CN110781041A - Server mainboard test method, system and equipment - Google Patents
Server mainboard test method, system and equipment Download PDFInfo
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- CN110781041A CN110781041A CN201910895557.9A CN201910895557A CN110781041A CN 110781041 A CN110781041 A CN 110781041A CN 201910895557 A CN201910895557 A CN 201910895557A CN 110781041 A CN110781041 A CN 110781041A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2284—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
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- General Physics & Mathematics (AREA)
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- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The invention provides a method, a system and equipment for testing a server mainboard, which comprise the following steps: defining a pin control type for controlling a power supply of a test server, wherein the control type comprises a system switching function and a power supply switching function; acquiring the current state of a test server system; and calling the pin needle to switch the power-on and power-off states of the test server through the ITS Hub according to the current state of the system and the control type of the pin needle. The invention not only can save manpower, but also has stronger controllability and practicability of a visual operation interface. In addition, the method can be applied to various operating systems and has universality.
Description
Technical Field
The invention relates to the technical field of server testing, in particular to a method, a system and equipment for testing a server mainboard.
Background
With the development of technology, servers are widely used in various fields, and the testing work of the servers is mostly to simulate problems that may occur during the use process of a client. The mainboard up/down alternating current test is used for preventing a server from being started normally after a client is powered off when the client is in use. The test requires the mainboard to run on/off alternating current for at least 500 times or 12 hours, and the traditional manual test method is a great waste of manpower. Therefore, a simple and easy method is needed to automatically circulate the ac power on/off the motherboard.
Disclosure of Invention
In view of the above-mentioned deficiencies of the prior art, the present invention provides a method, a system and a device for testing a server motherboard to solve the above-mentioned technical problems.
In a first aspect, the present invention provides a method for testing a server motherboard, including:
defining a pin control type for controlling a power supply of a test server, wherein the control type comprises a system switching function and a power supply switching function;
acquiring the current state of a test server system;
and calling the pin needle to switch the power-on and power-off states of the test server through the ITS Hub according to the current state of the system and the control type of the pin needle.
Further, the calling the pin needle to switch the power-on and power-off states of the test server through the ITS Hub according to the current state of the system and the control type of the pin needle comprises:
if the current test server system is in a power-on state, a power-off command is issued to a system switching function pin needle to control the test server to be powered off;
and when the shutdown state duration of the server system to be tested reaches the preset shutdown time, calling an INPUT simple operation on the ITS Hub to send a power-down command to a pin needle of the power supply switching function of the test server, and controlling the test server to power down.
Further, the calling the pin needle to switch the power-on and power-off states of the test server through the ITS Hub according to the current state of the system and the control type of the pin needle comprises:
if the current test server system is in a shutdown state, an INPUT SIMULATO on the ITS Hub is called to issue a power-on command to a pin needle of a power supply switching function of the test server, and the test server is controlled to be powered on;
and when the duration time of the power-on state reaches the preset starting time, a starting command is issued to a system switching function pin needle to control the test server to start.
In a second aspect, the present invention provides a server motherboard testing system, including:
the state defining unit is configured for defining a pin control type for controlling a power supply of the test server, wherein the control type comprises a system switching function and a power supply switching function;
the state acquisition unit is configured to acquire the current state of the test server system;
and the state switching unit is configured for calling the pin needle to switch the power-on and power-off states of the test server through the ITS Hub according to the current state of the system and the control type of the pin needle.
Further, the state switching unit includes:
the shutdown module is configured to control the test server to shutdown by issuing a shutdown command to the system switching function pin if the current test server system is in a startup state;
and the power-off module is configured to call an INPUT simple operation on the ITS Hub to send a power-off command to the pin of the power supply switching function of the test server when the duration of the power-off state of the server system to be tested reaches the preset power-off time, so as to control the test server to power off.
Further, the state switching unit includes:
the power-on module is configured to call INPUT simple operation on the ITS Hub to issue a power-on command to a pin needle of a power supply switching function of the test server and control the test server to be powered on if the current test server system is in a power-off state;
and the starting module is configured to control the test server to start by issuing a starting command to the system switching function pin when the duration of the power-on state reaches a preset starting time.
In a third aspect, an apparatus is provided, comprising: the control server is in communication connection with the ITSHub; the COM port of the ITS Hub is connected with the COM port of the main board of the test server, and the INPUTSIMULATO on the ITS Hub is connected with the pin of the test server; and the ITS Hub alternating current output end is connected with a Power Port of the test server.
Further, the control server executes the server motherboard testing method of the first aspect.
The beneficial effect of the invention is that,
according to the server mainboard test method, system and equipment provided by the invention, the script is operated at the working machine end to transmit the command to the ITS Hub, so that the Power Button and the Power Port of the server are controlled, and the on/off and the AC on/off actions of the server are realized. The invention not only can save manpower, but also has stronger controllability and practicability of a visual operation interface. In addition, the method can be applied to various operating systems and has universality.
In addition, the invention has reliable design principle, simple structure and very wide application prospect.
Drawings
In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present invention, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the invention.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In order to facilitate understanding of the present invention, the server motherboard testing method provided by the present invention is further described below with reference to the principle of the server motherboard testing method of the present invention and the process of testing the server motherboard in the embodiments.
The server mainboard test equipment provided by the embodiment comprises a control server and an ITS Hub, wherein the control server and the ITS Hub are connected together through a USB cable. The COM port on the Main Board of the test server and the COM port of the ITSHub are connected together through a serial port line. The PIN of the Power Button of the test server and the INPUT simple ato on ITS Hub are connected together by a communication cable. The Power ports of the test server and the AC outputs of the ITS Hub are connected together by a Power cord. And powering on the ITS Hub, and controlling the server to open ITS Client Manager software to confirm the connection state. And under the condition that the connection state is normal, importing an alternating current test script on/off the mainboard, and setting the script cycle running frequency to be 500 times (the script cycle running time can also be set to be 12 hours). And setting a Restore ACPower Loss option under the test server Setup as Power on, and entering the OS to clear the Log after saving and restarting. And the generated Log is transmitted to the ITS Hub through a serial port line and then transmitted to the control server by the ITS Hub. And (4) running the test script, stopping the system at the OS after the script is run, allowing a tester to check the Log, and outputting a test report by the ITS Client Manager software end to reflect whether the test is run successfully.
Referring to fig. 1, specifically, the server motherboard testing method includes:
and S1, defining pin control types for controlling the power supply of the test server, wherein the control types comprise a system switching function and a power supply switching function.
The system switching function of the pin is defined as 1, and the power supply switching function is defined as 2. The different function types correspond to different function pins.
And S2, acquiring the current state of the test server system.
And judging the current state of the test server system through the collected logs of the test server.
And S3, calling the pin needle to switch the power-on and power-off states of the test server through the ITS Hub according to the current state of the system and the control type of the pin needle.
If the system state of the test server is the starting state, calling a system switching function pin needle, sending a shutdown command to the system switching function pin needle through the ITS Hub, and calling an INPUT SIMULATO on the ITS Hub to send a power-down command to the test server power supply switching function pin needle after the shutdown time of the server to be tested reaches the preset waiting time so as to power down the test server.
And if the system state of the test server is a shutdown state, calling INPUT SIMULATO on the ITS Hub to issue a power-on command to a pin of the power supply switching function of the test server, so that the test server is powered on. And after the power-on duration time reaches the preset time, issuing a power-on command to the system switching function pin needle to control the test server to be powered on.
And circularly executing the steps S2-S3, storing the test logs acquired each time, and summarizing all the test logs when the circulating times reach a preset number (such as 500 times) so as to facilitate the analysis of the test results by testers.
The script code of this embodiment is as follows:
the server motherboard test provided by this embodiment includes:
the state defining unit is configured for defining a pin control type for controlling a power supply of the test server, wherein the control type comprises a system switching function and a power supply switching function;
the state acquisition unit is configured to acquire the current state of the test server system;
and the state switching unit is configured for calling the pin needle to switch the power-on and power-off states of the test server through the ITS Hub according to the current state of the system and the control type of the pin needle.
Optionally, as an embodiment of the present invention, the state switching unit includes:
the shutdown module is configured to control the test server to shutdown by issuing a shutdown command to the system switching function pin if the current test server system is in a startup state;
and the power-off module is configured to call an INPUT simple operation on the ITS Hub to send a power-off command to the pin of the power supply switching function of the test server when the duration of the power-off state of the server system to be tested reaches the preset power-off time, so as to control the test server to power off.
Optionally, as an embodiment of the present invention, the state switching unit includes:
the power-on module is configured to call INPUT simple operation on the ITS Hub to issue a power-on command to a pin needle of a power supply switching function of the test server and control the test server to be powered on if the current test server system is in a power-off state;
and the starting module is configured to control the test server to start by issuing a starting command to the system switching function pin when the duration of the power-on state reaches a preset starting time.
In the embodiments provided by the present invention, it should be understood that the disclosed system, system and method can be implemented in other ways. For example, the above-described system embodiments are merely illustrative, and for example, the division of the units is only one logical functional division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, systems or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
Although the present invention has been described in detail by referring to the drawings in connection with the preferred embodiments, the present invention is not limited thereto. Various equivalent modifications or substitutions can be made on the embodiments of the present invention by those skilled in the art without departing from the spirit and scope of the present invention, and these modifications or substitutions are within the scope of the present invention/any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (8)
1. A server mainboard test method is characterized by comprising the following steps:
defining a pin control type for controlling a power supply of a test server, wherein the control type comprises a system switching function and a power supply switching function;
acquiring the current state of a test server system;
and calling the pin needle to switch the power-on and power-off states of the test server through the ITS Hub according to the current state of the system and the control type of the pin needle.
2. The method of claim 1, wherein the calling the pin switch test server to power on and power off states by ITS Hub according to the current system state and the pin control type comprises:
if the current test server system is in a power-on state, a power-off command is issued to a system switching function pin needle to control the test server to be powered off;
and when the shutdown state duration of the server system to be tested reaches the preset shutdown time, calling INPUTSIMULATO on the ITS Hub to send a power-down command to a pin needle of the power supply switching function of the test server, and controlling the test server to power down.
3. The method of claim 1, wherein the calling the pin switch test server to power on and power off states by ITS Hub according to the current system state and the pin control type comprises:
if the current test server system is in a shutdown state, an INPUT SIMULATO on the ITS Hub is called to issue a power-on command to a pin needle of a power supply switching function of the test server, and the test server is controlled to be powered on;
and when the duration time of the power-on state reaches the preset starting time, a starting command is issued to a system switching function pin needle to control the test server to start.
4. A server motherboard testing system, comprising:
the state defining unit is configured for defining a pin control type for controlling a power supply of the test server, wherein the control type comprises a system switching function and a power supply switching function;
the state acquisition unit is configured to acquire the current state of the test server system;
and the state switching unit is configured for calling the pin needle to switch the power-on and power-off states of the test server through the ITS Hub according to the current state of the system and the control type of the pin needle.
5. The system of claim 4, wherein the state switching unit comprises:
the shutdown module is configured to control the test server to shutdown by issuing a shutdown command to the system switching function pin if the current test server system is in a startup state;
and the power-off module is configured to call an INPUT simple operation on the ITS Hub to send a power-off command to the pin of the power supply switching function of the test server when the duration of the power-off state of the server system to be tested reaches the preset power-off time, so as to control the test server to power off.
6. The system of claim 4, wherein the state switching unit comprises:
the power-on module is configured to call INPUTSIMULATO on the ITS Hub to issue a power-on command to a pin needle of a power supply switching function of the test server and control the test server to be powered on if the current test server system is in a shutdown state;
and the starting module is configured to control the test server to start by issuing a starting command to the system switching function pin when the duration of the power-on state reaches a preset starting time.
7. The server mainboard testing equipment is characterized by comprising a control server and an ITS Hub, wherein the control server is in communication connection with the ITS Hub; the COM port of the ITS Hub is connected with the COM port of the main board of the test server, and the INPUT SIMULATO on the ITS Hub is connected with the pin of the test server; and the ITS Hub alternating current output end is connected with a PowerPort of the test server.
8. The apparatus of claim 7, wherein the control server performs the method of any one of claims 1-3.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910895557.9A CN110781041B (en) | 2019-09-21 | 2019-09-21 | Server mainboard test method, system and equipment |
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| CN201910895557.9A CN110781041B (en) | 2019-09-21 | 2019-09-21 | Server mainboard test method, system and equipment |
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| CN110781041A true CN110781041A (en) | 2020-02-11 |
| CN110781041B CN110781041B (en) | 2022-08-12 |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120304011A1 (en) * | 2011-05-23 | 2012-11-29 | Hon Hai Precision Industry Co., Ltd. | Server and power supply test method |
| CN106933710A (en) * | 2017-02-19 | 2017-07-07 | 郑州云海信息技术有限公司 | The method of testing that DC is restarted is carried out to server based on WOL functions |
| CN109117330A (en) * | 2018-07-27 | 2019-01-01 | 郑州云海信息技术有限公司 | A kind of test method, test macro and the relevant apparatus of SSD power-on and power-off |
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2019
- 2019-09-21 CN CN201910895557.9A patent/CN110781041B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120304011A1 (en) * | 2011-05-23 | 2012-11-29 | Hon Hai Precision Industry Co., Ltd. | Server and power supply test method |
| CN106933710A (en) * | 2017-02-19 | 2017-07-07 | 郑州云海信息技术有限公司 | The method of testing that DC is restarted is carried out to server based on WOL functions |
| CN109117330A (en) * | 2018-07-27 | 2019-01-01 | 郑州云海信息技术有限公司 | A kind of test method, test macro and the relevant apparatus of SSD power-on and power-off |
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| CN110781041B (en) | 2022-08-12 |
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