CN111208376A - Detector for detecting performance of semiconductors in various forms - Google Patents
Detector for detecting performance of semiconductors in various forms Download PDFInfo
- Publication number
- CN111208376A CN111208376A CN202010159235.0A CN202010159235A CN111208376A CN 111208376 A CN111208376 A CN 111208376A CN 202010159235 A CN202010159235 A CN 202010159235A CN 111208376 A CN111208376 A CN 111208376A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 52
- 238000001514 detection method Methods 0.000 claims abstract description 64
- 239000007788 liquid Substances 0.000 claims abstract description 15
- 239000007787 solid Substances 0.000 claims abstract description 14
- 230000005540 biological transmission Effects 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 13
- 238000005086 pumping Methods 0.000 claims description 11
- 230000000149 penetrating effect Effects 0.000 claims description 9
- 230000006835 compression Effects 0.000 claims description 6
- 238000007906 compression Methods 0.000 claims description 6
- 238000007599 discharging Methods 0.000 claims 3
- 239000007789 gas Substances 0.000 abstract description 4
- 238000007789 sealing Methods 0.000 abstract description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Sampling And Sample Adjustment (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Compressors, Vaccum Pumps And Other Relevant Systems (AREA)
Abstract
Description
Claims (10)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010159235.0A CN111208376B (en) | 2020-03-09 | 2020-03-09 | Detector for detecting performance of semiconductors in various forms |
JP2020106474A JP2021139871A (en) | 2020-03-09 | 2020-06-19 | Tester for testing performance of a variety of forms of semiconductors |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010159235.0A CN111208376B (en) | 2020-03-09 | 2020-03-09 | Detector for detecting performance of semiconductors in various forms |
Publications (2)
Publication Number | Publication Date |
---|---|
CN111208376A true CN111208376A (en) | 2020-05-29 |
CN111208376B CN111208376B (en) | 2020-11-20 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010159235.0A Active CN111208376B (en) | 2020-03-09 | 2020-03-09 | Detector for detecting performance of semiconductors in various forms |
Country Status (2)
Country | Link |
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JP (1) | JP2021139871A (en) |
CN (1) | CN111208376B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112305410A (en) * | 2020-11-03 | 2021-02-02 | 谭秀美 | Chip automatic detection device |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114210601B (en) * | 2021-11-30 | 2024-01-05 | 中山市三乐电子有限公司 | Electrical performance testing device for manufacturing inductance coil of inductor |
CN114544215B (en) * | 2022-04-08 | 2023-10-20 | 乡宁县鸿达煤机有限公司 | Intelligent detection device for coal mine drainage equipment |
CN116559618B (en) * | 2023-05-17 | 2024-02-06 | 北京京瀚禹电子工程技术有限公司 | Semiconductor discrete device testing device capable of avoiding displacement |
CN116643083B (en) * | 2023-05-30 | 2023-12-08 | 林后富 | Intelligent electricity-saving monitoring device |
CN117214656B (en) * | 2023-08-28 | 2024-02-23 | 江苏芯卓物联网科技有限公司 | Integrated circuit tester |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007021907A2 (en) * | 2005-08-12 | 2007-02-22 | Bioscale, Inc. | Resonant sensor systems and methods with reduced gas interference |
CN101059440A (en) * | 2007-06-06 | 2007-10-24 | 华东师范大学 | Macroscopic semiconductor material performance test device |
CN102323453A (en) * | 2011-08-05 | 2012-01-18 | 上海交通大学 | Fixture for conductivity test and assembling method thereof |
CN105806892A (en) * | 2016-03-11 | 2016-07-27 | 清华大学 | Solid-liquid universal type thermal stimulus current measuring device |
RU172617U1 (en) * | 2016-12-14 | 2017-07-14 | Федеральное Государственное Бюджетное Образовательное Учреждение Высшего Образования "Новосибирский Государственный Технический Университет" | In-situ camera for monitoring the structure and current-voltage characteristics of thin polymer semiconductor films |
US20180045770A1 (en) * | 2016-08-15 | 2018-02-15 | The Boeing Company | Apparatus for testing dielectric breakdown voltage |
CN209014687U (en) * | 2018-08-21 | 2019-06-21 | 张琦 | A kind of semiconductor testboard |
CN110057871A (en) * | 2019-05-06 | 2019-07-26 | 宁波大学 | Intelligent liquid vaporation-type VOC gas test method based on STM32 |
CN110665831A (en) * | 2019-11-11 | 2020-01-10 | 青田林心半导体科技有限公司 | Equipment for detecting conductivity of semiconductor |
-
2020
- 2020-03-09 CN CN202010159235.0A patent/CN111208376B/en active Active
- 2020-06-19 JP JP2020106474A patent/JP2021139871A/en active Pending
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007021907A2 (en) * | 2005-08-12 | 2007-02-22 | Bioscale, Inc. | Resonant sensor systems and methods with reduced gas interference |
CN101059440A (en) * | 2007-06-06 | 2007-10-24 | 华东师范大学 | Macroscopic semiconductor material performance test device |
CN102323453A (en) * | 2011-08-05 | 2012-01-18 | 上海交通大学 | Fixture for conductivity test and assembling method thereof |
CN105806892A (en) * | 2016-03-11 | 2016-07-27 | 清华大学 | Solid-liquid universal type thermal stimulus current measuring device |
US20180045770A1 (en) * | 2016-08-15 | 2018-02-15 | The Boeing Company | Apparatus for testing dielectric breakdown voltage |
RU172617U1 (en) * | 2016-12-14 | 2017-07-14 | Федеральное Государственное Бюджетное Образовательное Учреждение Высшего Образования "Новосибирский Государственный Технический Университет" | In-situ camera for monitoring the structure and current-voltage characteristics of thin polymer semiconductor films |
CN209014687U (en) * | 2018-08-21 | 2019-06-21 | 张琦 | A kind of semiconductor testboard |
CN110057871A (en) * | 2019-05-06 | 2019-07-26 | 宁波大学 | Intelligent liquid vaporation-type VOC gas test method based on STM32 |
CN110665831A (en) * | 2019-11-11 | 2020-01-10 | 青田林心半导体科技有限公司 | Equipment for detecting conductivity of semiconductor |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112305410A (en) * | 2020-11-03 | 2021-02-02 | 谭秀美 | Chip automatic detection device |
Also Published As
Publication number | Publication date |
---|---|
JP2021139871A (en) | 2021-09-16 |
CN111208376B (en) | 2020-11-20 |
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Effective date of registration: 20201103 Address after: Room c-712, No. 198, Qidi Road, Xiaoshan Economic and Technological Development Zone, Xiaoshan District, Hangzhou City, Zhejiang Province Applicant after: Hangzhou Xiangyi Technology Co.,Ltd. Address before: 323900 No.107, Fujiang Road, Wenxi Town, Qingtian County, Lishui City, Zhejiang Province Applicant before: Qingtian Linxin Semiconductor Technology Co.,Ltd. |
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Effective date of registration: 20240415 Address after: Room 1812, Building 1, Qiantang Aviation Building, Shangcheng District, Hangzhou City, Zhejiang Province, 310000 Patentee after: Hangzhou Pinde Holding Co.,Ltd. Country or region after: China Address before: Room c-712, No. 198, Qidi Road, Xiaoshan Economic and Technological Development Zone, Xiaoshan District, Hangzhou City, Zhejiang Province Patentee before: Hangzhou Xiangyi Technology Co.,Ltd. Country or region before: China |
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Effective date of registration: 20240424 Address after: Room 05-2, 8th Floor, Building 2, Wuhan Optics Valley Enterprise World, No.1 Lingjiashan South Road, Donghu New Technology Development Zone, Wuhan City, Hubei Province, 430000 Patentee after: Wuhan Shenglida Technology Co.,Ltd. Country or region after: China Address before: Room 1812, Building 1, Qiantang Aviation Building, Shangcheng District, Hangzhou City, Zhejiang Province, 310000 Patentee before: Hangzhou Pinde Holding Co.,Ltd. Country or region before: China |