CN110877800A - Automated handling of devices under test with different physical dimensions in a test cell - Google Patents

Abstract

A system for performing testing using Automatic Test Equipment (ATE) is disclosed. The system includes a robot including an end effector for picking up DUTs and transferring the DUTs into and out of test slots in a base block. The system further includes a system controller including a memory and a processor for controlling the robot. And, the system includes a test rack comprising a plurality of base blocks, wherein the base blocks are modular devices comprising a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to access slots in the plurality of base blocks within the test rack using the end effector.

Description

Automated handling of devices under test with different physical dimensions in a test cell

Cross Reference to Related Applications

The present application relates to U.S. patent application No. 15/455,103 entitled "device test using dual fan cooling with ambient air" filed on 3, 9, 2017, which designated Roland Wolff as the inventor, and attorney docket No. ATSY-0046-01.01 US. Which is incorporated herein by reference in its entirety for all purposes.

Technical Field

The present application relates to the field of automated test equipment, and more particularly to techniques relating to automated handling of such equipment.

Background

Automatic Test Equipment (ATE) may be any test assembly that tests a semiconductor wafer or die, an Integrated Circuit (IC), a circuit board, or a packaged device such as a solid state drive. The ATE assembly may be used to perform automated testing that quickly performs measurements and generates test results that may then be analyzed. ATE assemblies can range from computer systems coupled to meters to complex automated test assemblies that can include customized, dedicated computer control systems and a number of different test instruments capable of automatically testing electronic components and/or semiconductor wafer tests (e.g., system on a chip (SOC) tests or integrated circuit tests). ATE systems both reduce the amount of time spent testing a device to ensure that the device is functioning as designed, and can also be used as a diagnostic tool to determine the presence of a faulty component within a given device before the given device reaches a user.

When a typical ATE system tests a device (often referred to as a device under test or dut), (device under test), the ATE system applies a stimulus (e.g., an electrical signal) to the device and examines the device's response (e.g., current and voltage). Typically, the end result of the test is either "pass" if the device successfully provides a particular expected response within the pre-established tolerance, or "fail" if the device does not provide an expected response within the pre-established tolerance. More complex ATE systems are able to evaluate failed devices to potentially determine one or more causes of the failure.

ATE systems commonly include a computer to direct the operation of the ATE system. Typically, a computer runs one or more special software programs to provide: (i) a test development environment, and (ii) a device testing environment. In a test development environment, a user typically creates a test program, i.e., a software-based construct having one or more files that control various portions of an ATE system. In a device testing environment, a user typically provides one or more devices to an ATE system for testing, and directs the ATE system to test each device according to a test program. A user may test additional devices by simply providing them to the ATE system and directing the ATE system to test them according to a test program. Accordingly, ATE systems enable users to test multiple devices in a consistent, automated manner based on a test program.

In a typical prior art test environment, the DUT is placed in a controlled environment chamber or "oven". The DUT is connected to the test strip of the test head. Several DUTs may be connected to a single test strip, and a single test box may contain several test strips. The test strip contains test circuitry that tests the DUT according to a test protocol. While the DUT is in the oven, the user cannot touch the DUT so as not to interfere with the controlled environment within the cabinet. When in a bin, even if a certain DUT test ends early, it cannot be removed before all tests are completed. The tank may then be accessed.

One problem associated with this test environment is that the interior of the environmental chamber is inaccessible during testing, which can cause certain test strips to idle if active test strips in the oven are being used for testing. Another problem is that conventional test environments typically require manual insertion and removal of DUTs from a test strip, which is disadvantageous because it is time consuming, error prone, and can damage the DUTs during manual handling. In addition, manual insertion and removal of DUTs in a high volume production environment is significantly inefficient and error prone.

Disclosure of Invention

Therefore, there is a need for an automated method of handling DUTs having different physical dimensions in a test cell. Additionally, what is needed is an automated method of inserting and removing DUTs into and from a substrate (private) in a test head using a robot that does not require human labor and achieves higher yields in less time. Additionally, what is needed is a testing environment that allows the use of a system when testing is conducted within the environment so that the system can be fully utilized. By using the beneficial aspects of the described system, without their respective limitations, embodiments of the present invention provide a new solution to these problems.

The invention disclosed herein utilizes a plurality of base blocks and associated DUT Interface Boards (DIBs) to test DUTs. Each base block is modular, meaning that it can operate independently of the other base blocks. Each base block is connected to a DIB, which contains multiple slots for multiple DUTs.

Embodiments of the present invention automate the testing process to some extent by automating the insertion of DUTs into and removal of DUTs from the DIB using a robot. In one embodiment, the robot utilizes replaceable grippers to handle DUTs having various physical dimensions. The automated process may be programmed so that the robot recognizes which type of device is being automatically tested and selects the appropriate gripper for the apparent size of the device being tested. Additionally, in other embodiments, the tester may also be programmed so that the robot also has the ability to intelligently determine the orientation (horizontal or vertical) and device position of the device in the bin. In further embodiments, the robot is further programmed to intelligently grasp the device without damaging the device through the use of a camera and an external reference point.

According to embodiments of the present invention, device heating generally occurs by the DUTs operating themselves. Thus, after the devices are allowed to operate, they will reach the set point temperature. Next, the cooling method and system (e.g., fans inside the DIB employed in embodiments of the present invention) effectively cool the devices so that they are maintained at the set point temperature for testing. Thus, no temperature controlled environment box is required to heat the device. Other advantages are that ambient air can be successfully used to cool the DUT without the need for additional cooling elements other than fans. Thus, no expensive environmental box is required, as the testing can be performed in a laboratory environment or test floor. This solution is low cost and the DIB (DUT interface board) and test execution module (or base block) combination itself can provide mechanical DUT manipulation and is therefore suitable for high volume testing of a variety of electronic devices including, but not limited to, network cards, graphics cards, chips, microprocessors, Hard Disk Drives (HDDs), and Solid State Drives (SSDs).

Furthermore, because the DUTs are not located within an environmental test cabinet, they are easier to handle, physically manipulate, inspect, etc. during a test cycle using a robot. Aspects of the electronic circuitry used to test the DUT are also modular (using a base block, as described herein). Thus, different modules may perform different tests on different look sizes and DUT types, or different tests on the same DUT type (since synchronous testing is no longer required). This improves overall test efficiency and test flexibility.

In one embodiment, a method for performing testing using Automatic Test Equipment (ATE) is disclosed. The method includes locating a Device Under Test (DUT). Additionally, it includes recording the presence of the DUT in a database and querying the database to determine if an empty slot exists in the base block, wherein the base block is a modular device that includes a plurality of slots for receiving and testing a plurality of DUTs. The method also includes inserting the DUT into the empty slot using the robot and reporting to the database that the empty slot has been filled. Finally, the method includes initiating testing of the DUT.

In various embodiments, a system for performing testing using Automated Test Equipment (ATE) is presented. The system includes a robot including an end effector for picking up the DUT and transferring the DUT into and out of the test slots in the base block. The system further includes a system controller including a memory and a processor for controlling the robot. Additionally, the system includes a test rack comprising a plurality of base blocks, wherein the base blocks are modular devices comprising a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to access the slots in the plurality of base blocks within the test rack using the end effector.

In yet another embodiment, a system for performing testing using Automated Test Equipment (ATE) is disclosed. The system includes a robot including an end effector for picking up the DUT and transferring the DUT into and out of the test slots in the base block. The system further includes an input and output module including a plurality of trays and for presenting the DUTs from the plurality of trays to the robot during testing. In addition, the system includes a system controller including a memory and a processor for controlling the robot. Also, a system includes a test rack comprising a plurality of base blocks, wherein a base block is a modular device comprising a plurality of slots for testing a plurality of DUTs, and wherein a robot is configured to access a slot in the plurality of base blocks within the test rack.

The following detailed description together with the accompanying drawings will provide a better understanding of the nature and advantages of the present invention.

Drawings

Embodiments of the invention are illustrated by way of example, and not by way of limitation, in the figures of the accompanying drawings in which like reference numerals refer to similar elements.

FIG. 1 illustrates a conventional test environment in which a DUT is placed in a controlled environment box.

FIG. 2 illustrates base blocks that interface with a DUT Interface Board (DIB)400 according to an embodiment of the invention.

Fig. 3A illustrates an automated workcell using a six-axis industrial robot for transferring DUT devices (e.g., solid state drives) into and out of a test block in a test head according to an embodiment of the present invention.

Fig. 3B illustrates a structural weldment for maintaining the test stand in a stationary positional alignment in a cell in accordance with an embodiment of the present invention.

FIG. 3C illustrates an input and output module for presenting a DUT to a robotic arm during testing in accordance with an embodiment of the present invention.

Fig. 4 illustrates an automated workcell using a Cartesian (Cartesian) three-axis industrial robot for transferring DUT devices (e.g., solid state drives) into and out of a test building block in a test head according to an embodiment of the invention.

Fig. 5 illustrates an end effector connected to the end of a robotic arm and used to grasp a DUT device (e.g., a solid state drive) and transfer the DUT device into and out of a test substrate in a test head, according to an embodiment of the invention.

Fig. 6 illustrates another end effector connected to the end of a robotic arm and used to grasp a DUT device (e.g., a solid state drive) and transfer the DUT device into and out of a test substrate in a test head in accordance with an embodiment of the present invention.

FIG. 7 illustrates a Solid State Drive (SSD) DUT on a typical flat plastic tray for a customer production facility.

FIG. 8 illustrates a Solid State Drive (SSD) DUT placed in a production bay tote.

Fig. 9A illustrates a six-axis anthropomorphic industrial robot mounted on a height adjustable Z-axis rectangular base in accordance with an embodiment of the present invention.

Fig. 9B illustrates a scissor lift module with a height adjustable Z-axis rectangular base in a fully extended upward configuration according to an embodiment of the present invention.

10A, 10B, 10C, 10D, and 10E illustrate the manner in which a Cartesian robot retrieves DUTs from a tray and inserts the DUTs into slots of a base block in accordance with an embodiment of the present invention.

FIG. 11 illustrates the manner in which a slave PC controller controls a studio according to an embodiment of the present invention.

FIG. 12 illustrates the overall hardware and software required to operate a workshop according to an embodiment of the invention.

FIG. 13 illustrates a flowchart of an exemplary computer-implemented process for testing a DUT in a workshop according to one embodiment of the invention.

In the drawings, elements having the same name have the same or similar functions.

Detailed Description

Reference will now be made in detail to various embodiments of the disclosure, examples of which are illustrated in the accompanying drawings. While described in conjunction with these embodiments, it will be understood that they are not intended to limit the disclosure to these embodiments. On the contrary, the present disclosure is intended to cover alternatives, modifications and equivalents, which may be included within the spirit and scope of the present disclosure as defined by the appended claims. Furthermore, in the following detailed description of the present disclosure, numerous specific details are set forth in order to provide a thorough understanding of the present disclosure. However, it is understood that the disclosure may be practiced without these specific details. In other instances, well-known methods, procedures, components, and circuits have not been described in detail as not to unnecessarily obscure aspects of the present disclosure.

Some portions of the detailed descriptions which follow are presented in terms of procedures, logic blocks, processing, and other symbolic representations of operations on data bits within a computer memory. These descriptions and representations are the means used by those skilled in the data processing arts to most effectively convey the substance of their work to others skilled in the art. In the present application, a procedure, logic block, process, etc., is conceived to be a self-consistent sequence of steps or instructions leading to a desired result. The steps are those utilizing physical manipulations of physical quantities. Usually, though not necessarily, these quantities take the form of electrical or magnetic signals capable of being stored, transferred, combined, compared, and otherwise manipulated in a computer system. It has proven convenient at times, principally for reasons of common usage, to refer to these signals as transactions, bits, values, elements, symbols, characters, samples, pixels, or the like.

It should be borne in mind, however, that all of these and similar terms are to be associated with the appropriate physical quantities and are merely convenient labels applied to these quantities. Unless specifically stated otherwise, as apparent from the following discussions, it is appreciated that throughout the disclosure, discussions utilizing terms such as "configuring," "updating," "testing," "polling," or the like, refer to the actions and processes of a computer system, or similar electronic computing device or processor (e.g., flowchart 1300 of FIG. 13). The computer system or similar electronic computing device manipulates and transforms data represented as physical (electronic) quantities within the computer system memories, registers or other such information storage, transmission or display devices.

The embodiments described herein may be discussed in the general context of computer-executable instructions, such as program modules, being executed by one or more computers or other devices, being resident on some form of computer-readable storage medium. By way of example, and not limitation, computer-readable storage media may comprise non-transitory computer-readable storage media and communication media; non-transitory computer-readable media includes all computer-readable media except transitory propagating signals. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The functionality of the program modules may be combined or distributed as desired in various embodiments.

Computer storage media includes volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data. Computer storage media includes, but is not limited to, Random Access Memory (RAM), Read Only Memory (ROM), electrically erasable programmable ROM (eeprom), flash memory or other memory technology, compact disc ROM (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed to retrieve the information.

Communication media may embody computer-executable instructions, data structures, and program modules and includes any information delivery media. By way of example, and not limitation, communication media includes wired media such as a wired network or direct-wired connection; and wireless media such as acoustic, Radio Frequency (RF), infrared and other wireless media. Combinations of any of the above should also be included within the scope of computer readable media.

Automated handling of devices under test with different physical dimensions in a test cell

FIG. 1 illustrates a conventional test environment in which a DUT is placed in a controlled environment chamber 10 or "oven". The DUT is connected to the test strip of the test head 20. Multiple DUTs may be connected to a single test strip 40. The test strip contains test circuitry that tests the DUT according to a test protocol. Each test head 20 may have a plurality of test strips. The DUTs are placed in the tray 30 when inserted into the oven 10. While the DUT is in the oven 10, the DUT is typically not accessible to a user so as not to interfere with the controlled environment of the enclosure 10. In a typical environmental chamber, multiple test slices operate synchronously to perform the same test scheme on multiple DUTs. In addition, the test head is typically controlled by a single controller computer system (not shown) that is directly connected to the test head and in this way controls all of the test strips in the test head 20.

One problem associated with this test environment is that the interior of the environmental chamber is inaccessible during testing, which can result in the entire test strip or unoccupied wells in the test strip being idle if other test strips in the test head are being used for testing. Another problem is that conventional test environments typically require manual insertion and removal of DUTs from a test strip, which is disadvantageous because it is time consuming, error prone, and can damage the DUTs during manual handling. In addition, manual insertion and removal of DUTs in a high volume production environment is significantly inefficient.

Embodiments of the present invention provide an automated method of handling DUTs having different physical dimensions in a test cell. Embodiments of the present invention further provide an automated method of inserting and removing DUTs into and from a base block in a test head using a robot, thereby eliminating the need for human labor and achieving higher yields in less time. In addition, embodiments of the present invention permit access to the interior of the tank while a test is being conducted within the tank so that the tank may be fully utilized at the same time.

According to embodiments of the present invention, device heating generally occurs by the DUTs operating themselves. Thus, after the devices are allowed to operate, they will reach the set point temperature. Next, the cooling method and system (e.g., fans inside the DIB employed in embodiments of the present invention) effectively cool the devices so that they are maintained at the set point temperature for testing. Thus, no temperature controlled environment box is required to heat the device.

Other advantages are that ambient air can be successfully used to cool the DUT without the need for additional cooling elements other than fans. Thus, no expensive environmental box is required. This solution is low cost and the DIB (DUT interface board) and test execution module (or base block) combination itself can provide mechanical DUT manipulation and is therefore suitable for high volume testing of a variety of electronic devices including, but not limited to, network cards, graphics cards, chips, microprocessors, Hard Disk Drives (HDDs), and Solid State Drives (SSDs).

Furthermore, because the DUTs are not located within an environmental test cabinet, they are easier to handle, physically manipulate, inspect, etc. during a test cycle using a robot. Aspects of the electronic circuitry used to test the DUT are also modular (using a base block, as described herein). Thus, different modules may be tested differently for different or even the same form factor and DUT type. This improves overall test efficiency and test flexibility.

As noted above, embodiments of the present invention advantageously utilize robotics to automate the testing process to some extent by automating the insertion of DUTs into and removal of DUTs from the DIB. In one embodiment, the robot utilizes replaceable grippers to handle DUTs having various physical dimensions. The automated process may be programmed so that the robot can intelligently recognize which type of device is being automatically tested, flexibility and strength, and select the appropriate gripper for the apparent size of the device being tested. Additionally, in other embodiments, the tester may also be programmed so that the robot can also intelligently determine the orientation (horizontal or vertical) and device position of the device in the bin. In additional embodiments, the robot is further programmed to intelligently grasp the device without damaging the device through the use of a camera and an external reference point.

FIG. 2 illustrates a base block 410 interfacing with a DUT Interface Board (DIB)400 according to an embodiment of the invention. Similar to the test strip 40 shown in FIG. 2, the base block of FIG. 4 is of the discrete test module type that fits into the test head 20 and includes test circuitry that tests the DUT according to a test scheme. The base block is, in part, a modification of the test strip 40 of fig. 1 in that it includes a housing 450, within which housing 450 all of the various electronic devices (e.g., site modules, power supplies, etc.) are housed. DIB400 can contain multiple DUTs 420, which DUTs 420 use custom connectors sized for DUTs 420. DIB400 can also include a housing 470. DIB400 interfaces with a universal backplane (not shown) of base block 410 through a load board (not shown) to obtain high speed signals and power. The base block 410 contains test circuitry for executing a test scheme on the DUT 420. The base block 410 may operate independently of any other base block and is connected to a control server.

Embodiments of the present invention utilize multiple base blocks (similar to the base block shown in fig. 2) and associated DIBs to test DUTs. Each base block is modular, meaning that it can operate independently of the other base blocks. Thus, a plurality of base blocks disposed in a rack may each operate according to a different test scheme.

In one embodiment, as explained in U.S. patent application No. 15/455,103 entitled "device test with DUAL FAN cooling USING AMBIENT AIR" (DEVICE TESTING use DUAL-FAN cooling AMBIENT AIR), filed on 9.3.2017, incorporated herein by reference, (referred to herein as the "DUAL-FAN cooling application"), if the test system uses the base block shown in fig. 4, then no environmental enclosure is required in testing DUTs associated with the chassis of the base block because the base block is designed to be partitioned in an efficient manner.

As mentioned in the dual fan cooling application, the advantage of dual fan cooling with ambient air systems is that ambient air is effectively and successfully implemented for cooling a Device Under Test (DUT) without the need for additional cooling elements other than fans. Because the test temperature set point is reached using heat generated from the DUT itself, the need for an environmental chamber is eliminated by using the base block shown in fig. 4. The fan then maintains the set point. In addition, dual fan cooling with ambient air is low cost, compatible with mechanical DUT (device under test) handling, and suitable for high volume testing of different types of devices (or DUTs), as noted above.

In this embodiment, the enclosure 450 of fig. 2 of the present application for the base block enables heat from the DUT to be retained inside the enclosure, and thus a separate heating box is not required. Thus, the user is allowed to directly manipulate the DUT and the base block at any time. In other words, the DUT supplies the heat required to test the DUT at a higher temperature (when powered within the enclosure for a longer duration). In addition, fans and/or vents allow air to circulate inside the base block in order to cool the DUT and thus reduce the internal temperature of the base block.

A typical test header includes a plurality of building blocks and associated DUT Interface Boards (DIB) to test the DUTs. Each base block is modular, meaning that it can operate independently of the other base blocks. Each base block is connected to a DIB400, which contains multiple slots for multiple DUTs 420. The test module 410 is modular and can be inserted into a rack supporting multiple modules with communication and power signals carried from the back of the module to one or more central control computers or test stations (not shown). Individual DUT test base blocks 410 and DIBs 400 may be inserted into respective rack slots to form racks with customizable columns and rows in an ambient air environment (e.g., a test stand or laboratory), eliminating the need for an environmental test cabinet.

As described in detail in the dual fan cooling application, the base block 410 is used to test the DUT 420 by conveying power, instructions, signals, data, test results, and/or information to the DUT 420. The test execution module 410 contains processing, communication, and storage circuitry to test the DUT 420. In addition, the base block or test execution module 410 controls the cooling of the DUT 420 by receiving input signals from temperature sensors near the DUT 420 and by adjusting the rotational speeds of the appropriate bottom and top fans. Also, test execution module 410 includes air conduit 490 to release airflow from DIB400 into the ambient environment.

Fig. 3A illustrates an automated workcell using a six-axis industrial robot for transferring DUT devices (e.g., solid state drives) into and out of a test block in a test head according to an embodiment of the present invention.

Industrial robots may have various axis configurations. Typically, most articulated robots have six axes, also referred to as six degrees of freedom. Six-axis robots provide greater flexibility and can perform a wider range of applications than robots with fewer axes.

Fig. 3A illustrates a six-axis robot 310 for transferring DUT devices (e.g., solid state drives) into and out of a test base block during performance and functional testing of the drives. Fig. 3 also shows an overall automated workshop including five racks 320 and six base blocks 330 per rack. The robot 310 works at the center of the cell. It should be noted that although the illustration in FIG. 3A includes five racks with six base blocks per rack, the bays may be scaled to include any number of racks and base blocks, and the number may be scaled to multiple bays of the production bay. Thus, embodiments of the present invention advantageously achieve higher yields in less time by automating the insertion of devices into or removal from the base block. In addition, the height of the robotic arm may be higher than an average person, and thus, embodiments of the present invention allow base blocks in a workshop to be stacked higher than base blocks in a configuration using manual labor.

The automated workcell may also include a large aluminum panel 311 that rests on the floor of the production cell and provides a single foundation for all hardware components. In one embodiment, the aluminum plate may comprise a 1 inch thick aluminum blank that is machined and drilled to accommodate the steel weldment and the inverted bolt of the test stand.

Fig. 3B illustrates a structural weldment for maintaining the test stand in a stationary positional alignment in a cell in accordance with an embodiment of the present invention. To keep the rack free of vibrations or movements associated with the pushing and pulling of the DUT during placement into or removal from the tester slot, the rack is held in a stationary positional alignment using a structural weld 312, as shown in fig. 3B. The structural weldment may consist of a vertical steel structural weldment securely anchored to the blank base plate 311. Each cell also includes a crossbar that provides support for each frame in the cell.

FIG. 3C illustrates an input and output module for presenting a DUT to a robotic arm during testing in accordance with an embodiment of the present invention. The input and output modules are separate systems for sliding trays/totes 391 that slide in from the operator side, through the modules, and out on the other side to present the DUTs to the robot for pick up. Several sliders may be programmed for various input or sort categories (sort categories) at any given time. In one embodiment, there is a display controlled by the microcontroller to show the operator which tote is to be loaded or unloaded. In operation, an operator places a tote or tray onto the slide that has been pushed out to present her. She then presses the flash button, moving the slider inwards into the module housing. On the opposite side, i.e. inside the work enclosure (work envelope) of the robot, the slide with the pallet or tote that the robot needs to access during the pick-and-place operation slides out into the work enclosure of the robot for access. Once the robot picks up or deposits the DUT, the slide is again moved rapidly in reverse into the module cabinet. In this way, only the slides required for the robot to access at a given moment are allowed to enter the robot work enclosure. As shown in FIG. 3C, the input-output module may be in close proximity to the test rack, and the base blocks 330 of the test rack populated with DUTs (e.g., SATASSD). This input-output module uses double-ended drawer slides driven by stepper motors at each station connected to a rack and pinion to slide the platen surface out toward the operator, or inward into the robot work enclosure.

Fig. 4 illustrates an automated workcell using a cartesian three-axis industrial robot for transferring DUT devices (e.g., solid state drives) into and out of a test block in a test head according to an embodiment of the invention. The cell of fig. 4 includes a single frame 497 having five base blocks 496.

The cartesian robot (also called linear robot) 495 shown in fig. 4 is an industrial robot whose three main axes to be controlled are linear (e.g., they move in a straight line rather than rotate) and are arranged at right angles to each other. The three sliding joints correspond to the up-down, inside-out and front-back movement of the wrist. It may be used as an alternative to a six-axis robot in certain production environments where a low cost workshop is required. Cartesian robot 495 can be programmed to retrieve the DUT from tray 498 and move along 3 linear axes (x, y, and z) to rotate the DUT into the slot of the DIB associated with base block 496.

Fig. 5 illustrates an end effector connected to the end of a robotic arm and used to transfer DUT devices (e.g., solid state drives) into and out of a test substrate block in a test head, according to an embodiment of the invention. End effector 510 is a device or tool that is attached to the end of a robotic arm where the hand is located. The end effector is the part of the robot that interacts with the DUT 505. In other words, the end effector is a gripper for grasping the DUTs using the fingers 520 of the gripper and moving them into and out of the slots inside the base block.

In one embodiment of the invention, the robotic arm (for both six-axis and cartesian robots) has a replaceable gripper. The gripper used depends on the physical dimensions of the device, e.g. SATA 2.5, m.2 drive, etc. The robotic arm is programmed to access the tray and use the gripper to pull one or more DUTs from the tray, and then slide the one or more DUTs into test slots of a desired substrate. Different types of DUTs have different specifications and physical dimensions, so grippers can be selected to accommodate differences in size, form and shape. Also, the robotic arm may be programmed so that the gripper can grasp the DUT at a desired location. For example, the robotic arm may be programmed so that the gripper may grasp the DUT at a certain location and in a manner that is less likely to damage the DUT.

In one embodiment, the holder needs to have sufficient strength and flexibility to detect the type of device. Depending on the type of DUT being tested, the robot or tester can be programmed with the ability to intelligently identify which gripper needs to be selected to select the appropriate device gripper and pick up the DUT and insert it into the appropriate slot.

In another embodiment, the robot or tester is further programmed to use a gripper to determine the orientation of the DUT or the position of the device within the tray. For example, the DUTs may be oriented vertically or horizontally within the tray. In this embodiment, the robot or tester would be programmed to recognize the orientation in which the DUT is placed within the tray, and pick up the device at the appropriate contact point based on the determined orientation. For example, the robot can be programmed such that the gripper approaches the DUT tray at a location where there is an indentation for a human finger to pick up the DUT, and further programmed such that the gripper grips the DUT at an edge of the device during insertion and removal from the base block test slot.

Fig. 6 illustrates another end effector connected to the end of a robotic arm and used to transfer DUT devices (e.g., solid state drives) into and out of a test substrate block in a test head in accordance with an embodiment of the present invention.

The end effector shown in fig. 6 includes a custom mechanical assembly that includes a gripper 610 and instruments needed to operate the cell. The gripper may include a position sensor for detecting motion and an optical sensor for detecting the presence of a DUT.

For example, the end effector of fig. 6 includes a laser transducer 630 for measuring the depth of travel. The transducer may also be used during automated position reference calibration. The effect of the robot orientation and mechanical alignment features is to be able to accurately measure the distance of the robot and the implement from the base block so that the robot can use this distance for automatic correction of the position reference.

The end effector further includes a camera 640 for allowing the gripper to be properly placed on the DUT. The cameras are used during picking up DUTs and placing DUTs in and out of totes and trays to obtain accurate position references. It can also be used to read and decrypt all serial numbers and barcodes of the DUT.

The gripper 610 moves a gripper finger 660 that holds the DUT 620 in motion. The camera 640 may be used by the tester to grasp the DUT at precise contact points to avoid damaging the DUT. The tester can intelligently use the predetermined reference point and the signal from the camera to pick up the DUT without damaging the device. In addition, the camera 640 may also be used to determine the orientation and position of the DUT in the tray. Laser transducer 630 can also be used in conjunction with a camera to determine the manner in which DUTs need to be removed from the tray, and to insert and remove DUTs from slots in the base block.

In one embodiment, the end effector is electronic, enabling adjustment of the gripper finger's gripping power. Gripper fingers 660 may have custom gripping capabilities that allow the robot to pick up several DUTs of different types and physical dimensions. In typical embodiments, the parallel gripper of the end effector is designed to hold one DUT face size at a time. In various embodiments, the end effector is pneumatic. In one embodiment, the end effector may include a pneumatic vacuum chuck capable of picking up a DUT lying flat in a tray.

In one embodiment, the gripper can be designed to accept snap-in and tumbler gripper fingers to accommodate different types of physical dimensions. This requires the use of an automated gripper change mechanism that allows the robot to insert parallel robotic grippers into the change station, and a robotic gripper for a particular product type can be changed to a gripper of a different product type within a few seconds. As mentioned above, the tester can be programmed with the ability to intelligently determine the type of gripper needed and make this replacement without user intervention.

In one embodiment, the end effector is a dual end effector that is capable of replacing a DUT that is currently in a gripper and then immediately and quickly capturing another DUT in a similar gripper. The robot need only twist its wrist 180 deg. to point the gripper to another DUT. This almost doubles the throughput of a single gripper. In one embodiment, there is a series of 1-2 suction cups as part of the end effector, and the robot can place the 1-2 suction cups on the DUTs lying in a flat plastic input tray. Once sucked up, it places the DUT on a middle stationary exchange table and twists its final mechanical joint, again using grippers to pick up the DUT that needs to be put in or taken out of the base block.

In one embodiment, a fixed and stable gripper change station is located on a steel column in front of the robot. The change station includes an automated quick change mechanism, as well as various grippers required to handle a particular product. In operation, the robot simply pushes the existing gripper into the table, and the gripper replacement mechanism captures the gripper and removes it from the pneumatic (or electrical) parallel device. The robot then takes the bare parallel gripper assembly and pushes it into a different change station to pick up the grippers of a different product type required for the next transfer. In one embodiment, the exchange station may also include a fixedly mounted barcode scanner that reads the DUT barcode label when the DUT is stabilized inside the holder. The robot is also able to scan the DUT as it passes the barcode reader. In other words, when the device is held in this station, the barcode scanner may read the serial number of the device statically or by having the robot scan the device past the barcode scanner without interruption. In one embodiment, the DUT has stored a serial number inside the RAM memory, so the serial number can be read electronically (as opposed to using a bar code reader).

In one embodiment, a stationary exchange station has several devices to interface with the end effector, which is used primarily to transfer the DUT from vacuum chuck to parallel gripper or vice versa. The stationary exchange station also handles the removal of one type of product holder and the attachment of a different type of product holder, all within a few seconds of the robot movement.

FIG. 7 illustrates a Solid State Drive (SSD) DUT on a typical flat plastic tray for a customer production facility. The tray shown in fig. 7 may be fragile and may be easily bent and deformed. It keeps the DUT in a planar orientation. The robot of the present invention may advantageously be programmed to recognize the planar orientation of the DUT, and the end effector may use a vacuum chuck to pick the DUT from the tray at a location that minimizes the risk of damage to the DUT.

FIG. 8 illustrates a Solid State Drive (SSD) DUT placed in a production bay tote. These SSD DUTs consist of antistatic cardboard boxes or hard plastics. They will be split to arrange the DUTs so that the connectors face down, enabling the robot gripper to access the end of the drive and make contact at the corners.

Thus, the end effector shown in fig. 6 is capable of performing a variety of functions. For example, the end effector may use a vacuum chuck to pick a DUT lying out of the tray, or to place the same DUT into an outgoing tray (as shown in fig. 7). Additionally, the end effector may use parallel grippers to capture a device standing upright in the tote tank (as shown in fig. 8). Additionally, the end effector may use parallel grippers to push the DUT into the base block slot location or to grasp and remove the DUT from the base block. For example, after picking the DUT using the vacuum chuck, the end effector may place the DUT into a parallel gripper at a change station. When in the holder at the exchange station, the barcode serial number can be read by a fixed barcode scanner at the exchange station.

Fig. 9A illustrates a six-axis anthropomorphic industrial robot mounted on a height adjustable Z-axis rectangular base in accordance with an embodiment of the present invention. In order to place the robot in the correct orientation with respect to the items in the cell, the robot 901 will be mounted to a rectangular base of a Z-axis motion device 902 which is actually height adjustable. The motion device 902 consists of a precision scissor lift with its own high torque stepper motor and associated electronics. The scissor lift can transport the entire robot up to reach a higher optional frame height. The six-axis robot 901 has a long reach because it can be mounted on a height-adjustable Z-axis rectangular base 902 so that the robot can advantageously reach heights that may not normally be reached by a human operator.

Fig. 9B illustrates a scissor lift module with a height adjustable Z-axis rectangular base in a fully extended upward configuration according to an embodiment of the present invention. Scissor lifts can be heavy and therefore consist of their own steel weldment structure. The scissor lift module may have its own electronics built in, which mainly requires a power supply and an ethernet connection. The scissor lift works as its own independent module. It simply transports the robot up and down to the designated location required by the system controller over the local ethernet. The scissor-like active action is produced by a high torque stepper motor driving thick, tight linear screws, which can handle the extreme cases of weight transfer required at the bottom of the motion. Both the top and bottom use linear slides to accommodate the movement required for scissor action. A clutch and brake are built into the stepper motor assembly to stop any downward jog or any movement during power loss, particularly when an emergency power off condition is required. There is an optical laser transducer that measures the height of the scissor platform relative to the base to verify that the desired motion has been achieved. The elevator electronics consist of a fanless Windows-based embedded PC and a stepper motor indexer.

Fig. 10A-10E illustrate the manner in which a cartesian robot retrieves DUTs from a tray and inserts the DUTs into slots of a base block under computer control in accordance with an embodiment of the invention. Fig. 10A illustrates a cartesian robot moving in the x, y, and z planes to access DUTs arranged in a vertical orientation in an interbay tote. Typically, the robot will be programmed to intelligently determine the position of the tote and the orientation of the DUT placed in the tote. In one embodiment, the position (e.g., x, y, and z coordinates) of the tote may be programmed into the tester. As mentioned above, the DUT will be positioned with the connector facing down so that the robot gripper can access the end of the drive and make contact at the corner.

Fig. 10B illustrates the simultaneous use of two parallel grippers to access the end effector of two DUTs. The robot can move up and down (in the Z direction) to access the tray and pick up two DUTs at a time. In one embodiment, each gripper is loaded at a different time. In various embodiments, two grippers may be loaded simultaneously. Fig. 10C illustrates a cartesian robot that rotates about pivot point 1002 to allow the robot arm to move in the x-y plane in order to insert a DUT into the base block slot. Finally, fig. 10D and 10E illustrate different views of an end effector inserting two DUTs into an open slot within a substrate block.

FIG. 11 illustrates the manner in which a slave PC controller controls a studio according to an embodiment of the present invention. In one embodiment, the system controller 1102, which may be a standard PC, may be configured to manage and perform all operations within the entire cell. In one embodiment, a dedicated display 1104 at each cell may be used to interact with the system controller 1102. In one embodiment, the touch screen display 1104 is used for direct operation of viewing and control automation, and may be used for debugging or further programming for continued improvement.

The system controller determines the current position of all DUTs, prioritizes and optimizes pick and place conditions, and then sends those directional commands to a robot controller 1106 which controls the robot and gripper 1108. After the robot controller performs the motion and the sensor verifies that the motion is successfully completed, it sends its latest updated location and status information to the SQL database over the network.

In one embodiment, the SQL database is configured to receive SQL commands and queries from the robot controller or base block. It is formatted as a series of tables representing each of the base block, the rack, and all of the tester socket locations. This information is populated with its current status or the presence of the DUT, the appropriate serial number and test result information, and any other information that the plant may use to determine the current status. The SQL database provides a main interface to allow the building block to know how complete the robot is at the moment and the status of each DUT on the plant. The robotic test cell automation places data about the current state in the robotic test cell into this database and reads information already placed there through the base block during operation of the base block. It allows completely asynchronous and independent communication between all the objects of the plant.

As shown in FIG. 11, in one embodiment, the system controller includes a work program file 1120 that contains all the parameters and configuration values needed to run the cell at the desired performance. In addition, the system controller also includes an archive log file 1122 containing a record of each action in the workshop. Each action is recorded and time stamped. In addition, the log file contains all serial number interactions with the DUT and all interactions with the SQL database.

FIG. 12 illustrates the overall hardware and software required to operate a workshop according to an embodiment of the invention. The system controller 1102 and display 1104 may be used to interface with the base blocks in the rack. The display and system controller may be directly connected to the rack electronics for local control and debugging. The display may include an interface 1124 that allows a user to interact directly with the base block in the rack.

Additionally, the display 1104 may include an interface 1226 for an automation package with the robot controller 1106. In addition, the display may also provide control and debug capabilities. The display may also include an HTML web interface 1228 for system control and configuration, monitoring, maintenance, and debugging. This interface is typically used in production rooms and inside factories, and operations can be implemented through a local intranet 1236.

The display may further include an HTML interface 1230, usable outside the facility, for system control and configuration, monitoring, maintenance and debugging, where a user may log in from a remote location to operate the cell over the internet 1236. The display may also include an HTML web interface 1232 running on the mobile device for system monitoring.

The SQL database 1234 discussed above is installed by the customer and may be used to maintain internal security protocols at the customer's test site.

FIG. 13 illustrates a flowchart of an exemplary computer-implemented process for testing a DUT in a workshop according to one embodiment of the invention. However, the present invention is not limited to the description provided by flowchart 1300. Rather, other functional flows will be apparent to those skilled in the relevant art from the teachings provided herein that are within the scope and spirit of the invention. Flowchart 1300 will continue to be described with reference to the exemplary embodiments described above, but the method is not limited to those embodiments.

At step 1302, the automated test system locates the incoming DUT and records the presence of the new DUT in the SQL database. In one embodiment, the serial number of the DUT may be scanned at the replacement station.

At step 1304, the robot prepares to load the DUT into the test rack. The automated test system queries the SQL database to determine if an empty slot inside the base block is available. In addition, the automated system ensures that the correct configuration of the tester is correct for the particular product being tested, and that the selected slot is online and available.

At step 1306, the robot loads the DUT into the selected slot. In addition, the test system makes the DUT platen position information and its status available in the SQL database for the tester to begin the test process.

At step 1308, the base block in the rack continually polls the SQL DUT table to determine if a socket has been filled. If the socket is filled, the tester sets the status to "in test" at the SQL database and begins a normal test cycle.

At step 1310, after completing the test cycle, the tester updates the status of the DUT to pass/fail and other information, such as sort categories, in the SQL database.

At step 1312, the automated test system polls the SQL database to receive test results for the DUT. Once the tester receives the response, it may remove the DUT from the base block and place it into a designated output bin based on the received information, e.g., information about the sort category.

The foregoing description, for purpose of explanation, has been described with reference to specific embodiments. However, the illustrative discussions above are not intended to be exhaustive or to limit the invention to the precise forms disclosed. Many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and its practical applications, to thereby enable others skilled in the art to best utilize the invention and various embodiments with various modifications as may be suited to the particular use contemplated.

Claims (27)

1. A method for performing testing using Automatic Test Equipment (ATE), the method comprising:

positioning and grasping a Device Under Test (DUT);

recording the presence of the DUT in a database;

querying the database to determine if an empty slot exists in a base block, wherein the base block is a modular device comprising a plurality of slots for testing a plurality of DUTs;

automatically positioning and inserting the DUT into the empty slot using a robot;

reporting to the database that the empty slot has been filled; and

beginning testing of the DUT.

2. The method of claim 1, wherein the DUT is a Solid State Drive (SSD).

3. The method of claim 1, wherein the base block is one of a plurality of base blocks in a test rack, wherein the robot is to access slots in the plurality of base blocks within the test rack.

4. The method of claim 1, further comprising:

updating a state of the DUT in the database based on a result of the testing.

5. The method of claim 4, further comprising:

using the robot to automatically retrieve the DUT from the base block and return the DUT to a tray.

6. The method of claim 1, wherein the robot is a six-axis robot.

7. The method of claim 1, wherein the robot is a cartesian robot.

8. The method of claim 1, wherein the robot comprises an end effector for holding the DUT and transferring the DUT into and out of a test slot in the base block.

9. The method of claim 8, wherein the robot further comprises a camera for facilitating accurate pick and place of the DUT.

10. The method of claim 9, wherein the robot further comprises a laser transducer for measuring a depth of movement of the end effector.

11. A system for performing testing using Automatic Test Equipment (ATE), the system comprising:

a robot including an end effector for automatically picking up a DUT and transferring the DUT into and out of a test slot in a base block;

a system controller including a memory and a processor for controlling the robot; and

a test rack comprising a plurality of base blocks, wherein each base block is a modular device comprising a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to automatically access slots in the plurality of base blocks within the test rack using the end effector.

12. The system of claim 11, wherein the robot further comprises a camera for facilitating accurate pick and place of the DUT.

13. The system of claim 12, wherein the robot further comprises a laser transducer for measuring a depth of movement of the end effector.

14. The system of claim 11, wherein the robot is a six-axis robot.

15. The system of claim 11, wherein the robot is a cartesian robot.

16. The system of claim 11, further comprising:

a display coupled to the system controller, wherein the display is used to observe and control the operation of the robot and to troubleshoot problems with the robot.

17. The system of claim 11, further comprising:

a change station comprising a plurality of end effectors, wherein the robot is to be programmed to automatically recognize a cosmetic dimension of the DUT and to change an end effector at the change station in accordance with the cosmetic dimension of the DUT.

18. A system for performing testing using Automatic Test Equipment (ATE), the system comprising:

a robot including an end effector for automatically grasping and picking up a DUT and transferring the DUT into and out of a test slot in a base block;

an input and output module comprising a plurality of trays and for presenting DUTs from the plurality of trays to the robot during testing;

a system controller including a memory and a processor for controlling the robot; and

a test rack comprising a plurality of base blocks, wherein each base block is a modular device comprising a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to access slots in the plurality of base blocks within the test rack.

19. The system of claim 18, wherein said robot is adapted to be programmed to automatically retrieve said DUT directly from a tray in said input and output module prior to inserting said DUT into a slot within a designated base block.

20. The system of claim 19, wherein the robot is further programmed to retrieve the DUT after it has been tested from the slot and return the DUT to a tray in the input and output module.

21. The system of claim 18, wherein the robot further comprises a camera for facilitating accurate pick and place of the DUT.

22. The system of claim 21, wherein the robot further comprises a laser transducer for measuring a depth of movement of the end effector.

23. The system of claim 22, wherein the robot further comprises a vacuum chuck for picking a DUT lying out of a tray or placing a DUT flat into an outgoing tray.

24. The system of claim 18, wherein the robot is a six-axis robot.

25. The system of claim 18, wherein the robot is a cartesian robot.

26. The system of claim 18, wherein a plurality of structural welds are used to maintain the testing stand in a stationary positional alignment in a cell.

27. The system of claim 26, wherein the plurality of structural welds secure the robot and the input and output modules to the test rack.

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