CN110911299B - IGBT module frequency sweep test bench - Google Patents
IGBT module frequency sweep test bench Download PDFInfo
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- CN110911299B CN110911299B CN201911198327.3A CN201911198327A CN110911299B CN 110911299 B CN110911299 B CN 110911299B CN 201911198327 A CN201911198327 A CN 201911198327A CN 110911299 B CN110911299 B CN 110911299B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
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Abstract
The invention discloses an IGBT module frequency sweep test bench which comprises a support frame, a frequency sweep test group, an IGBT module positioning table, a lifting table and a lifting driving piece, wherein the lifting driving piece is installed at the bottom of the support frame, the top of the lifting driving piece is an output end, the lifting table is installed on the output end of the lifting driving piece, the IGBT module positioning table is installed on the lifting table, the frequency sweep test group is installed on the support frame and located above the IGBT module positioning table, the IGBT module is positioned on the IGBT module positioning table, and the lifting driving piece drives the IGBT module to ascend through the IGBT module positioning table to be in butt joint with the frequency sweep test group for frequency sweep test. The test board has the advantages of high safety, low cost, capability of reducing the test difficulty and improving the test accuracy and the test efficiency.
Description
Technical Field
The invention mainly relates to an IGBT frequency sweep test technology, in particular to an IGBT module frequency sweep test bench.
Background
An Insulated Gate Bipolar Transistor (IGBT) is a composite fully-controlled voltage-driven power semiconductor device consisting of a Bipolar Junction Transistor (BJT) and an insulated Gate field effect transistor (MOS), and has the advantages of high input impedance of the MOSFET and low conduction voltage drop of the GTR. The GTR saturation voltage is reduced, the current carrying density is high, but the driving current is large; the MOSFET has small driving power, high switching speed, large conduction voltage drop and small current carrying density. The IGBT integrates the advantages of the two devices, and has small driving power and reduced saturation voltage.
In the prior production process of the IGBT module, a process of frequency sweep test is not designed, so that the higher product reject ratio is caused, and in order to improve the performance such as the product percent of pass and the like, the process of frequency sweep test gradually exists at present, but a test bed which is not formed at the test stage of a sample piece is tested in a manual wiring and connecting mode, so that the test efficiency is reduced; on the other hand, the labor cost is increased, and the test difficulty is high.
Disclosure of Invention
The technical problem to be solved by the invention is to overcome the defects of the prior art and provide the IGBT module frequency sweep test bench which has high safety and low cost, can reduce the test difficulty and improve the test accuracy and the test efficiency
The bogie has simple and compact structure, stable and comfortable action and can realize small-radius turning.
In order to solve the technical problems, the invention adopts the following technical scheme:
the utility model provides a IGBT module frequency sweep testboard, includes support frame, frequency sweep test group, IGBT module location platform, elevating platform and lift driving piece, the lift driving piece is installed in the bottom of support frame, and the top of lift driving piece is the output, the elevating platform is installed on the output of lift driving piece, IGBT module location platform is installed on the elevating platform, frequency sweep test group installs on the support frame, and is located the top of IGBT module location platform, the IGBT module location is on IGBT module location platform, the lift driving piece passes through IGBT module location platform and drives that the IGBT module rises and carry out the frequency sweep test with the butt joint of frequency sweep test group.
As a further improvement of the above technical solution:
the lifting platform is provided with a guide rail, and the IGBT module positioning platform is arranged on the guide rail in a sliding mode.
The end part of the IGBT module positioning table is provided with a handle which is convenient for pushing and pulling the IGBT module positioning table.
The end of the lifting platform is provided with a limiting seat for preventing the IGBT module positioning platform from dropping off.
And the limiting seat is provided with a positioning button for positioning the IGBT module positioning table during testing.
The support frame facial make-up is equipped with the guide post, the both sides of elevating platform all the suit is on the guide post of corresponding side.
And a plurality of installation positions for installing the IGBT module are arranged on the IGBT module positioning table.
The lifting driving piece is arranged into cylinders, and the cylinders are arranged into a plurality of groups.
The frequency sweep testing set comprises a capacitor, a capacitor bus bar, an alternating current bar, a direct current bar and testing columns, wherein the capacitor, the capacitor bus bar, the alternating current bar and the direct current bar are all installed on a supporting frame, the capacitor and the capacitor bus bar are connected, the alternating current bar and the direct current bar are all connected with the capacitor bus bar, and the testing columns are installed on the alternating current bar and the direct current bar.
The top of the supporting frame is hinged with a cover plate used for covering the AC row and the DC row.
The bottom of the support frame is provided with universal wheels.
Handles are arranged at the end part and the side part of the support frame.
Compared with the prior art, the invention has the advantages that:
the invention discloses an IGBT module frequency sweep test bench which comprises a support frame, a frequency sweep test set, an IGBT module positioning table, a lifting table and a lifting driving piece, wherein the lifting driving piece is installed at the bottom of the support frame, the top of the lifting driving piece is an output end, the lifting table is installed on the output end of the lifting driving piece, the IGBT module positioning table is installed on the lifting table, the frequency sweep test set is installed on the support frame and is positioned above the IGBT module positioning table, the IGBT module is positioned on the IGBT module positioning table, and the lifting driving piece drives the IGBT module to ascend through the IGBT module positioning table to be in butt joint with the frequency sweep test set so as to carry out frequency sweep test. During the use, the lifting driving piece is located initial position, fixes a position IGBT module on IGBT module positioning platform, then starts the lifting driving piece, orders about the lifting platform to drive IGBT module positioning platform and IGBT module to rise, makes IGBT module and sweep frequency test group form the butt joint, then utilizes sweep frequency test group to carry out the sweep frequency in order to inspect whether it is qualified to IGBT module. Compared with the traditional manual wiring, the test bench forms a special test bench for the IGBT module, field manual wiring is not needed, on one hand, the safety is improved, and on the other hand, the test cost is reduced; moreover, the automatic test of the IGBT module is realized through the test board, the phenomenon of manual misconnection is prevented, the test difficulty is reduced, and the test accuracy and the test efficiency are greatly improved.
Drawings
Fig. 1 is a schematic perspective view of a frequency sweeping test bench for an IGBT module according to the present invention.
Fig. 2 is a schematic structural view of a frequency sweeping test bench of an IGBT module according to the present invention.
Fig. 3 is a schematic side view of the IGBT module frequency sweep test bed according to the present invention.
Fig. 4 is a schematic diagram of a top view structure of the IGBT module frequency sweep test bed of the present invention.
The reference numerals in the figures denote:
1. a support frame; 11. a guide post; 2. a frequency sweep test group; 21. a capacitor; 22. a capacitor busbar; 23. an alternating current row; 24. a direct current row; 25. testing the column; 3. an IGBT module positioning table; 31. a handle; 32. an installation position; 4. a lifting platform; 41. a guide rail; 5. a lifting drive member; 6. a limiting seat; 61. a positioning button; 7. a cover plate; 8. a universal wheel; 9. a handle.
Detailed Description
The invention will be described in further detail below with reference to the drawings and specific examples.
Fig. 1 to 4 show an embodiment of the IGBT module frequency sweep test bench according to the present invention, which includes a support frame 1, a frequency sweep test set 2, an IGBT module positioning table 3, a lifting table 4, and a lifting driving member 5, where the lifting driving member 5 is installed at the bottom of the support frame 1, and the top of the lifting driving member 5 is an output end, the lifting table 4 is installed at the output end of the lifting driving member 5, the IGBT module positioning table 3 is installed on the lifting table 4, the frequency sweep test set 2 is installed on the support frame 1 and located above the IGBT module positioning table 3, the IGBT module is positioned on the IGBT module positioning table 3, and the lifting driving member 5 drives the IGBT module to ascend through the IGBT module positioning table 3 to dock with the frequency sweep test set 2 for frequency sweep test. During the use, lift driving piece 5 is located initial position, fixes a position IGBT module on IGBT module locating platform 3, then starts lift driving piece 5, orders about elevating platform 4 and drives IGBT module locating platform 3 and IGBT module rising, makes IGBT module and sweep frequency test set 2 form the butt joint, then utilizes sweep frequency test set 2 to carry out the frequency sweep in order to inspect whether it is qualified to the IGBT module. Compared with the traditional manual wiring, the test bench forms a special test bench for the IGBT module, field manual wiring is not needed, on one hand, the safety is improved, and on the other hand, the test cost is reduced; moreover, the automatic test of the IGBT module is realized through the test board, the phenomenon of manual misconnection is prevented, the test difficulty is reduced, and the test accuracy and the test efficiency are greatly improved.
In this embodiment, the lifting table 4 is provided with a guide rail 41, and the IGBT module positioning table 3 is slidably mounted on the guide rail 41. The arrangement of the guide rail 41 enables the IGBT module positioning table 3 to be horizontally pulled out and pushed in on the lifting table 4 along the guide rail 41, and the IGBT module is convenient to mount and dismount.
In this embodiment, the end of the IGBT module positioning table 3 is provided with a handle 31 for pushing and pulling the IGBT module positioning table 3. The handle 31 improves the convenience of horizontally pulling out and pushing in the IGBT module positioning table 3.
In this embodiment, the end of the lifting table 4 is provided with a limiting seat 6 for preventing the IGBT module positioning table 3 from coming off. This spacing seat 6 can prevent that IGBT module location platform 3 from pulling out and deviate from elevating platform 4 completely, plays spacing effect to it.
In this embodiment, the limiting seat 6 is provided with a positioning button 61 for positioning the IGBT module positioning table 3 during testing. In this structure, push the back when IGBT module location platform 3, press positioning button 61, positioning button 61 can withstand IGBT module location platform 3, prevents that it from taking place the maloperation again, guarantees the accurate butt joint of follow-up test.
In this embodiment, the support frame 1 is provided with the guide post 11, and the guide post 11 on the corresponding side is all suited to the both sides of the elevating platform 4. The guide post 11 ensures the smoothness and stability of the lifting motion of the lifting platform 4 on one hand; on the other hand, the butt joint accuracy of the IGBT module and the upper sweep frequency testing group 2 is further improved.
In this embodiment, the IGBT module positioning table 3 is provided with a plurality of mounting positions 32 for mounting the IGBT module. The IGBT module positioning table 3 is provided with a plurality of IGBT modules, so that one-time multi-measurement can be realized, and the efficiency is greatly improved.
In this embodiment, the lifting driving member 5 is provided as a cylinder, and the cylinders are provided as a plurality of groups. Because a plurality of IGBT modules can be simultaneously installed on one IGBT module positioning table 3, the cylinders are arranged into a plurality of groups, so that the stress of the whole IGBT module positioning table 3 is more uniform and stable on one hand; on the other hand, the lifting stability is improved.
In this embodiment, the sweep frequency testing group 2 includes a capacitor 21, a capacitor bus 22, an ac bus 23, a dc bus 24 and a testing column 25, the capacitor 21, the capacitor bus 22, the ac bus 23 and the dc bus 24 are all installed on the supporting frame 1, the capacitor 21 and the capacitor bus 22 are connected, the ac bus 23 and the dc bus 24 are all connected with the capacitor bus 22, and the testing column 25 is installed on the ac bus 23 and the dc bus 24. In the structure, the frequency sweeping test is realized through the matching of the capacitor 21, the capacitor busbar 22, the alternating current bar 23, the direct current bar 24 and the test column 25, the structure is simple and reliable, and the test column 25 is a copper column.
In this embodiment, the top of the supporting frame 1 is hinged with a cover plate 7 for covering the ac row 23 and the dc row 24. The cover plate 7 is of a reversible structure and is used for covering the alternating current row 23 and the direct current row 24 on one hand to prevent dust from depositing to influence the test; on the other hand, the maintenance work of the AC row 23 and the DC row 24 is also facilitated.
In this embodiment, the bottom of the support frame 1 is provided with universal wheels 8. Make support frame 1 can remove through setting up universal wheel 8, the test of being convenient for transition.
In this embodiment, the end and the side of the support frame 1 are provided with handles 9. The handle 9 further improves the convenience of movement of the support 1.
Although the present invention has been described with reference to the preferred embodiments, it is not intended to be limited thereto. Those skilled in the art can make numerous possible variations and modifications to the present invention, or modify equivalent embodiments to equivalent variations, without departing from the scope of the invention, using the teachings disclosed above. Therefore, any simple modification, equivalent change and modification made to the above embodiments according to the technical spirit of the present invention should fall within the protection scope of the technical scheme of the present invention, unless the technical spirit of the present invention departs from the content of the technical scheme of the present invention.
Claims (11)
1. The utility model provides a IGBT module frequency sweep testboard which characterized in that: including support frame (1), frequency sweep test set (2), IGBT module location platform (3), elevating platform (4) and lift driving piece (5), install in the bottom of support frame (1) and the top of lift driving piece (5) is the output in lift driving piece (5), install on the output of lift driving piece (5) elevating platform (4), install on elevating platform (4) IGBT module location platform (3), frequency sweep test set (2) are installed on support frame (1) and are located the top of IGBT module location platform (3), IGBT module location is on IGBT module location platform (3), lift driving piece (5) drive IGBT module through IGBT module location platform (3) and rise and carry out the frequency sweep test with frequency sweep test set (2) butt joint, frequency sweep test set (2) are including electric capacity (21), electric capacity female arranging (22), Alternating current row (23), direct current row (24) and test post (25), electric capacity (21), electric capacity are arranged (22), are arranged (23) and are arranged (24) all to be installed on support frame (1) with direct current, electric capacity (21) and electric capacity are arranged (22) and are formed the connection, alternating current row (23) and direct current row (24) all are arranged (22) with electric capacity and are formed the connection, test post (25) are installed on alternating current row (23) and direct current row (24).
2. A frequency sweep test bench for IGBT modules as claimed in claim 1, wherein: a guide rail (41) is arranged on the lifting platform (4), and the IGBT module positioning platform (3) is arranged on the guide rail (41) in a sliding mode.
3. A frequency sweep test stand for an IGBT module according to claim 2, wherein: the end part of the IGBT module positioning table (3) is provided with a handle (31) which is convenient for pushing and pulling the IGBT module positioning table (3).
4. A frequency sweep test stand for an IGBT module according to claim 3, wherein: the end part of the lifting platform (4) is provided with a limiting seat (6) for preventing the IGBT module positioning platform (3) from dropping off.
5. A frequency sweep test bench for IGBT modules as claimed in claim 4, wherein: and the limiting seat (6) is provided with a positioning button (61) for positioning the IGBT module positioning table (3) during testing.
6. A frequency sweep test bench for IGBT modules as claimed in claim 5, wherein: the supporting frame (1) is provided with guide columns (11), and the two sides of the lifting platform (4) are sleeved on the guide columns (11) on the corresponding sides.
7. A frequency sweep test bench for IGBT modules as claimed in claim 6, wherein: and a plurality of mounting positions (32) for mounting the IGBT module are arranged on the IGBT module positioning table (3).
8. A frequency sweep test bench for IGBT modules as claimed in claim 7, wherein: the lifting driving piece (5) is arranged into cylinders, and the cylinders are arranged into a plurality of groups.
9. A frequency sweep test stand for an IGBT module according to claim 1, wherein: the top of the support frame (1) is hinged with a cover plate (7) used for covering the alternating current bar (23) and the direct current bar (24).
10. A IGBT module swept frequency test bench according to any of claims 1 to 9, wherein: the bottom of the support frame (1) is provided with universal wheels (8).
11. A frequency sweep test stand for an IGBT module according to claim 10, wherein: handles (9) are arranged at the end part and the side part of the support frame (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911198327.3A CN110911299B (en) | 2019-11-29 | 2019-11-29 | IGBT module frequency sweep test bench |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911198327.3A CN110911299B (en) | 2019-11-29 | 2019-11-29 | IGBT module frequency sweep test bench |
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| Publication Number | Publication Date |
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| CN110911299A CN110911299A (en) | 2020-03-24 |
| CN110911299B true CN110911299B (en) | 2022-07-29 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201911198327.3A Active CN110911299B (en) | 2019-11-29 | 2019-11-29 | IGBT module frequency sweep test bench |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1860446A1 (en) * | 2006-05-23 | 2007-11-28 | Converteam SAS | Method and device for measuring the temperature of a junction in an electronic component. |
| CN208672690U (en) * | 2018-08-29 | 2019-03-29 | 烟台台芯电子科技有限公司 | A kind of half-bridge DBC test fixture inside IGBT module |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203191512U (en) * | 2013-04-18 | 2013-09-11 | 重庆大学 | Device applied to testing organic thin-film field effect transistor |
| JP6790974B2 (en) * | 2017-04-06 | 2020-11-25 | 株式会社デンソー | Inspection device for semiconductor elements |
| CN207020281U (en) * | 2017-07-27 | 2018-02-16 | 东莞市冠佳电子设备有限公司 | A kind of functional test equipment |
| CN208208718U (en) * | 2018-05-29 | 2018-12-07 | 扬州乔恒电子有限公司 | A kind of IGBT module property retrogradation apparatus casing |
| CN208810592U (en) * | 2018-07-12 | 2019-05-03 | 太仓市晨启电子精密机械有限公司 | A kind of IGBT module full-automatic testing cohoront machine |
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2019
- 2019-11-29 CN CN201911198327.3A patent/CN110911299B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1860446A1 (en) * | 2006-05-23 | 2007-11-28 | Converteam SAS | Method and device for measuring the temperature of a junction in an electronic component. |
| CN208672690U (en) * | 2018-08-29 | 2019-03-29 | 烟台台芯电子科技有限公司 | A kind of half-bridge DBC test fixture inside IGBT module |
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| CN110911299A (en) | 2020-03-24 |
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