CN110907846B - Test system and test method of DC/DC conversion module - Google Patents
Test system and test method of DC/DC conversion module Download PDFInfo
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Abstract
The present disclosure relates to a test system and a test method for a DC/DC conversion module, which can simultaneously perform a performance test on a plurality of DC/DC conversion modules, and save time and required equipment. The test system comprises a first high-voltage direct current source, a second high-voltage direct current source and 2N +1 DC/DC conversion modules, wherein the 2N +1 DC/DC conversion modules are connected in series and then connected in series with the first high-voltage direct current source and the second high-voltage direct current source, and N is a positive integer.
Description
Technical Field
The present disclosure relates to the field of electronic technologies, and in particular, to a test system and a test method for a DC/DC conversion module.
Background
At present, the performance of the DC/DC conversion module is usually tested by a power aging test, and in the power aging test, the DC/DC conversion module is mostly connected with a high voltage direct current source and a load, as shown in fig. 1.
In the performance test, since the load consumes power, energy loss and large cost waste are caused. In addition, one high-voltage direct current source is needed for aging one DC/DC conversion module, and a plurality of high-voltage direct current sources are needed for aging a plurality of DC/DC conversion modules simultaneously, so that the cost is too high, and if a plurality of high-voltage direct current sources are not adopted, the aging period is too long, and the production efficiency is low.
Disclosure of Invention
The purpose of the present disclosure is to provide a test system and a test method for a DC/DC conversion module, which can perform a performance test on a plurality of DC/DC conversion modules at the same time, and save time and required equipment.
According to a first embodiment of the present disclosure, a test system of a DC/DC conversion module is provided, the test system includes a first high voltage DC source, a second high voltage DC source and 2N +1 DC/DC conversion modules, the 2N +1 DC/DC conversion modules are connected in series and then connected in series with the first high voltage DC source and the second high voltage DC source, where N is a positive integer.
Optionally, for the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, the operation mode of the odd numbered DC/DC conversion module is a step-up mode, and the operation mode of the even numbered DC/DC conversion module is a step-down mode; and the working mode of the 2N +1 th DC/DC conversion module is a boosting and constant-current mode.
Optionally, for the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, the operation mode of the odd numbered DC/DC conversion module is a step-down mode, and the operation mode of the even numbered DC/DC conversion module is a step-up mode; and the working mode of the 2N +1 th DC/DC conversion module is a voltage reduction and constant current mode.
Optionally, the test system further comprises a first circuit breaker and a second circuit breaker, wherein the first circuit breaker is connected in series between a first DC/DC conversion module and the first high voltage DC source, and the second circuit breaker is connected in series between a 2N +1 th DC/DC conversion module and the second high voltage DC source.
Optionally, the power values of the 2N +1 DC/DC conversion modules during the test process are all set as the rated power values.
According to another embodiment of the present disclosure, a testing method of a DC/DC conversion module is provided, the testing method is applied to a testing system of the DC/DC conversion module, the testing system includes a first high voltage direct current source, a second high voltage direct current source and 2N +1 DC/DC conversion modules, the 2N +1 DC/DC conversion modules are connected in series and then connected in series with the first high voltage direct current source and the second high voltage direct current source, where N is a positive integer; the test method comprises the following steps: setting the voltages of the first high-voltage direct current source and the second high-voltage direct current source to be a first constant voltage and a second constant voltage respectively; setting respective working modes of the 2N +1 DC/DC conversion modules; and testing the performance parameters corresponding to each DC/DC conversion module when the DC/DC conversion module works in the respective working mode.
Optionally, the setting of the respective operating modes of the 2N +1 DC/DC conversion modules includes: for the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, setting the operation mode of the odd-numbered DC/DC conversion module as the step-up mode, and setting the operation mode of the even-numbered DC/DC conversion module as the step-down mode; and setting the working mode of the 2N +1 th DC/DC conversion module to be a boosting and constant-current mode.
Optionally, the setting of the respective operating modes of the 2N +1 DC/DC conversion modules includes: for the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, setting the operation mode of the odd-numbered DC/DC conversion module as a step-down mode, and setting the operation mode of the even-numbered DC/DC conversion module as a step-up mode; and setting the working mode of the 2N +1 th DC/DC conversion module to be a voltage reduction and constant current mode.
Optionally, the test system further comprises a first circuit breaker and a second circuit breaker, wherein the first circuit breaker is connected in series between a first DC/DC conversion module and the first high voltage DC source, and the second circuit breaker is connected in series between a 2N +1 th DC/DC conversion module and the second high voltage DC source; the test method further comprises the following steps: disconnecting the first high voltage direct current source from the first DC/DC conversion module using the first circuit breaker; and disconnecting the second high-voltage direct current source from the 2N +1 th DC/DC conversion module by using the second circuit breaker.
Optionally, the testing method further comprises: and setting the power values of the 2N +1 DC/DC conversion modules as rated power values in the test process.
The technical scheme has the following beneficial effects. Firstly, the performance test can be performed on the DC/DC conversion module, so that the potential failure risk of the DC/DC conversion module is exposed in advance and optimized, and the reliability of the whole DC/DC conversion module is ensured. Secondly, through the technical scheme, the DC/DC conversion modules can be infinitely connected in series in the aging test process so as to simultaneously perform performance test on the DC/DC conversion modules in batches, thereby saving the time required by the performance test and improving the batch production period of products. In addition, in the aging test process, only the first high-voltage direct current source, the second high-voltage direct current source and the aged 2N +1 DC/DC conversion modules consume energy, and the loss is extremely low, so that compared with the prior art, the energy cost is greatly saved. Moreover, compared with the prior art, the batch performance test of the DC/DC conversion module can be realized only by two high-voltage direct current sources, so that the time required by an aging test can be greatly saved under the condition of limited high-voltage direct current sources, the batch production period of products is further prolonged, and the investment cost of equipment is saved.
Additional features and advantages of the disclosure will be set forth in the detailed description which follows.
Drawings
The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of this specification, illustrate embodiments of the disclosure and together with the description serve to explain the disclosure without limiting the disclosure. In the drawings:
fig. 1 is a schematic block diagram of a test system of a DC/DC conversion module according to the prior art.
Fig. 2 is a schematic block diagram of a test system of a DC/DC conversion module according to an embodiment of the present disclosure.
Fig. 3 shows a schematic block diagram of a test system of a DC/DC conversion module according to yet another embodiment of the present disclosure.
Fig. 4 illustrates a flowchart of a test method of a DC/DC conversion module according to still another embodiment of the present disclosure.
Detailed Description
The following detailed description of specific embodiments of the present disclosure is provided in connection with the accompanying drawings. It should be understood that the detailed description and specific examples, while indicating the present disclosure, are given by way of illustration and explanation only, not limitation.
Fig. 2 is a schematic block diagram of a test system of a DC/DC conversion module according to an embodiment of the present disclosure. As shown in FIG. 2, the test systemThe system may comprise a first high voltage direct current source 11, a second high voltage direct current source 13 and 2N +1 DC/DC conversion modules 121～122N+1The 2N +1 DC/DC conversion modules 121～122N+1And the first high-voltage direct current source 11 and the second high-voltage direct current source 13 are connected in series and then connected in series, wherein N is a positive integer.
The technical scheme has the following beneficial effects. Firstly, the performance test can be performed on the DC/DC conversion module, so that the potential failure risk of the DC/DC conversion module is exposed in advance and optimized, and the reliability of the whole DC/DC conversion module is ensured. Secondly, through the technical scheme, the DC/DC conversion modules can be infinitely connected in series in the aging test process so as to simultaneously perform performance test on the DC/DC conversion modules in batches, thereby saving the time required by the performance test and improving the batch production period of products. In addition, only the first high-voltage direct current source 11, the second high-voltage direct current source 13 and the aged 2N +1 DC/DC conversion modules 12 are in the process of the aging test1～122N+1Energy is consumed, and the loss is extremely small, so compared with the prior art, the energy cost is greatly saved. Moreover, compared with the prior art, the batch performance test of the DC/DC conversion module can be realized only by two high-voltage direct current sources, so that the time required by an aging test can be greatly saved under the condition of limited high-voltage direct current sources, the batch production period of products is further prolonged, and the investment cost of equipment is saved.
The test system of the DC/DC conversion module according to the embodiment of the disclosure can adopt a plurality of aging ways to perform aging tests on the DC/DC conversion module.
The first aging mode is as follows: for 2N +1 DC/DC conversion modules 121～122N+1For the first 2N DC/DC conversion modules, the working mode of the odd numbered DC/DC conversion module is the step-up mode, and the working mode of the even numbered DC/DC conversion module is the step-down mode; and the working mode of the 2N +1 th DC/DC conversion module is a boosting and constant-current mode. That is, the first high voltage direct current source 11 is connected to the low voltage side of the first DC/DC conversion module and the high voltage side of the first DC/DC conversion moduleThe high-voltage side of the second DC/DC conversion module is connected, the low-voltage side of the second DC/DC conversion module is connected with the low-voltage side of the third DC/DC conversion module, and the like, the second DC/DC conversion module is connected in series, and finally the second high-voltage DC source 13 is connected with the high-voltage side of the 2N +1 th DC/DC conversion module.
In the present disclosure, the boost mode refers to boosting the voltage on the low-voltage side to the high-voltage side through the on/off and inductive energy storage effects of the switching tube inside the DC/DC conversion module; the voltage reduction mode is that the voltage at the high voltage side is reduced to the low voltage at the low voltage side through the on and off of a switch tube in the DC/DC conversion module and the inductive filtering; the constant current means that the voltage and the current output by the DC/DC conversion module do not change no matter how the load changes within the maximum current range that can be output by the DC/DC conversion module in the boost mode or the buck mode.
The second aging mode is: for 2N +1 DC/DC conversion modules 121～122N+1For the first 2N DC/DC conversion modules, the working mode of the odd numbered DC/DC conversion module is the step-down mode, and the working mode of the even numbered DC/DC conversion module is the step-up mode; and the working mode of the 2N +1 th DC/DC conversion module is a voltage reduction and constant current mode. That is, the first high voltage DC source 11 is connected to the high voltage side of the first DC/DC conversion module, the low voltage side of the first DC/DC conversion module is connected to the low voltage side of the second DC/DC conversion module, the high voltage side of the second DC/DC conversion module is connected to the high voltage side of the third DC/DC conversion module, and so on, and the second high voltage DC source 13 is connected to the low voltage side of the 2N +1 th DC/DC conversion module.
In the two aging modes, when the first high-voltage dc source 11 is in the discharging mode, the second high-voltage dc source 13 is in the charging mode, and when the first high-voltage dc source 11 is in the charging mode, the second high-voltage dc source 13 is in the discharging mode, so that the electric energy can be fed back to the power grid. For the grid, the energy losses are only the losses of the first high voltage DC source 11, the second high voltage DC source 13 and the aged DC/DC conversion module themselves. In addition, in the course of the aging test, 2N +1 DC/DC conversion modules 12 are aged1～122N+1Performance ofParameters are monitored, such as performance parameters of conversion efficiency, high side voltage accuracy, low side current accuracy, inductor current accuracy, and switching tube temperature.
Further, in the aging test process, if the DC/DC conversion module is set to the boost mode, performance parameters of the DC/DC conversion module, such as conversion efficiency, high-voltage side voltage accuracy, low-voltage side voltage accuracy, high-voltage side current accuracy, inductor current accuracy, and switching tube temperature, are monitored; if the DC/DC conversion module is set to a step-down mode, performance parameters of the DC/DC conversion module, such as conversion efficiency, high-side voltage precision, low-side current precision, inductance current precision and switch tube temperature, are monitored. Taking the high-voltage side voltage as an example, assuming that one DC/DC conversion module is set to the boost mode, the set output voltage is 400V, and the fluctuation of the output voltage cannot exceed ± 3V, for example, if the fluctuation of the output voltage exceeds ± 3V, the DC/DC conversion module is a failed product due to aging, and needs to be discarded. That is, only if all monitored performance parameters of the DC/DC conversion module are within the set condition range, the DC/DC conversion module is a qualified product.
In addition, preferably, in the two aging modes, the 2N +1 DC/DC conversion modules 121～122N+1The power during the test is set to the rated power value so as to better perform the burn-in test, and it is ensured that all 2N +1 DC/DC conversion modules 121～122N+1Accuracy of the aging test results.
In addition, in the aging test process, only one of the aging modes may be performed, or both of the aging modes may be performed. If both aging modes are executed, the performance of the same DC/DC conversion module in two different operation modes, namely a boosting mode and a buck mode, can be reflected through the two aging modes.
Fig. 3 shows a schematic block diagram of a test system of a DC/DC conversion module according to yet another embodiment of the present disclosure, which may further include a first circuit breaker 14 and a second circuit breaker as shown in fig. 3A circuit breaker 15, wherein the first breaker 14 is connected in series to the first DC/DC conversion module 121The second circuit breaker 15 is connected in series with the 2N +1 th DC/DC conversion module 12 between the first high voltage DC source 112N+1And the second high voltage dc source 13. A first circuit breaker 14 is able to disconnect said first high voltage direct current source 11 from a first DC/DC conversion module 121The second circuit breaker 15 can disconnect the second high voltage direct current source 13 from the 2N +1 th DC/DC conversion module 122N+1The connection between the modules is such that when any one of the aged DC/DC conversion modules fails or the performance of the aged DC/DC conversion module is detected to be not meeting the requirement, the 2N +1 DC/DC conversion modules connected in series can be disconnected from the high-voltage direct current source through the circuit breaker so as to replace the aged DC/DC conversion modules and the like.
Fig. 4 is a flowchart illustrating a testing method of a DC/DC conversion module according to another embodiment of the present disclosure, the testing method is applied to a testing system of the DC/DC conversion module, the testing system includes a first high voltage DC source, a second high voltage DC source and 2N +1 DC/DC conversion modules, the 2N +1 DC/DC conversion modules are connected in series and then connected in series with the first high voltage DC source and the second high voltage DC source, where N is a positive integer.
As shown in fig. 4, the test method according to the embodiment of the present disclosure may include the following steps S41-S43.
In step S41, the voltages of the first and second high voltage dc sources are set to first and second constant voltages, respectively.
In the present disclosure, the first constant voltage and the second constant voltage are set based on the performance of the DC/DC conversion module that is subjected to the burn-in test, for example, in the first burn-in mode described above, the first constant voltage may be set to, for example, 100V, and the second constant voltage may be set to, for example, 500V.
In step S42, the respective operation modes of the 2N +1 DC/DC conversion modules are set.
In step S43, the performance parameters corresponding to each DC/DC conversion module operating in the respective operating mode are tested.
The technical scheme has the following beneficial effects. Firstly, the performance test can be performed on the DC/DC conversion module, so that the potential failure risk of the DC/DC conversion module is exposed in advance and optimized, and the reliability of the whole DC/DC conversion module is ensured. Secondly, through the technical scheme, the DC/DC conversion modules can be infinitely connected in series in the aging test process so as to simultaneously perform performance test on the DC/DC conversion modules in batches, thereby saving the time required by the performance test and improving the batch production period of products. In addition, in the aging test process, only the first high-voltage direct current source, the second high-voltage direct current source and the aged 2N +1 DC/DC conversion modules consume energy, and the loss is extremely low, so that compared with the prior art, the energy cost is greatly saved. Moreover, compared with the prior art, the batch performance test of the DC/DC conversion module can be realized only by two high-voltage direct current sources, so that the time required by an aging test can be greatly saved under the condition of limited high-voltage direct current sources, the batch production period of products is further prolonged, and the investment cost of equipment is saved.
Optionally, the setting of the respective operating modes of the 2N +1 DC/DC conversion modules includes: for the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, setting the operation mode of the odd-numbered DC/DC conversion module as the step-up mode, and setting the operation mode of the even-numbered DC/DC conversion module as the step-down mode; and setting the working mode of the 2N +1 th DC/DC conversion module to be a boosting and constant-current mode.
Optionally, the setting of the respective operating modes of the 2N +1 DC/DC conversion modules includes: for the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, setting the operation mode of the odd-numbered DC/DC conversion module as a step-down mode, and setting the operation mode of the even-numbered DC/DC conversion module as a step-up mode; and setting the working mode of the 2N +1 th DC/DC conversion module to be a voltage reduction and constant current mode.
Optionally, the test system further comprises a first circuit breaker and a second circuit breaker, wherein the first circuit breaker is connected in series between a first DC/DC conversion module and the first high voltage DC source, and the second circuit breaker is connected in series between a 2N +1 th DC/DC conversion module and the second high voltage DC source; the test method further comprises the following steps: disconnecting the first high voltage direct current source from the first DC/DC conversion module using the first circuit breaker; and disconnecting the second high-voltage direct current source from the 2N +1 th DC/DC conversion module by using the second circuit breaker.
Optionally, the testing method further comprises: and setting the power values of the 2N +1 DC/DC conversion modules as rated power values in the test process.
The preferred embodiments of the present disclosure are described in detail with reference to the accompanying drawings, however, the present disclosure is not limited to the specific details of the above embodiments, and various simple modifications may be made to the technical solution of the present disclosure within the technical idea of the present disclosure, and these simple modifications all belong to the protection scope of the present disclosure.
It should be noted that the various features described in the above embodiments may be combined in any suitable manner without departing from the scope of the invention. In order to avoid unnecessary repetition, various possible combinations will not be separately described in this disclosure.
In addition, any combination of various embodiments of the present disclosure may be made, and the same should be considered as the disclosure of the present disclosure, as long as it does not depart from the spirit of the present disclosure.
Claims (6)
1. The test system of the DC/DC conversion module is characterized by comprising a first high-voltage direct current source, a second high-voltage direct current source and 2N +1 DC/DC conversion modules, wherein the 2N +1 DC/DC conversion modules are connected in series and then connected in series with the first high-voltage direct current source and the second high-voltage direct current source, and N is a positive integer;
for the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, the operation mode of the odd numbered DC/DC conversion module is the step-up mode, and the operation mode of the even numbered DC/DC conversion module is the step-down mode; and
the working mode of the 2N +1 th DC/DC conversion module is a boosting and constant-current mode; or
For the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, the operation mode of the odd numbered DC/DC conversion module is the step-down mode, and the operation mode of the even numbered DC/DC conversion module is the step-up mode; and
the working mode of the 2N +1 th DC/DC conversion module is a voltage reduction and constant current mode.
2. The test system of claim 1, further comprising a first circuit breaker and a second circuit breaker, wherein the first circuit breaker is connected in series between a first one of the DC/DC conversion modules and the first high voltage DC source, and the second circuit breaker is connected in series between a 2N +1 th one of the DC/DC conversion modules and the second high voltage DC source.
3. The test system according to claim 1, wherein the power values of the 2N +1 DC/DC conversion modules during the test are all set as rated power values.
4. The testing method is applied to a testing system of the DC/DC conversion module, the testing system comprises a first high-voltage direct current source, a second high-voltage direct current source and 2N +1 DC/DC conversion modules, the 2N +1 DC/DC conversion modules are connected in series and then connected in series with the first high-voltage direct current source and the second high-voltage direct current source, wherein N is a positive integer;
the test method comprises the following steps:
setting the voltages of the first high-voltage direct current source and the second high-voltage direct current source to be a first constant voltage and a second constant voltage respectively;
setting respective working modes of the 2N +1 DC/DC conversion modules;
testing corresponding performance parameters of each DC/DC conversion module when the DC/DC conversion module works in respective working mode;
the setting of the respective operating modes of the 2N +1 DC/DC conversion modules includes:
for the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, setting the operation mode of the odd-numbered DC/DC conversion module as the step-up mode, and setting the operation mode of the even-numbered DC/DC conversion module as the step-down mode; and
setting the working mode of the 2N +1 th DC/DC conversion module as a boosting and constant-current mode; or
The setting of the respective operating modes of the 2N +1 DC/DC conversion modules includes:
for the first 2N DC/DC conversion modules of the 2N +1 DC/DC conversion modules, setting the operation mode of the odd-numbered DC/DC conversion module as a step-down mode, and setting the operation mode of the even-numbered DC/DC conversion module as a step-up mode; and
and setting the working mode of the 2N +1 th DC/DC conversion module as a voltage reduction and constant current mode.
5. The testing method of claim 4, wherein the testing system further comprises a first circuit breaker and a second circuit breaker, wherein the first circuit breaker is connected in series between a first DC/DC conversion module and the first high voltage DC source, and the second circuit breaker is connected in series between a 2N +1 th DC/DC conversion module and the second high voltage DC source;
the test method further comprises the following steps:
disconnecting the first high voltage direct current source from the first DC/DC conversion module using the first circuit breaker;
and disconnecting the second high-voltage direct current source from the 2N +1 th DC/DC conversion module by using the second circuit breaker.
6. The testing method of claim 4, further comprising:
and setting the power values of the 2N +1 DC/DC conversion modules as rated power values in the test process.
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