CN111273116B - Shielded indoor traveling wave type electromagnetic compatibility test device - Google Patents
Shielded indoor traveling wave type electromagnetic compatibility test device Download PDFInfo
- Publication number
- CN111273116B CN111273116B CN202010258732.6A CN202010258732A CN111273116B CN 111273116 B CN111273116 B CN 111273116B CN 202010258732 A CN202010258732 A CN 202010258732A CN 111273116 B CN111273116 B CN 111273116B
- Authority
- CN
- China
- Prior art keywords
- wire
- array
- resistance
- conduction band
- electromagnetic compatibility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 81
- 239000004020 conductor Substances 0.000 claims abstract description 6
- 230000007704 transition Effects 0.000 claims description 20
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 2
- 230000005284 excitation Effects 0.000 abstract description 9
- 230000036039 immunity Effects 0.000 abstract description 7
- 230000005670 electromagnetic radiation Effects 0.000 abstract 1
- 230000005672 electromagnetic field Effects 0.000 description 6
- 230000005855 radiation Effects 0.000 description 6
- 230000007423 decrease Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000003756 stirring Methods 0.000 description 3
- 239000011358 absorbing material Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000000969 carrier Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000000265 homogenisation Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/006—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Electromagnetism (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The traveling wave type electromagnetic compatibility test device in the shielding chamber mainly comprises a shielding chamber (10), a feed source (20), a conduction band array (30) and a load resistor array (40); the conduction band array (30), the shielding chamber (10) and the load resistor array (40) form a band wire with a terminal load being a resistor; the conduction band array (30) is an inner conductor of a strip line, and the shielding chamber (10) is a ground of the strip line; the conduction band array (30) consists of a plurality of wires (31), and the load resistor array (40) consists of a plurality of mutually parallel resistor wires (41); one end of the conducting wire (31) is connected with the feed source (20), the other end of the conducting wire is connected with the resistance wire (41), and the total equivalent resistance of the load resistance array (40) is equal to the characteristic impedance of the strip wire. The device is used for electromagnetic compatibility radio frequency electromagnetic radiation immunity test, solves the problem that the lowest available frequency of the reverberation room is higher, can be even lower in the range of 10KHz to 30MHz, simultaneously keeps the uniformity of internal field intensity, has low cost and improves excitation efficiency.
Description
Technical Field
The invention relates to electromagnetic compatibility test, in particular to a shielded indoor traveling wave type electromagnetic compatibility test device.
Background
Electromagnetic compatibility testing aims to verify the sensitivity of the electrical and electronic products or systems under test (collectively referred to as test pieces) to external electromagnetic fields. In the test, the test piece needs to be in a uniform electromagnetic field, and the test device is shielded from interfering with the external environment. Electromagnetic compatibility testing is usually performed in anechoic chambers or reverberant chambers, and the anechoic chambers have lower testing efficiency compared with the anechoic chambers. Along with the application of a large number of new technologies such as 5G communication, electronic tags, power carriers and the like, a plurality of products use complex high-frequency radiation modes, the electromagnetic compatibility measurement repeatability of the existing anechoic chamber is low, and the reverberant chamber becomes a preferred test environment. The reverberation room method is applied to military standard MIL-STD-461F/G, GJB B, airborne electronic equipment standard DO-160, automobile part standard ISO 11452-11 and the like. The reverberation room method is particularly suitable for electromagnetic compatibility testing of large equipment level, the typical application is radio frequency radiation immunity testing of the whole automobile, and the standard SAE J551-16 for testing the reverberation room method of the whole automobile in the United states has been issued in three versions of 2005, 2012 and 2017, but at present, no corresponding standard exists in the world and China.
The anechoic chamber or the reverberation chamber adopts a shielding chamber structure, and the shielding chamber can shield the interference of the test device to the outside. To achieve this shielding, the insulating material of the shielding chamber is metal. The anechoic chamber has an absorbing material on the inner wall of the shielding chamber, which can absorb electromagnetic waves, and the shielding chamber can be regarded as infinite free space. The inner wall of the reverberation chamber is free of absorbing material, so that the shielding chamber corresponds to a metallic waveguide resonator. The resonant wavelength of the metal waveguide resonant cavity is determined by the shape and the size of the resonant cavity, and the wavelength at the lowest resonant frequency is about twice the length of the resonant cavity, and because the field intensity in the resonant cavity is in standing wave distribution, the uniformity of the electromagnetic field is poor and the test requirement of electromagnetic compatibility radio frequency radiation immunity cannot be met, the lowest use frequency of the common reverberation chamber is higher than a plurality of times (generally three times) of the lowest resonant frequency of the common reverberation chamber, so that enough multimode resonance is ensured. However, the resonant frequencies of the different modes are not continuously changed, although a plurality of modes are used, some test frequencies are between the resonant frequencies of the two modes, when the input impedance of the resonant cavity presents reactance, the farther the test frequency deviates from the resonant frequency, the larger the presented input reactance is, the larger the input reactance can cause large signal reflection, so that the power actually entering the reverberation chamber is far smaller than the output power of the power amplifier, and the excitation efficiency is low, sometimes only about one percent. In order to ensure the strength of the test signal inside the reverberation chamber, the required input power is very high, so that a power amplifier with very high power is used, which not only increases the test cost, but also sometimes the power requirement exceeds the maximum output power of the existing power amplifier, thereby limiting the usable range of the reverberation chamber. On the other hand, it is generally required that the spatial distribution of the field strength inside the shielding chamber is uniform when an excitation signal is present, whereas the field distribution at resonance is not uniform due to the inherent characteristics of the boundary conditions, the higher the resonance mode, the worse the uniformity of the electromagnetic field of the resonance mode inside the shielding chamber. Therefore, the boundary condition is changed by adopting a mode of randomly stirring the movable components by a stirrer, and then the field distribution of a resonance mode is changed, so that the homogenization of the electromagnetic field distribution in a shielding chamber in the time statistical average sense is realized, and the shielding chamber is also called a reverberation chamber. As the test frequency decreases, the wavelength becomes larger, so that the electrical size of the movable part "stirring" in the reverberation chamber becomes smaller, and the effect of "stirring" also decreases, and at this time the uniformity of the electromagnetic field distribution in the reverberation chamber also decreases.
Since the lowest resonance wavelength and the lowest usable frequency of the reverberant room are in a size-limited relationship, the lowest usable frequency is determined after the size of the reverberant room is determined. Existing reverberant chambers of usual size typically have a lowest available frequency above 80 MHz. If it is desired that the lowest available frequency is much lower than 80MHz, a very space-intensive reverberation chamber and a very large-volume mixer are built, resulting in a dramatic rise in construction and testing costs. Thus, it is practically difficult to realize a reverberation chamber having a minimum usable frequency much lower than 80MHz, which limits the range of applications of the reverberation chamber as an electromagnetic compatibility test device. Since various electromagnetic environments may be encountered during the running of an automobile, relevant standards prescribe that the frequency range of the electromagnetic compatibility radio frequency radiation immunity test of the automobile is 10kHz to 18GHz. Existing test devices based on reverberant rooms cannot meet such test requirements.
Disclosure of Invention
The invention provides a shielding indoor traveling wave type electromagnetic compatibility test device which can be used for electromagnetic compatibility radio frequency radiation immunity experiments, can solve the problem that the lowest available frequency based on the reverberation room test device is higher, enables the lowest available frequency to be lower than the lowest resonance frequency of a shielding room, reduces test cost, simultaneously keeps uniformity of internal field intensity, and is high in excitation efficiency.
The technical scheme is as follows:
The invention relates to a traveling wave type electromagnetic compatibility test device in a shielding room, which is characterized by comprising a shielding room, a feed source, a conduction band array and a load resistor array; the feed source, the conduction band array and the load resistor array are arranged in the shielding chamber; the conduction band array, the shielding chamber and the load resistor array form a band line with a terminal load as a resistor; the conduction band array is an inner conductor of the band wire, and the two side walls, the front wall, the rear wall, the bottom surface and the top surface of the shielding chamber are all grounds of the band wire; the conduction band array consists of a plurality of wires, and the load resistor array consists of a plurality of mutually parallel resistor wires; one end of the lead is connected with the feed source, and the other end of the lead is connected with the resistance wire; the conduction band array is divided into a transition section and a parallel section, and the two sections are connected in sequence; one end of the transition section is connected with the feed source, and the other end of the transition section is connected with the parallel section; in the parallel section, the wires are parallel to each other and are parallel to the bottom surface of the shielding chamber; the parallel section is positioned in the upper space of the shielding chamber, the height from the parallel section to the bottom surface is larger than the maximum height of the tested piece, one end of the wire is connected with the feed source, and the other end of the wire is connected with the resistance wire; one end of the resistance wire is connected with the lead wire, the other end of the resistance wire is connected with the rear wall of the shielding chamber, the resistance wire is vertical to the rear wall, and the total equivalent resistance of the load resistor array is equal to the characteristic impedance of the strip wire.
The resistance value of each resistance wire is equal, and the closer the resistance wires are to the parallel section, the larger the resistance value of the part is, so as to improve the longitudinal uniformity of the field intensity in the shielded room.
The length of each resistive wire must not be too short to ensure uniformity of field strength in the test area and to avoid interference of cavity resonance modes, typically the length of each resistive wire is greater than one half the height of the parallel section of wire.
The length of each resistive wire is less than one-eighth of the maximum operating wavelength to avoid resonance.
The width of the parallel section is larger than the width of the tested piece, and the length of the parallel section is larger than the length of the tested piece.
In order to improve the transverse uniformity of the field intensity in the shielded room measured area, the width of the parallel section should be as large as possible, and on the basis that the condition is satisfied and the height of the parallel section is larger than the maximum height of the tested piece and a certain working allowance is maintained, the transverse position of the parallel section in the shielded room can be changed so as to adjust the characteristic impedance of the strip line and facilitate the matching with the total equivalent resistance of the load resistor array.
The shape of the conduction band array at the transition section is to realize the transition of the impedance from the impedance of the connection of the conduction band array and the feed source to the impedance of the parallel section, and reduce the conflict between the band line field and the cavity mode.
The resistance of the resistive wire is a distributed resistance or one or a plurality of concentrated parameter resistances positioned on the resistive wire, and the shape of the conduction band array at the transition section is to realize the impedance transition from the impedance of the connection part of the conduction band array and the feed source to the impedance of the parallel section.
The test device scheme actually forms a double-conductor transmission line (called a strip line for short) with a load of a resistor by using the whole shielding chamber. The longitudinal direction of the strip line is the direction from the feed source towards the load, i.e. the front wall of the shielding chamber towards the rear wall. The direction perpendicular to the longitudinal direction is referred to as the transverse direction. The traditional test device based on the reverberation room is equivalent to a waveguide resonant cavity, and the transverse dimension of the reverberation room is several times of the wavelength corresponding to the lowest working frequency of the test device. On the other hand, because the terminal load of the strip line is a resistor, when the resistor is equal to the characteristic impedance of the strip line, the terminal of the strip line is not reflected, and the strip line is in a matching state, so that no standing wave exists in the longitudinal direction, the longitudinal dimension cannot limit the magnitude of the test frequency, and because the strip line is in a matching state and is in a transverse wave traveling wave mode, the field intensity of the strip line is uniformly distributed in the longitudinal direction, and the requirement of electromagnetic compatibility immunity test on field distribution is met.
In principle, unlike existing reverberant room test apparatus operating in a resonant state, in the present shielded room traveling wave electromagnetic compatibility test apparatus scheme, the shielded room operates in a non-resonant mode, so that the lowest available frequency of the present shielded room traveling wave electromagnetic compatibility test apparatus is different from the several times the lowest resonant frequency required by the reverberant room test apparatus. Therefore, under the same geometric dimension condition, the lowest available frequency of the traveling wave type electromagnetic compatibility test device of the shielding room is lower than that of the existing reverberation room test device, and even the traveling wave type electromagnetic compatibility test device can reach direct current. Meanwhile, because the feed source works in a matching state, the reflection at the excitation position of the feed source is small, and therefore the excitation efficiency is high.
Because the impedance matching requirement with the power output source is met, the characteristic impedance of the parallel section of the strip line is limited to be changed within a certain range, the changing range depends on the requirement of the voltage standing wave ratio, the characteristic impedance adjustment can be realized by adjusting the distance between the parallel section and the top surface and the width of the parallel section, the terminal load impedance value is designed according to the characteristic impedance, the resistance value of the lumped parameter of the resistor network is equal to the characteristic impedance of the parallel section through the design of the distributed resistor network, so that reflection is eliminated, the more the number of the resistor lines is, the higher the resistance value of each resistor line is, the heat dissipation of the resistor is facilitated, and the requirement on the resistance power capacity is reduced.
The beneficial effects are that: the beneficial effects of the invention are as follows: the provided shielding indoor traveling wave type electromagnetic compatibility test device can be used for electromagnetic compatibility radio frequency radiation immunity experiments, solves the problem that the lowest available frequency is higher due to the existing reverberation room technology, can be even lower in the range of 10KHz to 30MHz, reduces test cost, simultaneously maintains uniformity of internal field intensity, and improves excitation efficiency.
Drawings
FIG. 1 is a schematic diagram of a shielded indoor traveling wave electromagnetic compatibility test apparatus of the present invention;
FIG. 2 is a side view of a shielded room traveling wave type electromagnetic compatibility test apparatus of the present invention
FIG. 3 is a top view of a shielded indoor traveling wave electromagnetic compatibility test apparatus of the present invention;
In the figure, a shielding chamber (10), side walls (11), a front wall (12), a rear wall (13), a bottom surface (14), a top surface (15), a feed source (20), a conduction band array (30), a conducting wire (31), a transition section (32), a parallel section (33), a load resistor array (40) and a resistor wire (41) are shown.
Detailed Description
The invention is further described below with reference to the drawings and examples.
The invention adopts the following embodiments: the traveling wave type electromagnetic compatibility test device in the shielding chamber comprises a shielding chamber 10, a feed source 20, a conduction band array 30 and a load resistor array 40; the feed source 20, the conduction band array 30 and the load resistor array 40 are in the shielding chamber 10; the conduction band array 30, the shielding chamber 10 and the load resistor array 40 constitute a band line with a terminating load being a resistor; the conduction band array 30 is a strip-line inner conductor, and the two side walls 11, front wall 12, rear wall 13, bottom surface 14 and top surface 15 of the shield room 10 are all strip-line grounds; the conduction band array 30 is composed of a plurality of conducting wires 31, and the load resistor array 40 is composed of a plurality of mutually parallel resistor wires 41; one end of the lead 31 is connected with the feed source 20, and the other end is connected with the resistance wire 41; the conduction band array 30 is divided into a transition section 32 and a parallel section 33, and the two sections are connected in sequence; one end of the transition section 32 is connected with the feed source 20, and the other end is connected with the parallel section 33; in the parallel section 33, the wires 31 are parallel to each other and to the bottom surface 14 of the shielding chamber; the parallel section 33 is positioned in the upper space of the shielding chamber 10, the height from the parallel section 33 to the bottom surface 14 is larger than the maximum height of a tested piece, one end of the conducting wire 31 is connected with the feed source 20, and the other end of the conducting wire 31 is connected with the resistance wire 41; one end of the resistor wire 41 is connected with the conducting wire 31, the other end of the resistor wire 41 is connected with the rear wall 13 of the shielding chamber, the resistor wire 41 is vertical to the rear wall 13, and the total equivalent resistance of the load resistor array 40 is equal to the characteristic impedance of the strip wire in the parallel section 33.
The resistance of each of the resistive wires 41 is equal, the closer the resistive wire is to the parallel section 33, the greater the resistance of that portion to improve the longitudinal uniformity of the field strength within the shielded room 10 in the region.
The length of each resistive wire 41 must not be too short to ensure uniformity of the field strength of the test area and to avoid interference of cavity resonance modes, and typically the length of each resistive wire 41 is greater than half the height of the parallel segment 33 of the wire 31.
The length of each resistive wire 41 is less than one-eighth of the maximum operating wavelength to avoid resonance.
The width of the parallel section 33 is greater than the width of the test piece, and the length of the parallel section 33 is greater than the length of the test piece.
In order to improve the transverse uniformity of the field strength in the region to be shielded in the shielding chamber 10, the width of the parallel section 33 should be as large as possible, and on the basis that this condition is satisfied and the height of the parallel section 30 is larger than the maximum height of the tested piece and a certain working margin is maintained, the transverse position of the parallel section 30 in the shielding chamber 10 can be changed to adjust the characteristic impedance of the strip line, so as to be matched with the total equivalent resistance of the load resistor array 40 conveniently.
The shape of the conduction band array 30 at the transition section 32 is such that it achieves a transition in impedance from that at its connection with the feed 20 to that of the parallel section 33 and reduces the collision of the stripline field with the cavity mode. .
The resistance of the resistive wire 41 is a distributed resistance or one or several concentrated parametric resistances located on the resistive wire, the conduction band array being shaped in the transition section to achieve a transition of the impedance from its impedance at the connection to the feed to the impedance of the parallel section.
The embodiment of the device actually forms a double-conductor transmission line (called a strip line for short) with a load of resistance by using the whole shielding chamber. The longitudinal direction of the strip line is the direction from the feed source towards the load, i.e. the front wall of the shielding chamber towards the rear wall. The direction perpendicular to the longitudinal direction is referred to as the transverse direction. Existing reverberant room test apparatus correspond to waveguide resonators and require multiple modes of operation, the lateral dimensions of the reverberant room being several times the wavelength corresponding to the lowest operating frequency of the test apparatus. Unlike waveguides, the lateral dimensions of the strip line of the present embodiment may be arbitrarily small, so that the lateral dimensions do not limit the magnitude of the test frequency. On the other hand, because the terminal load of the strip line is a resistor, when the resistor is equal to the characteristic impedance of the strip line, the terminal of the strip line is not reflected, and the strip line is in a matching state, so that no standing wave exists in the longitudinal direction, the longitudinal dimension cannot limit the magnitude of the test frequency, and because the strip line is in the matching state, the field intensity of the strip line is uniformly distributed in the longitudinal direction, and the field distribution requirement of an electromagnetic compatibility test is met.
In principle, unlike prior art reverberant chamber based test apparatus that operate in a resonant state, in embodiments of the present apparatus, the shielded chamber operates in a non-resonant mode, and thus the lowest test frequency available for the present test apparatus is no longer determined by the resonant frequency of the shielded chamber. Therefore, under the same geometric dimension condition, the lowest available frequency of the traveling wave type electromagnetic compatibility test device of the shielding room is lower than that of the existing reverberation room test device, and even can reach direct current. Meanwhile, no stirrer is used, and the cost is low. Because the feed source works in a matching state, the reflection at the excitation position of the feed source is small, and the excitation efficiency is high.
If the resistance lines 41 adopt the distributed parameter resistance, the total number of the resistance lines 41 is set as n, the resistance value of each resistance line 41 is set as r, the tolerance power P of each resistance line 41, the expected total power P, and the characteristic impedance of the parallel section 33 of the strip line is set as Z, the following relationship should be satisfied:
n≥P/p;
Z=r/n。
if the resistor wire 41 uses the concentrated parameter resistor as the load resistor, and the resistance r, the withstand power P, the expected total power P of the resistor element are set, the characteristic impedance of the parallel section (33) of the strip line is Z, the total number of resistors N and the number of resistor wires 41 are N, the following relationship should be satisfied:
N≥P/p;
Z=r٠N/n2。
the parasitic inductance of the resistor wire 41 used or the concentrated parametric resistor thereon should be as low as possible in order to facilitate reduced reflection.
The test device can also adopt a quick detachable mounting mode so that after the test device is used, the test device can be restored to a reverberation mode of the shielding chamber to improve the service efficiency of the shielding chamber.
The present invention can be achieved in accordance with the above.
Claims (8)
1. The traveling wave type electromagnetic compatibility test device in the shielding room is characterized by comprising a shielding room (10), a feed source (20), a conduction band array (30) and a load resistor array (40); the feed source (20), the conduction band array (30) and the load resistor array (40) are arranged in the shielding chamber (10); the conduction band array (30), the shielding chamber (10) and the load resistor array (40) form a band wire with a terminal load being a resistor; the conduction band array (30) is an inner conductor with wires, and the two side walls (11), the front wall (12), the rear wall (13), the bottom surface (14) and the top surface (15) of the shielding chamber (10) are all grounds with wires; the conduction band array (30) consists of a plurality of wires (31), and the load resistor array (40) consists of a plurality of mutually parallel resistor wires (41); one end of the lead (31) is connected with the feed source (20), and the other end is connected with the resistance wire (41); the conduction band array (30) is divided into a transition section (32) and a parallel section (33), and the two sections are connected in sequence; one end of the transition section (32) is connected with the feed source (20), and the other end is connected with the parallel section (33); in the parallel sections (33), the wires (31) are parallel to each other and to the bottom surface (14) of the shielding chamber; the parallel section (33) is positioned in the upper space of the shielding chamber (10), the height of the parallel section (33) to the bottom surface (14) is larger than the maximum height of a tested piece, one end of the wire (31) is connected with the feed source (20), and the other end of the wire (31) is connected with the resistance wire (41); one end of the resistance wire (41) is connected with the lead wire (31), the other end of the resistance wire (41) is connected with the rear wall (13) of the shielding chamber, the resistance wire (41) is perpendicular to the rear wall (13), and the total equivalent resistance of the load resistor array (40) is equal to the characteristic impedance of the strip wire in the parallel section (33).
2. The traveling wave electromagnetic compatibility test device in a shielded room according to claim 1, characterized in that the resistance value of each resistance wire (41) is equal, the closer to the parallel section (33) the resistance value of the resistance wire is, the larger the resistance value of the section is, so as to improve the longitudinal uniformity of the field strength in the shielded room (10) in the region to be shielded.
3. The shielded room traveling wave electromagnetic compatibility test device according to claim 1, characterized in that the length of each resistive wire (41) is not too short to ensure uniformity of the field strength of the test area and to avoid interference of cavity resonance modes, the length of each resistive wire (41) being greater than half the height of the parallel section (33) wire (31).
4. The shielded indoor traveling wave electromagnetic compatibility test device of claim 1, wherein the length of each resistive wire (41) is less than one eighth of the maximum operating wavelength to avoid resonance.
5. The shielded indoor traveling wave type electromagnetic compatibility test apparatus according to claim 1, characterized in that the width of the parallel section (33) is larger than the width of the test piece, and the length of the parallel section (33) is larger than the length of the test piece.
6. The electromagnetic compatibility test device of traveling wave type in a shielded room according to claim 1, characterized in that in order to improve the transverse uniformity of the field intensity in the shielded room (10) to be measured, the width of the parallel section (33) should be as large as possible, and on the basis of satisfying this condition and the height of the parallel section (33) being larger than the maximum height of the test piece and maintaining a certain working margin, the transverse position of the parallel section (33) in the shielded room (10) can be changed to adjust the characteristic impedance of the strip line to facilitate matching with the total equivalent resistance of the load resistor array (40).
7. The shielded room traveling wave electromagnetic compatibility test device of claim 1, wherein the conduction band array (30) is shaped at a transition section (32) to achieve a transition of impedance from that of its connection to the feed (20) to that of the parallel section (33) and to reduce collisions of the stripline field with cavity modes.
8. A shielded room travelling wave electromagnetic compatibility test apparatus according to claim 1 or 2, characterized in that the resistance of the resistive wire (41) is a distributed resistance or one or several concentrated parametric resistances located on the resistive wire, the conduction band array being shaped in the transition section to achieve a transition of the impedance from its impedance at the connection with the feed source to the impedance of the parallel section.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010258732.6A CN111273116B (en) | 2020-04-03 | 2020-04-03 | Shielded indoor traveling wave type electromagnetic compatibility test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010258732.6A CN111273116B (en) | 2020-04-03 | 2020-04-03 | Shielded indoor traveling wave type electromagnetic compatibility test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111273116A CN111273116A (en) | 2020-06-12 |
| CN111273116B true CN111273116B (en) | 2024-07-30 |
Family
ID=70998177
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010258732.6A Active CN111273116B (en) | 2020-04-03 | 2020-04-03 | Shielded indoor traveling wave type electromagnetic compatibility test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111273116B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113253036B (en) * | 2021-06-11 | 2021-09-17 | 南京容测检测技术有限公司 | Darkroom reconfigurable strip line for electromagnetic compatibility test |
| CN117558220B (en) * | 2024-01-09 | 2024-04-05 | 四川信特农牧科技有限公司 | Liquid crystal display quality monitoring system and method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113253036A (en) * | 2021-06-11 | 2021-08-13 | 南京容测检测技术有限公司 | Darkroom reconfigurable strip line for electromagnetic compatibility test |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6295032B1 (en) * | 2000-05-18 | 2001-09-25 | Andrew S. Podgorski | Broadband horn antennas and electromagnetic field test facility |
| CN105823935B (en) * | 2016-05-13 | 2018-11-23 | 南京信息工程大学 | A kind of semi-anechoic chamber field uniformity test device and its method |
| CN106124891B (en) * | 2016-06-21 | 2019-03-01 | 西南交通大学 | A kind of planar circuit test space electromagnetic interference method |
| CN110311211A (en) * | 2019-06-20 | 2019-10-08 | 成都天锐星通科技有限公司 | A kind of Microstrip Receiving Antenna, transmitting antenna and vehicle-mounted phased array antenna |
-
2020
- 2020-04-03 CN CN202010258732.6A patent/CN111273116B/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113253036A (en) * | 2021-06-11 | 2021-08-13 | 南京容测检测技术有限公司 | Darkroom reconfigurable strip line for electromagnetic compatibility test |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111273116A (en) | 2020-06-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Giannini et al. | Planar circuit analysis of microstrip radial stub (short paper) | |
| Johnston et al. | An improved small antenna radiation-efficiency measurement method | |
| CN108566175B (en) | Adjustable negative group delay circuit | |
| CN111273116B (en) | Shielded indoor traveling wave type electromagnetic compatibility test device | |
| JP2001507518A (en) | Contactless transmission of electrical signals and / or energy | |
| US20190086503A1 (en) | Measurement system configured for measurements at non-calibrated frequencies | |
| CN212134841U (en) | Travelling wave type electromagnetic compatibility test device in shielding room | |
| CN105356020A (en) | Quarter-wavelength step-impedance resonator-based band-pass filter and design method | |
| Kim et al. | Characteristics of the sleeve dipole antenna used for EMC applications | |
| CN110707405A (en) | Microstrip line vertical transition structure and microwave device | |
| US9470731B1 (en) | Transverse electromagnetic cell | |
| Balanis | Circular waveguides | |
| CN113253036B (en) | Darkroom reconfigurable strip line for electromagnetic compatibility test | |
| CN106099299B (en) | Miniaturized high-isolation microwave double-frequency power divider | |
| CN110275071B (en) | High-sensitivity active electric field probe adopting door-shaped structure | |
| US5565822A (en) | TEM waveguide arrangement | |
| CN112034224A (en) | Coupling detector | |
| US20100301965A1 (en) | Waveguide System with Differential Waveguide | |
| SE515126C2 (en) | Testing apparatus and method for testing of transmission equipment | |
| CN212134840U (en) | Measuring device for low-frequency electromagnetic compatibility test | |
| Li et al. | Solving resonance problems in transitions: End-launch connector considerations for coaxial-to-microstrip transitions | |
| CN111273115A (en) | Measuring device for low-frequency electromagnetic compatibility test | |
| Darwis et al. | Cross-coupled line bandpass filter based on modified parallel-coupled line structure | |
| Gu et al. | Development of a TEM cell with 2 m in height | |
| JPH08122379A (en) | Cell for measuring minute electromagnetic wave and generating strong electromagnetic wave |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |