CN114062909B - Direct-current high-current through-current test loop for triggering gap switch - Google Patents
Direct-current high-current through-current test loop for triggering gap switch Download PDFInfo
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- CN114062909B CN114062909B CN202110783735.6A CN202110783735A CN114062909B CN 114062909 B CN114062909 B CN 114062909B CN 202110783735 A CN202110783735 A CN 202110783735A CN 114062909 B CN114062909 B CN 114062909B
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- 238000012360 testing method Methods 0.000 title claims abstract description 63
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3272—Apparatus, systems or circuits therefor
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Abstract
The application discloses a direct-current high-current through-current test loop for triggering a gap switch, and belongs to the technical field of high voltage. The test loop of the present application comprises: a current source branch, the current source branch comprising: the device comprises a direct current charging loop, an energy discharging branch, an energy storage capacitor, a follow current diode, a reactor, an arcing time control switch K1, a protection switch K2, a voltage divider I and a current coil; the voltage source branch comprises: the direct current high voltage generator, the recovery voltage regulating capacitor, the recovery voltage rise time regulating resistor R and the voltage divider II. The test voltage of the test loop can meet the triggering requirement, the output direct current meets the through-current capability assessment requirement, the recovery voltage can be applied at the moment of arc extinction to meet the rapid insulation recovery assessment requirement, the direct current peak value, the arcing time, the recovery voltage peak value and the rising time are flexible and adjustable, and the requirements of different test parameters can be met.
Description
Technical Field
The application relates to the technical field of high voltage, in particular to a direct-current high-current through-current test loop for triggering a gap switch.
Background
The trigger gap switch is a novel sub-millisecond-level fast switching switch which can be used for an AC and DC system, is often connected with a circuit breaker in parallel to serve as a fast control/protection switch, and is responsible for fast triggering a guide, and the circuit breaker is switched on later to help gap transfer current to start insulation recovery. Taking a trigger gap switch for controlling a controllable self-recovery energy dissipation device of a white crane beach-Jiangsu + -800 kV direct current engineering as an example, the minimum triggerable voltage is 20kV, the through-current requirement is 30kA/30ms, and the DC80kV can be tolerated for 1s after the arc extinction is required.
The trigger gap switch fracture comprises a high-voltage electrode and a low-voltage electrode which are fixed and can not move, a current path is maintained by arcing in a gap, short-time current is large, arc ablation can cause burning loss of a contact, a large amount of metal vapor and gas decomposition products are generated simultaneously, quick insulation recovery after arc extinction can be influenced, a current test needs to be carried out, large current and insulation recovery capacity is researched and verified, and a current test loop is an important means for triggering gap switch research and development and performance verification.
The through-flow test loop of the trigger gap switch needs to generate large current, high-amplitude recovery voltage is applied after the trigger gap switch is controlled to flow in a short time, the loop capacity is large, the recovery voltage is high, and the control is complex. At present, an alternating current through-current test can be carried out by means of a synthetic loop for an alternating current breaker short-circuit breaking test, a direct current through-current test does not have a usable test loop, the direct adoption of the alternating current short-circuit breaking synthetic loop cannot meet the requirements, and a new test loop (comprising a circuit topology, a regulation method, a device parameter determining method and the like) needs to be researched and proposed.
The composite loop for the alternating current short-circuit breaking test consists of a low-voltage high-current source and a high-voltage low-current voltage source, wherein the current source outputs test current and controls arcing time, and the voltage source applies recovery voltage through the ball gap ignition control.
The above loop is used to trigger a gap dc test that does not meet the following requirements:
1) The output voltage of the current source is only 10kV, is lower than the lowest triggerable voltage, the trigger gap switch is difficult to reliably trigger and conduct, and if the test voltage is increased, the power capacity is increased, so that the test cost is greatly increased;
2) The output of the current source is alternating current, certain difference exists between the current source and direct current arcing, the equivalent method of the alternating current-direct current arcing is not yet defined at present, and if the current source is transformed into direct current output, rectifying equipment such as a large-capacity silicon stack and the like needs to be added, so that the transformation cost is high;
3) The test loop relies on the auxiliary switch of the current source branch to break the current so as to control the arcing time, the auxiliary switch can be turned off when the current crosses zero, if the current source is transformed into direct current output, no current crossing point exists, and the auxiliary switch can not break the current, so that the arcing time can not be controlled.
Disclosure of Invention
The application also provides a direct-current high-current through-current test loop for triggering a gap switch, which comprises the following components:
a current source branch, the current source branch comprising: the device comprises a direct current charging loop, an energy discharging branch, an energy storage capacitor, a follow current diode, a reactor, an arcing time control switch K1, a protection switch K2, a voltage divider I and a current coil;
the direct-current charging loop is connected with the energy storage capacitor and is used for charging the energy storage capacitor; the energy discharge branch is connected with the energy storage capacitor in parallel and is used for discharging the energy storage capacitor under abnormal conditions; the energy storage capacitor provides test voltage before gap contact and provides large current after the gap contact; the freewheeling diode, the freewheeling diode and the energy storage capacitor are in anti-parallel connection, and form a direct current attenuation current loop with the reactor and the trigger gap, and the direct current attenuation current loop generates direct current attenuation current; the arcing time control switch K1 controls the arcing time by closing the transfer trigger gap current; the protection switch K2 protects the current source branch by disconnecting the isolation recovery voltage; the voltage divider I measures the test voltage; measuring test current by a current coil;
a voltage source branch, the voltage source branch comprising: the direct-current high-voltage generator, the recovery voltage regulating capacitor, the recovery voltage rise time regulating resistor R and the voltage divider II;
the direct-current high-voltage generator is used for charging the recovery voltage regulating capacitor; the recovery voltage regulating capacitor provides recovery voltage after the gap is quenched; when the recovery voltage rise time adjusting resistor R is in clearance through flow, the direct high-emission output current is limited to be lower than the short-circuit protection current, and forms an RC series circuit with a clearance fracture stray capacitor after clearance arc extinction, so that the rise rate of clearance recovery voltage is controlled; the voltage divider II measures the test voltage.
Optionally, the freewheeling diode is anti-parallel connected at two ends of the energy storage capacitor, and the energy storage capacitor is reversely conducted to bypass the energy storage capacitor, so that direct current attenuation current is generated in the reactor and the gap loop.
Optionally, the resistance value of the recovery voltage rising time adjusting resistor R is M omega level, the voltage source for the recovery voltage is a high-capacity direct-current high-voltage generator, the recovery voltage is pre-added before the through current, and the recovery voltage can be immediately applied at the moment of gap arc extinction.
Optionally, the test loop is connected with the arcing time control switch K1 in parallel at two ends of the reactor, and the gap current is transferred by closing the K1, so that the application rate of the recovery voltage is not affected, and the gap arcing time can be controlled.
The test voltage of the test loop can meet the triggering requirement, the output direct current meets the through-current capability assessment requirement, the recovery voltage can be applied at the moment of arc extinction to meet the rapid insulation recovery assessment requirement, the direct current peak value, the arcing time, the recovery voltage peak value and the rising time are flexible and adjustable, and the requirements of different test parameters can be met. Meanwhile, the test loop has low requirement on the power supply capacity, the control is simple and flexible, and the test station, scientific research and production units can be built.
Drawings
FIG. 1 is a circuit topology of a test loop of the present application;
FIGS. 2 (a) - (f) are graphs of simulation results of the test loop gap flow test procedure of the present application.
Detailed Description
The exemplary embodiments of the present application will now be described with reference to the accompanying drawings, however, the present application may be embodied in many different forms and is not limited to the examples described herein, which are provided to fully and completely disclose the present application and fully convey the scope of the application to those skilled in the art. The terminology used in the exemplary embodiments illustrated in the accompanying drawings is not intended to be limiting of the application. In the drawings, like elements/components are referred to by like reference numerals.
Unless otherwise indicated, terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art. In addition, it will be understood that terms defined in commonly used dictionaries should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense.
The application is further illustrated by the following examples:
the test loop provided by the test loop of the application has a circuit topology shown in figure 1, and the application adopts a synthetic loop type.
The current source generates direct current attenuation current in a mode of oscillating discharge of the capacitor bank and diode follow current, and the gap arcing time is selected by controlling the K1 closing time;
the voltage source adopts a high-capacity straight high-voltage +MΩ protection resistor to realize the exponential rising recovery voltage at the moment of arc extinction, and the recovery voltage rising rate is selected by controlling the resistor R and the straight high-voltage output voltage. The constitution of the two branches is described below:
the current source branch circuit comprises a direct current charging loop, an energy discharging branch circuit, an energy storage capacitor, a freewheeling diode, a reactor, an arcing time control switch K1, a protection switch K2, a voltage divider I and a current coil. The direct current charging loop is used for charging the energy storage capacitor; the energy discharge branch is used for discharging energy of the energy storage capacitor under the abnormal condition of the loop equipment; the energy storage capacitor provides test voltage before gap contact and provides large current after the gap contact; the freewheeling diode is in anti-parallel connection with the energy storage capacitor and forms a direct current attenuation current loop with the reactor and the trigger gap; after the arcing time control switch K1 is closed, the trigger gap current can be transferred, so that the arcing time is controlled; the breaker K2 is used for isolating the high-voltage protection current source loop equipment when the voltage source applies recovery voltage to the sample; the voltage divider I is used for measuring test voltage; the current coil is used to measure the test current.
The voltage source branch consists of a direct-current high-voltage generator, a recovery voltage regulating capacitor, a recovery voltage rising time regulating resistor R and a voltage divider II. The direct-current high-voltage generator is used for charging the recovery voltage regulating capacitor, and the recovery voltage is provided by the regulating capacitor after the gap is quenched; the resistance value of the resistor R is M omega level, when the gap flows, the direct high-emission output current is limited to be lower than the short-circuit protection current, and after the gap is in arc extinction, the resistor R and the gap break stray capacitance form RC series connection to control the rising rate of the gap recovery voltage.
The specific method of test circuit regulation is as follows, and FIG. 2 is a simulated expected waveform diagram;
before the test, the energy storage capacitor bank is charged to a test voltage U1, the output of the direct high voltage is increased to a recovery voltage U2, and K1 is opened and K2 is closed.
The control triggers the gap switch to conduct to connect the circuit in 0ms, the energy storage capacitor bank discharges through the reactor as shown in fig. 2- (a), and the oscillation current with peak value I is generated as shown in fig. 2- (b).
The direct current generation method of the flywheel diode comprises the following steps: when the current reaches a peak, the capacitor bank voltage reverses and the freewheeling diode turns on bypassing the capacitor bank as in fig. 2- (c), creating a dc decaying current in the gap as in fig. 2- (d).
The method for controlling the arcing time of the reactor current bypass comprises the following steps: and the K1 is controlled to be closed at the time t according to the through-current time requirement, and test current is transferred to a 'reactor+K1' loop, so that the gap arcing time can be controlled, and the gap application recovery voltage is not influenced, as shown in the figure 2- (e). The current transfer principle is that before K1 is closed, a current path is a reactor, a freewheeling diode, a K2+ gap, wherein a gap switch maintains the current path through an arc, the arc resistance is tens to hundreds of mΩ, the on-state impedance of the freewheeling diode is also m Ω, after K1 is closed, the loop impedance of the reactor, the K1, is the contact resistance of a contact after the breaker is closed, the resistance value is tens to hundreds of mu Ω, and is far lower than the branch resistance of the gap, the freewheeling diode, and therefore, the current is transferred to a K1 branch to realize the control of the gap arcing time.
The method for rapidly applying the direct current recovery voltage of the direct current high-voltage generator comprises the following steps: and a trigger clearance switch triggering command is sent out, meanwhile, the breaker K2 is controlled to break, after the current is transferred, the trigger clearance switch is triggered to quench, meanwhile, K2 is disconnected, the recovery voltage with exponential rise is immediately applied, as shown in the figure 2- (f), and K2 can effectively isolate the capacitor bank from the recovery voltage. The method has the advantages of low power supply capacity and simple control. The method comprises the steps that a high-capacity straight high-voltage generator is selected, before a gap is triggered, the straight high-voltage generator is sent to a recovery voltage regulating capacitor to be charged to a recovery voltage, the regulating capacitor applies high voltage to the gap through an M omega-level recovery voltage regulating resistor R, at the moment, K2 is in a switching-off state, and through-current equipment and the straight high-voltage generator are isolated and protected; after the gap is triggered, the straight high hair is grounded through an adjusting resistor R, and the adjusting resistor value is used for enabling the grounding current to be lower than a short-circuit protection value of the straight high hair so as to enable the straight high hair to keep high-voltage output; when the gap is in arc extinction, the regulating capacitor applies exponentially rising recovery voltage to the gap fracture through the regulating resistor R, and the reasonable regulating capacitor capacitance value is selected to ensure that the rising time of the recovery voltage is not influenced by the corona discharge of the switch K2 fracture and the gap fracture, and is only determined by the regulating resistor R and the fracture stray capacitance, so that the ms-level can be achieved, and the requirement of triggering the gap switch is met.
According to the requirement of a direct current engineering trigger gap switch through-current test in a certain place, a direct current test loop is designed, the test voltage U1=30 kV, the test current peak value I=30kA, the arcing time t=80 ms, the recovery voltage U2=80 kV and the rising time 100ms, the test requirement is comprehensively met, and the rated voltage 36kV, the capacitance value 1mF and the inductance value 0.78mH of a reactor of an energy storage capacitor in a current source branch are met; the rated voltage is 160kV, the rated current is 10mA, and the resistance R is 30MΩ. The result shows that the test loop has small power supply capacity, is simple and convenient to adjust, and can economically and effectively meet the requirement of the through-flow test of the trigger gap switch.
The test voltage of the test loop can meet the triggering requirement, the output direct current meets the through-current capability assessment requirement, the recovery voltage can be applied at the moment of arc extinction to meet the rapid insulation recovery assessment requirement, the direct current peak value, the arcing time, the recovery voltage peak value and the rising time are flexible and adjustable, and the requirements of different test parameters can be met. Meanwhile, the test loop has low requirement on the power supply capacity, the control is simple and flexible, and the test station, scientific research and production units can be built.
It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein. The scheme in the embodiment of the application can be realized by adopting various computer languages, such as object-oriented programming language Java, an transliteration script language JavaScript and the like.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the application.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the spirit or scope of the application. Thus, it is intended that the present application also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (4)
1. A dc high current through-current test loop for triggering a gap switch, the loop comprising:
a current source branch, the current source branch comprising: the device comprises a direct current charging loop, an energy discharging branch, an energy storage capacitor, a follow current diode, a reactor, an arcing time control switch K1, a protection switch K2, a voltage divider I and a current coil;
the direct-current charging loop is connected with the energy storage capacitor and is used for charging the energy storage capacitor; the energy discharge branch is connected with the energy storage capacitor in parallel and is used for discharging the energy storage capacitor under abnormal conditions; the energy storage capacitor provides test voltage before gap contact and provides large current after the gap contact; the freewheeling diode, the freewheeling diode and the energy storage capacitor are in anti-parallel connection, and form a direct current attenuation current loop with the reactor and the trigger gap, and the direct current attenuation current loop generates direct current attenuation current; the arcing time control switch K1 controls the arcing time by closing the transfer trigger gap current; the protection switch K2 protects the current source branch by disconnecting the isolation recovery voltage; the voltage divider I measures the test voltage; measuring test current by a current coil;
a voltage source branch, the voltage source branch comprising: the direct-current high-voltage generator, the recovery voltage regulating capacitor, the recovery voltage rise time regulating resistor R and the voltage divider II;
the direct-current high-voltage generator is used for charging the recovery voltage regulating capacitor; the recovery voltage regulating capacitor provides recovery voltage after the gap is quenched; when the recovery voltage rise time adjusting resistor R is in clearance through flow, the direct high-emission output current is limited to be lower than the short-circuit protection current, and forms an RC series circuit with a clearance fracture stray capacitor after clearance arc extinction, so that the rise rate of clearance recovery voltage is controlled; the voltage divider II measures the test voltage.
2. A circuit according to claim 1, wherein the freewheeling diode is anti-parallel connected across the energy storage capacitor, and conducting back in reverse direction of the energy storage capacitor voltage bypasses the energy storage capacitor, creating a dc-damping current in the reactor, gap loop.
3. The circuit of claim 1, wherein the resistance value of the recovery voltage rise time adjusting resistor R is mΩ, the recovery voltage source is a high-capacity dc high-voltage generator, and the recovery voltage is pre-applied before the through-current, and can be applied immediately at the moment of gap arc extinction.
4. The test loop according to claim 1, wherein the test loop is connected with a arcing time control switch K1 in parallel across the reactor, and the clearance current is transferred by closing the switch K1, so that the clearance arcing time can be controlled without affecting the recovery voltage application rate.
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08306271A (en) * | 1995-05-08 | 1996-11-22 | Fuji Electric Co Ltd | Synthesis testing device for circuit-breaker |
CN102129033A (en) * | 2010-12-23 | 2011-07-20 | 中国西电电气股份有限公司 | Test loop used for direct-current switch test |
CN103248264A (en) * | 2013-04-27 | 2013-08-14 | 西安交通大学 | Trigger for triggering Trigatron gas switch |
CN105807214A (en) * | 2014-12-29 | 2016-07-27 | 国家电网公司 | Breaking test device and test method for high-voltage direct current breaker |
WO2017071413A1 (en) * | 2015-10-29 | 2017-05-04 | 全球能源互联网研究院 | Synthesis circuit and method for testing direct current circuit breaker by means of composite injection of high voltage and large current |
CN107329068A (en) * | 2017-06-30 | 2017-11-07 | 中国西电电气股份有限公司 | Spark gap recover loop and the method for voltage test in a kind of series compensation device |
CN109254242A (en) * | 2018-09-18 | 2019-01-22 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | A kind of ablation test circuit and breaker arcing contact ablation state test method |
CN110161405A (en) * | 2019-07-01 | 2019-08-23 | 大连理工大学 | Three power supply direct currents of one kind cut-off synthetic test loop and its test method |
CN110944440A (en) * | 2019-12-06 | 2020-03-31 | 西安交通大学 | Plasma jet trigger gap testing device and testing method |
-
2021
- 2021-07-12 CN CN202110783735.6A patent/CN114062909B/en active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08306271A (en) * | 1995-05-08 | 1996-11-22 | Fuji Electric Co Ltd | Synthesis testing device for circuit-breaker |
CN102129033A (en) * | 2010-12-23 | 2011-07-20 | 中国西电电气股份有限公司 | Test loop used for direct-current switch test |
CN103248264A (en) * | 2013-04-27 | 2013-08-14 | 西安交通大学 | Trigger for triggering Trigatron gas switch |
CN105807214A (en) * | 2014-12-29 | 2016-07-27 | 国家电网公司 | Breaking test device and test method for high-voltage direct current breaker |
WO2017071413A1 (en) * | 2015-10-29 | 2017-05-04 | 全球能源互联网研究院 | Synthesis circuit and method for testing direct current circuit breaker by means of composite injection of high voltage and large current |
CN107329068A (en) * | 2017-06-30 | 2017-11-07 | 中国西电电气股份有限公司 | Spark gap recover loop and the method for voltage test in a kind of series compensation device |
CN109254242A (en) * | 2018-09-18 | 2019-01-22 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | A kind of ablation test circuit and breaker arcing contact ablation state test method |
CN110161405A (en) * | 2019-07-01 | 2019-08-23 | 大连理工大学 | Three power supply direct currents of one kind cut-off synthetic test loop and its test method |
CN110944440A (en) * | 2019-12-06 | 2020-03-31 | 西安交通大学 | Plasma jet trigger gap testing device and testing method |
Non-Patent Citations (1)
Title |
---|
等离子体喷射触发型SF6间隙开关触发寿命试验研究;朱浩等;电网技术;第1-7页 * |
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