CN111307072B - Measuring platform system and measuring system - Google Patents
Measuring platform system and measuring system Download PDFInfo
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- CN111307072B CN111307072B CN202010093755.6A CN202010093755A CN111307072B CN 111307072 B CN111307072 B CN 111307072B CN 202010093755 A CN202010093755 A CN 202010093755A CN 111307072 B CN111307072 B CN 111307072B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C1/00—Measuring angles
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
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- Engineering & Computer Science (AREA)
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- Length Measuring Devices With Unspecified Measuring Means (AREA)
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Abstract
The application discloses measurement platform system and measurement system for installation measuring device, wherein, including platform device and treater device, wherein the platform device includes: a box body; the mounting mechanism is arranged on the surface of the box body and used for mounting the measuring device; and a gyroscope and an accelerometer disposed within the housing, wherein the gyroscope and the accelerometer are configured to detect pose detection information related to a pose and/or a position of the measurement device, and the processor device is configured to correct measurement information measured by the measurement device based on the pose detection information.
Description
Technical Field
The present application relates to the field of measurement technologies, and in particular, to a measurement platform system and a measurement system.
Background
In the process of measuring an object to be measured by using a measuring device, for example, in the process of detecting the parallelism or angle of the object to be measured by using a light pipe measuring device, the device is easily interfered by external factors such as vibration and jitter. Especially when the hand-held instrument is used for measurement, the hand shake influences the position and the angle of the optical axis of the measuring device, so that the measuring result generates large errors. In addition, the measuring device may have deviation of installation position and installation posture during installation and fixation, thereby easily causing large error of the measuring result.
For the technical problem that the measurement result has large errors due to the position and angle deviation of the measuring device, no effective solution is provided at present.
Disclosure of Invention
The present disclosure provides a measuring platform system and a measuring system to at least solve the technical problem of large error in the measurement result caused by the position and angle deviation of the measuring device in the prior art.
According to an embodiment of the application, a measurement platform system is provided for mounting a measurement device. The system comprises a platform device and a processor device. Wherein, platform device includes: a box body; the mounting mechanism is arranged on the surface of the box body and used for mounting the measuring device; and a gyroscope and an accelerometer disposed within the case, wherein the gyroscope and the accelerometer are configured to detect pose detection information associated with a pose and/or a position of the measurement device. And the processor device is configured to correct the measurement information measured by the measurement device according to the pose detection information.
Optionally, the gyroscope comprises a plurality of gyroscopes arranged perpendicular to each other and the accelerometer comprises a plurality of accelerometers arranged perpendicular to each other.
Optionally, the operation of correcting the measurement information measured by the measurement device according to the pose detection information includes: determining attitude information and/or position information of the measuring device according to the pose detection information by using a strapdown inertial navigation algorithm; and correcting the measured information using the determined attitude information and/or position information.
Optionally, the operation of correcting the measurement information by using the determined attitude information and/or position information includes: and correcting target attitude information related to the attitude of the measured object, which is measured by the measuring device, by using the determined attitude information.
Optionally, the platform device further comprises a signal acquisition circuit arranged in the box body, and the signal acquisition circuit is connected with the gyroscope and the accelerometer and used for acquiring pose detection information from the gyroscope and the accelerometer.
Optionally, a signal output interface is arranged on the box body, the signal output interface is connected with the signal acquisition circuit, and the processor device is connected with the signal output interface.
Optionally, the processor device is a processor disposed in the box, and the box is provided with a measurement information input interface, where the measurement information input interface is used to receive measurement information collected by the measurement device. And wherein the processor is configured to: receiving measurement information collected by a measurement device from a measurement information input interface and pose detection information from a gyroscope and an accelerometer; and correcting the measurement information according to the pose detection information.
Optionally, the operation of correcting the measurement information according to the pose detection information includes: determining attitude information and/or position information of the measuring device according to the pose detection information by using a strapdown inertial navigation algorithm; and correcting the measurement information using the determined attitude information and/or position information.
Optionally, the operation of correcting the measurement information by using the determined attitude information and/or position information includes: and correcting target attitude information related to the attitude of the measured object, which is measured by the measuring device, using the determined attitude information.
Alternatively, the case is in a rectangular parallelepiped shape, and the plurality of gyroscopes are respectively provided inside mutually perpendicular case walls of the case.
Optionally, the at least one gyroscope is disposed inside a wall of the tank in which the mounting mechanism is disposed.
Optionally, the platform device further comprises a handheld component disposed on an outer surface of the box body.
Optionally, the platform device further includes a power circuit disposed in the box, and the power circuit is configured to supply power to the gyroscope, the accelerometer, and the signal acquisition circuit.
According to a second aspect of the embodiments of the present application, there is provided a measurement system for measuring an attitude of an object to be measured, including a measurement device, and a measurement platform system for mounting the measurement device. Wherein the measuring platform system is any one of the above measuring platform systems, and wherein the platform device of the measuring platform system is connected with the measuring device through a mounting mechanism on the surface of the box body.
Optionally, the measuring device comprises: a light source; an image acquisition unit; a first reticle disposed in front of the light source; the second reticle is arranged in front of the image acquisition unit; and an optical system. Wherein the optical system is used for projecting light source light emitted by the light source and passing through the first reticle onto a measurement surface of the object to be measured, and projecting light source light reflected from the measurement surface to the image acquisition unit via the second reticle. And the image acquisition unit is configured to acquire a detection image as the measurement information, wherein the detection image comprises a first image of a first reticle of the first reticle and a second image of a second reticle of the second reticle.
Optionally, the processor means of the measurement platform system is configured to: determining the azimuth angle and the pitch angle of the measured object according to the detection image; and correcting the determined azimuth angle and the pitch angle according to the pose detection information.
In summary, the present embodiment detects pose detection information related to the attitude and/or position of the measurement apparatus using a gyroscope and an accelerometer in the platform apparatus to which the measurement apparatus is mounted. Then, measurement information relating to the measured object measured by the measuring device is corrected based on the pose detection information, so that a measurement result error of the measuring device due to interference of external vibration or jitter and a measurement result error of the measuring device due to a positional or angular deviation at the time of installation can be effectively compensated. Therefore, the technical problem that a measurement result caused by the position and angle deviation of the measuring device has large errors in the prior art is solved.
The above and other objects, advantages and features of the present application will become more apparent to those skilled in the art from the following detailed description of specific embodiments thereof, taken in conjunction with the accompanying drawings.
Drawings
Some specific embodiments of the present application will be described in detail hereinafter by way of illustration and not limitation with reference to the accompanying drawings. The same reference numbers in the drawings identify the same or similar elements or components. Those skilled in the art will appreciate that the drawings are not necessarily drawn to scale. In the drawings:
fig. 1 is a schematic structural diagram of a measurement platform system according to embodiment 1 of the present application;
fig. 2 is a schematic structural diagram of a platform device according to embodiment 1 of the present application;
FIG. 3 is a schematic cross-sectional inside view of a stage apparatus according to embodiment 1 of the present application;
fig. 4 is a schematic view of an object to be measured detected by using a measuring device fixed on a platform device according to embodiment 1 of the present application;
fig. 5 is a schematic diagram of an euler angle between a carrier coordinate system and a geographic coordinate system of the measuring device according to embodiment 1 of the present application when detecting a measured object;
FIG. 6 is a schematic cross-sectional inside view of a measuring device according to embodiment 1 of the present application;
fig. 7 is a schematic structural view of an optical system of the measuring apparatus according to embodiment 1 of the present application;
FIG. 8A is a schematic view of a test image formed by co-projecting a first reticle and a second reticle onto an imaging surface according to an embodiment of the present application, wherein the measurement device is misaligned with the object to be measured according to FIG. 8A;
FIG. 8B is a further schematic view of a test image formed by the co-projection of a first reticle and a second reticle onto an imaging surface according to an embodiment of the present application, wherein the measurement device is misaligned with the object to be measured according to FIG. 8B;
fig. 9A is a schematic view of a detection image formed by projecting the first reticle and the second reticle together on the imaging plane according to an embodiment of the present application, wherein the pitch angle of the object to be measured with respect to the measuring apparatus according to fig. 9A is not zero;
FIG. 9B is a further schematic diagram of a detection image formed by the first reticle and the second reticle collectively projected on an imaging plane according to an embodiment of the present application, wherein an azimuth angle of the object to be measured with respect to the measuring apparatus according to FIG. 9B is not zero;
fig. 10 is a schematic structural view of a stage apparatus according to embodiment 2 of the present application;
fig. 11 is a further schematic structural view of a stage device according to embodiment 2 of the present application; and
fig. 12 is a side view of a stage arrangement according to embodiment 2 of the present application.
Detailed Description
It should be noted that, in the present disclosure, the embodiments and features of the embodiments may be combined with each other without conflict. The present disclosure will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.
In order to make the technical solutions of the present disclosure better understood by those skilled in the art, the technical solutions of the embodiments of the present disclosure will be clearly and completely described below with reference to the drawings in the embodiments of the present disclosure, and it is obvious that the described embodiments are only some embodiments of the present disclosure, not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments disclosed herein without making any creative effort, shall fall within the protection scope of the present disclosure.
It should be noted that the terms "first," "second," and the like in the description and claims of the present disclosure and in the above-described drawings are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the terms so used are interchangeable under appropriate circumstances for describing the embodiments of the disclosure herein. Moreover, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof, unless the context clearly indicates otherwise.
Further, terms referred to in the present specification are explained as follows:
geographic coordinate system (t system for short): origin at the centre of gravity, x, of the object to be measured t The axis pointing east, y t Axis north, z t The axis points along the vertical to the sky, commonly referred to as the northeast coordinate system. There are also different methods for taking geographical coordinate systems, such as northwest, northeast, etc. The different orientation of the coordinate system only affects the different signs of the projection components of a certain vector in the coordinate system, and does not affect the explanation of the basic principle of the navigation of the tested object and the accuracy of the calculation result of the navigation parameters.
Vector coordinate system (b series for short): the carrier coordinate system is fixed on the measured object and its origin is at the gravity center, x, of the measured object b With axis pointing forwards of the longitudinal axis of the object to be measured, y b The axis pointing to the right of the object to be measured, z b Axis vertical Ox b y b The plane is upward.
Example 1
According to a first aspect of the present embodiment, fig. 1 shows a schematic structural diagram of a measurement platform system according to the present embodiment, fig. 2 shows a schematic external view of a platform device of the measurement platform system according to the present embodiment, and fig. 3 shows a schematic internal cross-sectional view of the platform device. Referring to fig. 1 to 3, the measurement platform system of the present embodiment is used for installing a measurement apparatus 300, and includes a platform apparatus 100 and a processor apparatus 200.
Wherein, platform device 100 includes: the accelerometer includes a case 110, a mounting mechanism 120 disposed on a surface of the case 110, and a gyroscope 130 and an accelerometer 140 disposed in the case 110. Wherein the mounting mechanism 120 is used to mount the measuring device 300. And the gyroscope 130 and the accelerometer 140 are used to detect pose detection information related to the pose and/or position of the measurement apparatus 300. Also, the processor device 200 is configured to correct the measurement information measured by the measurement device 300 according to the pose detection information.
As described in the background art, in a process of measuring an object to be measured using a measuring device, for example, in a process of detecting parallelism or angle of the object to be measured using a light pipe measuring device, it is susceptible to external disturbance such as chattering and shaking. Especially when the hand-held instrument is used for measurement, the hand shake influences the position and the angle of the optical axis of the measuring device, so that the measuring result generates large errors. In addition, the measuring device may have deviation of installation position and installation posture during installation and fixation, thereby easily causing large error of the measuring result.
In view of the technical problem, the present embodiment provides a measurement platform system, which, as shown in fig. 1 to 3, includes a platform device 100 and a processor device 200 (note that the measurement device 300 shown in fig. 1 does not belong to the measurement platform system described in the present application).
The stage apparatus 100 includes a housing 110, a mounting mechanism 120 disposed on a surface of the housing 110, a gyroscope 130 and an accelerometer 140 disposed in the housing. Here, the measuring apparatus 300 may be mounted on the platform apparatus 100 through the mounting structure 120, and then during the measurement of the object to be measured by the measuring apparatus 300, the posture detection information related to the posture and/or position of the measuring apparatus 300 may be detected through the gyroscope 130 and the accelerometer 140 provided in the case 110. In this way, the measurement platform system provided by the embodiment can continuously detect pose detection information related to the position and/or the posture of the measurement device 300 during the measurement of the measured object by the measurement device 300.
Thus, the processor device 200 can correct the measurement information measured by the measurement device 300 according to the pose detection information. For example, the processor device 200 may determine attitude information of the measurement device 300 from the attitude detection information, thereby correcting angle measurement information relating to the measured object measured by the measurement device 300 from the attitude information. Or the processor device 200 may determine the position information of the measuring device 300 from the pose detection information, thereby correcting the position measurement information relating to the measured object measured by the measuring device 300 based on the position information.
In this way, the present embodiment thus detects pose detection information relating to the pose and/or position of the measurement apparatus 300 using the gyroscope 130 and the accelerometer 140 in the platform apparatus 100 to which the measurement apparatus 300 is mounted. Then, the measurement information relating to the measured object measured by the measuring device 300 is corrected based on the pose detection information, so that the measurement result error of the measuring device due to the disturbance of the external vibration or shake and the measurement result error of the measuring device due to the positional or angular deviation at the time of installation can be effectively compensated.
Therefore, the technical problem that a measuring result has larger errors due to the position and angle deviation of the measuring device in the prior art is solved.
Optionally, the gyroscope 130 comprises a plurality of gyroscopes 130a, 130b, 130c arranged perpendicular to each other, and the accelerometer 140 comprises a plurality of accelerometers 140a, 140b, 140c arranged perpendicular to each other.
Specifically, referring to fig. 3, the gyroscope 130 includes a plurality of gyroscopes 130a, 130b, 130c disposed perpendicular to each other, and the accelerometer 140 includes a plurality of accelerometers 140a, 140b, 140c disposed perpendicular to each other, wherein angular motion information of the measuring apparatus 300 is detected by the plurality of gyroscopes 130a, 130b, 130c, and linear velocity information of the measuring apparatus 300 is detected by the plurality of accelerometers 140a, 140b, 140c, so that attitude information of the measuring apparatus 300 can be obtained from the angular motion information and the linear velocity information according to a strapdown inertial navigation algorithm.
Further, the accuracy of the attitude information of the measuring apparatus 300 measured is directly affected by the accuracy of the gyroscope 130. In order to ensure the precision, a high-precision fiber optic gyroscope, such as a three-axis integrated high-precision fiber optic gyroscope, can be adopted. Or a gyroscope with the accuracy of 1% is selected, and the accuracy gyroscope can ensure that the course keeps 0.01 degree per hour and meets the requirement of measurement accuracy.
Further, accelerometer 140 may be implemented as a quartz flexure accelerometer, which is a mechanical pendulum force balance servo accelerometer. When the pendulum is sensed to input acceleration, it will generate an inertial moment about the flexible pivot, under which moment the pendulum makes an angular movement about the flexible pivot, generating an angular displacement. The differential capacitance sensor converts the displacement into capacitance variation and transmits the capacitance variation to the analog amplifier, and the analog amplifier converts the capacitance variation into a current signal and transmits the current signal to the torquer to generate a restoring torque. When the restoring moment is balanced with the moment of inertia of the pendulum, the current value to the torquer can be used to measure the magnitude of the input acceleration.
Further, the gyroscope 130 may include 3 gyroscopes 130 disposed perpendicular to each other, and the accelerometer 140 also includes 3 accelerometers 140 disposed perpendicular to each other. And thus can be used to provide pose detection information sufficient to determine the position and pose of the measurement apparatus 300.
And further optionally, the operation of correcting the measurement information measured by the measurement apparatus 300 according to the pose detection information includes: determining attitude information and/or position information of the measuring device 300 according to the pose detection information by using a strapdown inertial navigation algorithm; and correcting information measured by the measurement device 300 using the determined attitude information and/or position information.
Fig. 4 exemplarily shows that the position and the posture of the measuring apparatus 300 are detected by the platform apparatus 100. And corrects the measurement information of the measurement apparatus 300 using the measured pose detection information. Referring to fig. 4, the measuring device 300 mounted on the platform device 100 may be, for example, an optical alignment device for performing attitude measurement on the measurement plane S1 of the measured object, specifically including measurement of the azimuth angle and the pitch angle of the measured object (i.e., attitude information of the normal line of the measurement plane S1). Specifically, referring to fig. 4, the measurement device 300 may be used to face the measurement surface S1 of the measured object, thereby acquiring information on the angular deviation between the axis of the measurement device 300 and the normal line of the measurement surface S1. Wherein the angular deviation information is indicative of the angular deviation between the axis of the measuring device 300 and the normal to the measuring plane S1. Thus, for example, in the coordinate axis (for example x) of the measurement surface S1 and the carrier coordinate system of the measured object b2 Axis) is perpendicular, the angular deviation can reflect the carrier coordinate system Ox of the measured object b2 y b2 z b2 With the carrier coordinate system Ox of the measuring device 300 b1 y b1 z b1 The angular deviation therebetween. For example, a carrier coordinate system Ox which can reflect the measured object b2 y b2 z b2 Relative to the carrier coordinate system Ox of the measuring device 300 b1 y b1 z b1 Azimuth angle deviation and pitch angle deviation.
Thus if the carrier coordinate system Ox of the measuring device 300 is set b1 y b1 z b1 With a geographical coordinate system Ox t1 y t1 z t1 If the measured angle deviation from the measuring plane S1 measured by the measuring device 300 is consistent, the actual azimuth angle and elevation angle information of the measured object can be reflected. So that the azimuth angle and the pitch angle information of the object to be measured can be measured using the measuring device 300.
However, as described in the background, in the actual measurement process, the measuring apparatus 300 itself may have an angular deviation, thereby causing a large measurement error. Therefore, according to the technical solution of the present embodiment, the attitude information of the measurement apparatus 300 can be determined according to the attitude detection information detected by the gyroscope 130 and the accelerometer 140 in the platform apparatus 100 by using the strapdown inertial navigation algorithm.
In particular, for example, but not limiting of, the processor device 200 may determine pose information of the measurement device 300 from pose detection information. For example, referring to fig. 5, the attitude information of the measuring device 300 may be, for example, a carrier coordinate system Ox of the measuring device 300 b1 y b1 z b1 Relative to the geographical coordinate system Ox of the measuring device 300 t1 y t1 z t1 Euler angle (alpha) 1 ，β 1 ，θ 1 ) And is used to indicate the azimuth, pitch, and roll of the measuring device 300 with respect to a geographic coordinate system.
The processor means 200 may thus correct the information measured by the measuring means 300 based on the determined azimuth angle and elevation angle of the measuring means 300.
Thus, optionally, the operation of correcting the measurement information measured by the measurement apparatus 300 according to the pose detection information includes: determining attitude information and/or position information of the measuring device 300 according to the pose detection information by using a strapdown inertial navigation algorithm; and correcting the measurement information measured by the measurement device 300 using the determined attitude information and/or position information.
Specifically, as described above, for example, the angle values of the azimuth angle and the pitch angle measured by the measurement device 300 may be subtracted by the azimuth angle and the pitch angle determined according to the pose information measured by the platform device 100, so that the measurement information measured by the measurement device 300 may be corrected. For specific details of the strapdown inertial navigation algorithm, reference may be made to related prior art, and detailed description is not repeated in this specification.
Optionally, the platform device 100 further includes a signal acquisition circuit 150 disposed in the box 110. The signal acquisition circuit 150 is connected to the gyroscope 130 and the accelerometer 140, and is configured to acquire pose detection information from the gyroscope 130 and the accelerometer 140.
Specifically, referring to fig. 2 and 3, the platform device 100 further includes a signal acquisition circuit 150 disposed in the box 110 and connected to the gyroscope 130 and the accelerometer 140. The signal acquisition circuit 150 is mainly used for acquiring gyro signals and acceleration signals of the gyroscope 130 and the accelerometer 140, and then processing the gyro signals and the acceleration signals and sending the processed gyro signals and acceleration signals to the subsequent processor device 200. So that the processor device 200 can perform attitude calculation on the received gyro signal and acceleration signal to determine the position and attitude of the measuring device 300.
In addition, the signal acquisition circuit 150 may also process the acquired gyro signal. For example, since the gyro signal acquired by the gyro signal acquisition circuit 150 is a high-frequency signal, it is necessary to perform filtering processing on the gyro signal and accumulate the signal to obtain a low-frequency gyro signal. And finally, the gyro signal acquisition circuit 150 sends out the gyro signal with low frequency. For example, a low frequency gyro signal is sent to the processor device 200 so that the processor device 200 can perform an attitude solution on the received gyro signal to determine the attitude of the measurement device 300.
Optionally, a signal output interface 180 is disposed on the box body 110. The signal output interface 180 is connected to the signal acquisition circuit 150, and the processor device 200 is connected to the signal output interface 180.
Specifically, the box 110 is provided with a signal output interface 180, and the signal output interface 180 may be connected to the signal acquisition circuit 150 through a wiring backplane (not shown in the figure), for example. Therefore, after the signal acquisition circuit 150 acquires the gyro signal and the acceleration signal, the signal can be transferred to the signal output interface 180 through the wiring bottom plate, and finally the gyro signal and the acceleration signal are transmitted to the subsequent processor device 200 through the signal output interface 180.
Alternatively, although not shown in the drawings, the processor device 200 may be a processor disposed in the box 110, and the box 110 is provided with a measurement information input interface 190, wherein the measurement information input interface 190 is used for receiving measurement information collected by the measurement device 300. And wherein the processor is configured to: receiving measurement information collected by the measurement device 300 from the measurement information input interface 190 and pose detection information from the gyroscope 130 and the accelerometer 140; and correcting the measurement information according to the pose detection information.
Thus, the processor can be integrated into the platform device 100 in this way, thereby saving the cost of the platform system and improving the integration level of the platform system.
Alternatively, as shown in fig. 1 and 2, the case 110 has a rectangular parallelepiped shape, and the plurality of gyroscopes 130 are respectively disposed inside three case walls of the case 110 that are perpendicular to each other.
Optionally, at least one gyroscope 130 is disposed inside the wall of the tank in which the mounting mechanism 120 is disposed. In this way, the gyroscope 130 is brought into close proximity to the measurement device 300 to the maximum extent, and the attitude information of the measurement device 300 can be accurately detected.
Optionally, a handle 160 is further included and is disposed on an outer surface of the case 110. Referring to fig. 1, for example, but not limited to, the outer surfaces of the two symmetrical sides of the case 110 are respectively provided with a hand-held unit 160, and a user can flexibly move the platform device 100 by holding the hand-held unit 160, so that the platform device can be applied to various measuring occasions.
Optionally, the gyroscope further comprises a power circuit 170 disposed in the box body 110, and the power circuit 170 is configured to supply power to the gyroscope 130, the gyroscope signal acquisition circuit 150, and the accelerometer 140.
Specifically, referring to fig. 2, the platform device 100 further includes a power circuit 170 disposed in the box 110 for supplying power to the gyroscope 130, the gyroscope signal acquisition circuit 150, and the accelerometer 140. In addition, power supply circuit 170 may be customized as desired, and in addition to providing power to gyroscope 130, gyroscope signal acquisition circuit 150, and accelerometer 140, power supply circuit 170 may be designed for electromagnetic compatibility, with the input voltage being provided by a battery in peripheral processor device 200.
Referring to fig. 1, according to a second aspect of the present embodiment, there is provided a measurement system for measuring the posture of a measured object, including a measurement device 300, and a measurement platform system for mounting the measurement device 300. Wherein the measurement platform system is the measurement platform system described in any one of the above, and wherein the platform device 100 of the measurement platform system is connected to the measurement device 300 through the mounting mechanism 120 on the surface of the box 110.
Thus, the present embodiment detects pose detection information relating to the pose and/or position of the measurement apparatus 300 using the gyroscope 130 and the accelerometer 140 in the platform apparatus 100 to which the measurement apparatus 300 is mounted. Then, the measurement information relating to the measured object measured by the measuring device 300 is corrected based on the pose detection information, so that the measurement result error of the measuring device 300 due to the disturbance of the external vibration or shake and the measurement result error of the measuring device 300 due to the positional or angular deviation at the time of installation can be effectively compensated. Therefore, the technical problem that a measurement result caused by the position and angle deviation of the measuring device has large errors in the prior art is solved.
Optionally, the measurement device 300 comprises: a light source 310; an image acquisition unit 320; a first reticle 330 disposed in front of the light source; a second partition board 340 disposed in front of the image capturing unit 320; and an optical system. Wherein the optical system is used to project the light source light emitted by the light source 310 and passing through the first reticle 330 onto the measurement plane S1 of the object to be measured, and to project the light source light reflected back from the measurement plane S1 onto the image pickup unit 320 via the second reticle 340. And wherein the image acquisition unit 320 is configured for acquiring a detection image as the measurement information, wherein the detection image comprises a first image of a first reticle of the first reticle 330 and a second image of a second reticle of the second reticle 340.
In particular, fig. 6 schematically shows a schematic cross-sectional view of the measuring device 300. Referring to fig. 6, the measuring apparatus 300 includes: the system comprises a light source 310, an image acquisition unit 320, a first reticle 330 arranged in front of the light source, a second reticle 340 arranged in front of the image acquisition unit 320, and an optical system. Fig. 7 schematically shows a structure of the optical system. Referring to fig. 7, the optical system includes an objective lens 350, a prism 360, and an eyepiece 370, wherein a first reticle 330 and a second reticle 340 are located on a focal plane of the objective lens system and the eyepiece lens system through a spectroscopic conjugate of the prism 360.
Further, as shown in fig. 6 and 7, for example, a mirror may be provided as the measurement surface S1 on the object to be measured. According to the optical path reversible imaging principle, the light source light emitted by the light source 310 passes through the first reticle 330 and then passes through the objective 350 to be parallel light and then irradiates to the reflector arranged on the object to be measured. Then, the image is reflected by the mirror, passes through the objective lens 359 and the eyepiece 370 again, and is imaged on the image plane position of the objective lens 350. Since the second division plate 340 is located at the image plane position of the objective lens 350, the optical system projects the light source light reflected back from the object to be measured as parallel light to the image pickup unit 320 via the second division plate 340. So that the image capturing unit 320 disposed on the imaging plane can capture a detection image including a first image of the first scribe line of the first reticle 330 and a second image of the second scribe line of the second reticle 340, as shown in fig. 8A and 8B.
Specifically, as shown with reference to fig. 8A and 8B, when the normal of the measurement plane S1 is not parallel to the axis of the measurement apparatus 300, that is, the roll, pitch, and azimuth difference angles between the two spatially coplanar straight lines are not zero, the images formed by the first reticle 330 and the second reticle 340 projected together on the imaging plane are as shown in fig. 8A or 8B. The centers of the crosses of the first image of the first reticle 330 and the second image of the second reticle 340 are separated by a distance and are not in an overlapping position, which means that the measuring device 300 is not aligned with the measuring plane S1, i.e. there is an angular deviation.
The light source can be a 1550nm optical fiber light source (SFS) which is based on Amplified Spontaneous Emission (ASE) of an erbium-doped optical fiber, and the optical fiber light source has the advantages of good temperature stability, large output power, long service life and low polarization correlation. Further, the image capturing unit 320 is, for example, but not limited to, a trigger CCD camera.
Optionally, the processor means 200 of the measurement platform system is configured for: determining the azimuth angle and the pitch angle of the measured object according to the detection image; and correcting the determined azimuth angle and the pitch angle according to the pose detection information.
Referring specifically to fig. 9A and 9B, when the axis of the measuring device 300 is not parallel to the normal of the measuring plane S1, the cross of the first image and the cross of the second image may not coincide. In which when the axis of the measuring device 300 is deviated from the normal of the measuring plane S1 by a pitch angle, the first image and the second image are deviated in position in the vertical direction as shown in fig. 9A. When the axis of the measuring device 300 is deviated azimuthally from the normal line of the measuring plane S1, the first image and the second image are deviated in position in the horizontal direction as shown in fig. 9B.
Referring also to fig. 9A and 9B, when there are azimuthal and elevation angle deviations of the axis of the measuring device 300 from the normal of the measuring plane S1, there are positional deviations of the first and second images in both the horizontal and vertical directions. Therefore, the azimuth angle deviation and the pitch angle deviation of the measuring plane S1 with respect to the measuring device 300 can be determined according to the positions of the first image and the second image, and thus the azimuth angle deviation and the pitch angle deviation can be used as the angle value of the measured object in the pitch angle.
Specifically, the posture information of the object to be measured is determined from the first image and the second image projected on the image pickup unit 320. Wherein the second image is used as the reference imageThe relative displacement (Δ x, Δ y) of the first image with respect to the second image can be derived. And the azimuth angle k of the measured object with respect to the measuring device 300 can be derived by the following formula i And a pitch angle phi i 。
k i ＝Δx/S x
φ i ＝Δy/S y
Wherein S x Is a scale factor in the horizontal direction, S y Is a scale factor in the vertical direction. And wherein S x And S y In pixels/arcsec (height imaged per arcsec resolution/CCD size), these two parameters can be calibrated in advance.
Further, as described above, the attitude information of the measuring apparatus 300, that is, the azimuth angle, the pitch angle, and the roll angle of the measuring apparatus 300 can be determined from the pose detection information of the measuring apparatus.
Thereby utilizing the azimuth angle alpha of the measuring device 300 1 And a pitch angle beta 1 For the above-mentioned azimuth angle k of the object to be measured i And a pitch angle phi i And (6) carrying out correction. Specifically, the calculated azimuth angle k of the measured object may be calculated i Minus the azimuth angle alpha of the measuring device 300 1 To determine the final azimuth angle of the measured object and calculate the pitch angle phi of the measured object i Minus the pitch angle beta of the measuring device 300 1 And determining the final pitch angle of the measured object.
Therefore, in this way, the technical solution of this embodiment can utilize optical projection imaging and image processing technology to calculate the attitude information of the measured object relative to the measuring device, and utilize the attitude information about the measuring device collected by the inertial sensor in the platform device to correct the measured attitude information of the measured object in real time, thereby not only ensuring the accuracy of detection, but also calculating the attitude information of the measured object in real time.
In summary, the present embodiment detects pose detection information related to the attitude and/or position of the measurement apparatus using a gyroscope and an accelerometer in the platform apparatus to which the measurement apparatus is mounted. Then, measurement information relating to the measured object measured by the measuring device is corrected based on the pose detection information, so that a measurement result error of the measuring device due to interference of external vibration or jitter and a measurement result error of the measuring device due to a positional or angular deviation at the time of installation can be effectively compensated. Therefore, the technical problem that a measurement result caused by the position and angle deviation of the measuring device has large errors in the prior art is solved.
Example 2
Fig. 10 shows a schematic structural diagram of the platform device 100 according to the embodiment 2, fig. 11 shows another schematic structural diagram of the platform device 100 according to the embodiment 2, and fig. 12 shows a side view of the platform device 100 according to the embodiment 2. Referring to fig. 10, 11 and 12, the platform device 100 according to the present embodiment includes: the accelerometer includes a case 110, a mounting mechanism (not shown) disposed on a surface of the case 110, and a gyroscope 130 and an accelerometer 140 disposed in the case 110. Wherein the mounting mechanism is used for mounting the measuring device. And the gyroscope 130 and the accelerometer 140 are used to detect pose detection information related to the pose and/or position of the measurement device.
As described in the background art, in a process of measuring an object to be measured using a measuring device, for example, in a process of detecting parallelism or angle of the object to be measured using a light pipe measuring device, it is susceptible to external disturbance such as chattering and shaking. Especially when the hand-held instrument is used for measurement, the hand shake influences the position and the angle of the optical axis of the measuring device, so that the measuring result generates large errors. In addition, the measuring device may have deviation of installation position and installation posture during installation and fixation, thereby easily causing large error of the measuring result.
The platform device 100 provided in this embodiment may mount the measurement device on the platform device 100 through the mounting structure, and then may detect pose detection information related to the pose and/or position of the measurement device through the gyroscope 130 and the accelerometer 140 provided in the case 110 during measurement of the object to be measured by the measurement device. In this way, the measurement platform system provided by this embodiment can continuously detect pose detection information related to the position and/or posture of the measurement device during the measurement of the measured object by the measurement device.
Thus, the processor device communicatively connected to the platform device 100 can correct the measurement information measured by the measurement device according to the pose detection information. For example, the processor device may determine attitude information of the measuring device from the pose detection information, thereby correcting angle measurement information related to the measured object measured by the measuring device based on the attitude information. Or the processor device may determine position information of the measuring device based on the pose detection information, thereby correcting position measurement information related to the measured object measured by the measuring device based on the position information.
In this way, the present embodiment thus detects pose detection information relating to the pose and/or position of the measurement apparatus using the gyroscope 130 and the accelerometer 140 in the platform apparatus 100 for mounting the measurement apparatus. Then, measurement information relating to the measured object measured by the measuring device is corrected based on the pose detection information, so that a measurement result error of the measuring device due to interference of external vibration or jitter and a measurement result error of the measuring device due to a positional or angular deviation at the time of installation can be effectively compensated.
Therefore, the technical problem that a measurement result caused by the position and angle deviation of the measuring device has large errors in the prior art is solved.
Alternatively, the gyroscope 130 includes a plurality of gyroscopes disposed perpendicular to each other, and the accelerometer 140 includes a plurality of accelerometers disposed perpendicular to each other.
Specifically, the gyroscope 130 includes a plurality of gyroscopes disposed perpendicular to each other, and the accelerometer 140 includes a plurality of accelerometers disposed perpendicular to each other, wherein angular movement information of the measuring device is detected by the plurality of gyroscopes, and linear velocity information of the measuring device is detected by the plurality of accelerometers, so that attitude information of the measuring device can be obtained from the angular movement information and the linear velocity information according to a strapdown inertial navigation algorithm.
Further, the accuracy of the attitude information of the measuring apparatus measured is directly affected by the accuracy of the gyroscope 130. In order to ensure the precision, a high-precision fiber optic gyroscope, such as a three-axis integrated high-precision fiber optic gyroscope, can be adopted. Or a gyroscope with the accuracy of 1% is selected, and the accuracy gyroscope can ensure that the course keeps 0.01 degree per hour and meets the requirement of measurement accuracy.
Further, accelerometer 140 may be implemented as a quartz flexure accelerometer, which is a mechanical pendulum force balance servo accelerometer. When the pendulum is sensed to input acceleration, it will generate an inertial moment about the flexible pivot, under which moment the pendulum makes an angular movement about the flexible pivot, generating an angular displacement. The differential capacitance sensor converts the displacement into capacitance variation and transmits the capacitance variation to the analog amplifier, and the analog amplifier converts the capacitance variation into a current signal and transmits the current signal to the torquer to generate a restoring torque. When the restoring moment is balanced with the moment of inertia of the pendulum, the current value to the torquer can be used to measure the magnitude of the input acceleration.
Further, the gyroscope 130 may include 3 gyroscopes 130 disposed perpendicular to each other, and the accelerometer 140 also includes 3 accelerometers 140 disposed perpendicular to each other. And thus may be used to provide pose detection information sufficient to determine the position and pose of the measurement apparatus 300.
And further optionally, the operation of correcting the measurement information measured by the measurement apparatus 300 according to the pose detection information includes: determining attitude information and/or position information of the measuring device according to the pose detection information by using a strapdown inertial navigation algorithm; and correcting information measured by the measurement device 300 using the determined attitude information and/or position information.
Optionally, the platform device 100 further comprises a signal acquisition circuit disposed in the box 110. The signal acquisition circuit is connected with the gyroscope 130 and the accelerometer 140, and is used for acquiring pose detection information from the gyroscope 130 and the accelerometer 140.
Specifically, the platform device 100 further includes a signal acquisition circuit disposed in the box 110, and connected to the gyroscope 130 and the accelerometer 140. The signal acquisition circuit is mainly used for acquiring gyro signals and acceleration signals of the gyroscope 130 and the accelerometer 140, and then processing the gyro signals and the acceleration signals and sending the processed gyro signals and acceleration signals to a subsequent processor device. The processor device can perform attitude calculation on the received gyro signal and the acceleration signal, and the position and the attitude of the measuring device are determined.
In addition, the signal acquisition circuit can also process the gyro signal that gathers. For example, since the gyro signal acquired by the gyro signal acquisition circuit is a high-frequency signal, it is necessary to perform filtering processing on the gyro signal and accumulate the gyro signal to obtain a low-frequency gyro signal. And finally, the gyro signal acquisition circuit sends out the low-frequency gyro signal. For example, a low frequency gyro signal is sent to the processor device, so that the processor device can perform attitude solution on the received gyro signal to determine the attitude of the measuring device.
Optionally, a signal output interface is disposed on the box body 110. The signal output interface is connected with the signal acquisition circuit, and the processor device is connected with the signal output interface.
Specifically, the box 110 is provided with a signal output interface, and the signal output interface may be connected to the signal acquisition circuit through a wiring backplane (not shown in the figure), for example. Therefore, after the signal acquisition circuit acquires the gyro signal and the acceleration signal, the signal can be transferred to the signal output interface through the wiring bottom plate, and finally the gyro signal and the acceleration signal are transmitted to the subsequent processor device through the signal output interface.
Alternatively, although not shown in the drawings, the processor device may be a processor disposed in the box 110, and the box 110 is provided with a measurement information input interface, wherein the measurement information input interface is used for receiving measurement information collected by the measurement device. And wherein the processor is configured to: receiving measurement information collected by the measurement device from the measurement information input interface and pose detection information from the gyroscope 130 and the accelerometer 140; and correcting the measurement information according to the pose detection information.
Thus, the processor can be integrated into the platform device 100 in this way, thereby saving the cost of the platform system and improving the integration level of the platform system.
Alternatively, the case 110 has a rectangular parallelepiped shape, and the plurality of gyroscopes 130 are respectively disposed inside three case walls of the case 110 that are perpendicular to each other.
Optionally, at least one gyroscope 130 is disposed inside the wall of the tank in which the mounting mechanism 120 is disposed. In this way, the gyroscope 130 is brought into close proximity to the measurement device to the maximum extent, and the attitude information of the measurement device can be accurately detected.
Optionally, a hand-held component 160 is further included, which is disposed on the outer surface of the box body 110. Referring to fig. 10, 11 and 12, for example, but not limited to, the outer surfaces of the two symmetrical sides of the case 110 are respectively provided with a hand-held unit 160, and a user can flexibly move the platform device 100 by holding the hand-held unit 160, thereby being suitable for various measuring occasions.
Optionally, a power circuit disposed in the box body 110 is further included, and the power circuit is configured to supply power to the gyroscope 130, the gyroscope signal acquisition circuit, and the accelerometer 140.
Specifically, the platform device 100 further includes a power circuit disposed in the box 110 for supplying power to the gyroscope 130, the gyroscope signal acquisition circuit, and the accelerometer 140. In addition, the power circuit may be customized as desired, and in addition to providing power to the gyroscope 130, the gyroscope signal acquisition circuit, and the accelerometer 140, electromagnetic compatibility design considerations are also provided for the power circuit, with the input voltage being provided by a battery in the peripheral processor device.
Thus, the present embodiment detects pose detection information relating to the pose and/or position of the measurement apparatus using the gyroscope 130 and the accelerometer 140 in the platform apparatus 100 to which the measurement apparatus is mounted. Then, measurement information relating to the measured object measured by the measuring device is corrected based on the pose detection information, so that a measurement result error of the measuring device due to interference of external vibration or jitter and a measurement result error of the measuring device due to a positional or angular deviation at the time of installation can be effectively compensated. Therefore, the technical problem that a measurement result caused by the position and angle deviation of the measuring device has large errors in the prior art is solved.
The relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present disclosure unless specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective portions shown in the drawings are not drawn in an actual proportional relationship for the convenience of description. Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate. In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
Spatially relative terms, such as "above … …," "above … …," "above … … surface," "above," and the like, may be used herein for ease of description to describe one device or feature's spatial relationship to another device or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if a device in the figures is turned over, devices described as "above" or "on" other devices or configurations would then be oriented "below" or "under" the other devices or configurations. Thus, the exemplary term "above … …" can include both an orientation of "above … …" and "below … …". The device may be otherwise variously oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
In the description of the present disclosure, it is to be understood that the orientation or positional relationship indicated by the directional terms such as "front, rear, upper, lower, left, right", "lateral, vertical, horizontal" and "top, bottom", etc., are generally based on the orientation or positional relationship shown in the drawings, and are presented only for the convenience of describing and simplifying the disclosure, and in the absence of a contrary indication, these directional terms are not intended to indicate and imply that the device or element being referred to must have a particular orientation or be constructed and operated in a particular orientation, and therefore, should not be taken as limiting the scope of the disclosure; the terms "inner and outer" refer to the inner and outer relative to the profile of the respective component itself.
The above description is only for the preferred embodiment of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (3)
1. A measurement system comprising a measurement device (300) and a measurement platform system, characterized in that the measurement platform system comprises a platform device (100) and a processor device (200), wherein
The platform arrangement (100) comprises: a case (110); a mounting mechanism (120) arranged on the surface of the box body (110) and used for mounting the measuring device (300); and a gyroscope (130) and an accelerometer (140) disposed within the housing (110), wherein the gyroscope (130) and the accelerometer (140) are configured to detect pose detection information related to a pose and/or position of the measurement device (300), and wherein the gyroscope (130) and the accelerometer (140) are configured to detect pose detection information related to a pose and/or position of the measurement device
The gyroscope (130) comprises a plurality of gyroscopes (130 a, 130b, 130 c) arranged perpendicular to each other, and the accelerometer (140) comprises a plurality of accelerometers (140 a, 140b, 140 c) arranged perpendicular to each other,
the stage device (100) of the measurement stage system is connected to the measurement apparatus (300) by a mounting mechanism (120) of the surface of the case (110), and the measurement apparatus (300) includes: a light source (310); an image acquisition unit (320); a first reticle (330) disposed in front of the light source (310); a second reticle (340) disposed in front of the image acquisition unit (320); and an optical system, wherein
The optical system is used for projecting light source light emitted by the light source and passing through the first reticle (330) onto a measurement plane (S1) of a measured object, and projecting the light source light reflected back from the measurement plane (S1) to the image acquisition unit (320) via the second reticle (340); and
the image acquisition unit (320) is configured to acquire a test image as measurement information, wherein the test image comprises a first image of a first reticle of the first reticle (330) and a second image of a second reticle of the second reticle (340), and wherein
The processor device (200) is configured for:
according to the relative displacement of the first image relative to the second image
Determining an azimuth angle of the measured object relative to the measuring device (300) by the following formula
And a pitch angle
：
Wherein
Is a scale factor in the horizontal direction and,
scale factor for vertical direction;
determining an azimuth angle alpha 1 and a pitch angle beta 1 of the measuring device (300) according to the pose detection information by using a strapdown inertial navigation algorithm; and
azimuth angle of the measured object relative to the measuring device (300)
Subtracting the difference of the azimuth angle alpha 1 of the measuring device (300) as the final azimuth angle of the measured object, and adjusting the pitch angle of the measured object relative to the measuring device (300)
And subtracting the difference value of the pitch angle beta 1 of the measuring device (300) to be used as the final pitch angle of the measured object.
2. The measurement system according to claim 1, wherein the processor device (200) is a processor disposed within a housing (110), and a measurement information input interface (190) is disposed on the housing (110), wherein the measurement information input interface (190) is configured to receive the measurement information, and wherein the processor is configured to:
receive the measurement information from the measurement information input interface (190) and the pose detection information from the gyroscope (130) and the accelerometer (140); and
and correcting the measurement information according to the pose detection information.
3. The measuring system according to claim 1, wherein the case (110) is in a rectangular parallelepiped shape, and the plurality of gyroscopes (130 a, 130b, 130 c) are respectively provided inside mutually perpendicular case walls of the case (110); and/or
At least one of the gyroscopes (130) is disposed inside a wall of the tank in which the mounting mechanism (120) is disposed.
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