CN111292700A - TFT threshold voltage compensation method and device and display - Google Patents
TFT threshold voltage compensation method and device and display Download PDFInfo
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- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
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Abstract
The invention provides a TFT threshold voltage compensation method, a device and a display, which are used for solving the technical problem that the display in the prior art adopts a DEMUX technology, and the drift amount of the threshold voltage of a TFT in the DEMUX at a part of the position in a display panel is too large along with the increase of the service time of the display, so that the display is displayed unevenly, wherein the method comprises the following steps: judging whether the drift amount of the threshold voltage of a Thin Film Transistor (TFT) in the DEMUX is larger than a first preset threshold value or not; if the threshold voltage is larger than the preset threshold voltage, acquiring the working temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX; calling a sample database according to a preset first output current, a preset working temperature and a preset threshold voltage of the DEMUX, and determining a first grid driving high level voltage; the gate driving high level voltage of the DEMUX driving circuit is adjusted to a first gate driving high level voltage.
Description
Technical Field
The invention relates to the field of liquid crystal displays, in particular to a TFT threshold voltage compensation method, a TFT threshold voltage compensation device and a display.
Background
The lcd is one of the most widely used flat panel displays, and has gradually become a display for various electronic devices such as mobile phones, digital cameras, computer screens, or notebook computer screens. With the development and progress of the liquid crystal display technology, people put forward higher requirements on the display quality, the appearance design and the like of the liquid crystal display, low cost and narrow frames become the targets pursued by people, and a Demultiplexer (DEMUX) is used for decomposing one signal channel into a plurality of signal channels, can reduce input channels, reduces the cost of an integrated circuit, and is widely applied to medium and small-sized liquid crystal displays.
In a display using DEMUX technology in which Thin Film Transistors (TFTs) are required to charge a plurality of data lines and their connected pixels, the use often encounters the following problems: (1) as the service time of the display increases, the threshold voltage of the TFT in the DEMUX can drift, and the drift amounts of different positions on a display panel are inconsistent; (2) because various electronic elements in the display have different heat productivity, the environmental temperatures of the DEMUX at different positions are different, and the difference can expand the characteristic difference of the TFTs in the DEMUX at different positions. Finally, the above problem may cause the characteristics of the TFTs in some DEMUXs in the display to not meet the normal display requirements, resulting in non-uniform display of the display.
Therefore, in the display adopting the DEMUX technology in the prior art, as the service time of the display increases, the drift amount of the threshold voltage of the TFT in the DEMUX at a part of the display panel is too large, which causes the problem of uneven display of the display.
Disclosure of Invention
The invention provides a TFT threshold voltage compensation method, a TFT threshold voltage compensation device and a display, which are used for solving the technical problem that the display in the prior art adopts a DEMUX technology, and the drift amount of the threshold voltage of a TFT in the DEMUX at a part of the display panel is too large along with the increase of the service time of the display, so that the display is displayed unevenly.
In a first aspect, to solve the foregoing technical problem, an embodiment of the present invention provides a TFT threshold voltage compensation applied to a display, where the display includes a pixel unit, a column driver circuit and a demultiplexer DEMUX driver circuit, where the column driver circuit includes at least one DEMUX, the column driver circuit is configured to write a data signal into the pixel unit, and the DEMUX driver circuit is configured to control distribution of the DEMUX in the column driver circuit to the data signal, and a technical solution of the method is as follows:
judging whether the drift amount of the threshold voltage of a Thin Film Transistor (TFT) in the DEMUX is larger than a first preset threshold value or not;
if the threshold voltage is larger than the preset threshold voltage, acquiring the working temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX;
calling a sample database according to a preset first output current, the working temperature and the threshold voltage of the DEMUX, and determining a first grid driving high level voltage, wherein the sample database comprises a plurality of groups of corresponding relations among the output current, the working temperature, the threshold voltage and the grid driving high level voltage;
and adjusting the gate drive high level voltage of the DEMUX driving circuit to the first gate drive high level voltage, wherein the gate drive high level voltage is used for starting the DEMUX, controlling the output current of the DEMUX and compensating the threshold voltage of the TFT in the DEMUX.
In this embodiment, when the drift amount of the threshold voltage of the TFT in the DEMUX is greater than the first preset threshold, the operating temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX may be obtained, and the sample database may be called to determine the first gate driving high level voltage according to the preset first output current, operating temperature, and threshold voltage of the DEMUX, where the sample database includes a plurality of sets of correspondence relationships among the output current, operating temperature, threshold voltage, and gate driving high level voltage, and the gate driving high level voltage of the DEMUX driving circuit is adjusted to the first gate driving high level voltage, where the gate driving high level voltage is used to turn on the DEMUX and control the output current of the DEMUX to compensate the threshold voltage of the TFT in the DEMUX, and by determining whether the drift amount of the threshold voltage of the TFT in the DEMUX is greater than the first preset threshold, if so as to determine the first output current of the DEMUX, and determining the corresponding gate drive high level voltage, and adjusting the gate drive high level voltage of the DEMUX driving circuit to the gate drive high level voltage corresponding to the first output current, so as to compensate the drift amount of the threshold voltage and eliminate poor display.
Optionally, determining whether the drift amount of the threshold voltage of the thin film transistor TFT in the DEMUX is greater than a first preset threshold includes:
displaying a standard image on the display, and acquiring a second output current of the DEMUX;
judging whether the second output current is smaller than a second preset threshold value or not;
and if the threshold voltage is smaller than the first preset threshold value, determining that the drift amount of the threshold voltage of the TFT in the DEMUX is larger than the first preset threshold value.
Optionally, the first output current is an output current of the DEMUX when the DEMUX writes a data signal into a corresponding pixel unit.
Optionally, obtaining the threshold voltage of the TFT in the DEMUX includes:
acquiring a second grid driving high-level voltage of the DEMUX driving circuit;
and calling the sample database according to the second output current, the second gate drive high level voltage and the working temperature, and determining the threshold voltage of the TFT in the DEMUX.
In a second aspect, a TFT threshold voltage compensation apparatus is provided, which is applied to a display, where the display includes a pixel unit, a column driving circuit and a demultiplexer DEMUX driving circuit, where the column driving circuit includes at least one DEMUX, the column driving circuit is configured to write a data signal into the pixel unit, and the DEMUX driving circuit is configured to control distribution of the DEMUX to the data signal in the column driving circuit, and the TFT threshold voltage compensation apparatus includes:
the judging module is used for judging whether the drift amount of the threshold voltage of the thin film transistor TFT in the DEMUX is larger than a first preset threshold value or not;
the acquisition module is used for acquiring the working temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX if the working temperature of the DEMUX is larger than the threshold voltage of the TFT in the DEMUX;
the determining module is used for calling a sample database according to a preset first output current of the DEMUX, the working temperature and the threshold voltage, and determining a first grid driving high level voltage, wherein the sample database comprises a plurality of groups of corresponding relations among the output current, the working temperature, the threshold voltage and the grid driving high level voltage;
and the adjusting module is used for adjusting the grid driving high level voltage of the DEMUX driving circuit to be the first grid driving high level voltage, wherein the grid driving high level voltage is used for starting the DEMUX, controlling the output current of the DEMUX and compensating the threshold voltage of the TFT in the DEMUX.
Optionally, the determining module is specifically configured to:
displaying a standard image on the display, and acquiring a second output current of the DEMUX;
judging whether the second output current is smaller than a second preset threshold value or not;
and if the threshold voltage is smaller than the first preset threshold value, determining that the drift amount of the threshold voltage of the TFT in the DEMUX is larger than the first preset threshold value.
Optionally, the first output current is an output current of the DEMUX when the DEMUX writes a data signal into a corresponding pixel unit.
Optionally, the obtaining module is specifically configured to:
acquiring a second grid driving high-level voltage of the DEMUX driving circuit;
and calling the sample database according to the first output current, the second gate drive high level voltage and the working temperature, and determining the threshold voltage of the TFT in the DEMUX.
In a third aspect, a display is provided, comprising: the TFT threshold voltage compensation apparatus according to any one of the embodiments in the second aspect, and a pixel unit, a column driver circuit and a demultiplexer DEMUX driver circuit, wherein the column driver circuit includes at least one DEMUX, the column driver circuit is configured to write a data signal into the pixel unit, and the DEMUX driver circuit is configured to control distribution of the DEMUX to the data signal in the column driver circuit.
In a fourth aspect, there is provided a storage medium having stored thereon computer-executable instructions for causing a computer to perform the steps included in any one of the embodiments of the first aspect.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application.
Fig. 1 is a schematic structural diagram of a display in an embodiment of the present application;
FIG. 2 is a schematic flow chart illustrating a TFT threshold voltage compensation method according to an embodiment of the present application;
FIG. 3 is a schematic structural diagram of a TFT threshold voltage compensation device in an embodiment of the present application;
fig. 4 is a schematic structural diagram of a TFT threshold voltage compensation system in an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions in the embodiments of the present application will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application. In the present application, the embodiments and features of the embodiments may be arbitrarily combined with each other without conflict. Also, while a logical order is shown in the flow diagrams, in some cases, the steps shown or described can be performed in an order different than here.
The terms "first" and "second" in the description and claims of the present application and the above-described drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the term "comprises" and any variations thereof, which are intended to cover non-exclusive protection. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.
In the embodiments of the present application, "at least one" may mean one or at least two, for example, one, two, three, or more, and the embodiments of the present application are not limited.
In addition, the term "and/or" herein is only one kind of association relationship describing an associated object, and means that there may be three kinds of relationships, for example, a and/or B, which may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" in this document generally indicates that the preceding and following related objects are in an "or" relationship unless otherwise specified.
At present, in a display adopting a Demultiplexer (DEMUX) technology, a Thin Film Transistor (TFT) in the DEMUX needs to charge a plurality of data lines and pixels connected with the data lines, and the following problems are frequently encountered in use: (1) as the service time of the display increases, the threshold voltage of the TFT in the DEMUX can drift, and the drift amounts of different positions on a display panel are inconsistent; (2) because various electronic elements in the display have different heat productivity, the environmental temperatures of the DEMUX at different positions are different, and the difference can expand the characteristic difference of the TFTs in the DEMUX at different positions. Finally, the above problem may cause the characteristics of the TFTs in some DEMUXs in the display to not meet the normal display requirements, resulting in non-uniform display of the display. Therefore, in the display adopting the DEMUX technology in the prior art, as the service time of the display increases, the drift amount of the threshold voltage of the TFT in the DEMUX at a part of the display panel is too large, which causes the problem of uneven display of the display.
In view of this, an embodiment of the present application provides a TFT threshold voltage compensation method, which may obtain an operating temperature of a DEMUX and a threshold voltage of a TFT in the DEMUX when a drift amount of the threshold voltage of the TFT in the DEMUX is greater than a first preset threshold, call a sample database according to a first output current, the operating temperature, and the threshold voltage of the preset DEMUX, determine a first gate driving high level voltage, where the sample database includes a plurality of sets of correspondences between an output current, the operating temperature, the threshold voltage, and a gate driving high level voltage, adjust the gate driving high level voltage of a DEMUX driving circuit to the first gate driving high level voltage, where the gate driving high level voltage is used to turn on the DEMUX and control the output current of the DEMUX to compensate the threshold voltage of the TFT in the DEMUX, by determining whether the drift amount of the threshold voltage of the TFT in the DEMUX is greater than the first preset threshold, if the threshold voltage is larger than the preset threshold voltage, determining the corresponding grid driving high level voltage according to the first output current of the DEMUX, and adjusting the grid driving high level voltage of the DEMUX driving circuit to the grid driving high level voltage corresponding to the first output current, so that the drift amount of the threshold voltage is compensated, and poor display is eliminated.
In order to better understand the technical solutions, the technical solutions of the present application are described in detail below through the drawings and the specific embodiments of the specification, and it should be understood that the specific features of the embodiments and examples of the present application are detailed descriptions of the technical solutions of the present application, and are not limitations of the technical solutions of the present application, and the technical features of the embodiments and examples of the present application may be combined with each other without conflict.
Fig. 1 is a structure of a display to which the method provided in the embodiment of the present application is applicable, although the method provided in the embodiment of the present application can be applied to various displays, and it should be understood that the display shown in fig. 1 is a simple illustration of a display to which the method provided in the embodiment of the present application is applicable, and is not a limitation of a display to which the method provided in the embodiment of the present application is applicable.
The display shown in fig. 1 includes a pixel unit 100, a row driver Circuit 101, a column driver Circuit 102, a DEMUX driver Circuit 103, an Integrated Circuit (IC) 104, and a TFT threshold voltage compensation device 105. The row driving circuit 101 is configured to control the pixel units 100 to be turned on and off, and specifically, the row driving circuit 101 respectively provides control signals to the row data lines G1, G2, and G3 … Gn, so as to respectively control the turning on and off of the pixel points P11, P12, and P13 … Pnm in the pixel units 100 corresponding to the row data lines G1, G2, and G3 … Gn, where different pixel points in the pixel units 100 are controlled by different row data lines, for example, the row driving circuit 101 provides a high level to the row data line G1, the row data lines G2 and G3 … Gn provide a low level, and the pixel points P11, P12, and P13 … P1m in the pixel unit 100 corresponding to the row data line G1 are in an on state, and the pixel points P21, P22, P23 … m in the pixel units 100 corresponding to the row data lines G2 and G3 … Gn are in an off state. The column driving circuit 102 includes at least one DEMUX, and is configured to write data signals into the pixel unit 100, specifically, one path of signals output from the IC104 passes through the DEMUX in the column driving circuit, and is allocated to any data line corresponding to the DEMUX by the DEMUX, for example, the DEMUX1 may be selectively allocated to any data line of the column data lines D1, D2, and D3, and the DEMUX2 may be selectively allocated to any data line of the column data lines D4, D5, and D6, where the allocation rate of the DEMUX may be 1:2, 1:3, 1:4, or others. The DEMUX driver 103 is configured to provide a control signal to the corresponding switch to control the distribution of the data signals by the DEMUX in the column driver 102, and specifically, if the DEMUX driver 103 provides a high level to the switch SW _1 and provides low levels to the switches SW _2 and SW _3, it is determined that the DEMUX will distribute the data signals to the corresponding first data line, for example, the DEMUX1 selects to distribute the data signals to the data line D1, and the DEMUX2 selects to distribute the data signals to the data line D4. The TFT threshold voltage compensation device 105 is configured to determine whether a drift amount of a threshold voltage of a TFT in any DEMUX in the column driving circuit 102 is greater than a first preset threshold, and if the drift amount is greater than the first preset threshold, adjust a gate driving high level voltage of the DEMUX driving circuit 103 to compensate the threshold voltage of the TFT in any DEMUX in the column driving circuit 102.
Referring to fig. 2, an embodiment of the present application provides a TFT threshold voltage compensation method, which can be performed by the display shown in fig. 1. The specific flow of the method is described below.
Step 201: and judging whether the drift amount of the threshold voltage of the thin film transistor TFT in the DEMUX is larger than a first preset threshold value.
In the embodiment of the application, when the DEMUX in the column driving circuit 102 is started, a minimum output current I is generatedminEnabling the DEMUX to write data signals to the corresponding pixel cells 100, thereby normally lighting each pixel point in the display. If the characteristics of the TFTs in any one of the DEMUX in the column driver circuit 102 are normal, the actual voltage V applied to the TFTs in that DEMUX1The difference between the gate driving high level voltage VGH and the threshold voltage Vth, i.e., V, supplied to the switches SW _1, SW _2, SW _3 by the DEMUX driving circuit 1031When the current on the TFT in DEMUX is I1,I1>Imin. However, as the display lifetime increases, if the characteristics of the TFTs in the DEMUX shift in the forward direction, i.e., Vth increases to Vth new, the actual voltage applied to the TFTs in the DEMUX becomes V2VGH-Vth new, apparent V2<V1Then I2<I1. When the Vth new is reduced until the difference between the Vth and the Vthnew is larger than a first preset threshold, namely the drift amount of the threshold voltage is larger than the first preset threshold, I is under the original VGH2<IminThat is, the output current of the DEMUX is smaller than the output current required for normally lighting the pixel points in the pixel unit 100 corresponding to the DEMUX, and at this time, the pixel points in the pixel unit 100 corresponding to the DEMUX cannot be normally displayed, which finally causes the display to display unevenly.
Then, in order to determine whether the drift amount of the threshold voltage of the TFT in the DEMUX is greater than a first preset threshold, the TFT threshold voltage compensation device 105 may determine whether the output current of the DEMUX is less than a second preset threshold, that is, the minimum output current I when the DEMUX is turned onminSpecifically, a standard image is displayed on the display, and the ends of the column data lines D1, D2, and D3 … Dm are connected to a current detection circuit which detects the detected currentAnd processing and amplifying the flow signal to obtain a second output current of the DEMUX, judging whether the second output current is smaller than a second preset threshold value, and if so, determining that the drift amount of the threshold voltage of the TFT in the DEMUX is larger than a first preset threshold value.
Step 202: and if so, acquiring the working temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX.
In the embodiment of the application, the characteristic preset values corresponding to the DEMUX in different environments can be obtained through a pre-experiment to obtain a sample database, wherein the threshold voltage, the gate drive high level voltage, the input current, the output current and the working temperature are in one-to-one correspondence, and when a standard image is displayed on a display, the input current is a fixed value, and the variable can be fixed. For DEMUX, the amount of drift of the threshold voltage varies at different times of use, temperatures of use. For example, the initial threshold voltage Vth is 1V, the threshold voltage may be changed to a value between-2V and 4V with time and temperature changes, and when the threshold voltage Vth is experimentally measured to be-2V, -1.5V, -1V … 4V, a data set of (threshold voltage, gate driving high level voltage, output current, operating temperature) is obtained by obtaining the gate driving high level voltage and input current at each threshold voltage and operating temperature, the experimental test may be carried out to obtain a data set of (threshold voltage, gate driving high level voltage, output current, operating temperature) … 4V, and the smaller the step change of the test is, the more accurate the obtained (threshold voltage, gate driving high level voltage, output current, operating temperature) sample database is.
After determining that the drift amount of the threshold voltage of the TFT in the DEMUX is greater than the first preset threshold, the TFT threshold voltage compensation device 105 obtains the operating temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX, specifically, obtains the second gate drive high level voltage of the DEMUX drive circuit, and calls a sample database including correspondence among a plurality of sets of output currents, operating temperatures, threshold voltages, and gate drive high level voltages according to the second output current, the second gate drive high level voltage, and the operating temperature, to determine the threshold voltage of the TFT in the DEMUX.
Step 203: calling a sample database according to a preset first output current, the working temperature and the threshold voltage of the DEMUX, and determining a first grid driving high level voltage, wherein the sample database comprises a plurality of groups of corresponding relations among the output current, the working temperature, the threshold voltage and the grid driving high level voltage.
In this embodiment, after obtaining the operating temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX, the TFT threshold voltage compensation device 105 obtains the gate drive high level voltage from the sample database according to the parameter indicating that the output is normal, specifically, according to a preset first output current of the DEMUX, the obtained operating temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX, calls the sample database including a correspondence relationship among a plurality of groups of output currents, operating temperatures, threshold voltages and gate drive high level voltages, and determines the first gate drive high level voltage, where the first output current is the output current of the DEMUX when the DEMUX writes a data signal into a corresponding pixel unit. For ease of understanding, the following description is given by way of example:
for example, if the threshold voltage of the TFT in DEMUX2 is shifted in the forward direction, the display starts to be used, and when a standard image is displayed, the gate drive high level voltage supplied to the switch SW _1 by the DEMUX driving circuit 103 is VGH, the threshold voltage of the TFT in DEMUX2 is Vth0, and the output current of D4 is I0,I0>IminAt an ambient temperature of T0. As the display lifetime increases, when a standard image is displayed, the gate-driving high-level voltage supplied to the switch SW _1 by the DEMUX driving circuit 103 is still VGH, but the output current of D4 becomes I1At an ambient temperature of T1By comparison, I1<Imin<I0Indicating that the display is in abnormal working state, and connecting VGH and I1、T1The sample database is substituted, and a value Vth1 of the current threshold voltage of the TFT in the DEMUX2 which is closest to the current threshold voltage can be obtained;
if the preset first output current of the DEMUX is I0Vth1, I0、T1And substituting the sample database to obtain a gate drive high level voltage value VGH1, and determining that VGH1 is the first gate drive high level voltage.
Step 204: and adjusting the gate drive high level voltage of the DEMUX driving circuit to the first gate drive high level voltage, wherein the gate drive high level voltage is used for starting the DEMUX, controlling the output current of the DEMUX and compensating the threshold voltage of the TFT in the DEMUX.
In this embodiment of the application, after determining the first gate driving high level voltage, the TFT threshold voltage compensation device 105 adjusts the gate driving high level voltage of the DEMUX driving circuit to the first gate driving high level voltage, so that the output current of the DEMUX is greater than the second preset threshold, that is, the output current of the DEMUX is greater than the output current required for normally lighting the pixel points in the pixel unit 100 corresponding to the DEMUX, at this time, the pixel points in the pixel unit 100 corresponding to the DEMUX can be normally displayed, and the problem of uneven display of the display due to the excessive drift of the threshold voltage of the TFT in the DEMUX, that is, the threshold voltage of the TFT in the DEMUX is compensated.
According to the TFT threshold voltage compensation method, whether the drift amount of the threshold voltage of the TFT in the DEMUX is too large or not can be judged by detecting the output current of the display for displaying a standard image DEMUX and comparing the output current with the preset standard current, if the drift amount is too large, a new grid driving high level voltage is obtained from a sample database according to parameters with normal display output, the grid driving high level voltage of the DEMUX driving circuit is adjusted to be the new grid driving high level voltage, the drift amount of the threshold voltage of the TFT in the DEMUX is compensated, and poor display is eliminated.
Based on the same inventive concept, the embodiments of the present application provide a TFT threshold voltage compensation apparatus, which is applied to the display shown in fig. 1. The TFT threshold voltage compensation means may be a hardware structure, a software module, or a hardware structure plus a software module. The TFT threshold voltage compensation device can be realized by a chip system, and the chip system can be formed by a chip and can also comprise the chip and other discrete devices. Referring to fig. 3, the TFT threshold voltage compensation apparatus includes a determining module 301, an obtaining module 302, a determining module 303, and an adjusting module 304, wherein:
the judging module 301 is configured to judge whether a drift amount of a threshold voltage of a thin film transistor TFT in the DEMUX is greater than a first preset threshold;
an obtaining module 302, configured to obtain an operating temperature of the DEMUX and a threshold voltage of a TFT in the DEMUX if the operating temperature is greater than the threshold voltage;
a determining module 303, configured to invoke a sample database according to a preset first output current of the DEMUX, the operating temperature, and the threshold voltage, and determine a first gate driving high level voltage, where the sample database includes a correspondence relationship among multiple groups of output currents, operating temperatures, threshold voltages, and gate driving high level voltages;
an adjusting module 304, configured to adjust a gate driving high level voltage of the DEMUX driving circuit to the first gate driving high level voltage, where the gate driving high level voltage is used to turn on the DEMUX, control an output current of the DEMUX, and compensate for a threshold voltage of a TFT in the DEMUX.
Optionally, the determining module 301 is specifically configured to:
displaying a standard image on the display, and acquiring a second output current of the DEMUX;
judging whether the second output current is smaller than a second preset threshold value or not;
and if the threshold voltage is smaller than the first preset threshold value, determining that the drift amount of the threshold voltage of the TFT in the DEMUX is larger than the first preset threshold value.
Optionally, the first output current is an output current of the DEMUX when the DEMUX writes a data signal into a corresponding pixel unit.
Optionally, the obtaining module 302 is specifically configured to:
acquiring a second grid driving high-level voltage of the DEMUX driving circuit;
and calling the sample database according to the first output current, the second gate drive high level voltage and the working temperature, and determining the threshold voltage of the TFT in the DEMUX.
The TFT threshold voltage compensation apparatus described above first determines, by the determining module 301, whether a drift amount of a threshold voltage of a TFT in the DEMUX is greater than a first preset threshold, and if so, obtains, by the obtaining module 302, a working temperature of the DEMUX and a threshold voltage of the TFT in the DEMUX, and then determines, by the determining module 303, a first gate driving high level voltage according to the working temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX, which are obtained by the obtaining module 302, and the adjusting module 304 adjusts the gate driving high level voltage of the DEMUX driving circuit to the first gate driving high level voltage, thereby compensating the drift amount of the threshold voltage of the TFT in the DEMUX, and eliminating display defects.
Based on the same inventive concept, an embodiment of the present application provides a TFT threshold voltage compensation system, please refer to fig. 4, where the TFT threshold voltage compensation system includes at least one processor 402 and a memory 401 connected to the at least one processor, a specific connection medium between the processor 402 and the memory 401 is not limited in the embodiment of the present application, fig. 4 is an example in which the processor 402 and the memory 401 are connected by a bus 400, the bus 400 is represented by a thick line in fig. 4, and a connection manner between other components is merely a schematic illustration and is not limited thereto. The bus 400 may be divided into an address bus, a data bus, a control bus, etc., and is shown with only one thick line in fig. 4 for ease of illustration, but does not represent only one bus or type of bus.
In the embodiment of the present application, the memory 401 stores instructions executable by the at least one processor 402, and the at least one processor 402 may execute the steps included in the TFT threshold voltage compensation method by calling the instructions stored in the memory 401.
The processor 402 is a control center of the TFT threshold voltage compensation system, and may be connected to various parts of the entire TFT threshold voltage compensation system through various interfaces and lines, and implement various functions of the TFT threshold voltage compensation system by executing instructions stored in the memory 401. Optionally, the processor 402 may include one or more processing units, and the processor 402 may integrate an application processor and a modem processor, wherein the application processor mainly handles operating systems, user interfaces, application programs, and the like, and the modem processor mainly handles wireless communications. It will be appreciated that the modem processor described above may not be integrated into the processor 402. In some embodiments, processor 402 and memory 401 may be implemented on the same chip, or in some embodiments, they may be implemented separately on separate chips.
The processor 402 may be a general-purpose processor, such as a Central Processing Unit (CPU), digital signal processor, application specific integrated circuit, field programmable gate array or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or the like, that may implement or perform the methods, steps, and logic blocks disclosed in embodiments of the present application. A general purpose processor may be a microprocessor or any conventional processor or the like. The steps of the TFT threshold voltage compensation method disclosed in connection with the embodiments of the present application may be directly implemented by a hardware processor, or implemented by a combination of hardware and software modules in the processor.
By programming the processor 402, the code corresponding to the TFT threshold voltage compensation method described in the foregoing embodiment may be solidified into a chip, so that the chip can execute the steps of the TFT threshold voltage compensation method when running, and how to program the processor 402 is a technique known by those skilled in the art, and is not described here again.
Based on the same inventive concept, the present application also provides a storage medium storing computer instructions, which when run on a computer, cause the computer to perform the steps of the TFT threshold voltage compensation method as described above.
In some possible embodiments, the various aspects of the TFT threshold voltage compensation method provided in the present application may also be implemented in the form of a program product, which includes program code for causing a TFT threshold voltage compensation system to perform the steps of the TFT threshold voltage compensation method according to various exemplary embodiments of the present application described above in this specification, when the program product runs on the TFT threshold voltage compensation system.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (10)
1. A TFT threshold voltage compensation method, applied to a display including a pixel unit, a column driver circuit and a demultiplexer DEMUX driver circuit, wherein the column driver circuit includes at least one DEMUX, the column driver circuit is configured to write a data signal into the pixel unit, and the DEMUX driver circuit is configured to control distribution of the data signal by the DEMUX in the column driver circuit, and includes:
judging whether the drift amount of the threshold voltage of a Thin Film Transistor (TFT) in the DEMUX is larger than a first preset threshold value or not;
if the threshold voltage is larger than the preset threshold voltage, acquiring the working temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX;
calling a sample database according to a preset first output current, the working temperature and the threshold voltage of the DEMUX, and determining a first grid driving high level voltage, wherein the sample database comprises a plurality of groups of corresponding relations among the output current, the working temperature, the threshold voltage and the grid driving high level voltage;
and adjusting the gate drive high level voltage of the DEMUX driving circuit to the first gate drive high level voltage, wherein the gate drive high level voltage is used for starting the DEMUX, controlling the output current of the DEMUX and compensating the threshold voltage of the TFT in the DEMUX.
2. The method of claim 1, wherein determining whether a drift amount of a threshold voltage of a Thin Film Transistor (TFT) in the DEMUX is greater than a first preset threshold value comprises:
displaying a standard image on the display, and acquiring a second output current of the DEMUX;
judging whether the second output current is smaller than a second preset threshold value or not;
and if the threshold voltage is smaller than the first preset threshold value, determining that the drift amount of the threshold voltage of the TFT in the DEMUX is larger than the first preset threshold value.
3. The method of claim 1, wherein the first output current is an output current of the DEMUX when writing a data signal to a corresponding pixel cell.
4. The method of claim 2, wherein obtaining the threshold voltage of the TFT in the DEMUX comprises:
acquiring a second grid driving high-level voltage of the DEMUX driving circuit;
and calling the sample database according to the second output current, the second gate drive high level voltage and the working temperature, and determining the threshold voltage of the TFT in the DEMUX.
5. A TFT threshold voltage compensation apparatus for a display including a pixel unit, a column driver circuit and a demultiplexer, DEMUX, driver circuit, wherein the column driver circuit includes at least one DEMUX, the column driver circuit is configured to write a data signal to the pixel unit, and the DEMUX driver circuit is configured to control distribution of the data signal by the DEMUX in the column driver circuit, the TFT threshold voltage compensation apparatus comprising:
the judging module is used for judging whether the drift amount of the threshold voltage of the thin film transistor TFT in the DEMUX is larger than a first preset threshold value or not;
the acquisition module is used for acquiring the working temperature of the DEMUX and the threshold voltage of the TFT in the DEMUX if the working temperature of the DEMUX is larger than the threshold voltage of the TFT in the DEMUX;
the determining module is used for calling a sample database according to a preset first output current of the DEMUX, the working temperature and the threshold voltage, and determining a first grid driving high level voltage, wherein the sample database comprises a plurality of groups of corresponding relations among the output current, the working temperature, the threshold voltage and the grid driving high level voltage;
and the adjusting module is used for adjusting the grid driving high level voltage of the DEMUX driving circuit to be the first grid driving high level voltage, wherein the grid driving high level voltage is used for starting the DEMUX, controlling the output current of the DEMUX and compensating the threshold voltage of the TFT in the DEMUX.
6. The apparatus of claim 5, wherein the determining module is specifically configured to:
displaying a standard image on the display, and acquiring a second output current of the DEMUX;
judging whether the second output current is smaller than a second preset threshold value or not;
and if the threshold voltage is smaller than the first preset threshold value, determining that the drift amount of the threshold voltage of the TFT in the DEMUX is larger than the first preset threshold value.
7. The apparatus of claim 5, wherein the first output current is an output current of the DEMUX when the DEMUX writes a data signal to a corresponding pixel cell.
8. The apparatus of claim 6, wherein the obtaining module is specifically configured to:
acquiring a second grid driving high-level voltage of the DEMUX driving circuit;
and calling the sample database according to the first output current, the second gate drive high level voltage and the working temperature, and determining the threshold voltage of the TFT in the DEMUX.
9. A display, comprising: TFT threshold voltage compensation device according to any of claims 5-8, and a pixel cell, a column driver circuit and a demultiplexer, DEMUX, driver circuit, wherein the column driver circuit comprises at least one DEMUX, the column driver circuit being adapted to write data signals to the pixel cell, the DEMUX driver circuit being adapted to control the distribution of DEMUX to the data signals in the column driver circuit.
10. A storage medium storing computer-executable instructions for causing a computer to perform the steps comprising the method of any one of claims 1-4.
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