodiments may be implemented.
The present invention has been described in terms of specific examples, which are provided to aid understanding of the invention and are not intended to be limiting. For a person skilled in the art to which the invention pertains, several simple deductions, modifications or substitutions may be made according to the idea of the invention.
Claims (10)
1. A digital oscilloscope for implementing rapid measurements, comprising:
the memory is used for storing original data acquired by acquiring a detected signal through an acquisition circuit of the digital oscilloscope;
the processor is used for reading the original data from the memory so as to obtain the tested signal according to the original data;
the measurement preprocessing circuit is used for preprocessing the measured signal to acquire preprocessed data; the measurement preprocessing circuit comprises a level comparison circuit, an edge detection circuit, an edge position calculation circuit and an edge position acquisition circuit; the level comparison circuit is used for comparing the detected signal with three preset voltage signals respectively and outputting three pulse signals respectively according to the comparison result; the edge detection circuit is used for respectively monitoring high and low level information of the three pulse signals and acquiring edge type information according to the high and low level information of the three pulse signals; the edge type information comprises rising edge information, falling edge information and no edge information of the detected signal; the edge position calculating circuit is used for sequencing the sequentially acquired edge type information; the edge position acquisition circuit is used for acquiring rising edge information of the detected signal, serial number information corresponding to the rising edge information, falling edge information and serial number information corresponding to the falling edge information from the sequenced edge type information to serve as the preprocessed data to be output; the processor is also used for acquiring the parameter information of the detected signal according to the preprocessing data;
and the display is used for displaying the parameter information of the detected signal.
2. The digital oscilloscope of claim 1, wherein the measurement preprocessing circuit further comprises a signal preprocessing device and a preset voltage acquisition device; the signal preprocessing device is used for acquiring voltage histogram information of the detected signal so as to acquire the maximum voltage amplitude, the minimum voltage amplitude and/or probability information of each voltage amplitude of the detected signal according to the histogram information;
the preset voltage acquisition device is used for acquiring three preset voltages according to the maximum voltage amplitude, the minimum voltage amplitude and/or probability information of each voltage amplitude of the detected signal.
3. The digital oscilloscope according to claim 2, wherein the preset voltage obtaining means is configured to compare the voltage amplitude of the signal under test with a first preset value and a second preset value, respectively, and to average the voltage amplitude smaller than the first preset value and average the voltage amplitude larger than the second preset value to obtain Vbase value and Vtop value; wherein Vbase is the average value of the voltage amplitude of the detected signal smaller than the first preset value, and Vtop is the average value of the voltage amplitude of the detected signal larger than the second preset value;
the preset voltage obtaining device obtains the preset voltage according to the following formula:
VL=Vbase+(Vtop-Vbase)/10
VM=(Vbase+ Vtop)/2
VH=Vbase+9*( Vtop-Vbase)/10,
wherein, VLIs a first predetermined voltage, VMIs a second predetermined voltage, VHAnd for a third preset voltage, Vbase is the average value of the voltage amplitude of the detected signal smaller than the first preset value, and Vtop is the average value of the voltage amplitude of the detected signal larger than the second preset value.
4. The digital oscilloscope of claim 3, wherein the first preset value is 40% of a peak-to-peak voltage value of the signal under test; and/or the second preset value is 60% of the peak-to-peak voltage value of the detected signal.
5. The digital oscilloscope of claim 3, wherein the edge detection circuit obtains edge type information according to high and low level information of three pulse signals, comprising:
the edge detection circuit acquires the rising and falling edge information of the three pulse signals according to the high and low level information of the three pulse signals respectively, and combines the rising and falling edge information of the three pulse signals to acquire the edge type information.
6. The digital oscilloscope of claim 5, wherein the rising and falling edge information of the pulse signal comprises a binary number of two bits.
7. The digital oscilloscope of claim 6, wherein the rising and falling edge information of the pulse signal comprises:
when the high-low level information of the pulse signal keeps low level, the rising and falling edge information of the pulse signal is 00;
when the high-low level information of the pulse signal keeps high level, the rising and falling edge information of the pulse signal is 11;
when the high-low level information of the pulse signal is changed from low level to high level, the rising and falling edge information of the pulse signal is 01;
when the high-low level information of the pulse signal changes from high level to low level, the rising and falling edge information of the pulse signal is 10.
8. The digital oscilloscope of claim 6, wherein the edge type information comprises a four-digit binary number.
9. The digital oscilloscope of claim 8, wherein the rising and falling edge information of three of the pulse signals comprises first rising and falling edge information, second rising and falling edge information, and third rising and falling edge information;
the first lifting edge information is obtained according to a pulse signal obtained by comparing the detected signal with the first preset voltage; the second lifting edge information is obtained according to a pulse signal obtained by comparing the detected signal with the second preset voltage; the third lifting edge information is obtained according to a pulse signal obtained by comparing the measured signal with the third preset voltage;
combining rising and falling edge information of three pulse signals to acquire the edge type information comprises:
when the first lifting edge information is 10, and the second lifting edge information and the third lifting edge information are both 00 or 11, the edge type information is 0001;
when the first lifting edge information is 01, and the second lifting edge information and the third lifting edge information are both 00 or 11, the edge type information is 0010;
when the second lifting edge information is 10 and the first lifting edge information and the third lifting edge information are both 00 or 11, the edge type information is 0011;
when the second lifting edge information is 01, and the first lifting edge information and the third lifting edge information are both 00 or 11, the edge type information is 0100;
when the third lifting edge information is 10 and the first lifting edge information and the second lifting edge information are both 00 or 11, the edge type information is 0101;
when the third lifting edge information is 01 and the first lifting edge information and the second lifting edge information are both 00 or 11, the edge type information is 0110;
when the first lifting edge information and the second lifting edge information are both 10 and the third lifting edge information is 00 or 11, the edge type information is 1001;
when the first lifting edge information and the second lifting edge information are both 01 and the third lifting edge information is 00 or 11, the edge type information is 1010;
when the second lifting edge information and the third lifting edge information are both 10 and the first lifting edge information is 00 or 11, the edge type information is 1011;
when the second lifting edge information and the third lifting edge information are both 01 and the first lifting edge information is 00 or 11, the edge type information is 1100;
when the first lifting edge information, the second lifting edge information and the third lifting edge information are all 10, the edge type information is 1101;
when the first lifting edge information, the second lifting edge information and the third lifting edge information are all 01, the edge type information is 1110;
when the first lifting edge information, the second lifting edge information and the third lifting edge information are all 00 or 11, the edge type information is 0000.
10. The digital oscilloscope of claim 5, wherein the processor is further configured to obtain the period of the signal under test based on the pre-processed data and a sampling frequency at which acquisition circuitry of the digital oscilloscope acquires the signal under test.
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