CN110674614A - Signal eye diagram analysis method based on RX MASK central dot matrix - Google Patents
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Abstract
The invention provides a signal eye diagram analysis method based on an RX MASK central dot matrix, which relates to the technical field of storage system engineering and comprises the following steps: s1: acquiring a stored data signal simulation eye pattern; s2: customizing the specification and size of the effective Rx MASK; s3: counting effective Rx MASK central dot matrixes; s4: analyzing and evaluating the stored signal eye diagram based on the MASK central dot matrix; s5: the optimal center point is obtained along with the swing margin and the timing margin. The signal eye diagram analysis method based on the RX MASK center dot matrix optimizes interconnection topological parameters, optimizes access and storage signal channels, quantificationally stores data signal eye diagram quality judgment standards, ensures that a storage system has sufficient design margins, can simulate the operation process of a training mechanism, selects the most appropriate central point according to the swing amplitude and time sequence priority weight proportion, and calculates the corresponding swing amplitude margin and time sequence margin.
Description
Technical Field
The invention relates to the technical field of storage system engineering,
in particular, the invention relates to a signal eye diagram analysis method based on an RX MASK central dot matrix.
Background
The important component of the computer system structure, the advanced storage system, has decisive influence on the performance index, the integration scale and the stable operation of the whole system. At present, a conventional high-speed parallel memory circuit technology, ddr (double data rate) series memories are widely used. Compared with DDR2/3, the access speed of the new generation DDR4 and the future DDR5 is greatly improved, and the requirement on the design capability of an access signal channel is also more severe. Unlike previous generations where the Vih/Vil decision level was defined, the DDR4 SDRAM Specification Standard JESD79-4B defines the data signal receiver Rx MASK size. Here, a rectangular MASK is defined, whose center point coordinates (VMIDPOINT, TDQS) require that the waveform/eye pattern of the signal not enter the MASK to ensure a certain level of error rate. For example, DDR4-3200 corresponds to MASK regions with a height of 110mV and a width of 0.23UI to achieve a 1E-16 BER level, where 1 UI = 312.5 ps.
Based on the JEDEC standard definition, Rx MASK is implanted into the simulated eye diagram, and the conventional method can only preliminarily judge whether one memory access signal channel design can meet the standard requirement. For example, scientific placement of the Rx MASK ensures that traces within the eye diagram for storing data signals do not enter the Rx MASK, even if JEDEC standard electrical requirements are met. At this time, the conventional method has several problems that are difficult to solve. The first problem is that the standard Rx MASK is only the minimum requirement to ensure correct identification, and in some cases, the system design lacks sufficient design margin and is difficult to resist the adverse operating environment and other SI/PI noise effects. The second problem is that there are many combinations of DDR memory interconnect topology parameters, such as drive internal Resistance (RON), termination (RODT), transmission channel (Z0), load condition (SR/DR), etc., and it is sometimes difficult to quantify what kind of parameter combination has a larger system design margin. The third problem is that, unlike the previous generations using SSTL-12 (Fixed VREF), DDR4 uses POD-12 interface circuit technology, the training phase must consider not only the Timing (Timing) condition, but also the varying reference Voltage (Variable VREF) condition, i.e., it is necessary to consider both the signal swing (Voltage) and Timing (Timing) together. The fourth problem is that the actual regulation capability of the VREF voltage, the timing parameter, of the memory control training is ignored. A fifth problem is that the 1/4 trace within the signal eye does not necessarily exhibit a monotonic (increasing or decreasing) behavior, and this irregular eye pattern places new higher requirements on the center point (VMIDPOINT, TDQS) selection.
In summary, the conventional method is difficult to effectively determine the eye diagram quality of the stored data signal, and is difficult to scientifically and reasonably select the optimal central point position, so how to design a reasonable signal eye diagram analysis method based on the RX MASK central dot matrix becomes a problem that needs to be solved urgently at present.
Disclosure of Invention
The invention aims to provide a signal eye diagram analysis method based on an RX MASK central dot matrix, which is convenient for simulating the practical process steps of memory control training, comprehensively analyzes the signal swing amplitude and the time sequence margin, scientifically guides the selection of access and memory interconnection topological parameters and the design of an access and memory signal channel.
In order to achieve the purpose, the invention is realized by adopting the following technical scheme:
a method for analyzing an eye diagram of a signal based on an RX MASK central lattice, the method comprising the steps of:
s1: acquiring a stored data signal simulation eye pattern for developing analysis;
s2: customizing the specification and size of the effective Rx MASK;
s3: counting effective Rx MASK central dot matrixes;
s4: analyzing and evaluating the stored signal eye diagram based on the MASK central dot matrix;
s5: and obtaining the optimal central point and the corresponding swing margin and timing margin.
Preferably, the step S3 includes:
s31: programming and calculating an inner edge trace of the eye diagram of the stored data signal;
s32: traversing (gridding) all possible effective Rx MASK center points according to the training stepping parameters;
s33: counting the center points of all effective Rx MASKs located inside the eye pattern but not intersecting the trace line inside the eye pattern;
s34: and carrying out statistics to judge the quality of the eye diagram of the stored data signal.
Preferably, in step S34, the statistical content includes the number of central points and the V/T area occupied by the calculated central dot matrix.
As a preferred embodiment of the present invention, when step S1 is executed, pre-simulation or post-simulation is performed on the stored data signal, and at least one simulation test can be performed to obtain different simulation eye diagrams by using a circuit-level simulation tool for different parameter combinations of the DDR memory interconnect topology.
As a preferred embodiment of the present invention, step S2 is executed to simulate quantifiable noise introduced by the stored data signal, analyze the influence of the signal noise on the signal swing and timing margin, and add to obtain the specification size of the effective Rx MASK based on the JEDEC standard Rx MASK.
Preferably, step S3 is performed by programmatically calculating a center lattice that satisfies the effective Rx MASK based on the stored eye pattern of the data signal and the training adjustment steps.
Preferably, in step S3, the training adjustment step parameters include a sampling clock timing adjustment granularity and a reference power swing adjustment granularity.
Preferably, in step S4, the parameters for analyzing and evaluating the eye diagram of the stored signal include the number of central points, distribution and area size of the effective Rx MASK determination.
As a preferred embodiment of the present invention, when step S5 is executed, the interconnect topology parameters and the access signal channels are evaluated to determine whether they are good or bad, and whether they are good or not, and the interconnect topology parameters and the access signal channels are optimized, and the optimal central point and the corresponding swing margin and timing margin are obtained according to the weight ratio of the swing and timing priority.
The signal eye diagram analysis method based on the RX MASK central dot matrix has the beneficial effects that: optimizing interconnection topological parameters, optimizing a memory access signal channel, considering the influence of quantifiable and controlled noise, quantifying the eye diagram quality evaluation standard of the memory data signal, and ensuring that the memory system still has sufficient design margin. In addition, the working process of a training mechanism can be simulated, the most appropriate central point is selected according to the weight proportion of the swing amplitude and the time sequence priority, and the corresponding swing amplitude margin and the corresponding time sequence margin are calculated.
Drawings
FIG. 1 is a schematic flow chart of a signal eye diagram analysis method based on an RX MASK central lattice according to the present invention;
FIG. 2 is a schematic diagram of a central lattice search process of a signal eye diagram analysis method based on an RX MASK central lattice according to the present invention;
FIG. 3 is a signal eye diagram and a Rx MASK center dot diagram of a signal eye diagram analysis method based on an RX MASK center dot diagram according to the present invention.
Detailed Description
The following are specific examples of the present invention and further describe the technical solutions of the present invention, but the present invention is not limited to these examples.
Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the modules and steps set forth in these embodiments and steps do not limit the scope of the invention unless specifically stated otherwise.
Meanwhile, it should be understood that the flows in the drawings are not merely performed individually for convenience of description, but a plurality of steps are performed alternately with each other.
The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.
Techniques, methods, and systems known to those of ordinary skill in the relevant art may not be discussed in detail, but are intended to be part of the specification where appropriate.
Based on JEDEC standard definition, Rx MASK is implanted into the simulated eye pattern, the conventional method can only preliminarily judge whether one memory access signal channel design can meet the standard requirement, the conventional method is difficult to effectively judge the quality of the memory data signal eye pattern, and is difficult to scientifically and reasonably select the optimal central point position.
Example one
As shown in fig. 1 to 3, which are only one embodiment of the present invention, the present invention provides a method for analyzing an eye diagram of a signal based on an RX MASK central lattice, the method comprising the following steps:
s1: acquiring a stored data signal simulation eye pattern for developing analysis;
the pre-simulation or the post-simulation is carried out on the stored data signals, and at least one simulation test can be carried out by utilizing a circuit-level simulation tool according to different parameter combinations of the DDR memory interconnection topology to obtain different simulation eye diagrams.
Generally, aiming at different parameter combinations of the DDR memory interconnection topology, all the parameter combinations are combined once, simulation design is sequentially executed, multiple simulation tests are carried out, and simulation eye diagrams corresponding to all the parameter combinations are obtained.
S2: customizing the specification and size of the effective Rx MASK;
after acquiring the simulation eye diagrams corresponding to all the parameter combinations, the specification size of the effective Rx MASK is obtained by addition based on the JEDEC standard RxMASK according to the simulation storage data signal.
S3: counting effective Rx MASK central dot matrixes;
it should be noted that the method for performing step S3, that is, calculating and finding the central lattice satisfying the effective Rx MASK specifically includes:
s31: programming and calculating an inner edge trace of the eye diagram of the stored data signal;
s32: traversing (gridding) all possible effective Rx MASK center points according to the training stepping parameters;
s33: counting the center points of all effective Rx MASKs located inside the eye pattern but not intersecting the trace line inside the eye pattern;
s34: and carrying out statistics to judge the quality of the eye diagram of the stored data signal.
Actually, when step S34 is executed, the statistical content includes the number of central points and the V/T area occupied by the calculated central dot matrix. That is to say, the number of the central points can be counted or the V/T area occupied by the central dot matrix can be calculated by different methods, but both methods can be executed, so that the purpose is to count the distribution of the central dot matrix, and the quality of the eye diagram of the stored data signal can be conveniently judged.
And, after obtaining the distribution of the central lattice, drawing a diagram, for example, as shown in fig. 3, two straight lines in the diagram are specification size boundaries of the custom Rx MASK, an outer arc area is a simulated eye diagram under the original parameter combination of the stored data signal, and an inner shadow area is a calculated and found central lattice distribution area of the effective Rx MASK.
S4: analyzing and evaluating the stored signal eye diagram based on the MASK central dot matrix;
s5: and obtaining the optimal central point and the corresponding swing margin and timing margin.
Generally speaking, the stored signal eye diagram is analyzed and evaluated based on the MASK center lattice, and the swing margin and the timing margin of the eye diagram can be respectively deduced according to the number, the distribution condition and the area size of the central points judged by the effective Rx MASK, and further, the optimal central point and the corresponding swing margin and timing margin are obtained.
The signal eye diagram analysis method based on the RX MASK central dot matrix optimizes interconnection topological parameters, optimizes access and storage signal channels, considers the influence of quantifiable and controlled noise, quantifies the evaluation standard of the quality of the stored data signal eye diagram, and ensures that a storage system still has sufficient design margin. In addition, the working process of a training mechanism can be simulated, the most appropriate central point is selected according to the weight proportion of the swing amplitude and the time sequence priority, and the corresponding swing amplitude margin and the corresponding time sequence margin are calculated.
Example two
Still referring to fig. 1 to 3, which are still one embodiment of the present invention, in order to make the method for analyzing an eye diagram of a signal based on an RX MASK central lattice according to the present invention more convenient to perform and more accurate, the present invention further has the following designs:
first, step S2 is executed to simulate the quantifiable noise condition introduced by the stored data signal, analyze the influence of the signal noise on the signal swing and timing margin, and add to obtain the specification size of the effective RxMASK based on the JEDEC standard Rx MASK.
Then, in step S3, the center lattice that satisfies the effective Rx MASK is calculated programmatically based on the stored data signal eye pattern and the training adjustment steps.
Of course, the training adjustment step parameters include sampling clock timing adjustment granularity and reference supply swing adjustment granularity.
In step S4, the parameters for analyzing and evaluating the eye diagram of the stored signal include the number of central points, distribution, and area size of the effective Rx MASK determination.
Finally, when step S5 is executed, the interconnect topology parameters, the advantages and disadvantages of the access signal channel, and whether the access signal channel is amplitude friendly or time sequence friendly are judged, and the interconnect topology parameters and the access signal channel are optimized, and the optimal central point and the corresponding amplitude margin and time sequence margin are obtained according to the weight ratio of the amplitude and the time sequence priority.
It should be particularly noted that, when step S5 is executed, if the acquired signal eye pattern is an irregular eye pattern, it is necessary to delete the improper center point, and then perform the subsequent statistics, analysis and comparison.
The signal eye diagram analysis method based on the RX MASK central dot matrix optimizes interconnection topological parameters, optimizes access and storage signal channels, considers the influence of quantifiable and controlled noise, quantifies the evaluation standard of the quality of the stored data signal eye diagram, and ensures that a storage system still has sufficient design margin. In addition, the working process of a training mechanism can be simulated, the most appropriate central point is selected according to the weight proportion of the swing amplitude and the time sequence priority, and the corresponding swing amplitude margin and the corresponding time sequence margin are calculated.
While certain specific embodiments of the present invention have been described in detail by way of illustration, it will be understood by those skilled in the art that the foregoing is illustrative only and is not limiting of the scope of the invention, as various modifications or additions may be made to the specific embodiments described and substituted in a similar manner by those skilled in the art without departing from the scope of the invention as defined in the appending claims. It should be understood by those skilled in the art that any modifications, equivalents, improvements and the like made to the above embodiments in accordance with the technical spirit of the present invention are included in the scope of the present invention.
Claims (9)
1. A signal eye diagram analysis method based on an RX MASK central dot matrix is characterized by comprising the following steps:
s1: acquiring a stored data signal simulation eye pattern for developing analysis;
s2: customizing the specification and size of the effective Rx MASK;
s3: counting effective Rx MASK central dot matrixes;
s4: analyzing and evaluating the stored signal eye diagram based on the MASK central dot matrix;
s5: and obtaining the optimal central point and the corresponding swing margin and timing margin.
2. The method according to claim 1, wherein the step S3 is executed to include:
s31: programming and calculating an inner edge trace of the eye diagram of the stored data signal;
s32: traversing all possible effective Rx MASK central points according to the training stepping parameters;
s33: counting the center points of all effective Rx MASKs located inside the eye pattern but not intersecting the trace line inside the eye pattern;
s34: and carrying out statistics to judge the quality of the eye diagram of the stored data signal.
3. The method according to claim 2, wherein the method comprises the following steps:
when step S34 is executed, the statistical content includes the number of center points and the V/T area occupied by the calculated center dot matrix.
4. The method according to claim 1, wherein the method comprises the following steps:
when step S1 is executed, pre-simulation or post-simulation is performed on the stored data signal, and at least one simulation test can be performed to obtain different simulation eye diagrams by using a circuit-level simulation tool for different parameter combinations of the DDR memory interconnection topology.
5. The method according to claim 1, wherein the method comprises the following steps:
the step S2 is executed to specifically simulate the quantifiable noise condition introduced by the stored data signal, analyze the influence of the signal noise on the signal swing and the timing margin, and add and obtain the specification size of the effective Rx MASK based on the JEDEC standard Rx MASK.
6. The method according to claim 1, wherein the method comprises the following steps:
in step S3, the center lattice that satisfies the effective RxMASK is programmed and calculated based on the stored eye pattern of the data signal and the training adjustment steps.
7. The method according to claim 6, wherein the method comprises the following steps:
in step S3, the training adjustment step parameters include a sampling clock timing adjustment granularity and a reference power swing adjustment granularity.
8. The method according to claim 1, wherein the method comprises the following steps:
in step S4, the parameters for analyzing and evaluating the eye diagram of the stored signal include the number of central points, distribution and area size of the effective Rx MASK determination.
9. The method according to claim 1, wherein the method comprises the following steps:
when step S5 is executed, the interconnect topology parameters, the advantages and disadvantages of the access signal channel, and whether the access signal channel is friendly to swing or friendly to timing are judged, and the interconnect topology parameters and the access signal channel are optimized, and the optimal central point and the corresponding swing margin and timing margin are obtained according to the weight ratio of the swing and timing priority.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111863104A (en) * | 2020-07-29 | 2020-10-30 | 展讯通信（上海）有限公司 | Eye pattern determination model training method, eye pattern determination device, eye pattern determination apparatus, and medium |
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| WO2023164959A1 (en) * | 2022-03-02 | 2023-09-07 | 长鑫存储技术有限公司 | Signal eye pattern analysis system and method therefor |
| CN114301556A (en) * | 2022-03-10 | 2022-04-08 | 武汉普赛斯电子技术有限公司 | Eye pattern template margin obtaining method and device, computer equipment and storage medium |
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