CN110767025A - Teaching device and system - Google Patents
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- CN110767025A CN110767025A CN201911238568.6A CN201911238568A CN110767025A CN 110767025 A CN110767025 A CN 110767025A CN 201911238568 A CN201911238568 A CN 201911238568A CN 110767025 A CN110767025 A CN 110767025A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09B—EDUCATIONAL OR DEMONSTRATION APPLIANCES; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND, DEAF OR MUTE; MODELS; PLANETARIA; GLOBES; MAPS; DIAGRAMS
- G09B9/00—Simulators for teaching or training purposes
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09B—EDUCATIONAL OR DEMONSTRATION APPLIANCES; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND, DEAF OR MUTE; MODELS; PLANETARIA; GLOBES; MAPS; DIAGRAMS
- G09B7/00—Electrically-operated teaching apparatus or devices working with questions and answers
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Abstract
The application provides a teaching device and a system, which can generate a teaching model with faults based on fault sample data of a photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite through a fault introduction module; generating a signal waveform corresponding to the fault sample data based on the fault sample data through a waveform determining module; and displaying the teaching model, the fault sample data and the signal waveform through a teaching module. Compared with a teaching device in the prior art, the fault teaching device can generate a teaching model with a fault through the fault introduction module, generate a waveform signal corresponding to a fault sample through the waveform determination module, visually display the fault for a user, and improve the sense of reality and teaching effect of teaching.
Description
Technical Field
The application relates to the technical field of teaching equipment, in particular to a teaching device and a system.
Background
The photoelectric theodolite is used for measuring flight target track, attitude and the like, and can realize synchronous real-time recording of images of a measured target, and an azimuth angle and a pitch angle at the measuring moment. Due to the complex structure of the photoelectric theodolite, the obstacle removing difficulty of the photoelectric theodolite is high, and the photoelectric theodolite obstacle removing teaching is very important.
However, the existing fault-removing teaching system for the photoelectric theodolite is not perfect, the effect of restoring faults of the photoelectric theodolite is poor, a user cannot intuitively acquire fault information of the photoelectric theodolite, and the obtained teaching effect is poor.
Disclosure of Invention
In view of this, an object of the present application is to provide a teaching device and a teaching system, which can generate a teaching model with a fault through a fault introduction module, and generate a waveform signal corresponding to a fault sample through a waveform determination module, so as to visually display the fault to a user, thereby improving the sense of reality and teaching effect of teaching.
The embodiment of the application provides a teaching device for photoelectric theodolite trouble reappears equipment, the teaching device includes:
the fault introducing module is used for generating a teaching model with faults based on fault sample data of the photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite;
the waveform determining module is used for generating a signal waveform corresponding to the fault sample data based on the fault sample data;
and the teaching module is used for displaying the teaching model, the fault sample data and the signal waveform.
In a possible embodiment, the teaching device further comprises:
the examination module is used for generating examination paper based on the teaching model and the signal waveform and collecting examination paper answers input by a user aiming at the examination paper;
and the settlement module is used for determining the score of the user in the examination based on the test paper answers input by the user and the fault sample data, wherein the score represents the strength of the fault capability of the photoelectric theodolite for the user to eliminate.
In one possible embodiment, the assessment module comprises:
and the test question generating unit is used for generating a plurality of examination questions based on the teaching model, the fault sample data and the signal waveform, wherein the examination questions comprise at least one examination question.
In a possible embodiment, the assessment module further comprises:
the difficulty level determining unit is used for determining the difficulty level of each examination question;
and the examination paper generating unit is used for generating the examination paper based on each examination question and the difficulty degree corresponding to each examination question.
In a possible implementation, the settlement module is specifically configured to:
and determining the score of the examination paper corresponding to the user based on the difficulty degree corresponding to each examination question in the examination paper, the examination paper answer input by the user and the fault sample data.
In a possible implementation manner, the settlement module is specifically configured to, when determining the score of the examination paper corresponding to the user based on the difficulty level corresponding to each examination question in the examination paper, the answer of the examination paper input by the user, and the fault sample data:
determining the accuracy of each examination question answer in the examination paper answers input by the user based on the fault sample data;
determining the score of the user on each examination question based on the accuracy of the answer of each examination question and the difficulty corresponding to the examination question;
and determining the score of the examination paper corresponding to the user based on the score of the user on each examination question.
In a possible implementation, the difficulty level determining unit is specifically configured to:
and determining the difficulty of the examination questions based on a plurality of score samples corresponding to each examination question, the time consumed by the user corresponding to each score sample for the examination questions and the difficulty coefficient of each examination question.
In one possible implementation, the difficulty level determining unit is further configured to:
and determining the difficulty coefficient of the examination questions based on a plurality of score samples corresponding to each examination question.
In a possible embodiment, the difficulty level determining unit is specifically configured to, when determining the difficulty coefficient of the examination question:
respectively determining the number of first scoring samples with scores higher than a first preset threshold value and the number of second scoring samples with scores lower than a second preset threshold value in the plurality of scoring samples corresponding to the examination questions;
determining the difficulty factor based on the first number of scored samples and the second number of scored samples.
The embodiment of the application also provides a teaching system, which comprises the teaching device.
According to the teaching device and the teaching system, the fault introduction module is used for generating a teaching model with faults based on fault sample data of the photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite; generating a signal waveform corresponding to the fault sample data based on the fault sample data through a waveform determining module; and displaying the teaching model, the fault sample data and the signal waveform through a teaching module. Compared with a teaching device in the prior art, the fault teaching device can generate a teaching model with a fault through the fault introduction module, generate a waveform signal corresponding to a fault sample through the waveform determination module, visually display the fault for a user, and improve the sense of reality and teaching effect of teaching.
In order to make the aforementioned objects, features and advantages of the present application more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained from the drawings without inventive effort.
Fig. 1 is a schematic structural diagram illustrating an instructional device provided in an embodiment of the present application;
FIG. 2 is a schematic diagram of another teaching device according to an embodiment of the present application;
fig. 3 shows a second schematic structural diagram of another teaching device provided in the embodiment of the present application;
fig. 4 shows a schematic structural diagram of a teaching system provided in an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. Every other embodiment that can be obtained by a person skilled in the art without making creative efforts based on the embodiments of the present application falls within the protection scope of the present application.
First, an application scenario to which the present application is applicable will be described. The method and the device can be applied to photoelectric theodolite fault reproduction equipment, and the photoelectric theodolite fault elimination teaching is carried out on the user through the photoelectric theodolite fault reproduction equipment.
Before the application is provided, researches show that the conventional fault-removing teaching system for the photoelectric theodolite is not perfect, the effect of reducing faults of the photoelectric theodolite is poor, a user cannot intuitively acquire fault information of the photoelectric theodolite, and the obtained teaching effect is poor.
Based on this, this application embodiment provides a teaching device, can produce the teaching model with trouble through trouble introduction module to through the waveform signal that waveform determination module generation trouble sample corresponds, show the trouble for the user directly perceivedly, promote the sense of reality and the teaching effect of teaching.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a teaching device according to an embodiment of the present disclosure. As shown in fig. 1, a teaching apparatus 100 provided in an embodiment of the present application includes a fault introduction module 101, a waveform determination module 102, and a teaching module 103.
And the fault introducing module 101 is used for generating a teaching model with faults based on fault sample data of the photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite.
In specific implementation, the fault introducing module 101 can add a fault corresponding to the fault sample data to a pre-generated simulation model of the electro-optic theodolite according to the fault sample data to obtain a teaching model with the fault.
The fault sample data comprises attribute information of the photoelectric theodolite fault sample, such as the position of the fault, the phenomenon caused by the fault, the type of the fault and the like. Through the attribute information, the fault can be simulated through the fault reproduction equipment of the photoelectric theodolite and combined with the simulation model to obtain the teaching model.
Furthermore, the simulation model of the photoelectric theodolite can be obtained by performing simulation modeling according to sample data of the photoelectric theodolite.
And a waveform determining module 102, configured to generate a signal waveform corresponding to the fault sample data based on the fault sample data.
In a specific implementation, the waveform determining module 102 may generate a signal waveform of the fault sample data by using a labview or other tool according to the fault sample data, where the signal waveform reflects fault characteristics, such as frequency and wavelength, corresponding to the fault sample data. The user can judge the fault position, the fault type and other related information in the teaching model according to the relation between the signal waveform and the fault sample data, and further enable the user to learn the related knowledge of the fault elimination of the photoelectric theodolite.
A teaching module 103, configured to display the teaching model, the fault sample data, and the signal waveform.
In a specific implementation, the teaching module 103 may display the teaching model, the fault sample data, and the signal waveform to a user in an application mode, and the user may observe the signal waveform of each component by clicking each position of the teaching model, and judge the position and the fault type of the fault occurring in the teaching model by the signal waveform and the phenomenon video in the fault sample data, so as to learn related knowledge.
According to the teaching device provided by the embodiment of the application, a fault introduction module is used for generating a teaching model with faults based on fault sample data of the photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite; generating a signal waveform corresponding to the fault sample data based on the fault sample data through a waveform determining module; and displaying the teaching model, the fault sample data and the signal waveform through a teaching module. Compared with a teaching device in the prior art, the fault teaching device can generate a teaching model with a fault through the fault introduction module, generate a waveform signal corresponding to a fault sample through the waveform determination module, visually display the fault for a user, and improve the sense of reality and teaching effect of teaching.
Referring to fig. 2 and fig. 3, fig. 2 is a schematic structural diagram of a teaching device according to another embodiment of the present application, and fig. 3 is a second schematic structural diagram of the teaching device according to another embodiment of the present application. As shown in fig. 2, an instructional device 200 provided in an embodiment of the present application includes:
and the fault introducing module 201 is used for generating a teaching model with faults based on fault sample data of the photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite.
A waveform determining module 202, configured to generate a signal waveform corresponding to the fault sample data based on the fault sample data.
And the teaching module 203 is used for displaying the teaching model, the fault sample data and the signal waveform.
And the examination module 204 is used for generating examination paper based on the teaching model and the signal waveform and collecting examination paper answers input by the user aiming at the examination paper.
In a specific implementation, the examination module 204 may generate a plurality of examination questions about the fault examination, specifically, for example, "a plurality of faults are present in the teaching model", "the type of the fault in the teaching model", "what kind of fault is reflected in the signal waveform", and the like, for the fault in the teaching model and the signal waveform corresponding to the fault sample data, and then the examination questions are combined into an examination paper for checking the strength of the fault removing capability of the photoelectric theodolite.
And the settlement module 205 is configured to determine a score of the user in the examination based on the examination paper answers input by the user and the fault sample data, where the score represents the strength of the fault capability of the photoelectric theodolite for the user to eliminate.
In a specific implementation, the settlement module 205 may first determine the accuracy of the answer of each examination question input by the user with respect to the fault sample data, determine the score of each examination question, and then determine the score of the whole examination paper according to the score of each examination question and the difficulty of the examination question.
The descriptions of the fault introduction module 201, the waveform determination module 202, and the teaching module 203 may refer to the descriptions of the fault introduction module 101, the waveform determination module 102, and the teaching module 103, and may achieve the same technical effects, which is not described in detail herein.
As shown in FIG. 3, in some embodiments, the assessment module 204 further comprises:
in some embodiments, the assessment module 204 includes:
the test question generating unit 2042 is configured to generate a plurality of examination questions based on the teaching model, the fault sample data, and the signal waveform, where the examination questions include at least one examination question.
In a specific implementation, the test question generating unit 2042 may generate examination questions of multiple fault types for the fault types in the fault sample data, or may generate examination questions of a certain specified type collectively. Therefore, comprehensive examination or centralized training for eliminating faults of the photoelectric theodolite can be realized.
In some embodiments, the assessment module 204 further comprises:
the difficulty level determining unit 2044 is configured to determine the difficulty level of each examination question.
The test paper generating unit 2046 is configured to generate the examination paper based on each examination question and the difficulty level corresponding to each examination question.
In a specific implementation, the difficulty level determining unit 2044 may determine the difficulty level of the test question according to the historical assessment condition of the test question, and according to the actual condition, the test paper generating unit 2046 selects assessment test questions with the same difficulty level or the sum of the difficulty levels within a preset range. For example, one examination paper may include examination questions with a difficulty level higher than a preset threshold, and the average value of the rest of the examination questions may be within a preset range.
In some embodiments, the settlement module 205 is specifically configured to:
and determining the score of the examination paper corresponding to the user based on the difficulty degree corresponding to each examination question in the examination paper, the examination paper answer input by the user and the fault sample data.
In a specific implementation, the settlement module 205 may determine the score of the user on the question through the answer of the test paper and the fault sample data input by the user, and multiply the difficulty level of each examination question by the difficulty level to obtain a comprehensive score of each examination question, where the sum of the total scores of all examination questions is the score of the examination paper corresponding to the user.
In some embodiments, the settlement module 205 is specifically configured to, when determining the score of the examination paper corresponding to the user based on the difficulty level corresponding to each examination question in the examination paper, the answer of the examination paper input by the user, and the fault sample data:
determining the accuracy of each examination question answer in the examination paper answers input by the user based on the fault sample data;
determining the score of the user on each examination question based on the accuracy of the answer of each examination question and the difficulty corresponding to the examination question;
and determining the score of the examination paper corresponding to the user based on the score of the user on each examination question.
In some embodiments, the difficulty level determining unit 2044 is specifically configured to:
and determining the difficulty of the examination questions based on a plurality of score samples corresponding to each examination question, the time consumed by the user corresponding to each score sample for the examination questions and the difficulty coefficient of each examination question.
In specific implementation, the difficulty level determining unit 2044 may obtain a plurality of score samples, where the score samples may be obtained by testing a user group, and the score samples are divided into a high group, a low group, and a middle group according to scores of the score samples. For example, the highest-score 25% of the subjects are taken as the high group (H), the lowest-score 25% of the subjects are taken as the low group (L), and the middle 50% of the subjects are taken as the middle group; respectively solving the ratio of the number of people scoring more than a preset threshold value on the examination questions in the high grouping and the low grouping to the total number of people, and determining a difficulty coefficient according to the two ratios and the number of people in each group; and then according to the average time consumed by the full-scale users for the examination questions and the average time consumed by the full-scale users corresponding to the examination questions with the maximum average time consumed by the full-scale users in all the examination questions, determining the difficulty of the examination questions corresponding to the scoring samples.
Specifically, the difficulty of the examination questions corresponding to the scoring samples can be determined through the following formula:
wherein D is the difficulty of the examination questions corresponding to the scoring sample, T is the average time consumed by the full-scale user aiming at the examination questions in the scoring sample, and T is the average time consumed by the full-scale user aiming at the examination questionsmaxIn order to obtain the average consumption time corresponding to the examination question with the maximum average consumption time of full-scale users in all examination questions, P is a difficulty coefficient, RHFor the number of people in the high group who score on the examination question over the preset threshold, RLThe number of people scoring the assessment test questions to exceed a preset threshold value in the low group is shown, and N is the total number of people in the high group or the low group.
In some embodiments, the difficulty level determining unit 2044 is further configured to:
and determining the difficulty coefficient of the examination questions based on a plurality of score samples corresponding to each examination question.
In some embodiments, the difficulty level determining unit 2044 is specifically configured to, when determining the difficulty level of the examination questions:
respectively determining the number of first scoring samples with scores higher than a first preset threshold value and the number of second scoring samples with scores lower than a second preset threshold value in the plurality of scoring samples corresponding to the examination questions;
determining the difficulty factor based on the first number of scored samples and the second number of scored samples.
According to the teaching device provided by the embodiment of the application, a fault introduction module is used for generating a teaching model with faults based on fault sample data of the photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite; generating a signal waveform corresponding to the fault sample data based on the fault sample data through a waveform determining module; displaying the teaching model, the fault sample data and the signal waveform through a teaching module; and generating an examination paper through an examination module based on the teaching model and the signal waveform, and collecting examination paper answers input by a user aiming at the examination paper. And determining the score of the user in the examination based on the examination paper answers input by the user and the fault sample data through a settlement module. Compared with the teaching device in the prior art, the fault teaching device can generate a teaching model with a fault through the fault introduction module, generate a waveform signal corresponding to a fault sample through the waveform determination module, determine the fault removing capability of a user through the assessment module and the settlement module, visually display the fault for the user, and improve the sense of reality and the teaching effect of teaching.
Referring to fig. 4, fig. 4 is a schematic structural diagram of a teaching system according to an embodiment of the present application. As shown in fig. 4, the teaching system 40 includes the teaching device 41 of any of the above embodiments. The teaching system 40 can control the teaching apparatus 41 and realize the function of the teaching apparatus 41.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the several embodiments provided in the present application, it should be understood that the disclosed system, apparatus and method may be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one logical division, and there may be other divisions when actually implemented, and for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some communication interfaces, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a non-volatile computer-readable storage medium executable by a processor. Based on such understanding, the technical solution of the present application or portions thereof that substantially contribute to the prior art may be embodied in the form of a software product stored in a storage medium and including instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present application, and are used for illustrating the technical solutions of the present application, but not limiting the same, and the scope of the present application is not limited thereto, and although the present application is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope disclosed in the present application; such modifications, changes or substitutions do not depart from the spirit and scope of the exemplary embodiments of the present application, and are intended to be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A teaching device for an electro-optic theodolite fault recurrence apparatus, the teaching device comprising:
the fault introducing module is used for generating a teaching model with faults based on fault sample data of the photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite;
the waveform determining module is used for generating a signal waveform corresponding to the fault sample data based on the fault sample data;
and the teaching module is used for displaying the teaching model, the fault sample data and the signal waveform.
2. Instructional device according to claim 1, characterized in that it further comprises:
the examination module is used for generating examination paper based on the teaching model and the signal waveform and collecting examination paper answers input by a user aiming at the examination paper;
and the settlement module is used for determining the score of the user in the examination based on the test paper answers input by the user and the fault sample data, wherein the score represents the strength of the fault capability of the photoelectric theodolite for the user to eliminate.
3. An educational device in accordance with claim 2, wherein the assessment module comprises:
and the test question generating unit is used for generating a plurality of examination questions based on the teaching model, the fault sample data and the signal waveform, wherein the examination questions comprise at least one examination question.
4. The teaching device of claim 3, wherein the assessment module further comprises:
the difficulty level determining unit is used for determining the difficulty level of each examination question;
and the examination paper generating unit is used for generating the examination paper based on each examination question and the difficulty degree corresponding to each examination question.
5. Teaching apparatus according to claim 4, wherein the settlement module is specifically configured to:
and determining the score of the examination paper corresponding to the user based on the difficulty degree corresponding to each examination question in the examination paper, the examination paper answer input by the user and the fault sample data.
6. The teaching device of claim 5, wherein the settlement module, when determining the score of the examination paper corresponding to the user based on the difficulty level corresponding to each examination question in the examination paper, the answer of the examination paper input by the user, and the fault sample data, is specifically configured to:
determining the accuracy of each examination question answer in the examination paper answers input by the user based on the fault sample data;
determining the score of the user on each examination question based on the accuracy of the answer of each examination question and the difficulty corresponding to the examination question;
and determining the score of the examination paper corresponding to the user based on the score of the user on each examination question.
7. Teaching apparatus in accordance with claim 4, wherein the difficulty level determining unit is specifically configured to:
and determining the difficulty of the examination questions based on a plurality of score samples corresponding to each examination question, the time consumed by the user corresponding to each score sample for the examination questions and the difficulty coefficient of each examination question.
8. Instructional device according to claim 7, characterized in that the difficulty level determination unit is further adapted to:
and determining the difficulty coefficient of the examination questions based on a plurality of score samples corresponding to each examination question.
9. Teaching device according to claim 8, wherein the difficulty level determining unit, when determining the difficulty level of the examination questions, is specifically configured to:
respectively determining the number of first scoring samples with scores higher than a first preset threshold value and the number of second scoring samples with scores lower than a second preset threshold value in the plurality of scoring samples corresponding to the examination questions;
determining the difficulty factor based on the first number of scored samples and the second number of scored samples.
10. Instructional system, comprising an instructional device according to anyone of the claims 1 to 9.
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| CN201911238568.6A CN110767025A (en) | 2019-12-06 | 2019-12-06 | Teaching device and system |
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