CN110716130A - Voltage margin testing device - Google Patents
Voltage margin testing device Download PDFInfo
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- CN110716130A CN110716130A CN201810768935.2A CN201810768935A CN110716130A CN 110716130 A CN110716130 A CN 110716130A CN 201810768935 A CN201810768935 A CN 201810768935A CN 110716130 A CN110716130 A CN 110716130A
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- 238000012360 testing method Methods 0.000 title claims abstract description 33
- 230000001105 regulatory effect Effects 0.000 claims abstract description 22
- 238000006243 chemical reaction Methods 0.000 claims description 17
- 239000003990 capacitor Substances 0.000 claims description 16
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
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- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
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- Tests Of Electronic Circuits (AREA)
Abstract
A voltage margin testing device comprises a voltage generating unit and a voltage regulating unit. The voltage generating unit is used for outputting power supply voltage to the electronic equipment, and the voltage adjusting unit is used for receiving the power supply voltage output by the voltage generating unit and adjusting the size of the power supply voltage output to the electronic equipment. Therefore, the voltage margin testing device can be used for testing the working voltage margin of the electronic equipment, and is simple and cost-saving.
Description
Technical Field
The present disclosure relates to testing devices, and particularly to a testing device for testing voltage margin.
Background
Generally, the stability of the power supply voltage of the computer motherboard directly determines the stability of the operation performance. When a computer motherboard comes into the market, various chassis power supplies are encountered, and in order to match the chassis power supplies with the computer motherboard, the voltage margin of the computer motherboard, that is, the upper and lower limit ranges of the motherboard voltage, needs to be determined first during design and development.
Disclosure of Invention
In view of the foregoing, it is desirable to provide a voltage margin test apparatus.
A voltage margin test apparatus, comprising:
the voltage generating unit is used for outputting a power supply voltage to an electronic device; and
and the voltage regulating unit is connected with the voltage generating unit and used for receiving the power supply voltage output by the voltage generating unit and regulating the size of the power supply voltage output to the electronic equipment.
Further, the voltage margin testing device further comprises a universal meter, and the universal meter is used for measuring the power supply voltage.
Further, the voltage generating unit includes a voltage converting chip and a first capacitor, the voltage converting chip includes a voltage input pin, a voltage output pin, a reference voltage pin and a ground pin, the voltage input pin of the voltage converting chip is connected to a power supply, the voltage input pin of the voltage converting chip is also grounded through the first capacitor, the ground pin of the voltage converting chip is grounded, and the voltage output pin and the reference voltage pin of the voltage converting chip are both connected to the voltage regulating unit.
Further, the voltage adjusting unit includes a first resistor and a second resistor, a first end of the first resistor is connected to the voltage output pin of the voltage converting chip, a second end of the first resistor is connected to the first end of the second resistor, a second end of the second resistor is grounded, the reference voltage pin of the voltage converting chip is connected to a node between the first resistor and the second resistor, and a first end of the first resistor is connected to the power input end of the electronic device.
Furthermore, the voltage regulation unit further comprises a second capacitor, a first end of the second capacitor is connected with the voltage output pin of the voltage conversion chip, and a second end of the second capacitor is grounded.
Further, the voltage regulating unit further includes a sliding varistor, the sliding varistor includes a first end, a second end and a regulating end, the regulating end of the sliding varistor is connected to a node between the first resistor and the second resistor, the first end of the sliding varistor is connected to the first end of the first resistor, and the second end of the sliding varistor is connected to the second end of the second resistor.
Further, the voltage conversion chip is configured to convert the operating voltage received by the voltage input pin into a supply voltage, and output the supply voltage to the voltage adjustment unit through the voltage input pin.
Further, a reference voltage pin of the voltage conversion chip outputs a voltage of 0.8V.
The voltage margin testing device regulates the power supply voltage output to the electronic equipment by the voltage generating unit through the voltage regulating unit, and measures the power supply voltage when the electronic equipment works abnormally, so that the margin of the working voltage of the electronic equipment can be obtained, and the voltage margin testing device is simple and saves cost.
Drawings
FIG. 1 is a block diagram of a preferred embodiment of a voltage margin test apparatus connected to an electronic device.
FIG. 2 is a circuit diagram of the voltage margin test apparatus of FIG. 1 according to a preferred embodiment.
Description of the main elements
Voltage margin testing device 100
Voltage conversion chip U1
First resistor R1
Second resistor R2
Slide rheostat R3
First capacitor C1
Second capacitance C2
Power supply V1
Node P1
The following detailed description will further illustrate the invention in conjunction with the above-described figures.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
In order to make the objects, technical solutions and advantages of the present invention more apparent, the voltage margin testing apparatus of the present invention will be described in detail with reference to the accompanying drawings and embodiments.
Referring to fig. 1, in a preferred embodiment of the invention, a voltage margin testing apparatus 100 is used for testing an operating voltage margin of an electronic device 200. The electronic device 200 may be a computer motherboard.
The voltage margin testing apparatus 100 includes a voltage generating unit 10 and a voltage regulating unit 20. The voltage adjusting unit 20 is connected between the voltage generating unit 10 and the electronic device 200.
The voltage generating unit 10 is configured to output a power supply voltage and transmit the power supply voltage to the electronic device 200 through the voltage regulating unit 20 to operate the electronic device.
The voltage adjusting unit 20 is configured to receive the power supply voltage output by the voltage generating unit 10 and adjust the magnitude of the power supply voltage output to the electronic device 200.
Further, the voltage margin testing device 100 may further include a multimeter 30, where the multimeter 30 is configured to measure the magnitude of the power supply voltage.
Referring to fig. 2, in a preferred embodiment, the voltage generating unit 10 may further include a voltage converting chip U1 and a first capacitor C1.
The voltage conversion chip U1 includes a voltage input pin IN, a voltage output pin OUT, a reference voltage pin FB, and a ground pin GND. The voltage input pin IN of the voltage conversion chip U1 is connected to a power supply V1, the voltage input pin IN of the voltage conversion chip U1 is further grounded through the first capacitor C1, the ground pin GND of the voltage conversion chip U1 is grounded, and the voltage output pin OUT and the reference voltage pin FB of the voltage conversion chip U1 are both connected to the voltage regulation unit 20.
In a preferred embodiment, the voltage regulating unit 20 may further include a second capacitor C2, a first resistor R1 and a second resistor R2.
A first end of the first resistor R1 is connected to a voltage output pin OUT of the voltage conversion chip U1, a second end of the first resistor R1 is connected to a first end of the second resistor R2, a second end of the second resistor R2 is grounded, and a reference voltage pin FB of the voltage conversion chip U1 is connected to a node P1 between the first resistor R1 and the second resistor R2. A first terminal of the first resistor R1 is connected to a power input terminal (not shown) of the electronic device 200.
The first end of the second capacitor C2 is connected to the voltage output pin OUT of the voltage conversion chip U1, and the second end of the second capacitor C2 is grounded.
The voltage conversion chip U1 is used for converting an operating voltage (e.g., 3.3V) received by the voltage input pin IN into a supply voltage, and outputting the supply voltage to the voltage regulating unit 20 through the voltage input pin OUT.
Further, the voltage regulating unit 20 may further include a sliding resistor R3, wherein the sliding resistor R3 has a first end, a second end and a regulating end. The adjusting end of the sliding rheostat R3 is connected to a node P1 between the first resistor R1 and the second resistor R2, the first end of the sliding rheostat R3 is connected to the first end of the first resistor R1, and the second end of the sliding rheostat R3 is connected to the second end of the second resistor R2.
The basic working principle of the invention is as follows: the output voltage of the reference voltage pin FB of the voltage conversion chip U1 is marked as VFBThe power supply voltage received by the electronic device 200 is denoted as VOUTThe resistance value of the first resistor R1 is denoted as R1, the resistance value of the second resistor R2 is denoted as R2, the resistance value between the adjusting end and the first end of the slide rheostat R3 is denoted as R3, and the resistance value between the adjusting end and the second end of the slide rheostat R3 is denoted as R4.
In this way, the supply voltage V received by the electronic device 200 can be derivedOUTThe following formula is satisfied: vOUT＝VFB*(1+(r1//r3)/(r2//r4))。
In this way, by sliding the adjustment end of the slide rheostat R3, the sizes of R3 and R4 can be dynamically adjusted, and a required voltage value can be obtained.
In a preferred embodiment, the output voltage V of the reference voltage pin FB of the voltage conversion chip U1FBIt was 0.8V.
When the voltage margin testing device 100 is used to test the lower limit of the operating voltage of the electronic device 200, the adjustment end of the slide rheostat R3 is moved toward the first end, so that R3 is gradually decreased and R4 is gradually increased, and the supply voltage V is further increasedOUTAnd is reduced accordingly. Thus, when the output voltage V of the voltage generating unit 10 is generatedOUTWhen the voltage is correspondingly reduced to a certain value, so that the electronic device 200 works abnormally, the power supply voltage is measured by using the multimeter 30, and then the lower limit of the working voltage of the electronic device 200 can be obtained.
When the voltage margin testing device 100 is used to test the upper limit of the operating voltage of the electronic apparatus 200, the adjustment end of the sliding rheostat R3 is moved toward the second end, so that R3 is gradually increased and R4 is gradually decreased, and the output voltage V of the voltage generating unit 10 is further increasedOUTAnd increases accordingly. Thus, when the output voltage V of the voltage generating unit 10 is generatedOUTWhen the electronic device 200 is abnormally operated due to the corresponding increase to a certain value, the electronic device is usedThe multimeter 30 measures the power supply voltage, and the upper limit of the operating voltage of the electronic device 200 can be obtained.
In this way, with the voltage margin testing apparatus 100 of the present invention, the voltage adjusting unit 20 adjusts the magnitude of the power supply voltage output from the voltage generating unit 10 to the electronic device 200, and the magnitude of the power supply voltage is measured when the electronic device 200 is in abnormal operation, so as to obtain the margin of the operating voltage of the electronic device 200, which is simple and cost-effective.
Finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present invention and are not limited, although the present invention is described in detail with reference to the preferred embodiments. It will be understood by those skilled in the art that various modifications and equivalent arrangements can be made without departing from the spirit and scope of the present invention. Moreover, based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without any creative effort will fall within the protection scope of the present invention.
Claims (8)
1. A voltage margin test device, comprising:
the voltage generating unit is used for outputting a power supply voltage to an electronic device; and
and the voltage regulating unit is connected with the voltage generating unit and used for receiving the power supply voltage output by the voltage generating unit and regulating the size of the power supply voltage output to the electronic equipment.
2. The voltage margin test apparatus of claim 1, further comprising a multimeter to measure the supply voltage.
3. The apparatus of claim 1, wherein the voltage generating unit comprises a voltage converting chip and a first capacitor, the voltage converting chip comprises a voltage input pin, a voltage output pin, a reference voltage pin and a ground pin, the voltage input pin of the voltage converting chip is connected to a power supply, the voltage input pin of the voltage converting chip is further grounded through the first capacitor, the ground pin of the voltage converting chip is grounded, and the voltage output pin and the reference voltage pin of the voltage converting chip are both connected to the voltage regulating unit.
4. The voltage margin test device as claimed in claim 3, wherein the voltage adjusting unit comprises a first resistor and a second resistor, a first end of the first resistor is connected to the voltage output pin of the voltage converting chip, a second end of the first resistor is connected to a first end of the second resistor, a second end of the second resistor is grounded, the reference voltage pin of the voltage converting chip is connected to a node between the first resistor and the second resistor, and a first end of the first resistor is connected to the power input terminal of the electronic device.
5. The voltage margin test device of claim 4, wherein the voltage regulating unit further comprises a second capacitor, a first terminal of the second capacitor is connected to the voltage output pin of the voltage converting chip, and a second terminal of the second capacitor is connected to ground.
6. The apparatus for testing voltage margin as claimed in claim 5, wherein the voltage regulating unit further comprises a sliding varistor, the sliding varistor comprises a first terminal, a second terminal and a regulating terminal, the regulating terminal of the sliding varistor is connected to the node between the first resistor and the second resistor, the first terminal of the sliding varistor is connected to the first terminal of the first resistor, and the second terminal of the sliding varistor is connected to the second terminal of the second resistor.
7. The voltage margin test device of claim 3, wherein the voltage conversion chip is configured to convert the operating voltage received by the voltage input pin into a supply voltage and output the supply voltage to the voltage regulation unit via the voltage input pin.
8. The voltage margin test device of claim 3, wherein a reference voltage pin of the voltage conversion chip outputs a voltage of 0.8V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810768935.2A CN110716130A (en) | 2018-07-13 | 2018-07-13 | Voltage margin testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810768935.2A CN110716130A (en) | 2018-07-13 | 2018-07-13 | Voltage margin testing device |
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| Publication Number | Publication Date |
|---|---|
| CN110716130A true CN110716130A (en) | 2020-01-21 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201810768935.2A Pending CN110716130A (en) | 2018-07-13 | 2018-07-13 | Voltage margin testing device |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101996120A (en) * | 2009-08-18 | 2011-03-30 | 鸿富锦精密工业（深圳）有限公司 | Voltage margin test device |
| CN102540051A (en) * | 2010-12-22 | 2012-07-04 | 鸿富锦精密工业（深圳）有限公司 | Device and method for testing voltage margin |
| CN102721916A (en) * | 2012-06-29 | 2012-10-10 | 福建星网锐捷网络有限公司 | Power supply voltage-regulating testing device |
-
2018
- 2018-07-13 CN CN201810768935.2A patent/CN110716130A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101996120A (en) * | 2009-08-18 | 2011-03-30 | 鸿富锦精密工业（深圳）有限公司 | Voltage margin test device |
| CN102540051A (en) * | 2010-12-22 | 2012-07-04 | 鸿富锦精密工业（深圳）有限公司 | Device and method for testing voltage margin |
| CN102721916A (en) * | 2012-06-29 | 2012-10-10 | 福建星网锐捷网络有限公司 | Power supply voltage-regulating testing device |
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