CN111256816A - Scattered light signal intensity acquisition method and device - Google Patents
Scattered light signal intensity acquisition method and device Download PDFInfo
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Abstract
The disclosure relates to a scattered light signal intensity acquisition method and device. The method is applied to a wide-angle light scattering device, and comprises the following steps: at a scattering angle theta on the rotary arm1When the sample is detected, controlling an image acquisition component to acquire a scattered light image corresponding to the detected sample; determining an initial light signal intensity of the scattered light image; determining the effective optical signal intensity after the stray light signal intensity is eliminated according to the initial optical signal intensity; and determining the scattered light signal intensity corresponding to the detected sample under the set slit width according to the effective light signal intensity. The method and the device can determine the intensity of the scattered light signal corresponding to the detected sample under the set slit width, so that the optimal measurement effect when the set slit width meets the measurement requirement can be obtained.
Description
Technical Field
The present disclosure relates to the field of optical scattering technologies, and in particular, to a method and an apparatus for obtaining intensity of a scattered light signal.
Background
Wide-angle static light scattering is a technique for determining relevant parameters in a sample by measuring the intensity of scattered light signals at multiple scattering angles. For example, by wide angle static light scattering, the average molecular weight of the particles in the sample can be determined.
Fig. 1 is a schematic diagram showing a configuration of a wide-angle static light scattering device in the related art. As shown in FIG. 1, the laser beam emitted from the laser is converged by a lens (L1) to a sample to be measured placed at the center of a sample cell, and aperture stops (S1 and S2) are provided in front of and behind the lens, respectively. The scattered light emitted at the angle theta sequentially passes through a polarization analyzer (P), an aperture diaphragm (S3), a lens (L2), a SLIT (SLIT), an adjustable Aperture (AW) and an adjustable Filter (FW), is finally received by a photomultiplier tube (PMT) and converted into an electric signal, and further the intensity of the scattered light signal is determined. Starting from the polarization analyzer, the components up to the photomultiplier are mounted uniformly on a rotating arm. The rotary arm may rotate about the centre of the sample cell.
In the wide-angle light scattering measurement process, the scattered light signal intensity is an important parameter influencing the measurement result, and the scattered light signal intensity can be adjusted by changing the slit width. However, in the existing wide-angle light scattering device, the width of the slit is adjusted in advance, and it is not possible to change the acquisition of the scattered light signal intensity, so that the optimal scattered light signal intensity cannot be obtained.
Disclosure of Invention
In view of this, the present disclosure provides a method and an apparatus for acquiring intensity of scattered light signals, which can determine intensity of scattered light signals corresponding to a sample to be measured under a set slit width, thereby achieving an optimal measurement effect.
According to a first aspect of the present disclosure, a scattered light signal intensity obtaining method is provided, where the method is applied to a wide-angle light scattering device, where the wide-angle light scattering device includes a laser source, a rotary arm, an image collecting component, and a sample chamber, where the sample chamber is located at an end close to a rotation center of the rotary arm, the image collecting component is installed at an end of the rotary arm away from the rotation center, and a sample to be measured is placed in the sample chamber, where an incident light beam emitted by the laser source irradiates on the sample to be measured and is scattered by the sample to be measured; the method comprises the following steps: at the rotary arm at a scattering angle theta1When the sample is detected, controlling the image acquisition component to acquire a scattered light image corresponding to the detected sample; determining an initial light signal intensity of the scattered light image; determining to eliminate spurs based on the initial optical signal strengthEffective optical signal intensity after optical signal intensity; and determining the scattered light signal intensity corresponding to the detected sample under the set slit width according to the effective light signal intensity.
In a possible implementation manner, determining, according to the effective optical signal intensity, a scattered optical signal intensity corresponding to the measured sample under a set slit width includes: judging whether an interference signal exists or not according to the effective optical signal intensity; and when no interference signal exists, determining the intensity of the scattered light signal corresponding to the detected sample under the set slit width.
In a possible implementation manner, the determining the scattered light signal intensity corresponding to the measured sample under the set slit width according to the effective light signal intensity includes: according to the effective light signal intensity, at the scattering angle theta1And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the detected sample.
In a possible implementation manner, the determining, according to the effective optical signal intensity, a corresponding scattered optical signal intensity of the measured sample at the set slit width includes: according to the effective light signal intensity, scattering at an angle theta2And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the measured sample, wherein the scattering angle theta2With said scattering angle theta1Different.
In one possible implementation, determining an initial light signal intensity of the scattered light image includes: determining a target area in the scattered light image, wherein the center of the target area is the imaging position of the measured sample in the scattered light image, the width of the target area in the direction parallel to the rotating plane of the rotary arm is larger than the set slit width, and the height of the target area in the direction perpendicular to the rotating plane is the scattering angle theta1Corresponding scattered light in a direction perpendicular to the plane of rotationA first preset multiple of the bundle height; and respectively determining the initial light signal intensity of a plurality of pixel points in the target area.
According to a second aspect of the present disclosure, there is provided a scattered light signal intensity obtaining apparatus, which is applied to a wide-angle light scattering device, where the wide-angle light scattering device includes a laser source, a rotary arm, an image collecting component and a sample chamber, the sample chamber is located at an end close to a rotation center of the rotary arm, the image collecting component is installed at an end of the rotary arm away from the rotation center, and a sample to be measured is placed in the sample chamber, where an incident light beam emitted from the laser source irradiates on the sample to be measured and is scattered by the sample to be measured; the device comprises: an acquisition module for positioning the rotary arm at a scattering angle θ1When the sample is detected, controlling the image acquisition component to acquire a scattered light image corresponding to the detected sample; a first determining module for determining an initial light signal intensity of the scattered light image; the stray light elimination module is used for determining the effective optical signal intensity after the stray light signal intensity is eliminated according to the initial optical signal intensity; and the second determining module is used for determining the scattered light signal intensity corresponding to the detected sample under the set slit width according to the effective light signal intensity.
In one possible implementation manner, the second determining module includes: the interference signal judgment submodule is used for judging whether an interference signal exists or not according to the effective optical signal intensity; and the first determining submodule is used for determining the intensity of the scattered light signal corresponding to the detected sample under the set slit width when no interference signal exists.
In one possible implementation, the set slit width includes a plurality of simulated slit widths, and the second determining module includes: a second determining submodule for determining the scattering angle theta according to the effective optical signal intensity1And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the detected sample.
In one possible implementation, the set slit width comprises a plurality of simulated slit widths,the second determining module includes: a third determining submodule for determining a scattering angle theta based on the effective optical signal intensity2And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the measured sample, wherein the scattering angle theta2With said scattering angle theta1Different.
In one possible implementation manner, the first determining module includes: a fourth determining submodule, configured to determine a target region in the scattered light image, where a center of the target region is an imaging position of the sample to be measured in the scattered light image, a width of the target region in a direction parallel to a rotation plane of the rotary arm is greater than the set slit width, and a height of the target region in a direction perpendicular to the rotation plane is the scattering angle θ1A first preset multiple of the beam height of the corresponding scattered light in a direction perpendicular to the plane of rotation; and the fifth determining submodule is used for respectively determining the initial optical signal intensity of a plurality of pixel points in the target area.
According to the scattered light signal intensity acquisition method and device disclosed by the embodiment of the disclosure, the rotating arm is positioned at a scattering angle theta1And when the slit width is set to meet the measurement requirement, the optimal measurement effect can be obtained when the slit width is set.
Other features and aspects of the present disclosure will become apparent from the following detailed description of exemplary embodiments, which proceeds with reference to the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate exemplary embodiments, features, and aspects of the disclosure and, together with the description, serve to explain the principles of the disclosure.
Fig. 1 is a schematic view showing a configuration of a wide-angle static light scattering device in the related art;
fig. 2 is a schematic flow chart of a scattered light signal intensity acquisition method according to an embodiment of the present disclosure;
FIG. 3 shows a schematic diagram of a wide-angle light scattering device of an embodiment of the present disclosure;
fig. 4 is a schematic flow chart illustrating step S22 of the scattered light signal intensity obtaining method according to an embodiment of the present disclosure;
fig. 5 is a schematic flow chart illustrating step S24 of the scattered light signal intensity obtaining method according to an embodiment of the present disclosure;
fig. 6 shows a block diagram of a scattered light signal intensity acquisition apparatus according to an embodiment of the present disclosure.
Detailed Description
Various exemplary embodiments, features and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. In the drawings, like reference numbers can indicate functionally identical or similar elements. While the various aspects of the embodiments are presented in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.
The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration. Any embodiment described herein as "exemplary" is not necessarily to be construed as preferred or advantageous over other embodiments.
Furthermore, in the following detailed description, numerous specific details are set forth in order to provide a better understanding of the present disclosure. It will be understood by those skilled in the art that the present disclosure may be practiced without some of these specific details. In some instances, methods, means, elements and circuits that are well known to those skilled in the art have not been described in detail so as not to obscure the present disclosure.
Fig. 2 is a schematic flow chart of a scattered light signal intensity obtaining method according to an embodiment of the present disclosure. The method can be applied to wide-angle light scattering devices.
Fig. 3 shows a schematic diagram of a wide-angle light scattering device of an embodiment of the present disclosure. As shown in fig. 3, the wide-angle light scattering device includes a laser source, a rotary arm, an image collecting component and a sample chamber, the sample chamber is located at one end close to the rotation center of the rotary arm, the image collecting component is installed at one end of the rotary arm far away from the rotation center, and a measured sample is placed in the sample chamber, wherein an incident light beam emitted by the laser source irradiates the measured sample and is scattered by the measured sample.
As shown in fig. 3, the incident beam emitted from the laser source is focused by the converging lens, and then irradiates on the sample to be measured and is scattered by the sample to be measured. The rotating arm is provided with the lens group, and the lens group is arranged at a position which can enable the imaging sensitive surface of the detected sample and the image acquisition component to meet the imaging relation, so that the scattered light of the detected sample can be imaged on the image acquisition component through the lens group.
As shown in fig. 2, the method may include:
step S21, the rotating arm is at scattering angle theta1And when the sample is detected, controlling the image acquisition part to acquire a scattered light image corresponding to the detected sample.
In step S22, the initial light signal intensity of the scattered light image is determined.
In step S23, the effective optical signal intensity after the stray light signal intensity is eliminated is determined according to the initial optical signal intensity.
And step S24, determining the scattered light signal intensity corresponding to the detected sample under the set slit width according to the effective light signal intensity.
Still taking the wide-angle light scattering device shown in fig. 3 as an example, the zero rotation angle of the rotating arm is consistent with the direction of the incident light beam irradiated onto the measured sample, so that the rotation angle of the rotating arm is the scattering angle corresponding to the measured sample.
Adjusting the rotary arm to the scattering angle theta1And at a scattering angle theta1And the lower control image acquisition part acquires a scattered light image corresponding to the detected sample, and further determines the initial light signal intensity of the scattered light image.
For clarity, the following uses (x, y) to denote any one pixel point in the scattered light image, where the pixel point is located in the x-th row and y-th column of the pixel array of the scattered light image, and the pixel point corresponding to the imaging position of the detected sample in the scattered light image is (x, y)0,y0) The scattered light image is represented by A (x, y)And the initial light signal intensity corresponding to the middle pixel point (x, y), wherein the x direction is parallel to the rotation plane of the rotating arm, and the y direction is vertical to the rotation plane of the rotating arm.
In one possible implementation, determining an initial light signal intensity of the scattered light image comprises:
and respectively determining the initial light signal intensity of a plurality of pixel points in the scattered light image.
For example, the initial light signal intensity A (x, y) for each pixel in the scattered light image is determined.
Fig. 4 is a flowchart illustrating a step S22 of a scattered light signal intensity obtaining method according to an embodiment of the disclosure. As shown in fig. 4, step S22 may include:
step S221, determining a target area in the scattered light image, wherein the center of the target area is the imaging position of the tested sample in the scattered light image, the width of the target area in the direction parallel to the rotating plane of the rotating arm is larger than the width of the set slit, and the height of the target area in the direction perpendicular to the rotating plane is the scattering angle theta1A first preset multiple of the beam height of the corresponding scattered light in a direction perpendicular to the plane of rotation.
Step S222, determining initial optical signal intensities of a plurality of pixels in the target region respectively.
Since no slit exists in the wide-angle light scattering device, and the slit width is set during the data processing of the scattered light image to realize the simulation of the slit (hereinafter referred to as simulated slit), the target region can be determined in the scattered light image according to the set slit width in order to simplify the data processing.
Wherein, the center of the target area is the imaging position of the detected sample in the scattered light image, namely a pixel point (x)0,y0)。
The width of the target area in the direction (x direction) parallel to the rotation plane of the rotary arm is larger than the set slit width corresponding to the analog slit. For example, let the width of the slit be k and the width of the target region in the x direction be p, where p > k, i.e. the coordinate range of the target region in the x direction isx0-p/2 to x0+p/2。
The height of the target region in the direction perpendicular to the plane of rotation (y-direction) is the scattering angle θ1A first predetermined multiple of the beam height of the corresponding scattered light in the y-direction. For example, the scattering angle θ1The height of the corresponding scattered light beam in the y direction is q, and the width of the target area in the y direction is jq, where j is a first preset multiple, that is, the coordinate range of the target area in the y direction is y0-jq/2 to y0+jq/2。
The first preset multiple is such that the height of the target area in the y direction is much larger than the scattering angle theta1The beam height of the corresponding scattered light in the y direction is, for example, a first preset multiple greater than 9, and the specific value of the first preset multiple is not limited by the present disclosure.
After the target region is determined, initial light signal intensities of a plurality of pixel points in the target region may be determined, respectively.
For example, the initial optical signal intensity a (x ', y') of each pixel in the target region is determined, where (x ', y') is the pixel in the target region that is located in the x 'th row and y' th column of the pixel array of the scattered light image.
In addition to the scattered light signal intensity corresponding to the sample to be measured, the determined initial light signal intensity also includes the scattered light signal intensity corresponding to other stray light, so that in order to accurately determine the scattered light signal intensity corresponding to the sample to be measured under the set slit width, the effective light signal intensity after the stray light signal intensity is eliminated can be determined according to the initial light signal intensity.
Still taking the above-mentioned determination of the initial optical signal intensity of each pixel point in the target region as an example, the manner of determining the effective optical signal intensity after eliminating the stray light signal intensity includes, but is not limited to, the following two manners.
The first method comprises the following steps:
when the incident beam irradiated onto the sample to be measured is a beam of poor quality, for example, an unshaped semiconductor laser, or a laser of unknown beam quality, it can be determined by the following formula:
wherein h is the scattering angle theta1And a second preset multiple of the beam height of the corresponding scattered light in the y direction, wherein the second preset multiple is smaller than the first preset multiple and is larger than 3. The specific value of the second predetermined multiple is not specifically limited by this disclosure.
R1(x') is the value of y direction in the target area0+0.5h to y0Intensity of light signal, R, of pixels of each column in the range of +1.5h2(x') is the value of y direction in the target area00.5h to y0The light signal intensity of each column of pixels in the range of-1.5 h, S (x') is the value of y in the y direction of the target area00.5h to y0Light signal intensity of each column of pixels in the range of +0.5 h.
Further, the effective optical signal intensity S of each column of pixels after the stray light signal intensity is eliminated can be determined by the following formulaIs effective(x')：
And the second method comprises the following steps:
when the incident light beam irradiated on the measured sample is a light beam with good quality, for example, the shaped laser can be used for fitting and eliminating the effective optical signal intensity S of each column of pixels after the stray light signal intensity is eliminated by using a least square method according to the following Gaussian function formulaIs effective(x')：
SIs effective(x')＝a(x')。
Wherein a (x'), b, c and d are parameters obtained by fitting.
Fig. 5 is a flowchart illustrating a step S24 of a scattered light signal intensity obtaining method according to an embodiment of the disclosure. As shown in fig. 5, step S24 may include:
step S241 determines whether there is an interference signal according to the effective optical signal intensity.
Step S242, when there is no interference signal, determining the intensity of the scattered light signal corresponding to the sample to be measured under the set slit width.
The sample to be tested is typically placed in a sample cell, and the sample cell containing the sample to be tested is then placed in a sample compartment. In practical application, scratches may exist on the surface of the sample cell, or dust exists in the sample to be measured, which may interfere with the scattered light and affect the measurement result, so that whether an interference signal exists may be determined according to the determined effective optical signal intensity, and then when it is determined that no interference signal exists, the intensity of the scattered light signal corresponding to the sample to be measured under the set slit width is further determined, so as to improve the accuracy of the measurement result.
For example, the effective optical signal intensity S of each column of pixels after the elimination of the stray light signal intensity determined aboveIs effective(x') performing polynomial fitting to obtain fitting optical signal intensity S of each row of pixelsa(x'), and further determining the variance σ:
where p is the width of the target region in the x-direction.
When the surface of the sample cell is scratched, the scattered light signal intensity is reduced, so that S is detectedIs effective(x')-SaWhen (x') < m · σ, it can be determined at the scattering angle θ1And scratches exist on the surface of the sample cell. At this time, the rotary arm can be adjusted to other scattering angles, and the corresponding measured sample is re-collected under the other scattering anglesAnd then the above-described operations of determining the initial light signal intensity, determining the effective light signal intensity after the stray light signal intensity is eliminated, and judging whether there is an interference signal are performed until it is determined that there is no interference signal.
When dust exists in the tested sample, the intensity of the scattered light signal is increased, and therefore, when S is used, S is increasedIs effective(x')-SaWhen (x') is > m.sigma, it can be determined that dust is present in the sample to be measured at the time of collecting the scattered light image. At this time, the scattering angle θ can be used1And executing the operation of determining the initial light signal intensity, determining the effective light signal intensity after eliminating the stray light signal intensity and judging whether an interference signal exists or not until determining that the interference signal does not exist according to other collected scattered light images corresponding to the detected sample.
Wherein m is a threshold parameter. The present disclosure does not limit the specific value of the threshold parameter m.
And when no interference signal exists, determining the scattered light signal intensity corresponding to the detected sample under the set slit width according to the effective light signal intensity.
In one possible implementation, the set slit width includes a plurality of simulated slit widths.
The slit is simulated by setting the slit width, and when the set slit width comprises a plurality of simulated slit widths, the scattered light image is subjected to data processing to respectively determine the scattered light signal intensities corresponding to the detected sample under different simulated slit widths, so that the optimal measurement result is obtained.
In a possible implementation manner, determining the scattered light signal intensity corresponding to the detected sample under the set slit width according to the effective light signal intensity includes:
at a scattering angle theta according to the effective optical signal intensity1And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the detected sample.
For example, the scattering angle θ can be determined according to the following equation1The intensity of the scattered light signal corresponding to the measured sample under the width k of each simulated slitL(k)：
Wherein, w is the interval between the pixel in the image acquisition part, f is the focus of lens group, and n is the refracting index of surveyed sample.
When the width k of the simulation slit is increased, the intensity of the scattered light signal is increased, and the scattering angle theta is increased1The resolution of (2) is reduced; when the simulated slit width k is reduced, the scattered light signal intensity is reduced, and the scattering angle theta is reduced1The resolution of (2) is improved. The scattered light signal intensity and the scattering angle theta of the detected sample under different simulated slit widths are determined1The two indexes of the resolution ratio are subjected to compromise consideration, so that the optimal measurement result can be obtained.
In a possible implementation manner, determining the intensity of the scattered light signal corresponding to the measured sample under the set slit width according to the effective light signal intensity includes:
at a scattering angle theta according to the effective optical signal intensity2And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the measured sample, wherein the scattering angle theta2And scattering angle theta1Different.
For example, the scattering angle θ can be determined according to the following equation2Intensity L (theta) of scattered light signal corresponding to the sample to be measured at each simulated slit width k2,k)：
For scattering angle theta1The scattered light image corresponding to the detected sample collected below is subjected to data processing, the width k of the simulation slit is fixed, and the scattering angle theta is changed2By the above formulaTo determine different scattering angles theta under the same simulated slit width2The intensity of the scattered light signal corresponding to the lower sample to be measured without adjusting the rotary arm to different scattering angles theta2And the image is collected again, so that the intensity of the scattered light signal corresponding to the detected sample under a plurality of different scattering angles is obtained by adjusting the primary rotating arm, and the measuring speed is effectively improved.
In order to increase the different scattering angles theta2The accuracy of the intensity of the scattered light signal corresponding to the lower sample to be measured, the scattering angle theta2And scattering angle theta1The angular difference therebetween may be within a preset angular range, for example, a preset angular range of-2 degrees to +2 degrees. The present disclosure is not limited to specific values of the predetermined angular range.
Fig. 6 shows a block diagram of a scattered light signal intensity acquisition apparatus according to an embodiment of the present disclosure. The device is applied to wide angle light scattering equipment, and wide angle light scattering equipment includes laser source, swinging boom, image acquisition part and sample storehouse, and the sample storehouse is located the one end of being close to the rotation center of swinging boom, and the one end of keeping away from the rotation center on the swinging boom is installed to the image acquisition part, has placed the measured sample in the sample storehouse, and wherein, incident beam that the laser source sent shines on being measured the sample and by being measured the sample scattering. As shown in fig. 6, the apparatus 60 includes:
an acquisition module 61 for scattering the angle θ at the rotary arm1When the sample is detected, controlling an image acquisition component to acquire a scattered light image corresponding to the detected sample;
a first determining module 62 for determining an initial light signal intensity of the scattered light image;
a stray light elimination module 63, configured to determine, according to the initial optical signal intensity, an effective optical signal intensity after eliminating the stray light signal intensity;
and a second determining module 64, configured to determine, according to the effective optical signal intensity, a scattered light signal intensity corresponding to the detected sample under the set slit width.
In one possible implementation, the second determining module 64 includes:
the interference signal judgment submodule is used for judging whether an interference signal exists or not according to the effective optical signal intensity;
and the first determining submodule is used for determining the intensity of the scattered light signal corresponding to the detected sample under the set slit width when no interference signal exists.
In one possible implementation, the setting of the slit width includes a plurality of simulated slit widths, and the second determining module 64 includes:
a second determining submodule for determining the scattering angle theta according to the effective light signal intensity1And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the detected sample.
In one possible implementation, the setting of the slit width includes a plurality of simulated slit widths, and the second determining module 64 includes:
a third determining submodule for determining the scattering angle theta according to the effective light signal intensity2And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the measured sample, wherein the scattering angle theta2And scattering angle theta1Different.
In one possible implementation, the first determining module 62 includes:
a fourth determining submodule for determining a target area in the scattered light image, wherein the center of the target area is the imaging position of the measured sample in the scattered light image, the width of the target area in the direction parallel to the rotation plane of the rotary arm is larger than the set slit width, and the height of the target area in the direction perpendicular to the rotation plane is the scattering angle theta1A first preset multiple of the beam height of the corresponding scattered light in a direction perpendicular to the plane of rotation;
and the fifth determining submodule is used for respectively determining the initial optical signal intensity of a plurality of pixel points in the target area.
Having described embodiments of the present disclosure, the foregoing description is intended to be exemplary, not exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen in order to best explain the principles of the embodiments, the practical application, or improvements made to the technology in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.
Claims (10)
1. A scattered light signal intensity obtaining method is applied to a wide-angle light scattering device, the wide-angle light scattering device comprises a laser source, a rotating arm, an image collecting component and a sample bin, the sample bin is located at one end close to a rotating center of the rotating arm, the image collecting component is installed at one end, far away from the rotating center, of the rotating arm, a sample to be measured is placed in the sample bin, and an incident light beam emitted by the laser source irradiates the sample to be measured and is scattered by the sample to be measured;
the method comprises the following steps:
at the rotary arm at a scattering angle theta1When the sample is detected, controlling the image acquisition component to acquire a scattered light image corresponding to the detected sample;
determining an initial light signal intensity of the scattered light image;
determining the effective optical signal intensity after the stray light signal intensity is eliminated according to the initial optical signal intensity;
and determining the scattered light signal intensity corresponding to the detected sample under the set slit width according to the effective light signal intensity.
2. The method of claim 1, wherein determining the scattered light signal intensity corresponding to the measured sample at a set slit width according to the effective light signal intensity comprises:
judging whether an interference signal exists or not according to the effective optical signal intensity;
and when no interference signal exists, determining the intensity of the scattered light signal corresponding to the detected sample under the set slit width.
3. The method of claim 1, wherein the set slit width comprises a plurality of simulated slit widths,
wherein, according to the effective optical signal intensity, determining the scattered optical signal intensity corresponding to the detected sample under the set slit width, including:
according to the effective light signal intensity, at the scattering angle theta1And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the detected sample.
4. The method of claim 1, wherein the set slit width comprises a plurality of simulated slit widths,
wherein, according to the effective optical signal intensity, determining the corresponding scattered light signal intensity of the tested sample under the set slit width, comprising:
according to the effective light signal intensity, scattering at an angle theta2And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the measured sample, wherein the scattering angle theta2With said scattering angle theta1Different.
5. The method of claim 1, wherein determining an initial light signal intensity of the scattered light image comprises:
determining a target area in the scattered light image, wherein the center of the target area is the imaging position of the measured sample in the scattered light image, the width of the target area in the direction parallel to the rotating plane of the rotary arm is larger than the set slit width, and the height of the target area in the direction perpendicular to the rotating plane is the scattering angle theta1A first preset multiple of the beam height of the corresponding scattered light in a direction perpendicular to the plane of rotation;
and respectively determining the initial light signal intensity of a plurality of pixel points in the target area.
6. A scattered light signal intensity obtaining device is applied to a wide-angle light scattering device, the wide-angle light scattering device comprises a laser source, a rotating arm, an image collecting component and a sample bin, the sample bin is located at one end close to a rotating center of the rotating arm, the image collecting component is installed at one end, far away from the rotating center, of the rotating arm, a sample to be measured is placed in the sample bin, and an incident light beam emitted by the laser source irradiates the sample to be measured and is scattered by the sample to be measured;
the device comprises:
an acquisition module for positioning the rotary arm at a scattering angle θ1When the sample is detected, controlling the image acquisition component to acquire a scattered light image corresponding to the detected sample;
a first determining module for determining an initial light signal intensity of the scattered light image;
the stray light elimination module is used for determining the effective optical signal intensity after the stray light signal intensity is eliminated according to the initial optical signal intensity;
and the second determining module is used for determining the scattered light signal intensity corresponding to the detected sample under the set slit width according to the effective light signal intensity.
7. The apparatus of claim 1, wherein the second determining module comprises:
the interference signal judgment submodule is used for judging whether an interference signal exists or not according to the effective optical signal intensity;
and the first determining submodule is used for determining the intensity of the scattered light signal corresponding to the detected sample under the set slit width when no interference signal exists.
8. The apparatus of claim 6, wherein the set slit width comprises a plurality of simulated slit widths, and wherein the second determining module comprises:
a second determining submodule for determining the scattering angle theta according to the effective optical signal intensity1And each simulation slotAnd respectively determining the intensity of the scattered light signals corresponding to the detected samples under the width of the slits.
9. The device of claim 6, wherein; characterized in that the set slit width comprises a plurality of simulated slit widths, the second determining module comprising:
a third determining submodule for determining a scattering angle theta based on the effective optical signal intensity2And under the width of each simulation slit, respectively determining the intensity of the scattered light signal corresponding to the measured sample, wherein the scattering angle theta2With said scattering angle theta1Different.
10. The apparatus of claim 6, wherein the first determining module comprises:
a fourth determining submodule, configured to determine a target region in the scattered light image, where a center of the target region is an imaging position of the sample to be measured in the scattered light image, a width of the target region in a direction parallel to a rotation plane of the rotary arm is greater than the set slit width, and a height of the target region in a direction perpendicular to the rotation plane is the scattering angle θ1A first preset multiple of the beam height of the corresponding scattered light in a direction perpendicular to the plane of rotation;
and the fifth determining submodule is used for respectively determining the initial optical signal intensity of a plurality of pixel points in the target area.
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