CN111157802B - High-precision test method for microwave dielectric property of high-loss material - Google Patents

High-precision test method for microwave dielectric property of high-loss material Download PDF

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CN111157802B
CN111157802B CN202010006812.2A CN202010006812A CN111157802B CN 111157802 B CN111157802 B CN 111157802B CN 202010006812 A CN202010006812 A CN 202010006812A CN 111157802 B CN111157802 B CN 111157802B
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向锋
熊刚
李建壮
张波
郭永钊
董亦鹏
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Xian Jiaotong University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
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Abstract

The invention discloses a method for measuring microwave dielectric property of a high-loss material by adopting an electric field symmetric structure, which adopts a perturbation method with an electric field symmetric structure on the basis of a traditional resonance method and mainly comprises the following structures: TE011Mode metal resonant cavity, highCircular TE of Q value011The device comprises a mode dielectric resonator, a coupling adjusting device and a round long rod-shaped sample to be measured. By TE011The mode ring resonator and the metal resonant cavity can limit the test frequency to a certain specific frequency range. In the test process, a round long rod-shaped sample to be tested is placed into the annular TE011In the mode dielectric resonator, a tested sample can be better positioned at the axis position of the metal resonant cavity, errors caused by position deviation are reduced, the electric field structure is guaranteed to be a symmetrical structure, the electric field distribution uniformity of the interface of two different electrical property materials is improved, and the testing precision of the dielectric property can be effectively improved.

Description

High-precision test method for microwave dielectric property of high-loss material
Technical Field
The invention belongs to the technical field of microwave dielectric property test, and includes but is not limited to a high dielectric loss material and a microwave dielectric property test thereof under a variable temperature condition.
Background
With the development of microwave technology, the application of high dielectric loss materials represented by wave-absorbing materials in the fields of aerospace, electromagnetic pollution and the like is becoming wide, and accurate dielectric properties are required to be simulated and designed in many practical application occasions, but the accurate test of the dielectric properties of the high dielectric loss materials in a microwave frequency band is always a difficult problem.
The current method for testing the microwave dielectric property of the high dielectric loss material mainly adopts a transmission/reflection method, representative methods include a free space method, a waveguide method, a coaxial air line method and the like, and the methods have low testing precision due to the sensitivity of phase testing in the testing process and only can roughly reflect the change trend of the dielectric property of the material along with frequency. The traditional resonance method capable of accurately testing the microwave dielectric property is not suitable for high dielectric loss materials, because the high dielectric loss materials can cause serious attenuation or even disappearance of resonance peaks, and great difficulty is brought to measurement of resonance frequency and quality factor. On the other hand, although the prior art method uses a cylindrical metal resonant cavity to measure the microwave dielectric property of a high-loss material, the method directly uses a solid cylindrical ceramic as a reference sample, places a sheet-shaped sample to be measured directly on the ceramic, and uses a quartz single crystal as a support. The problems with this configuration are: the ceramic reference sample and the sample to be measured cannot be guaranteed to be positioned at the geometric center of the cavity in the actual measurement process, and the structure only has symmetry in the vertical direction and does not have complete symmetry in the direction of the feed axis, so that the electric field distribution at the interface of two different electrical property materials is uneven, the electromagnetic field distribution in the resonant cavity is influenced, errors are brought to the measurement of resonant frequency and quality factors, and the accurate measurement of the microwave dielectric property of the high-loss dielectric material cannot be realized.
Disclosure of Invention
The invention aims to provide a method for accurately measuring the microwave dielectric property of a high dielectric loss material by adopting an electric field symmetric structure, which has the characteristics of high precision, high efficiency and easy realization of temperature-changing test.
On the basis of the traditional resonance method, the invention adopts a perturbation method with an electric field symmetrical structure, and mainly comprises the following structures: TE011Mode metal resonant cavity and high-Q-value circular TE011The device comprises a mode dielectric resonator, a coupling adjusting device and a round long rod-shaped sample to be measured. By TE011The mode ring resonator and the metal resonant cavity can limit the test frequency to a certain specific frequency range. In the test process, a round long rod-shaped sample to be tested is placed into the annular TE011In the mode dielectric resonator, a tested sample can be better positioned at the axis position of the metal resonant cavity, errors caused by position deviation are reduced, the electric field structure is guaranteed to be a symmetrical structure, the electric field distribution uniformity of the interface of two different electrical property materials is improved, and the testing precision of the dielectric property can be effectively improved.
The method for measuring the microwave dielectric property of the high dielectric loss material requires that the sample is a round long rod-shaped sample, the height of the sample is the same as that of the high Q value annular dielectric resonator, and the diameter of the sample is not more than 3 mm. Typically, a sample diameter of 3mm is selected, and when no significant resonance peak is detected, the sample diameter is reduced appropriately until a resonance peak is detected.
The invention is realized by adopting the following technical scheme:
the invention uses the TE mode metal resonant cavity for testing, and the working mode of the resonant cavity is selected as TE011The specific test steps are as follows:
(1) setting the starting frequency and the number of scanning points, and calibrating the network analyzer and the coaxial cable.
(2) TE with high Q value011A mode ring ceramic resonator disposed on the TE011Testing and finding TE by using a network analyzer in the center above the low-dielectric-constant medium support body in the mode metal resonant cavity011Resonant peak of working mode, recording resonant frequency f0And a quality factor Q0。
(3) Measuring the diameter of the sample to be measured, and placing the sample to be measured in TE011Center of the mode ring resonator, test and find TE with a network analyzer011Resonance peak of working mode, recording resonance frequency fLAnd a quality factor QL。
(4) And establishing a physical model by using electromagnetic simulation software, ensuring that the resonant frequency of the cavity simulation is completely consistent with the actual measurement result, simulating the resonant frequency of the unloaded sample and the sample loaded with different dielectric constants under the diameter, drawing a resonant frequency deviation diagram of the sample loaded with different dielectric constants under the diameter, and performing linear fitting on the obtained curve.
(5) Paraffin with stable dielectric property, fused silica glass and alumina with purity of 99.6 percent are used as standard samples to test the resonant frequency and quality factor of the samples, the dielectric constant value corresponding to the resonant frequency actually measured under the diameter of the samples is searched in the step (4), and is compared with the theoretical dielectric constant value of the samples and the curve obtained in the step (4) is corrected, so that the dielectric constant values of the three samples are consistent with the theoretical values of the samples, and the purpose of correcting the fitted curve is achieved.
(6) The dielectric constant epsilon of the tested sample is obtained through the step (4)SSimplified calculation of formula ε by loss tangent2·tanδ2＝V1·ε1·tanδ1+(1-V1)εs·tanδsCalculating to obtain the loss tangent tan delta of the tested samplesIn which epsilon1、tanδ1The dielectric constant and the loss tangent obtained without adding the sample are respectively represented by f0、Q0To obtain epsilon2、tanδ2Showing the dielectric constant and loss tangent, V, obtained by adding the sample1Representing the relative volume, epsilon, of the ring dielectric resonator with respect to the sample to be measureds、tanδsThe dielectric constant and loss tangent of the sample to be measured are shown.
(7) And (5) replacing the sample to be tested, and repeating the steps (1) to (6) to realize the accurate test of the microwave dielectric property of the sample to be tested.
According to the invention, the dielectric property parameters are inverted by improving the structure of the dielectric resonator and utilizing a method combining simulation and actual measurement, so that the test precision of the microwave dielectric property is improved, and the precise test of the microwave dielectric property of the high dielectric loss material can be realized. The testing method provided by the invention is based on the principle of the dielectric resonator perturbation method, so that the defect of low testing precision of a waveguide method and a coaxial air line method is overcome from the testing principle. In the present invention by TE011The mode ring resonator and the metal resonant cavity can limit the testing frequency within a certain specific frequency range, meanwhile, the ring dielectric resonator can ensure that a sample to be tested is positioned in the geometric center of the cavity as far as possible, and the total loss of a resonant system can be reduced by controlling the inner diameter and the sample diameter of the ring dielectric resonator so as to ensure that an obvious resonance peak is observed. Meanwhile, the metal resonant cavity, the low-dielectric-constant medium support body and the annular medium resonator can resist high temperature, so that the test cavity can be placed in a temperature box to test the microwave dielectric property of the high-dielectric-loss material under the condition of variable temperature.
The invention can accurately test conventional materials, wave-absorbing materials, high dielectric loss materials and microwave dielectric properties of the materials in a variable temperature environment, and the relative error between the dielectric constant and the dielectric loss is within 3 percent.
Drawings
Fig. 1 is a schematic cross-sectional view of a metal resonant cavity, wherein fig. (a) is a schematic view of a sample not loaded, fig. (b) is a schematic view of a sample loaded, 1 represents a circular ring-shaped dielectric resonator, 2 represents a low-permittivity dielectric support, and 3 represents a sample to be measured.
FIG. 2 is a schematic diagram of a cylindrical metal resonant cavity system based on a resonance perturbation method for testing the microwave dielectric performance of a high dielectric loss sample.
FIG. 3 is a database of resonant frequency deviation of samples with different diameters, which is established by electromagnetic simulation software, and varies with dielectric constant, wherein the outer diameter of the circular ring-shaped dielectric resonator is 10mm, the inner diameter is 3mm, and the height is 5 mm.
Detailed Description
TE011The resonant mode is the most common resonant mode of a cylindrical metal resonant cavity, the electric field of the resonant mode is distributed annularly, and the resonant mode is widely applied to the test of the microwave dielectric property of low-loss and low-dielectric-constant materials at present.
Resonant perturbation methods based on cylindrical metal resonators are also common methods in microwave testing. The calculation formula of the dielectric constant can be expressed as
Figure GDA0002962004840000031
Figure GDA0002962004840000032
Wherein f is0And fL、Q0And QLRespectively representing the resonant frequency and the quality factor before and after the sample is put in, and the parameters alpha and beta are related to the structure of the cavity, the working mode, the shape of the sample and the position of the sample in the cavity.
As can be seen from the formulas (1) and (2), the dielectric constant is directly related to the resonant frequency offset, so that the dielectric constant of the sample to be measured can be obtained through the resonant frequency offset.
The figure of merit for unloaded samples can be expressed as
Figure GDA0002962004840000041
Wherein R issDenotes the surface resistance, tan delta, of the metal resonatorsIs the dielectric loss tangent, tan. delta. of the sampledIs the dielectric loss tangent of the dielectric support column, and the parameter G is the geometric factor of the resonant system, QrThe radiation quality factor of the resonant structure is obtained, and the last two terms in the formula (3) can be ignored by means of optimizing the cavity design and the like. QuCan be simplified to only with PesAnd PedThe associated formula.
Parameter PesIs the electric energy fill factor of the sample portion, defined as follows
Figure GDA0002962004840000042
Wherein: wetIs the total energy of the electromagnetic wave in the resonant cavity, WesIs the total energy of the electromagnetic wave stored in the sample, V is the volume of the inner cavity of the resonant cavity, VsFor the volume of the sample,. epsilon. (v) is the dielectric constant of the resonator (related to the spatial structure). epsilon. (v)sIs the dielectric constant, E.E, of the sample*Is the electric field energy.
Parameter PedIs a dielectric constant of epsilondA loss tangent of tan. deltadThe dielectric support column electric energy filling factor of (1) can be expressed as
Figure GDA0002962004840000043
Wherein: wedIs the total energy of the electromagnetic wave, ε, stored in the dielectric support postsdIs the dielectric constant, V, of the dielectric support postsdIs the volume of the media support column.
From the expressions (3) to (5), the Q value is related to the dielectric constant, loss tangent and volume, and thus can be simply considered to be
ε2·tanδ2＝V1·ε1·tanδ1+(1-V1)εs·tanδs (6)
Wherein epsilon1、tanδ1The dielectric constant and the loss tangent obtained without adding the sample are respectively represented by f0、Q0To obtain epsilon2、tanδ2Showing the dielectric constant and loss tangent, V, obtained by adding the sample1Representing the relative volume, ε, of the ring dielectric resonator to the samples、tanδsThe dielectric constant and loss tangent of the sample to be measured are shown.
The method for measuring the microwave dielectric property of the high dielectric loss material comprises the following specific steps:
(1) by using TE011Mode Metal resonator, as shown in FIG. 1, wherein 1 represents TE011A mode circular ring-shaped dielectric resonator, 2 represents a low dielectric constant dielectric support, 3 represents a sample to be measured, and 1 is positioned right above 2;
(2) connecting the metal resonant cavity with a network analyzer, building a test system as shown in fig. 2, setting an initial frequency and the number of scanning points, and calibrating the network analyzer and the coaxial cable;
(3) a circular ring-shaped dielectric resonator 1 is arranged in the middle of the upper part of a low-dielectric-constant dielectric support body 2 in a metal resonant cavity, wherein the dielectric resonator adopts a dielectric constant of 36.7 and a loss tangent of 1 multiplied by 10-4Test and find TE011Resonant peak of working mode, recording resonant frequency f0And a quality factor Q0；
(4) Making the sample to be measured into a round long rod-shaped sample with the same height as the resonator, measuring the diameter of the sample, and recording the diameter as D1；
(5) Placing a sample 3 to be tested at the central position of the circular ring-shaped dielectric resonator 1, testing and searching TE011Resonance peak of working mode, recording resonance frequency fLAnd a quality factor QL；
(6) An electromagnetic simulation model is established according to a cylindrical metal resonant cavity object, the resonant frequency of cavity simulation is ensured to be completely consistent with the actually measured resonant frequency, a curve graph of resonant frequency deviation of samples with different diameters changing along with dielectric constant is established by utilizing electromagnetic simulation software and is subjected to linear fitting, the curve is obviously shown to be closest to the linear relation by observation, and then, at least 3 samples with known dielectric constants are used as standard samples for calibration, as shown in figure 3. FIG. 3 is a graph showing the relationship between the resonance frequency deviation of samples with different diameters and the change of dielectric constant, and the calibration of a curve phi of 3.0mm is completed by using paraffin, fused quartz glass and alumina;
(7) calculating resonance frequency deviation delta f ═ f0-fLL, find diameter D from FIG. 31And the frequency deviation is the dielectric constant corresponding to delta f to obtain the dielectric constant epsilon of the samples；
(8) Obtaining epsilon through dielectric property calculation software1、tanδ1、ε2、tanδ2；
(9) The above value was substituted into formula (6) to obtain the loss tangent tan. delta. of the sample to be measureds；
(10) Repeating steps (3) - (5) and steps (7) - (9), and taking epsilons、tanδsThe average value is the dielectric constant and loss tangent value of the tested sample;
(11) and (5) replacing the sample, and repeating the steps (3) to (10) to realize the accurate test of the microwave dielectric property of the high dielectric loss material.
Example 1
The microwave dielectric property test was performed on paraffin wax, fused silica glass, and alumina having a purity of 99.6% having stable dielectric properties.
The annular dielectric resonator is ceramic with an outer diameter of 10mm and an inner diameter of 3mm, a dielectric constant of 36.7 and a loss tangent of 1 × 10-4The samples to be measured are paraffin, fused quartz glass and alumina with the diameter of 3mm and the height of 5mm respectively.
The test results are shown in table 1.
TABLE 1
Figure GDA0002962004840000061
From table 1, it is known that: when the method provided by the invention is used for testing paraffin, fused quartz glass and alumina, the test result is very close to the simulation result, the test result is good in performance, and the method is proved to be feasible and high in test precision.
Example 2
And (3) carrying out microwave dielectric property test on the wave-absorbing material with high dielectric loss.
The annular dielectric resonator is ceramic with an outer diameter of 10mm and an inner diameter of 3mm, a dielectric constant of 36.7 and a loss tangent of 1 × 10-4The sample to be detected is a wave-absorbing material with the diameter of 3mm and the height of 5mm, and is prepared by uniformly mixing and pressing paraffin and carbon powder according to the mass ratio of 1%, 2%, 4%, 8% and 16% respectively.
The test results are shown in table 2.
TABLE 2
Figure GDA0002962004840000062
From table 2, it is known that: the coaxial air line is greatly influenced by samples and environmental factors, the test precision is low, and the test of the microwave dielectric property under the condition of variable temperature cannot be realized. Compared with a coaxial air line method, the method provided by the invention has higher test precision, has more loose requirements on sample manufacture, and can provide accurate test of microwave dielectric property of the wave absorbing material under variable temperature conditions.

Claims (1)

1. A high-precision test method for microwave dielectric property of high-loss material is characterized in that the working mode of a resonant cavity is selected as TE011The method comprises the following specific steps:
(1) setting an initial frequency and the number of scanning points, and calibrating a network analyzer and a coaxial cable;
(2) TE with high Q value011A mode ring ceramic resonator disposed on the TE011Testing and finding TE by using a network analyzer in the center above the low-dielectric-constant medium support body in the mode metal resonant cavity011Resonant peak of working mode, recording resonant frequency f0And a quality factor Q0；
(3) Measuring the diameter of the sample to be measured, and placing the sample to be measured in TE011Center of the mode ring resonator, test and find TE with a network analyzer011Resonance peak of working mode, noteRecording the resonance frequency fLAnd a quality factor QL；
(4) Establishing a physical model by using electromagnetic simulation software, ensuring that the resonant frequency of cavity simulation is completely consistent with the actual measurement result, simulating the resonant frequency of an unloaded sample and a sample loaded with different dielectric constants under the diameter, drawing a resonant frequency deviation diagram of the sample loaded with different dielectric constants under the diameter, and performing linear fitting on the obtained curve;
(5) paraffin with stable dielectric property, fused quartz glass and alumina with purity of 99.6 percent are used as standard samples to test the resonant frequency and quality factor of the samples, the dielectric constant value corresponding to the resonant frequency actually measured under the diameter of the samples is searched in the step (4), and is compared with the theoretical dielectric constant value of the samples and the curve obtained in the step (4) is corrected, so that the dielectric constant values of the three samples are consistent with the theoretical values of the samples, and the purpose of correcting the fitted curve is achieved;
(6) the dielectric constant epsilon of the tested sample is obtained through the step (4)sSimplified calculation of formula ε by loss tangent2·tanδ2＝V1·ε1·tanδ1+(1-V1)εs·tanδsCalculating to obtain the loss tangent tan delta of the tested samplesIn which epsilon1、tanδ1The dielectric constant and the loss tangent obtained without adding the sample are respectively represented by f0、Q0To obtain epsilon2、tanδ2Showing the dielectric constant and loss tangent, V, obtained by adding the sample1Representing the relative volume, epsilon, of the ring dielectric resonator with respect to the sample to be measureds、tanδsThe dielectric constant and the loss tangent of the tested sample are shown;
(7) and (5) replacing the sample to be tested, and repeating the steps (1) to (6) to realize the accurate test of the microwave dielectric property of the sample to be tested.
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