CN110767025A - Teaching device and system - Google Patents

Abstract

The application provides a teaching device and system, which can generate a teaching model with faults through a fault introduction module based on fault sample data of a photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite; The fault sample data is used to generate the signal waveform corresponding to the fault sample data; the teaching model, the fault sample data and the signal waveform are displayed through the teaching module. Compared with the teaching device in the prior art, the present application can generate a teaching model with faults through the fault introduction module, and generate a waveform signal corresponding to the fault sample through the waveform determination module, so as to visually display the fault to the user and improve the teaching efficiency. Realism and teaching effectiveness.

Description

A teaching device and system

technical field

The present application relates to the technical field of teaching equipment, and in particular, to a teaching device and system.

Background technique

Photoelectric theodolite is used for the measurement of flight target track and attitude, etc. It can realize the synchronous real-time recording of the image of the measured target, the azimuth angle and the pitch angle at the measurement time. Due to the complex structure of the optoelectronic theodolite, the troubleshooting of the optoelectronic theodolite is very difficult, which is very important for the teaching of optoelectronic theodolite troubleshooting.

However, the current photoelectric theodolite troubleshooting teaching system is not perfect, the effect of restoring the photoelectric theodolite failure is poor, the user cannot intuitively obtain the photoelectric theodolite failure information, and the obtained teaching effect is poor.

SUMMARY OF THE INVENTION

In view of this, the purpose of this application is to provide a teaching device and system, which can generate a teaching model with faults through a fault introduction module, and generate a waveform signal corresponding to a fault sample through a waveform determination module, so as to visually display the fault to the user. , to improve the realism and teaching effect of teaching.

An embodiment of the present application provides a teaching device, which is used in a photoelectric theodolite fault reproduction device, and the teaching device includes:

The fault introduction module is used to generate a teaching model with faults based on the fault sample data of the photoelectric theodolite and the pre-generated simulation model of the photoelectric theodolite;

a waveform determination module, configured to generate a signal waveform corresponding to the fault sample data based on the fault sample data;

The teaching module is used for displaying the teaching model, the fault sample data and the signal waveform.

In a possible implementation, the teaching device further includes:

An assessment module, configured to generate an assessment test paper based on the teaching model and the signal waveform, and collect the test paper answers entered by the user for the assessment test paper;

The settlement module is configured to determine the user's score in the assessment based on the test paper answer input by the user and the fault sample data, wherein the score represents the user's ability to eliminate the failure of the optoelectronic theodolite.

In a possible implementation, the assessment module includes:

The test question generating unit is configured to generate a plurality of examination questions based on the teaching model, the fault sample data and the signal waveform, wherein the examination paper includes at least one examination question.

In a possible implementation, the assessment module further includes:

Difficulty determination unit, used to determine the difficulty of each examination question;

The test paper generating unit is configured to generate the test paper based on each test question and the difficulty level corresponding to each test question.

In a possible implementation manner, the settlement module is specifically used for:

Based on the difficulty level corresponding to each examination question in the examination paper, the answer of the examination paper input by the user, and the fault sample data, the score of the examination paper corresponding to the user is determined.

In a possible implementation, the settlement module determines the score of the examination paper corresponding to the user based on the difficulty level corresponding to each examination question in the examination paper, the answer of the examination paper input by the user, and the fault sample data , specifically for:

Based on the fault sample data, determine the degree of accuracy of the answer to each assessment question in the answer input by the user;

Determine the user's score on the assessment question based on the accuracy of the answer to each assessment question and the corresponding difficulty of the assessment question;

Based on the user's score on each assessment question, the score of the user's corresponding assessment paper is determined.

In a possible implementation manner, the difficulty determination unit is specifically used for:

The difficulty of the assessment question is determined based on the multiple score samples corresponding to each assessment question, the time consumed by the user corresponding to each score sample for the assessment question, and the difficulty coefficient of each assessment question.

In a possible implementation, the difficulty determining unit is further configured to:

Based on a plurality of score samples corresponding to each of the assessment questions, the difficulty coefficient of the assessment question is determined.

In a possible implementation, the difficulty determining unit is specifically used for determining the difficulty coefficient of the examination question:

respectively determining the number of first scoring samples whose scores are higher than the first preset threshold and the number of second scoring samples whose scores are lower than the second preset threshold among the plurality of scoring samples corresponding to the assessment questions;

The difficulty factor is determined based on the first number of scoring samples and the second number of scoring samples.

The embodiment of the present application also provides a teaching system, including the teaching device as described above.

In the teaching device and system provided by the embodiments of the present application, a fault introduction module is used to generate a teaching model with faults based on the fault sample data of the photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite; the waveform determination module is used to determine the fault based on the fault sample data, and generate the signal waveform corresponding to the fault sample data; through the teaching module, display the teaching model, the fault sample data and the signal waveform. Compared with the teaching device in the prior art, the present application can generate a teaching model with faults through the fault introduction module, and generate a waveform signal corresponding to the fault sample through the waveform determination module, so as to visually display the fault to the user and improve the teaching efficiency. Realism and teaching effectiveness.

In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the preferred embodiments are exemplified below, and are described in detail as follows in conjunction with the accompanying drawings.

Description of drawings

In order to illustrate the technical solutions of the embodiments of the present application more clearly, the following drawings will briefly introduce the drawings that need to be used in the embodiments. It should be understood that the following drawings only show some embodiments of the present application, and therefore do not It should be regarded as a limitation of the scope, and for those of ordinary skill in the art, other related drawings can also be obtained according to these drawings without any creative effort.

FIG. 1 shows a schematic structural diagram of a teaching device provided by an embodiment of the present application;

FIG. 2 shows one of the schematic structural diagrams of another teaching device provided by an embodiment of the present application;

FIG. 3 shows the second schematic structural diagram of another teaching device provided by an embodiment of the present application;

FIG. 4 shows a schematic structural diagram of a teaching system provided by an embodiment of the present application.

Detailed ways

In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only It is a part of the embodiments of the present application, but not all of the embodiments. The components of the embodiments of the present application generally described and illustrated in the drawings herein may be arranged and designed in a variety of different configurations. Thus, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the application as claimed, but is merely representative of selected embodiments of the application. Based on the embodiments of the present application, every other embodiment obtained by those skilled in the art without creative work falls within the protection scope of the present application.

First, the applicable application scenarios of this application are introduced. The present application can be applied to the photoelectric theodolite fault reproduction equipment, and through the photoelectric theodolite reproduction equipment, the user can be taught how to troubleshoot the photoelectric theodolite.

It is worth noting that, before this application was filed, it was found through research that the current photoelectric theodolite troubleshooting teaching system was not perfect, the effect of restoring photoelectric theodolite failures was poor, and users could not intuitively obtain the photoelectric theodolite failure information, and the teaching obtained. less effective.

Based on this, the embodiment of the present application provides a teaching device, which can generate a teaching model with faults through a fault introduction module, and generate a waveform signal corresponding to a fault sample through a waveform determination module, so as to visually display the fault to the user and improve teaching. realism and teaching effect.

Please refer to FIG. 1 , which is a schematic structural diagram of a teaching device provided by an embodiment of the present application. As shown in FIG. 1 , the teaching device 100 provided by the embodiment of the present application includes a fault introduction module 101 , a waveform determination module 102 , and a teaching module 103 .

The fault introduction module 101 is used to generate a teaching model with faults based on the fault sample data of the photoelectric theodolite and the pre-generated simulation model of the photoelectric theodolite.

In a specific implementation, the fault introduction module 101 can add faults corresponding to the fault sample data to the pre-generated simulation model of the optoelectronic theodolite according to the fault sample data to obtain a teaching model with faults.

The fault sample data includes attribute information of the photoelectric theodolite fault sample, such as information such as the location of the fault, the phenomenon caused by the fault, and the type of the fault. Through these attribute information, the fault can be simulated by the photoelectric theodolite fault reproduction equipment, and combined with the simulation model to obtain a teaching model.

Further, the simulation model of the photoelectric theodolite can be obtained by simulating modeling according to the sample data of the photoelectric theodolite.

The waveform determination module 102 is configured to generate a signal waveform corresponding to the fault sample data based on the fault sample data.

In a specific implementation, the waveform determination module 102 can generate a signal waveform of the fault sample data by using tools such as labview according to the fault sample data, and the signal waveform reflects the fault characteristics corresponding to the fault sample data, such as frequency and wavelength. According to the relationship between the signal waveform and the fault sample data, the user can judge the fault location, fault type and other related information in the teaching model, so that the user can learn the relevant knowledge of photoelectric theodolite troubleshooting.

The teaching module 103 is used for displaying the teaching model, the fault sample data and the signal waveform.

In a specific implementation, the teaching module 103 can display the teaching model, the fault sample data and the signal waveform to the user by means of an application program. The user can click on various positions of the teaching model to observe the operation of each component. Signal waveform, and through the signal waveform and the phenomenon video in the fault sample data to determine the location of the fault occurred in the teaching model and the type of fault, and learn relevant knowledge.

The teaching device provided by the embodiment of the present application generates a teaching model with faults based on the fault sample data of the photoelectric theodolite and the pre-generated simulation model of the photoelectric theodolite through the fault introduction module; through the waveform determination module, based on the fault sample data , generate the signal waveform corresponding to the fault sample data; display the teaching model, the fault sample data and the signal waveform through the teaching module. Compared with the teaching device in the prior art, the present application can generate a teaching model with faults through the fault introduction module, and generate a waveform signal corresponding to the fault sample through the waveform determination module, so as to visually display the fault to the user and improve the teaching efficiency. Realism and teaching effectiveness.

Please refer to FIG. 2 and FIG. 3 at the same time. FIG. 2 is one of the schematic structural diagrams of the teaching apparatus provided by another embodiment of the present application, and FIG. 3 is the second schematic structural schematic diagram of the teaching apparatus provided by another embodiment of the present application. As shown in FIG. 2 , the teaching device 200 provided by the embodiment of the present application includes:

The fault introduction module 201 is used to generate a teaching model with faults based on the fault sample data of the photoelectric theodolite and the pre-generated simulation model of the photoelectric theodolite.

The waveform determination module 202 is configured to generate a signal waveform corresponding to the fault sample data based on the fault sample data.

The teaching module 203 is used for displaying the teaching model, the fault sample data and the signal waveform.

The assessment module 204 is configured to generate an assessment test paper based on the teaching model and the signal waveform, and collect test paper answers entered by the user for the assessment test paper.

In a specific implementation, the assessment module 204 can generate a plurality of fault assessment test questions for the faults in the teaching model and the signal waveforms corresponding to the fault sample data. Types of faults", "what kind of faults does the signal waveform reflect", etc., and then these examination questions are formed into examination papers to test the user's ability to eliminate faults in the optoelectronic theodolite.

The settlement module 205 is configured to determine the user's score in the assessment based on the test paper answer input by the user and the fault sample data, wherein the score represents the user's ability to eliminate the failure of the optoelectronic theodolite.

In a specific implementation, the settlement module 205 may first determine the accuracy of the answer of each assessment question input by the user relative to the fault sample data, determine the score of each assessment question, and then determine the score of each assessment question and the The difficulty level determines the score of the entire examination paper.

The description of the fault introduction module 201 , the waveform determination module 202 and the teaching module 203 can refer to the descriptions of the fault introduction module 101 , the waveform determination module 102 and the teaching module 103 , and can achieve the same technical effect, which will not be repeated.

As shown in FIG. 3, in some embodiments, the assessment module 204 further includes:

In some embodiments, the assessment module 204 includes:

The test question generating unit 2042 is configured to generate a plurality of examination questions based on the teaching model, the fault sample data and the signal waveform, wherein the examination paper includes at least one examination question.

In a specific implementation, the test question generating unit 2042 may generate examination questions of multiple fault types according to the fault types in the fault sample data, or may generate examination questions of a specified type in a centralized manner. In this way, a comprehensive assessment or centralized training for troubleshooting the photoelectric theodolite can be realized.

In some embodiments, the assessment module 204 further includes:

The difficulty level determination unit 2044 is used for determining the difficulty level of each examination question.

The test paper generating unit 2046 is configured to generate the test paper based on each test question and the difficulty level corresponding to each test question.

In a specific implementation, the difficulty level determining unit 2044 can determine the difficulty level of the test item according to the historical assessment situation of the test question, and according to the actual situation, the test paper generating unit 2046 selects the level of difficulty level or the total level of difficulty level within a preset range. internal examination questions. For example, an assessment test paper may include one assessment question whose difficulty level is higher than a preset threshold, and the average value of the remaining assessment questions may be within the preset range.

In some embodiments, the settlement module 205 is specifically configured to:

Based on the difficulty level corresponding to each examination question in the examination paper, the answer of the examination paper input by the user, and the fault sample data, the score of the examination paper corresponding to the user is determined.

In a specific implementation, the settlement module 205 can determine the user's score on the question through the test paper answers and fault sample data input by the user, and multiply the difficulty of each assessment question by its difficulty to obtain the score of each assessment question. Comprehensive score, the sum of the total scores of all assessment questions is the score of the user's corresponding assessment paper.

In some embodiments, when the settlement module 205 determines the score of the examination paper corresponding to the user based on the difficulty level corresponding to each examination question in the examination paper, the answer of the examination paper input by the user, and the fault sample data, Specifically for:

Based on the fault sample data, determine the degree of accuracy of the answer to each assessment question in the answer input by the user;

Determine the user's score on the assessment question based on the accuracy of the answer to each assessment question and the corresponding difficulty of the assessment question;

Based on the user's score on each assessment question, the score of the user's corresponding assessment paper is determined.

In some embodiments, the difficulty determining unit 2044 is specifically configured to:

The difficulty of the assessment question is determined based on the multiple score samples corresponding to each assessment question, the time consumed by the user corresponding to each score sample for the assessment question, and the difficulty coefficient of each assessment question.

In a specific implementation, the difficulty determination unit 2044 can obtain a plurality of score samples, and the score samples can be obtained by experimenting with user groups. According to the scores of the score samples, the score samples are divided into high group, low group and middle group. For example, the 25% of the subjects with the highest scores are regarded as the high group (H), the 25% of the subjects with the lowest scores are regarded as the low group (L), and the middle 50% of the subjects are regarded as the middle group; In the low group, the ratio of the number of people who scored more than the preset threshold on the assessment question to the total number of people, according to the above two ratios, and the number of people in each group, to determine the difficulty coefficient; and then according to the score samples, the users who got the full score The average time consumed by the assessment questions, and the average consumption time corresponding to the assessment question with the largest average consumption time among all assessment questions for users who have obtained a full score, determine the difficulty of the assessment question corresponding to the score sample.

Specifically, the difficulty of the examination questions corresponding to the score samples can be determined by the following formula:

Among them, D is the difficulty of the assessment question corresponding to the scoring sample, T is the average time consumed by users who have obtained full scores for the assessment question in the scoring sample, and T _max is the average consumption of users who have obtained full scores in all assessment questions. The average consumption time corresponding to the assessment question with the longest time, P is the difficulty coefficient, R _H is the number of people in the high group whose score on this assessment question exceeds the preset threshold, and R _L is the low group whose score on this assessment question exceeds the preset threshold Threshold number of people, N is the total number of high group or low group.

In some embodiments, the difficulty determining unit 2044 is further configured to:

Based on a plurality of score samples corresponding to each of the assessment questions, the difficulty coefficient of the assessment question is determined.

In some embodiments, the difficulty level determination unit 2044 is specifically used for determining the difficulty coefficient of the examination question:

respectively determining the number of first scoring samples whose scores are higher than the first preset threshold and the number of second scoring samples whose scores are lower than the second preset threshold among the plurality of scoring samples corresponding to the assessment questions;

The difficulty factor is determined based on the first number of scoring samples and the second number of scoring samples.

The teaching device provided by the embodiment of the present application generates a teaching model with faults based on the fault sample data of the photoelectric theodolite and the pre-generated simulation model of the photoelectric theodolite through the fault introduction module; through the waveform determination module, based on the fault sample data , generate the signal waveform corresponding to the fault sample data; display the teaching model, the fault sample data and the signal waveform through the teaching module; generate the assessment module based on the teaching model and the signal waveform through the assessment module test paper, and collect the test paper answers entered by the user for the assessment test paper. Through the settlement module, the user's score in the assessment is determined based on the test paper answer input by the user and the fault sample data. Compared with the teaching device in the prior art, the present application can generate a teaching model with faults through the fault introduction module, generate the waveform signal corresponding to the fault sample through the waveform determination module, and determine the user's troubleshooting through the assessment module and the settlement module. Ability to visually display faults to users, improve the realism and teaching effect of teaching.

Please refer to FIG. 4 , which is a schematic structural diagram of a teaching system provided by an embodiment of the present application. As shown in FIG. 4 , the teaching system 40 includes the teaching device 41 in any of the above-mentioned embodiments. The teaching system 40 can control the teaching device 41 and realize the functions of the teaching device 41 .

Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the above-described systems, devices and units may refer to the corresponding processes in the foregoing method embodiments, which will not be repeated here.

In the several embodiments provided in this application, it should be understood that the disclosed system, apparatus and method may be implemented in other manners. The apparatus embodiments described above are only illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components may be combined or Can be integrated into another system, or some features can be ignored, or not implemented. On the other hand, the shown or discussed mutual coupling or direct coupling or communication connection may be through some communication interfaces, indirect coupling or communication connection of devices or units, which may be in electrical, mechanical or other forms.

The units described as separate components may or may not be physically separated, and components displayed as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution in this embodiment.

In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit.

The functions, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a processor-executable non-volatile computer-readable storage medium. Based on this understanding, the technical solution of the present application can be embodied in the form of a software product in essence, or the part that contributes to the prior art or the part of the technical solution. The computer software product is stored in a storage medium, including Several instructions are used to cause a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (Read-Only Memory, ROM), random access memory (Random Access Memory, RAM), magnetic disk or optical disk and other media that can store program codes.

Finally, it should be noted that the above-mentioned embodiments are only specific implementations of the present application, and are used to illustrate the technical solutions of the present application, rather than limit them. The embodiments describe the application in detail, and those of ordinary skill in the art should understand that: any person skilled in the art can still modify the technical solutions described in the foregoing embodiments within the technical scope disclosed in the application. Or can easily think of changes, or equivalently replace some of the technical features; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions in the embodiments of the application, and should be covered in this application. within the scope of protection. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (10)

1. A teaching device for an electro-optic theodolite fault recurrence apparatus, the teaching device comprising:

the fault introducing module is used for generating a teaching model with faults based on fault sample data of the photoelectric theodolite and a pre-generated simulation model of the photoelectric theodolite;

the waveform determining module is used for generating a signal waveform corresponding to the fault sample data based on the fault sample data;

and the teaching module is used for displaying the teaching model, the fault sample data and the signal waveform.

2. Instructional device according to claim 1, characterized in that it further comprises:

the examination module is used for generating examination paper based on the teaching model and the signal waveform and collecting examination paper answers input by a user aiming at the examination paper;

and the settlement module is used for determining the score of the user in the examination based on the test paper answers input by the user and the fault sample data, wherein the score represents the strength of the fault capability of the photoelectric theodolite for the user to eliminate.

3. An educational device in accordance with claim 2, wherein the assessment module comprises:

and the test question generating unit is used for generating a plurality of examination questions based on the teaching model, the fault sample data and the signal waveform, wherein the examination questions comprise at least one examination question.

4. The teaching device of claim 3, wherein the assessment module further comprises:

the difficulty level determining unit is used for determining the difficulty level of each examination question;

and the examination paper generating unit is used for generating the examination paper based on each examination question and the difficulty degree corresponding to each examination question.

5. Teaching apparatus according to claim 4, wherein the settlement module is specifically configured to:

and determining the score of the examination paper corresponding to the user based on the difficulty degree corresponding to each examination question in the examination paper, the examination paper answer input by the user and the fault sample data.

6. The teaching device of claim 5, wherein the settlement module, when determining the score of the examination paper corresponding to the user based on the difficulty level corresponding to each examination question in the examination paper, the answer of the examination paper input by the user, and the fault sample data, is specifically configured to:

determining the accuracy of each examination question answer in the examination paper answers input by the user based on the fault sample data;

determining the score of the user on each examination question based on the accuracy of the answer of each examination question and the difficulty corresponding to the examination question;

and determining the score of the examination paper corresponding to the user based on the score of the user on each examination question.

7. Teaching apparatus in accordance with claim 4, wherein the difficulty level determining unit is specifically configured to:

and determining the difficulty of the examination questions based on a plurality of score samples corresponding to each examination question, the time consumed by the user corresponding to each score sample for the examination questions and the difficulty coefficient of each examination question.

8. Instructional device according to claim 7, characterized in that the difficulty level determination unit is further adapted to:

and determining the difficulty coefficient of the examination questions based on a plurality of score samples corresponding to each examination question.

9. Teaching device according to claim 8, wherein the difficulty level determining unit, when determining the difficulty level of the examination questions, is specifically configured to:

respectively determining the number of first scoring samples with scores higher than a first preset threshold value and the number of second scoring samples with scores lower than a second preset threshold value in the plurality of scoring samples corresponding to the examination questions;

determining the difficulty factor based on the first number of scored samples and the second number of scored samples.

10. Instructional system, comprising an instructional device according to anyone of the claims 1 to 9.

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