CN110793450A - High-precision particle size measuring device and method based on optical fiber tweezers - Google Patents
High-precision particle size measuring device and method based on optical fiber tweezers Download PDFInfo
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- 239000013307 optical fiber Substances 0.000 title claims abstract description 159
- 239000002245 particle Substances 0.000 title claims abstract description 150
- 238000000034 method Methods 0.000 title claims abstract description 24
- 239000000523 sample Substances 0.000 claims abstract description 67
- 238000012576 optical tweezer Methods 0.000 claims abstract description 53
- 230000003287 optical effect Effects 0.000 claims abstract description 31
- 238000012545 processing Methods 0.000 claims abstract description 12
- 239000000835 fiber Substances 0.000 claims description 51
- CLOMYZFHNHFSIQ-UHFFFAOYSA-N clonixin Chemical compound CC1=C(Cl)C=CC=C1NC1=NC=CC=C1C(O)=O CLOMYZFHNHFSIQ-UHFFFAOYSA-N 0.000 claims description 3
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- 238000005259 measurement Methods 0.000 abstract description 10
- 238000001514 detection method Methods 0.000 abstract description 5
- 230000010354 integration Effects 0.000 abstract description 3
- 239000004793 Polystyrene Substances 0.000 description 15
- 229920002223 polystyrene Polymers 0.000 description 15
- 238000010586 diagram Methods 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 239000008367 deionised water Substances 0.000 description 3
- 229910021641 deionized water Inorganic materials 0.000 description 3
- 239000011859 microparticle Substances 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
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- 239000000377 silicon dioxide Substances 0.000 description 2
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- 239000003292 glue Substances 0.000 description 1
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
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- G—PHYSICS
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- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
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- G01N15/0205—Investigating particle size or size distribution by optical means
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Abstract
The invention relates to the technical field of optical precision measurement, in particular to the field of a high-precision particle size measuring device and a measuring method based on optical tweezers. A high-precision particle size measuring device based on optical tweezers comprises: the laser device is connected with an input port of the optical fiber circulator, the optical fiber probe is connected with an output port of the optical fiber circulator, and the data acquisition and processing system is connected with a reflection output port of the optical fiber circulator. According to the invention, the change of the particle size of the micro-nano particles can be detected on line in real time by using the reflective double-beam interference based on the optical tweezers; the optical tweezers are adopted, so that the particle detection operation is more flexible and free, the cost is low, and the integration and miniaturization are facilitated; the interference light intensity is used as the particle size detection standard, the particle size change smaller than the wavelength range can be accurately detected, and the accuracy can reach the nanometer level.
Description
Technical Field
The invention relates to the technical field of optical precision measurement, in particular to the field of a high-precision particle size measuring device and a measuring method based on optical tweezers.
Background
With the development of micro-nano technology, the high-precision nano-scale range measurement of the particle size of the particles has important research significance. At present, the nano-scale measurement and calibration of the particles mainly utilize instruments such as a scanning and fast moving particle measuring instrument, an electric low-voltage impactor, a condensation particle counter, a nano particle surface area monitor and the like (J Nanopart Res 2012,14 and 718). Most of micro-particle nano-scale measuring instruments have great difficulty in the single micro-particle diameter measurement research, but the research on single particles is helpful to the exploration of various micro-nano-scale characteristics of the particles. For the particle size measurement of a single micro-nano particle, the most common and effective method is to use an electron microscope and an atomic force microscope, the cost of the two types of microscopes is high, a sample needs to be manufactured when the microscope is used, and the micro-nano particle cannot be operated on line. With the development of optical fiber technology, jamaicarmy et al have disclosed methods and apparatus for fiber measurement of particle diameter, patent application No.: CN90102821.5, directly transmitting the signals transmitted by a plurality of optical fibers in the optical fiber probe to the particles to be measured, then transmitting the signals to the photoelectric conversion element by the optical fibers in the optical fiber receiving device arranged on the optical fiber probe, and calculating the particle diameter distribution by computer collection.
The manipulation of the particles at a certain position can be calibrated and monitored according to the intensity of the reflected light of the particles, Hongbao Xin and the like process optical fibers into probes with special shapes so as to capture single upconversion nanoparticle bacteria and carry out labeling (Small2017,13, 1603418), the article labels and analyzes the bacteria, and the size of the particles cannot be accurately measured according to the intensity of the light; yuchao Li et al proposed that the particle size of the captured particles could not be resolved by using the intensity of the reflected light to calibrate the particle capture, which is generated by assembling micro-lenses on the fiber probe to generate parallel photon Nano-jet array capture device to contact and detect the Nano-particles and cells (ACS Nano 2016,10, 5800-. The capturing technology of the micro-nano particles based on the optical fiber provides technical basis for accurately measuring the particle size of the micro-nano particles.
According to the principle of light interference, the intensity of interference light changes as a cosine function with the change of optical path difference. Therefore, a plurality of discrete areas exist, the interference light intensity has certain monotonicity in the range of optical path difference change, and the measurement precision can reach the size fluctuation range of the micro-nano particles at the wavelength level by utilizing the light intensity. By combining the technologies, the optical fiber optical tweezers based on the optical fiber are used as the optical fiber probe, the optical fiber reflected light of the optical fiber probe and the reflected light of the micro-nano particles form double-beam interference to generate interference signals, and the particle size change of the micro-nano particles in a certain range is calculated by using the intensity of the interference light signals, so that the novel high-precision particle size measuring device and the novel high-precision particle size measuring method based on the optical fiber optical tweezers are realized.
Disclosure of Invention
The invention aims to provide a high-precision particle size measuring device and a high-precision particle size measuring method based on optical fiber tweezers.
The invention is realized by the following steps:
a high-precision particle size measuring device based on optical tweezers comprises: the device comprises a laser 1, a data acquisition and processing system 2, an optical fiber circulator 3 and an optical fiber probe 4, wherein the laser 1 is connected with an input port 3-1 of the optical fiber circulator, the optical fiber probe 4 is connected with an output port 3-2 of the optical fiber circulator 3, and the data acquisition and processing system 2 is connected with a reflection output port 3-3 of the optical fiber circulator 3.
The optical fiber probe 4 is an optical fiber optical tweezers for capturing particles to be detected, and the optical fiber probe 4 is one of an optical fiber optical tweezers of a single-mode optical fiber superposed lens, an optical fiber optical tweezers formed by single-mode optical fiber corrosion or fused biconical taper, a special optical fiber optical tweezers based on a multi-core optical fiber, a nano optical tweezers based on an optical fiber evanescent field principle, or a nano array optical fiber optical tweezers based on an interference principle.
A high-precision particle size measuring method based on optical tweezers comprises the following steps:
(1) laser emitted by the laser is transmitted to a fiber probe for capturing particles through the circulator;
(2) reflected light of the end face of the optical fiber probe interferes with the captured reflected light of the particles to be detected, and interference light signals are transmitted to a data acquisition system through a circulator;
(3) the intensity of the interference light signal changes along with the change of the optical path difference, so that the change of the particle size of the standard particles within a certain range can be calculated and measured by using the intensity of the interference light signal.
In the step (2), the reflected light of the end face of the optical fiber probe interferes with the captured reflected light of the particles to be detected, and the detected light intensity signal I' can be expressed as
Wherein, I1'is reflected light intensity of end face of optical fiber probe, I'2Is the reflected light intensity of the particle to be measured, and delta is the light beam I1'and beam I'2The optical path difference of the light beam interference is 2d, d is the distance between the particle capture position and the optical fiber probe, λ is the wavelength of the laser in vacuum, n is the background refractive index, and pi is the phase difference caused by half-wave loss of the light beam when the surface of the particle is reflected.
In the step (3), the particle size of the particles can be measured by distinguishing the particle size variation range Deltar
The invention has the beneficial effects that: according to the invention, the change of the particle size of the micro-nano particles can be detected on line in real time by using the reflective double-beam interference based on the optical tweezers; the invention adopts the optical tweezers, so that the particle detection operation is more flexible and free, the cost is low, and the integration and miniaturization are convenient; the invention adopts the interference light intensity as the particle size detection standard, can accurately detect the particle size change smaller than the wavelength range, and the accuracy can reach the nanometer level.
Drawings
FIG. 1a is a schematic diagram of a high-precision particle size measuring device for optical fiber tweezers based on single-mode fiber sticky balls;
FIG. 1b is a partial enlarged view of a high-precision fiber optical tweezers particle size measuring device based on single-mode fiber sticky balls;
FIG. 2 is a schematic diagram of the distance between the fiber probe and the particle for detecting particles with different particle sizes;
FIG. 3 is a schematic diagram showing the intensity of interference signals varying with the optical path difference δ between the reflected light from the end face of the optical fiber and the reflected light from the particles to be measured;
FIG. 4 is a diagram showing the signal intensity of the interference light reflected by the standard particle;
FIG. 5 is a diagram illustrating the comparison between the reflected interference light intensity of the particles to be measured and the reflected interference light intensity of the standard particles;
FIG. 6 is a schematic diagram of the numbering of an axisymmetric three-core optical fiber and a core;
FIG. 7 is a schematic diagram of a micro-machined three-core fiber symmetrical wedge and total reflection converging light beam;
FIG. 8 is a schematic diagram of a three-core fiber-based fiber optical tweezers high-precision particle size measuring device.
Detailed Description
Description of reference numerals: the device comprises a laser 1, a data acquisition and processing system 2, a fiber-optic circulator 3-1 input port, a fiber-optic circulator 3-2 output port, a fiber-optic circulator 3-3 reflection output port, a fiber-optic probe 4-1 optical path channel, a fiber-optic probe 4-2 needle, particles to be detected 5, a fiber-optic coupler 6, a three-core fiber-optic coupler 7 and three-core fiber-optic tweezers 8.
The present invention will be described in further detail with reference to the accompanying drawings.
The invention belongs to the technical field of optical precision measurement, and particularly relates to a high-precision particle size measuring device and method based on optical tweezers.
The invention aims to provide a high-precision particle size detection device based on optical fiber tweezers, and further aims to provide a high-precision particle size measurement method based on optical fiber tweezers. The invention utilizes the intensity of the optical tweezers back reflection interference light intensity to measure the particle size change of the micro-nano particles within a certain range.
The purpose of the invention is realized as follows:
the high-precision particle size measuring device based on the optical fiber tweezers comprises a laser, a data acquisition and processing system, an optical fiber circulator and an optical fiber probe. The laser is connected with the input port of the optical fiber circulator, the optical fiber probe is connected with the output port of the optical fiber circulator, and the data acquisition system is connected with the reflection output port of the optical fiber circulator. The laser injected into the input port of the optical fiber circulator by the laser is output to the optical fiber probe from the output port of the optical fiber circulator, the optical fiber probe is used for capturing particles to be detected and transmitting interference light, reflected light on the end face of the optical fiber probe interferes with the captured reflected light of the particles to be detected, interference light signals are transmitted to a connected data acquisition system through the circulator, and because the intensity of the interference light signals changes along with the change of optical path difference, the change of the particle size of standard particles within a certain range can be measured and calibrated by utilizing the intensity of the interference light signals.
The optical fiber probe is an optical fiber optical tweezers for capturing particles to be detected, can transmit laser signals for obtaining interference and receive and transmit interference optical signals of reflected light at an optical fiber end and reflected light on the surface of the particles, and can be an optical fiber optical tweezers of a single-mode optical fiber superposition lens, an optical fiber optical tweezers formed by single-mode optical fiber corrosion or fused biconical taper, a special optical fiber optical tweezers based on a multi-core optical fiber, a nano optical tweezers based on an optical fiber evanescent field principle and a nano array optical fiber optical tweezers based on an interference principle.
The range delta r of the particle size change of the standard particles is measuredλ is the wavelength of the laser source used and n is the ambient refractive index.
The high-precision particle size measuring method based on the fiber optical tweezers is characterized in that laser emitted by a laser is transmitted to a fiber probe for capturing particles through a circulator, reflected light on the end face of the fiber probe interferes with the captured reflected light of particles to be measured, interference optical signals are transmitted to a data acquisition system through the circulator, and the intensity of the interference optical signals changes along with the change of optical path difference, so that the intensity of the interference optical signals can be used for calculating, measuring and calibrating the particle size change of standard particles within a certain range.
When the optical fiber probe captures the micro-nano particles, the optical fiber reflected light of the optical fiber probe and the reflected light of the micro-nano particles generate double-beam interference, and the interference light signal intensity is determined by the optical path difference between the reflected light of the optical fiber probe and the reflected light of the nano particles. Specifically, in the present invention, under the action of the optical tweezers with the determined capturing position, the optical path difference between the reflected light from the micro-nano particles and the reflected light from the optical fiber probe is determined by the particle diameters with different particle diameters, so that the change in the particle diameter of the micro-nano particles can be calculated by using the intensity of the interference light signal, which is explained in detail below.
When the fiber probe captures particles, the intensity of the reflected light on the fiber end face of the fiber probe is I as shown in FIG. 1, 6-11'the spherical surface reflected light beam 6-2 of the captured particles is I'2,I1'and I'2Two beams interfere, and the detected light intensity signal I' can be expressed as
Phi is the phase difference of the two beams, in which case phi can also be expressed as
Delta is the beam I1'and beam I'2The optical path difference of the light beam interference is generated, delta is 2d, d is the distance between the particle capture position and the optical fiber probe, lambda is the wavelength of the laser in vacuum, n is the background refractive index, and pi is the phase difference caused by half-wave loss of the light beam when the surface of the particle is reflected.
When the micro-nano particles are measured, the reflection interference light intensity is
Because the central position of the particles captured by the optical fiber probe is unchanged, when the diameters of the small spheres are different, the optical path difference delta between the reflected light of the end face of the optical fiber and the reflected light of the micro-nano particles is changedIn the variation, as shown in the formula (3), the light intensity at the rising edge or the falling edge of a certain cosine function changes monotonically with the optical path difference δ, and different optical path differences δ correspond to different signal intensities, that is, the range of the particle size variation of different particles which can be measured with resolution is as follows
As shown in FIG. 2, because the particles with different diameters in the same converged light field are captured at the same position, and because the particles with different diameters are different in size, the optical path difference between the reflected light from the end face of the fiber probe and the micro-nano particles is delta1=2d1n and delta2=2d2n。
The intensity of the interference signal varies with the optical path difference δ between the light reflected by the end face of the optical fiber and the light reflected by the trapped particle, and as shown in fig. 3, the intensity of the interference signal varies periodically with the variation of the optical path difference δ. According to the periodical change of the interference signal intensity along with the optical path difference delta in fig. 3, the change of the particle size can be obtained through the interference signal intensity, and the radius change range Deltar of the particles to be detected can be identified as
The invention is further described below.
The invention measures and calibrates the particle size change of the standard particles within a certain range by calculating the intensity of interference signals of the reflected light of the optical fiber probe and the reflected light of the particles to be measured. The realization process is shown in figure 1, and comprises a laser 1, a data acquisition processing system 2, an optical fiber circulator 3 and an optical fiber probe 4, wherein the laser 1 is connected with an input port 3-1 of the optical fiber circulator 3, the optical fiber probe 4 is connected with an output port 3-2 of the optical fiber circulator 3, the data acquisition system 2 is connected with a reflection output port 3-3 of the optical fiber circulator 3, the laser 1 injects laser into the port 3-1 of the optical fiber circulator and is output to the optical fiber probe 4 from the port 3-2 of the optical fiber circulator 3, the optical fiber probe 4 is used for capturing particles to be detected and transmitting interference light, the reflected light of the end surface of the optical fiber probe interferes with the captured reflected light of the particles to be detected, the interference light signal is transmitted to the data acquisition system 2 connected with the port 3-3 of the circulator through the port 3-2 of the optical fiber circulator, as shown in figure 3, the intensity of the interference light signal, and calculating, measuring and calibrating the particle size change of the standard particles within a certain range by utilizing the signal intensity of the interference light.
According to the above principle and structure, the present invention can be realized by:
in the first embodiment, the particle size measuring device based on the single-mode fiber strong converging optical tweezers structure comprises:
1. intercepting a 980nm single-mode fiber with the length of about 1m, processing two ends of the single-mode fiber, cutting the single-mode fiber flatly by using a fiber cutter, controlling one end of the fiber stained with ultraviolet glue to be in axisymmetric adhesion with a silica sphere by using a micro-displacement operation platform, and converging light beams output by the single-mode fiber according to an optical field lens convergence technology to form a fiber optical tweezers probe.
2. A 980nm laser source is welded and coupled with an input port of the optical fiber circulator with the same waveband, an output end of the circulator is welded and coupled with one end of the non-bonded silica ball of the optical fiber optical tweezers probe manufactured in the step 1, and a return output port of the circulator is connected with a photoelectric detector data acquisition system to complete the connection of the optical fiber light path as shown in the figure 1.
3. The fiber optical tweezers probe is put into the deionized water containing the polystyrene with the calibrated standard particle diameter of 5 microns, the 980nm laser is started, the fiber optical tweezers probe is operated to capture the polystyrene sphere, the reflected light of the fiber end face of the fiber optical tweezers probe and the reflected light of the polystyrene sphere return to the fiber, and the reflected light are transmitted to the photoelectric detector data acquisition system through the circulator, so that the light intensity is displayed. As shown in FIG. 4, the calibrated 5 μm polystyrene standard particle reflects the interference light signal intensity, the ordinate represents the reflected interference light signal intensity, and the abscissa represents the signal acquisition time, so as to calculate the particle size of the 5 μm polystyrene sphere to be measured, which is not precisely calibrated, based on the signal intensity.
4. Putting the same fiber optical tweezers probe in the step 3 into deionized water containing 5-micron-diameter polystyrene spheres which are not accurately calibrated, and capturing and observing the intensity of the interference light signal of the contrast reflection light in the same way as in the step 3 for the polystyrene particlesAs shown in FIG. 5, the reflected interference light intensity I of the particle 0 to be measured is shown0The reflection interference light intensity I of the particles 1 to be measured1The reflection interference light intensity I of the particles 2 to be measured2The reflection interference light intensity I of the particles 3 to be measured3The reflected interference light intensity I of the particles 4 to be measured4Finally, the particle size of the particles to be measured is calculated by comparing the size of the reflected interference light intensity of the standard particles shown in FIG. 4, so as to reach the range of calibrating the particle size change of the polystyrene with the diameter of 5 μm.
Example two: the high-precision fiber optical tweezers particle size measuring device based on the three-core fiber comprises the following steps:
1. the axisymmetric three-core optical fiber with the length of about 1m as shown in fig. 6 is intercepted, the three-core optical fiber is ground into symmetrical wedge-shaped optical fiber optical tweezers as shown in fig. 7 by using a fiber end surface micromachining method, and the optical fiber light beams are converged on an optical axis for transmitting the light beams of the middle optical fiber core in a total reflection mode.
2. The optical path shown in the figure 8 is connected, light emitted by a 980nm laser 1 is connected with a three-core optical fiber coupler 7 through a 1 x 3 optical fiber coupler 6 with the splitting ratio of 1:0.1:1, an output optical fiber with the large splitting ratio of the 1 x 3 optical fiber coupler is connected with input optical fibers with the numbers ① and ③ of the three-core optical fiber coupler in the figure 8 and finally input into the numbers ① and ③ of the fiber cores of the three-core optical fiber coupler in the figure 6 to achieve the effect of high-power laser particle capture of the three-core optical fiber tweezers 8, the output optical fiber end with the small splitting ratio of the 1 x 3 optical fiber coupler is connected with an input optical fiber with the number ② of the three-core optical fiber coupler and finally transmitted into the middle fiber core with the number ② of the fiber core of the three-core optical fiber in the figure 6, reflected light of the fiber and reflected light of captured particles are transmitted to a photoelectric detector data acquisition system 2 through the annular fiber in the middle fiber ②, the output optical fiber of the three-core optical fiber coupler is in accordance with the type used in the step 1 and is connected with an optical fiber clamp, and an output optical fiber fusion splicer with an optical fiber with a processing machine with the output optical fiber end of the three-core, and an output optical fiber clamp, and an optical fiber end of a three-core optical fiber fusion-core.
3. The fiber optical tweezers probe manufactured in the step 1 is put into deionized water containing polystyrene with the calibrated standard particle diameter of 5 microns according to the method in the step 3 of the embodiment, a 980nm laser is turned on, the fiber optical tweezers probe is operated to capture the polystyrene spheres by using the converged light of the outer double cores, the reflected light of the fiber end surface of the fiber optical tweezers probe and the reflected light of the polystyrene spheres return to the middle core of the three-core fiber, and the reflected light of the polystyrene spheres are transmitted to a photodetector data acquisition system through a three-core fiber coupler and a fiber circulator, so that the intensity of light is displayed. And calibrating the signal intensity of the interference light reflected by the polystyrene standard particles with the size of 5 mu m.
4. In the same way as in step 4 of the embodiment, the reflected interference light signal intensity of the polystyrene with the diameter of 5 μm which is not precisely calibrated is obtained, and the size of the particle to be measured is finally calculated by comparing the light intensity with that of the standard particle, so as to calibrate the particle size variation range of the polystyrene with the diameter of 5 μm.
In summary, the present invention relates to a novel high-precision particle size measuring apparatus and method based on fiber optical tweezers. The high-precision particle size measuring device based on the optical fiber optical tweezers comprises a laser 1, a data acquisition and processing system 2, an optical fiber circulator 3 and an optical fiber probe 4, wherein the laser is connected with an input port 3-1 of the optical fiber circulator, the optical fiber probe is connected with an output port 3-2 of the optical fiber circulator, and the data acquisition system is connected with a reflection output port 3-3 of the optical fiber circulator. The method comprises the steps that light of a port 3-1 of an optical fiber circulator is injected by a laser, the light is output to an optical fiber probe through the port 3-2 of the optical fiber circulator, the optical fiber probe is used for capturing particles to be detected, reflected light of the end face of the optical fiber probe interferes with reflected light of the captured particles, interference light signals are transmitted to a port 3-3 of the circulator through the port 3-2 of the optical fiber probe to be processed through a data acquisition processing system 2, and the particle size change of the captured particles in a certain range can be calculated by means of the intensity of the interference light signals as the intensity of the interference light signals changes along with the change of optical path difference. The method for measuring and calibrating the particle size of the captured particles by utilizing the strength of the optical fiber optical tweezers back-reflecting interference signals is a novel method for measuring the particle size of the microparticles, the change range of the particle size of the calibrated standard particles can be flexibly and freely measured on line in real time at high precision by using a reflecting type single optical fiber structure, and the method has the advantages of simple structure, easy realization of integration, low cost and high measurement precision.
Claims (5)
1. A high-precision particle size measuring device based on optical tweezers comprises: laser instrument 1, data acquisition processing system 2, optic fibre circulator 3, fiber probe 4, characterized by: the laser 1 is connected with an input port 3-1 of the optical fiber circulator, the optical fiber probe 4 is connected with an output port 3-2 of the optical fiber circulator 3, and the data acquisition and processing system 2 is connected with a reflection output port 3-3 of the optical fiber circulator 3.
2. The high-precision particle size measuring device based on the optical tweezers of the optical fiber as claimed in claim 1, wherein: the optical fiber probe 4 is optical fiber tweezers for capturing particles to be detected, and the optical fiber probe 4 is single-mode optical fiber stacked lens optical fiber tweezers or optical fiber optical tweezers formed by single-mode optical fiber corrosion or fused biconical taper, or special optical fiber optical tweezers based on multi-core optical fiber, nano optical tweezers based on optical fiber evanescent field principle, or nano array optical fiber optical tweezers based on interference principle.
3. A high-precision particle size measuring method based on optical tweezers is characterized by comprising the following steps: the method comprises the following steps:
(1) laser emitted by the laser is transmitted to a fiber probe for capturing particles through the circulator;
(2) reflected light of the end face of the optical fiber probe interferes with the captured reflected light of the particles to be detected, and interference light signals are transmitted to a data acquisition system through a circulator;
(3) the intensity of the interference light signal changes along with the change of the optical path difference, so that the change of the particle size of the standard particles within a certain range can be calibrated and measured by utilizing the intensity of the interference light signal.
4. The method for measuring the particle size of the optical tweezers based on the optical fiber according to the claim 3, which is characterized in that: in the step (2), the reflected light of the end face of the optical fiber probe interferes with the captured reflected light of the particles to be detected, and the detected light intensity signal I' can be expressed as
Wherein, I1'is reflected light intensity of end face of optical fiber probe, I'2Is the reflected light intensity of the particle to be measured, and delta is the light beam I1'and beam I'2The optical path difference of the light beam interference is generated, delta is 2d, d is the distance between the particle capture position and the optical fiber probe, lambda is the wavelength of the laser in vacuum, n is the background refractive index, and pi is the phase difference caused by half-wave loss of the light beam when the surface of the particle is reflected.
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CN111913230A (en) * | 2020-06-12 | 2020-11-10 | 浙江大学 | Absolute gravimeter based on vacuum optical tweezers and measuring method |
CN111913230B (en) * | 2020-06-12 | 2022-02-01 | 浙江大学 | Absolute gravimeter based on vacuum optical tweezers and measuring method |
CN113238075A (en) * | 2021-04-22 | 2021-08-10 | 哈尔滨工程大学 | Flow velocity meter based on optical fiber tweezers technology |
CN113238075B (en) * | 2021-04-22 | 2023-02-14 | 哈尔滨工程大学 | Flow velocity meter based on optical fiber tweezers technology |
CN114544434A (en) * | 2022-02-25 | 2022-05-27 | 天津大学 | Method for measuring diameter of liquid drop based on single conical optical fiber probe |
CN114544434B (en) * | 2022-02-25 | 2023-09-26 | 天津大学 | Method for measuring droplet diameter based on single conical optical fiber probe |
CN114593689A (en) * | 2022-03-08 | 2022-06-07 | 深圳迈塔兰斯科技有限公司 | Optical fiber end face detection method and device |
CN114593689B (en) * | 2022-03-08 | 2024-04-09 | 深圳迈塔兰斯科技有限公司 | Optical fiber end face detection method and device |
CN117647470A (en) * | 2024-01-29 | 2024-03-05 | 之江实验室 | Device for measuring far field of scattered field based on suspended optical tweezers and reciprocity theorem and application thereof |
CN117647470B (en) * | 2024-01-29 | 2024-06-07 | 之江实验室 | Device for measuring far field of scattered field based on suspended optical tweezers and reciprocity theorem and application thereof |
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