CN110954938B - Threshold correction method and device of comparator and sampling circuit - Google Patents
Threshold correction method and device of comparator and sampling circuit Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/005—Details of radiation-measuring instruments calibration techniques
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/26—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being duration, interval, position, frequency, or sequence
Abstract
The embodiment of the application discloses a threshold correction method and device of a comparator and a sampling circuit, wherein the method can comprise the following steps: measuring time intervals between rising edge transitions and corresponding falling edge transitions generated by the comparator when the amplitudes of the received reference signals respectively reach a reference threshold value, so as to obtain a plurality of different time intervals corresponding to the reference signals; and selecting a predetermined number of time intervals from the obtained plurality of time intervals, calculating a difference between the selected time intervals, and calculating an actual operating threshold of the comparator under the reference threshold according to the obtained difference. By utilizing the technical scheme provided by the embodiment of the application, the accuracy of the subsequent signal sampling result can be improved.
Description
Technical Field
The present disclosure relates to the field of data processing technologies, and in particular, to a threshold correction method and apparatus for a comparator, and a sampling circuit.
Background
Positron Emission Tomography (PET) is a technique for clinical imaging using radioactive elements, and mainly captures gamma photons emitted by annihilation of positrons in a subject to obtain distribution of a tracer labeled with a Positron nuclide in the subject, thereby obtaining physiological characteristics such as organ function and metabolism.
A multi-threshold sampling method (e.g., MVT sampling method) can be used to achieve digital sampling of the pulse signal detected with the PET detector, the main principle of which is as follows: corresponding reference threshold values are preset according to characteristics of the pulse signals output by the PET detectors, and digital sampling of the pulse signals is realized by digitizing the time when the amplitude of the pulse signals crosses the threshold values. In practical applications, the MVT sampling method is generally performed by using an MVT sampling circuit including a comparator, a time-to-digital converter (TDC), and the like. The comparator is used for comparing the voltage of the pulse signal output by the PET detector with a preset reference voltage and outputting a jump signal at the moment when the voltage of the pulse signal crosses the reference voltage, and the time-to-digital converter is used for digitizing the time of the jump signal output by the comparator so as to obtain a sampling point of the pulse signal.
In the process of implementing the present application, the inventor finds that at least the following problems exist in the prior art:
when the MVT sampling circuit is used to digitally sample the pulse signal output by the PET detector, the actual voltage inverted by the comparator may not be consistent with the preset reference voltage due to the influence of various factors such as the manufacturing process of the comparator and environmental factors, and thus the accuracy of the signal sampling result may be reduced.
Disclosure of Invention
The embodiment of the application aims to provide a threshold correction method and device of a comparator and a sampling circuit so as to improve the accuracy of a subsequent signal sampling result.
In order to solve the above technical problem, an embodiment of the present application provides a threshold correction method for a comparator, where the threshold correction method may include:
s1, measuring the time interval between the rising edge jump and the corresponding falling edge jump generated by the comparator when the amplitudes of the received reference signals respectively reach the reference threshold value, so as to obtain a plurality of different time intervals corresponding to the reference signals; and
s2, selecting a predetermined number of time intervals from the obtained plurality of time intervals, calculating a difference between the selected time intervals, and calculating an actual operating threshold of the comparator under the reference threshold according to the obtained difference.
In at least one embodiment, the step S1 may include:
measuring a first time interval between a first rising edge transition and a corresponding first falling edge transition generated by each of the comparators when the amplitude of the received first reference signal reaches the reference threshold;
measuring a second time interval between a second rising edge transition and a corresponding second falling edge transition generated by each of the comparators when the amplitude of the received second reference signal reaches the reference threshold;
and so on, until the Nth time interval between the Nth rising edge jump generated by each comparator when the amplitude of the received Nth reference signal reaches the reference threshold and the corresponding Nth falling edge jump is measured, wherein N is a positive integer larger than 1.
In at least one embodiment, each of the time intervals may be obtained by:
measuring, for each of the reference signals received by each of the comparators, a first actual time at which each of the comparators generates a rising edge transition and a second actual time at which a corresponding falling edge transition is generated;
calculating a difference between each of the first actual times and the corresponding second actual time as the time interval.
In at least one embodiment, the step S2 may include:
selecting two different time intervals from the plurality of time intervals, calculating a difference between the selected two different time intervals, and calculating an actual operating threshold of the comparator under the reference threshold according to the obtained difference.
In at least one embodiment, the step S2 may further include:
calculating differences between every two different time intervals in the plurality of time intervals in sequence, calculating an actual working threshold of the comparator under the reference threshold according to each obtained difference, calculating an average value of the plurality of obtained actual working thresholds, and taking the obtained average value as the final actual working threshold of the comparator.
In at least one embodiment, the difference between two different said time intervals may be calculated using the following formula:
DOTi-DOTj＝(T′2i-T′1i)-(T′2j-T′1j)
＝[(T2i+Toffset2)-(T1i+Toffset1)]-[(T2j+Toffset2)-(T1j+Toffset1)]
＝[(f-1(M′th)2+Toffset2)-(f-1(M′th)1+Toffset1)]-[(g-1(M′th)2+Toffset2)- (g-1(M′th)1+Toffset1)]
＝(f-1(M′th)2-f-1(M′th)1)-(g-1(M′th)2-g-1(M′th)1)
wherein, DOTiAnd DOTjRepresenting two different time intervals; m'thRepresenting an actual operating threshold of the comparator; t is1i＝f-1(M′th)1And T2i＝f-1(M′th)2Respectively representing theoretical time of generating an ith rising edge jump and an ith falling edge jump by the comparator; t is1j＝g-1(M′th)1And T2j＝g-1(M′th)2Respectively representing theoretical time of a comparator generating a j rising edge jump and a j falling edge jump; t isoffset1And Toffset2Respectively expressed in the same reference threshold value MthThe lower measured comparator generates time deviation between the actual time of the rising edge jump and the falling edge jump and the corresponding theory; i and j are respectively different positive integers.
In at least one embodiment, the reference signal may include a sine wave signal, a cosine wave signal, a triangular wave signal, a step wave signal, a sawtooth wave signal, or a square wave signal.
In at least one embodiment, the reference threshold may comprise a preset voltage threshold or current threshold.
The present application also provides a threshold correction apparatus of a comparator, which may include:
a measuring unit configured to measure a time interval between a rising edge transition and a corresponding falling edge transition generated by the comparator when the amplitudes of the received plurality of reference signals respectively reach a reference threshold, so as to obtain a plurality of different time intervals corresponding to the plurality of reference signals; and
a processing unit configured to select a predetermined number of said time intervals from the obtained plurality of different said time intervals, calculate a difference between the selected said time intervals, and calculate an actual operating threshold of said comparator below said reference threshold based on the obtained difference.
The embodiment of the application also provides a sampling circuit, and the sampling circuit can comprise the comparator and a threshold correction device.
As can be seen from the above technical solutions provided by the embodiments of the present application, in the embodiments of the present application, time intervals between rising edge transitions and corresponding falling edge transitions, which are generated when amplitudes of a plurality of received reference signals respectively reach a reference threshold, are measured by a comparator, so as to obtain a plurality of different time intervals corresponding to the plurality of reference signals; and selecting a predetermined number of time intervals from the obtained plurality of time intervals, calculating a difference between the selected time intervals, and calculating an actual working threshold of the comparator under a reference threshold according to the obtained difference, thereby realizing threshold correction of the comparator, which makes it possible to improve the accuracy of a subsequent signal sampling result.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without any creative effort.
FIG. 1 is a schematic diagram of a MVT sampling method;
fig. 2 is a schematic flowchart of a threshold correction method of a comparator according to an embodiment of the present disclosure;
FIG. 3 is a graph illustrating the time offset between the actual time at which the comparator generates an edge transition and the corresponding theory measured at the same reference threshold;
fig. 4 is a schematic structural diagram of a threshold correction apparatus of a comparator according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a sampling circuit according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only used for explaining a part of the embodiments of the present application, but not all embodiments, and are not intended to limit the scope of the present application or the claims. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It will be understood that when an element is referred to as being "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected/coupled" to another element, it can be directly connected/coupled to the other element or intervening elements may also be present. The term "connected/coupled" as used herein may include electrical and/or mechanical physical connections/couplings. The term "comprises/comprising" as used herein refers to the presence of features, steps or elements, but does not preclude the presence or addition of one or more other features, steps or elements. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
In addition, in the description of the present application, the terms "first", "second", "third", and the like are used for descriptive purposes only and to distinguish similar objects, and there is no order of precedence between the two, and no indication or implication of relative importance is to be inferred. In addition, in the description of the present application, "a plurality" means two or more unless otherwise specified.
The basic principle of the MVT sampling method is explained below with reference to fig. 1. When the amplitude of the pulse signal in fig. 1 increases from 0 to a preset reference threshold, the comparator generates a rising edge transition, and when the amplitude of the pulse signal decreases from a peak value to the reference threshold, the comparator generates a falling edge transition, and then two sampling points, for example, (Vth1, T1) and (Vth1, T8), can be sampled at each reference threshold by measuring the time when the comparator generates the rising edge transition and the falling edge transition.
Although theoretically, the comparator should flip at the reference threshold (i.e., generate a rising edge transition or a falling edge transition), due to manufacturing factors and environmental factors existing in the comparator itself, the actual operating threshold when the comparator generates the rising edge transition and the falling edge transition may not be the same as the reference threshold, and there may be a certain deviation between the theoretical time when the comparator flips at the actual operating threshold and the measured actual time, which may affect the accuracy of the sampling result of the pulse signal. Therefore, the application provides a threshold correction method of a comparator to improve the accuracy of a subsequent signal sampling result.
As shown in fig. 2, an embodiment of the present application provides a threshold correction method for a comparator, which may include the following steps:
s1: and measuring the time interval between the rising edge jump and the corresponding falling edge jump generated by the comparator when the amplitudes of the received multiple reference signals respectively reach the reference threshold value so as to obtain multiple different time intervals corresponding to the multiple reference signals.
Each reference signal may be any signal that can be expressed as a function of time, i.e., a signal whose amplitude at that time can be determined as a function of time. That is, the amplitude of the reference signal may vary with time according to a preset law, and its amplitude expression may be M ═ f (t). Wherein M is amplitude; t is time; f (t) is a function of time, which represents a predetermined rule. Preferably, each reference signal may be a periodic signal, for example, a sine wave signal, a cosine wave signal, a triangular wave signal, a step wave signal, a sawtooth wave signal, a square wave signal, or the like. In addition, the types of the multiple reference signals may be the same or different, and only the time intervals corresponding to the reference signals are different.
The reference threshold may correspond to amplitude, and may be an electrical threshold such as voltage or current, or other threshold. In addition, the reference threshold may be preset in the comparator according to empirical data or actual requirements, or may be externally received by the comparator when the comparator receives the reference signal.
For each comparator, after receiving a reference signal and when the amplitude of the reference signal reaches a preset reference threshold, the comparator generates a corresponding edge transition. Specifically, the comparator maintains the current state when the amplitude of the reference signal is less than or greater than the reference threshold, and generates a rising edge transition when the amplitude of the reference signal increases to the reference threshold, and generates a falling edge transition when the amplitude of the reference signal decreases to the reference threshold. When the comparators generate the rising edge transition and the falling edge transition, the time interval between the rising edge transition and the falling edge transition generated by each comparator can be directly measured by using a time measuring device, the actual time of the rising edge transition and the falling edge transition generated by each comparator can be measured by using a time measuring device (for example, a TDC), and then the time interval between the rising edge transition generated by each comparator and the corresponding falling edge transition can be calculated according to the measured actual time.
After measuring a time interval, the time interval between the rising edge transition and the corresponding falling edge transition generated by each comparator under the same reference threshold after receiving other reference signals can be measured in turn to obtain a plurality of different time intervals. For example, a first time interval between a first rising edge transition and a corresponding first falling edge transition generated by each comparator when the amplitude of the received first reference signal reaches a reference threshold may first be measured; then, a second time interval between a second rising edge transition and a corresponding second falling edge transition generated by each comparator when the amplitude of the received second reference signal reaches a reference threshold may be measured; and so on, until the nth time interval between the nth rising edge jump generated by each comparator when the amplitude of the received nth reference signal reaches the reference threshold and the corresponding nth falling edge jump is measured, so that N different time intervals can be obtained, wherein N is a positive integer greater than 1.
These N time intervals can be measured directly or obtained by: for each reference signal received by each comparator, a first actual time at which each comparator generates a rising edge transition and a second actual time at which each comparator generates a corresponding falling edge transition may be measured, and then a difference between each first actual time and the corresponding second actual time may be calculated as a time interval. Each of the resulting time intervals may be represented by the following formula (1):
DOTi＝T′2i-T′1i (1)
wherein, DOTiIndicating the width of the ith time interval, which may also be referred to as the ith reference signal, below the actual operating threshold, and, for different comparators, the DOTiMay be the same or different values; i is a positive integer; t'1iAnd T'2iRespectively representing the actual times at which the measured comparators generate the ith rising edge transition and the ith falling edge transition, and T'1iIs less than T'2i. That is, T 'when the comparator generates the ith falling edge transition after generating the ith rising edge transition'1iTo representThe measured comparator produces the actual time of the ith rising edge transition, i.e., the first actual time, and T'2iRepresenting the actual time at which the measured comparator produced the ith falling edge transition, i.e., the second actual time; and vice versa.
S2: the actual operating threshold of the comparator below the reference threshold is calculated using the measured plurality of different time intervals.
After a number of different time intervals have been measured, these time intervals can be used to calculate the actual operating threshold of the comparator below the reference threshold. Specifically, a predetermined number of time intervals may be selected from the obtained plurality of different time intervals, a difference between the selected time intervals is calculated, and an actual operation threshold of the comparator under the reference threshold is calculated based on the obtained difference.
For example, two different time intervals may be selected from the obtained plurality of time intervals, and a difference between the two different time intervals may be calculated, so that the actual operating threshold of the comparator below the reference threshold may be calculated from the obtained difference. In addition, all the obtained time intervals may also be selected, at this time, the difference between every two different time intervals in the multiple time intervals may be sequentially calculated, then the actual operating threshold of the comparator under the reference threshold may be calculated according to each obtained difference, and finally, the average value of the obtained multiple actual operating thresholds may be calculated, so that the obtained average value may be used as the final actual operating threshold of the comparator.
The difference between two different time intervals can be calculated using the following equation (2):
wherein, DOTiAnd DOTjRepresenting two different time intervals; m'thRepresenting an actual operating threshold of the comparator; i and j are respectively different positive integers; t is1i＝f-1(M′th)1And T2i＝f-1(M′th)2Respectively representing the theoretical time of generating the ith rising edge jump and the ith falling edge jump by the comparator, wherein the theoretical time and the ith rising edge jump are inverse functions of the amplitude expression function f (t) of the ith reference signal; t is1j＝g-1(M′th)1And T2j＝g-1(M′th)2Respectively representing theoretical time of generating a j rising edge jump and a j falling edge jump by the comparator, wherein the theoretical time and the theoretical time are inverse functions of an amplitude expression function g (t) of a j reference signal; t isoffset1And Toffset2Respectively expressed in the same reference threshold value MthThe lower measured comparator produces a time offset between the actual time of the rising edge transition and the falling edge transition and the corresponding theory, which may be referred to as a first time offset and a second time offset, respectively, as shown in fig. 3.
Toffset1And Toffset2May be due to external factors such as signal propagation delay (e.g., signal output delay of the comparator). In addition, Toffset1And Toffset2May be positive or negative, and the values may be different. Furthermore, for different comparators, Toffset1And Toffset2May each have a different value.
The reference threshold M of the comparator can be obtained by solving or iterative analysis of the formula (2)thActual working threshold value M'th。
For each preset reference threshold and comparator, the actual operation threshold of each comparator under each reference threshold can be calculated through the above steps S1-S2, so that when the comparator is used for signal sampling, the reference threshold can be corrected to the corresponding actual operation threshold, and the accuracy of the signal sampling result can be improved.
In addition, when a plurality of comparators exist, the same reference threshold value can be set for each comparator, and the same reference signal is input, so that the time when each comparator generates a rising edge transition or a falling edge transition is the same, and the time synchronization correction among the plurality of comparators can be completed.
As can be seen from the above description, the embodiments of the present application may improve the accuracy of the subsequent signal sampling result by sequentially measuring the time intervals between the rising edge transition and the corresponding falling edge transition of the comparator generated for a plurality of received reference signals, and using the obtained plurality of different time intervals to calculate the actual operating threshold of the comparator under the reference threshold, instead of directly using the reference threshold as the actual operating threshold.
The present application also provides a threshold correction apparatus of a comparator, as shown in fig. 4, the threshold correction apparatus may include:
a measuring unit 110, which may be configured to measure time intervals between rising edge transitions and corresponding falling edge transitions generated by the comparator when amplitudes of the received multiple reference signals respectively reach a reference threshold, so as to obtain multiple different time intervals corresponding to the multiple reference signals; and
a processing unit 120, which may be configured to select a predetermined number of time intervals from the obtained plurality of different time intervals, calculate a difference between the selected time intervals, and calculate an actual operating threshold of the comparator below the reference threshold based on the obtained difference.
In an embodiment, the measuring unit 110 may be specifically configured to measure a first time interval between a first rising edge transition and a corresponding first falling edge transition generated by each comparator when the amplitude of the received first reference signal reaches a reference threshold; measuring a second time interval between a second rising edge transition and a corresponding second falling edge transition generated by each comparator when the amplitude of the received second reference signal reaches a reference threshold; and so on, until the Nth time interval between the Nth rising edge jump generated by each comparator when the amplitude of the received Nth reference signal reaches the reference threshold and the corresponding Nth falling edge jump is measured.
In addition, the N time intervals are each obtained by: measuring, for each reference signal received by each comparator, a first actual time at which each of the comparators generates a rising edge transition and a second actual time at which a corresponding falling edge transition is generated; and calculating the difference value between each first actual time and the corresponding second actual time as a time interval.
In addition, the measurement unit 110 may be a TDC, or may be another time measurement device, and is not limited herein.
In an embodiment, the processing unit 120 may be specifically configured to select two different time intervals from the plurality of time intervals, calculate a difference between the selected two different time intervals, and calculate an actual operating threshold of the comparator below the reference threshold according to the obtained difference.
In another embodiment, the processing unit 120 may be specifically configured to sequentially calculate a difference between each two different time intervals in the plurality of time intervals, calculate an actual operating threshold of the comparator under the reference threshold according to each obtained difference, calculate an average value of the obtained plurality of actual operating thresholds, and take the obtained average value as a final actual operating threshold of the comparator.
For a detailed description of the measurement unit 110 and the processing unit 120 in the threshold correction device, reference may be made to the related description in the above method embodiment, which is not described redundantly here.
By utilizing the threshold correction device provided by the embodiment of the application, the reference threshold set for the comparator can be corrected to be the actual working threshold, so that the accuracy of the subsequent signal sampling result can be improved.
The embodiment of the present application further provides a sampling circuit, as shown in fig. 5, which may include the comparator and the threshold correction device described in the above embodiment, and is preferably an MVT sampling circuit.
By sampling the pulse signal (e.g., scintillation pulse) output by the detector (e.g., PET detector) with the sampling circuit, the accuracy of the sampling result of the pulse signal can be improved.
The apparatuses, modules, units, and the like explained in the above embodiments may be specifically implemented by a semiconductor chip, a computer chip, and/or an entity, or implemented by a product having a certain function. For convenience of description, the above devices are described as being divided into various units by function, and are described separately. Of course, the functions of the units may be integrated into one or more chips when implementing the embodiments of the present application.
Although the present application provides method steps as described in the above embodiments or flowcharts, additional or fewer steps may be included in the method, based on conventional or non-inventive efforts. In the case of steps where no necessary causal relationship exists logically, the order of execution of the steps is not limited to that provided by the embodiments of the present application.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments.
The embodiments described above are described in order to enable those skilled in the art to understand and use the present application. It will be readily apparent to those skilled in the art that various modifications to these embodiments may be made, and the generic principles described herein may be applied to other embodiments without the use of the inventive faculty. Therefore, the present application is not limited to the above embodiments, and those skilled in the art should make improvements and modifications within the scope of the present application based on the disclosure of the present application.
Claims (10)
1. A method for correcting a threshold of a comparator, the method comprising the steps of:
s1, measuring the time interval between the rising edge jump and the corresponding falling edge jump generated by the comparator when the amplitudes of the received reference signals respectively reach the reference threshold value, so as to obtain a plurality of different time intervals corresponding to the reference signals; and
s2, selecting a predetermined number of time intervals from the obtained plurality of different time intervals, calculating a difference between every two time intervals of the selected predetermined number of time intervals, and calculating an actual operating threshold of the comparator under the reference threshold according to the obtained difference.
2. The method according to claim 1, wherein the step S1 includes:
measuring a first time interval between a first rising edge transition and a corresponding first falling edge transition generated by each of the comparators when the amplitude of the received first reference signal reaches the reference threshold;
measuring a second time interval between a second rising edge transition and a corresponding second falling edge transition generated by each of the comparators when the amplitude of the received second reference signal reaches the reference threshold;
and so on, until the Nth time interval between the Nth rising edge jump generated by each comparator when the amplitude of the received Nth reference signal reaches the reference threshold and the corresponding Nth falling edge jump is measured, wherein N is a positive integer larger than 1.
3. The method of claim 2, wherein each of the time intervals is obtained by:
measuring, for each of the reference signals received by each of the comparators, a first actual time at which each of the comparators generates a rising edge transition and a second actual time at which a corresponding falling edge transition is generated;
calculating a difference between each of the first actual times and the corresponding second actual time as the time interval.
4. The method according to claim 1, wherein the step S2 includes:
selecting two different time intervals from the plurality of time intervals, calculating a difference between the selected two different time intervals, and calculating an actual operating threshold of the comparator at the reference threshold based on the obtained difference.
5. The method according to claim 1, wherein the step S2 further comprises:
calculating differences between every two different time intervals in the plurality of time intervals in sequence, calculating an actual working threshold of the comparator under the reference threshold according to each obtained difference, calculating an average value of the plurality of obtained actual working thresholds, and taking the obtained average value as the final actual working threshold of the comparator.
6. The method according to claim 4 or 5, characterized in that the difference between two different time intervals is calculated using the following formula:
DOTi-DOTj＝(T'2i-T'1i)-(T'2j-T'1j)
＝[(T2i+Toffset2)-(T1i+Toffset1)]-[(T2j+Toffset2)-(T1j+Toffset1)]
＝[(f-1(M'th)2+Toffset2)-(f-1(M'th)1+Toffset1)]-[(g-1(M'th)2+Toffset2)- (g-1(M'th)1+Toffset1)]
＝(f-1(M'th)2-f-1(M'th)1)-(g-1(M'th)2-g-1(M’th)1)
wherein, DOTiAnd DOTjRepresenting two different time intervals; m'thRepresenting an actual operating threshold of the comparator; t is1i＝f-1(M'th)1And T2i＝f-1(M'th)2Respectively representing theoretical time of generating an ith rising edge jump and an ith falling edge jump by the comparator; t is1j＝g-1(M'th)1And T2j＝g-1(M'th)2Respectively representing theoretical time of a comparator generating a j rising edge jump and a j falling edge jump; t isoffset1And Toffset2Respectively expressed in the same reference threshold value MthThe lower measured comparator generates time deviation between the actual time of the rising edge jump and the falling edge jump and the corresponding theory; i and j are respectively different positive integers.
7. The method of claim 1, wherein each of the reference signals comprises a sine wave signal, a cosine wave signal, a triangular wave signal, a step wave signal, a sawtooth wave signal, or a square wave signal.
8. The method of claim 1, wherein the reference threshold comprises a preset voltage threshold or a preset current threshold.
9. An apparatus for correcting a threshold of a comparator, the apparatus comprising:
a measuring unit configured to measure a time interval between a rising edge transition and a corresponding falling edge transition generated by the comparator when the amplitudes of the received plurality of reference signals respectively reach a reference threshold, so as to obtain a plurality of different time intervals corresponding to the plurality of reference signals; and
a processing unit configured to select a predetermined number of said time intervals from the obtained plurality of different said time intervals, calculate a difference between every two of said time intervals of the selected predetermined number of said time intervals, and calculate an actual operating threshold of said comparator at said reference threshold based on the obtained difference.
10. A sampling circuit comprising a comparator and the threshold correction means of claim 9, wherein the threshold correction means is arranged to threshold correct the comparator.
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7863876B2 (en) * | 2008-03-26 | 2011-01-04 | Freescale Semiconductor, Inc. | Built-in self-calibration (BISC) technique for regulation circuits used in non-volatile memory |
| CN102006070A (en) * | 2010-12-22 | 2011-04-06 | 复旦大学 | Time-domain comparator applying maladjustment correction technology |
| CN102338880A (en) * | 2011-06-02 | 2012-02-01 | 中国科学技术大学 | Nuclear pulse amplitude digitizing method and system |
| CN103961126A (en) * | 2013-02-05 | 2014-08-06 | 苏州瑞派宁科技有限公司 | Threshold value rectifying method of multi-threshold value sampling digitalization device |
| CN208156201U (en) * | 2018-03-22 | 2018-11-27 | 苏州瑞迈斯医疗科技有限公司 | The device of power spectrum is obtained, power spectrum is obtained and the device of energy window is set |
| CN109194331A (en) * | 2018-08-29 | 2019-01-11 | 苏州瑞迈斯医疗科技有限公司 | Electronic device and the method for correcting comparator in the electronic device |
| CN109983363A (en) * | 2016-10-27 | 2019-07-05 | 探测科技有限公司 | Spectrometer |
| US10469096B1 (en) * | 2019-01-03 | 2019-11-05 | Esilicon Corporation | Successive approximation register (SAR) analog to digital converter (ADC) with partial loop-unrolling |
-
2019
- 2019-12-11 CN CN201911264471.2A patent/CN110954938B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7863876B2 (en) * | 2008-03-26 | 2011-01-04 | Freescale Semiconductor, Inc. | Built-in self-calibration (BISC) technique for regulation circuits used in non-volatile memory |
| CN102006070A (en) * | 2010-12-22 | 2011-04-06 | 复旦大学 | Time-domain comparator applying maladjustment correction technology |
| CN102338880A (en) * | 2011-06-02 | 2012-02-01 | 中国科学技术大学 | Nuclear pulse amplitude digitizing method and system |
| CN103961126A (en) * | 2013-02-05 | 2014-08-06 | 苏州瑞派宁科技有限公司 | Threshold value rectifying method of multi-threshold value sampling digitalization device |
| CN109983363A (en) * | 2016-10-27 | 2019-07-05 | 探测科技有限公司 | Spectrometer |
| CN208156201U (en) * | 2018-03-22 | 2018-11-27 | 苏州瑞迈斯医疗科技有限公司 | The device of power spectrum is obtained, power spectrum is obtained and the device of energy window is set |
| CN109194331A (en) * | 2018-08-29 | 2019-01-11 | 苏州瑞迈斯医疗科技有限公司 | Electronic device and the method for correcting comparator in the electronic device |
| US10469096B1 (en) * | 2019-01-03 | 2019-11-05 | Esilicon Corporation | Successive approximation register (SAR) analog to digital converter (ADC) with partial loop-unrolling |
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