CN111238412A - Measuring method, system and storage medium - Google Patents

Measuring method, system and storage medium Download PDF

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Publication number
CN111238412A
CN111238412A CN202010093745.2A CN202010093745A CN111238412A CN 111238412 A CN111238412 A CN 111238412A CN 202010093745 A CN202010093745 A CN 202010093745A CN 111238412 A CN111238412 A CN 111238412A
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measurement
information
reticle
image
measured
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CN111238412B (en
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杨君
徐唐进
习先强
孙化龙
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Tianjin Spatiotemporal Measurement And Control Technology Co Ltd
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Tianjin Spatiotemporal Measurement And Control Technology Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C1/00—Measuring angles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Manufacturing & Machinery (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

The application discloses a measuring method, a measuring system and a storage medium. The method comprises the steps of measuring a measured target by using a measuring device and generating measuring information related to the measured target; detecting pose detection information related to the pose and/or position of the measurement device using a gyroscope and an accelerometer, wherein the gyroscope and the accelerometer are disposed within a platform device coupled to the measurement device; and correcting the measurement information according to the pose detection information.

Description

Measuring method, system and storage medium
Technical Field
The present application relates to the field of measurement technologies, and in particular, to a measurement method, a measurement system, and a storage medium.
Background
In a process of measuring an object to be measured by using a measuring device, for example, in a process of detecting parallelism or an angle of the object to be measured by using a light pipe measuring device, the object to be measured is easily disturbed by external factors such as vibration and jitter. Especially when the hand-held instrument is used for measurement, the hand shake influences the position and the angle of the optical axis of the measuring device, so that the measuring result generates large errors. In addition, the measuring device may have deviation of installation position and installation posture during installation and fixation, thereby easily causing large error of the measuring result.
For the technical problem that the measurement result has large errors due to the position and angle deviation of the measuring device, no effective solution is provided at present.
Disclosure of Invention
The present disclosure provides a measurement method, a measurement system, and a storage medium, which at least solve the technical problem of the prior art that a measurement result has a large error due to a position and an angle deviation of a measurement device.
According to an aspect of the present application, there is provided a measurement method including: measuring a measured target by using a measuring device and generating measuring information related to the measured target; detecting pose detection information related to the pose and/or position of the measurement device using a gyroscope and an accelerometer, wherein the gyroscope and the accelerometer are disposed within a platform device coupled to the measurement device; and correcting the measurement information according to the pose detection information.
According to another aspect of the present application, there is provided a measurement system including: a processor; and a memory coupled to the processor for providing instructions to the processor for processing the following processing steps: measuring a measured target by using a measuring device and generating measuring information related to the measured target; detecting pose detection information related to the pose and/or position of the measurement device using a gyroscope and an accelerometer, wherein the gyroscope and the accelerometer are disposed within a platform device coupled to the measurement device; and correcting the measurement information according to the pose detection information.
In summary, the present embodiment detects pose detection information related to the attitude and/or position of the measurement apparatus using a gyroscope and an accelerometer in the platform apparatus to which the measurement apparatus is mounted. Then, measurement information relating to the measured object measured by the measuring device is corrected based on the pose detection information, so that a measurement result error of the measuring device due to interference of external vibration or shake and a measurement result error of the measuring device due to a positional or angular deviation at the time of installation can be effectively compensated. Therefore, the technical problem that a measurement result caused by the position and angle deviation of the measuring device has large errors in the prior art is solved.
The above and other objects, advantages and features of the present application will become more apparent to those skilled in the art from the following detailed description of specific embodiments thereof, taken in conjunction with the accompanying drawings.
Drawings
Some specific embodiments of the present application will be described in detail hereinafter by way of illustration and not limitation with reference to the accompanying drawings. The same reference numbers in the drawings identify the same or similar elements or components. Those skilled in the art will appreciate that the drawings are not necessarily drawn to scale. In the drawings:
fig. 1 is a schematic structural diagram of a measurement platform system according to a first aspect of embodiment 1 of the present application;
FIG. 2 is a schematic cross-sectional view of a stage apparatus according to the first aspect of embodiment 1 of the present application;
fig. 3 is a schematic flow chart of a measurement method according to the first aspect of embodiment 1 of the present application;
FIG. 4 is a schematic view of an object under test detected by a measuring device fixed on a stage device according to embodiment 1 of the present application;
fig. 5 is a schematic diagram of an euler angle between a carrier coordinate system and a geographic coordinate system of the measuring apparatus according to embodiment 1 of the present application when detecting a target to be detected;
FIG. 6 is a schematic cross-sectional inside view of a measuring device according to embodiment 1 of the present application;
fig. 7 is a schematic structural view of an optical system of the measuring apparatus according to embodiment 1 of the present application;
FIG. 8A is a schematic view of a detection image formed by a first reticle and a second reticle collectively projected onto an imaging plane according to an embodiment of the present application, wherein the measurement apparatus according to FIG. 8A is not aligned with an object under test;
FIG. 8B is a further schematic view of a detection image formed by the first reticle and the second reticle collectively projected onto an imaging plane according to an embodiment of the present application, wherein the measurement device is misaligned with the object under test according to FIG. 8B;
fig. 9A is a schematic view of a detection image formed by the first reticle and the second reticle collectively projected on an imaging plane according to an embodiment of the present application, wherein a pitch angle of the object to be measured with respect to the measuring apparatus according to fig. 9A is not zero;
FIG. 9B is a schematic view of a detection image formed by the first reticle and the second reticle collectively projected on an imaging plane according to an embodiment of the present application, wherein an azimuth angle of the measured object with respect to the measuring apparatus according to FIG. 9B is not zero; and
fig. 10 is a schematic view of a measurement system according to embodiment 2 of the present application.
Detailed Description
It should be noted that, in the present disclosure, the embodiments and features of the embodiments may be combined with each other without conflict. The present disclosure will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.
In order to make the technical solutions of the present disclosure better understood by those skilled in the art, the technical solutions of the embodiments of the present disclosure will be clearly and completely described below with reference to the drawings in the embodiments of the present disclosure, and it is obvious that the described embodiments are only some embodiments of the present disclosure, not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments disclosed herein without making any creative effort, shall fall within the protection scope of the present disclosure.
It should be noted that the terms "first," "second," and the like in the description and claims of the present disclosure and in the above-described drawings are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the terms so used are interchangeable under appropriate circumstances for describing the embodiments of the disclosure herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof, unless the context clearly indicates otherwise.
Further, terms referred to in the present specification are explained as follows:
geographic coordinate system (t system for short): origin at the centre of gravity, x, of the object to be measuredtThe axis pointing east, ytAxis north, ztThe axis points along the vertical to the sky, commonly referred to as the northeast coordinate system. There are also different methods for taking geographical coordinate systems, such as northwest, northeast, etc. The different orientation of the coordinate system only affects the different signs of the projection components of a certain vector in the coordinate system, and does not affect the explanation of the basic principle of the navigation of the tested object and the accuracy of the calculation result of the navigation parameters.
Vector coordinate system (b series for short): the carrier coordinate system is fixed on the measured object and its origin is at the gravity center, x, of the measured objectbWith axis pointing forward of the longitudinal axis of the object to be measured, ybThe axis pointing to the right of the object to be measured, zbAxis vertical OxbybThe plane is upward.
Example 1
According to a first aspect of the present embodiment, fig. 1 shows a schematic structural diagram of a measurement platform system according to the present embodiment, and fig. 2 shows a schematic internal cross-sectional view of a platform device. Referring to fig. 1 and 2, the measurement platform system of the present embodiment is used for installing a measurement apparatus 300, and includes a platform apparatus 100 and a processor apparatus 200.
Wherein, platform device 100 includes: the accelerometer includes a case 110, a mounting mechanism 120 disposed on a surface of the case 110, and a gyroscope 130 and an accelerometer 140 disposed in the case 110. Wherein the mounting mechanism 120 is used to mount the measuring device 300. And the gyroscope 130 and the accelerometer 140 are used to detect pose detection information related to the pose and/or position of the measurement apparatus 300. Also, the processor device 200 is configured to correct the measurement information measured by the measurement device 300 according to the pose detection information.
In the measurement platform system shown in fig. 1, referring to fig. 3, a measurement method is proposed. Referring to fig. 3, the method includes:
s302: measuring the measured object by using the measuring device 300 and generating measuring information related to the measured object;
s304: detecting pose detection information related to the pose and/or position of the measurement apparatus 300 using the gyroscope 130 and the accelerometer 140, wherein the gyroscope 130 and the accelerometer 140 are provided in the platform apparatus 100 connected to the measurement apparatus 300; and
s306: and correcting the measurement information according to the pose detection information.
As described in the background art, in a process of measuring an object to be measured by using a measuring device, for example, in a process of detecting parallelism or an angle of the object to be measured by using a light pipe measuring device, it is easily disturbed by external factors such as vibration and jitter. Especially when the hand-held instrument is used for measurement, the hand shake influences the position and the angle of the optical axis of the measuring device, so that the measuring result generates large errors. In addition, the measuring device may have deviation of installation position and installation posture during installation and fixation, thereby easily causing large error of the measuring result.
In view of this technical problem, referring to fig. 1 to 3, the measurement method provided in this embodiment first uses the measurement device 300 to measure the target under test and generate measurement information related to the target under test, and then during the measurement of the target under test by the measurement device 300, may use the gyroscope 130 and the accelerometer 140 disposed in the platform device 100 to detect pose detection information related to the pose and/or position of the measurement device 300. In this way, the measurement method provided by the embodiment can continuously detect pose detection information related to the position and/or the posture of the measurement device 300 during the measurement of the measured object by the measurement device 300.
Finally, the measurement information measured by the measurement device 300 is corrected according to the pose detection information. For example, attitude information of the measurement apparatus 300 may be determined from the pose detection information, so that angle measurement information relating to the target object measured by the measurement apparatus 300 is corrected based on the attitude information. Or the position information of the measuring apparatus 300 may be determined from the pose detection information, so that the position measurement information relating to the measured object measured by the measuring apparatus 300 is corrected based on the position information.
In this way, the measurement method provided by the present embodiment thus detects pose detection information relating to the pose and/or position of the measurement apparatus 300 using the gyroscope 130 and the accelerometer 140 in the platform apparatus 100 connected to the measurement apparatus 300. Then, the measurement information relating to the measured object measured by the measuring apparatus 300 is corrected based on the pose detection information, so that the measurement result error of the measuring apparatus due to the disturbance of the external vibration or shake and the measurement result error of the measuring apparatus due to the positional or angular deviation at the time of installation can be effectively compensated.
Therefore, the technical problem that a measurement result caused by the position and angle deviation of the measuring device has large errors in the prior art is solved.
Alternatively, the gyroscope 130 includes a plurality of gyroscopes 130a, 130b, 130c disposed perpendicular to each other, the accelerometer 140 includes a plurality of accelerometers 140a, 140b, 140c disposed perpendicular to each other, and the operation of correcting the measurement information according to the pose detection information includes: determining attitude information and/or position information of the measuring device 300 according to the pose detection information by using a strapdown inertial navigation algorithm; and correcting the measurement information using the determined attitude information and/or position information.
Specifically, referring to fig. 2, the gyroscope 130 includes a plurality of gyroscopes 130a, 130b, 130c disposed perpendicular to each other, and the accelerometer 140 includes a plurality of accelerometers 140a, 140b, 140c disposed perpendicular to each other, wherein angular motion information of the measuring apparatus 300 is detected by the plurality of gyroscopes 130a, 130b, 130c, and linear velocity information of the measuring apparatus 300 is detected by the plurality of accelerometers 140a, 140b, 140c, so that attitude information of the measuring apparatus 300 can be obtained from the angular motion information and the linear velocity information according to a strapdown inertial navigation algorithm.
Further, the accuracy of the attitude information of the measuring apparatus 300 measured is directly affected by the accuracy of the gyroscope 130. In order to ensure the precision, a high-precision fiber optic gyroscope, such as a three-axis integrated high-precision fiber optic gyroscope, can be adopted. Or a gyroscope with the accuracy of 1% is selected, and the accuracy gyroscope can ensure that the course keeps 0.01 degree per hour and meets the requirement of measurement accuracy.
Further, accelerometer 140 may be implemented as a quartz flexure accelerometer, which is a mechanical pendulum force balance servo accelerometer. When the pendulum is sensed to input acceleration, it will generate an inertial moment about the flexible pivot, under which moment the pendulum makes an angular movement about the flexible pivot, generating an angular displacement. The differential capacitance sensor converts the displacement into capacitance variation and transmits the capacitance variation to the analog amplifier, and the analog amplifier converts the capacitance variation into a current signal and transmits the current signal to the torquer to generate a restoring torque. When the restoring moment is balanced with the moment of inertia of the pendulum, the current value to the torquer can be used to measure the magnitude of the input acceleration.
Further, the gyroscope 130 may include 3 gyroscopes 130 disposed perpendicular to each other, and the accelerometer 140 also includes 3 accelerometers 140 disposed perpendicular to each other. And thus can be used to provide pose detection information sufficient to determine the position and pose of the measurement apparatus 300.
And further optionally, the operation of correcting the measurement information measured by the measurement apparatus 300 according to the pose detection information includes: determining attitude information and/or position information of the measuring device 300 according to the pose detection information by using a strapdown inertial navigation algorithm; and correcting information measured by the measurement device 300 using the determined attitude information and/or position information.
Fig. 4 exemplarily shows that the position and the posture of the measuring apparatus 300 are detected by the platform apparatus 100. And corrects the measurement information of the measurement apparatus 300 using the measured pose detection information. Referring to fig. 4, the measuring device 300 mounted on the platform device 100 may be, for example, an optical alignment device, and is configured to perform attitude measurement on the measurement plane S1 of the measured object, specifically including measurement of the azimuth angle and the pitch angle of the measured object (i.e., attitude information of the normal line of the measurement plane S1). Specifically, referring to fig. 4, the measurement device 300 may be used to face the measurement surface S1 of the measured object, thereby acquiring angular deviation information between the axis of the measurement device 300 and the normal line of the measurement surface S1. Wherein the angular deviation information is indicative of the angular deviation between the axis of the measuring device 300 and the normal to the measuring plane S1. Thus, for example, on the coordinate axis (e.g., x) of the measurement plane S1 and the carrier coordinate system of the measured objectb2Axis) is perpendicular, the angular deviation can reflect the carrier coordinate system Ox of the measured objectb2yb2zb2With the carrier coordinate system Ox of the measuring device 300b1yb1zb1The angular deviation therebetween. For example, a carrier coordinate system Ox capable of reflecting the measured objectb2yb2zb2Relative to the carrier coordinate system Ox of the measuring device 300b1yb1zb1Azimuth angle deviation and pitch angle deviation.
Thus if the carrier coordinate system Ox of the measuring device 300 is setb1yb1zb1With a geographical coordinate system Oxt1yt1zt1If they are the same, then the measurement device 300 measures and measuresThe angular deviation between the measuring planes S1 can reflect the actual azimuth angle and pitch angle information of the measured object. So that the azimuth angle and the pitch angle information of the measured object can be measured using the measuring device 300.
However, as described in the background, in the actual measurement process, the measuring apparatus 300 itself may have an angular deviation, thereby causing a large measurement error. Therefore, according to the technical solution of the present embodiment, the attitude information of the measurement apparatus 300 can be determined according to the attitude detection information detected by the gyroscope 130 and the accelerometer 140 in the platform apparatus 100 by using the strapdown inertial navigation algorithm.
In particular, for example, but not limiting of, the processor device 200 may determine pose information of the measurement device 300 from pose detection information. For example, referring to fig. 5, the attitude information of the measuring device 300 may be, for example, a carrier coordinate system Ox of the measuring device 300b1yb1zb1Relative to the geographical coordinate system Ox of the measuring device 300t1yt1zt1Euler angle (α)1，β1，θ1) And is used to indicate the azimuth, pitch, and roll of the measuring device 300 with respect to a geographic coordinate system.
The processor means 200 may thus correct the information measured by the measuring means 300 according to the determined azimuth angle and the pitch angle of the measuring means 300.
Thereby optionally, the operation of correcting the measurement information using the determined attitude information and/or position information comprises: target attitude information relating to the attitude of the measured target measured by the measuring apparatus 300 is corrected using the determined attitude information.
Specifically, as described above, for example, the target attitude information related to the attitude of the target to be measured, which is measured by the measuring apparatus 300, may be corrected by subtracting the azimuth angle and the pitch angle determined from the attitude information measured by the platform apparatus 100 from the angle values of the azimuth angle and the pitch angle measured by the measuring apparatus 300. For specific details of the strapdown inertial navigation algorithm, reference may be made to related prior art, and detailed description is not repeated in this specification.
Optionally, the measurement device 300 comprises: a light source 310; an image acquisition unit 320; a first reticle 330 disposed in front of the light source 310; a second partition board 340 disposed in front of the image capturing unit 320; and an optical system for projecting the light source light emitted by the light source and passing through the first reticle 330 onto the measurement plane S1, and projecting the light source light reflected back from the measurement plane S1 to the image pickup unit 320 via the second reticle 340; and an image acquisition unit 320 for acquiring a detection image as measurement information, wherein the detection image comprises a first image of the first reticle 330 and a second image of the second reticle 340.
In particular, fig. 6 schematically shows a schematic cross-sectional view of the measuring device 300. Referring to fig. 6, the measuring apparatus 300 includes: the system comprises a light source 310, an image acquisition unit 320, a first reticle 330 arranged in front of the light source, a second reticle 340 arranged in front of the image acquisition unit 320, and an optical system. Fig. 7 schematically shows a structure of the optical system. Referring to fig. 7, the optical system includes an objective lens 350, a prism 360, and an eyepiece 370, wherein a first reticle 330 and a second reticle 340 are located on a focal plane of the objective lens system and the eyepiece lens system through a spectroscopic conjugate of the prism 360.
Further, as shown in fig. 6 and 7, for example, a mirror may be provided as the measurement surface S1 on the measurement target. According to the optical path reversible imaging principle, the light source light emitted from the light source 310 passes through the first reticle 330 and then passes through the objective 350 to be parallel light and then is irradiated to the reflector disposed on the target to be measured. Then, the image is reflected by the mirror, passes through the objective lens 359 and the eyepiece 370 again, and is imaged on the image plane position of the objective lens 350. Since the second reticle 340 is located at the image plane position of the objective lens 350, the optical system projects the light source light reflected from the object to be measured as parallel light to the image capturing unit 320 via the second reticle 340. So that the image capturing unit 320 disposed on the imaging plane can capture a detection image including a first image of the first scribe line of the first reticle 330 and a second image of the second scribe line of the second reticle 340, as shown in fig. 8A and 8B.
Specifically, as shown with reference to fig. 8A and 8B, when the normal of the measurement plane S1 is not parallel to the axis of the measurement apparatus 300, that is, the roll, pitch, and azimuth difference angles between the two spatially coplanar straight lines are not zero, the images formed by the first reticle 330 and the second reticle 340 projected together on the imaging plane are as shown in fig. 8A or 8B. The centers of the crosses of the first image of the first reticle 330 and the second image of the second reticle 340 are separated by a distance and are not in an overlapping position, which means that the measuring device 300 is not aligned with the measuring plane S1, i.e. there is an angular deviation.
The light source can be a 1550nm optical fiber light source (SFS) which is based on Amplified Spontaneous Emission (ASE) of an erbium-doped optical fiber, and the optical fiber light source has the advantages of good temperature stability, large output power, long service life and low polarization correlation. Further, the image capturing unit 320 is, for example, but not limited to, a trigger CCD camera.
Optionally, the processor means 200 of the measurement platform system is configured for: determining the azimuth angle and the pitch angle of the detected target according to the detection image; and correcting the determined azimuth angle and the pitch angle according to the pose detection information.
Referring specifically to fig. 9A and 9B, when the axis of the measuring device 300 is not parallel to the normal of the measuring plane S1, the cross of the first image and the cross of the second image may not coincide. In which when the axis of the measuring device 300 is deviated from the normal of the measuring plane S1 by a pitch angle, the first image and the second image are deviated in position in the vertical direction as shown in fig. 9A. When the axis of the measuring device 300 is deviated azimuthally from the normal line of the measuring plane S1, the first image and the second image are deviated in position in the horizontal direction as shown in fig. 9B.
Referring also to fig. 9A and 9B, when there are azimuthal and elevation angle deviations of the axis of the measuring device 300 from the normal of the measuring plane S1, there are positional deviations of the first and second images in both the horizontal and vertical directions. Therefore, the azimuth angle deviation and the pitch angle deviation of the measurement plane S1 with respect to the measurement device 300 can be determined according to the positions of the first image and the second image, and thus the azimuth angle deviation and the pitch angle deviation can be used as the angle value of the measured target azimuth angle in the pitch angle.
Specifically, the posture information of the object to be measured is determined from the first image and the second image projected on the image capturing unit 320. Wherein the second image is used as a reference image, and the relative displacement (Δ x, Δ y) of the first image relative to the second image can be obtained. And the azimuth angle k of the measured object relative to the measuring device 300 can be obtained by the following formulaiAnd a pitch angle phii。
ki＝Δx/Sx
φi＝Δy/Sy
Wherein SxIs a scale factor in the horizontal direction, SyIs a scale factor in the vertical direction. And wherein SxAnd SyIn pixels/arcsec (height imaged per arcsec resolution/CCD size), these two parameters can be calibrated in advance.
Optionally, the operation of correcting the measurement information by using the determined attitude information and/or position information includes: determining the azimuth angle and the pitch angle of the detected target according to the detection image; and correcting the determined azimuth angle and the pitch angle according to the pose detection information.
Specifically, as before, the azimuth angle and the pitch angle of the object under test can be determined from the inspection image and then the azimuth angle α of the measuring device 300 is used1And pitch angle β1Azimuth k to the above measured objectiAnd a pitch angle phiiAnd (6) carrying out correction. Specifically, the calculated azimuth k of the measured object may be usediMinus the azimuth α of the measuring device 3001To determine the final azimuth angle of the measured object and the calculated pitch angle phi of the measured objectiMinus the pitch angle β of the measuring device 3001And determining the final pitch angle of the measured target.
Therefore, according to the technical scheme of the embodiment, the attitude information of the measured target relative to the measuring device can be calculated by using optical projection imaging and image processing technologies, and the measured attitude information of the measured target is corrected in real time by using the attitude information about the measuring device acquired by the inertial sensor in the platform device, so that the detection accuracy can be ensured, and the attitude information of the measured target can also be calculated in real time.
In addition, referring to fig. 2, the platform device 100 further includes a signal acquisition circuit 150 disposed in the box body 110, a handheld unit 160 disposed on the outer surface of the two symmetrical sides of the box body 110, and a power circuit 170 disposed in the box body 110. Wherein the signal acquisition circuit 150 is configured to acquire pose detection information from the gyroscope 130 and the accelerometer 140; by the handheld unit 160, a user can flexibly move the platform device 100 by holding the handheld unit 160, so that the platform device can be applied to various measurement occasions; the power circuit 170 is used to supply power to the gyroscope 130, the gyroscope signal acquisition circuit 150, and the accelerometer 140.
Further, according to a second aspect of the present embodiment, there is provided a storage medium. The storage medium comprises a stored program, wherein the method of any of the above is performed by a processor when the program is run.
In summary, the present embodiment detects pose detection information related to the attitude and/or position of the measurement apparatus using a gyroscope and an accelerometer in the platform apparatus to which the measurement apparatus is mounted. Then, measurement information relating to the measured object measured by the measuring device is corrected based on the pose detection information, so that a measurement result error of the measuring device due to interference of external vibration or shake and a measurement result error of the measuring device due to a positional or angular deviation at the time of installation can be effectively compensated. Therefore, the technical problem that a measurement result caused by the position and angle deviation of the measuring device has large errors in the prior art is solved.
Example 2
Fig. 10 shows a measurement system 1000 according to the present embodiment, the device 1000 corresponding to the method according to the first aspect of embodiment 1. Referring to fig. 10, the apparatus 1000 includes: a processor 1010; and a memory 1020 coupled to the processor 1010 for providing instructions to the processor 1010 to process the following process steps: measuring the measured object by using the measuring device 300 and generating measuring information related to the measured object; detecting pose detection information related to the pose and/or position of the measurement apparatus 300 using the gyroscope 130 and the accelerometer 140, wherein the gyroscope 130 and the accelerometer 140 are provided in the platform apparatus 100 connected to the measurement apparatus 300; and correcting the measurement information according to the pose detection information.
Alternatively, the gyroscope 130 includes a plurality of gyroscopes 130a, 130b, 130c disposed perpendicular to each other, the accelerometer 140 includes a plurality of accelerometers 140a, 140b, 140c disposed perpendicular to each other, and the operation of correcting the measurement information according to the pose detection information includes: determining attitude information and/or position information of the measuring device 300 according to the pose detection information by using a strapdown inertial navigation algorithm; and correcting the measurement information using the determined attitude information and/or position information.
Optionally, the operation of correcting the measurement information by using the determined attitude information and/or position information includes: target attitude information relating to the attitude of the measured target measured by the measuring apparatus 300 is corrected using the determined attitude information.
Optionally, the measurement device 300 comprises: a light source 310; an image acquisition unit 320; a first reticle 330 disposed in front of the light source 310; a second partition board 340 disposed in front of the image capturing unit 320; and an optical system for projecting the light source light emitted by the light source and passing through the first reticle 330 onto the measurement plane S1, and projecting the light source light reflected back from the measurement plane S1 to the image pickup unit 320 via the second reticle 340; and an image acquisition unit 320 for acquiring a detection image as measurement information, wherein the detection image comprises a first image of the first reticle 330 and a second image of the second reticle 340.
Optionally, the operation of correcting the measurement information by using the determined attitude information and/or position information includes: determining the azimuth angle and the pitch angle of the detected target according to the detection image; and correcting the determined azimuth angle and the pitch angle according to the pose detection information.
Thus, in this way, the measurement system 1000 provided by the present embodiment detects pose detection information relating to the pose and/or position of the measurement apparatus 300 using the gyroscope and the accelerometer in the platform apparatus. Then, the measurement information relating to the measured object measured by the measuring device 300 is corrected based on the pose detection information, so that the measurement result error of the measuring device 300 due to the disturbance of the external vibration or shake and the measurement result error of the measuring device due to the positional or angular deviation at the time of installation can be effectively compensated. Therefore, the technical problem that a measurement result caused by the position and angle deviation of the measuring device has large errors in the prior art is solved.
The relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present disclosure unless specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective portions shown in the drawings are not drawn in an actual proportional relationship for the convenience of description. Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate. In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
Spatially relative terms, such as "above … …," "above … …," "above … …," "above," and the like, may be used herein for ease of description to describe one device or feature's spatial relationship to another device or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if a device in the figures is turned over, devices described as "above" or "on" other devices or configurations would then be oriented "below" or "under" the other devices or configurations. Thus, the exemplary term "above … …" can include both an orientation of "above … …" and "below … …". The device may be otherwise variously oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
In the description of the present disclosure, it is to be understood that the orientation or positional relationship indicated by the directional terms such as "front, rear, upper, lower, left, right", "lateral, vertical, horizontal" and "top, bottom", etc., are generally based on the orientation or positional relationship shown in the drawings, and are presented only for the convenience of describing and simplifying the disclosure, and in the absence of a contrary indication, these directional terms are not intended to indicate and imply that the device or element being referred to must have a particular orientation or be constructed and operated in a particular orientation, and therefore, should not be taken as limiting the scope of the disclosure; the terms "inner and outer" refer to the inner and outer relative to the profile of the respective component itself.
The above description is only for the preferred embodiment of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (10)

1. A method of measurement, comprising:
measuring a target to be measured by using a measuring device (300) and generating measurement information related to the target to be measured;
detecting pose detection information related to a pose and/or position of the measurement device (300) using a gyroscope (130) and an accelerometer (140), wherein the gyroscope (130) and the accelerometer (140) are disposed within a platform device (100) connected to the measurement device (300); and
and correcting the measurement information according to the pose detection information.
2. The measurement method according to claim 1, wherein the gyroscope (130) includes a plurality of gyroscopes (130a, 130b, 130c) that are provided perpendicular to each other, the accelerometer (140) includes a plurality of accelerometers (140a, 140b, 140c) that are provided perpendicular to each other, and the operation of correcting the measurement information according to the pose detection information includes:
determining attitude information and/or position information of the measuring device (300) according to the pose detection information by using a strapdown inertial navigation algorithm; and
correcting the measurement information using the determined attitude information and/or position information.
3. The measurement method according to claim 2, wherein the operation of correcting the measurement information using the determined attitude information and/or position information comprises: target attitude information relating to the attitude of the measured target measured by the measuring device (300) is corrected using the determined attitude information.
4. The measurement method according to any one of claims 1 to 3, characterized in that the measurement device (300) comprises: a light source (310); an image acquisition unit (320); a first reticle (330) disposed in front of the light source (310); a second reticle (340) disposed in front of the image acquisition unit (320); and an optical system, wherein
The optical system is used for projecting light source light emitted by the light source and passing through the first reticle (330) onto a measurement plane (S1), and projecting the light source light reflected back from the measurement plane (S1) to the image acquisition unit (320) via the second reticle (340); and
the image acquisition unit (320) is configured to acquire a detection image as the measurement information, wherein the detection image comprises a first image of a first reticle of the first reticle (330) and a second image of a second reticle of the second reticle (340).
5. The measurement method according to claim 4, wherein the operation of correcting the measurement information using the determined attitude information and/or position information comprises:
determining the azimuth angle and the pitch angle of the detected target according to the detection image; and
and correcting the determined azimuth angle and the pitch angle according to the pose detection information.
6. A storage medium comprising a stored program, wherein the method of any one of claims 1 to 5 is performed by a processor when the program is run.
7. A measurement system, comprising:
a processor; and
a memory coupled to the processor for providing instructions to the processor for processing the following processing steps:
measuring a target to be measured by using a measuring device (300) and generating measurement information related to the target to be measured;
detecting pose detection information related to a pose and/or position of the measurement device (300) using a gyroscope (130) and an accelerometer (140), wherein the gyroscope (130) and the accelerometer (140) are disposed within a platform device (100) connected to the measurement device (300); and
and correcting the measurement information according to the pose detection information.
8. The measurement system according to claim 7, wherein the gyroscope (130) includes a plurality of gyroscopes (130a, 130b, 130c) disposed perpendicular to each other, the accelerometer (140) includes a plurality of accelerometers (140a, 140b, 140c) disposed perpendicular to each other, and the operation of correcting the measurement information according to the pose detection information includes:
determining attitude information and/or position information of the measuring device (300) according to the pose detection information by using a strapdown inertial navigation algorithm; and
correcting the measurement information using the determined attitude information and/or position information.
9. The measurement system of claim 8, wherein the operation of correcting the measurement information using the determined attitude information and/or position information comprises: target attitude information relating to the attitude of the measured target measured by the measuring device (300) is corrected using the determined attitude information.
10. The measurement system according to any of claims 7 to 9, wherein the measurement device (300) comprises: a light source (310); an image acquisition unit (320); a first reticle (330) disposed in front of the light source (310); a second reticle (340) disposed in front of the image acquisition unit (320); and an optical system, wherein
The optical system is used for projecting light source light emitted by the light source and passing through the first reticle (330) onto a measurement plane (S1), and projecting the light source light reflected back from the measurement plane (S1) to the image acquisition unit (320) via the second reticle (340); and
the image acquisition unit (320) is configured to acquire a detection image as the measurement information, wherein the detection image comprises a first image of a first reticle of the first reticle (330) and a second image of a second reticle of the second reticle (340).
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