CN111366829A - Automatic downloading and managing system for test in semiconductor aging (TDBI) program - Google Patents
Automatic downloading and managing system for test in semiconductor aging (TDBI) program Download PDFInfo
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- CN111366829A CN111366829A CN201811587156.9A CN201811587156A CN111366829A CN 111366829 A CN111366829 A CN 111366829A CN 201811587156 A CN201811587156 A CN 201811587156A CN 111366829 A CN111366829 A CN 111366829A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F8/00—Arrangements for software engineering
- G06F8/60—Software deployment
- G06F8/65—Updates
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Abstract
The invention discloses an automatic downloading and managing system for a test in semiconductor aging (TDBI) program, aiming at providing a system which has the advantages of simple change and modification of later operation, universality and easy extension and popularization, and the technical scheme is characterized by comprising the following modes: s01, registering related test programs (including Sorter device DC PGM and TDBI device BI PGM) in Hess, wherein the paths for storing the related test programs are included; completing the approval, and transmitting the data to an MES system; s02, when the device starts to produce, the device sends a PGM acquisition request to the EAP/EIS, and the EAP/EIS sends the corresponding PGM acquisition path to the MES system according to the relevant information and returns the path to the device; and S03, the equipment automatically downloads the corresponding PGM file through the FTP according to the corresponding path, and then starts the testing process. The important system adopts cluster configuration to ensure the stability of the system. The JANET protocol is reformed into the SECS protocol, the change and modification of later-period operation are simple, and the method has universality and is easy to expand and popularize.
Description
Technical Field
The invention belongs to the field of testing in semiconductor aging, and particularly relates to an automatic downloading and managing system for a test in semiconductor aging (TDBI) program.
Background
The test in the aging process is a process of carrying out corresponding condition strengthening experiments on the aging condition of the product by simulating various factors related to the product in the actual use condition, the experiments mainly aim at the plastic material, and the common aging mainly comprises illumination aging, damp-heat aging and hot air aging.
At present, chinese patent publication No. CN103514893B discloses a cooling system for a semiconductor light source bar in an aging test, which includes a clamp for clamping the semiconductor light source bar, the clamp includes a housing, the housing has a water inlet channel and a water outlet channel which are communicated with each other; the first water tank is connected with the water inlet channel and filled with cooling liquid; the second water tank is connected with the water outlet channel; and the suction device is connected with the water outlet channel and at least sucks the cooling liquid in the first water tank to the second water tank so as to wash the bottom of the semiconductor light source strip to reduce the temperature of the semiconductor light source strip.
1. Current PGM (test program) automatic download and management approach:
JANETServer: JEC corporation is an operations server for managing TDBI device development.
Hess: with standard document management systems, all PGMs to be used are registered with the system and contain approvals.
MES: the manufacturing execution system includes management of all PGM reference data and production job data.
TAMS: and the automatic test management system and the MES system communicate with the equipment.
The current method for automatically acquiring the test program is as follows:
a) registering related test programs (including the software module (BIPGM) of the Sorter device DCPGM and the TDBI device) in Hess, wherein the related test programs are stored in the Hess; completing the approval, and transmitting the data to an MES system;
b) when the equipment starts to produce, the equipment sends a PGM acquisition request to the TAMS, and the TAMS sends the MES system to acquire a path corresponding to the PGM according to the relevant information and returns the path to the equipment;
c) the equipment automatically downloads a corresponding PGM file through the FTP according to the corresponding path and then starts a test process;
2. the communication mode of the current equipment and the JANETServer adopts a JANET protocol, has related limitations and does not have universality; late change modifications are complex.
At present, more test programs of semiconductor TDBI test equipment are managed on a JANETServer (operation server developed by JEC company for managing TDBI equipment), and the test programs run on a single machine, so that the stability is deficient.
Disclosure of Invention
The invention aims to provide an automatic downloading and management system for a semiconductor test in aging (TDBI) program. The method has the advantages of simple change and modification of later-period operation, universality and easy expansion and popularization.
The purpose of the invention can be realized by the following technical scheme:
an automatic download and management system for semiconductor test in burn-in (TDBI) program,
the method comprises the following steps:
s01, registering related test programs (including Sorter device DC PGM and TDBI device BI PGM) in Hess, wherein the paths for storing the related test programs are included; completing the approval, and transmitting the data to an MES system;
s02, when the device starts to produce, the device sends a PGM acquisition request to the EAP/EIS, and the EAP/EIS sends the corresponding PGM acquisition path to the MES system according to the relevant information and returns the path to the device;
and S03, the equipment automatically downloads the corresponding PGM file through the FTP according to the corresponding path, and then starts the testing process.
Preferably, the development and deployment of the EAP/EIS include that the EAP (device automation program) can receive information sent by the device, and also can convert return information of the server into information conforming to the SECS protocol, and the device can recognize the return information; the EIS (device interface system) logically processes the information uploaded by the device (not only including the processing of the device request PGM), and returns the processing result to the device through the EAP.
Preferably, the apparatus comprises a Sorter apparatus and a TDBI apparatus.
The invention has the beneficial effects that:
removing the JANET SERVER, and separately deploying the JANET SERVER through FTP SERVER to only store PGM files; upgrading the equipment system by applying SECS protocol (semiconductor equipment communication standard protocol); related systems are modularized, the coupling degree and complexity of the system are reduced, and the stability of the system is guaranteed. The important system adopts cluster configuration to ensure the stability of the system. The JANET protocol is reformed into the SECS protocol, the change and modification of later-period operation are simple, and the method has universality and is easy to expand and popularize.
Drawings
FIG. 1 is a schematic diagram of a path in the context of an illustration;
fig. 2 is a schematic diagram of a path in an embodiment of the specification.
Detailed Description
Example 1: a semiconductor test-in-aging (TDBI) program automatic downloading and management system comprises the following modes:
s01, registering related test programs (including Sorter device DC PGM and TDBI device BI PGM) in Hess, wherein the paths for storing the related test programs are included; completing the approval, and transmitting the data to an MES system;
s02, when the device starts to produce, the device sends a PGM acquisition request to the EAP/EIS, and the EAP/EIS sends the corresponding PGM acquisition path to the MES system according to the relevant information and returns the path to the device;
and S03, the equipment automatically downloads the corresponding PGM file through the FTP according to the corresponding path, and then starts the testing process.
Preferably, the development and deployment of the EAP/EIS include that the EAP (device automation program) can receive information sent by the device, and also can convert return information of the server into information conforming to the SECS protocol, and the device can recognize the return information; the EIS (device interface system) logically processes the information uploaded by the device (not only including the processing of the device request PGM), and returns the processing result to the device through the EAP.
Preferably, the apparatus comprises a Sorter apparatus and a TDBI apparatus.
Removing the JANET SERVER, and separately deploying the JANET SERVER through FTP SERVER to only store PGM files; upgrading the equipment system by applying SECS protocol (semiconductor equipment communication standard protocol); related systems are modularized, the coupling degree and complexity of the system are reduced, and the stability of the system is guaranteed. The important system adopts cluster configuration to ensure the stability of the system. The JANET protocol is reformed into the SECS protocol, the change and modification of later-period operation are simple, and the method has universality and is easy to expand and popularize.
Finally, it should be noted that: although the present invention has been described in detail with reference to the above embodiments, it should be understood by those skilled in the art that: modifications and equivalents may be made thereto without departing from the spirit and scope of the invention, and the appended claims are intended to cover such modifications and equivalents as fall within the true spirit and scope of the invention.
Claims (3)
1. A semiconductor in-burn-in Test (TDBI) program automatic download and management system, characterized by: the method comprises the following steps:
s01, registering related test programs (including Sorter device DC PGM and TDBI device BI PGM) in Hess, wherein the paths for storing the related test programs are included; completing the approval, and transmitting the data to an MES system;
s02, when the device starts to produce, the device sends a PGM acquisition request to the EAP/EIS, and the EAP/EIS sends the corresponding PGM acquisition path to the MES system according to the relevant information and returns the path to the device;
and S03, the equipment automatically downloads the corresponding PGM file through the FTP according to the corresponding path, and then starts the testing process.
2. The semiconductor test-in-aging (TDBI) program automatic download and management system of claim 1, wherein: the development and deployment of the EAP/EIS comprise that the EAP (equipment automation program) can receive information sent by equipment, return information of a server can be converted into information conforming to an SECS protocol, and the equipment can be identified; the EIS (device interface system) logically processes the information uploaded by the device (not only including the processing of the device request PGM), and returns the processing result to the device through the EAP.
3. The semiconductor test-in-aging (TDBI) program automatic download and management system of claim 1, wherein: the device comprises a Sorter device and a TDBI device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811587156.9A CN111366829A (en) | 2018-12-25 | 2018-12-25 | Automatic downloading and managing system for test in semiconductor aging (TDBI) program |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201811587156.9A CN111366829A (en) | 2018-12-25 | 2018-12-25 | Automatic downloading and managing system for test in semiconductor aging (TDBI) program |
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| CN111366829A true CN111366829A (en) | 2020-07-03 |
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