CN111198439A - Material evidence reconnaissance equipment - Google Patents

Abstract

The invention relates to the technical field of investigation equipment, in particular to material evidence investigation equipment, which comprises a base, a microscope and a position adjusting mechanism, wherein the base is provided with a positioning hole; wherein, the base can be fixed on the object surface, and base and microscope all are connected with position adjustment mechanism, and position adjustment mechanism is used for adjusting the relative position of microscope and base, and the microscope can move along the direction that is on a parallel with the stationary plane of base and object surface contact relative to the base. The material evidence investigation equipment provided by the invention can reduce the pollution area to the site.

Description

Material evidence reconnaissance equipment

Technical Field

The invention relates to the technical field of investigation equipment, in particular to material evidence investigation equipment.

Background

The material evidence reconnaissance device can bring great help to the investigation of criminal cases and is widely suitable for reconnaissance of various material evidences (such as human body desquamation scurf, sweat stain, blood, saliva spot, fine spot and the like) on the handling site.

There are some material evidence reconnaissance equipment to be provided with the microscope, during the use, it is fixed (directly fixed or indirectly fixed) to the object surface with the microscope to guarantee that microscopical camera lens can stable imaging, after the microscope on the current material evidence reconnaissance equipment has observed the region that it can observe at every turn, all need to change fixed position, and the area (taking the millimeter as the unit) that the microscope can observe at every turn is less, and the area (taking the meter as the unit) that the scene needs to be surveyed is great, forms huge proportion, so change the frequency higher, cause the pollution of great area to the scene easily.

In summary, how to overcome the above-mentioned defects of the existing material evidence investigation equipment is a technical problem that those skilled in the art are in urgent need to solve.

Disclosure of Invention

The invention aims to provide material evidence investigation equipment to solve the technical problem that the material evidence investigation equipment in the prior art is easy to cause large-area pollution on the site.

The material evidence investigation equipment provided by the invention comprises a base, a microscope and a position adjusting mechanism.

The base can be fixed on the surface of an object, the base and the microscope are connected with the position adjusting mechanism, the position adjusting mechanism is used for adjusting the relative position of the microscope and the base, and the microscope can move relative to the base along the direction parallel to the fixed surface of the base in contact with the surface of the object.

Preferably, as an implementation mode, the position adjusting mechanism can drive the microscope to move along an X axis relative to the base; and/or the position adjusting mechanism can drive the microscope to move along the Y axis relative to the base; and/or the position adjusting structure can drive the microscope to rotate around the Y axis relative to the base; and/or the position adjusting mechanism can drive the microscope to move along the Z axis relative to the base.

The X axis is perpendicular to the Y axis, and the X axis and the Y axis are both parallel to a fixing surface of the base, which is in contact with the surface of the object; the Z axis is parallel to the axis of the lens of the microscope.

Preferably, as an embodiment, the position adjustment mechanism includes an X-axis moving frame, a Y-axis moving frame, and a Y-axis rotating frame.

An X-axis sliding groove extending along an X axis is formed in the base, and the X-axis moving frame is in sliding fit with the X-axis sliding groove; or the X-axis moving frame is in sliding fit with the base, an X-axis rack extending along an X axis is fixedly arranged on the base, an X-axis gear is arranged on the X-axis moving frame, and the X-axis gear is meshed with the X-axis rack;

the Y-axis moving frame is in sliding fit with the X-axis moving frame, a Y-axis gear is mounted on the X-axis moving frame, a Y-axis rack extending along a Y axis is fixedly arranged on the Y-axis moving frame, the Y-axis gear is in rotating fit with the X-axis moving frame, and the Y-axis gear is meshed with the Y-axis rack;

the Y-axis rotating frame is in running fit with the Y-axis moving frame, and the Y-axis rotating frame can rotate around a Y axis relative to the Y-axis moving frame;

the microscope with Y axle swivel mount sliding fit, install Z axle gear on the Y axle swivel mount, Z axle gear with Y axle swivel mount normal running fit, the fixed Z axle rack that extends along the Z axle that is provided with on the microscope, Z axle rack with Z axle gear engagement.

Preferably, as an implementation mode, a locking threaded hole is formed in the X-axis moving frame, a locking screw penetrates through the locking threaded hole, and the locking screw can abut against the surface of the base; when the locking screw abuts against the surface of the base, the X-axis moving frame and the base are relatively fixed;

and/or a first damping threaded hole is formed in the X-axis moving frame, a first damping screw penetrates through the first damping threaded hole, and the end part of the first damping screw is abutted against the surface of the base; when the external force for driving the X-axis moving frame to move along the X axis is zero, the X-axis moving frame and the base are relatively fixed; when the external force for driving the X-axis moving frame to move along the X axis is larger than zero, sliding friction force exists between the first damping screw and the X-axis sliding groove;

and/or a second damping threaded hole is formed in the Y-axis rotating frame, a second damping screw penetrates through the second damping threaded hole, and the end part of the second damping screw is abutted against the surface of the Y-axis moving frame; when the external force for driving the Y-axis rotating frame to rotate around the Y axis is zero, the Y-axis rotating frame and the Y-axis moving frame are relatively fixed; when the external force for driving the Y-axis rotating frame to rotate around the Y axis is larger than zero, sliding friction force exists between the second damping screw and the Y-axis moving frame;

and/or, install Z axle stopper on the Y axle swivel mount, Z axle stopper with microscopical surface butt is used for the restriction the microscope is relative shaking of Y axle swivel mount.

Preferably, as an implementation mode, an X-axis adjusting hand wheel is arranged on the X-axis moving frame, and the X-axis adjusting hand wheel is coaxially fixed with the X-axis gear;

and/or a Y-axis adjusting hand wheel is arranged on the X-axis moving frame and is coaxially fixed with the Y-axis gear;

and/or a Z-axis adjusting hand wheel is arranged on the Y-axis rotating frame and coaxially fixed with the Z-axis gear.

Preferably, as an embodiment, the base has foldable support legs, each of which is capable of being fixed to the surface of an object at the tail end after being opened.

Preferably, as an embodiment, the tail end of each support leg can be sleeved with a spacer sleeve, the spacer sleeve is used for contacting with the surface of the object, and the spacer sleeve can be replaced.

Preferably, as an implementable mode, the material evidence investigation device further comprises a switching block, and the switching block is used for being fixedly connected with a tripod.

The transfer block is fixedly connected with the X-axis moving frame, or the transfer block is fixedly connected with the microscope.

Preferably, as an implementable mode, the physical evidence investigation apparatus further comprises a light source for irradiating light to the surface of the object;

the material evidence investigation equipment comprises a light source, a microscope lens, a light filter and a microscope lens, wherein the light source can excite fluorescence of material evidence materials, the fluorescence can sequentially penetrate through the light filter and the lens of the microscope, and the light filter is used for filtering interference light in the fluorescence; or, the light source is used to illuminate a survey area of the microscope.

Preferably, as an implementable mode, the light source comprises a main light source, and the irradiation direction of the main light source forms an included angle of 40-50 degrees with the lens of the microscope;

and/or the light source comprises a side light source, and when the lens of the microscope is opposite to the surface of the object, the side light source emits light towards the surface of the object as flat glancing light;

and/or the light source further comprises a marking light source which can irradiate the observation position of the microscope.

Preferably, as an implementation mode, the side light source is mounted on a lifting member, and the lifting member can drive the side light source to move along the axial direction of the lens of the microscope.

Preferably, as an implementation manner, the light source is installed on a support frame, the support frame is sleeved and fixed at an objective end of the microscope, and a zoom adjusting wheel of the microscope is located at an inner side of the support frame.

Material evidence reconnaissance equipment still includes zoom adjusting handle wheel, first zoom adjusting gear and second zoom adjusting gear, first zoom adjusting gear and the coaxial fixed of zoom adjusting gear on the microscope, second zoom adjusting gear with first zoom adjusting gear meshes mutually, zoom adjusting handle wheel with second zoom adjusting gear is coaxial fixed, just zoom adjusting handle is located the outside of support frame.

Preferably, as an implementation manner, the support frame is a cover structure, the substrate of the light source covers the inside of the support frame, and the support frame is provided with a heat dissipation window.

The heat dissipation window is provided with a plurality of fins, and/or a heat dissipation fan is arranged in the support frame.

Preferably, as an implementation mode, a reserved window is arranged on the bottom of the support frame, and the reserved window is used for wiping the physical evidence material when the lens of the microscope is opposite to the physical evidence material.

Preferably, as an implementable mode, the position where the base is in contact with the surface of the object is outside the investigation region of the microscope.

Compared with the prior art, the invention has the advantages that:

when the material evidence investigation equipment provided by the invention is used, the base can be fixed on the surface of an object to be investigated, then the material evidence material on the surface of the object is investigated by using the microscope, and after the area which can be investigated by the microscope at the current position is investigated, the position of the microscope can be adjusted by using the position adjusting mechanism, so that the microscope can move relative to the base along the direction parallel to the fixed surface of the base, which is in contact with the surface of the object (if the surface of the object to be investigated is a plane, the plane is the fixed surface of the base, which is in contact with the surface of the object), and thus the microscope can investigate an area different from the area investigated at the previous position.

Therefore, the material evidence investigation equipment provided by the invention can realize the investigation of a large area of the surface of an object by using the microscope by using the position adjusting mechanism without moving the base, so that when the investigation is carried out on the area with the same area, the material evidence investigation equipment provided by the invention has fewer times of moving the base, and further, the pollution area to the site can be reduced.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.

Fig. 1 is a schematic perspective view of a material evidence investigation apparatus in an investigation state according to an embodiment of the present invention;

fig. 2 is a schematic front view of a material evidence investigation apparatus in an investigation state according to an embodiment of the present invention;

fig. 3 is a schematic top view of a material evidence investigation apparatus provided in an investigation state according to an embodiment of the present invention;

fig. 4 is a schematic view illustrating an assembly structure of a base, an X-axis moving frame and a Y-axis moving frame in the physical evidence investigation apparatus according to an embodiment of the present invention;

FIG. 5 is a side view of an assembled structure of a base, an X-axis moving frame and a Y-axis moving frame in another physical evidence investigation apparatus according to an embodiment of the present invention;

FIG. 6 is a schematic perspective view of FIG. 5;

fig. 7 is a schematic perspective view of a material evidence investigation apparatus provided in an embodiment of the present invention in a storage state;

fig. 8 is an assembly structural diagram of a microscope, a Z-axis rack, a zoom adjusting handwheel, a first zoom adjusting gear and a second zoom adjusting gear in the material evidence investigation apparatus provided by the embodiment of the present invention;

fig. 9 is a schematic view of an assembly structure of a support frame and a lifting member in the additional evidence investigation apparatus according to the embodiment of the present invention.

Icon:

10-a base; 20-a microscope; a 30-X axis moving frame; a 40-Y axis moving frame; a 50-Y axis turret; 60-a primary light source; 70-side light source; 80-a lifting member; 90-a support frame; 100-zoom adjusting handwheel; 110-a first zoom adjustment gear; 120-a second zoom adjustment gear; 130-a transfer block;

101-support legs; 102-X axis rack;

201-Z axis rack;

a 301-Y axis adjusting hand wheel; 302-a bearing; 303-X axis adjusting handwheel;

401-Y axis rack;

501-Z axis adjusting handwheel;

901-fins; 902-reserving a window;

1301-a threaded hole.

Detailed Description

The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "inside", "outside", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, which are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and operate, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted" and "connected" are to be interpreted broadly, e.g., as being either fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.

The present invention will be described in further detail below with reference to specific embodiments and with reference to the attached drawings.

Referring to fig. 1 and 2, in the physical evidence investigation apparatus provided in this embodiment, when in use, the base 10 may be fixed on the surface of an object to be investigated, and then the microscope 20 may be used to investigate the physical evidence material on the surface of the object, and after the microscope 20 at the current position has investigated the area that can be investigated, the position of the microscope 20 may be adjusted by using the position adjusting mechanism, so that the microscope 20 moves relative to the base 10 in a direction parallel to a fixed surface of the base 10 that is in contact with the surface of the object (if the surface of the object to be investigated is a plane, the plane is the fixed surface of the base 10 that is in contact with the surface of the object), and thus, the microscope 20 may investigate an area different from the area investigated at the previous position.

Therefore, the material evidence investigation equipment provided by the embodiment can realize that the microscope 20 surveys a large area of the surface of an object by using the position adjusting mechanism, and the moving base 10 is not needed, so that when surveying the area with the same area, the material evidence investigation equipment provided by the embodiment moves the base 10 less times, and further, the pollution area to the site can be reduced.

Specifically, an X axis and a Y axis are defined with reference to a fixing surface of the base 10 contacting the surface of the object, wherein the X axis is perpendicular to the Y axis, and the X axis and the Y axis are both parallel to the fixing surface of the base 10 contacting the surface of the object; the Z-axis is parallel to the axis of the lens of the microscope 20, and when the physical evidence investigation apparatus provided in the present embodiment inspects the surface of the object, the Z-axis is perpendicular to the surface of the object to be inspected (if the surface of the object is a plane, the Z-axis is perpendicular to the fixed surface of the base 10 in contact with the surface of the object).

As a first possible implementation manner, the position adjustment mechanism can drive the microscope 20 to move along the X axis relative to the base 10, so that the exploratable length of the microscope 20 in the X axis direction can be increased without changing the position of the base 10, and further, the number of times of moving the base 10 can be reduced, and the pollution area to the site can be reduced.

As a second possible embodiment, the position adjustment mechanism is capable of moving the microscope 20 relative to the base 10 along the Y axis, so that the exploratable length of the microscope 20 in the Y axis direction can be increased without changing the position of the base 10, and further, the number of times of moving the base 10 can be reduced, and the area of contamination to the site can be reduced.

As a third possible implementation manner, the position adjustment mechanism can drive the microscope 20 to rotate around the Y axis relative to the base 10, so that the microscope 20 can survey the surface that the base 10 cannot be fixed on, such as various corners, the surveying range is wide, and the area of missing survey can be reduced; in addition, the area that can be surveyed by the microscope 20 while the base 10 is in the same position can be enlarged, facilitating further reduction of contamination.

As a fourth implementable manner, the position adjustment mechanism can drive the microscope 20 to move along the Z axis relative to the base 10, so that when an object with different surface heights or a groove is investigated, the position of the microscope 20 relative to the base 10 in the Z axis direction can be adjusted according to the height of the object surface opposite to the lens of the microscope 20, the adaptability is strong, and a good imaging effect can be obtained.

The material evidence investigation apparatus provided in this embodiment may have any one, two, or three of the four possible embodiments, or may have the four possible embodiments at the same time.

Preferably, referring to fig. 1 to 6, the physical evidence investigation apparatus provided in this embodiment preferably has the above four possible embodiments at the same time, and may be configured as the following specific structure:

the position adjusting mechanism is mainly composed of an X-axis moving frame 30, a Y-axis moving frame 40, and a Y-axis rotating frame 50.

As an embodiment, referring to fig. 4, an X-axis sliding slot extending along the X-axis is formed in the base 10, and the X-axis moving frame 30 is slidably engaged with the X-axis sliding slot, so that the X-axis moving frame 30 can move along the X-axis.

As another alternative, referring to fig. 5 and 6, the X-axis moving frame 30 is slidably engaged with the base 10, an X-axis rack 102 extending along the X-axis is fixedly disposed on the base 10, and an X-axis gear is mounted on the X-axis moving frame 30 and engaged with the X-axis rack 102, so that when the X-axis gear is rotated, the X-axis gear moves along the X-axis, and the X-axis moving frame 30 is further moved along the X-axis. An X-axis adjusting hand wheel 303 can be arranged on the X-axis moving frame 30, and the X-axis adjusting hand wheel 303 is coaxially fixed with the X-axis gear, so that the X-axis adjusting hand wheel 303 is rotated, the rotation of the X-axis gear can be realized, and the X-axis gear is convenient to hold and operate.

Referring to fig. 1 to 6, the Y-axis moving frame 40 is slidably engaged with the X-axis moving frame 30, a Y-axis gear is mounted on the X-axis moving frame 30, a Y-axis rack 401 extending along the Y-axis is fixedly disposed on the Y-axis moving frame 40, the Y-axis gear is rotatably engaged with the X-axis moving frame 30, and the Y-axis gear is engaged with the Y-axis rack 401, so that, when the Y-axis gear is rotated, the Y-axis rack 401 moves along the Y-axis, and the Y-axis moving frame 40 is driven to move along the Y-axis. The Y-axis adjusting hand wheel 301 can be arranged on the X-axis moving frame 30, and the Y-axis adjusting hand wheel 301 and the Y-axis gear are coaxially fixed, so that the Y-axis adjusting hand wheel 301 is rotated, the rotation of the Y-axis gear can be realized, and the Y-axis gear is convenient to hold and operate.

Referring to fig. 1 to 3, the Y-axis rotating frame 50 is rotatably coupled to the Y-axis moving frame 40, and the Y-axis rotating frame 50 is rotated about the Y-axis with respect to the Y-axis moving frame 40, so that the Y-axis rotating frame 50 is rotated about the Y-axis by applying a torque about the Y-axis to the Y-axis rotating frame 50 supported by the Y-axis moving frame 40.

Referring to fig. 1 to 3, the microscope 20 is slidably engaged with the Y-axis rotating frame 50, the Z-axis gear is mounted on the Y-axis rotating frame 50, and the Z-axis gear is rotatably engaged with the Y-axis rotating frame 50, and meanwhile, a Z-axis rack 201 extending along the Z-axis is fixedly disposed on the microscope 20, and the Z-axis rack 201 is engaged with the Z-axis gear, so that the Z-axis gear moves along the Z-axis rack 201 when the Z-axis gear is rotated, and the microscope 20 is driven to move along the Z-axis. Referring to fig. 2 and 3, a Z-axis adjusting handwheel 501 may be disposed on the Y-axis rotating frame 50, and the Z-axis adjusting handwheel 501 and the Z-axis gear are coaxially fixed, so that the Z-axis gear can be rotated by rotating the Z-axis adjusting handwheel 501, which is convenient for holding and operating.

Preferably, referring to fig. 4, a bearing 302 may be installed on the X-axis moving frame 30, and the bearing 302 is in sliding fit with the X-axis sliding slot, so as to reduce the wear of the X-axis sliding slot caused by the movement of the X-axis moving frame 30.

Preferably, a locking threaded hole may be formed in the X-axis moving frame 30, and a locking screw may be inserted into the locking threaded hole, when the X-axis moving frame 30 does not need to move, the locking screw may be screwed toward the surface of the base 10 until the locking screw abuts against the surface of the base 10, at this time, under the extrusion force between the locking screw and the surface of the base 10, the X-axis moving frame 30 and the base 10 may be relatively fixed, that is, the X-axis moving frame 30 cannot move relative to the base 10, so that the position deviation of the microscope 20 in the X-axis direction during use may be prevented, and the position accuracy, that is, the imaging stability of the microscope 20 may be conveniently ensured; when the X-axis moving frame 30 needs to move, the locking screw can be screwed out in a direction away from the surface of the base 10 until the locking screw is disengaged from the surface of the base 10, and at this time, the pressure between the locking screw and the surface of the base 10 is lost, and the X-axis moving frame 30 can move relative to the base 10.

Preferably, a first damping screw hole may be formed in the X-axis moving frame 30, and a first damping screw may be inserted into the first damping screw hole, such that an end of the first damping screw abuts against a surface of the base 10, and therefore, a certain amount of pressing force may exist between the first damping screw and the surface of the base 10, and once the X-axis moving frame 30 tends to move along the X-axis, friction (including static friction and dynamic friction) may occur between the first damping screw and the surface of the base 10. When the external force driving the X-axis moving frame 30 to move along the X-axis is zero, the X-axis moving frame 30 and the base 10 are relatively fixed, that is, no matter any structure in the physical evidence investigation apparatus provided by this embodiment causes the X-axis moving frame 30 to have a tendency to move along the X-axis relative to the base 10 due to the self-gravity, the X-axis moving frame 30 does not move relative to the base 10 under the action of the friction force between the first damping screw and the surface of the base 10, so that when the physical evidence investigation apparatus provided by this embodiment is stationary, the X-axis moving frame 30 can be prevented from sliding along the X-axis chute on the base 10, and the stability of the physical evidence investigation apparatus provided by this embodiment is enhanced; when the external force driving the X-axis moving frame 30 to move along the X-axis moving frame 30 is greater than zero, a sliding friction force exists between the first damping screw and the base 10, that is, the external force is applied to the X-axis moving frame 30, so that the purpose of sliding the X-axis moving frame 30 along the X-axis sliding slot on the base 10 can be achieved.

Preferably, a second damping screw hole may be formed in the Y-axis rotating frame 50, a second damping screw may be inserted into the second damping screw hole, and an end of the second damping screw may abut against a surface of the Y-axis moving frame 40, so that a certain amount of pressing force may exist between the second damping screw and the surface of the Y-axis moving frame 40, and once the Y-axis rotating frame 50 tends to rotate around the Y-axis, friction (including static friction and dynamic friction) may occur between the second damping screw and the surface of the Y-axis moving frame 40. When the external force for driving the Y-axis rotating frame 50 to rotate around the Y-axis is zero, the Y-axis rotating frame 50 and the Y-axis moving frame 40 are relatively fixed, that is, no matter any structure in the physical evidence investigation apparatus provided by this embodiment causes the X-axis rotating frame to have a tendency to rotate around the Y-axis relative to the Y-axis moving frame 40 due to the self-gravity, the Y-axis rotating frame 50 does not rotate relative to the Y-axis moving frame 40 under the action of the friction force between the second damping screw and the surface of the Y-axis moving frame 40, so that the Y-axis rotating frame 50 can be prevented from rotating around the Y-axis when the physical evidence investigation apparatus provided by this embodiment is static, and the stability of the physical evidence investigation apparatus provided by this embodiment is enhanced; when the external force for driving the Y-axis rotating frame 50 to rotate around the Y-axis is greater than zero, a sliding friction force exists between the second damping screw and the Y-axis moving frame 40, that is, the external force is applied to the Y-axis rotating frame 50, so that the purpose that the Y-axis rotating frame 50 rotates around the Y-axis can be achieved.

Preferably, a Z-axis stopper may be mounted on the Y-axis rotating frame 50, and the Z-axis stopper may abut against the surface of the microscope 20 to restrict the shaking of the microscope 20 with respect to the Y-axis rotating frame 50, thereby improving the imaging stability of the microscope 20.

Preferably, referring to fig. 1, the base 10 has foldable support legs 101, and the tail end of each support leg 101 can be fixed to the surface of the object after being unfolded, so as to reduce the contact area of the base 10 with the surface of the object.

In addition, referring to fig. 7, the supporting legs 101 can be folded to serve as a handheld material evidence investigation device, and the Y-axis rotating frame 50 can be used for driving the microscope 20 to rotate around the Y axis, so that the microscope 20 rotates to a position parallel to the base 10, and therefore the occupied space can be reduced, and the storage is convenient.

Further, the rear end of each support leg 101 may be covered with a spacer for surface contact with an object, and the spacer may be replaced, so that one set of the spacer may be replaced every time the base 10 is moved, thereby reducing contamination.

The isolating sleeve can be set as a silica gel sleeve, so that the friction force between the isolating sleeve and the surface of an object is increased conveniently.

In addition, referring to fig. 6, a transfer block 130 may be additionally provided in the material evidence investigation apparatus provided in this embodiment, and the transfer block 130 may be selectively and fixedly connected to the X-axis moving frame 30, or the transfer block 130 may be selectively and fixedly connected (indirectly or directly) to the microscope 20; the adaptor block 130 can be fixedly connected to the tripod, so that the physical evidence investigation apparatus provided by the present embodiment can be used by being mounted on the tripod.

Further, a threaded hole 1301 can be formed in the adapter block 130, so that the adapter block 130 can be fixed to the tripod by using a threaded connector.

Specifically, a clearance groove may be formed on the Y-axis moving frame 40, so that the transfer block 130 can pass through the clearance groove and be fixedly connected with the X-axis moving frame 30.

The physical evidence investigation apparatus provided by the present embodiment further includes a light source for irradiating light to a surface of the object.

As an implementable manner, the material evidence investigation apparatus is further provided with an optical filter, the light source can excite fluorescence of the material evidence, and the fluorescence can sequentially penetrate through the optical filter and the lens of the microscope 20, wherein the optical filter can filter out interference light in the fluorescence, and the microscope 20 can amplify images, so that a surveyor can conveniently find fluorescence information, and further, the material evidence material information is determined, useful material evidence can be conveniently and accurately extracted, and blind extraction is reduced.

As another possible embodiment, the light source may be used to illuminate an investigation region of a microscope to improve the visibility of the microscopic image.

In the physical evidence investigation apparatus provided in this example, either one of the two embodiments or both of the two embodiments may be selected.

Referring to fig. 2, the light source may include a main light source 60, the main light source 60 irradiates a lens of the microscope 20 at an angle of 40 ° to 50 °, and effective fluorescence information can be obtained when the main light source 60 irradiates most of the object surface.

Referring to fig. 2, the light source may include a side light source 70, and when the lens of the microscope 20 is facing the surface of the object, the side light source 70 emits a flat glancing light toward the surface of the object, so as to reduce interference of the fluorescence of the specific object (such as paint containing fluorescent agent) with the fluorescence excited by the material of the evidence.

Preferably, referring to fig. 2 and 9, the side light source 70 may be mounted on the lifting member 80, and the lifting member 80 drives the side light source 70 to move along the axial direction of the lens of the microscope 20, so that, when the object to be surveyed does not belong to the above-mentioned special object, the lifting member 80 can drive the side light source 70 to move along the axial direction of the lens of the microscope 20 towards the direction away from the surface of the object, thereby preventing the side light source 70 from interfering with the object to be surveyed, and being particularly suitable for the on-site environment with an uneven surface of the object.

The light source may include a marker light source that can illuminate the viewing position of the microscope 20, such that light emitted by the marker light source can be used to mark the viewing area, thereby facilitating direct observation of the material evidence material by the surveyor for extraction and avoiding missed inspection.

Further, referring to fig. 2, the light source can be mounted on the support 90, and the support 90 is fixed to the objective end of the microscope 20 in a sleeved manner, so that not only can the surface of the object be irradiated by the light source, but also the support 90 does not obstruct the visible area of the microscope 20; on the basis of the structure, referring to fig. 8, the zoom adjusting wheel on the microscope 20 is wrapped on the inner side of the supporting frame 90, and cannot be operated, so a zoom adjusting handwheel 100, a first zoom adjusting gear 110 and a second zoom adjusting gear 120 can be additionally arranged in the material evidence investigation equipment, the first zoom adjusting gear 110 and the zoom adjusting wheel on the microscope 20 are coaxially fixed, the second zoom adjusting gear 120 is meshed with the first zoom adjusting gear 110, the zoom adjusting handwheel 100 and the second zoom adjusting gear 120 are coaxially fixed, the zoom adjusting handwheel 100 is arranged on the outer side of the supporting frame 90, the second zoom adjusting gear 120 can be rotated by rotating the zoom adjusting handwheel 100, further, the first zoom adjusting gear 110 can be rotated, the zoom adjusting wheel on the microscope 20 is driven to rotate by the first zoom adjusting gear 110, realizes the zoom adjustment and is very convenient.

Specifically, the support frame 90 is a cover structure, the substrate of the light source covers the inside of the support frame 90 to ensure the aesthetic degree, and on the basis of the above structure, the support frame 90 may be opened with a heat dissipation window to dissipate the heat dissipated by the substrate of the light source.

Preferably, referring to fig. 1, a plurality of fins 901 may be installed at the heat dissipation window to improve a heat dissipation effect.

Preferably, a heat dissipation fan may be disposed in the support frame 90 to assist heat dissipation by the heat dissipation fan, thereby improving heat dissipation effect.

Specifically, referring to fig. 1, a reserved window 902 may be disposed on the bottom of the supporting frame 90, and the physical evidence material may be wiped through the reserved window when the lens of the microscope 20 is facing the physical evidence material, that is, the physical evidence material may be wiped under a condition that the microscope 20 is visible to the physical evidence material, so that whether the physical evidence is wiped on an extracting tool such as a cotton swab or not may be observed, and the possibility of missing the material may be reduced.

Specifically, the base 10 and the surface foundation of the object are located outside the investigation region of the microscope 20, so that the base 10 is prevented from contaminating the investigation region as much as possible.

In summary, the present invention discloses a material evidence investigation apparatus, which overcomes many technical defects of the conventional material evidence investigation apparatus. The material evidence reconnaissance equipment provided by the embodiment can reduce the pollution area to the scene.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.

Claims (15)

1. A material evidence investigation apparatus is characterized by comprising a base (10), a microscope (20) and a position adjusting mechanism;

the base (10) can be fixed on the surface of an object, the base (10) and the microscope (20) are connected with the position adjusting mechanism, the position adjusting mechanism is used for adjusting the relative position of the microscope (20) and the base (10), and the microscope (20) can move relative to the base (10) along the direction parallel to the fixed surface of the base (10) contacted with the surface of the object.

2. The physical evidence investigation apparatus of claim 1, wherein the position adjustment mechanism is capable of moving the microscope (20) relative to the base (10) along an X-axis; and/or the position adjusting mechanism can drive the microscope (20) to move along the Y axis relative to the base (10); and/or the position adjusting structure can drive the microscope (20) to rotate around the Y axis relative to the base (10); and/or the position adjusting mechanism can drive the microscope (20) to move along the Z axis relative to the base (10);

wherein the X axis is vertical to the Y axis, and the X axis and the Y axis are both parallel to the fixed surface of the base (10) contacted with the surface of the object; the Z axis is parallel to the axis of the lens of the microscope (20).

3. The physical evidence investigation apparatus of claim 2, wherein the position adjustment mechanism comprises an X-axis moving frame (30), a Y-axis moving frame (40) and a Y-axis rotating frame (50);

an X-axis sliding groove extending along an X axis is formed in the base (10), and the X-axis moving frame (30) is in sliding fit with the X-axis sliding groove; or the X-axis moving frame (30) is in sliding fit with the base (10), an X-axis rack (102) extending along an X axis is fixedly arranged on the base (10), an X-axis gear is mounted on the X-axis moving frame (30), and the X-axis gear is meshed with the X-axis rack (102);

the Y-axis moving frame (40) is in sliding fit with the X-axis moving frame (30), a Y-axis gear is mounted on the X-axis moving frame (30), a Y-axis rack (401) extending along the Y axis is fixedly arranged on the Y-axis moving frame (40), the Y-axis gear is in rotating fit with the X-axis moving frame (30), and the Y-axis gear is meshed with the Y-axis rack (401);

the Y-axis rotating frame (50) is in running fit with the Y-axis moving frame (40), and the Y-axis rotating frame (50) can rotate around a Y axis relative to the Y-axis moving frame (40);

microscope (20) with Y axle swivel mount (50) sliding fit, install Z axle gear on Y axle swivel mount (50), Z axle gear with Y axle swivel mount (50) normal running fit, fixed Z axle rack (201) that is provided with along the Z axle extension on microscope (20), Z axle rack (201) with Z axle gear engagement.

4. The material evidence investigation apparatus of claim 3, characterized in that the X-axis moving frame (30) is provided with a locking threaded hole, a locking screw is arranged in the locking threaded hole, and the locking screw can abut against the surface of the base (10); when the locking screw abuts against the surface of the base (10), the X-axis moving frame (30) and the base (10) are relatively fixed;

and/or a first damping threaded hole is formed in the X-axis moving frame (30), a first damping screw penetrates through the first damping threaded hole, and the end part of the first damping screw is abutted against the surface of the base (10); when the external force for driving the X-axis moving frame (30) to move along the X axis is zero, the X-axis moving frame (30) and the base (10) are relatively fixed; when the external force for driving the X-axis moving frame (30) to move along the X axis is larger than zero, sliding friction force exists between the first damping screw and the X-axis sliding groove;

and/or a second damping threaded hole is formed in the Y-axis rotating frame (50), a second damping screw penetrates through the second damping threaded hole, and the end part of the second damping screw is abutted against the surface of the Y-axis moving frame (40); when the external force for driving the Y-axis rotating frame (50) to rotate around the Y axis is zero, the Y-axis rotating frame (50) and the Y-axis moving frame (40) are relatively fixed; when the external force for driving the Y-axis rotating frame (50) to rotate around the Y axis is larger than zero, sliding friction force exists between the second damping screw and the Y-axis moving frame (40);

and/or, install the Z axle stopper on Y axle swivel mount (50), the Z axle stopper with the surperficial butt of microscope (20) is used for the restriction microscope (20) is relative the rocking of Y axle swivel mount (50).

5. The material evidence investigation equipment of claim 3, characterized in that, an X-axis adjusting handwheel (303) is arranged on the X-axis moving frame (30), the X-axis adjusting handwheel (303) is coaxially fixed with the X-axis gear;

and/or a Y-axis adjusting hand wheel (301) is arranged on the X-axis moving frame (30), and the Y-axis adjusting hand wheel (301) is coaxially fixed with the Y-axis gear;

and/or a Z-axis adjusting hand wheel (501) is arranged on the Y-axis rotating frame (50), and the Z-axis adjusting hand wheel (501) is coaxially fixed with the Z-axis gear.

6. The physical evidence investigation apparatus of claim 1, wherein the base (10) has foldable support legs (101), each support leg (101) having an open rear end capable of being secured to an object surface.

7. The physical evidence investigation apparatus of claim 6, characterized in that the tail end of each support leg (101) is provided with a spacer, which is adapted to be in contact with the surface of the object and which is replaceable.

8. The physical evidence investigation apparatus of claim 3, characterized in that the physical evidence investigation arrangement further comprises a transfer block (130), the transfer block (130) for fixed connection with a tripod;

the transfer block (130) is fixedly connected with the X-axis moving frame (30), or the transfer block (130) is fixedly connected with the microscope (20).

9. The physical evidence survey apparatus of any one of claims 1 to 8, further comprising a light source for illuminating light to a surface of an object;

the material evidence investigation equipment also comprises an optical filter, wherein the fluorescence can sequentially penetrate through the optical filter and a lens of the microscope (20), and the optical filter is used for filtering out interference light in the fluorescence; and/or the light source is used for illuminating a survey area of the microscope (20).

10. The physical evidence investigation apparatus of claim 9, wherein the light source comprises a primary light source (60), an illumination direction of the primary light source (60) being at an angle of 40 ° -50 ° to a lens of the microscope (20);

and/or the light source comprises a side light source (70), when the lens of the microscope (20) is opposite to the surface of the object, the light emitted by the side light source (70) towards the surface of the object is flat glancing light;

and/or the light source further comprises a marker light source which can be irradiated to the observation position of the microscope (20).

11. The physical evidence investigation apparatus of claim 10, wherein the side light source (70) is mounted on a lifting member (80), the lifting member (80) being capable of moving the side light source (70) in an axial direction of a lens of the microscope (20).

12. The material evidence investigation apparatus of claim 9, characterized in that the light source is mounted on a support frame (90), the support frame (90) is fixed to the objective end of the microscope (20) in a sleeved manner, and the zoom adjustment wheel of the microscope (20) is located inside the support frame (90);

material evidence reconnaissance equipment still includes zoom adjusting hand wheel (100), first zoom adjusting gear (110) and second zoom adjusting gear (120), first zoom adjusting gear (110) and the zoom adjusting gear coaxial fixation on microscope (20), second zoom adjusting gear (120) with first zoom adjusting gear (110) meshes mutually, zoom adjusting hand wheel (100) with second zoom adjusting gear (120) coaxial fixation, just zoom adjusting hand wheel (100) are located the outside of support frame (90).

13. The material evidence investigation apparatus of claim 12, wherein the support frame (90) is a cover structure, the substrate of the light source covers the inside of the support frame (90), and a heat dissipation window is opened on the support frame (90);

the heat dissipation window is provided with a plurality of fins (901) and/or a heat dissipation fan is arranged in the support frame (90).

14. The physical evidence investigation apparatus of claim 10, wherein the support frame (90) is provided with a pre-cut window (902) on a bottom thereof, the pre-cut window (902) being adapted to wipe material when a lens of the microscope (20) is facing the material.

15. The physical evidence investigation apparatus of any one of claims 1-7, characterized in that the position of the base (10) in contact with the object surface is outside the investigation region of the microscope (20).

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