CN110944440B - Plasma jet trigger gap testing device and testing method - Google Patents
Plasma jet trigger gap testing device and testing method Download PDFInfo
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- CN110944440B CN110944440B CN201911247995.0A CN201911247995A CN110944440B CN 110944440 B CN110944440 B CN 110944440B CN 201911247995 A CN201911247995 A CN 201911247995A CN 110944440 B CN110944440 B CN 110944440B
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Abstract
In the plasma jet trigger gap testing device, one end of a charging circuit breaker QF1 is connected with a direct-current power supply, the other end of the charging circuit breaker QF1 is connected with a high-voltage output end of a capacitor bank CS, and the other end of the capacitor bank CS is grounded; one end of the test circuit breaker QF2 is connected with the high-voltage output end of the capacitor bank CS, one end of the reactor L is connected with the test circuit breaker QF2, and the other end of the reactor L is connected with the high-voltage end of the rapid mechanical switch S; the high-voltage end of a resistor voltage divider PT is connected with the high-voltage end of a plasma jet trigger gap TSG, the other end of the resistor voltage divider PT is connected with the ground, a Rogowski coil CT is sleeved at the low-voltage end of the plasma jet trigger gap TSG, one end of a protective ball gap BQ is connected with the high-voltage end of a quick mechanical switch S, the other end of the protective ball gap BQ is connected with the ground, the input end of a controller is connected with a measuring signal of the resistor voltage divider PT, the first output end of the controller is connected with the driving input end of a driving module.
Description
Technical Field
The invention relates to the technical field of plasma jet, in particular to a plasma jet trigger gap testing device and a testing method.
Background
The plasma jet trigger gap can excite high-speed plasma jet to penetrate through the main gap by using pulse discharge under an extremely low working coefficient, and the switch is effectively triggered to be conducted. In an extra-high voltage direct current transmission project, a plasma jet trigger gap is one of important equipment for protecting a converter station, when an output fault occurs on an alternating current side, the plasma jet trigger gap on the direct current side and a direct current breaker act simultaneously, the trigger gap is conducted within 100 mu s, after about 30ms, the breaker is conducted, current is transferred to the breaker, and the trigger gap is extinguished and disconnected. In order to verify that the plasma jet trigger gap has a high-capacity direct-current through-flow capacity, a plasma jet trigger gap testing device and a plasma jet trigger gap testing method are needed to verify the through-flow capacity of the plasma jet trigger gap.
The direct-current large-capacity test loop of the plasma jet trigger gap needs to simulate the actual working condition of the direct-current large-capacity test loop in a direct-current system, and the corresponding high-voltage direct-current system is difficult to realize due to the fact that the trigger gap needs to bear high voltage before being conducted, and the investment for building the test loop is huge. Therefore, a testing apparatus and a testing method using a plasma jet firing gap are necessary.
The above information disclosed in this background section is only for enhancement of understanding of the background of the invention and therefore it may contain information that does not form the prior art that is well known to those of ordinary skill in the art.
Disclosure of Invention
In order to solve the problems, the invention provides a plasma jet trigger gap testing device and a testing method, which can effectively replace a direct-current large-capacity testing loop with huge investment required by a plasma jet trigger gap under an actual working condition. The purpose of the invention is realized by the following technical scheme.
A plasma jet trigger gap test apparatus includes,
a direct-current power supply U is arranged,
one end of the charging breaker QF1 is connected with a direct-current power supply, the other end of the charging breaker QF1 is connected with the high-voltage output end of the capacitor bank CS, and the other end of the capacitor bank CS is grounded;
one end of the test circuit breaker QF2 is connected with the high-voltage output end of the capacitor bank CS,
one end of the reactor L is connected with the test circuit breaker QF2, and the other end of the reactor L is connected with the high-voltage end of the quick mechanical switch S;
the other end of the rapid mechanical switch S is connected with the low-voltage end of the plasma jet trigger gap TSG;
a resistor divider PT having a high voltage end connected to the high voltage end of the plasma jet trigger gap TSG and the other end connected to ground,
a Rogowski coil CT fitted around the low-voltage end of the plasma jet trigger gap TSG,
one end of the protective ball gap BQ is connected with the high-voltage end of the rapid mechanical switch S, the other end is connected with the ground,
the output end of the driving module is connected with the trigger end of the plasma jet trigger gap TSG,
and the input end of the controller is connected with a measurement signal of the resistance voltage divider PT, the first output end of the controller is connected with the driving input end of the driving module, and the second output end of the controller is connected with the control end of the quick mechanical switch S.
In the plasma jet trigger gap testing device, a capacitor bank CS is connected with a high-voltage reactor L through a test circuit breaker QF2 to form a low-frequency oscillation loop.
In the plasma jet trigger gap testing device, the controller comprises a single chip microcomputer, an Application Specific Integrated Circuit (ASIC) or a Field Programmable Gate Array (FPGA), and the controller comprises a storage unit, wherein the storage unit comprises one or more of a Read Only Memory (ROM), a Random Access Memory (RAM), a flash memory or an Electrically Erasable Programmable Read Only Memory (EEPROM).
In the plasma jet trigger gap testing device, a controller is connected with a flexible touch screen for displaying information and wireless communication equipment.
In the plasma jet trigger gap testing device, the wireless communication equipment at least comprises wireless local area network communication equipment and/or mobile communication network equipment, the wireless local area network communication equipment comprises a Bluetooth module, a ZigBee module and/or a Wi-Fi module, and the mobile communication network equipment comprises a 2G wireless communication chip, a 3G wireless communication chip, a 4G wireless communication chip and/or a 5G wireless communication chip.
According to another aspect of the present invention, a method of testing the plasma jet firing gap test apparatus includes the steps of,
the charging circuit breaker QF1 and the test circuit breaker QF2 are in an opening state, the charging circuit breaker QF1 is closed, and the opening charging circuit breaker QF1 is opened after the capacitor bank CS is charged;
the test circuit breaker QF2 is closed at the time of t1, the controller outputs a control signal to close the rapid mechanical switch S at the time of t2, the controller triggers and conducts the plasma jet trigger gap TSG, the rapid mechanical switch S is completely closed at the time of t3, the current of the plasma jet trigger gap TSG is completely transferred to the plasma jet trigger gap S, the time difference between the time of t1 and the time of t3 is the closing time of the rapid mechanical switch S, and the TSG through-flow time is adjusted by adjusting the time of t1 and the time of t 2;
the test is completed by opening the test breaker QF2 and the fast mechanical switch S.
In the test method, the TSG through-current time is the time difference between the t2 time and the t3 time.
In the test method, the time t1 is less than the time t2, and the time t2 is less than the time t 3.
In the test method, the time difference between the time t2 and the time t1 is less than 100 mus, and the time difference between the time t3 and the time t1 is more than 15ms and less than 30 ms.
Compared with the prior art, the invention has the beneficial effects that:
the LC low-frequency oscillation circuit directly tests the plasma jet trigger gap, examines the matching capacity of the plasma jet trigger gap and the rapid mechanical switch, examines the direct-current high-capacity through-current capacity of the plasma jet trigger gap when the plasma jet trigger gap is conducted to the full closing of the rapid mechanical switch, and has high test circuit equivalence. The method effectively replaces a test loop which is constructed for carrying out a plasma jet triggering gap direct current large-capacity test and needs huge investment; according to the invention, a high-voltage capacitor bank CS of a low-frequency oscillation loop is output to a high-voltage end of a plasma jet trigger gap TSG through a test circuit breaker QF2 and a high-voltage reactor L, the plasma jet trigger gap TSG and a rapid mechanical switch S are connected in parallel to be used as a test article, a protective ball gap BQ is connected in parallel at two ends of the test article, and the test instrument is prevented from being damaged by overvoltage which may occur; and the test loop completes the direct-current large-capacity test on the plasma jet trigger gap by reasonably controlling t1, t2 and t 3.
The above description is only an overview of the technical solutions of the present invention, and in order to make the technical means of the present invention more clearly apparent, and to make the implementation of the content of the description possible for those skilled in the art, and to make the above and other objects, features and advantages of the present invention more obvious, the following description is given by way of example of the specific embodiments of the present invention.
Drawings
Various other advantages and benefits of the present invention will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. It is obvious that the drawings described below are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort. Also, like parts are designated by like reference numerals throughout the drawings.
In the drawings:
FIG. 1 is a schematic diagram of a plasma jet trigger gap test apparatus according to the present invention;
FIG. 2 is a timing diagram of the operation of a plasma jet triggered gap test loop according to the present invention;
FIG. 3 is a schematic representation of the steps of the test method of the present invention.
The invention is further explained below with reference to the figures and examples.
Detailed Description
Specific embodiments of the present invention will be described in more detail below with reference to fig. 1 to 3. While specific embodiments of the invention are shown in the drawings, it should be understood that the invention may be embodied in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
It should be noted that certain terms are used throughout the description and claims to refer to particular components. As one skilled in the art will appreciate, various names may be used to refer to a component. This specification and claims do not intend to distinguish between components that differ in name but not function. In the following description and in the claims, the terms "include" and "comprise" are used in an open-ended fashion, and thus should be interpreted to mean "include, but not limited to. The description which follows is a preferred embodiment of the invention, but is made for the purpose of illustrating the general principles of the invention and not for the purpose of limiting the scope of the invention. The scope of the present invention is defined by the appended claims.
For the purpose of facilitating understanding of the embodiments of the present invention, the following description will be made by taking specific embodiments as examples with reference to the accompanying drawings, and the drawings are not to be construed as limiting the embodiments of the present invention.
For better understanding, as shown in fig. 1, a plasma jet firing gap test apparatus includes, a dc power supply U,
one end of the charging breaker QF1 is connected with a direct-current power supply, the other end of the charging breaker QF1 is connected with the high-voltage output end of the capacitor bank CS, and the other end of the capacitor bank CS is grounded;
one end of the test circuit breaker QF2 is connected with the high-voltage output end of the capacitor bank CS,
one end of the reactor L is connected with the test circuit breaker QF2, and the other end of the reactor L is connected with the high-voltage end of the quick mechanical switch S;
the other end of the rapid mechanical switch S is connected with the low-voltage end of the plasma jet trigger gap TSG;
a resistor divider PT having a high voltage end connected to the high voltage end of the plasma jet trigger gap TSG and the other end connected to ground,
a Rogowski coil CT fitted around the low-voltage end of the plasma jet trigger gap TSG,
one end of the protective ball gap BQ is connected with the high-voltage end of the rapid mechanical switch S, the other end is connected with the ground,
the output end of the driving module is connected with the trigger end of the plasma jet trigger gap TSG,
and the input end of the controller is connected with a measurement signal of the resistance voltage divider PT, the first output end of the controller is connected with the driving input end of the driving module, and the second output end of the controller is connected with the control end of the quick mechanical switch S.
In the preferred embodiment of the plasma jet trigger gap testing device, the capacitor bank CS is connected with the high-voltage reactor L through the test breaker QF2 to form a low-frequency oscillation circuit.
In a preferred embodiment of the plasma jet trigger gap testing device, the controller comprises a single chip microcomputer, an application specific integrated circuit ASIC or a field programmable gate array FPGA, and the controller comprises a storage unit, wherein the storage unit comprises one or more of a read only memory ROM, a random access memory RAM, a flash memory or an electrically erasable programmable read only memory EEPROM.
In the preferred embodiment of the plasma jet trigger gap testing device, the controller is connected with the flexible touch screen for displaying information and the wireless communication equipment.
In a preferred embodiment of the plasma jet trigger gap testing device, the wireless communication device at least comprises a wireless local area network communication device and/or a mobile communication network device, the wireless local area network communication device comprises a bluetooth module, a ZigBee module and/or a Wi-Fi module, and the mobile communication network device comprises a 2G wireless communication chip, a 3G wireless communication chip, a 4G wireless communication chip and/or a 5G wireless communication chip.
To further understand the present invention, in one embodiment, a testing apparatus for an equivalent dc bulk test loop of a plasma jet firing gap comprises: the test circuit part is connected with the direct current power supply; the direct current power supply consists of a high-voltage direct current source U and a high-voltage capacitor bank CS; the test loop part comprises a charging breaker QF1, a test breaker QF2, a high-voltage reactor L and a quick mechanical switch S; one end of the charging circuit breaker QF1 is connected with a high-voltage direct-current power supply, the other end of the charging circuit breaker QF1 is connected with the high-voltage output end of the high-voltage capacitor bank CS, and the other end of the high-voltage capacitor bank CS is grounded; one end of the test circuit breaker QF2 is connected with the high-voltage output end of the high-voltage capacitor bank CS, and the other end of the test circuit breaker QF2 is connected with one end of the high-voltage reactor L; the other end of the high-voltage reactor L is connected with the high-voltage end of the quick mechanical switch S; the other end of the rapid mechanical switch S is connected with the low-voltage end of the plasma jet trigger gap TSG; the high-voltage end of the plasma jet trigger gap TSG is connected with the high-voltage end of the rapid mechanical switch S, and the low-voltage end of the plasma jet trigger gap TSG is connected with the low-voltage end of the high-voltage capacitor bank CS in a common ground mode.
In one embodiment, a test apparatus includes: the device comprises a direct current power supply, a test loop part connected with the direct current power supply, a measuring system, a protective ball gap and a control trigger loop. The test loop part comprises a charging breaker QF1, a test breaker QF2, a high-voltage reactor L and a quick mechanical switch S. The measurement system includes: a resistive voltage divider PT and a rogowski coil CT. The control trigger circuit includes: a controller and a drive module.
One end of the charging circuit breaker QF1 is connected with a high-voltage direct-current power supply, the other end of the charging circuit breaker QF1 is connected with the high-voltage output end of the high-voltage capacitor bank CS, and the other end of the high-voltage capacitor bank CS is grounded; one end of the test circuit breaker QF2 is connected with the high-voltage output end of the high-voltage capacitor bank CS, and the other end of the test circuit breaker QF2 is connected with one end of the high-voltage reactor L; the other end of the high-voltage reactor L is connected with the high-voltage end of the quick mechanical switch S; the other end of the rapid mechanical switch S is connected with the low-voltage end of the plasma jet trigger gap TSG; the high-voltage end of the plasma jet trigger gap TSG is connected with the high-voltage end of the rapid mechanical switch S, and the low-voltage end of the plasma jet trigger gap TSG is connected with the low-voltage end of the high-voltage capacitor bank CS in a common ground mode; the high-voltage end of the resistor voltage divider PT is connected with the high-voltage end of the plasma jet trigger gap TSG, and the other end of the resistor voltage divider PT is connected with the ground; the Rogowski coil CT is sleeved at the low-voltage end of the plasma jet trigger gap TSG; one end of the protective ball gap BQ is connected with the high-voltage end of the quick mechanical switch S, and the other end of the protective ball gap BQ is connected with the ground; the control input end of the controller is connected with a measurement signal of the resistance voltage divider PT, one control output end of the controller is connected with the driving input end of the driving module, and the other control output end of the controller is connected with the control end of the quick mechanical switch S; the driving output end of the driving module is connected with the triggering end of the plasma jet triggering gap.
The high-voltage capacitor bank CS of the low-frequency oscillation loop is output to a high-voltage end of the plasma jet trigger gap TSG through the test circuit breaker QF2 and the high-voltage reactor L, the plasma jet trigger gap TSG is connected with the rapid mechanical switch S in parallel to be used as a test article, the protective ball gap BQ is connected with two ends of the test article in parallel, and the test instrument is prevented from being damaged by possible overvoltage.
As shown in fig. 2 to 3, a method for testing the plasma jet trigger gap test apparatus includes the steps of,
the charging circuit breaker QF1 and the test circuit breaker QF2 are in an opening state, the charging circuit breaker QF1 is closed, and the opening charging circuit breaker QF1 is opened after the capacitor bank CS is charged;
the test circuit breaker QF2 is closed at the time of t1, the controller outputs a control signal to close the rapid mechanical switch S at the time of t2, the controller triggers and conducts the plasma jet trigger gap TSG, the rapid mechanical switch S is completely closed at the time of t3, the current of the plasma jet trigger gap TSG is completely transferred to the plasma jet trigger gap S, the time difference between the time of t1 and the time of t3 is the closing time of the rapid mechanical switch S, and the TSG through-flow time is adjusted by adjusting the time of t1 and the time of t 2;
the test is completed by opening the test breaker QF2 and the fast mechanical switch S.
In the preferred embodiment of the test method, the TSG through-current time is the time difference between time t2 and time t 3.
In a preferred embodiment of the test method, time t1 < time t2, time t2 < time t 3.
In the preferred embodiment of the test method, the time difference between the time t2 and the time t1 is less than 100 μ s, and the time difference between the time t3 and the time t1 is greater than 15ms and less than 30 ms.
Industrial applicability
The plasma jet trigger gap testing device and the testing method can be manufactured and used in the field of battery impedance.
The foregoing describes the general principles of the present application in conjunction with specific embodiments, however, it is noted that the advantages, effects, etc. mentioned in the present application are merely examples and are not limiting, and they should not be considered essential to the various embodiments of the present application. Furthermore, the foregoing disclosure of specific details is for the purpose of illustration and description and is not intended to be limiting, since the foregoing disclosure is not intended to be exhaustive or to limit the disclosure to the precise details disclosed.
The foregoing description has been presented for purposes of illustration and description. Furthermore, the description is not intended to limit embodiments of the application to the form disclosed herein. While a number of example aspects and embodiments have been discussed above, those of skill in the art will recognize certain variations, modifications, alterations, additions and sub-combinations thereof.
Claims (9)
1. A plasma jet trigger gap test device includes,
a direct-current power supply U is arranged,
one end of the charging breaker QF1 is connected with a direct-current power supply, the other end of the charging breaker QF1 is connected with the high-voltage output end of the capacitor bank CS, and the other end of the capacitor bank CS is grounded;
one end of the test circuit breaker QF2 is connected with the high-voltage output end of the capacitor bank CS,
one end of the reactor L is connected with the test circuit breaker QF2, and the other end of the reactor L is connected with the high-voltage end of the quick mechanical switch S;
the other end of the rapid mechanical switch S is connected with the low-voltage end of the plasma jet trigger gap TSG;
a resistor divider PT having a high voltage end connected to the high voltage end of the plasma jet trigger gap TSG and the other end connected to ground,
a Rogowski coil CT fitted around the low-voltage end of the plasma jet trigger gap TSG,
one end of the protective ball gap BQ is connected with the high-voltage end of the rapid mechanical switch S, the other end is connected with the ground,
the output end of the driving module is connected with the trigger end of the plasma jet trigger gap TSG,
and the input end of the controller is connected with a measurement signal of the resistance voltage divider PT, the first output end of the controller is connected with the driving input end of the driving module, and the second output end of the controller is connected with the control end of the quick mechanical switch S.
2. The plasma jet firing gap testing apparatus as claimed in claim 1, wherein the capacitor bank CS is connected with the high voltage reactor L through a test breaker QF2 to form a low frequency oscillation circuit.
3. The plasma jet firing gap test apparatus of claim 1, wherein the controller comprises a single chip microcomputer, an application specific integrated circuit ASIC, or a field programmable gate array FPGA, the controller comprising a memory unit comprising one or more of a read only memory ROM, a random access memory RAM, a flash memory, or an electrically erasable programmable read only memory EEPROM.
4. The plasma jet triggered gap testing apparatus of claim 1, wherein the controller interfaces a flexible touch screen displaying information and a wireless communication device.
5. The plasma jet trigger gap test apparatus of claim 4, wherein the wireless communication device comprises at least a wireless local area network communication device comprising a Bluetooth, ZigBee and/or Wi-Fi module and/or a mobile communication network device comprising a 2G wireless communication chip, a 3G wireless communication chip, a 4G wireless communication chip and/or a 5G wireless communication chip.
6. A method of testing the plasma jet trigger gap test apparatus of any one of claims 1 to 5, comprising the steps of,
the charging circuit breaker QF1 and the test circuit breaker QF2 are in an opening state, the charging circuit breaker QF1 is closed, and the opening charging circuit breaker QF1 is opened after the capacitor bank CS is charged;
the test circuit breaker QF2 is closed at the time of t1, the controller outputs a control signal to close the rapid mechanical switch S at the time of t2, the controller triggers and conducts the plasma jet trigger gap TSG, the rapid mechanical switch S is completely closed at the time of t3, the current of the plasma jet trigger gap TSG is completely transferred to the plasma jet trigger gap S, the time difference between the time of t1 and the time of t3 is the closing time of the rapid mechanical switch S, and the TSG through-flow time is adjusted by adjusting the time of t1 and the time of t 2;
the test is completed by opening the test breaker QF2 and the fast mechanical switch S.
7. The test method of claim 6, wherein the TSG through-current time is a time difference between time t2 and time t 3.
8. The test method of claim 6, wherein time t1 < time t2, time t2 < time t 3.
9. The test method of claim 6, wherein the time difference between time t2 and time t1 is less than 100 μ s, and the time difference between time t3 and time t1 is greater than 15ms and less than 30 ms.
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