CN110823960B - Surface damage detection device - Google Patents

Surface damage detection device Download PDF

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Publication number
CN110823960B
CN110823960B CN201911170688.7A CN201911170688A CN110823960B CN 110823960 B CN110823960 B CN 110823960B CN 201911170688 A CN201911170688 A CN 201911170688A CN 110823960 B CN110823960 B CN 110823960B
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conductive
damage
state
layer
unit group
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CN110823960A (en
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蔡苗
王希有
贠明辉
杨道国
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Guilin University of Electronic Technology
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Guilin University of Electronic Technology
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/32Measuring arrangements characterised by the use of electric or magnetic techniques for measuring areas

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  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
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Abstract

The invention provides a surface damage detection device, which is used for a matrix to be detected and comprises: the induction layer is arranged on the base body to be detected; the sensor assembly is connected with the induction layer and used for acquiring a detection signal of the induction layer; and the processor is used for determining the damage state of the substrate to be detected according to the detection signal of the induction layer. The damage state of the base body to be detected can be determined through the damage state of the detected induction layer by the surface damage detection device, real-time detection of the base body to be detected is achieved, manual detection is avoided when the surface of the base body to be detected is detected at every time, and the detection accuracy can be guaranteed while manpower is saved.

Description

Surface damage detection device
Technical Field
The invention relates to the technical field of damage detection, in particular to a surface damage detection device.
Background
With the rise of sharing economy, the sharing automobile gradually enters the daily life of people, and great convenience is brought to people for going out. However, when a shared automobile is returned, a vehicle user is generally required to take pictures of the automobile from different angles and upload the pictures to a background of software of a shared automobile service provider so as to confirm that the automobile is in a good state, particularly to confirm whether the surface of the automobile is damaged by scraping or the like. The requirement increases the use time cost of the vehicle using personnel to a certain extent, and reduces the user experience. How to realize the real-time detection of the surface damage condition of the shared automobile without manpower becomes a problem which needs to be solved urgently.
Disclosure of Invention
The present invention is directed to solving at least one of the problems of the prior art.
A first aspect of the invention provides a surface damage detection apparatus.
In view of the above, according to a first aspect of the present invention, there is provided a surface damage detecting apparatus for a substrate to be measured, comprising: the induction layer is arranged on the base body to be detected; the sensor assembly is connected with the induction layer and used for acquiring a detection signal of the induction layer; and the processor is used for determining the damage state of the substrate to be detected according to the detection signal of the induction layer.
In this technical scheme, the surface on the base member that awaits measuring sets up the response layer, and when the base member that awaits measuring that the surface was provided with the response layer received the damage, the response layer can receive the damage earlier. Through sensor module and inductive layer connection, and give the treater with detected signal transmission and carry out analysis processes, realize the detection to the inductive layer state through the analysis processes to detected signal, it also receives the damage to detect the base member when receiving the damage to detect the inductive layer, the damage state of the base member that awaits measuring can be confirmed to the damage state through the inductive layer that detects, the real-time detection to the base member that awaits measuring has been realized, avoided all needing the manual work to detect when examining the base member surface at every turn, can also guarantee the accuracy that detects when having saved the manpower.
Further, the induction layer is made of a thin flexible material with low rigidity, and is arranged on the outer surface of the base body to be tested in a pasting mode, so that the induction layer is more tightly attached to the base body to be tested, the induction layer is guaranteed to be damaged when the base body to be tested is damaged, and the probability of misjudgment caused when the induction layer is damaged but the base body to be tested is not damaged can be reduced by the thin induction layer.
It can be understood that the substrate to be detected can be a shared automobile but is not limited to the shared automobile, the damage state of the outer surface of the shared automobile is detected in real time by covering the outer surface of the shared automobile with the induction layer, and the condition that a user needs to take a picture to check the shared automobile after using the shared automobile every time is avoided.
Specifically, the substrate to be measured is car paint of a shared car, wherein the induction layer can be arranged outside the car paint or inside the car paint, and the induction layer and the car paint jointly form a surface coating of the shared car, so that the protection and the attractiveness are achieved.
In addition, the triggering device in the above technical solution provided by the present invention may further have the following additional technical features:
in any of the above technical solutions, the sensing layer includes: the first conductive units are arranged along a first direction to form a first conductive unit group, and the first conductive unit groups extend along a second direction; the plurality of second conductive units are arranged along a second direction to form a second conductive unit group, and the plurality of second conductive unit groups extend along the first direction; the sensing assembly comprises a voltage sensor, the voltage sensor is connected with the first conductive unit group and the second conductive unit group, and the voltage sensor is further used for detecting a first voltage signal corresponding to the first conductive unit group and a second voltage signal corresponding to the second conductive unit group.
In this technical scheme, the response layer is including a plurality of first conducting element groups and a plurality of second conducting element group that cross arrangement, a plurality of first conducting element groups are located the coplanar, a plurality of second conducting element groups are located the coplanar, and set up a plurality of first conducting element groups and a plurality of second conducting element group on different surfaces, the realization has guaranteed that a plurality of first conducting element groups and a plurality of second conducting element group can not produce the effect of interference each other, wherein, first conducting element group comprises a plurality of first conducting element, the second conducting element group has a plurality of second conducting element to constitute. The first conductive unit group and the second conductive unit group are both connected with the voltage sensor, and are always in an electrified state in the detection process. Specifically, one end of each of the first conductive unit group and the second conductive unit group is connected with a power supply, the other end of each of the first conductive unit group and the second conductive unit group is connected with a voltage sensor, and the voltage sensor collects a first voltage signal of each of the first conductive unit groups in an electrified state and a second voltage signal of each of the second conductive unit groups in the electrified state.
It can be understood that a plurality of voltage sensors may be provided, or one voltage sensor may be provided, and according to production requirements and actual needs, the plurality of voltage sensors may be connected to the plurality of first conductive unit groups and the plurality of second conductive unit groups in a one-to-one correspondence, or each voltage sensor may be connected to the plurality of first conductive unit groups and the plurality of second conductive unit groups.
It can be understood that the power supply for supplying power to the first conductive unit group and the second conductive unit group may be a power supply carried by the substrate to be tested, or may be an external power supply. Specifically, when the shared automobile is used as a substrate to be tested, a power supply in the automobile can be used as a power supply for supplying power to the first conductive unit and the second conductive unit after voltage reduction processing.
In any of the above technical solutions, the processor is further configured to determine an on-off state of each first conductive element group according to the first voltage signal, and determine an on-off state of each second conductive element group according to the second voltage signal; determining the damage state of the matrix to be detected according to the on-off state of each first conductive unit group and the on-off state of each second conductive unit group; the damage state of the matrix to be detected comprises a damage boundary and a damage area.
In the technical scheme, the processor analyzes and processes a first voltage signal and a second voltage signal fed back by the voltage sensor, if the processor receives the first voltage signal of the first conducting unit group at the specified position fed back by the voltage sensor, the processor can determine that the first conducting unit group is in a connected state, and if the processor does not receive the first voltage signal corresponding to the first conducting unit group, the processor determines that the first conducting unit group is in an open circuit state. If the processor receives the second voltage signal of the second conductive element group at the specified position fed back by the voltage sensor, the processor can determine that the second conductive element group is in the connected state, and if the processor does not receive the second voltage signal corresponding to the second conductive element group, the processor determines that the second conductive element group is in the disconnected state. The processor can determine the on-off state of each first conductive unit group and each second conductive unit group according to the first voltage signal and the second voltage signal fed back by the voltage sensor based on the principle, and determine the damage state of the induction layer according to the on-off state of each first conductive unit group and each second conductive unit group, the induction layer directly covers the outer surface of the base body to be detected, and the damage state of the induction layer can directly reflect the damage state of the base body to be detected. The damage state of the matrix to be detected comprises a damaged boundary and a damaged area, and the damage of the matrix to be detected can be evaluated according to the damage state.
In any of the above technical solutions, the processor is further configured to determine a damage boundary of the sensing layer according to an on-off state of each first conductive element group and an on-off state of each second conductive element group, and determine a damage area of the substrate to be measured according to a damage boundary position of the sensing layer.
In any of the above technical solutions, the processor is further configured to determine a damage position of the sensing layer along the second direction according to the on-off state of each first conductive unit, and determine a damage position of the sensing layer along the first direction according to the on-off state of each second conductive unit; and positioning the damage boundary of the induction layer according to the damage position of the induction layer along the first direction and the damage position of the induction layer along the second direction.
In the technical scheme, the processor can determine the damage boundary of the induction layer according to the on-off state of each first conductive unit group and the on-off state of each second conductive unit group, and the damage area of the induction layer can be estimated according to the damage boundary.
It is to be understood that, in the sensing layer, each of the first conductive element groups is composed of first conductive elements extending along a first direction, a plurality of the first conductive element groups are arranged along a second direction, each of the second conductive element groups is composed of second conductive elements extending along the second direction, a plurality of the second conductive element groups are arranged along the first direction, the plurality of the first conductive element groups and the plurality of the second conductive element groups are not in the same plane, the first conductive unit groups and the second conductive units are distributed up and down, the processor can determine the damage position of the induction layer along the second direction according to the on-off state of each first conductive unit group in the plurality of first conductive unit groups, according to the on-off state of each second conductive unit group in the plurality of second conductive unit groups, the damage position of the sensing layer along the first direction can be determined, and the damage position of the sensing layer along the first direction and the damage position along the second direction can be determined as the damage boundary of the sensing layer.
In any of the above technical solutions, the processor is further configured to determine a geometric parameter of the damage according to the damage boundary of the sensing layer, and estimate the damage area according to the geometric parameter of the damage.
In the technical scheme, after a new complete induction layer is laid and electrified, the processor can record the positions of each first conductive unit group and each second conductive unit group in the induction layer through the voltage sensor, and establish a corresponding relation between the positions of each first conductive unit group and each second conductive unit group and parameters of the outer surface of the to-be-detected base body prestored in the system, so that the damage boundary of the induction layer is determined, and meanwhile, the damage boundary and the damage geometric parameters of the to-be-detected base body are also determined. And determining the damage boundary of the induction layer can determine the geometric parameters of the damage according to the pre-stored geometric parameters of the substrate to be detected and the damage boundary of the substrate to be detected.
It can be understood that the correspondence relationship between the position of each first conductive element group and the position of each second conductive element group and the parameter of the outer surface of the to-be-measured substrate pre-stored in the system may be set as an aggregation parameter of the sensing layer, specifically, the processor may set a coordinate point with geometric parameter information for the intersection point of the first conductive element group and the second conductive element group, and determine the damage area according to the geometric parameter in the coordinate point of the damage boundary.
In any of the above technical solutions, the sensor further includes a cover layer, and the cover layer is disposed on the sensing layer.
In the technical scheme, the covering layer plays a role in covering and protecting the induction layer, and the induction layer is prevented from being directly exposed to the outside to cause the failure of the induction layer when the induction layer is arranged outside the base body to be tested.
It can be understood that, when the car paint of the shared car is used as a base body to be tested and the induction layer is arranged outside the car paint, the covering layer can be used for coating the car, namely the induction layer and the protective film are attached into a whole, the protective film attached with the induction layer is coated on the shared car, the induction layer is arranged outside the car paint of the shared car, the covering layer and the induction layer are covered outside the car paint together, and the protection effect on the car paint and the effect of detecting the damage of the car paint are achieved.
In any of the above technical solutions, the sensing layer further includes: a first insulating layer connected to the plurality of first conductive cell groups; and the second insulating layer is connected with the plurality of second conductive unit groups.
In the technical scheme, the first conductive unit group and the second conductive unit group are respectively arranged in the first insulating layer and the second insulating layer, the first insulating layer and the second insulating layer can effectively prevent the first conductive unit group and the second conductive unit group from electric leakage, and meanwhile, mutual interference between the first conductive unit group and the second conductive unit group is avoided.
It can be appreciated that the first and second insulating layers are each provided with a slot for placing the first and second groups of conductive elements, which facilitates the placement of the first and second groups of conductive elements within the first and second insulating layers in subsequent steps. The insulating layer and the conductive unit group can be formed in one step by a one-step spray forming mode.
In any of the above technical solutions, the first direction and the second direction are perpendicular to each other.
In this technical solution, the first direction and the second direction are perpendicular to each other, so that the first conductive element group and the second conductive element group are arranged in a perpendicular crossing manner, and the grids formed by the first conductive element group and the second conductive element group are rectangular. The detection grids formed by the first conductive unit groups and the second conductive unit groups are more regular, and the subsequent damage states determined according to the on-off states of the first conductive unit groups and the second conductive unit groups are more accurate.
Specifically, the first conductive element groups are arranged at equal intervals, and the second conductive element groups are arranged at equal intervals according to the intervals between the first conductive element groups, namely, the first conductive element groups and the second conductive element groups are ensured to form crossed grids with each grid being square, the distance between each two adjacent crossed points in the same direction is equal, and the damage state is more accurately determined according to the on-off state of the conductive element groups.
In any of the above technical solutions, the material of the first conductive unit and the second conductive unit includes: one or the combination of conductive ink, conductive organic matter, conductive paint and metal.
In the technical scheme, a plurality of continuous conductive units form a conductive group capable of conducting electricity, the conductive units can be formed by one or a combination of conductive ink, conductive organic matter, conductive paint and metal, and in order to enable detection to be more sensitive and accurate, the conductive units can be combined by utilizing the materials to enable the conductive group to have a smaller size and simultaneously have good conductivity.
Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 shows a schematic structural diagram of a surface damage detection apparatus in one embodiment of the present invention;
FIG. 2 is a schematic diagram of a structure of a sensing layer of a surface damage detection apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of the structure of the sensing layer of the surface damage detection apparatus according to another embodiment of the present invention;
fig. 4 shows a schematic structure of a sensing layer of a surface damage detection apparatus according to still another embodiment of the present invention.
Wherein, the correspondence between the reference numbers and the part names in fig. 1 to 4 is:
100 sense layer, 102 first conductive element group, 104, second conductive element group, 106 first insulating layer, 108 second insulating layer, 200 sensor assembly, 202 voltage sensor, 300 processor, 400 cover layer, 500 substrate under test.
Detailed Description
In order that the above objects, features and advantages of the present invention can be more clearly understood, a more particular description of the invention will be rendered by reference to the appended drawings. It should be noted that the embodiments and features of the embodiments of the present application may be combined with each other without conflict.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, however, the present invention may be practiced in other ways than those specifically described herein, and therefore the scope of the present invention is not limited to the specific embodiments disclosed below.
A surface damage detection apparatus according to some embodiments of the present invention is described below with reference to fig. 1 to 4.
As shown in fig. 1, an embodiment of the present invention provides a surface damage detection apparatus for a substrate 500 to be detected, including: the induction layer 100, the induction layer 100 is arranged on the base body 500 to be tested; the sensor assembly 200 is connected with the sensing layer 100 and used for collecting detection signals of the sensing layer 100; and the processor 300, wherein the processor 300 is used for determining the damage state of the substrate 500 to be detected according to the detection signal of the sensing layer 100.
In this embodiment, the sensing layer 100 is disposed on the surface of the substrate 500 to be tested, and when the substrate 500 to be tested, on which the sensing layer 100 is disposed, is damaged, the sensing layer 100 is damaged first. Be connected with response layer 100 through sensor subassembly 200, and will detect signal transmission and carry out analysis processes for treater 300, realize the detection to response layer 100 state through the analysis processes to detecting signal, it also receives the damage to judge that the base member 500 that awaits measuring also receives when detecting response layer 100 and receiving the damage, the damage state of the base member 500 that awaits measuring can be confirmed to the damage state through the response layer 100 that detects, the real-time detection to the base member 500 that awaits measuring has been realized, avoided at every turn to the base member 500 surface that awaits measuring to examine time measuring all need artifically detect, can also guarantee the accuracy that detects when having saved the manpower.
Further, the sensing layer 100 is made of a thin flexible material with low rigidity, and the sensing layer 100 is arranged on the outer surface of the substrate 500 to be tested in a pasting mode, so that the sensing layer 100 is attached to the substrate 500 to be tested more tightly, the sensing layer 100 is guaranteed to be damaged when the substrate 500 to be tested is damaged, and the probability of misjudgment generated when the sensing layer 100 is damaged but the substrate 500 to be tested is not damaged can be reduced by the thin sensing layer 100.
It can be understood that the substrate 500 to be detected may be a shared automobile but not limited to a shared automobile, and the sensing layer 100 is used to cover the outer surface of the shared automobile to realize real-time detection of the damage state of the outer surface of the shared automobile, thereby avoiding the need for the user to perform a photo check on the shared automobile after using the shared automobile every time.
Specifically, the substrate 500 to be tested is the car paint of the shared car, wherein the sensing layer 100 can be arranged outside the car paint or inside the car paint, and the sensing layer and the car paint together form a surface coating of the shared car, so that the protection and the beauty are achieved.
As shown in fig. 1 and 2, in any of the above embodiments, the sensing layer 100 includes: a plurality of first conductive elements arranged in a first direction to form a first conductive element group 102, the plurality of first conductive element groups 102 extending in a second direction; a plurality of second conductive elements and a plurality of second conductive elements are arranged along a second direction to form a second conductive element group 104, and the plurality of second conductive element groups 104 extend along the first direction; the sensing assembly includes a voltage sensor 202, the voltage sensor 202 coupled to the first set of conductive elements 102 and the second set of conductive elements 104, the voltage sensor 202 further configured to detect a first voltage signal corresponding to the first set of conductive elements 102 and a second voltage signal corresponding to the second set of conductive elements 104.
In this embodiment, the sensing layer 100 includes a plurality of first conductive element groups 102 and a plurality of second conductive element groups 104 that are arranged in a crossing manner, the plurality of first conductive element groups 102 are located on the same plane, the plurality of second conductive element groups 104 are located on the same plane, and the plurality of first conductive element groups 102 and the plurality of second conductive element groups 104 are arranged on different surfaces, so as to achieve an effect of ensuring that the plurality of first conductive element groups 102 and the plurality of second conductive element groups 104 do not interfere with each other, where the first conductive element groups 102 are composed of a plurality of first conductive elements, and the second conductive element groups 104 are composed of a plurality of second conductive elements. The first set of conductive elements 102 and the second set of conductive elements 104 are both coupled to the voltage sensor 202, and during sensing, both the first set of conductive elements 102 and the second set of conductive elements 104 are always energized. Specifically, one end of each of the first conductive cell group 102 and the second conductive cell group 104 is connected to a power supply, the other end is connected to the voltage sensor 202, and the voltage sensor 202 collects a first voltage signal of each of the first conductive cell groups 102 in the powered state and a second voltage signal of each of the second conductive cell groups 104 in the powered state.
It is understood that a plurality of voltage sensors 202 may be provided or one voltage sensor 202 may be provided according to production requirements and actual needs.
In some embodiments, a plurality of voltage sensors 202 may be connected in a one-to-one correspondence with a plurality of first conductive element groups 102 and a plurality of second conductive element groups 104, wherein one voltage sensor 202 detects a voltage signal for one first conductive element group 102 or one second conductive element group 104.
In some embodiments, multiple groups of conductive element may be connected by one voltage sensor 202, and in particular, all of the first group of conductive elements 102 and the second group of conductive elements 104 may be connected to the same voltage sensor 202, and all of the groups of conductive elements may be sensed by one voltage sensor 202.
It is understood that the power supply for supplying power to the first conductive element group 102 and the second conductive element group 104 may be a power supply of the substrate 500 to be tested, or may be an external power supply. Specifically, when the shared automobile is used as the substrate 500 to be tested, a power supply in the automobile can be used as a power supply for supplying power to the first conductive unit and the second conductive unit after voltage reduction processing.
As shown in fig. 1 and 2, in any of the above embodiments, the processor 300 is further configured to determine an on-off state of each of the first group of conductive elements 102 based on the first voltage signal, and determine an on-off state of each of the second group of conductive elements 104 based on the second voltage signal; determining the damage state of the substrate 500 to be tested according to the on-off state of each first conductive unit group 102 and the on-off state of each second conductive unit group 104; the damage state of the substrate 500 to be measured includes a damage boundary and a damage area.
In this embodiment, the processor 300 analyzes and processes the first voltage signal and the second voltage signal fed back by the voltage sensor 202, and determines that the first conductive element group 102 is in the connected state if the processor 300 receives the first voltage signal of the first conductive element group 102 at the specified position fed back by the voltage sensor 202, and determines that the first conductive element group 102 is in the disconnected state if the processor 300 does not receive the first voltage signal corresponding to the first conductive element group 102. The processor 300 may determine that the second group of conductive elements 104 is in the connected state if it receives the second voltage signal from the second group of conductive elements 104 at the designated location fed back by the voltage sensor 202 and determine that the second group of conductive elements 104 is in the disconnected state if the processor 300 does not receive the second voltage signal from the second group of conductive elements 104. Based on the principle, the processor 300 may determine the on-off state of each first conductive element group 102 and each second conductive element group 104 according to the first voltage signal and the second voltage signal fed back by the voltage sensor 202, and determine the damage state of the sensing layer 100 according to the on-off state of each first conductive element group 102 and each second conductive element group 104, where the sensing layer 100 directly covers the outer surface of the substrate 500 to be tested, and the damage state of the sensing layer 100 may directly reflect the damage state of the substrate 500 to be tested. The damage state of the substrate 500 to be tested comprises a damaged boundary and a damaged area, and the damage of the substrate 500 to be tested can be evaluated according to the damage state.
As shown in fig. 1 and fig. 2, in any of the above embodiments, the processor 300 is further configured to determine a damage boundary of the sensing layer 100 according to an on-off state of each first conductive element group 102 and an on-off state of each second conductive element group 104, and determine a damage area of the substrate 500 to be tested according to a damage boundary position of the sensing layer 100.
In any of the above embodiments, as shown in fig. 1 and fig. 2, the processor 300 is further configured to determine a damage position of the sensing layer 100 along the second direction according to the on-off state of each first conductive unit, and determine a damage position of the sensing layer 100 along the first direction according to the on-off state of each second conductive unit; the damage boundary of the sensing layer 100 is located according to the damage position of the sensing layer 100 along the first direction and the damage position of the sensing layer 100 along the second direction.
In this embodiment, the processor 300 may determine the damage boundary of the sensing layer 100 according to the on-off state of each first group of conductive elements 102 and the on-off state of each second group of conductive elements 104, and may estimate the damage area of the sensing layer 100 according to the damage boundary.
It is understood that, in the sensing layer 100, each first conductive element group 102 is composed of first conductive elements extending along a first direction, a plurality of first conductive element groups 102 are arranged along a second direction, each second conductive element group 104 is composed of second conductive elements extending along the second direction, a plurality of second conductive element groups 104 are arranged along the first direction, the plurality of first conductive element groups 102 and the plurality of second conductive element groups 104 are not in the same plane, and the first conductive element groups 102 and the second conductive elements are distributed up and down, the processor 300 can determine the damage position of the sensing layer 100 along the second direction according to the on-off state of each first conductive element group 102 in the plurality of first conductive element groups 102, can determine the damage position of the sensing layer 100 along the first direction according to the on-off state of each second conductive element group 104 in the plurality of second conductive element groups 104, the damage location of the sensing layer 100 along the first direction and along the second direction may determine the damage boundary of the sensing layer 100.
In any of the above embodiments, as shown in fig. 1 and 2, the processor 300 is further configured to determine a geometric parameter of the damage according to the damage boundary of the sensing layer 100, and estimate the area of the damage according to the geometric parameter of the damage.
In this embodiment, after a new complete sensing layer 100 is laid and powered on, the processor 300 may record the position of each first conductive element group 102 and each second conductive element group 104 in the sensing layer 100 through the voltage sensor 202, and establish a corresponding relationship between the position of each first conductive element group 102 and each second conductive element group 104 and a parameter of the outer surface of the substrate 500 to be tested, which is pre-stored in the system, so that the damage boundary of the sensing layer 100 is determined, and the damage boundary and the geometric parameter of the damage of the substrate 500 to be tested are also determined. Determining the damage boundary of the sensing layer 100 may determine the geometric parameters of the damage according to the pre-stored geometric parameters of the substrate 500 to be tested and the damage boundary of the substrate 500 to be tested.
It can be understood that, establishing a corresponding relationship between the position of each first conductive element group 102 and each second conductive element group 104 and a parameter of the outer surface of the substrate 500 to be tested, which is pre-stored in the system, may be to use an aggregation parameter of the outer surface of the substrate 500 to be tested as an aggregation parameter of the sensing layer 100, and specifically, the processor 300 may establish a coordinate point with geometric parameter information for an intersection of the first conductive element group 102 and the second conductive element group 104, and determine the damage area according to the geometric parameter in the coordinate point of the damage boundary.
As shown in fig. 2 and fig. 3, fig. 3 is a schematic structural diagram of each layer structure of the sensing layer 100 in a top view, in any of the above embodiments, the sensing layer further includes a covering layer 400, and the covering layer 400 is disposed on the sensing layer 100.
In this embodiment, the covering layer 400 serves as a covering protection for the sensing layer 100, so as to prevent the sensing layer 100 from being directly exposed to the outside and causing failure when the sensing layer 100 is disposed outside the substrate 500 to be tested.
It can be understood that, when the car paint of the shared car is used as the substrate 500 to be tested and the sensing layer 100 is disposed outside the car paint, the covering layer 400 may also be a car coating film, that is, the sensing layer 100 and the protective film are attached to one body, and the protective film attached with the sensing layer 100 is coated on the shared car, so that the sensing layer 100 is disposed outside the car paint of the shared car, the covering layer 400 and the sensing layer 100 are covered outside the car paint together, and the protection effect on the car paint and the effect of detecting the damage of the car paint are achieved.
As shown in fig. 2 and 3, in any of the above embodiments, the sensing layer 100 further includes a first insulating layer 106, and the first insulating layer 106 is connected to the plurality of first conductive element groups 102; a second insulating layer 108, the second insulating layer 108 being connected to the plurality of second groups 104 of conductive elements.
In this embodiment, the first conductive element group 102 and the second conductive element group 104 are disposed in the first insulating layer 106 and the second insulating layer 108, respectively, and the first insulating layer 106 and the second insulating layer 108 may effectively prevent the first conductive element group 102 and the second conductive element group 104 from leaking electricity while avoiding mutual interference between the first conductive element group 102 and the second conductive element group 104.
In some embodiments, the first and second insulating layers 106, 108 are each formed with a slot therein for receiving the first and second groups of conductive elements 102, 104, thereby facilitating the placement of the first and second groups of conductive elements 102, 104 within the first and second insulating layers 106, 108 in subsequent steps.
In some embodiments, the insulating layer and the conductive unit group can be formed in one step by one-step spray forming.
In any of the above embodiments, the first direction and the second direction are perpendicular to each other, as shown in fig. 4.
In this embodiment, the first direction and the second direction are perpendicular to each other, and the first conductive element group 102 and the second conductive element group 104 may be arranged in a perpendicular crossing manner, and the grid formed by the first conductive element group 102 and the second conductive element group 104 is rectangular. The detection grid formed by the first conductive element group 102 and the second conductive element group 104 is more regular, and the subsequent damage state determined according to the on-off states of the first conductive element group 102 and the second conductive element group 104 is more accurate.
In some embodiments, the first conductive element groups 102 are arranged at equal intervals, and the second conductive element groups 104 are arranged at equal intervals between the first conductive element groups 102, that is, the first conductive element groups 102 and the second conductive element groups 104 are ensured to form a cross grid with each square cell, so that the distance between each adjacent cross points in the same direction is equal, and the damage state can be determined more accurately according to the on-off state of the conductive element groups.
As shown in fig. 2 to 4, in any of the above embodiments, the material of the first conductive element and the second conductive element includes: one or the combination of conductive ink, conductive organic matter, conductive paint and metal.
In this embodiment, a plurality of continuous conductive units form a conductive group capable of conducting electricity, the conductive units can be formed by one or a combination of conductive ink, conductive organic matter, conductive paint and metal, and in order to make the detection more sensitive and accurate, the conductive units can be combined by using the above materials to make the conductive group have a smaller size and also have good conductivity.
In the present invention, the term "plurality" means two or more unless explicitly defined otherwise. The terms "mounted," "connected," "fixed," and the like are to be construed broadly, and for example, "connected" may be a fixed connection, a removable connection, or an integral connection; "coupled" may be direct or indirect through an intermediary. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the description herein, the description of the terms "one embodiment," "some embodiments," "specific embodiments," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes will occur to those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (8)

1. A surface damage detection device for a substrate to be detected, comprising:
the response layer, the response layer sets up on the base member that awaits measuring, the response layer includes:
a plurality of first conductive cells arranged in a first direction to form a first group of conductive cells extending in a second direction;
a plurality of second conductive cells arranged in a second direction to form a second conductive cell group, the plurality of second conductive cell groups extending in the first direction;
the sensing assembly comprises a voltage sensor, the voltage sensor is connected with the first conductive unit group and the second conductive unit group, and the voltage sensor is further used for detecting a first voltage signal corresponding to the first conductive unit group and a second voltage signal corresponding to the second conductive unit group;
the sensor assembly is connected with the induction layer and is used for acquiring a detection signal of the induction layer;
the processor is used for determining the damage state of the base body to be detected according to the detection signal of the induction layer, determining the on-off state of each first conductive unit group according to the first voltage signal, and determining the on-off state of each second conductive unit group according to the second voltage signal; determining the damage state of the matrix to be tested according to the on-off state of each first conductive unit group and the on-off state of each second conductive unit group; the damage state of the matrix to be detected comprises a damage boundary and a damage area.
2. The surface damage detection apparatus of claim 1, wherein the processor is further configured to,
and determining the damage boundary of the induction layer according to the on-off state of each first conductive unit group and the on-off state of each second conductive unit group, and determining the damage area of the matrix to be detected according to the damage boundary position of the induction layer.
3. The surface damage detection apparatus of claim 2, wherein the processor is further configured to,
determining the damage position of the sensing layer along the second direction according to the on-off state of each first conductive unit group, and determining the damage position of the sensing layer along the first direction according to the on-off state of each second conductive unit group;
and positioning the damage boundary of the induction layer according to the damage position of the induction layer along the first direction and the damage position of the induction layer along the second direction.
4. The surface damage detection apparatus of claim 3, wherein the processor is further configured to,
and determining the geometric parameters of the damage according to the damage boundary of the induction layer, and estimating the damage area according to the geometric parameters of the damage.
5. The surface damage detection apparatus of any one of claims 1 to 4, further comprising:
a cover layer disposed on the sensing layer.
6. The surface damage detection device of any of claims 1 to 4, wherein the sensing layer further comprises:
a first insulating layer connected with the plurality of first conductive cell groups;
a second insulating layer connected to the plurality of second conductive element groups.
7. The surface damage detection apparatus of claim 6,
the first direction and the second direction are perpendicular to each other.
8. The surface damage detection device of claim 7, wherein the first conductive element and the second conductive element are made of materials comprising:
one or the combination of conductive ink, conductive organic matter, conductive paint and metal.
CN201911170688.7A 2019-11-26 2019-11-26 Surface damage detection device Active CN110823960B (en)

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