CN111025029A - System and method for testing near-field directional diagram of triple-frequency phased array surface - Google Patents
System and method for testing near-field directional diagram of triple-frequency phased array surface Download PDFInfo
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Abstract
The invention provides a triple-frequency phased array surface near-field directional diagram test system and a triple-frequency phased array surface near-field directional diagram test method. The invention reduces the test frequency of the directional diagram, shortens the time by more than half, compensates the directional diagram result and ensures that the test precision is kept unchanged.
Description
Technical Field
The invention belongs to the antenna measurement technology, and particularly relates to a system and a method for testing a near-field directional pattern of a triple-frequency phased array surface.
Background
Phased arrays have flexible beams, with consequent enormous testing and calibration effort. For its features, a set of near field test systems is usually customized. To shorten the testing time, two methods are commonly used: and simultaneously measuring by multiple probes and measuring by multiple wave positions. Generally, the simultaneous measurement of multiple probes needs to solve the problems of mutual coupling and consistency between probes. The multi-wave position measurement is to acquire measurement information as much as possible in one scanning process. At present, near-field correction of phased array equipment at home and abroad usually adopts a waveguide probe to measure an array surface, and the method is characterized by high linear polarization purity, weak directional diagram and zero-point-free forward direction.
At present, the ultra-wideband phased array surface near-field directional diagram test adopts waveguide probes of different frequency bands for time-sharing test. For the 6-18GHz phased array area near-field directional diagram test, waveguide probes of three frequency bands (BJ70, BJ100 and BJ140) are adopted to respectively test the directional diagram of the array surface, the probes need to be frequently replaced in the sub-band test, the radio frequency link signal is adjusted to work in a linear area, the efficiency is low, and the test time is too long.
Disclosure of Invention
The invention aims to provide a frequency tripling phased array area near-field directional diagram test system.
The technical solution for realizing the purpose of the invention is as follows: a frequency tripling phased array surface near field directional diagram test system comprises a near field control system, an amplification coupling circuit, a first frequency mixer, a broadband probe, a near field scanning frame and a second frequency mixer, wherein the near field control system is connected with one end of the amplification coupling circuit, the other end of the amplification coupling circuit is respectively connected with an antenna to be tested and the near field control system, the broadband probe is arranged on the near field scanning frame and is connected with one end of the second frequency mixer, the other end of the second frequency mixer is connected with the near field control system, the near field control system is used for generating an excitation signal to be output to the amplification coupling circuit and simultaneously used for controlling the near field scanning frame, obtaining amplitude and phase data according to a signal detected by the broadband probe and obtaining a far field directional diagram through near field and far field conversion.
Preferably, the broadband probe is a 6-18GHz broadband ridge horn with an H-plane opening, the opening surface of the E-plane is a half wavelength of high frequency, and the wall thickness of the horn is controlled within 1 mm.
Preferably, the broadband probe is arranged at a position 7.5cm-12.5cm away from the antenna to be measured
The invention also provides a method for testing the near-field directional diagram of the triple-frequency phased array surface, which comprises the following specific steps:
step 3, the near field control system excites the radiation signal of the antenna to be measured, the broadband probe collects the radiation signal of the antenna to obtain amplitude and phase data, the near field control system controls the near field scanning frame to adjust the direction of the broadband probe to obtain the amplitude and phase data of each position of the antenna to be measured;
and 5, obtaining a far-field directional diagram through near-far field transformation according to the amplitude-phase data.
Preferably, the broadband probe is compensated when a far-field pattern is obtained through near-far-field transformation according to the amplitude-phase data, and the specific calculation formula is as follows:
and Fe _ aut _ none and Fh _ aut _ none are E-plane and H-plane directional diagrams of the antenna to be detected when the probe compensation is not considered, Fe _ probe and Fh _ probe are E-plane and H-plane directional diagrams of the probe, and Fe _ aut and Fh _ aut are E-plane and H-plane directional diagrams of the antenna to be detected after the compensation.
Compared with the prior art, the invention has the following remarkable advantages:
(1) when the near-field directional diagram test is carried out on the array surface equipment, the broadband probe is used for debugging, the state of the directional diagram can be roughly tested in the 6-18GHz full-frequency band, the fault is eliminated, and the frequent assembly and disassembly of 3 standard waveguide probes are avoided;
(2) the invention adopts the broadband probe to test the directional diagram under each mode, does not need to replace the probe, avoids repeatedly adjusting the gain of the radio frequency link, shortens the time by more than half, and keeps the test precision unchanged;
(3) the invention adopts the broadband probe to replace the three frequency band waveguide probes, thereby reducing the production cost.
The present invention is described in further detail below with reference to the attached drawings.
Drawings
FIG. 1 is a schematic diagram of a frequency tripling phased array front-field pattern testing system.
FIG. 2 is a comparison graph of the test results of the backward direction of the broadband probe and the waveguide probe respectively compensated when the working frequency is 6 GHz.
FIG. 3 is a comparison graph of the test results of the backward direction graph of the broadband probe and the waveguide probe respectively compensated with the working frequency of 12 GHz.
FIG. 4 is a comparison graph of the test results of the backward direction of the broadband probe and the waveguide probe respectively compensated with the working frequency of 18 GHz.
Detailed Description
As shown in fig. 1, a triple-frequency phased array surface near-field pattern testing system includes a near-field control system, an amplifying coupling circuit, a first mixer, a broadband probe, a near-field scanning frame, and a second mixer, where the near-field control system is connected to one end of the amplifying coupling circuit, the other end of the amplifying coupling circuit is connected to a measured antenna and the near-field control system, the broadband probe is disposed on the near-field scanning frame, the broadband probe is connected to one end of the second mixer, the other end of the second mixer is connected to the near-field control system, the near-field control system is configured to generate an excitation signal and output the excitation signal to the amplifying coupling circuit, and simultaneously, the near-field control system is configured to control the near-field scanning frame, acquire amplitude and phase data according to a signal detected by the broadband probe, and obtain.
The working process of the invention is as follows: an excitation signal sent by the near field control system is divided into two parts through an amplifier and a coupler, wherein one part is used as an excitation signal of the antenna to be detected and used for exciting the antenna to be detected to radiate a signal; the other part of the reference intermediate frequency signal is obtained by a mixer and is returned to the near field control system; the broadband probe receives a signal radiated by the antenna to be detected, transmits the signal to the mixer to obtain a detected intermediate frequency signal, transmits the detected intermediate frequency signal to the near field control system, and the near field control system obtains amplitude-phase data according to the reference intermediate frequency signal and the detected intermediate frequency signal. And adjusting the direction of the broadband probe through the near-field scanning frame, thereby obtaining the amplitude-phase data of each position of the antenna to be measured. The method specifically comprises the following steps: controlling the near-field scanning frame to move to a preset starting point along the horizontal direction in the test process, then moving at equal intervals along the vertical direction, and collecting the amplitude phase of the near-field region of the antenna at equal intervals in the moving process to obtain the amplitude phase data of the line; after one row of test is finished, the scanning frame moves to the next position along the horizontal direction to obtain the next row of amplitude and phase data, and the steps are repeated in this way to obtain the amplitude and phase data of the whole mouth surface. And obtaining amplitude-phase data in other modes by adjusting parameters of the broadband probe, and passing through a near-far field according to the amplitude-phase data.
In a further embodiment, the broadband probe is a 6-18GHz broadband ridge horn with an H surface opened, the opening surface of the E surface is a half wavelength of high frequency, and the wall thickness of the horn is controlled within 1mm, so that the influence of the wall thickness on the radiation performance is reduced.
In a further embodiment, the broadband probe is positioned 7.5cm to 12.5cm from the antenna being measured.
A method for testing a near-field directional diagram of a triple frequency phased array surface comprises the following specific steps:
step 3, the near field control system excites the radiation signal of the antenna to be measured, the broadband probe collects the radiation signal of the antenna to obtain amplitude and phase data, the near field control system controls the near field scanning frame to adjust the direction of the broadband probe to obtain the amplitude and phase data of each position of the antenna to be measured;
and 5, obtaining a far-field directional diagram through near-far field transformation according to the amplitude-phase data.
In a further embodiment, for the linear polarization test, a far-field directional diagram is obtained through near-far-field transformation according to amplitude-phase data, and the broadband probe is compensated, wherein a specific calculation formula is as follows:
and Fe _ aut _ none and Fh _ aut _ none are E-plane and H-plane directional diagrams of the antenna to be measured, which are measured when the probe compensation is not considered, Fe _ probe and Fh _ probe are E-plane and H-plane directional diagrams of the probe, and Fe _ aut and Fh _ aut are E-plane and H-plane directional diagrams of the antenna to be measured after the compensation.
In further embodiments, the broadband probe parameters include frequency, azimuth angle, elevation angle, and digital beamforming size, angle, and distance.
The invention uses the 6-18GHz broadband and the ridged horn as the broadband probe, and changes the three-time test of the directional diagram frequency division band into the one-time test of the full frequency band. In the test process, the frequency point number is increased by 3 times in the one-time directional diagram test process, the test time is increased linearly, and the test time mainly depends on the directional diagram test times. The broadband probe can reduce the frequency of the directional diagram, so that the time is shortened by more than half, the result of the directional diagram is compensated, and the test precision is kept unchanged.
Examples
A method for testing a near-field directional diagram of a triple frequency phased array surface comprises the following specific steps:
in this embodiment, the design of the broadband probe is as follows: and a 650-ridge waveguide horn with an H-plane opening is adopted, and the opening surface of the E plane is half wavelength of high frequency, so that the E plane has wider beam width. Meanwhile, in order to meet the radiation condition, the opening surface of the H surface is more than half wavelength. In order to reduce the edge diffraction, the wall thickness of the horn is within 1 mm. The horn can be regarded as a gradually-opened waveguide probe, and the directional diagram of the waveguide probe can be obtained by normalizing functions of an E surface and an H surface of the free space waveguide probe.
step 3, the near field control system excites the radiation signal of the antenna to be measured, the broadband probe collects the radiation signal of the antenna to obtain amplitude and phase data, the near field control system controls the near field scanning frame to adjust the direction of the broadband probe to obtain the amplitude and phase data of each position of the antenna to be measured;
and 5, obtaining a far-field directional diagram through near-far field transformation according to the amplitude-phase data.
The amplitude-phase data of each position is obtained through the test of the embodiment, the far-field directional diagram under each mode is obtained through near-far field transformation, index statistics is carried out on the far-field directional diagram data, and the far-field directional diagram data and the waveguide probe directional diagram statistical data are compared and analyzed. Comparing the standard probe and the broadband probe head compensation curve with the three typical frequency point patterns in the figures 2, 3 and 4, the amplitude difference is within 1dB within Azimuth +/-60 degrees. Comparing uncompensated curves of the broadband probe with compensated curves of the broadband probe, wherein the amplitude difference value reaches 3dB within the Azimuth (Azimuth) +/-60 degrees, namely when a far-field directional diagram is obtained through near-far field transformation, the directional diagram of the antenna to be detected can be accurately obtained only by compensating the broadband probe, and the broadband probe compensation calculation formula is as follows:
and Fe _ aut _ none and Fh _ aut _ none are E-plane and H-plane directional diagrams of the antenna to be detected when the probe compensation is not considered, Fe _ probe and Fh _ probe are E-plane and H-plane directional diagrams of the probe, and Fe _ aut and Fh _ aut are E-plane and H-plane directional diagrams of the antenna to be detected after the compensation. As can be seen from the comparison of the directional diagram test results of the broadband probe and the waveguide probe in the figures 2, 3 and 4, the directional diagrams are consistent within the range of the test angle +/-60 degrees, and the engineering application requirements are met.
The statistics of the waveguide probe pattern versus the broadband pattern test time are shown in table 2. The total number of waveguide probe tests was 3. The test time of the waveguide probe is 9 hours, and the total time is 10 hours by adding the probe replacement time (1 hour); the total testing times of the broadband probe are 3 times, the time is 4 hours, the probe does not need to be replaced, and the total time is 4 hours.
The total testing time of the broadband probe is less than half of that of the waveguide probe, so that the testing efficiency is improved.
TABLE 1 broadband Probe Directional diagram test Master control test parameters and NSI software setup Table
Table 2 waveguide probe directional diagram test master control test parameter and NSI software setting table
Claims (6)
1. The near-field control system is connected with one end of the amplifying coupling circuit, the other end of the amplifying coupling circuit is respectively connected with an antenna to be measured and the near-field control system, the broadband probe is arranged on the near-field scanning frame and connected with one end of the second mixer, the other end of the second mixer is connected with the near-field control system, the near-field control system is used for generating an excitation signal and outputting the excitation signal to the amplifying coupling circuit, and meanwhile the near-field control system is used for controlling the near-field scanning frame, acquiring amplitude and phase data according to signals detected by the broadband probe and obtaining a directional diagram far field through near-field transformation.
2. The frequency tripling phased array front field near field pattern test system according to claim 1, wherein the broadband probe is a 6-18GHz broadband ridged horn with an H-plane open, the aperture plane of the E-plane is a half wavelength of high frequency, and the horn wall thickness is controlled within 1 mm.
3. The frequency tripling phased array front field near field pattern testing system of claim 1, wherein the broadband probe is positioned 7.5cm to 12.5cm from the antenna under test.
4. The frequency tripling phased array area near field pattern test system based on any one of claims 1 to 3 is characterized by comprising the following specific steps:
step 1, arranging a broadband probe at a position 7.5cm-12.5cm away from an antenna to be tested, adopting a broadband probe to carry out full-band test, and setting the working frequency of a front surface to be 6-18GHz/1 GHz;
step 2, setting parameters of a broadband probe;
step 3, the near field control system excites the radiation signal of the antenna to be measured, the broadband probe collects the radiation signal of the antenna to obtain amplitude and phase data, the near field control system controls the near field scanning frame to adjust the direction of the broadband probe to obtain the amplitude and phase data of each position of the antenna to be measured;
step 4, adjusting parameters of the broadband probe, and repeating the step 3 to obtain amplitude-phase data of each position of the antenna to be measured in different modes;
and 5, obtaining a far-field directional diagram through near-far field transformation according to the amplitude-phase data.
5. The method for testing the frequency tripling phased array front-field near-field pattern according to claim 4, wherein the broadband probe is compensated when a far-field pattern is obtained through near-far field transformation according to amplitude-phase data, and the specific calculation formula is as follows:
and Fe _ aut _ none and Fh _ aut _ none are E-plane and H-plane directional diagrams of the antenna to be detected when the probe compensation is not considered, Fe _ probe and Fh _ probe are E-plane and H-plane directional diagrams of the probe, and Fe _ aut and Fh _ aut are E-plane and H-plane directional diagrams of the antenna to be detected after the compensation.
6. The frequency tripling phased array front field near field pattern testing method of claim 4, wherein the broadband probe parameters include frequency, azimuth angle, elevation angle, and digital beam forming size, angle and distance.
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| CN113449439A (en) * | 2021-08-27 | 2021-09-28 | 广东健博通科技股份有限公司 | Design method, device and system of array antenna and storage medium |
| CN115133265A (en) * | 2022-07-13 | 2022-09-30 | 中国船舶集团有限公司第七二三研究所 | Testing horn angle adjusting device and method for marine investigation antenna |
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| CN115133265A (en) * | 2022-07-13 | 2022-09-30 | 中国船舶集团有限公司第七二三研究所 | Testing horn angle adjusting device and method for marine investigation antenna |
| CN115133265B (en) * | 2022-07-13 | 2024-06-07 | 中国船舶集团有限公司第七二三研究所 | Test horn angle adjusting device and method for marine investigation antenna |
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