CN113992278A - Calibration test method and device for reflective phased array antenna - Google Patents

Calibration test method and device for reflective phased array antenna Download PDF

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Publication number
CN113992278A
CN113992278A CN202111635427.5A CN202111635427A CN113992278A CN 113992278 A CN113992278 A CN 113992278A CN 202111635427 A CN202111635427 A CN 202111635427A CN 113992278 A CN113992278 A CN 113992278A
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array antenna
phased array
array element
test probe
reflective
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CN113992278B (en
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周建华
曾卓
毛小莲
鲍坤
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Shanghai Laitian Communication Technology Co ltd
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/10Monitoring; Testing of transmitters
    • H04B17/11Monitoring; Testing of transmitters for calibration
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/20Monitoring; Testing of receivers
    • H04B17/21Monitoring; Testing of receivers for calibration; for correcting measurements

Abstract

The application discloses a calibration test method of a reflective phased array antenna, which comprises the following steps. Step S10: and (4) removing the self space feed source of the reflection type phased array antenna. Step S20: an external feed source and a test probe are arranged at the midfield position, so that the test probe is ensured to be not shielded from the reflecting surface of the reflective phased array antenna; the midfield position refers to a region from 3 wavelengths to 10 wavelengths from the emission surface. Step S30: adopt external feed source to carry out the offset feed radiation feed to the plane of reflection formula phased array antenna's reflection, gather the radiation signal that each array element of plane of reflection formula phased array antenna's reflection returns through test probe to carry out calibration trim to the data that each array element gathered and make the phase place of each array element aperture face department unanimous. The method and the device have the advantages of simple test method and calculation process, low calibration difficulty and high calibration precision.

Description

Calibration test method and device for reflective phased array antenna
Technical Field
The application relates to a calibration test method of a reflective phased array antenna.
Background
The reflective phased-array antenna is a mixture of a reflector antenna (reflector antenna) and a phased-array antenna (phased array antenna), and generally comprises a space feed source and a reflector, wherein the space feed source is installed through a support so as to keep a proper distance from the reflector. The spatial feed is typically located directly in front of or laterally in front of the reflecting surface. The reflecting surface consists of a set of reflecting elements, each of which can be individually phased to form a high gain beam in a desired direction.
The phase inconsistency among the channels of the phased array antenna can cause the problems of low radiation efficiency and the like, the phased array antenna is inevitably subjected to processing errors in the production and processing process and the phase shift errors of the phase shifter cause the phase inconsistency of the channels of the phased array antenna, and the errors can be verified and compensated only through the calibration test after production. The current mainstream phased array antenna calibration methods include a near field scanning method, a rotation vector method, a point-by-point scanning method and the like.
The reflective phased array antenna differs from the conventional phased array antenna in that it has an externally fed structure (i.e., a spatial feed). Due to the existence of the space feed source, the reflective phased array antenna is difficult to calibrate by directly adopting a near field scanning method, a rotation vector method and a point-by-point scanning method (the calibration result is not accurate). Especially, in the reflective phased array antenna of the feed forward method, the probe cannot accurately acquire the amplitude and phase values of each channel of the antenna array surface during calibration, and the calibration of each channel of the antenna array surface is difficult to perform. Therefore, a new calibration method is required for the reflective phased array antenna.
Disclosure of Invention
The technical problem to be solved by the application is to provide a calibration test method suitable for a reflective phased array antenna. Therefore, the application also provides a calibration test device suitable for the reflective phased array antenna.
In order to solve the above technical problem, the present application provides a calibration test method for a reflective phased array antenna, which includes the following steps. Step S10: and (4) removing the self space feed source of the reflection type phased array antenna. Step S20: an external feed source and a test probe are arranged at the midfield position, so that the test probe is ensured to be not shielded from the reflecting surface of the reflective phased array antenna; the midfield position refers to a region from 3 wavelengths to 10 wavelengths from the emission surface. Step S30: adopt external feed source to carry out the offset feed radiation feed to the plane of reflection formula phased array antenna's reflection, gather the radiation signal that each array element of plane of reflection formula phased array antenna's reflection returns through test probe to carry out calibration trim to the data that each array element gathered and make the phase place of each array element aperture face department unanimous. The method avoids the interference brought to test calibration by the space feed source of the reflection type phased array antenna positioned between the test probe and the reflecting surface, improves the accuracy of array surface calibration of the reflection type phased array antenna, and is simple and convenient to implement and low in cost.
Further, the midfield position has a radiation near-field characteristic for the whole reflection surface of the reflective phased array antenna and a radiation far-field characteristic for each array element in the reflective phased array antenna.
Further, in the step S20, the external feed source is located at a side surface of the test probe, and the external feed source is located at a distance from the test probe.
Further, in step S20, the incident angle of the external feed source to the center of the reflection plane of the reflective phased array antenna is greater than or equal to 0 degree and less than 90 degrees.
Preferably, in step S20, the incident angle of the external feed to the center of the reflection plane of the reflective phased array antenna is 30 degrees.
Further, the calibration and trimming for the collected data of each channel in step S30 further includes the following sub-steps. Step S31: calculating the incident phase of each array element
Figure 100002_DEST_PATH_IMAGE002
. Step S32: the method comprises the steps of carrying out offset feed radiation feed on a reflecting surface of the reflective phased array antenna by adopting an external feed source, and acquiring a radiation signal A reflected by each array element of the reflecting surface of the reflective phased array antenna through a test probei(ii) a When each array element is tested, the test probe is kept to be opposite to each array element at the same distance. Step S33: calculating the compensation phase value of each array element
Figure 100002_DEST_PATH_IMAGE004
(ii) a By passing
Figure 227621DEST_PATH_IMAGE004
And calculating a balancing value required when the relative phases of the array elements are balanced to be 0, and obtaining the calibration balancing table. Step S34: and performing phase balancing on each array element according to the values in the calibration balancing table, and repeating the steps S32 to S33 until the test result shows that the phases at the aperture surfaces of the channels are consistent.
Preferably, in step S31, the external feed is applied to the incident phase of the array element i
Figure 494654DEST_PATH_IMAGE002
Calculating by adopting a formula II:
Figure 100002_DEST_PATH_IMAGE006
(formula two); wherein K0Is the propagation constant of an electromagnetic wave in a vacuum,
Figure 100002_DEST_PATH_IMAGE008
,λ0is the wavelength of the electromagnetic wave;
Figure 100002_DEST_PATH_IMAGE010
c is the speed of light, f0Is the frequency of the electromagnetic wave.
Preferably, in step S32, the test probe measures the reflected radiation signal a collected by the array iiCalculating by adopting a formula III:
Figure 100002_DEST_PATH_IMAGE012
(formula three); wherein
Figure 100002_DEST_PATH_IMAGE014
Is the reflected phase of the array element i,
Figure 100002_DEST_PATH_IMAGE016
to test the distance of the probe to the array element i,
Figure 886364DEST_PATH_IMAGE004
the compensation phase introduced for array element i.
Preferably, in step S32, for the phased array antenna with each channel being individually turned off, the phased array antenna is calibrated by using a point-by-point scanning method, the test probe moves to align with each array element to be tested to perform data acquisition, and when data of a certain channel is acquired, the signal output of other channels is turned off.
Preferably, in step S32, for a phased array antenna whose channel cannot be individually turned off, a rotation vector method is used to perform data acquisition and calculation on the channel.
Preferably, in step S33, the compensating phase introduced by the array element i
Figure 555243DEST_PATH_IMAGE004
Calculating by the formula four:
Figure 100002_DEST_PATH_IMAGE018
(formula four); because the test probe is vertical and has the same distance with each array element in the test process, the test probe has the advantages of simple structure, low cost, and high reliability
Figure 610924DEST_PATH_IMAGE014
Is constant for each channel.
The application also provides a calibration test device of the reflection type phased array antenna, which comprises a dismantling unit, a setting unit and a test unit. The dismounting unit is used for dismounting the space feed source of the reflection type phased array antenna. The setting unit is used for setting an external feed source and a test probe at a midfield position to ensure that no shielding exists between the test probe and a reflecting surface of the reflective phased array antenna; the midfield position refers to a region from 3 wavelengths to 10 wavelengths from the emission surface. The test unit is used for carrying out offset feed radiation feed on the reflecting surface of the reflective phased array antenna by adopting an external feed source, collecting radiation signals reflected by each array element of the reflecting surface of the reflective phased array antenna through the test probe, and calibrating and balancing data collected by each array element to enable the phase position of the aperture surface of each array element to be consistent. The device avoids the interference brought by the space feed source of the reflection type phased array antenna between the test probe and the reflecting surface for test calibration, improves the accuracy of array surface calibration of the reflection type phased array antenna, and is simple and convenient to realize and low in cost.
The method has the advantages that the shielding influence of the space feed source of the reflection type phased array antenna on the aperture surface (namely the reflecting surface) of the antenna is eliminated, the array surface of the reflection type phased array antenna is directly calibrated, and the method has the advantages of simple test method and calculation process, low calibration difficulty and high calibration precision.
Drawings
Fig. 1 is a schematic flowchart of a calibration test method for a reflective phased array antenna according to the present application.
Fig. 2 is a schematic structural diagram of the calibration test apparatus for the entire reflective phased array antenna after step S20 is completed.
Fig. 3 is a schematic view of the subdivision flow of step S30.
FIG. 4 is a schematic diagram of the relative positions of the reflection surface of the surface antenna, the external feed source and the test probe.
Fig. 5 is a block diagram of a calibration test apparatus for a reflective phased array antenna according to the present application.
The reference numbers in the figures illustrate: 10 is a dismantling unit, 20 is a setting unit, 30 is a testing unit, 51 is an X-axis guide rail, 52 is a Y-axis guide rail, 53 is a sliding block, 54 is a testing probe, 55 is an external feed source, 56 is a Z-axis guide rail, 57 is an antenna support frame, and 58 is a reflection type phased array antenna (namely an antenna to be tested).
Detailed Description
Referring to fig. 1, the calibration test method for the reflective phased array antenna provided by the present application includes the following steps.
Step S10: and (4) removing the self space feed source of the reflection type phased array antenna.
Step S20: an external feed source and a test probe are arranged at the middle field position, so that the test probe is ensured to be free from shielding from a reflecting surface (namely an antenna array surface) of the reflective phased array antenna. The midfield position refers to a region 3 wavelengths to 10 wavelengths away from the antenna front. The mid-field position has a radiating near-field characteristic for the antenna array and an approximate radiating far-field characteristic for each antenna element in the antenna array. For example, the external feed source is located at the side of the test probe and at a distance from the test probe.
The external feed source is used for measuring the incident angle of the center of the reflecting surface of the reflective phased array antenna to be more than or equal to 0 degree and less than 90 degrees, calibration test can be carried out in the angle range, and the difference is that the test errors are different when the incident angle is different. Preferably, the external feed source has an angle of incidence of 30 degrees to the center of the reflecting surface of the reflective phased array antenna. The 30-degree incident angle can ensure that the external feed source can not shield the measuring probe to scan the reflecting surface, and the difference between the reflecting phase curve and the vertical incident phase is not large, so that the feed can be similar to the feed in a positive feed mode.
Step S30: the method comprises the steps of carrying out offset feed radiation feed on a reflecting surface of the reflective phased array antenna by adopting an external feed source, collecting radiation signals reflected by each array element (namely each channel) of the reflecting surface of the reflective phased array antenna through a test probe, and calibrating and balancing data collected by each channel to enable the phases of the channels to be consistent.
The distance between the space feed source (original space feed source) of the reflection type phased array antenna and the reflection surface is generally very close. When the antenna array surface of the reflective phased array antenna is calibrated at the midfield position, the original space feed source is necessarily positioned between the test probe and the reflecting surface of the reflective phased array antenna, and errors are necessarily generated when the antenna array surface of the reflective phased array antenna is calibrated under the condition. After the original space feed source is detached, the shielding of the original space feed source on the antenna array surface is avoided.
Referring to fig. 2, after the step S20 is completed, the whole calibration test apparatus for the reflective phased array antenna includes three major parts. The first part is a test probe 54, which is fixed to the slide 53. The slider 53 is fixed to the Y-axis guide rail 52 and is movable in the Y-axis direction along the Y-axis guide rail 52. The Y-axis guide 52 is fixed to the X-axis guide 51 and is movable in the X-axis along the X-axis guide 51. The X-axis guide rail 51, the Y-axis guide rail 52, and the slider 53 form a scanning frame, and the scanning frame drives the test probe 54 to perform a scanning test at a midfield position away from the reflective phased array antenna 58. The second part is an external feed 55, also maintained in a midfield position with a reflective phased array antenna 58. The third part is a reflective phased array antenna 58 to be tested, which is secured to an antenna support bracket 57. The antenna support bracket 57 is fixed to the Z-axis guide rail 56 and is movable in the Z-axis direction along the Z-axis guide rail 56. The reflective surface of the reflective phased array antenna 58 is planar and parallel to the XY plane. Generally, non-planar reflecting surfaces are not part of a phased array antenna and are not part of the scope of this application.
Referring to fig. 3, the calibration and trimming for the data collected by each channel in step S30 specifically includes the following sub-steps.
Step S31: calculating the incident phase of each array element
Figure 365253DEST_PATH_IMAGE002
. An array element refers to each antenna element constituting an antenna array, i.e. each reflecting element constituting a reflecting surface of a reflective phased array antenna. The incident phase from the external feed source phase center to each array element is different, so the incident phase of each array element needs to be calculated.
Referring to the schematic diagram and the coordinate system of the reflection plane, the external feed source and the test probe of the planar antenna shown in fig. 4, the distance from the phase center of the external feed source to a certain array element i (shown by a black square in the figure) is RiAfter the positions of the external feed source and the reflecting surface are fixed, RiIs also a fixed value, RiThe following formula I is adopted for calculation:
Figure DEST_PATH_IMAGE020
(formula one). Wherein (x)i,yi) Is the i coordinate of the array element, the Y axis is the direction perpendicular to the paper, R0The vertical distance from the phase center of the external feed source to the reflecting surface (plane).
According to the theory of array antenna, the incident phase from external feed source to each array element
Figure 915314DEST_PATH_IMAGE002
The following formula two is adopted for calculation:
Figure 438700DEST_PATH_IMAGE006
(formula two). Wherein K0Is transmission of electromagnetic waves in vacuumThe constant of the broadcast is the constant of the broadcast,
Figure 930861DEST_PATH_IMAGE008
,λ0is the wavelength of the electromagnetic wave.
Figure 172486DEST_PATH_IMAGE010
C is the speed of light, f0Is the frequency of the electromagnetic wave. Under the position layout of fig. 4, after the positions of the reflecting surface of the reflective phased-array antenna to be measured and the external feed source are fixed, the relative distance between the reflecting surface of the reflective phased-array antenna to be measured and the external feed source is kept unchanged, and the incident phase from the external feed source to each array element is obtained by calculation of a formula two. As long as the positions of the reflecting surface and the external feed source are unchanged during each test, the incident phase of each array element cannot be changed, and the incident phase table formed by the method is a certain value.
Step S32: after the incident phase meter is obtained, an external feed source is adopted to carry out offset feed radiation feed on the reflecting surface of the reflective phased array antenna, and a test probe is used for collecting radiation signals A reflected by each array element of the reflecting surface of the reflective phased array antennai. And considering accuracy and rapidity, when each array element is tested, the test probe is kept to be over against each array element to be tested at the same distance, namely the connecting line of the test probe and each array element to be tested is vertical to the array element to be tested, and the length of the connecting line is kept unchanged. When the test probe is over against a certain array element to be tested and the data reflected by the array element to be tested is collected, the test probe moves to over against the next array element to be tested and collects the data reflected by a new array element to be tested; and moving in sequence until the reflection data of all array elements are acquired.
Measurement of array element i by the probe (i.e. the collected reflected radiation signal) AiThe following formula three is adopted for calculation:
Figure DEST_PATH_IMAGE021
(formula three). Wherein the content of the first and second substances,
Figure 759194DEST_PATH_IMAGE014
is the reflected phase of the array element i,
Figure 464982DEST_PATH_IMAGE016
the distance from the test probe to the array element i is shown in FIG. 4;
Figure 800149DEST_PATH_IMAGE004
the compensation phase introduced for array element i. Each antenna array element (unit) can introduce a compensation phase, and the size of the compensation phase is realized by a wave control device of the reflection type phased array antenna. And the formula III shows that the acquired data consists of the incident phase of each array element of the reflecting surface, the compensation phase introduced by each array element and the reflection phase. The purpose of calibrating the reflecting surface of the reflective phased array antenna is to obtain the compensation phase of each array element, so that the phases at the aperture surface of each channel antenna after reflection are the same.
Preferably, during testing (that is, data acquisition), the phased array antenna with each channel capable of being independently turned off is calibrated by adopting a point-by-point scanning method, the scanning frame drives the test probe to move to align each array element to be tested for data acquisition, and when data of a certain channel is acquired, signal output of other channels is turned off. And for the phased array antenna with the channel incapable of being independently turned off, data acquisition and calculation are carried out on the channel by adopting a rotation vector method. The channel refers to an antenna unit channel, that is, a T/R (transmission/reception) component connected to each antenna unit. The T/R component consists of a low noise amplifier, a high power amplifier, a phase shifter, a T/R switch and other functional circuits. Calibration of the antenna elements may also be understood as calibration of the antenna channels.
Step S33: calculating the compensation phase value of each array element
Figure 342120DEST_PATH_IMAGE004
. The compensation phase introduced by the array element i can be known by the formula III
Figure 483251DEST_PATH_IMAGE004
Can be calculated by equation four as follows:
Figure DEST_PATH_IMAGE022
(equation four). Obtained during previous testing
Figure 981228DEST_PATH_IMAGE002
Watch and AiBecause the test probe is vertical and has the same distance with each array element in the test process, the test probe has the advantages of simple structure, low cost, and high reliability
Figure 64460DEST_PATH_IMAGE014
The compensation phase value of each array element can be obtained by a formula IV
Figure 15098DEST_PATH_IMAGE004
. By passing
Figure 959920DEST_PATH_IMAGE004
And calculating a balancing value required when the relative phases of the array elements are balanced to be 0, and obtaining the calibration balancing table.
Step S34: and (4) carrying out phase balancing on each array element according to the numerical value in the calibration balancing table, repeating the steps from S32 to S33 until the test result shows that the phases at the aperture surfaces of the channels are consistent, stopping the iteration test, and finishing the whole calibration test.
Referring to fig. 5, the calibration and test apparatus for a reflective phased array antenna according to the present invention includes a removing unit 10, a setting unit 20, and a testing unit 30.
The removing unit 10 is used for removing the spatial feed source of the reflection type phased array antenna.
The setting unit 20 is used for setting an external feed source and a test probe at a midfield position, so as to ensure that no shielding exists between the test probe and a reflecting surface of the reflective phased array antenna. The midfield position refers to a region from 3 wavelengths to 10 wavelengths from the emission surface.
The test unit 30 is configured to perform offset feed radiation feed on the reflection surface of the reflective phased array antenna by using an external feed source, collect radiation signals reflected by each array element of the reflection surface of the reflective phased array antenna through the test probe, and perform calibration and balancing on data collected by each channel to make phases of each channel consistent.
According to the calibration test method of the reflective phased array antenna, the external feed source is adopted to replace the original space feed source to perform offset feed irradiation on the antenna array surface (namely the reflecting surface) at the midfield position, the shielding of the original space feed source on the antenna array surface is avoided, then data acquisition of each channel is performed through the test probe at the midfield position, and calibration balancing is performed on the acquired data of each channel to enable the phase of each channel to be consistent. The method can effectively eliminate the shielding influence of the space feed source of the reflection type phased array antenna on the aperture surface (namely the reflecting surface) of the antenna, directly calibrate the array surface of the reflection type phased array antenna, and has the advantages of simple test method and calculation process, low calibration difficulty and high calibration precision. The method fills the blank of the calibration of the array surface of the reflective phased array antenna at present, and has wide application prospect for the trend that the reflective phased array antenna can become mainstream in the future and the necessity of the test verification along with the trend.
The above are merely preferred embodiments of the present application and are not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims (12)

1. A calibration test method of a reflection type phased array antenna is characterized by comprising the following steps;
step S10: dismantling a space feed source of the reflection type phased array antenna;
step S20: an external feed source and a test probe are arranged at the midfield position, so that the test probe is ensured to be not shielded from the reflecting surface of the reflective phased array antenna; the midfield position refers to a region which is 3 wavelengths to 10 wavelengths away from the emitting surface;
step S30: adopt external feed source to carry out the offset feed radiation feed to the plane of reflection formula phased array antenna's reflection, gather the radiation signal that each array element of plane of reflection formula phased array antenna's reflection returns through test probe to carry out calibration trim to the data that each array element gathered and make the phase place of each array element aperture face department unanimous.
2. The method of claim 1, wherein the midfield position has a radiating near-field characteristic for the entire reflecting surface of the reflective phased array antenna and a radiating far-field characteristic for each element of the reflective phased array antenna.
3. The method for calibrating and testing a reflective phased array antenna according to claim 1, wherein in step S20, the external feed source is located at a side of the test probe and at a distance from the test probe.
4. The method for calibrating and testing the reflective phased array antenna according to claim 3, wherein in the step S20, the incident angle of the external feed source to the center of the reflection surface of the reflective phased array antenna is greater than or equal to 0 degree and less than 90 degrees.
5. The method for calibrating and testing the reflective phased array antenna according to claim 4, wherein in the step S20, the incident angle of the external feed to the center of the reflection surface of the reflective phased array antenna is 30 degrees.
6. The method for calibrating and testing a reflective phased array antenna as claimed in claim 1, wherein said calibration and trimming of the data collected in each channel in step S30 further comprises the following sub-steps;
step S31: calculating the incident phase of each array element
Figure DEST_PATH_IMAGE002
Step S32: the method comprises the steps of carrying out offset feed radiation feed on a reflecting surface of the reflective phased array antenna by adopting an external feed source, and acquiring a radiation signal A reflected by each array element of the reflecting surface of the reflective phased array antenna through a test probei(ii) a When each array element is tested, the test probe is kept to be opposite to each array element at the same distance;
step S33: calculating for each array elementCompensating phase value
Figure DEST_PATH_IMAGE004
(ii) a By passing
Figure 363629DEST_PATH_IMAGE004
Calculating a balancing value required when each array element is balanced until the relative phase is 0, and obtaining a calibration balancing table;
step S34: and performing phase balancing on each array element according to the values in the calibration balancing table, and repeating the steps S32 to S33 until the test result shows that the phases at the aperture surfaces of the channels are consistent.
7. The method for calibrating and testing a reflective phased array antenna as claimed in claim 6, wherein in step S31, the external feed is applied to the incident phase of the array element i
Figure 280769DEST_PATH_IMAGE002
Calculating by adopting a formula II:
Figure DEST_PATH_IMAGE006
(formula two); wherein K0Is the propagation constant of an electromagnetic wave in a vacuum,
Figure DEST_PATH_IMAGE008
,λ0is the wavelength of the electromagnetic wave;
Figure DEST_PATH_IMAGE010
c is the speed of light, f0Is the frequency of the electromagnetic wave.
8. The method for calibrating and testing a reflective phased array antenna as claimed in claim 6, wherein in step S32, the test probe measures the reflected radiation signal A collected by the array element iiCalculating by adopting a formula III:
Figure DEST_PATH_IMAGE012
(formula three); wherein
Figure DEST_PATH_IMAGE014
Is the reflected phase of the array element i,
Figure DEST_PATH_IMAGE016
to test the distance of the probe to the array element i,
Figure 998189DEST_PATH_IMAGE004
the compensation phase introduced for array element i.
9. The method for calibrating and testing the reflective phased array antenna according to claim 6, wherein in the step S32, the phased array antenna with each channel being individually turned off is calibrated by a point-by-point scanning method, the test probe moves to align with each array element to be tested for data acquisition, and when data of a certain channel is acquired, the signal output of other channels is turned off.
10. The method for calibrating and testing a reflective phased array antenna according to claim 6, wherein in step S32, for the phased array antenna whose channel cannot be independently turned off, the channel is subjected to data acquisition and calculation by using a rotation vector method.
11. The method for calibrating and testing a reflective phased array antenna as claimed in claim 6, wherein in said step S33, the compensating phase introduced by the array element i
Figure 393399DEST_PATH_IMAGE004
Calculating by the formula four:
Figure DEST_PATH_IMAGE018
(formula four); because the test probe is vertical and has the same distance with each array element in the test process, the test probe has the advantages of simple structure, low cost, and high reliability
Figure 519355DEST_PATH_IMAGE014
Is constant for each channel.
12. A calibration test device of a reflection type phased array antenna is characterized by comprising a dismantling unit, a setting unit and a test unit;
the dismantling unit is used for dismantling a space feed source of the reflection type phased array antenna;
the setting unit is used for setting an external feed source and a test probe at a midfield position to ensure that no shielding exists between the test probe and a reflecting surface of the reflective phased array antenna; the midfield position refers to a region which is 3 wavelengths to 10 wavelengths away from the emitting surface;
the test unit is used for carrying out offset feed radiation feed on the reflecting surface of the reflective phased array antenna by adopting an external feed source, collecting radiation signals reflected by each array element of the reflecting surface of the reflective phased array antenna through the test probe, and calibrating and balancing data collected by each array element to enable the phase position of the aperture surface of each array element to be consistent.
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Cited By (2)

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Publication number Priority date Publication date Assignee Title
CN117394929A (en) * 2023-12-12 2024-01-12 南京纳特通信电子有限公司 Phased array antenna calibration method, device, medium, equipment and calibration test method
WO2024060040A1 (en) * 2022-09-20 2024-03-28 京东方科技集团股份有限公司 Single-channel test device and system, and test method

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