CN111207911A - Method for measuring refractive index of parallel plane transparent solid material - Google Patents
Method for measuring refractive index of parallel plane transparent solid material Download PDFInfo
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- CN111207911A CN111207911A CN202010057393.5A CN202010057393A CN111207911A CN 111207911 A CN111207911 A CN 111207911A CN 202010057393 A CN202010057393 A CN 202010057393A CN 111207911 A CN111207911 A CN 111207911A
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- transparent solid
- parallel plane
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
Abstract
A method for measuring the refractivity of the transparent solid material with parallel planes features that the change of focal position of convergent light beam when the convergent light beam passes through the transparent solid material with parallel planes is measured.
Description
Technical Field
The invention relates to a method for measuring the refractive index of a transparent material, in particular to a method for measuring the refractive index of a parallel plane transparent solid material.
Background
The refractive index is an important parameter of the optical properties of the material, and the refractive index of the transparent material is measured by a minimum deviation angle method and a total reflection method. The minimum deviation angle method measurement has no limitation on the refractive index of the measured material, but the measured material needs to be processed into a prism, which brings great trouble to measuring personnel, and the prism processing difficulty is large except that the original shape of the material is damaged. The total reflection method is convenient to test, but is only suitable for materials with a certain range of refractive index. In addition, a special tool and corresponding matching conditions are needed for measuring the angle, the limitation is large, and the measuring steps are complicated, so that certain uncertainty is brought to the final refractive index measuring result. In contrast, the material with the two-side parallel structure has low processing technology difficulty and wide application range, and most optical elements have the two-side parallel planar structure in practical application, so that the method for measuring the refractive index, which is simple and convenient and is suitable for the parallel planar transparent solid material, has very important practical value.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides a method for measuring the refractive index of a transparent solid material with two parallel planes. The method is simple and easy to implement, and can be used for conveniently measuring the refractive index of the transparent solid material with two parallel planes.
The principle of the invention is as follows:
FIG. 2 is a refraction diagram of light rays passing through a planar transparent solid material, wherein α1Angle of incidence of incident ray, α2Angle of refraction of refracted ray, r1Distance of incident ray to optical axis of light beam, r2Distance L from the intersection point of the refracted rays on the rear surface of the planar transparent solid material to the optical axis of the light beam3Distance of focal point A from front surface of planar transparent solid material, L4Distance of focal point B to the front surface of the planar transparent solid material.
From FIG. 2, it can be seen that
L4＝r1ctgα1(1)
L3＝d+r2ctgα1(2)
Substituting (1) and (2) into the formula (3)
L1-L2＝L3-L4＝d+(r2-r1)ctgα1(3)
From the formula (3), it can be obtained
From FIG. 2, it can be seen that
r1-r2＝dtgα2(5)
From the formula (5), it can be obtained
When α1Smaller
sinα1≈tgα1(7)
sinα2≈tgα2(8)
At this time, the law of refraction can be used
Substituting equations (4) and (6) into the available
The technical solution of the invention is as follows:
a method for measuring the refractive index of a parallel plane transparent solid material is characterized by comprising the following steps:
① setting up a measuring light path, placing a focusing lens and a light beam quality analyzer in sequence along the same optical axis in the output light direction of the laser, wherein the light beam quality analyzer is connected with a computer;
② placing the transparent solid material of the parallel plane to be measured between the focusing lens and the light beam quality analyzer, wherein the transparent solid material of the plane to be measured is close to the focusing lens, and the focused light beam is incident to the transparent solid of the parallel plane to be measured at a near-vertical angle;
③ moving the beam quality analyzer back and forth along the optical axis until the spot size measured by the computer is minimum, that is, the beam quality analyzer is at the focus position A after the output laser passes through the focusing lens and the parallel plane transparent solid material to be measured;
④ measuring the distance from the beam quality analyzer to the focusing lens with a tape measure, denoted L1；
⑤ moving out the parallel plane transparent solid material to be measured, moving the light beam quality analyzer back and forth along the optical axis again until the light spot size measured by the computer is minimum, that is, the light beam quality analyzer is located at the focus position B where the output laser passes through the focusing lens and then converges;
⑥ measuring the distance from the beam quality analyzer to the focusing lens using the tape measure, denoted L2；
⑦, calculating the refractive index n of the parallel plane transparent solid material to be measured, the formula is as follows:
in the formula, d is the thickness of the parallel plane transparent solid material to be measured, and can be measured by a vernier caliper (17).
Compared with the prior art, the invention has the technical effects that:
1. can utilize the parallel two sides to measure, application scope is wide, need not special processing sample.
2. The equipment requirement is low, and for optical laboratories and processing sites, equipment such as dimension measuring tools and beam quality analyzers are common.
3. The only measurement to be made is the sample thickness, the distance from the beam mass analyzer to the focusing lens, and there is reduced uncertainty in the measurement.
4. By changing the wavelength of the output laser, the measurement of the refractive index of the parallel plane transparent solid material with different wavelengths can be realized.
The refractive index of the parallel plane quartz glass is measured by the method, the thickness d of the quartz is 40.09mm, and when the laser output wavelength is 632.8nm, the thickness d of the quartz is in the light pathFocal point position distance difference L in the presence or absence of parallel plane transparent solid material to be measured1-L2The refractive index of the parallel plane quartz material at 632.8nm is calculated to be 1.46 according to the formula, which is consistent with the refractive index of 1.46 at 656nm wavelength of quartz glass (page P137 in quartz glass), and the method can accurately measure the refractive index of the parallel plane transparent solid material.
Drawings
FIG. 1 is a schematic diagram of an apparatus for measuring the refractive index of a transparent solid material having parallel planes.
Fig. 2 is a schematic view of refraction of a light incident material.
In the figure, 11 is a laser, 12 is a focusing lens, 13 is a plane transparent solid material, 14 is a beam quality analyzer, 15 is a computer, 16 is a measuring tape, and 17 is a vernier caliper.
Detailed Description
The invention is further illustrated with reference to the following examples and figures, without thereby limiting the scope of the invention.
Please refer to fig. 1. Fig. 1 is a schematic diagram of an apparatus for measuring a refractive index of a parallel plane transparent solid material, as shown in the figure, a focusing lens 12, a parallel plane transparent solid material 13 to be measured, and a beam quality analyzer 14 are sequentially disposed on an output optical path of a laser 11, the beam quality analyzer 14 is connected to a computer 15, wherein the parallel plane transparent solid material 13 to be measured is as close to the focusing lens 12 as possible, a focused beam enters the parallel plane transparent solid material 13 to be measured at a nearly vertical angle, and the computer 15 measures a spot size of the beam entering the beam quality analyzer 14 through the beam quality analyzer 14.
The method for measuring the refractive index of the parallel plane transparent solid material comprises the following steps:
① moving the beam mass analyser 14 along the output optical path of the laser 11 behind the parallel plane transparent solid material 13 until the spot size measured by the computer 15 is minimal, and stopping moving the beam mass analyser 14, at which point the beam mass analyser 13 is at the focal position a where the output laser light passes through the focusing lens 12 and the plane transparent solid material 13;
② the tape 16 is used to measure the distance from the beam quality analyzer 14 to the focusing lens 12, denoted L1；
③ moving out the transparent solid material 13 of the parallel plane to be measured;
④ moving the beam quality analyzer 14 along the output optical path of the laser 11 behind the focusing lens 12 until the spot size measured by the computer 15 is minimal, and stopping moving the beam quality analyzer 14. at this time, the beam quality analyzer 14 is located at the focal point position B where the output laser light is converged by the focusing lens 12;
⑤ the distance from the beam quality analyzer 14 to the focusing lens 12 is measured by the tape 16 and is denoted as L2；
⑥ measuring the thickness of the parallel plane transparent solid material 13 to be measured by the vernier caliper 17, and is marked as d;
⑦ according to the formula
The refractive index of the parallel plane transparent solid material 13 to be measured is calculated.
Claims (2)
1. A method for measuring the refractive index of a parallel plane transparent solid material is characterized by comprising the following steps:
①, a measuring light path is established, wherein a focusing lens (12) and a light beam quality analyzer (14) are sequentially arranged on the same optical axis in the output light direction of the laser (11), and the light beam quality analyzer (14) is connected with a computer (15);
②, placing the transparent solid material (13) of the parallel plane to be measured between the focusing lens (12) and the light beam quality analyzer (14), wherein the transparent solid material (13) of the plane to be measured is close to the focusing lens (12), and the focused light beam enters the transparent solid of the parallel plane to be measured at an angle close to the vertical angle;
③ moving the beam mass analyser (14) back and forth along the optical axis until the spot size measured by the computer (15) is at a minimum;
④ the distance from the beam quality analyser (14) to the focussing lens (12) is measured by a tape measure (16) denoted L1；
⑤ moving out the parallel plane transparent solid material (13) to be measured, moving the beam quality analyzer (14) back and forth along the optical axis again until the light spot size measured by the computer (15) is minimum;
⑥ the distance from the beam quality analyser (14) to the focussing lens (12) is measured by the tape measure (16) and is denoted L2；
⑦, the refractive index n of the parallel plane transparent solid material (13) to be measured is calculated by the following formula:
in the formula, d is the thickness of the transparent solid material (13) to be measured.
2. The method for measuring the refractive index of the planar transparent solid material according to claim 1, wherein the thickness d of the parallel planar transparent solid material (13) to be measured is measured by a vernier caliper (17).
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113959984A (en) * | 2021-10-28 | 2022-01-21 | 深圳迈塔兰斯科技有限公司 | Film refractive index detection device and detection method |
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| US20080285026A1 (en) * | 2007-05-16 | 2008-11-20 | Otsuka Electronics Co., Ltd. | Optical characteristic measuring apparatus and measuring method using light reflected from object to be measured |
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| CN106556573A (en) * | 2016-11-17 | 2017-04-05 | 仝宁瑶 | A kind of experimental provision for determining glass refraction |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113959984A (en) * | 2021-10-28 | 2022-01-21 | 深圳迈塔兰斯科技有限公司 | Film refractive index detection device and detection method |
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Application publication date: 20200529 |