CN111426974A - Power supply automatic test circuit, system and method - Google Patents
Power supply automatic test circuit, system and method Download PDFInfo
- Publication number
- CN111426974A CN111426974A CN202010367613.4A CN202010367613A CN111426974A CN 111426974 A CN111426974 A CN 111426974A CN 202010367613 A CN202010367613 A CN 202010367613A CN 111426974 A CN111426974 A CN 111426974A
- Authority
- CN
- China
- Prior art keywords
- power supply
- circuit
- relay
- test
- characteristic parameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
Abstract
A power supply automatic test circuit, system and method, through one or more in the control gate circuit gating load circuit, first test assembly or second test assembly of the master control circuit, the load circuit imitates the line load, the voltage output characteristic parameter information of the feedback mainboard, the first test assembly gathers the alternating current input characteristic parameter of the alternating current signal that the alternating current power supply outputs, the second test assembly gathers the high-voltage power supply characteristic parameter of the mainboard, the direct current power supply feedbacks the characteristic parameter information of direct current input while working; the host computer gathers above-mentioned each characteristic parameter information, realizes the output characteristic, input characteristic and the high pressure characteristic of automatic test TV set mainboard on same station to automatic recording and upload the data of gathering, degree of automation is high, the test result reliability is strong, and operation process is simple, avoids producing human error.
Description
Technical Field
The application belongs to the technical field of televisions, and particularly relates to a power supply automatic test circuit, system and method.
Background
In the production link of the mainboard of the television, two parts of tests are needed, namely, the input characteristic and the output characteristic of the power supply are tested, and the primary high voltage and the secondary high voltage of the power supply are tested. At present, the traditional test mode is that different testers test on two different stations respectively, and the measured numerical value is observed through human eyes, so that whether the test is passed or not is judged, and the data obtained by the test cannot be recorded.
Therefore, the technical scheme of testing the power performance of the traditional television mainboard has the problems that the testing process is complicated and human errors are easily caused due to the fact that different testers test on two different stations and the measured values are observed by human eyes.
Disclosure of Invention
The application aims to provide a power supply automatic test circuit, system and method, and aims to solve the problems that in the traditional power supply performance test technical scheme of a television mainboard, the test is carried out on two different stations by different testers, and the tested numerical value is observed by human eyes, so that the test process is complicated, and human errors are easily generated.
The first aspect of the embodiment of the application provides a power automation test circuit for mainboard connection with host computer and TV set, the host computer is used for exporting multiple operating instruction extremely power automation test circuit, and gather and record a plurality of characteristic parameter information of power automation test circuit feedback, power automation test circuit includes:
the alternating current power supply is connected with the upper computer and the mainboard and is configured to output an alternating current signal and supply power to the mainboard when receiving the corresponding operation instruction;
the direct current power supply is connected with the upper computer and the mainboard and is configured to output a direct current signal to supply power to the mainboard and feed back direct current input characteristic parameter information to the upper computer when receiving the corresponding operation instruction;
the master control circuit is connected with the upper computer and is configured to receive corresponding output control signals of the corresponding operation instructions;
the load circuit is connected with the upper computer, is configured to simulate a line load, and feeds back voltage output characteristic parameter information of the mainboard to the upper computer;
the first testing assembly is connected with the upper computer and the alternating current power supply and is configured to collect alternating current input characteristic parameter information of the alternating current signal and feed the alternating current input characteristic parameter information back to the upper computer;
the second testing component is connected with the upper computer and configured to collect the high-voltage power supply characteristic parameter information of the mainboard and feed the high-voltage power supply characteristic parameter information back to the upper computer after outputting a target voltage signal; and
and the gating circuit is connected with the main control circuit, the mainboard, the load circuit, the first test component and the second test component and is configured to correspondingly gate any one or more of the load circuit, the first test component and the second test component according to the control signal.
A second aspect of the embodiments of the present application provides an automatic power supply testing system, which is used for being connected to a main board of a television, and includes:
the power supply automatic test circuit; and
and the upper computer is connected with the power supply automatic test circuit and is configured to output various operation instructions to the power supply automatic test circuit and collect and record a plurality of characteristic parameter information fed back by the power supply automatic test circuit.
A third aspect of the embodiments of the present application provides a power supply automated testing method based on the above power supply automated testing circuit, including:
when the alternating current power supply is adopted to receive the corresponding operation instruction, an alternating current signal is output, and power is supplied to the mainboard;
when a direct-current power supply is adopted to receive a corresponding operation instruction, a direct-current electric signal is output to supply power to the mainboard, and direct-current input characteristic parameter information is fed back to the upper computer;
a main control circuit is adopted to receive corresponding operation instructions and then correspondingly output control signals;
a load circuit is adopted to simulate a line load, and voltage output characteristic parameter information of the mainboard is fed back to an upper computer;
collecting alternating current input characteristic parameter information of an alternating current signal by adopting a first testing assembly and feeding back the information to an upper computer;
after the second test group is adopted to output a target voltage signal, collecting the high-voltage power supply characteristic parameter information of the mainboard and feeding the high-voltage power supply characteristic parameter information back to the upper computer;
and correspondingly gating one or more of the load circuit, the first test component and the second test component by adopting the gating circuit according to the control signal.
Compared with the prior art, the embodiment of the invention has the following beneficial effects: the main control circuit controls the gating circuit to gate one or more of the load circuit, the first test component or the second test component, the load circuit simulates circuit load and feeds back voltage output characteristic parameter information of the mainboard, the first test component acquires alternating current input characteristic parameters of alternating current signals output by the alternating current power supply, the second test component acquires high-voltage power supply characteristic parameter information of the mainboard, and the direct current power supply feeds back direct current input characteristic parameter information when working; the host computer gathers above-mentioned one characteristic parameter information, realizes output characteristic, input characteristic and the high pressure characteristic of automatic test TV set mainboard on same station to automatic recording and upload the data of gathering, degree of automation is high, the test result reliability is strong, and operation process is simple, avoids producing human error.
Drawings
Fig. 1 is a schematic block diagram of an automatic power test circuit according to an embodiment of the present disclosure;
FIG. 2 is an exemplary circuit schematic of a master control circuit in the power automated test circuit of FIG. 1;
FIG. 3 is a schematic diagram of an exemplary operation of the main control circuit shown in FIG. 2 to control the power on/off of the main board;
FIG. 4 is a schematic diagram of a portion of an exemplary circuit for a gate circuit in the power supply automated test circuit of FIG. 1;
FIG. 5 is a flowchart illustrating steps of a method for automatically testing a power supply according to another aspect of the present disclosure;
fig. 6 is a flowchart illustrating the operation of the power supply automation test method shown in fig. 5 in practical operation.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects to be solved by the present application clearer, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
Fig. 1 is a schematic block diagram of a power supply automation test circuit 100 according to an embodiment of the present disclosure, which only shows parts related to the embodiment for convenience of description, and the details are as follows:
an automated test circuit includes an AC power supply 10, a DC power supply 20, a master control circuit 30, a load circuit 40, a first test component 50, a second test component 60, and a gating circuit 70.
The power supply automatic test circuit 100 is connected with the upper computer 200 and the mainboard 300 of the television, and the upper computer 200 is used for outputting various operation instructions to the power supply automatic test circuit 100 and collecting and recording a plurality of characteristic parameter information fed back by the power supply automatic test circuit 100. Specifically, the characteristic parameter information includes dc input characteristic parameter information, ac input characteristic parameter information, voltage output characteristic parameter information, and high-voltage power supply characteristic parameter information.
The alternating current power supply 10 is connected with the upper computer 200 and the mainboard 300, the direct current power supply 20 is connected with the upper computer 200 and the mainboard 300, the main control circuit 30 is connected with the upper computer 200, the load circuit 40 is connected with the upper computer 200, the first test component 50 is connected with the upper computer 200 and the alternating current power supply 10, the second test component 60 is connected with the upper computer 200, and the gating circuit 70 is connected with the main control circuit 30, the mainboard 300, the load circuit 40, the first test component 50 and the second test component 60.
The ac power supply 10 is configured to output an ac signal and supply power to the motherboard 300 when receiving a corresponding operation instruction.
The dc power supply 20 is configured to output a dc signal to power the motherboard 300 and feed back the dc input characteristic parameter information to the upper computer 200 when receiving a corresponding operation instruction.
Specifically, the ac power supply 10 and the dc power supply 20 simulate power supplies required by the motherboard 300 during operation, and respectively output ac electrical signals and dc electrical signals. It should be noted that the same motherboard 300 uses either the ac power supply 10 or the dc power supply 20, so only one of the ac power supply 10 and the dc power supply 20 receives the operation command and operates, and the other does not operate during the test. Both the main board 300 of the adaptive DC power supply 20 and the main board 300 of the adaptive AC power supply 10 can be tested by using the power supply automatic test circuit 100 of the application, and the test circuit is convenient and practical.
The master control circuit 30 is configured to receive the corresponding operation instruction and output a control signal.
Specifically, the control signal output by the main control circuit 30 is used to control the on/off state of the switch component in the gating circuit 70, and the control signal is a level signal, which may be a high level or a low level.
The load circuit 40 is configured to simulate a line load and feed back voltage output characteristic parameter information of the main board 300 to the upper computer 200.
Specifically, the load circuit 40 simulates a line load connected to the main board 300 of the television, and is used for testing the voltage output characteristic parameter information of the main board 300.
The voltage output characteristic parameter information includes, but is not limited to, parameters of a motherboard power supply signal for supplying power to the operation of each active device on the motherboard 300 and parameters of a backlight power supply signal for supplying power to the operation of L ED lamps on the backlight of the television.
The first test assembly 50 is configured to collect and feed back ac input characteristic parameter information of the ac electrical signal to the upper computer 200.
Specifically, the first testing component 50 is connected to the ac power supply 10, and the ac power supply 10 operates only when the main board 300 is fitted to the ac power supply 10, so that the first testing component 50 also operates only in this case. The ac input characteristic parameter information includes, but is not limited to, input power, input current, and power factor of the ac electrical signal.
The second testing component 60 is configured to collect the high-voltage power characteristic parameter information of the motherboard 300 and feed back the information to the upper computer 200 after outputting the target voltage signal.
Specifically, the second testing assembly 60 is used to perform both primary and secondary high voltage tests. The target voltage signal output by the first testing component 50 is an electrical signal higher than the commercial power, for example, the target voltage signal is 3750V high-voltage alternating current. The second testing component 60 is used for testing the degree of high voltage resistance of the motherboard 300, and the high voltage power characteristic parameter information includes, but is not limited to, the withstand voltage values of the primary coil and the secondary coil in the power line of the motherboard 300, the leakage current of the primary coil and the secondary coil, and the impedance of the primary coil and the secondary coil.
The gating circuit 70 is configured to gate any one or more of the load circuit 40, the first testing component 50, and the second testing component 60 in response to the control signal.
Specifically, the gating circuit 70 includes a plurality of switch components therein, and all the switch components are controlled by the main control circuit 30 and are turned on and off according to the control signal output by the main control circuit 30. The switching circuit of the gate circuit 70, which connects the main board 300 with the load circuit 40, the first testing component 50 and the second testing component 60, functions as a switch and an isolator in the whole circuit.
Fig. 2 is a schematic circuit diagram of an exemplary main control circuit 30 in the power automatic test circuit 100 shown in fig. 1, which only shows the relevant parts related to the present embodiment for convenience of description, and the following details are shown:
in an optional embodiment, the main control circuit 30 includes a single chip microcomputer U3, a first capacitor E2, a second capacitor C15, a third capacitor E3, a first resistor R17, a second resistor R19, and a switch SW 1.
The single chip microcomputer U3 includes a reset terminal RST, a power terminal VCC, a first backlight output control terminal L ED _ ON/OFF _1, a second backlight output control terminal L ED _ ON/OFF _2, a first motherboard power supply control terminal 12V _ ON/OFF _1, a second motherboard power supply control terminal 12V _ ON/OFF _2, a first High Voltage test control terminal High Voltage, a second High Voltage test control terminal L-N ShortCircuit, a first AC input control terminal AC _ ON/OFF _1, and a second AC input control terminal AC _ ON/OFF _ 2.
The power supply terminal VCC is connected to working voltage, a node where the first end of the first capacitor E2, the first end of the second capacitor C15 and the first end of the third capacitor E3 are connected in common is connected with the power supply terminal VCC, a node where the second end of the first capacitor E2 and the first end of the first resistor R17 are connected in common is connected with the reset terminal RST, and the second end of the first resistor R17 is grounded; the first end of the second resistor R19 is connected with external voltage, the node of the second end of the second resistor R19 and the first fixed end of the switch SW1 are connected with one signal end of the single chip microcomputer U3, and the second fixed end of the switch SW1 is grounded.
Specifically, when a control signal is output by one of the first backlight output control terminal L ED _ ON/OFF _1, the second backlight output control terminal L ED _ ON/OFF _2, the first motherboard power supply control terminal 12V _ ON/OFF _1, the second motherboard power supply control terminal 12V _ ON/OFF _2, the first High Voltage test control terminal High Voltage, the second High Voltage test control terminal L-N Short Circuit, the first AC input control terminal AC _ ON/OFF _1, and the second AC input control terminal AC _ ON/OFF _2 of the single-chip microcomputer U3, the gating Circuit 70 performs a corresponding ON-OFF operation.
The first backlight output control terminal L ED _ ON/OFF _1 and the second backlight output control terminal L ED _ ON/OFF _2 are connected to the load circuit 40 through the gate circuit 70, and when the first backlight output control terminal L ED _ ON/OFF _1 and the second backlight output control terminal L ED _ ON/OFF _2 output control signals, corresponding switch components in the gate circuit 70 are closed, the main board 300 outputs a backlight power supply signal to the backlight panel, thereby testing whether the backlight power key of the main board 300 is normal.
The first motherboard power supply control terminal 12V _ ON/OFF _1 and the second motherboard power supply control terminal 12V _ ON/OFF _2 are connected to the load circuit 40 through the gating circuit 70, when the first motherboard power supply control terminal 12V _ ON/OFF _1 and the second motherboard power supply control terminal 12V _ ON/OFF _2 output control signals, corresponding switch components in the gating circuit 70 are closed, and the motherboard 300 outputs a 12V power supply working signal to corresponding active devices in the motherboard 300, thereby testing whether the motherboard 300 normally outputs the power supply working signal.
The first alternating current input control terminal AC _ ON/OFF _1 and the second alternating current input control terminal AC _ ON/OFF _2 are both connected with the first testing component 50 through the gating circuit 70, when the first alternating current input control terminal AC _ ON/OFF _1 and the second alternating current input control terminal AC _ ON/OFF _2 output control signals, corresponding switching components in the gating circuit 70 are closed, and the first testing component 50 starts to work.
The first High Voltage test control terminal High Voltage and the second High Voltage test control terminal L-N Short Circuit are both connected to the second test component 60 through the gating Circuit 70. when the first High Voltage test control terminal High Voltage and the second High Voltage test control terminal L-N Short Circuit output control signals, corresponding switch components in the gating Circuit 70 are closed, the second test component 60 starts to work, and a target Voltage signal is output.
In an optional embodiment, the first testing component 50 is implemented by a power meter, an input end of the power meter is connected to the ac power supply 10 to receive an ac signal, an output end and a controlled end of the power meter are connected to the upper computer 200, an acquisition end of the power meter is connected to the gating circuit 70, specifically, the acquisition end of the power meter is connected to the motherboard 300 through the gating circuit 70, when the power meter needs to work, the main control circuit 30 outputs a control signal to the gating circuit 70 to control the closing of corresponding switching components in the gating circuit 70, so as to communicate the power meter with the motherboard 300.
In addition, the single chip microcomputer U3 is further provided with a main board 300 switch control terminal Key _ ON/OFF, the main board 300 switch control terminal Key _ ON/OFF is connected with a switch Key of the main board 300, the main board 300 switch control terminal is connected with the switch Key of the main board 300 through the gating circuit 70, when the main board 300 switch control terminal Key _ ON/OFF outputs a control signal, a corresponding switch component in the gating circuit 70 is closed, the switch Key of the main board 300 is closed by obtaining a switch-ON signal, or is opened by obtaining a switch-OFF signal, so as to test whether the main board 300 is normally switched ON or OFF.
Referring to fig. 3, an exemplary operation schematic diagram of the main control circuit 30 shown in fig. 2 controlling the on/off of the motherboard 300 is shown.
The power ON/OFF control end Key _ ON/OFF of the singlechip U3 is connected with the base electrode of an NPN triode Q1 through a resistor R16; the ON-OFF Key of the main board 300 is connected through the plug component CN3, when the ON-OFF control terminal Key _ ON/OFF outputs a control signal, the NPN triode Q1 is turned ON, and the ON-OFF Key of the main board 300 is closed.
In an alternative embodiment, the second testing component 60 is implemented using a high voltage generator. The high voltage generator generates a target voltage signal, which is higher than the commercial power, and is used for testing the voltage resistance and the pressure resistance of the related circuits in the main board 300.
Referring to fig. 4, a schematic diagram of a portion of an exemplary circuit of the gate circuit 70 in the power automatic test circuit 100 shown in fig. 1 is shown, and for convenience of description, only the portion related to the embodiment is shown, and detailed as follows:
in an alternative embodiment, the gate circuit 70 includes a first relay KT1, a second relay KT2, a third relay, a fourth relay, a fifth relay, a sixth relay, a seventh relay, and an eighth relay.
The coil of the first relay KT1, the coil of the second relay KT2, the coil of the third relay, the coil of the fourth relay, the coil of the fifth relay, the coil of the sixth relay, the coil of the seventh relay and the coil of the eighth relay are all connected with the main control circuit 30.
The set of contacts of the first relay KT1 and the set of contacts of the second relay KT2 are connected to the first testing component 50.
The contact set of the third relay and the contact set of the fourth relay are connected to the second test assembly 60.
The contact group of the fifth relay, the contact group of the sixth relay, the contact group of the seventh relay, and the contact group of the eighth relay are connected to the load circuit 40.
It should be noted that fig. 4 only exemplarily shows a connection structure between the first relay KT1 and the second relay KT2 and the main control circuit 30, and connection structures between the remaining relays and the main control circuit 30 are similar to the structure shown in fig. 4.
Taking fig. 4 as an example, the connection relationship between the first test component 50, the gating circuit 70 and the main control circuit 30 is shown. As shown in fig. 4, a first AC input control terminal (AC _ ON/OFF _1) of the single chip microcomputer U3 is connected to a base of the NPN triode Q10 through a resistor R70, one end of a coil of the first relay KT1 is connected to a collector of the NPN triode Q10, the other end of the coil of the first relay KT1 is connected to a 12V power signal through resistors R74 and R75 which are connected in parallel, two ends of a contact group of the first relay KT1 are respectively connected to the plug-in module CN36 and the plug-in module CN37, and the plug-in module CN36 and the plug-in module CN37 are respectively connected to the first testing module 50 and the.
Similarly, a second alternating current input control end (AC _ ON/OFF _2) of the single chip microcomputer U3 is connected with a base electrode of the NPN triode Q13 through a resistor R84, one end of a coil of the second relay KT2 is connected with a collector electrode of the NPN triode Q13, the other end of the coil of the second relay KT2 is connected with a 12V power signal through resistors R74 and R75 which are connected in parallel, two ends of a contact group of the second relay KT2 are respectively connected with the plug-in component CN36 and the plug-in component CN37, and the plug-in component CN36 and the plug-in component CN37 are respectively connected with the first testing component 50 and.
When the first alternating current input control terminal (AC _ ON/OFF _1) and the second alternating current input control terminal (AC _ ON/OFF _2) both output control signals, the NPN transistor Q10 and the NPN transistor Q13 are turned ON, the first relay KT1 and the second relay KT2 are powered ON, and the contact sets are closed, so that the first testing component 50 is communicated with the main board 300, and the first testing component 50 starts to operate.
When the high-voltage generator works, the first relay KT1 and the second relay KT2 are disconnected at the moment due to the fact that the amplitude of the target voltage signal is large, the high-voltage and low-voltage are isolated, and the power meter and the alternating current power supply 10 are protected from being damaged.
The power supply automation test circuit 100 provided by this embodiment combines the input characteristic test and the output characteristic test of the main board 300 with the primary high voltage test and the secondary high voltage test, and the two test processes are not interfered with each other, each relay inside the gating circuit 70 is controlled to be correspondingly conducted in different working links by the main control circuit 30, the upper computer 200 outputs an operation instruction to the main control circuit 30, the main control circuit 30 correspondingly outputs a control signal to the relay inside the gating circuit 70, and thus the two test parts are combined together. The main function of the relay in the circuit is switching and isolating, and as the voltage output by the voltage generator is up to 3750V during the high-voltage test of the primary and secondary power supplies, devices such as a power meter and the like are inevitably damaged if the relay is not used for isolating the devices such as the power meter and the like.
The second aspect of the embodiment of the present application provides an automatic power test system, which is used for being connected to a motherboard 300 of a television, and includes the above automatic power test circuit 100 and the upper computer 200.
The upper computer 200 is used for outputting various operation instructions to the power supply automatic test circuit 100 and collecting and recording a plurality of characteristic parameter information fed back by the power supply automatic test circuit 100.
Specifically, the upper computer 200 is connected in communication with the power supply automation test circuit 100 through a plurality of serial communication interfaces, and collects a plurality of characteristic parameter information of the main board 300. The characteristic parameter information includes, but is not limited to, characteristic parameter information including dc input characteristic parameter information, ac input characteristic parameter information, voltage output characteristic parameter information, and high voltage power supply characteristic parameter information.
Optionally, the upper computer 200 is implemented by a computer.
Referring to fig. 5, a flowchart of steps of a power supply automation test method provided in the third aspect of the embodiment of the present application is shown, for convenience of description, only parts related to the embodiment are shown, and the following details are described:
step S01: when the ac power supply 10 receives a corresponding operation command, it outputs an ac signal and supplies power to the motherboard 300.
Step S02: when the dc power supply 20 is used to receive a corresponding operation instruction, a dc signal is output to supply power to the motherboard 300, and dc input characteristic parameter information is fed back to the upper computer 200.
Step S03: the main control circuit 30 is used for receiving the corresponding operation instruction and then outputting a control signal.
Step S04: and simulating a line load by using the load circuit 40, and feeding back the voltage output characteristic parameter information of the mainboard 300 to the upper computer 200.
Step S05: the first test component 50 is used for collecting the alternating current input characteristic parameter information of the alternating current signal and feeding back the information to the upper computer 200.
Step S06: after the second test set is adopted to output the target voltage signal, the high-voltage power supply characteristic parameter information of the main board 300 is collected and fed back to the upper computer 200.
Step S07: the gating circuit 70 is adapted to gate any one or more of the load circuit 40, the first test assembly 50 and the second test assembly 60 in response to the control signal.
Optionally, the method further includes step S08:
the upper computer 200 is adopted to output various operation instructions to the power supply automatic test circuit 100, and acquire and record a plurality of characteristic parameter information fed back by the power supply automatic test circuit 100.
Specifically, characteristic parameter information is collected and recorded through the upper computer 200, manual visual observation is not needed, the operation flow is simplified, and human errors are avoided.
Optionally, the method further includes step S08:
and uploading a plurality of characteristic parameter information to the background by using the upper computer 200 so that the background can analyze the characteristic parameter information.
Specifically, data are uploaded to the background, data loss is avoided, and human errors caused by manual recording and collection are avoided.
Please refer to fig. 6, which is a flowchart illustrating a specific operation of the power automatic testing method shown in fig. 5 in an actual operation, for convenience of description, only the relevant parts of the present embodiment are shown, and the following details are described below:
specifically, the motherboard 300 to be tested is placed on a test jig, and the direct current power supply 20 or the alternating current power supply 10 is selected to supply power through the upper computer 200.
If the alternating current power supply 10 supplies power, the specific work is as follows:
the instrument and equipment required by the test are set to be initialized through the control of the upper computer 200.
The test key of the upper computer 200 is pressed to start the test.
The master control circuit 30 controls the switching component of the gating circuit 70 connected to the second testing component 60 to close.
The second testing component 60 performs a primary high voltage test and a secondary high voltage test, the upper computer 200 reads and records the information of the alternating current input characteristic parameters obtained by the tests, and if the tests do not pass, the setting initialization stage is returned.
The main control circuit 30 opens the switching component of the gate circuit 70 connected to the second testing component 60 while closing the switching component of the gate circuit 70 connected to the load circuit 40 and the first testing component 50. Specifically, the load circuit 40 is first turned on, and then the first testing component 50 is turned on.
The main control circuit 30 imitates a power-on signal of the motherboard 300 to control the motherboard 300 to start.
After the motherboard 300 is turned on, the upper computer 200 reads the voltage output characteristic parameter information fed back by the load circuit 40 and the ac input characteristic parameter information fed back by the first test component 50, and at the same time, the upper computer 200 calculates the efficiency of the power supply.
If the motherboard 300 is not powered on or the power supply does not output after the motherboard 300 is powered on, the upper computer 200 controls to turn off the alternating current power supply 10, and then controls the primary electrolytic capacitor in the motherboard 300 to discharge, and finally restores the initialized state of the system.
The main control circuit 30 simulates a shutdown signal of the motherboard 300 to control the motherboard 300 to start up, and then switches off the switch component connected to the load circuit 40 in the gating circuit 70.
The standby power consumption of the motherboard 300 is tested by the computer reading the input power of the first testing component 50.
The ac power supply 10 is turned off.
And controlling the electrolytic capacitor on the primary side of the transformer to discharge.
And after the test is finished, the initialized state is recovered.
If the direct current power supply 20 supplies power, the specific operation is as follows:
the initialization parameters of the dc power supply 20 are set. Specifically, the initialization parameter of the dc power supply 20 refers to the input voltage of the dc power supply 20.
The output of the direct current power supply 20 is controlled by the upper computer 200, the current and the voltage of the direct current power supply 20 are read, and the standby power consumption of the mainboard 300 is calculated.
The main control circuit 30 simulates a start-up signal of the motherboard 300, reads the direct current and the direct voltage, and determines whether the motherboard 300 is working normally, and if the test fails, the initialization stage is returned.
And after the test is finished, controlling the direct current power supply 20 to restore the initialization state.
It should be noted that fig. 6 only shows a specific operation flow of the power supply automation test method in actual operation in the case of supplying power by the ac power supply 10.
In summary, according to the power supply automatic test circuit, system and method provided by the application, the master control circuit controls the gating circuit to gate one or more of the load circuit, the first test component or the second test component, the load circuit simulates a circuit load and feeds back voltage output characteristic parameter information of the main board, the first test component acquires alternating current input characteristic parameter information of an alternating current signal output by an alternating current power supply, the second test component acquires high-voltage power supply characteristic parameters of the main board, and the direct current power supply feeds back direct current input characteristic parameter information when working; the upper computer collects the characteristic parameter information, the output characteristic, the input characteristic and the high-voltage characteristic of the television mainboard are automatically tested on the same station, the collected data are automatically recorded and uploaded, the automation degree is high, the reliability of the test result is high, the operation process is simple, the generation of human errors is avoided, the delivery quality of products is improved, and the later maintenance cost is reduced; and the labor cost is reduced, and the testing time is shortened.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (10)
1. The utility model provides a power automation test circuit for mainboard connection with host computer and TV set, the host computer be used for exporting multiple operating instruction extremely power automation test circuit to gather and record the characteristic parameter information of power automation test circuit feedback, its characterized in that, power automation test circuit includes:
the alternating current power supply is connected with the upper computer and the mainboard and is configured to output an alternating current signal and supply power to the mainboard when receiving the corresponding operation instruction;
the direct current power supply is connected with the upper computer and the mainboard and is configured to output a direct current signal to supply power to the mainboard and feed back direct current input characteristic parameter information to the upper computer when receiving the corresponding operation instruction;
the main control circuit is connected with the upper computer and is configured to output a control signal after receiving the corresponding operation instruction;
the load circuit is connected with the upper computer, is configured to simulate a line load, and feeds back voltage output characteristic parameter information of the mainboard to the upper computer;
the first testing assembly is connected with the upper computer and the alternating current power supply and is configured to collect alternating current input characteristic parameter information of the alternating current signal and feed the alternating current input characteristic parameter information back to the upper computer;
the second testing component is connected with the upper computer and configured to collect the high-voltage power supply characteristic parameter information of the mainboard and feed the high-voltage power supply characteristic parameter information back to the upper computer after outputting a target voltage signal; and
and the gating circuit is connected with the main control circuit, the mainboard, the load circuit, the first test component and the second test component and is configured to correspondingly gate any one or more of the load circuit, the first test component and the second test component according to the control signal.
2. The power supply automation test circuit of claim 1 wherein the master circuit comprises:
the circuit comprises a singlechip, a first capacitor, a second capacitor, a third capacitor, a first resistor, a second resistor and a switch;
the single chip microcomputer comprises a reset end, a power end, a mainboard switching on and off control end, a first backlight output control end, a second backlight output control end, a first mainboard power supply control end, a second mainboard power supply control end, a first high-voltage test control end, a second high-voltage test control end, a first alternating current input control end and a second alternating current input control end;
the first backlight output control end, the second backlight output control end, the first main board power supply control end, the second main board power supply control end, the first high-voltage test control end, the second high-voltage test control end, the first alternating current input control end and the second alternating current input control end are all connected with the gating circuit;
the power supply end is connected with working voltage, the nodes which are commonly connected with the first end of the first capacitor, the first end of the second capacitor and the first end of the third capacitor are connected with the power supply end, the node which is commonly connected with the second end of the first capacitor and the first end of the first resistor is connected with the reset end, and the second end of the first resistor is grounded; the first end of second resistance inserts external voltage, the second end of second resistance with the nodal connection that the first stiff end of switch connects altogether a signal end of singlechip, the second stiff end ground connection of switch.
3. The power supply automation test circuit of claim 1 wherein the first test component is implemented with a power meter; the input end of the power meter is used for receiving the alternating current signal, the output end and the controlled end of the power meter are connected with the upper computer, and the acquisition end of the power meter is connected with the gating circuit.
4. The power supply automation test circuit of claim 1 wherein the second test component is implemented using a high voltage generator.
5. The power supply automation test circuit of claim 1 wherein the gating circuit comprises:
the relay comprises a first relay, a second relay, a third relay, a fourth relay, a fifth relay, a sixth relay, a seventh relay and an eighth relay;
the coil of the first relay, the coil of the second relay, the coil of the third relay, the coil of the fourth relay, the coil of the fifth relay, the coil of the sixth relay, the coil of the seventh relay and the coil of the eighth relay are all connected with the main control circuit;
the contact group of the first relay and the contact group of the second relay are connected with the first testing component;
the contact group of the third relay and the contact group of the fourth relay are connected with the second testing component;
the contact group of the fifth relay, the contact group of the sixth relay, the contact group of the seventh relay, and the contact group of the eighth relay are connected to the load circuit.
6. An automatic test system for power supply, which is used for connecting with a main board of a television, is characterized by comprising:
the power supply automation test circuit of any one of claims 1 to 5; and
and the upper computer is connected with the power supply automatic test circuit and is configured to output various operation instructions to the power supply automatic test circuit and collect and record characteristic parameter information fed back by the power supply automatic test circuit.
7. The power supply automation test system of claim 6 wherein the upper computer is implemented using a computer.
8. A power supply automatic test method based on the power supply automatic test circuit of any one of claims 1 to 5, characterized by comprising:
when the alternating current power supply is adopted to receive the corresponding operation instruction, an alternating current signal is output, and power is supplied to the mainboard;
when a direct-current power supply is adopted to receive a corresponding operation instruction, a direct-current electric signal is output to supply power to the mainboard, and direct-current input characteristic parameter information is fed back to the upper computer;
a main control circuit is adopted to receive a corresponding operation instruction and then output a control signal;
a load circuit is adopted to simulate a line load, and voltage output characteristic parameter information of the mainboard is fed back to an upper computer;
collecting alternating current input characteristic parameter information of an alternating current signal by adopting a first testing assembly and feeding back the information to an upper computer;
after the second test group is adopted to output a target voltage signal, collecting the high-voltage power supply characteristic parameter information of the mainboard and feeding the high-voltage power supply characteristic parameter information back to the upper computer;
and correspondingly gating one or more of the load circuit, the first test component and the second test component by adopting the gating circuit according to the control signal.
9. The power supply automation test method of claim 8 further comprising:
and outputting various operation instructions to the power supply automatic test circuit by adopting an upper computer, and acquiring and recording characteristic parameter information fed back by the power supply automatic test circuit.
10. The power supply automation test method of claim 9 further comprising:
and uploading the characteristic parameter information to a background by adopting an upper computer so that the background can analyze the characteristic parameter information.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010367613.4A CN111426974A (en) | 2020-04-30 | 2020-04-30 | Power supply automatic test circuit, system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010367613.4A CN111426974A (en) | 2020-04-30 | 2020-04-30 | Power supply automatic test circuit, system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111426974A true CN111426974A (en) | 2020-07-17 |
Family
ID=71552302
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010367613.4A Pending CN111426974A (en) | 2020-04-30 | 2020-04-30 | Power supply automatic test circuit, system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111426974A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113311350A (en) * | 2021-07-28 | 2021-08-27 | 苏州浪潮智能科技有限公司 | BBU power supply online test device, method and server |
| CN114019402A (en) * | 2021-09-24 | 2022-02-08 | 北京无线电测量研究所 | Customized switch power supply automatic test system and method |
| CN117031161A (en) * | 2023-08-08 | 2023-11-10 | 南京航空航天大学 | Multi-agent technology-based automatic test method for airborne converter |
-
2020
- 2020-04-30 CN CN202010367613.4A patent/CN111426974A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113311350A (en) * | 2021-07-28 | 2021-08-27 | 苏州浪潮智能科技有限公司 | BBU power supply online test device, method and server |
| CN114019402A (en) * | 2021-09-24 | 2022-02-08 | 北京无线电测量研究所 | Customized switch power supply automatic test system and method |
| CN117031161A (en) * | 2023-08-08 | 2023-11-10 | 南京航空航天大学 | Multi-agent technology-based automatic test method for airborne converter |
| CN117031161B (en) * | 2023-08-08 | 2024-04-09 | 南京航空航天大学 | Multi-agent technology-based automatic test method for airborne converter |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111426974A (en) | Power supply automatic test circuit, system and method | |
| CN209590584U (en) | Automatic controller for electric consumption up and down | |
| CN205229445U (en) | Electric energy meter RS485 communication interface comprehensive properties test module | |
| CN214585871U (en) | Novel relay test device | |
| CN110501998B (en) | BMS hardware in-loop test system and test method | |
| CN104460652A (en) | Board card ageing device and using method thereof | |
| CN114039686B (en) | Automatic semi-physical satellite energy testing system and method | |
| CN110928196A (en) | Double-star combined test energy simulation and monitoring system | |
| CN113567796B (en) | Compatibility performance testing method | |
| CN114550795A (en) | Platform development system for testing LPDDR4 particles and control method | |
| CN212207622U (en) | Automatic test circuit and system for power supply | |
| CN102902268A (en) | Live testing device of feed line automatic system | |
| CN112698135A (en) | Detection system and method for satellite loading test of satellite power supply and distribution system | |
| CN208432669U (en) | A kind of test macro | |
| CN112379252B (en) | Primary and secondary fusion pole switch test system | |
| CN111122994A (en) | Man-machine interaction testing device for simulation circuit breaker | |
| CN213457293U (en) | Universal novel multichannel power module test system | |
| CN202305726U (en) | Ageing monitoring equipment for distributors | |
| CN206161802U (en) | Boundary switch antithetical couplet adjusting tries on clothes and puts on post | |
| CN219574270U (en) | High-voltage testing device | |
| CN212905198U (en) | Thousand-time power-off automatic test system | |
| CN218099424U (en) | Battery cell simulation board and BMS testing device | |
| CN216082965U (en) | DC charging performance test apparatus for vehicle | |
| CN220509056U (en) | Aging current monitoring system | |
| CN113311322B (en) | Load driving and mutual inductor signal processing device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |