CN111240917A - Equipment testing method and device - Google Patents
Equipment testing method and device Download PDFInfo
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- CN111240917A CN111240917A CN202010031275.7A CN202010031275A CN111240917A CN 111240917 A CN111240917 A CN 111240917A CN 202010031275 A CN202010031275 A CN 202010031275A CN 111240917 A CN111240917 A CN 111240917A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3058—Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3058—Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations
- G06F11/3062—Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations where the monitored property is the power consumption
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Abstract
The application discloses a device testing method and device, which are used for improving the accuracy of a device testing result. The method comprises the following steps: judging whether the minimum power consumption value of the device to be tested meets a first preset condition or not in the running process of the device to be tested; under the condition that the minimum power consumption value of the to-be-tested equipment meets a first preset condition, judging whether the average power consumption value of the to-be-tested equipment meets a second preset condition or not; under the condition that the average power consumption value of the equipment does not meet a second preset condition, judging whether the variation amplitude of the power consumption value of the equipment is smaller than a preset amplitude or not; and under the condition that the variation amplitude of the equipment power is smaller than the preset amplitude, determining that the equipment to be tested is normal equipment. By adopting the scheme provided by the application, the phenomenon that the normal machine is mistaken for the abnormal machine due to overhigh environment temperature can be avoided, and the accuracy of the equipment test result is improved.
Description
Technical Field
The present disclosure relates to the field of computers, and in particular, to a method and an apparatus for testing devices.
Background
Before the equipment leaves the factory, quality detection is carried out, so that the equipment leaving the factory meets the relevant technical standards and user requirements. In particular, electronic devices may be shipped from a factory to perform detection of various indexes, where detection of device power consumption is one of the main detection indexes.
In the prior art, when detecting the power consumption of a device, the average power consumption of the device is usually detected, and when the average power consumption of the device is abnormal, the device is considered to be unqualified, but there are many reasons for causing the abnormal average power consumption of the device: for example, the screw lock of the heat dissipation module is missed, the heat dissipation paste of the heat dissipation module is not uniform, poor assembly in a factory causes the frequency locking of the processor, the main body of the processor is poor, the environment temperature is too high, the frequency reduction protection of the processor is caused, and the reason that the average power consumption of the equipment is abnormal is that the environment temperature is too high, under the condition that the frequency reduction protection of the processor is caused, after the environment temperature is improved, the power consumption can return to normal.
Disclosure of Invention
An object of the embodiments of the present application is to provide a device testing method and apparatus, so as to improve the accuracy of a device testing result.
In order to solve the technical problem, the embodiment of the application adopts the following technical scheme: a method of device testing, the method comprising:
judging whether the minimum power consumption value of the device to be tested meets a first preset condition or not in the running process of the device to be tested;
under the condition that the minimum power consumption value of the to-be-tested equipment meets a first preset condition, judging whether the average power consumption value of the to-be-tested equipment meets a second preset condition or not;
under the condition that the average power consumption value of the equipment does not meet a second preset condition, judging whether the variation amplitude of the power consumption value of the equipment is smaller than a preset amplitude or not;
and under the condition that the variation amplitude of the equipment power is smaller than the preset amplitude, determining that the equipment to be tested is normal equipment.
The beneficial effect of this application lies in: under the condition that the average power consumption value of the equipment to be tested does not meet the second preset condition, the equipment to be tested is not directly determined to be abnormal equipment, but whether the change amplitude of the power consumption value of the equipment is smaller than the preset amplitude is continuously judged; under the condition that the variation amplitude of the equipment power is smaller than the preset amplitude, the equipment to be tested is determined to be normal equipment, the condition that the normal equipment is mistaken for an abnormal equipment due to overhigh ambient temperature can be avoided, and the accuracy of the equipment test result is improved.
In one embodiment, the determining whether the minimum power consumption value of the device to be tested satisfies a first preset condition includes:
judging whether the minimum power consumption value of the device to be tested is higher than a first threshold value or not;
and under the condition that the minimum power consumption of the device to be tested is not higher than a first threshold value, determining that the minimum power consumption value does not meet a first preset condition.
In one embodiment, the method further comprises:
and under the condition that the minimum power consumption value of the device to be tested does not meet a first preset condition, determining that the device to be tested is an abnormal device.
In one embodiment, the determining whether the average power consumption value of the device to be tested satisfies a second preset condition includes:
comparing the average power consumption value of the device to be tested with a second threshold value;
determining that the average power consumption value of the equipment to be tested meets a second preset condition under the condition that the average power consumption value of the equipment to be tested is larger than a second threshold value;
and under the condition that the average power consumption value of the equipment to be tested is smaller than or equal to a second threshold value, determining that the average power consumption value of the equipment to be tested does not meet a second preset condition.
In one embodiment, the method further comprises:
and under the condition that the average power consumption value of the equipment meets a second preset condition, determining that the equipment to be tested is normal equipment.
In one embodiment, the method further comprises:
and determining the device to be tested as an abnormal device under the condition that the variation amplitude of the device power is larger than or equal to a preset amplitude.
The present application further provides an apparatus testing device, including:
the device comprises a first judgment module, a second judgment module and a control module, wherein the first judgment module is used for judging whether the minimum power consumption value of the device to be tested meets a first preset condition or not in the running process of the device to be tested;
the second judgment module is used for judging whether the average power consumption value of the equipment to be tested meets a second preset condition or not under the condition that the minimum power consumption value of the equipment to be tested meets the first preset condition;
the third judging module is used for judging whether the variation amplitude of the power consumption value of the equipment is smaller than the preset amplitude or not under the condition that the average power consumption value of the equipment does not meet a second preset condition;
the first determining module is used for determining the device to be tested to be normal device under the condition that the variation amplitude of the device power is smaller than a preset amplitude.
In one embodiment, the first determining module includes:
the judgment submodule is used for judging whether the minimum power consumption value of the device to be tested is higher than a first threshold value or not;
the first determining submodule is used for determining that the minimum power consumption value does not meet a first preset condition under the condition that the minimum power consumption of the device to be tested is not higher than a first threshold value.
In one embodiment, the apparatus further comprises:
and the second determining module is used for determining the device to be tested as abnormal equipment under the condition that the minimum power consumption value of the device to be tested does not meet the first preset condition.
In one embodiment, the second determining module includes:
the comparison submodule is used for comparing the average power consumption value of the device to be tested with a second threshold value;
the second determining submodule is used for determining that the average power consumption value of the equipment to be tested meets a second preset condition under the condition that the average power consumption value of the equipment to be tested is larger than a second threshold value;
and the third determining submodule is used for determining that the average power consumption value of the equipment to be tested does not meet a second preset condition under the condition that the average power consumption value of the equipment to be tested is smaller than or equal to a second threshold value.
Drawings
Fig. 1 is a flowchart of a device testing method according to an embodiment of the present application;
FIG. 2 is a flow chart of a method for testing a device according to another embodiment of the present application;
FIG. 3 is a flow chart of a method for testing a device according to another embodiment of the present application;
FIG. 4 is a block diagram of an apparatus testing device according to an embodiment of the present application;
fig. 5 is a block diagram of a device testing apparatus according to another embodiment of the present application.
Detailed Description
Various aspects and features of the present application are described herein with reference to the drawings.
It will be understood that various modifications may be made to the embodiments of the present application. Accordingly, the foregoing description should not be construed as limiting, but merely as exemplifications of embodiments. Those skilled in the art will envision other modifications within the scope and spirit of the application.
The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the application and, together with a general description of the application given above and the detailed description of the embodiments given below, serve to explain the principles of the application.
These and other characteristics of the present application will become apparent from the following description of preferred forms of embodiment, given as non-limiting examples, with reference to the attached drawings.
It should also be understood that, although the present application has been described with reference to some specific examples, a person of skill in the art shall certainly be able to achieve many other equivalent forms of application, having the characteristics as set forth in the claims and hence all coming within the field of protection defined thereby.
The above and other aspects, features and advantages of the present application will become more apparent in view of the following detailed description when taken in conjunction with the accompanying drawings.
Specific embodiments of the present application are described hereinafter with reference to the accompanying drawings; however, it is to be understood that the disclosed embodiments are merely exemplary of the application, which can be embodied in various forms. Well-known and/or repeated functions and constructions are not described in detail to avoid obscuring the application of unnecessary or unnecessary detail. Therefore, specific structural and functional details disclosed herein are not to be interpreted as limiting, but merely as a basis for the claims and as a representative basis for teaching one skilled in the art to variously employ the present application in virtually any appropriately detailed structure.
The specification may use the phrases "in one embodiment," "in another embodiment," "in yet another embodiment," or "in other embodiments," which may each refer to one or more of the same or different embodiments in accordance with the application.
Fig. 1 is a flowchart of a device testing method provided in an embodiment of the present application, where the method may be applied to a device providing device testing or a device to be tested itself. As shown in FIG. 1, the method includes the following steps S11-S14:
in step S11, in the running process of the device to be tested, it is determined whether the minimum power consumption value of the device to be tested meets a first preset condition;
in step S12, under the condition that the minimum power consumption value of the device to be tested satisfies the first preset condition, determining whether the average power consumption value of the device to be tested satisfies a second preset condition;
in step S13, in a case that the average power consumption value of the device does not satisfy the second preset condition, determining whether a variation amplitude of the device power consumption value is smaller than a preset amplitude;
in step S14, in the case that the variation amplitude of the device power is smaller than the preset amplitude, it is determined that the device to be tested is a normal device.
In this embodiment, in the running process of the device to be tested, it is determined whether the minimum power consumption value of the device to be tested satisfies the first preset condition, and specifically, it is determined whether the minimum power consumption value of the device to be tested satisfies the first preset condition by:
judging whether the minimum power consumption value of the device to be tested is higher than a first threshold value or not; and under the condition that the minimum power consumption of the device to be tested is not higher than a first threshold value, determining that the minimum power consumption value does not meet a first preset condition.
More specifically, determining whether the minimum power consumption value of the device to be tested is higher than the first threshold value may be implemented by the following formula 1:
where n is the duration of the test in seconds and PL1 is the first threshold. For example, the duration of the test is 20min, that n is 1200, i is the calculation start time, for example, the result of 10min later in 20min is taken, and i is 601. K1Is an allowed error value.
Under the condition that the minimum power consumption value of the device to be tested meets a first preset condition, judging whether the average power consumption value of the device to be tested meets a second preset condition or not; specifically, when judging whether the average power consumption value of the device to be tested meets a second preset condition, comparing the average power consumption value of the device to be tested with a second threshold value; if the average power consumption value of the equipment to be tested is larger than the second threshold value, determining that the average power consumption value of the equipment to be tested meets a second preset condition; and if the average power consumption value of the equipment to be tested is smaller than or equal to the second threshold value, determining that the average power consumption value of the equipment to be tested does not meet the second preset condition.
More specifically, determining whether the minimum power consumption value of the device to be tested is higher than the first threshold value may be implemented by the following formula 2:
where n is the duration of the test in seconds and PL2 is the second threshold. For example, the duration of the test is 20min, that n is 1200, i is the calculation start time, for example, the result of 10min later in 20min is taken, and i is 601. K2Is an allowed error value.
The meaning of this equation 2 is: the actual average value in the period from 601 second to 1200 second should be greater than or equal to the average value of the preset PL2 minus K2, and the value of K2 is different among different products because the average power of the products is different due to different designs of each product item. The preset value PL2 is stable power consumption expected by product design, but the PL2 design also allows fluctuation according to different use scenes, so the average value of the same time period needs to be tested, and the PL2 value is different when different product designs are used.
It should be noted that, in both formula 1 and formula 2, the test is started from the ith second, which is to obtain the average power consumption of the device after the operation is stable for a period of time, because the power tends to be stable after the device is stable, and the stable power consumption has a reference value for testing whether the device is abnormal, for example: it makes sense to take the average value of the next 10 minutes after the test time length is 20 minutes (n is 1200s), i is 601s of the calculation starting time, n-i +1 is 1200s-601s +1 is 600s, i is the average power consumption of the next 600s (10 minutes). That is, when the average power consumption value of the device is less than the second threshold value PL2 and the allowed error value K2The average power consumption value of the device does not satisfy the second preset condition.
Under the condition that the average power consumption value of the equipment does not meet a second preset condition, judging whether the change amplitude of the power consumption value of the equipment is smaller than a preset amplitude or not; specifically, whether the variation amplitude of the power consumption value of the device is smaller than the preset amplitude can be judged by the following formula 3:
wherein t is testing time in seconds; pt is the power consumption of the CPU at t seconds; pt-1 is the power consumption of the CPU at t-1 second; k3Is an allowed error value.
The meaning of the above formula 3 is: within a period of testing time, the obtained absolute value of the ratio of the current time power consumption of the CPU to the power consumption of the CPU in the previous second minus 1 is greater than or equal to a time set of K3, when an element in the set is 0 (i.e., card (p) ═ 0), it is indicated that the variation amplitude of the power consumption of the device is smaller than a preset amplitude, and in this case, although the average power of the device does not satisfy the second preset condition, the external environment temperature triggers the temperature sensor during testing, which causes the CPU to perform down-conversion protection, which is a protection mechanism of the product.
The beneficial effect of this application lies in: under the condition that the average power consumption value of the equipment to be tested does not meet the second preset condition, the equipment to be tested is not directly determined to be abnormal equipment, but whether the change amplitude of the power consumption value of the equipment is smaller than the preset amplitude is continuously judged; under the condition that the variation amplitude of the equipment power is smaller than the preset amplitude, the equipment to be tested is determined to be normal equipment, the normal equipment is prevented from being mistaken for an abnormal equipment due to overhigh ambient temperature, and the accuracy of the equipment test result is improved.
In one embodiment, as shown in FIG. 2, the above step S11 can be implemented as the following steps S21-S22:
in step S21, determining whether the minimum power consumption value of the device to be tested is higher than a first threshold;
in step S22, in the case that the minimum power consumption of the device to be tested is not higher than the first threshold, it is determined that the minimum power consumption value does not satisfy the first preset condition.
In the embodiment, whether the minimum power consumption value of the device to be tested is higher than a first threshold value is judged; and under the condition that the minimum power consumption of the device to be tested is not higher than a first threshold value, determining that the minimum power consumption value does not meet a first preset condition. Specifically, the method can be realized by the following formula 1:
where n is the duration of the test in seconds and PL1 is the first threshold. For example, the duration of the test is 20min, that n is 1200, i is the calculation start time, for example, the result of 10min later in 20min is taken, and i is 601. K1Is an allowed error value.
For example, the frequency locking power consumption of a CPU of a certain platform is 15W, the predetermined power consumption of PL1 in product design is 45W, the minimum power consumption is judged, the K value is 30W, the formula can meet the condition that the average value of the actual power consumption in a period of time is more than or equal to 45W-30W, and the K value can be set according to CPUs of different platforms or different models. That is, in determining whether the minimum power value of the device to be tested is higher than the first threshold, an error may also be set as long as the minimum power value of the device to be tested is greater than or equal to the first thresholds PL1 and K1May be determined to satisfy a first preset condition. If the minimum power of the device to be tested is less than the first threshold PL1 and K1Determining that the minimum power does not satisfy a first preset condition.
In one embodiment, the method may also be implemented as the steps of:
and under the condition that the minimum power consumption value of the device to be tested does not meet the first preset condition, determining that the device to be tested is an abnormal device.
In this embodiment, when the minimum power consumption of the device to be tested does not satisfy the first preset condition, that is, the minimum power consumption of the device to be tested does not satisfy formula 1, it is determined that the device to be tested is an abnormal device.
In one embodiment, as shown in FIG. 3, the above step S12 can be implemented as the following steps S31-S33:
comparing the average power consumption value of the device to be tested with a second threshold value in step S31;
in step S32, determining that the average power consumption value of the device to be tested satisfies a second preset condition when the average power consumption value of the device to be tested is greater than a second threshold;
in step S33, in the case that the average power consumption value of the device to be tested is less than or equal to the second threshold, it is determined that the average power consumption value of the device to be tested does not satisfy the second preset condition.
In the embodiment, under the condition that the minimum power consumption value of the device to be tested meets a first preset condition, whether the average power consumption value of the device to be tested meets a second preset condition is judged; specifically, when judging whether the average power consumption value of the device to be tested meets a second preset condition, comparing the average power consumption value of the device to be tested with a second threshold value; if the average power consumption value of the equipment to be tested is larger than the second threshold value, determining that the average power consumption value of the equipment to be tested meets a second preset condition; and if the average power consumption value of the equipment to be tested is smaller than or equal to the second threshold value, determining that the average power consumption value of the equipment to be tested does not meet the second preset condition.
Determining whether the minimum power consumption value of the device to be tested is higher than the first threshold value may be implemented by the following equation 2:
where n is the duration of the test in seconds and PL2 is the second threshold. For example, the duration of the test is 20min, that n is 1200, i is the calculation start time, for example, the result of 10min later in 20min is taken, and i is 601. K2Is an allowed error value.
The meaning of this equation 2 is: the actual average value in the period from 601 second to 1200 second should be greater than or equal to the average value of the preset PL2 minus K2, and the value of K2 is different among different products because the average power of the products is different due to different designs of each product item. The preset value PL2 is stable power consumption expected by product design, but the PL2 design also allows fluctuation according to different use scenes, so the average value of the same time period needs to be tested, and the PL2 value is different when different product designs are used.
It should be noted that, in both formula 1 and formula 2, the order is from the firstThe test is started in i seconds, so as to obtain the average power consumption of the device after the operation is stable for a period of time, because the power tends to be stable after the device is stable, and the stable power consumption has a reference value when the test device is abnormal, for example: it makes sense to take the average value of the next 10 minutes after the test time length is 20 minutes (n is 1200s), i is 601s of the calculation starting time, n-i +1 is 1200s-601s +1 is 600s, i is the average power consumption of the next 600s (10 minutes). That is, when the average power consumption value of the device is less than the second threshold value PL2 and the allowed error value K2The average power consumption value of the device does not satisfy the second preset condition.
In one embodiment, the method may also be implemented as the steps of:
and under the condition that the average power consumption value of the equipment meets a second preset condition, determining that the equipment to be tested is normal equipment.
In this embodiment, when the average power consumption of the device satisfies the second preset condition, that is, when it is determined whether the average power consumption of the device satisfies the second preset condition by the above formula 2, if the average power consumption value of the device is greater than or equal to the second threshold value PL2 and the allowed error value K2When the difference is smaller than the first threshold, the average power consumption value of the device meets a second preset condition.
In one embodiment, the method may also be implemented as the steps of:
and determining the device to be tested as abnormal equipment under the condition that the variation amplitude of the power of the device is larger than or equal to the preset amplitude.
In this embodiment, when the variation amplitude of the device power is greater than or equal to the preset amplitude, that is, when the calculation is performed according to the formula 3, if card (p) ≠ 0, it is determined that the average power consumption of the device to be tested is abnormal and is not triggered by the frequency-down protection mechanism due to the ambient temperature, and therefore, it is determined that the device to be tested is an abnormal device.
Fig. 4 is a block diagram of a device testing apparatus provided in an embodiment of the present application, where the apparatus may be applied to a device providing device testing or a device to be tested itself. As shown in fig. 4, the apparatus includes:
the first judging module 41 is configured to judge whether a minimum power consumption value of the device to be tested meets a first preset condition in an operation process of the device to be tested;
the second judging module 42 is configured to judge whether the average power consumption value of the device to be tested meets a second preset condition or not when the minimum power consumption value of the device to be tested meets the first preset condition;
a third determining module 43, configured to determine whether a variation amplitude of the power consumption value of the device is smaller than a preset amplitude when the average power consumption value of the device does not satisfy a second preset condition;
the first determining module 44 is configured to determine that the device to be tested is a normal device when the variation amplitude of the device power is smaller than the preset amplitude.
In one embodiment, as shown in fig. 5, the first determining module 41 includes:
the judgment submodule 51 is configured to judge whether the minimum power consumption value of the device to be tested is higher than a first threshold;
the first determining submodule 52 is configured to determine that the minimum power consumption value does not satisfy the first preset condition when the minimum power consumption of the device to be tested is not higher than the first threshold.
In one embodiment, the apparatus further comprises:
and the second determining module is used for determining the device to be tested as abnormal equipment under the condition that the minimum power consumption value of the device to be tested does not meet the first preset condition.
In one embodiment, the second determining module includes:
the comparison submodule is used for comparing the average power consumption value of the device to be tested with a second threshold value;
the second determining submodule is used for determining that the average power consumption value of the equipment to be tested meets a second preset condition under the condition that the average power consumption value of the equipment to be tested is larger than a second threshold value;
and the third determining submodule is used for determining that the average power consumption value of the equipment to be tested does not meet a second preset condition under the condition that the average power consumption value of the equipment to be tested is smaller than or equal to a second threshold value.
The above embodiments are only exemplary embodiments of the present application, and are not intended to limit the present application, and the protection scope of the present application is defined by the claims. Various modifications and equivalents may be made by those skilled in the art within the spirit and scope of the present application and such modifications and equivalents should also be considered to be within the scope of the present application.
Claims (10)
1. A method for testing a device, comprising:
judging whether the minimum power consumption value of the device to be tested meets a first preset condition or not in the running process of the device to be tested;
under the condition that the minimum power consumption value of the to-be-tested equipment meets a first preset condition, judging whether the average power consumption value of the to-be-tested equipment meets a second preset condition or not;
under the condition that the average power consumption value of the equipment does not meet a second preset condition, judging whether the variation amplitude of the power consumption value of the equipment is smaller than a preset amplitude or not;
and under the condition that the variation amplitude of the equipment power is smaller than the preset amplitude, determining that the equipment to be tested is normal equipment.
2. The method of claim 1, wherein the determining whether the minimum power consumption value of the device under test satisfies a first preset condition comprises:
judging whether the minimum power consumption value of the device to be tested is higher than a first threshold value or not;
and under the condition that the minimum power consumption of the device to be tested is not higher than a first threshold value, determining that the minimum power consumption value does not meet a first preset condition.
3. The method of claim 1 or 2, wherein the method further comprises:
and under the condition that the minimum power consumption value of the device to be tested does not meet a first preset condition, determining that the device to be tested is an abnormal device.
4. The method of claim 1, wherein determining whether the average power consumption value of the device under test satisfies a second preset condition comprises:
comparing the average power consumption value of the device to be tested with a second threshold value;
determining that the average power consumption value of the equipment to be tested meets a second preset condition under the condition that the average power consumption value of the equipment to be tested is larger than a second threshold value;
and under the condition that the average power consumption value of the equipment to be tested is smaller than or equal to a second threshold value, determining that the average power consumption value of the equipment to be tested does not meet a second preset condition.
5. The method of claim 1 or 4, wherein the method further comprises:
and under the condition that the average power consumption value of the equipment meets a second preset condition, determining that the equipment to be tested is normal equipment.
6. The method of any one of claims 1-5, further comprising:
and determining the device to be tested as an abnormal device under the condition that the variation amplitude of the device power is larger than or equal to a preset amplitude.
7. An apparatus testing device, comprising:
the device comprises a first judgment module, a second judgment module and a control module, wherein the first judgment module is used for judging whether the minimum power consumption value of the device to be tested meets a first preset condition or not in the running process of the device to be tested;
the second judgment module is used for judging whether the average power consumption value of the equipment to be tested meets a second preset condition or not under the condition that the minimum power consumption value of the equipment to be tested meets the first preset condition;
the third judging module is used for judging whether the variation amplitude of the power consumption value of the equipment is smaller than the preset amplitude or not under the condition that the average power consumption value of the equipment does not meet a second preset condition;
the first determining module is used for determining the device to be tested to be normal device under the condition that the variation amplitude of the device power is smaller than a preset amplitude.
8. The apparatus of claim 7, wherein the first determining module comprises:
the judgment submodule is used for judging whether the minimum power consumption value of the device to be tested is higher than a first threshold value or not;
the first determining submodule is used for determining that the minimum power consumption value does not meet a first preset condition under the condition that the minimum power consumption of the device to be tested is not higher than a first threshold value.
9. The apparatus of claim 7 or 8, wherein the apparatus further comprises:
and the second determining module is used for determining the device to be tested as abnormal equipment under the condition that the minimum power consumption value of the device to be tested does not meet the first preset condition.
10. The apparatus of claim 7, wherein the second determining module comprises:
the comparison submodule is used for comparing the average power consumption value of the device to be tested with a second threshold value;
the second determining submodule is used for determining that the average power consumption value of the equipment to be tested meets a second preset condition under the condition that the average power consumption value of the equipment to be tested is larger than a second threshold value;
and the third determining submodule is used for determining that the average power consumption value of the equipment to be tested does not meet a second preset condition under the condition that the average power consumption value of the equipment to be tested is smaller than or equal to a second threshold value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010031275.7A CN111240917B (en) | 2020-01-13 | 2020-01-13 | Equipment testing method and device |
Applications Claiming Priority (1)
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| CN104092835A (en) * | 2014-07-31 | 2014-10-08 | 广东欧珀移动通信有限公司 | Power consumption anomaly detection method and device for mobile terminal |
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| US20060242463A1 (en) * | 2005-03-29 | 2006-10-26 | Fujitsu Limited | Abnormal circuit operation detection system |
| CN104092835A (en) * | 2014-07-31 | 2014-10-08 | 广东欧珀移动通信有限公司 | Power consumption anomaly detection method and device for mobile terminal |
| CN109799385A (en) * | 2019-01-17 | 2019-05-24 | 晶晨半导体(上海)股份有限公司 | The power consumption test method and system of hardware device |
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