CN110739971B - Determination method, device, equipment and medium of ADC sampling point sampling voltage - Google Patents
Determination method, device, equipment and medium of ADC sampling point sampling voltage Download PDFInfo
- Publication number
- CN110739971B CN110739971B CN201911148181.1A CN201911148181A CN110739971B CN 110739971 B CN110739971 B CN 110739971B CN 201911148181 A CN201911148181 A CN 201911148181A CN 110739971 B CN110739971 B CN 110739971B
- Authority
- CN
- China
- Prior art keywords
- signal
- sampling
- pulse signal
- determining
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
The embodiment of the application provides a method, a device, equipment and a medium for determining sampling voltage of an ADC sampling point, wherein an instantaneous pulse signal is sent to the ADC, an input voltage signal is sent to the ADC after a preset time interval, the ADC samples the instantaneous pulse signal and the input voltage signal in sequence to obtain sampling data, a data section corresponding to the instantaneous pulse signal is determined from the sampling data, a sampling point corresponding to the sampling point with the maximum amplitude value in the data section after the preset time interval is used as a sampling starting point of the input voltage signal, and after the sampling starting point is determined, the sampling voltage of each subsequent sampling point of the input voltage signal is determined based on the corresponding relation between the voltage and the time in the input voltage signal. The scheme for determining the voltage of the sampling point provided by the embodiment of the application is simple and efficient, is easy to realize, and can accurately determine the voltage value corresponding to each sampling point.
Description
Technical Field
The embodiment of the application relates to the technical field of signal processing, in particular to a method, a device, equipment and a medium for determining sampling voltage of an ADC sampling point.
Background
An analog-to-digital converter (ADC) is used to convert a continuous-time and continuous-amplitude analog signal into a discrete-time and discrete-amplitude digital signal through 4 processes of sampling, holding, quantizing, and encoding. The sampling rate refers to the number of points collected within a unit time of the ADC. The analog-to-digital conversion process is shown in fig. 1 and fig. 2, fig. 1 is a waveform diagram of a ramp voltage signal sent by a signal generator (the period t2 minus t1 or t5 minus t4 of the ramp voltage signal, and the linear relationship between voltage and time can be set by the signal generator), and fig. 2 is a step-and-line diagram of "digital output value k-sampling point n" of a 12-bit ADC output (the sampling rate of the ADC can be set); when the voltage range of the ramp signal sent by the signal generator is 0-3.3V, the output value range of the ADC is 0-4095.
In daily ADC error data analysis, a specific voltage corresponding to each sampling point needs to be determined. However, in the prior art, because the ADC and the signal generator use different clocks, the time correspondence between the sampling start point of the ADC and the sampling signal is difficult to determine, and therefore the time of each subsequent sampling point corresponding to the sampling signal cannot be determined, and further the specific voltage corresponding to each sampling point cannot be determined. Some schemes provide that the voltage peak value and the zero value of the sampling signal correspond to the ADC digital output peak value and the zero value, so that the time point of the sampling signal corresponding to a peak value sampling point or a zero value sampling point is determined, and further, the specific voltage corresponding to each sampling point is solved according to the 'voltage-time' linear relation of the sampling signal. However, as can be seen from fig. 2, the correspondence relationship between the digital output value of the ADC and the sampling point is a step-broken line relationship, in other words, the digital output value does not uniquely correspond to the sampling point, so the digital output peak value or the zero value of the ADC does not uniquely correspond to the voltage peak value or the zero value of the sampling signal, which may cause the specific voltage corresponding to each sampling point of the ADC to be inaccurate, and thus the above-mentioned scheme is not feasible. A technical solution that can more accurately determine the specific voltage corresponding to each sampling point is desired.
Disclosure of Invention
The embodiment of the application provides a method, a device, equipment and a medium for determining sampling voltage of an ADC sampling point, which are used for accurately determining the sampling voltage corresponding to the ADC sampling point.
A first aspect of the embodiments of the present application provides a method for determining a sampling voltage at an ADC sampling point, where the method includes:
receiving an analog signal input by a signal generating device, wherein the analog signal comprises an instantaneous pulse signal and an input voltage signal which is sent at a preset time interval after the instantaneous pulse signal; acquiring a corresponding relation between voltage and time in the input voltage signal, and acquiring sampling data sampled by the ADC from the analog signal; determining a data segment corresponding to the instantaneous pulse signal from the sampling data, and taking a sampling point corresponding to a sampling point with the maximum amplitude value in the data segment after the interval of the preset time as a sampling starting point of the input voltage signal; and determining the sampling voltage of each sampling point of the input voltage signal after the sampling start point according to the corresponding relation.
In a possible implementation, the determining, from the sampled data, a data segment corresponding to the transient pulse signal may include:
and determining a data segment of the sampled data, wherein the amplitude jump range of the sampled data is larger than a preset threshold value, and the signal duration is smaller than or equal to the preset signal duration, as a data segment corresponding to the instantaneous pulse signal.
In a possible implementation, the determining, from the sampled data, a data segment corresponding to the transient pulse signal may include:
and determining the data segment of which the signal duration is less than or equal to the preset signal duration and the time interval with the next data segment is greater than or equal to the preset time in the sampling data as the data segment corresponding to the instantaneous pulse signal.
In one possible embodiment, the input voltage signal may be a ramp voltage signal.
In a possible embodiment, the transient pulse signal may be any one of the following:
a momentary rising pulse signal and a momentary falling pulse signal.
In one possible embodiment, the transient pulse signal is input into the ADC after the end of the previous input voltage signal.
A second aspect of the embodiments of the present application provides a sampling voltage determination apparatus, including:
the receiving module is used for receiving an analog signal input by the signal generating device, wherein the analog signal comprises an instantaneous pulse signal and an input voltage signal which is sent at a preset time interval after the instantaneous pulse signal.
And the acquisition module is used for acquiring the corresponding relation between the voltage and the time in the input voltage signal and acquiring sampling data obtained by sampling the analog signal by the ADC.
And the first determining module is used for determining a data segment corresponding to the instantaneous pulse signal from the sampling data, and taking a sampling point corresponding to a sampling point with the maximum amplitude in the data segment after the interval of the preset time as a sampling starting point of the input voltage signal.
And the second determining module is used for determining the sampling voltage of each sampling point of the input voltage signal after the sampling starting point according to the corresponding relation.
In one possible embodiment, the first determining module includes:
and the first determining submodule is used for determining a data segment of the sampled data, wherein the amplitude jump range of the sampled data is larger than a preset threshold value, and the signal duration of the data segment is smaller than or equal to the preset signal duration, as a data segment corresponding to the instantaneous pulse signal.
In one possible embodiment, the first determining module includes:
and the second determining submodule is used for determining a data segment, of the sampling data, of which the signal duration is less than or equal to the preset signal duration and the time interval with the next data segment is greater than or equal to the preset time, as the data segment corresponding to the instantaneous pulse signal.
In one possible embodiment, the input voltage signal may be a ramp voltage signal.
In a possible embodiment, the transient pulse signal may be any one of the following: a momentary rising pulse signal and a momentary falling pulse signal.
In one possible embodiment, the transient pulse signal is input into the ADC after the end of the previous input voltage signal.
A third aspect of the embodiments of the present application provides an analog-to-digital converter, including a processor and a memory; the memory has stored therein instructions for performing the method of the first aspect when executed by the processor.
A fourth aspect of the embodiments of the present application provides a computer-readable storage medium, on which a computer program is stored, which when executed by a processor implements the method according to the first aspect.
Based on the above aspects, the method, the apparatus, the device and the medium for determining the sampling voltage of the sampling point of the ADC provided by the embodiments of the present application send the instantaneous pulse signal to the ADC, and then send the input voltage signal to the ADC after the interval of the preset time, so that the ADC sequentially samples the instantaneous pulse signal and the input voltage signal to obtain the sampling data, because the duration of the instantaneous pulse signal is very short, the point with the maximum amplitude in the corresponding sampling data is unique, and the sampling time of the sampling point can uniquely correspond to the sending time of the instantaneous pulse signal, so that after the data segment corresponding to the instantaneous pulse signal is determined from the sampling data, the sampling point corresponding to the sampling point with the maximum amplitude in the data segment after the interval of the preset time can be used as the sampling start point of the input voltage signal, and then according to the corresponding relationship between the voltage and the time in the input voltage signal, the sampling start point of the input voltage signal can be accurately determined The voltage of (c). The scheme for determining the voltage of the sampling point provided by the embodiment of the application is simple and efficient, easy to implement and high in accuracy.
It should be understood that what is described in the summary section above is not intended to limit key or critical features of the embodiments of the application, nor is it intended to limit the scope of the application. Other features of the present disclosure will become apparent from the following description.
Drawings
FIG. 1 is a waveform diagram of a ramp voltage signal sent by a signal generator;
FIG. 2 is a step-and-line plot of "digital output value k-sample point n" output by a 12-bit ADC;
fig. 3 is a schematic view of a scenario of analog-to-digital conversion provided in an embodiment of the present application;
fig. 4 is a flowchart of a method for determining a sampling voltage at an ADC sampling point according to an embodiment of the present application;
FIG. 5 is a schematic diagram of an exemplary analog signal;
fig. 6 is a flowchart of a method for determining a sampling voltage at an ADC sampling point according to an embodiment of the present application;
fig. 7 is a schematic diagram of a corresponding relationship between a digital output value k and a sampling point n obtained by the 12-bit ADC based on the analog signal shown in fig. 5;
fig. 8 is a flowchart of a method for determining a sampling voltage at an ADC sampling point according to an embodiment of the present application;
fig. 9 is a schematic structural diagram of a sampling voltage determination apparatus according to an embodiment of the present application.
Detailed Description
Embodiments of the present application will be described in more detail below with reference to the accompanying drawings. While certain embodiments of the present application are shown in the drawings, it should be understood that the present application may be embodied in various forms and should not be construed as limited to the embodiments set forth herein, but rather these embodiments are provided for a more complete and thorough understanding of the present application. It should be understood that the drawings and embodiments of the present application are for illustration purposes only and are not intended to limit the scope of the present application.
The terms "first," "second," "third," "fourth," and the like in the description and in the claims of the embodiments of the application and in the drawings described above, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Fig. 3 is a schematic diagram of an analog-to-digital conversion scenario provided by an embodiment of the application, and for example, in the analog-to-digital conversion scenario of fig. 3, a signal generating device 11 and an ADC12 are included, where the signal generating device 11 is configured to generate an analog voltage signal and input the analog voltage signal to an ADC 12. The ADC12 receives the analog voltage signal input by the signal generating device 11, and performs sampling, holding, quantization, encoding, and other processes on the analog voltage signal to convert the analog voltage signal into a corresponding digital signal. Wherein, during the processing of the ADC12, the sampling and holding, the quantization and the encoding can be simultaneously implemented during the conversion.
To aid in understanding the present application, the sampling, holding, quantizing, and encoding processes of ADC12 are described below:
sampling: the amplitude of the analog voltage signal is extracted at fixed time intervals, and the amplitude of the acquired analog voltage signal is used as a sample value, wherein the shorter the time interval (or also referred to as a sampling interval) for extracting the amplitude of the analog voltage signal, the more the signal can be correctly reproduced. However, shortening the sampling interval causes an increase in the amount of data, and thus the sampling interval can be set as needed in practical applications.
Maintaining: in practice, a certain time is often required for converting the sampled signal into a digital signal, and in order to provide a stable value for the subsequent quantization encoding process, the amplitude of the sampled voltage signal must be maintained for a certain period of time, while the sampling and maintaining processes are generally performed simultaneously in the related art.
And (3) quantification: although a signal continuous on the time axis is converted into a discontinuous (discrete) signal by sampling, the amplitude of the voltage signal obtained by sampling is still a continuous value (analog quantity). In this case, the sample values may be divided at regular intervals in the amplitude direction, a section to which each sample value belongs may be determined, and a value stored in the section may be assigned to the sample value. The quantization process needs a certain time tau, and for analog voltage signals changing along with time, instantaneous sampling values are required to be kept unchanged within the time tau, so that the conversion correctness and conversion precision can be ensured, and the process is kept. With the hold process, the sampled signal is actually a step-like continuous function.
And (3) encoding: the process of converting the quantized signal into a binary number, i.e. representing the quantized signal by a combination of 0 and 1, is called encoding, "1" indicates the presence of a pulse, and "0" indicates the absence of a pulse. When the quantization levels are 64 levels, the number of binary digits representing these values must be 6 bits; when the quantization level is 256 levels, it must be represented by an 8-bit binary number.
The analog voltage signal can be converted into a digital signal through the above four processes, however, since the ADC and the signal generating device use different clocks, the correspondence between each sampling point of the ADC and a time point on the analog voltage signal is difficult to determine, and thus, a specific voltage corresponding to each sampling point cannot be determined.
In view of the above problems in the prior art, embodiments of the present application provide a solution for determining sampling voltages at sampling points of an ADC, the innovative concept of this scheme is to input a short duration transient pulse signal to the ADC first, the voltage signal is input after the instantaneous pulse signal with a preset time interval, and the instantaneous pulse signal has the characteristics of concentrated energy and easy identification, so that, the sampling point corresponding to the instantaneous pulse signal can be easily identified from the sampling data of the ADC, and the sampling point corresponding to the point with the maximum amplitude value in the sampling points after the preset time interval can be used as the sampling starting point of the input voltage signal, after the sampling start point is determined, the sampling voltage of each sampling point of the input voltage signal after the sampling start point is determined according to the corresponding relation between the voltage and the time in the input voltage signal.
The scheme of the embodiment of the application is explained in detail in the following with the exemplary embodiment.
Fig. 4 is a flowchart of a method for determining a sampling voltage at an ADC sampling point according to an embodiment of the present application, where as shown in fig. 4, the method includes:
Illustratively, FIG. 5 is a schematic diagram of an exemplary analog signal. The analog signal includes an input voltage signal and a transient pulse signal, wherein the input voltage signal is embodied as a ramp voltage signal in fig. 5. The ramp voltage signal is a voltage signal with a certain slope which linearly increases from zero to a certain amplitude along with time. The linear relationship of the mathematical function representation of the input voltage V and the time t of the input voltage signal is preset, and the sampling of a ramp voltage signal is performed before the signal generating device sends the ramp voltage signal. Since the entire ramp voltage signal needs to be sampled, the sampling start time is usually earlier than the time of sending the ramp voltage signal, so that a plurality of sampling points with voltage values of 0 are provided before the sampling point corresponding to the start point of the ramp voltage signal, and if the sampling start point is regarded as the point with voltage value of 0, it cannot be determined which sampling point of the plurality of sampling points with voltage values of 0 is the sampling point actually corresponding to the start point of the ramp voltage signal.
The signal generating device is set to transmit an instantaneous pulse signal before each time of transmitting the ramp voltage signal (the time interval is t1 minus t0), wherein the relationship between the input voltage value V and the time t of the ramp voltage signal can be expressed by a mathematical function, and the latter instantaneous pulse signal is transmitted after the former ramp voltage signal is recovered (i.e. t4> t3), namely the instantaneous pulse signal is set to be transmitted again after each input voltage signal reaches the maximum voltage value and then recovers to zero (the time interval is t4 minus t 3). The time interval t4 minus t0 is the transmission period of a transient pulse signal. The instantaneous pulse signal is a signal which is continuously sent at a certain time interval according to a certain voltage amplitude, the duration of the instantaneous pulse signal is less than or equal to the duration of a preset signal, the duration of the preset signal is set to be as short as possible so as to quickly and accurately detect the instantaneous pulse signal which jumps greatly, and the sampling points corresponding to the instantaneous pulse signal sending time plus the time interval t1 minus t0 are used as the sampling starting points of the ramp voltage signal, so that the voltage value corresponding to each sampling point of the subsequent ramp voltage signal can be accurately determined according to the sampling starting points.
The instantaneous pulse signal can be an instantaneous rising or instantaneous falling pulse signal, namely the amplitude of the pulse signal can be a positive voltage value which jumps instantly and greatly, or a negative voltage value which jumps instantly and greatly, and the maximum jump value of the amplitude can be quickly detected to determine the sending time point of the signal no matter the positive voltage value or the negative voltage value is positive or negative. For example, in this embodiment, the transient pulse signal may be exemplarily understood as a unit impulse signal, where the unit impulse signal is an ideal signal with infinite duration and infinite instantaneous amplitude, and covering a constant area of 1; or may be exemplarily understood as other rectangular pulses or triangular pulses with short duration and large amplitude, etc., as long as the pulse signals with short duration and amplitude jumping range larger than the preset threshold value in short time are satisfied.
Of course, fig. 5 is only an exemplary analog signal and is not the only limitation of what is referred to herein as an analog signal.
The correspondence between the voltage and the time in the input voltage signal referred to in this embodiment may be exemplarily understood as being stored in a storage medium in advance, and the correspondence between the voltage and the time in the input voltage signal is acquired from the storage medium when the method of this embodiment is executed.
In this embodiment, before the analog signal (including the transient pulse signal and the input voltage signal) is input to the ADC, the ADC starts sampling at a constant sampling frequency, so that after the analog signal of one cycle is input, the data sampled by the ADC includes the sampling data corresponding to the transient pulse signal and the sampling data corresponding to the input voltage signal.
And 403, determining a data segment corresponding to the instantaneous pulse signal from the sampling data, and taking a sampling point corresponding to a sampling point with the maximum amplitude in the data segment after the interval of the preset time as a sampling starting point of the input voltage signal.
Because the instantaneous pulse signal has the characteristics of short duration, concentrated energy, violent amplitude jump in a short time and the like, according to the characteristics of the instantaneous pulse signal, data which accords with the characteristics of the instantaneous pulse signal can be determined from the sampling data of the ADC and is used as a data section corresponding to the instantaneous pulse signal, the sampling time of a sampling point with the maximum amplitude in the data section plus the preset time can be regarded as the sending time of the input voltage signal, and the sampling point corresponding to the sending time of the input voltage signal is used as the sampling starting point of the input voltage signal.
And 404, determining the sampling voltage of each sampling point of the input voltage signal after the sampling starting point according to the corresponding relation.
Still taking fig. 5 as an example, since the time interval between the transient pulse signal and the ramp voltage signal (t1 minus t0), the period of the ramp voltage signal (t2 minus t1), and the linear relationship between the voltage and the time in the ramp voltage signal (t2 minus t0) can be preset, the voltage value corresponding to each time t in the range of (t2 minus t0) can be determined; in addition, since the sampling frequency of the ADC can be set, the sampling point n0 of the transient pulse signal (i.e. the point corresponding to the sampling time t0) can be calculated according to the sampling frequency, so that the time interval from each point of the input voltage signal to the sampling point n0, that is, the time interval is within the range of (t2 minus t0), and thus the specific voltage value corresponding to each ADC sampling point can be determined. The sampling rate or sampling frequency (sampling frequency) defines the number of samples extracted from a continuous signal per second and forming a discrete signal, and the sampling frequency is usually referred to as how many signal samples are collected by a computer per second. The sampling frequency of the ADC can be set to be larger to more easily acquire the large-amplitude jump data segment of the transient pulse signal.
Of course, this embodiment is only illustrated by way of example in fig. 5, and is not the only limitation of the present application.
In this embodiment, by first sending the transient pulse signal to the ADC and then sending the input voltage signal to the ADC after a preset time interval, the ADC samples the transient pulse signal and the input voltage signal in sequence to obtain sampling data, and because the transient pulse signal has short duration, the point with the maximum amplitude in the corresponding sampling data is unique, and the sampling time of the sampling point can uniquely correspond to the sending time of the instantaneous pulse signal, so that after the data segment corresponding to the instantaneous pulse signal is determined from the sampling data, the sampling point corresponding to the sampling point with the maximum amplitude in the data segment after a preset time interval can be used as the sampling starting point of the input voltage signal, and then the voltage corresponding to each sampling point of the input voltage signal after the sampling starting point can be accurately determined according to the corresponding relation between the voltage and the time in the input voltage signal. The scheme for determining the voltage of the sampling point provided by the embodiment is simple and efficient, easy to implement and high in accuracy.
Fig. 6 is a flowchart of a method for determining a sampling voltage at an ADC sampling point according to an embodiment of the present application, where as shown in fig. 6, the method includes:
For example, fig. 7 is a schematic diagram of a corresponding relationship between a digital output value k and a sampling point n obtained by a 12-bit ADC based on an analog signal shown in fig. 5, as shown in fig. 7, after the ADC finishes sampling, analyzing sampling data obtained by the ADC, locking a data segment (e.g., 0, 5, 600, 4, 0) in which a transition range of the digital output value occurs in a short time (the time is less than or equal to a preset signal duration) and a sampling point with the maximum amplitude in the data segment range is set as a sampling point n0 of an instantaneous pulse signal, according to the ADC principle and by referring to fig. 5, at this time, a time point corresponding to the sampling point n0 of the instantaneous pulse signal, i.e., a time t0 at which the instantaneous pulse signal is sent, a sampling point corresponding to the sampling point n0 after a preset time interval t1-t0 is used as a sampling point of a ramp voltage signal, and a starting point is according to a corresponding relationship between a voltage and a time in the ramp voltage signal, the sampling voltage corresponding to each sampling point after the sampling start point of the ramp voltage signal can be determined.
Of course, fig. 7 is merely illustrative and not the only limitation on the ADC input signal.
According to the characteristics of short duration, concentrated energy and large amplitude jump range in a short time, the data section corresponding to the instantaneous pulse signal can be rapidly and accurately determined, the sampling point corresponding to the point with the maximum amplitude in the data section after a preset time interval is taken as the sampling starting point of the ramp voltage signal, and the corresponding relation between the sampling starting point and the original analog signal can be accurately and uniquely determined, so that the sampling voltage corresponding to each subsequent sampling point of the ramp voltage signal can be accurately obtained according to the sampling starting point.
And step 604, determining the sampling voltage of each sampling point of the input voltage signal after the sampling starting point according to the corresponding relation.
The beneficial effects of this embodiment are similar to those of the embodiment of fig. 4, and are not described herein again.
Fig. 8 is a flowchart of a method for determining a sampling voltage at an ADC sampling point according to an embodiment of the present application, where as shown in fig. 8, the method includes:
And step 802, acquiring a corresponding relation between voltage and time in the input voltage signal, and acquiring sampling data sampled by the ADC from the analog signal.
And 803, determining a data segment in the sampled data, in which the signal duration is less than or equal to a preset signal duration and the time interval with the next data segment is greater than or equal to the preset time, as a data segment corresponding to the instantaneous pulse signal, and taking a sampling point in the data segment, in which the sampling point with the maximum amplitude value is spaced by the preset time, as a sampling starting point of the input voltage signal.
As shown in fig. 5, the duration of the transient pulse signal and the time interval (t1 minus t0) between the transient pulse signal and the input voltage signal can be preset, so that, when analyzing the sampled data of the ADC, if there are consecutive data segments, the duration of the data segment is less than or equal to the preset signal duration, and the interval between the data segment and the next continuous data segment is greater than or equal to the preset time interval between the transient pulse signal and the input voltage signal (t1 minus t0), the data segment can be judged as the sampling data of the transient pulse signal, wherein, the time corresponding to the point with the maximum amplitude value is the sending time of the instantaneous pulse signal, the sampling point corresponding to the point after the interval of preset time is taken as the sampling starting point of the input voltage signal, and determining the sampling voltage of each subsequent sampling point of the input voltage signal according to the sampling starting point. It is understood that this is by way of illustration and not by way of limitation.
According to the embodiment, the data segment corresponding to the instantaneous pulse signal is determined from the sampling data of the ADC according to the characteristics that the pulse signal duration is short and the interval between the pulse signal duration and the input voltage signal is preset, so that the sampling point n0 corresponding to the sending time t0 of the instantaneous pulse signal can be quickly and accurately determined according to the data segment, and the sampling point corresponding to the sampling point n0 after the interval between the sampling point n 1 and the sampling point t0 is used as the sampling starting point of the input voltage signal, so that the problem that the corresponding relation between the sampling starting point and the analog signal cannot be accurately determined in the prior art is solved.
And step 804, determining the sampling voltage of each sampling point of the input voltage signal after the sampling start point according to the corresponding relation.
The beneficial effects of this embodiment are similar to those of the embodiment of fig. 4, and are not described herein again.
Fig. 9 is a schematic structural diagram of a sampling voltage determination apparatus according to an embodiment of the present application, and as shown in fig. 9, the sampling voltage determination apparatus 90 includes:
the receiving module 91 is configured to receive an analog signal input by the signal generating device, where the analog signal includes a transient pulse signal and an input voltage signal transmitted at a preset time interval after the transient pulse signal.
And an obtaining module 92, configured to obtain a correspondence between a voltage in the input voltage signal and time, and obtain sampling data obtained by sampling the analog signal by the ADC.
The first determining module 93 is configured to determine a data segment corresponding to the instantaneous pulse signal from the sampling data, and use a sampling point corresponding to a sampling point with a maximum amplitude in the data segment after the interval of the preset time as a sampling start point of the input voltage signal.
And a second determining module 94, configured to determine, according to the corresponding relationship, a sampling voltage of each sampling point of the input voltage signal after the sampling start point.
In one possible embodiment, the first determining module includes:
and the first determining submodule is used for determining a data segment of the sampled data, wherein the amplitude jump range of the sampled data is larger than a preset threshold value, and the signal duration of the data segment is smaller than or equal to the preset signal duration, as a data segment corresponding to the instantaneous pulse signal.
In one possible embodiment, the first determining module includes:
and the second determining submodule is used for determining a data segment, of the sampling data, of which the signal duration is less than or equal to a preset signal duration and the time interval with the next data segment is greater than or equal to the preset time, as the data segment corresponding to the instantaneous pulse signal.
In one possible embodiment, the input voltage signal may be a ramp voltage signal.
In a possible embodiment, the transient pulse signal may be any one of the following: a unit impulse signal, an instantaneous rising pulse signal, and an instantaneous falling pulse signal.
In one possible embodiment, the transient pulse signal is input into the ADC after the end of the previous input voltage signal.
The apparatus provided in this embodiment is capable of performing the method of the foregoing method embodiment, and the performing manner and beneficial effects thereof are similar to those of the foregoing embodiment, and are not described herein again.
The embodiment of the application also provides an analog-to-digital converter, which comprises a processor and a memory; the memory has stored therein instructions for performing the method of any of the above embodiments when executed by the processor.
The embodiments of the present application also provide a computer-readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the method described in any of the above embodiments.
The functions described herein above may be performed, at least in part, by one or more hardware logic components. For example, without limitation, exemplary types of hardware logic components that may be used include: a Field Programmable Gate Array (FPGA), an Application Specific Integrated Circuit (ASIC), an Application Specific Standard Product (ASSP), a system on a chip (SOC), a load programmable logic device (CPLD), and the like.
Program code for implementing the methods of the present disclosure may be written in any combination of one or more programming languages. These program codes may be provided to a processor or controller of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the program codes, when executed by the processor or controller, cause the functions/operations specified in the flowchart and/or block diagram to be performed. The program code may execute entirely on the machine, partly on the machine, as a stand-alone software package, partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of this disclosure, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
Further, while operations are depicted in a particular order, this should be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed, to achieve desirable results. Under certain circumstances, multitasking and parallel processing may be advantageous. Likewise, while several specific implementation details are included in the above discussion, these should not be construed as limitations on the scope of the disclosure. Certain features that are described in the context of separate embodiments can also be implemented in combination in a single implementation. Conversely, various features that are described in the context of a single implementation can also be implemented in multiple implementations separately or in any suitable subcombination.
Although the subject matter has been described in language specific to structural features and/or methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims.
Claims (10)
1. A method for determining a sampling voltage at an ADC sampling point, the method comprising:
receiving an analog signal input by a signal generating device, wherein the analog signal comprises an instantaneous pulse signal and an input voltage signal which is sent at a preset time interval after the instantaneous pulse signal; the input voltage signal is a ramp voltage signal, and the instantaneous pulse signal is input into the ADC after the previous input voltage signal is finished;
acquiring a corresponding relation between voltage and time in the input voltage signal, and acquiring sampling data sampled by the ADC from the analog signal;
determining a data segment corresponding to the instantaneous pulse signal from the sampling data, and taking a sampling point corresponding to a sampling point with the maximum amplitude value in the data segment after the interval of the preset time as a sampling starting point of the input voltage signal;
and determining the sampling voltage of each sampling point of the input voltage signal after the sampling start point according to the corresponding relation.
2. The method of claim 1, wherein said determining a data segment corresponding to said transient pulse signal from said sampled data comprises:
and determining a data segment of the sampled data, wherein the amplitude jump range of the sampled data is larger than a preset threshold value, and the signal duration is smaller than or equal to the preset signal duration, as a data segment corresponding to the instantaneous pulse signal.
3. The method of claim 1, wherein said determining a data segment corresponding to said transient pulse signal from said sampled data comprises:
and determining the data segment of which the signal duration is less than or equal to the preset signal duration and the time interval with the next data segment is greater than or equal to the preset time in the sampling data as the data segment corresponding to the instantaneous pulse signal.
4. A method according to any of claims 1-3, characterized in that the transient pulse signal is any of the following:
a momentary rising pulse signal and a momentary falling pulse signal.
5. A sampled voltage determination apparatus, comprising:
the receiving module is used for receiving an analog signal input by the signal generating equipment, wherein the analog signal comprises an instantaneous pulse signal and an input voltage signal which is sent at a preset time interval after the instantaneous pulse signal; the input voltage signal is a ramp voltage signal, and the instantaneous pulse signal is input into the ADC after the previous input voltage signal is finished;
the acquisition module is used for acquiring the corresponding relation between the voltage and the time in the input voltage signal and acquiring sampling data sampled by the ADC from the analog signal;
the first determining module is used for determining a data segment corresponding to the instantaneous pulse signal from the sampling data, and taking a sampling point corresponding to a sampling point with the maximum amplitude in the data segment after the interval of the preset time as a sampling starting point of the input voltage signal;
and the second determining module is used for determining the sampling voltage of each sampling point of the input voltage signal after the sampling starting point according to the corresponding relation.
6. The apparatus of claim 5, wherein the first determining module comprises:
and the first determining submodule is used for determining a data segment of the sampled data, wherein the amplitude jump range of the sampled data is larger than a preset threshold value, and the signal duration of the data segment is smaller than or equal to the preset signal duration, as a data segment corresponding to the instantaneous pulse signal.
7. The apparatus of claim 5, wherein the first determining module comprises:
and the second determining submodule is used for determining a data segment, of the sampling data, of which the signal duration is less than or equal to the preset signal duration and the time interval with the next data segment is greater than or equal to the preset time, as the data segment corresponding to the instantaneous pulse signal.
8. The apparatus according to any one of claims 5-7, wherein the transient pulse signal is any one of:
a momentary rising pulse signal and a momentary falling pulse signal.
9. An analog-to-digital converter comprising a processor and a memory;
the memory has stored therein instructions to perform the method of any of claims 1-4 when executed by the processor.
10. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1-4.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210669807.9A CN115001498A (en) | 2019-11-21 | 2019-11-21 | Analog-digital converter |
| CN201911148181.1A CN110739971B (en) | 2019-11-21 | 2019-11-21 | Determination method, device, equipment and medium of ADC sampling point sampling voltage |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911148181.1A CN110739971B (en) | 2019-11-21 | 2019-11-21 | Determination method, device, equipment and medium of ADC sampling point sampling voltage |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210669807.9A Division CN115001498A (en) | 2019-11-21 | 2019-11-21 | Analog-digital converter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110739971A CN110739971A (en) | 2020-01-31 |
| CN110739971B true CN110739971B (en) | 2022-08-16 |
Family
ID=69273455
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911148181.1A Active CN110739971B (en) | 2019-11-21 | 2019-11-21 | Determination method, device, equipment and medium of ADC sampling point sampling voltage |
| CN202210669807.9A Pending CN115001498A (en) | 2019-11-21 | 2019-11-21 | Analog-digital converter |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210669807.9A Pending CN115001498A (en) | 2019-11-21 | 2019-11-21 | Analog-digital converter |
Country Status (1)
| Country | Link |
|---|---|
| CN (2) | CN110739971B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117871920A (en) * | 2024-03-13 | 2024-04-12 | 上海知白智能科技有限公司 | Eye pattern acquisition method, device, system and storage medium |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101022566A (en) * | 2007-03-12 | 2007-08-22 | 无锡市晶源微电子有限公司 | Analogue video signal processing circuit testing method |
| CN109633253A (en) * | 2018-12-07 | 2019-04-16 | 中电科仪器仪表(安徽)有限公司 | One kind realizing voltage transient signal deteching circuit and method based on FPGA |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN85101811B (en) * | 1985-04-01 | 1988-04-20 | 株式会社日立制作所 | Method and device for samp and processing video signal |
| KR20070077262A (en) * | 2006-01-23 | 2007-07-26 | 삼성전자주식회사 | Image processing apparatus having function of bi-directional communication and method thereof |
| US9813076B1 (en) * | 2016-03-31 | 2017-11-07 | Analog Value Ltd. | Analog to digital converter and a method for analog to digital conversion |
-
2019
- 2019-11-21 CN CN201911148181.1A patent/CN110739971B/en active Active
- 2019-11-21 CN CN202210669807.9A patent/CN115001498A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101022566A (en) * | 2007-03-12 | 2007-08-22 | 无锡市晶源微电子有限公司 | Analogue video signal processing circuit testing method |
| CN109633253A (en) * | 2018-12-07 | 2019-04-16 | 中电科仪器仪表(安徽)有限公司 | One kind realizing voltage transient signal deteching circuit and method based on FPGA |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110739971A (en) | 2020-01-31 |
| CN115001498A (en) | 2022-09-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO2006047751A1 (en) | Analog-to-digital converter | |
| CN110739971B (en) | Determination method, device, equipment and medium of ADC sampling point sampling voltage | |
| US11139823B2 (en) | Sample and hold circuit with indefinite holding time | |
| US3493874A (en) | Statistical decision systems | |
| CN104579347A (en) | Analog-to-digital converter | |
| CN114362553B (en) | Power acquisition circuit and method of radio frequency power supply | |
| CN110784222A (en) | ADC output curve generation method, device, equipment and medium | |
| CN114430274A (en) | Signal processing method and signal processing circuit | |
| CA2410422A1 (en) | Method and apparatus of producing a digital depiction of a signal | |
| CN112600561A (en) | Signal processing system in oscilloscope, oscilloscope and signal processing method | |
| CN109889200B (en) | Circuit for converting voltage signal into frequency signal based on frequency quantizer | |
| US7737874B1 (en) | Method of multi-channel data readout and acquisition | |
| CN2935633Y (en) | Analog-to-digital conversion apparatus | |
| CN210469275U (en) | Analog-to-digital converter | |
| CN111669182B (en) | Signal sampling device, system and method | |
| RU2572063C1 (en) | Device for detecting fission pulse shape | |
| CN111988041B (en) | Dynamic output method and device for analog-to-digital conversion, chip and household appliance | |
| SU746551A1 (en) | Device for determining probability density function | |
| CN114076847A (en) | High-resolution current frequency conversion device and method | |
| CN116795325A (en) | Charge measurement method and system based on automatic searching of optimal summation point | |
| SU452054A1 (en) | Adaptive Differential Pulse Code Modulator | |
| Kościelnik et al. | Analysis of conversion time of time-to-digital converters with charge redistribution | |
| RU2646356C1 (en) | Analogue-to-digital converter | |
| EP3145087A1 (en) | Method and apparatus for indirect conversion of voltage value to digital word | |
| RU2110886C1 (en) | Analog-to-digital converter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20200512 Address after: 519000 room 105-68710, No. 6, Baohua Road, Hengqin New District, Zhuhai City, Guangdong Province (centralized office area) Applicant after: Zhuhai Jihai Semiconductor Co.,Ltd. Address before: 519060 building 01, No. 83, Guangwan street, Xiangzhou District, Zhuhai City, Guangdong Province Applicant before: APEX MICROELECTRONICS Co.,Ltd. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |