CN111856150B - Error correction method for frequency-dependent change of quasi-optical cavity dielectric constant test - Google Patents
Error correction method for frequency-dependent change of quasi-optical cavity dielectric constant test Download PDFInfo
- Publication number
- CN111856150B CN111856150B CN202010833010.9A CN202010833010A CN111856150B CN 111856150 B CN111856150 B CN 111856150B CN 202010833010 A CN202010833010 A CN 202010833010A CN 111856150 B CN111856150 B CN 111856150B
- Authority
- CN
- China
- Prior art keywords
- optical cavity
- quasi
- field
- dielectric constant
- cavity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 59
- 238000000034 method Methods 0.000 title claims abstract description 27
- 238000012937 correction Methods 0.000 title claims abstract description 20
- 230000008859 change Effects 0.000 title claims abstract description 15
- 230000001419 dependent effect Effects 0.000 title claims description 6
- 230000005684 electric field Effects 0.000 claims abstract description 30
- 238000004364 calculation method Methods 0.000 claims abstract description 21
- 230000003287 optical effect Effects 0.000 claims abstract description 16
- 230000005672 electromagnetic field Effects 0.000 claims abstract description 4
- 238000005290 field theory Methods 0.000 claims description 5
- 230000035699 permeability Effects 0.000 claims description 2
- 238000001514 detection method Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- -1 polytetrafluoroethylene Polymers 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000009774 resonance method Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2682—Measuring dielectric properties, e.g. constants using optical methods or electron beams
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
The invention discloses a correction method for error along with frequency change in a quasi-optical cavity dielectric constant test, which belongs to the field of detection and can solve the problem of error along with frequency change in the quasi-optical cavity dielectric constant test, and comprises the following steps: analyzing Gaussian beam phase distribution in the optical cavity; obtaining actual phase distribution of the upper surface of the sample and an expression of an electric field and a magnetic field according to boundary condition relation of the upper surface of the sample to be detected, namely an electromagnetic field at the interface of the air and a medium area; considering the longitudinal field component of the electric field in the quasi-optical cavity, and simultaneously, listing the transverse field component and the longitudinal field component of the electric field in the quasi-optical cavity into the calculation step; the formula is carried in for calculation.
Description
Technical Field
The invention belongs to the field of detection, and particularly relates to a frequency-dependent error correction method for a quasi-optical cavity dielectric constant test.
Background
The statements herein merely provide background information related to the present disclosure and may not necessarily constitute prior art.
For testing dielectric properties of materials, the currently commonly used testing methods mainly include a plate capacitance method, a network parameter method, a resonance method, a free space method, a quasi-optical cavity method and the like. The quasi-optical cavity method has the advantages of simple operation, good mode purification effect and strong test adaptability. The quasi-optical cavity method has two structures of a quasi-optical cavity with a semi-symmetrical structure (a plano-concave cavity) and a quasi-optical cavity with a symmetrical structure (a double-ball cavity), and the structure schematic diagram is shown in figure 1. The flat concave cavity has the advantages of convenient sample loading, low processing cost and the like, and is widely used. The structure of the quasi-optical cavity test system is schematically shown in FIG. 2.
The inventor discovers that on one hand, the dielectric constant of a tested sample is unknown and cannot estimate the size of a quarter of the medium wavelength, and on the other hand, the test frequency range of the quasi-optical cavity is extremely wide, and the test cannot meet the matching of the thickness along with the change of the frequency in the wide frequency range. In a quasi-optical cavity test system, the thickness of a sample to be tested is usually a fixed value, and when the thickness does not meet one quarter of the medium wavelength, the test result can generate errors; the equiphase surface in the quasi-optical cavity is not a plane vertical to the z-axis, but a curved surface with a certain radian and a small included angle with the z-axis. The equiphase graph is shown in fig. 3. Since the sample surface is a plane and the equiphase surface is a curved surface, a point at the axis cannot represent the field of the whole material surface when boundary surface matching is performed, and errors are introduced. The included angle between the equiphase surface curve and the sample surface plane is smaller and smaller along with the increase of the frequency, so that the error phenomenon of sinusoidal fluctuation of the dielectric constant test result is avoided, the air gap between the equiphase surface and the sample surface is corrected according to the prior patent, and the inventor considers that the correction cannot solve the error phenomenon.
Disclosure of Invention
Aiming at the defects existing in the prior art, the invention aims to provide a correction method for the error of the dielectric constant test of the quasi-optical cavity along with the change of frequency.
In order to achieve the above object, the present invention is realized by the following technical scheme:
in a first aspect, the present invention provides a method for correcting error of a quasi-optical cavity dielectric constant test along with frequency change, including the following steps:
analyzing Gaussian beam phase distribution in the optical cavity;
obtaining actual phase distribution of the upper surface of the sample and an expression of an electric field and a magnetic field according to boundary condition relation of the upper surface of the sample to be detected, namely an electromagnetic field at the interface of the air and a medium area;
considering the longitudinal field component of the electric field in the quasi-optical cavity, and simultaneously, listing the transverse field component and the longitudinal field component of the electric field in the quasi-optical cavity into the calculation step;
the formula is carried in for calculation.
The technical scheme of the invention has the following beneficial effects:
in the past, although the quasi-optical cavity test system has higher precision compared with a network parameter method and the like, the extremely high precision condition of the test precision is ensured to be that the thickness of a sample is equal to odd times of the quarter dielectric wavelength during test, the thickness of the sample cannot be estimated during engineering test of unknown dielectric materials, and meanwhile, during broadband internal test, the quarter dielectric wavelength is a frequency variable, and the thickness of the test sample cannot be changed along with the change of the test frequency, so that the test error of the broadband internal dielectric constant is increased. The invention can solve the problem that the sample thickness does not meet the calculation result error introduced by the system theory when the quarter-medium wavelength matching is tested, thereby realizing the high-precision test of the broadband quasi-optical cavity.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention.
Figure 1a is a schematic diagram of a quasi-optical cavity with a semi-symmetrical structure in the background of the invention,
figure 1b is a schematic diagram of a symmetrical structured quasi-optical cavity in the background of the invention,
figure 2 is a schematic diagram of a quasi-optical cavity test system in the background of the invention,
figure 3 is an equiphase curve x-plane and z-plane diagram of the background of the invention,
figure 4 is a 10mm inner equiphase plane plot on a 20GHz mirror in one or more embodiments of the invention,
figure 5 is a 10mm inner equiphase plane plot on a 40GHz mirror in one or more embodiments of the invention,
figure 6 is a 10mm inner equiphase plane plot on an 80GHz plane mirror in one or more embodiments of the invention,
figure 7 is a graph of 15-50GHz quartz dielectric constant test result data in one or more embodiments of the invention,
figure 8 is a graph of Ex field components as a function of frequency in one or more embodiments of the invention,
fig. 9 is a graph of a power line in one or more embodiments of the invention.
The mutual spacing or dimensions are exaggerated for the purpose of showing the positions of the various parts, and the schematic illustrations are used for illustration only.
Detailed Description
It should be noted that the following detailed description is illustrative and is intended to provide further explanation of the invention. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of exemplary embodiments according to the present invention. As used herein, the singular forms also are intended to include the plural forms unless the present invention clearly dictates otherwise, and furthermore, it should be understood that when the terms "comprise" and/or "include" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof;
as described in the background art, the invention aims to provide a correction method for frequency-dependent error of quasi-optical cavity dielectric constant test, which can solve the problem of frequency-dependent error of quasi-optical cavity dielectric constant test.
Examples
In an exemplary implementation manner of the present invention, the present embodiment provides a method for correcting error of a quasi-optical cavity dielectric constant test along with frequency variation, which is mainly used for correcting error of a wideband quasi-optical cavity dielectric constant test result error regularity, analyzing by using a quasi-optical cavity field theory derived by a complex point source theory, correcting error amplitude by considering influence of a longitudinal field component, and correcting phase error by using a corresponding relation between a dielectric test result frequency variation phenomenon and theory.
Specifically, the method comprises the following steps:
1) Analyzing Gaussian beam phase distribution in the optical cavity;
2) According to the matching relation of the electromagnetic field boundary conditions at the interface of the air and the medium area on the upper surface of the sample to be detected, the actual phase distribution of the upper surface of the sample and the electric field and magnetic field intensity are obtained;
3) Meanwhile, the transverse field component and the longitudinal field component of the electric field in the quasi-optical cavity are listed in a dielectric constant calculation step;
4) And carrying out formula calculation to calculate the dielectric constant.
When the Gaussian beam phase distribution in the optical cavity is aligned by adopting the beam theory for analysis, the quasi-optical cavity size and the sample thickness of the sample are determined, and a graph of the electric field at the interface of the sample and the air along with the frequency is drawn according to the calculation result.
The correction method is suitable for flat concave cavities and double concave cavities.
Said step 1) comprises the steps of:
1) Adopting a beam theory to aim at Gaussian beam phase distribution in an optical cavity for analysis;
2) The phase expression of Gaussian beams is obtained by beam theory and wave equation:
it will be appreciated by those skilled in the art that it is common knowledge in the art to analyze the gaussian beam phase distribution in an optical cavity, and that the calculation methods and calculation steps are only listed here and are not listed.
Said step 3) comprises the steps of:
the quasi-optical cavity field theory deduced by the complex point source theory is utilized for analysis, the influence of the longitudinal field component is considered for error amplitude correction, and the phase error correction is carried out through the corresponding relation between the frequency change phenomenon of the dielectric test result and the theory.
It will be appreciated by those skilled in the art that the theory of multiple point sources is common general knowledge in the art, and that the steps for performing specific calculations using the theory are not listed together.
The gaussian beam theory mainly refers to that the transverse amplitude of electromagnetic waves in an optical cavity meets gaussian beam function distribution, is not a strict mathematical solution of the electromagnetic waves, but is a reasonable approximation of the spatial distribution of the electromagnetic waves when the electromagnetic waves meet certain conditions. The approximation introduces very small errors and can greatly simplify the field solution complexity, so that the method is widely applied to practical problems. The transverse boundary condition in Gaussian beam theory does not influence the distribution of beams, and is matched with the open structure of the quasi-optical cavity, so that the quasi-optical cavity can be well applied to a quasi-optical cavity system.
The Gaussian beam theory solves the problem of the open boundary condition of the quasi-optical cavity, and the paraxial approximation condition is applied to the analysis of the field inside the cavity. Analyzing Gaussian beam phase distribution in the optical cavity, including quasi-optical cavity open boundary condition analysis and cavity internal field analysis; the problem of the quasi-optical cavity open boundary condition is analyzed by using a beam wave theory, and the analysis is performed by using paraxial approximate conditions and combining the beam wave theory when the field inside the cavity is analyzed.
When the paraxial approximation is used, the distribution of the field along the z-axis in the collimating optical cavity is assumed to be superimposed by plane waves having a small angle with the z-axis.
And analyzing Gaussian beam phase distribution in the optical cavity, including resonance problem analysis, wherein standing wave solution is required to be obtained for the field in the resonant cavity, and a main mode standing wave field formula in the flat concave cavity is finally obtained by applying scalar fluctuation theory under the condition of meeting paraxial approximation.
Under the condition of meeting paraxial approximation, a scalar fluctuation theory is applied to finally obtain a main mode standing wave field formula in the flat concave cavity:
wherein E is x For the transverse electric field component, H y Is the transverse magnetic field component, j is the complex unit, w 0 The wave beam is Gaussian, w (z) is the beam radius at z, ρ is a transverse variable, k is a wave number, phi is Guan Canliang with z, R (z) is a wave front curvature radius, ε is a dielectric constant, μ is a dielectric permeability, and z is a longitudinal variable;
it can be seen that only the transverse field component E is used in the formula X Or H y The calculation of the amount in the z-direction is lacking.
Based on the prior knowledge, a person skilled in the art can calculate the z-direction component of the field by using gaussian beam theory under the condition of knowing the field distribution, and the specific principle thereof will not be described here.
It should be noted that, in the step 3), after the longitudinal field component is listed in the calculation step, the phase correction factor is obtained by combining the test data result; and selecting a typical frequency point, matching the thickness of the sample with a frequency point corresponding to one quarter and one half of the medium wavelength, analyzing a transverse field and a longitudinal field, and matching at the interface of the medium and air to obtain an amplitude correction factor.
On the basis of the test result of the traditional method, the test result of the dielectric constant in the broadband range is corrected, the error of the test result when the thickness of the sample is not matched with the quarter-wavelength dielectric is eliminated, and the high-precision dielectric performance test of the dielectric constant of the quasi-optical cavity is realized.
In a specific implementation scenario, for example, taking a polytetrafluoroethylene sample with a thickness of 3.53mm as an example, when the quasi-optical cavity is sized and the thickness of the sample is fixed, a graph of the electric field at the interface between the sample and air is plotted as shown in fig. 8, and the abscissa is the frequency. From the electric field graph and the fluctuation of the test result, it can be seen that when the transverse electric field Ex takes the maximum value (positive and negative represent the field direction), namely, the corresponding quarter wavelength, the dielectric constant test result is the central axis value, namely, no amplitude fluctuation exists, the test result is the most accurate, and the maximum error occurs in the test result when the electric field amplitude is 0.
The plot of the power line in the xz plane is shown in fig. 9. The tangential direction of the electric field lines represents the direction of the electric field, and the field strength of the electric field is maximum when the thickness of the sample is equal to an odd multiple of the quarter-medium wavelength, and the electric field is mainly the transverse electric field when the tangential direction of the electric line lines is close to a straight line parallel to the z-axis, and corresponds to the place where the electric line lines are most dense. When the thickness of the sample is equal to an integral multiple of one half of the medium wavelength, the electric field is transverse only on the axis, and other position power lines are close to be perpendicular to the surface of the sample, although the power lines are sparse at the moment, namely the electric field value is small, and the longitudinal field component of the whole surface of the sample cannot be ignored at the moment.
The accuracy of error analysis sources can be determined by combining the power line curve graph with the test data curve, and the periodic variation rule of dielectric property can be seen by analyzing the field component derived from the complex point source theory. Combining the test data result to obtain a phase correction factor; and selecting a typical frequency point, matching the thickness of the sample with a frequency point corresponding to one quarter and one half of the medium wavelength, analyzing a transverse field and a longitudinal field, and matching at the interface of the medium and air to obtain an amplitude correction factor.
If the conventional calculation method only considering the transverse field component is adopted, the graphs of the equiphase surfaces of 20GHz, 40GHz and 80GHz are shown in fig. 4 to 6, respectively, and the equiphase surfaces at the interface of the sample and the air are analyzed to change along with the frequency, so that the equiphase surfaces only slightly change along with the frequency, and the change direction rule is not consistent with the change rule of the dielectric constant test result in the broadband.
It can be seen that the magnitude of the equiphase surface variation is small in the range of 20-80GHz, i.e. the degree of matching of the equiphase surface of the sample surface with the sample hardly changes with frequency, and thus the air gap introduced by the mismatch hardly changes with frequency, and when the sample thickness t is fixed (e.g. 3.5mm is taken, i.e. z=3.5), the radius of curvature of the equiphase surface at the sample surface hardly changes with frequency. And the actual test results dielectric calculations fluctuate over a range of frequency values.
The results of the test polytetrafluoroethylene dielectric constant calculations are shown in the graph below, with the relative dielectric constant on the ordinate and frequency (in GHz) on the abscissa. The calculation result adopts an error correction formula for the mismatch between the equiphase surface and the sample surface, and the problem of frequency variation error cannot be solved. In the scalar fluctuation theory, the transverse electric field only has the Ex direction, no longitudinal field component, and the difference exists between the transverse electric field and the actual electric field in the cavity, and if analysis is carried out from the field theory, the analysis cannot be carried out. The corrected result curve is shown in fig. 7.
The vector theory (complex point source theory) gives standing wave field solution in the quasi-optical cavity, but the transverse field Ex is still utilized for matching when the sample is matched with the air interface field, so that the error of the broadband test settlement result is not solved. I.e. the test result is most accurate when the thickness of the tested sample meets the quarter medium wavelength. Aiming at the test error problem, the invention starts from the quasi-optical cavity internal field theory, considers the influence factors of the longitudinal field components, and corrects the broadband test result, thereby eliminating the broadband dielectric constant test error.
The above description is only of the preferred embodiments of the present invention and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. The error correction method for the dielectric constant test of the quasi-optical cavity along with the frequency change is characterized by comprising the following steps:
analyzing Gaussian beam phase distribution in the optical cavity;
adopting a beam theory to aim at Gaussian beam phase distribution in an optical cavity for analysis;
the phase expression of Gaussian beams is obtained by beam theory and wave equation:
obtaining actual phase distribution of the upper surface of the sample and an expression of an electric field and a magnetic field according to boundary condition relation of the upper surface of the sample to be detected, namely an electromagnetic field at the interface of the air and a medium area;
considering the longitudinal field component of the electric field in the quasi-optical cavity, and simultaneously, listing the transverse field component and the longitudinal field component of the electric field in the quasi-optical cavity into the calculation step;
the main mode standing wave field formula in the flat concave cavity is as follows:
wherein E is x For the transverse electric field component, H y Is the transverse magnetic field component, j is the complex unit, w 0 The wave beam is Gaussian, w (z) is the beam radius at z, ρ is a transverse variable, k is a wave number, phi is Guan Canliang with z, R (z) is a wave front curvature radius, ε is a dielectric constant, μ is a dielectric permeability, and z is a longitudinal variable;
carrying out calculation of dielectric constant by taking the formula into the formula;
after the longitudinal field component is listed in the calculation step, a phase correction factor is obtained by combining the test data result; selecting a typical frequency point, matching the thickness of a sample with a frequency point corresponding to one quarter and one half of the medium wavelength, analyzing a transverse field and a longitudinal field, and matching at the interface of the medium and air to obtain an amplitude correction factor;
when considering the longitudinal field component of the electric field in the quasi-optical cavity, the quasi-optical cavity field theory deduced by the complex point source theory is utilized to analyze, the influence of the longitudinal field component is considered to correct the error amplitude, and the phase error correction is carried out through the corresponding relation between the frequency change phenomenon of the dielectric test result and the theory.
2. The method for correcting error along with frequency variation in a quasi-optical cavity dielectric constant test according to claim 1, wherein a beam theory is adopted when Gaussian beam phase distribution in an optical cavity is aligned for analysis, the quasi-optical cavity size and the sample thickness of a sample are determined, and a graph of electric field along with frequency variation at an interface between the sample and air is drawn according to a calculation result.
3. The method of claim 1, wherein the correction method is applicable to both flat-cavity and double-cavity.
4. The method for correcting error of frequency variation in dielectric constant test of quasi-optical cavity according to claim 1, wherein when the Gaussian beam phase distribution in the optical cavity is analyzed, including quasi-optical cavity open boundary condition analysis and cavity internal field analysis; the problem of the quasi-optical cavity open boundary condition is analyzed by using a beam wave theory, and the analysis is performed by using paraxial approximate conditions and combining the beam wave theory when the field inside the cavity is analyzed.
5. The method of correcting frequency dependent error in a quasi-optical cavity dielectric constant test of claim 4, wherein said paraxial approximation is used to assume that the distribution of the field along the z-axis in the quasi-optical cavity is formed by superimposing plane waves having a small angle with the z-axis.
6. The method for correcting error of frequency variation in dielectric constant test of quasi-optical cavity according to claim 1, wherein the analysis of Gaussian beam phase distribution in the optical cavity is performed by analyzing Gaussian beam phase distribution in the optical cavity, and further comprising resonance problem analysis, wherein standing wave solution is needed to be obtained for the field in the resonant cavity, and a main mode standing wave field formula in the flat cavity is finally obtained by applying scalar fluctuation theory under the condition of meeting paraxial approximation.
7. The method for correcting frequency variation error in quasi-optical cavity dielectric constant test of claim 1, wherein the typical frequency point is 20GHz, 40GHz or 80GHz.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010833010.9A CN111856150B (en) | 2020-08-18 | 2020-08-18 | Error correction method for frequency-dependent change of quasi-optical cavity dielectric constant test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010833010.9A CN111856150B (en) | 2020-08-18 | 2020-08-18 | Error correction method for frequency-dependent change of quasi-optical cavity dielectric constant test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111856150A CN111856150A (en) | 2020-10-30 |
| CN111856150B true CN111856150B (en) | 2024-02-02 |
Family
ID=72969227
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010833010.9A Active CN111856150B (en) | 2020-08-18 | 2020-08-18 | Error correction method for frequency-dependent change of quasi-optical cavity dielectric constant test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111856150B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112666402A (en) * | 2020-12-22 | 2021-04-16 | 北京无线电计量测试研究所 | Millimeter wave frequency band material dielectric constant quasi-optical integrated test equipment and measurement method |
| CN113504414B (en) * | 2021-06-23 | 2022-05-03 | 电子科技大学 | Method and device for detecting plasma complex dielectric constant transient microwave transmission |
| CN113608032B (en) * | 2021-07-08 | 2024-02-06 | 中电科思仪科技股份有限公司 | Method for testing dielectric property of quasi-optical cavity double-layer material |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006275614A (en) * | 2005-03-28 | 2006-10-12 | Aet Inc | Instrument for measuring complex permittivity by using cavity resonator |
| CN101158702A (en) * | 2007-10-30 | 2008-04-09 | 电子科技大学 | Dielectric materials high-temperature complex dielectric constant measurement method based on terminal short circuit method |
| CN103412983A (en) * | 2013-07-22 | 2013-11-27 | 电子科技大学 | Quasi-optical phase correction surface design method |
| US9151793B1 (en) * | 2014-09-25 | 2015-10-06 | King Fahd University Of Petroleum And Minerals | Method for measuring the complex dielectric constant of a substance |
| CN107144736A (en) * | 2017-05-24 | 2017-09-08 | 电子科技大学 | The quasi-optical cell method wideband of material complex dielectric permittivity tests non-equiphase surface modification method |
| CN111077377A (en) * | 2019-11-28 | 2020-04-28 | 电子科技大学 | Sample stage for inhibiting degenerate high-order mode of quasi-optical cavity, and testing method and application thereof |
| CN111157802A (en) * | 2020-01-03 | 2020-05-15 | 西安交通大学 | Method for measuring microwave dielectric property of high-loss material by adopting electric field symmetric structure |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9841448B2 (en) * | 2014-11-24 | 2017-12-12 | Battelle Memorial Institute | Resonant system and method of determining a dielectric constant of a sample |
| DE102015208026A1 (en) * | 2015-03-03 | 2016-09-08 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Arrangement for the spatially resolved determination of the specific electrical resistance and / or the specific electrical conductivity of samples |
-
2020
- 2020-08-18 CN CN202010833010.9A patent/CN111856150B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006275614A (en) * | 2005-03-28 | 2006-10-12 | Aet Inc | Instrument for measuring complex permittivity by using cavity resonator |
| CN101158702A (en) * | 2007-10-30 | 2008-04-09 | 电子科技大学 | Dielectric materials high-temperature complex dielectric constant measurement method based on terminal short circuit method |
| CN103412983A (en) * | 2013-07-22 | 2013-11-27 | 电子科技大学 | Quasi-optical phase correction surface design method |
| US9151793B1 (en) * | 2014-09-25 | 2015-10-06 | King Fahd University Of Petroleum And Minerals | Method for measuring the complex dielectric constant of a substance |
| CN107144736A (en) * | 2017-05-24 | 2017-09-08 | 电子科技大学 | The quasi-optical cell method wideband of material complex dielectric permittivity tests non-equiphase surface modification method |
| CN111077377A (en) * | 2019-11-28 | 2020-04-28 | 电子科技大学 | Sample stage for inhibiting degenerate high-order mode of quasi-optical cavity, and testing method and application thereof |
| CN111157802A (en) * | 2020-01-03 | 2020-05-15 | 西安交通大学 | Method for measuring microwave dielectric property of high-loss material by adopting electric field symmetric structure |
Non-Patent Citations (2)
| Title |
|---|
| 电磁开腔测量双层介质复介电常数;夏军;《通信学报》;全文 * |
| 邹翘.准光腔法介电性能高精度测试技术研究.《中国优秀硕士论文全文数据库 信息科技》.2018,(第undefined期),第2-56页. * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111856150A (en) | 2020-10-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111856150B (en) | Error correction method for frequency-dependent change of quasi-optical cavity dielectric constant test | |
| Cullen et al. | The accurate measurement of permittivity by means of an open resonator | |
| Wang et al. | Characterization of dielectric materials at WR-15 band (50–75 GHz) using VNA-based technique | |
| CN107543970B (en) | Dielectric constant measuring method based on database calibration method | |
| CN109669075B (en) | Dielectric complex dielectric constant nondestructive reflection measurement method based on open rectangular waveguide | |
| US20200174050A1 (en) | Measuring device, measuring system, and measuring method for liquid crystal dielectric constant | |
| Sahin et al. | A simplified Nicolson–Ross–Weir method for material characterization using single-port measurements | |
| Ozturk et al. | Development of measurement and extraction technique of complex permittivity using transmission parameter s 21 for millimeter wave frequencies | |
| CN107144736A (en) | The quasi-optical cell method wideband of material complex dielectric permittivity tests non-equiphase surface modification method | |
| Kazemipour et al. | Standard load method: A new calibration technique for material characterization at terahertz frequencies | |
| Khalid et al. | Evaluation of a VNA-based material characterization kit at frequencies from 0.75 THz to 1.1 THz | |
| CN114137316A (en) | Microwave sensor measuring method for nondestructive testing of material tiny dielectric fluctuation | |
| You et al. | Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors | |
| Shahid et al. | Reflection type Q-factor measurement using standard least squares methods | |
| Hofmann et al. | A multistandard method of network analyzer self-calibration—Generalization of multiline TRL | |
| Gui et al. | Improvement of open resonator technique for dielectric measurement at millimetre wavelengths | |
| Lau et al. | An accurate free space method for material characterization in w-band using material samples with two different thicknesses | |
| CN113608032B (en) | Method for testing dielectric property of quasi-optical cavity double-layer material | |
| Schemmel et al. | Refractive index of polyaryletherketone (peek) at X-and W-band | |
| El Afendi et al. | Dielectric characterization using FEM modeling and ANNs for coaxial waveguide with conical open ended radiation | |
| Cheng et al. | An Inversion Method of Dielectric Material Characteristics at Terahertz Band | |
| Lu et al. | Planar Scanning Measurement System of Material Properties Based on Free Space Method | |
| Vaccaro et al. | Dielectric characterization of curved structures using flangeless open-ended waveguide measurement | |
| Li et al. | Broadband Measurement of Dielectric Properties for Low Loss Materials | |
| Czekala et al. | Beam Waist in a Plano-Concave Fabry-Perot Open Resonator |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 266555 No. 98 Xiangjiang Road, Huangdao District, Qingdao City, Shandong Province Applicant after: CLP kesiyi Technology Co.,Ltd. Address before: 266555 No. 98 Xiangjiang Road, Huangdao District, Qingdao City, Shandong Province Applicant before: CHINA ELECTRONICS TECHNOLOGY INSTRUMENTS Co.,Ltd. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |